CN115575785A - IGBT thermal resistance test system - Google Patents
IGBT thermal resistance test system Download PDFInfo
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- CN115575785A CN115575785A CN202211104137.2A CN202211104137A CN115575785A CN 115575785 A CN115575785 A CN 115575785A CN 202211104137 A CN202211104137 A CN 202211104137A CN 115575785 A CN115575785 A CN 115575785A
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- module
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- thermal resistance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors
- G01R31/2619—Circuits therefor for testing bipolar transistors for measuring thermal properties thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/02—Thermometers giving results other than momentary value of temperature giving means values; giving integrated values
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L67/00—Network arrangements or protocols for supporting network services or applications
- H04L67/01—Protocols
- H04L67/10—Protocols in which an application is distributed across nodes in the network
- H04L67/1097—Protocols in which an application is distributed across nodes in the network for distributed storage of data in networks, e.g. transport arrangements for network file system [NFS], storage area networks [SAN] or network attached storage [NAS]
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- Computer Networks & Wireless Communication (AREA)
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention discloses an IGBT thermal resistance test system which comprises a test host, a voltage source host, a measurement box, a cloud storage server and a temperature control module, wherein a signal control module for sending a control signal is arranged between the test host and the voltage source host, the voltage source host is connected with the voltage source control module, and the output end of the voltage source control module is connected with a test piece in the measurement box; this IGBT thermal resistance test system can upload the test result to cloud storage server in real time when testing the thermal resistance for operating personnel can directly log in cloud storage server through removal end such as cell-phone and carry out the acquisition of measuring result, conveniently carry out automatic recording, serial number and analysis to every measuring result of every test piece simultaneously, tester's work load has been reduced, the condition that prevents to make mistakes takes place, and this system passes through the temperature contrast calculation module among the temperature control module, cause the test temperature control in the measuring box more accurate, the degree of accuracy when having guaranteed the test.
Description
Technical Field
The invention belongs to the technical field of thermal resistance testing, and particularly relates to an IGBT thermal resistance testing system.
Background
The IGBT is also called an insulated gate bipolar transistor and is a common semiconductor device, the thermal resistance of the IGBT directly influences the later operation stability, therefore, the test of the thermal resistance value of the IGBT is one of important parameters for evaluating the subsequent operation reliability of the IGBT.
The IGBT thermal resistance test system in the prior art mainly comprises a thermal resistance tester, a measurement box and a voltage source host, wherein test results are obtained through the thermal resistance tester, and the external storage facility is required to record, number and analyze the measurement results of each time, so that the test workload is increased, errors are easy to occur, and meanwhile, the measurement box temperature control module in the existing IGBT thermal resistance test system has the defect of low precision, so that the accuracy of the results of later tests is difficult to guarantee.
Disclosure of Invention
The invention aims to provide an IGBT thermal resistance test system, and aims to solve the problems that the measurement result of the existing IGBT thermal resistance test system in the background technology is not easy to look up and has low accuracy.
In order to achieve the purpose, the invention provides the following technical scheme: the IGBT thermal resistance testing system comprises a testing host, a voltage source host, a measuring box, a cloud storage server and a temperature control module, wherein a signal control module for sending a control signal is arranged between the testing host and the voltage source host, the voltage source host is connected with the voltage source control module, the output end of the voltage source control module is connected with a test piece in the measuring box, the temperature control module is arranged in the measuring box, the testing host is connected with a current acquisition module through a sampling data transmission module, the current acquisition module is connected with the test piece in the measuring box, the testing host is connected with a calculation module capable of calculating sampling data, the calculation module is connected with a result analysis module, the result analysis module is connected with a result numbering module, and the result numbering module is connected with the cloud storage server through an uploading module to realize uploading of a testing result.
Preferably, the temperature control module comprises a temperature acquisition module, a temperature sensor, a cooling module and an oil cooling circulator, the temperature acquisition module is connected with a plurality of temperature sensors arranged in the measuring box, the temperature acquisition module is connected with the cooling module, and the cooling module is connected with the oil cooling circulator.
Preferably, the temperature control module further comprises a temperature comparison calculation module, and the temperature comparison calculation module is arranged between the temperature acquisition module and the cooling module.
Preferably, a plurality of temperature sensors are uniformly arranged in the measuring box and surround the test piece.
Preferably, an oil cooling pipeline is arranged on the measuring box and connected with the oil cooling circulator.
Preferably, the voltage source host is further connected with a voltage stabilizing module, and the voltage stabilizing module is arranged at the front end of the voltage source control module.
Preferably, the test host is further connected with a sampling data backup module for backing up sampling data.
Compared with the prior art, the invention has the beneficial effects that: this IGBT thermal resistance test system is when testing the thermal resistance, can upload the test result to cloud storage server in real time, make operating personnel can directly log on cloud storage server through mobile terminals such as cell-phones and carry out the acquisition of measuring result, simultaneously conveniently carry out automatic recording to every measuring result of every test piece, serial number and analysis, tester's work load has been reduced, the condition that prevents to make mistakes takes place, and this system passes through the temperature contrast calculation module among the temperature control module, can compare and calculate a plurality of temperature sensor's temperature acquisition result, reach the temperature average value of whole measuring box, compare traditional maximum value or minimum of getting, it is more accurate, cause the more accurate of the test temperature control of measuring box, accuracy when having guaranteed the test.
Drawings
FIG. 1 is a system framework diagram of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Examples
Referring to fig. 1, a first embodiment of the present invention provides a technical solution: the utility model provides a IGBT thermal resistance test system, including the test host computer, the voltage source host computer, the measurement case, cloud storage server and temperature control module, be provided with the signal control module who sends control signal between test host computer and the voltage source host computer, can send control signal to the voltage source host computer, cause the voltage source host computer to output the voltage of setting, be connected with the voltage source control module on the voltage source host computer, the voltage source control module output of control is set for voltage, and the output of voltage source control module links to each other with the test piece in the measurement case, input voltage to the test piece, the temperature control module sets up in the measurement case, can carry out constant temperature control to the temperature of measurement case, the test host computer links to each other with the current acquisition module through sampling data transmission module, the current acquisition module links to each other with the test piece in the measurement case, make the current value of test piece under different temperatures can be gathered by the test host computer, be connected with the calculation module that can calculate the sampling data on the test host computer, even there is the result analysis module, even there is a result numbering module even, the result numbering module links to the cloud storage server through the removal end login of mobile phone, the test result number of each can be carried out the convenience, the automatic analysis of the reduction of test piece, the circumstances that takes place the measuring and the circumstances that take place.
In this embodiment, preferably, the temperature control module includes the temperature acquisition module, a weighing sensor, cooling module and oil cooling circulator, the temperature acquisition module is connected with a plurality of temperature sensor that set up in the measuring box, link to each other between temperature acquisition module and the cooling module, realize the temperature value real-time acquisition to the measuring box, the cooling module links to each other with oil cooling circulator, accessible oil cooling circulator realizes the cooling, the temperature control module still includes temperature contrast calculation module, temperature contrast calculation module sets up between temperature acquisition module and cooling module, can compare the calculation to a plurality of temperature sensor's temperature data, thereby the whole temperature average value of measuring the incasement of activity, improve subsequent temperature control efficiency, a plurality of temperature sensor evenly set up in the measuring box, and surround around the test piece, be equipped with the oil cooling pipeline on the measuring box, and the oil cooling pipeline links to each other with oil cooling circulator, realize the oil cooling.
In this embodiment, preferably, the voltage source host is further connected with a voltage stabilizing module, the voltage stabilizing module is arranged at the front end of the voltage source control module to ensure the output stability of the voltage, and the test host is further connected with a sampling data backup module for backing up the sampling data to facilitate subsequent lookup.
In summary, the working principle and the using process of the invention are as follows: when testing the thermal resistance, the IGBT thermal resistance testing system firstly puts an IGBT test piece into a measuring box, then is connected with a voltage source control module and a current acquisition module, at the moment, a testing host and the voltage source host are started, the testing host sends an output signal to the voltage source host through the signal control module, so that the voltage source host outputs constant voltage, the voltage stability is ensured through a voltage stabilizing module, then the IGBT test piece is input, the temperature in the measuring box is set at constant temperature through a temperature control module, the current value of the IGBT test piece is observed under the constant temperature, then the testing temperature in the measuring box is gradually increased, the change of the current of the IGBT test piece along with the temperature is recorded, the current value on the IGBT test piece can be acquired by the current acquisition module and is transmitted to the testing host through a sampling data transmission module, the testing host firstly backs up the data through a sampling data backup module, then the data is accurately calculated through a calculation module, the thermal resistance of the IGBT test piece is obtained, the thermal resistance of the IGBT test piece is analyzed through a result analysis module, then the results are numbered, finally the data are transmitted to a cloud storage server through an uploading module, the mobile operator can directly log in the cloud server, and the test result can be automatically recorded, and the test result can be prevented from being reduced.
Although embodiments of the present invention have been shown and described with particularity and detail in the foregoing description, it will be appreciated by those skilled in the art that numerous changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (7)
1. An IGBT thermal resistance test system which characterized in that: the test system comprises a test host, a voltage source host, a measurement box, a cloud storage server and a temperature control module, wherein a signal control module for sending a control signal is arranged between the test host and the voltage source host, the voltage source host is connected with the voltage source control module, the output end of the voltage source control module is connected with a test piece in the measurement box, the temperature control module is arranged in the measurement box, the test host is connected with a current acquisition module through a sampling data transmission module, the current acquisition module is connected with the test piece in the measurement box, the test host is connected with a calculation module capable of calculating sampling data, the calculation module is connected with a result analysis module, the result analysis module is connected with a result numbering module, and the result numbering module is connected with the cloud storage server through an uploading module to realize uploading of test results.
2. The IGBT thermal resistance test system according to claim 1, characterized in that: the temperature control module comprises a temperature acquisition module, a temperature sensor, a cooling module and an oil cooling circulator, the temperature acquisition module is connected with a plurality of temperature sensors arranged in the measuring box, the temperature acquisition module is connected with the cooling module, and the cooling module is connected with the oil cooling circulator.
3. The IGBT thermal resistance test system of claim 2, characterized in that: the temperature control module further comprises a temperature comparison calculation module, and the temperature comparison calculation module is arranged between the temperature acquisition module and the cooling module.
4. The IGBT thermal resistance test system of claim 2, characterized in that: the plurality of temperature sensors are uniformly arranged in the measuring box and surround the test piece.
5. The IGBT thermal resistance test system according to claim 2, characterized in that: and an oil cooling pipeline is arranged on the measuring box and is connected with an oil cooling circulator.
6. The IGBT thermal resistance test system according to claim 1, characterized in that: the voltage source host is also connected with a voltage stabilizing module, and the voltage stabilizing module is arranged at the front end of the voltage source control module.
7. The IGBT thermal resistance test system according to claim 1, characterized in that: the test host is also connected with a sampling data backup module for backing up the sampling data.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211104137.2A CN115575785A (en) | 2022-09-09 | 2022-09-09 | IGBT thermal resistance test system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211104137.2A CN115575785A (en) | 2022-09-09 | 2022-09-09 | IGBT thermal resistance test system |
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| CN115575785A true CN115575785A (en) | 2023-01-06 |
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| CN202211104137.2A Pending CN115575785A (en) | 2022-09-09 | 2022-09-09 | IGBT thermal resistance test system |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118130998A (en) * | 2024-05-08 | 2024-06-04 | 成都恒合控制系统有限公司 | IGBT decay characteristic test equipment |
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2022
- 2022-09-09 CN CN202211104137.2A patent/CN115575785A/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118130998A (en) * | 2024-05-08 | 2024-06-04 | 成都恒合控制系统有限公司 | IGBT decay characteristic test equipment |
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