CN115561557A - Device and method for testing electrical property of heat wave-transmitting material based on laser heating - Google Patents
Device and method for testing electrical property of heat wave-transmitting material based on laser heating Download PDFInfo
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- CN115561557A CN115561557A CN202211269101.XA CN202211269101A CN115561557A CN 115561557 A CN115561557 A CN 115561557A CN 202211269101 A CN202211269101 A CN 202211269101A CN 115561557 A CN115561557 A CN 115561557A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G05D23/00—Control of temperature
- G05D23/19—Control of temperature characterised by the use of electric means
- G05D23/30—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature
- G05D23/32—Automatic controllers with an auxiliary heating device affecting the sensing element, e.g. for anticipating change of temperature with provision for adjustment of the effect of the auxiliary heating device, e.g. a function of time
Abstract
The embodiment of the invention provides a device and a method for testing the electrical property of a heat wave-transmitting material based on laser heating. The device comprises: the laser heating modules are used for heating the thermal wave-transmitting material to be tested to a preset temperature; the transmitting module comprises a transmitting antenna and a first guide rail, the transmitting antenna is movably arranged on the first guide rail, and the transmitting antenna is used for transmitting microwave signals to the heat-permeable material; the receiving module comprises a receiving antenna and a bracket, wherein the receiving antenna is movably arranged on the bracket and is used for receiving transmission signals and scattering signals generated by the thermal wave-transmitting material; a platform for supporting a thermally transparent material; and the analysis control module is used for controlling the heating temperature and the test angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The device can accurately measure the electrical property of the thermal wave-transmitting material at a set temperature.
Description
Technical Field
The embodiment of the invention relates to the technical field of materials, in particular to a device and a method for testing the electrical property of a heat wave-transmitting material.
Background
With the development of science and technology, the thermal wave-transmitting material is widely applied to the aircraft antenna housing, and the aircraft antenna housing is located at the head of an aircraft, so that the aircraft antenna housing plays a role in protecting a seeker system from normal operation, and the influence of the seeker system on an antenna is minimized. When the aircraft flies at a hypersonic speed, the appearance and the temperature field distribution of the antenna housing can be changed due to violent pneumatic heating and ablation, and the electrical property of the antenna housing is further changed. Therefore, testing the electrical performance of the radome of the hypersonic aircraft at a set high temperature is an important problem to be solved urgently.
In the prior art, the heat wave-transmitting material is usually heated to a set temperature and then placed in a test system for performance test, however, the temperature of the heat wave-transmitting material is reduced in the moving process, and therefore, the electrical performance of the heat wave-transmitting material at the set temperature cannot be accurately measured in real time.
Therefore, there is a need for a device and a method for testing electrical properties of a thermal wave-transmitting material based on laser heating to solve the above-mentioned problems.
Disclosure of Invention
The embodiment of the invention provides a device and a method for testing the electrical property of a thermal wave-transmitting material based on laser heating, which can accurately measure the electrical property of the thermal wave-transmitting material at a set temperature.
In a first aspect, an embodiment of the present invention provides a device for testing an electrical property of a thermal wave-transparent material based on laser heating, including:
the laser heating modules are used for heating the thermal wave-transmitting material to be tested to a preset temperature;
the transmitting module comprises a transmitting antenna and a first guide rail, the transmitting antenna is movably arranged on the first guide rail, and the transmitting antenna is used for transmitting microwave signals to the thermal wave-transmitting material;
the receiving module comprises a receiving antenna and a bracket, the receiving antenna is movably arranged on the bracket and is used for receiving the transmission signal and the scattering signal generated by the thermal wave-transmitting material;
a platform disposed between the transmitting antenna and the receiving antenna, the platform for supporting the thermal wave-transparent material;
and the analysis control module is connected with the laser heating module, the transmitting antenna and the receiving antenna, and is used for controlling the heating temperature and the test angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna.
In one possible design, each laser heating module includes a laser emitter, a beam expander lens and a second guide rail, the beam expander lens is disposed on the laser emitter, and the laser emitter is movably disposed on the second guide rail; the laser emitter is used for emitting a light source, and the beam expander is used for amplifying the light source into light spots;
and the laser emitter is adjusted on the second guide rail, so that the light spot uniformly heats the thermal wave-transparent material.
In one possible design, the laser emitter is a fiber laser emitter, and the power of the fiber laser emitter is 2kw to 10kw.
In one possible design, the beam expander is a kepler beam expander, and the kepler beam expander includes a first lens, a second lens and a third lens that are sequentially arranged along a laser emission direction;
the first lens and the third lens are both positive focal length lenses, and are used for magnifying a light source emitted by the laser emitter into light spots; the second lens is a biconvex lens, and is used for adjusting the image direction and shortening the optical path distance.
In one possible design, the focal point of the first lens coincides with the first focal point of the second lens, and the second focal point of the second lens coincides with the focal point of the third lens;
the distance between the first lens and the third lens is the sum of the focal lengths of the first lens, the second lens and the third lens.
In one possible design, the magnification of the beam expander is equal to the product of the ratio of the focal length of the third lens to the focal length of the first lens and the magnification of the second lens.
In one possible design, each of the laser heating modules is located more than 5 meters from the center of the thermally transparent material.
In one possible design, the first guide rail is a circular arc guide rail, and the center of the opening surface of the receiving antenna coincides with the circle center of the circular arc guide rail;
each laser heating module is arranged in a region outside a conical region which is formed by taking the center of the mouth surface of the receiving antenna as a vertex and taking 45 degrees as a semi-cone upwards.
In one possible design, the vertex of the circular arc-shaped guide rail is 0 °, and the transmitting antenna moves along a range with an included angle of ± 30 ° with the vertex.
In a second aspect, an embodiment of the present invention further provides a method for testing electrical properties of a thermal wave-transmitting material based on laser heating, where the method is applied to a testing apparatus in any one of the above designs, and the method includes:
placing the thermal wave-transmitting material to be tested at the central position of the platform;
heating the thermal wave-transmitting material to a preset temperature by using the laser heating module;
moving the transmitting antenna to a set position of the first guide rail and moving the receiving antenna to a set position of the bracket by using the analysis control module so as to adjust a test angle;
transmitting a microwave signal with a specified waveband to the thermal wave-transmitting material by using the transmitting antenna, wherein the microwave signal is incident to the thermal wave-transmitting material to generate a transmission signal and a scattering signal;
receiving the transmitted signal and the scattered signal with the receiving antenna;
and analyzing the transmission signal and the scattering signal by using the analysis control module to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
The invention provides a device for testing the electrical property of a thermal wave-transmitting material based on laser heating. The analysis control module is connected with the laser heating module, and can control and adjust the heating temperature of the laser heating module on the thermal wave-transparent material in real time so as to control the temperature of the thermal wave-transparent material at a preset temperature; when the thermal wave-transmitting material reaches the preset temperature, transmitting a microwave signal to the thermal wave-transmitting material at the preset temperature through a transmitting antenna, and receiving a transmission signal and a scattering signal generated by the thermal wave-transmitting material at the preset temperature through a receiving antenna; and finally, the analysis control module obtains the electrical property of the thermal wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna. The device for testing the electrical property of the thermal wave-transmitting material can accurately measure the electrical property of the thermal wave-transmitting material at a set temperature.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a system diagram of a device for testing electrical properties of a thermal wave-transparent material based on laser heating according to an embodiment of the present invention;
FIG. 2 is a schematic structural view of a laser heating module provided in accordance with an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating the working principle of the kepler beam expander according to an embodiment of the present invention;
fig. 4 is a schematic flowchart of a method for testing electrical properties of a thermal wave-transmitting material based on laser heating according to an embodiment of the present invention.
Reference numerals:
1-laser heating module;
11-a laser emitter;
12-a beam expander;
121-a first lens;
122-a second lens;
123-a third lens;
13-a second guide rail;
2-a transmitting module;
21-a transmitting antenna;
22-a first guide rail;
3-a receiving module;
31-a receiving antenna;
32-a scaffold;
4-a platform;
5-analysis control module.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer and more complete, the technical solutions in the embodiments of the present invention will be described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention, and based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts belong to the scope of the present invention.
As described above, the prior art cannot accurately measure the electrical properties of the heat wave-transparent material at a set temperature in real time. In order to solve the problem, the inventor proposes that a laser heating module can be added in a test system, and the heating temperature of the thermal wave-transparent material is controlled in real time through the laser heating module so as to accurately measure the electrical property of the thermal wave-transparent material at a set temperature.
As shown in fig. 1, an embodiment of the present invention provides an apparatus for testing electrical properties of a thermal wave-transparent material based on laser heating, the apparatus including:
the laser heating modules 1 are used for heating a thermal wave-transmitting material to be tested to a preset temperature;
the transmitting module 2 comprises a transmitting antenna 21 and a first guide rail 22, wherein the transmitting antenna 21 is movably arranged on the first guide rail 22, and the transmitting antenna 21 is used for transmitting microwave signals to the heat-wave-transparent material;
the receiving module 3 comprises a receiving antenna 31 and a bracket 32, the receiving antenna 31 is movably arranged on the bracket 32, and the receiving antenna 31 is used for receiving a transmission signal and a scattering signal generated by the thermal wave-transmitting material;
a platform 4 disposed between the transmitting antenna 21 and the receiving antenna 31, the platform 4 being configured to support a thermal wave-transparent material;
the analysis control module 5 is connected with the laser heating module 1, the transmitting antenna 21 and the receiving antenna 31, and the analysis control module 5 is used for controlling the heating temperature and the testing angle of the thermal wave-transparent material and obtaining the electrical property of the thermal wave-transparent material at a preset temperature according to the transmission signal and the scattering signal received by the receiving antenna 31.
The embodiment of the invention provides a device for testing the electrical property of a thermal wave-transmitting material based on laser heating, which comprises a laser heating module 1, a transmitting module 2, a receiving module 3, a platform 4 and an analysis control module 5. The analysis control module 5 is connected with the laser heating module 1, and the heating temperature of the laser heating module 1 to the heat wave-transparent material can be controlled and adjusted in real time through the analysis control module 5 so as to control the temperature of the heat wave-transparent material to be at a preset temperature; when the thermal wave-transmitting material reaches the preset temperature, transmitting microwave signals to the thermal wave-transmitting material at the preset temperature through the transmitting antenna 21, and receiving transmission signals and scattering signals generated by the thermal wave-transmitting material at the preset temperature through the receiving antenna 31; finally, the analysis control module 5 obtains the electrical property of the thermal wave-transparent material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna 31. The device for testing the electrical property of the thermal wave-transmitting material can accurately measure the electrical property of the thermal wave-transmitting material at a set temperature.
In the embodiment, the temperature of the heating area can be rapidly increased by laser heating, and the precise heating of the designated heating area can be realized by controlling the heating path. In addition, the preset temperature may be any temperature higher than room temperature, the temperature may be higher than 1000 ℃, and the preset temperature value is determined according to the user requirement, which is not specifically limited in the present application.
In some embodiments, the thermal wave-transparent material is installed at a central position of the platform 4, and the wave-absorbing material is laid on the region of the platform 4 except for the region where the thermal wave-transparent material is installed.
In the embodiment, the wave-absorbing material is preferably high-temperature resistant, and the interference of the platform 4 on the test signal can be reduced by arranging the wave-absorbing material. In addition, an insulating material is arranged between the wave-absorbing material and the platform 4 to ensure that the temperature below the platform 4 is lower than the highest temperature tolerance of the receiving antenna 31 and the accessory lines.
As shown in fig. 2, in some embodiments, each laser heating module 1 includes a laser emitter 11, a beam expander 12, and a second guide rail 13, the beam expander 12 being disposed on the laser emitter 11, the laser emitter 11 being movably disposed on the second guide rail 13; the laser emitter 11 is used for emitting a light source, and the beam expander 12 is used for amplifying the light source into light spots;
by adjusting the position of the laser emitter 11 on the second guide rail 13, the light spot uniformly heats the heat wave-transmitting material.
In this embodiment, there are two laser heating modules, and each laser emitter 11 heats the left and right regions of the thermal wave-transparent material. The thermal wave-transparent material is uniformly heated to a preset temperature by the laser emitter 11 slowly sliding on the respective second guide rails 13 to move the light spot on the surface of the thermal wave-transparent material.
In some embodiments, the laser emitter 11 is a fiber laser emitter 11, the power of the fiber laser emitter 11 is 2kw to 10kw, and the output power of the laser emitter 11 can be adjusted according to the set heating temperature and heating time.
As shown in fig. 3, in some embodiments, the beam expander 12 is a keplerian beam expander 12, and the keplerian beam expander 12 includes a first lens 121, a second lens 122, and a third lens 123 arranged in this order along the laser emission direction;
the first lens 121 and the third lens 123 are both positive focal length lenses, and the first lens 121 and the third lens 123 are used for magnifying a light source emitted by the laser emitter 11 into a light spot; the second lens 122 is a double-convex lens, and the second lens 122 is used for adjusting the image direction and shortening the optical path distance.
In this embodiment, the second lens 122 is a relay lens, and by providing three lenses, it is possible to increase the magnification of the beam expander 12, adjust the image direction, and shorten the optical path distance.
In some embodiments, the focal point of the first lens 121 coincides with the first focal point of the second lens 122, and the second focal point of the second lens 122 coincides with the focal point of the third lens 123;
the distance between the first lens 121 and the third lens 123 is the sum of the focal lengths of the first lens 121, the second lens 122, and the third lens 123. For example, if the focal length of the first lens 121 is f 1 The focal length of the third lens 123 is f 2 The focal length of the second lens 122 near the first lens 121 is 2f r1 The focal length of the second lens 122 near the third lens 123 is 2f r2 Then the pitch of the first lens 121 and the third lens 123 (i.e., the length of the entire beam expander 12 system) L = f 1 +2f r1 +2f r2 +f 2 。
In some embodiments, the magnification of the beam expander 12 is equal to the product of the ratio of the focal length of the third lens 123 to the focal length of the first lens 121 and the magnification of the second lens 122. For example, if the focal length of the first lens 121 is f 1 The focal length of the third lens 123 is f 2 The focal length of the second lens 122 near the first lens 121 is 2f r1 The focal length of the second lens 122 near the third lens 123 is 2f r2 Then the magnification of the second lens 122 is f r1 /f r2 Accordingly, the magnification M = (f) of the beam expander 12 2* f r1 )/(f 1 *f r2 )。
In some embodiments, the distance from each laser heating module 1 to the center of the thermal wave-transparent material is greater than 5 meters, so as to further reduce the interference of the laser heating modules 1 on the test signals and ensure the test accuracy.
In some embodiments, the first guide rail 22 is a circular arc guide rail, and the center of the opening surface of the receiving antenna 31 coincides with the center of the circular arc guide rail;
each laser heating module 1 is disposed in a region other than a conical region formed upward at 45 ° by a half cone with the center of the mouth face of the receiving antenna 31 as a vertex.
In this embodiment, the arc-shaped first guide rail 22 facilitates the transmission antenna 21 to slide on the first guide rail 22, and the first guide rail 2222 may be provided with graduation marks to facilitate accurate adjustment of the position of the transmission antenna 21 on the first guide rail 22. In addition, the laser heating module 1 is disposed in a region other than the conical region formed by taking the center of the mouth surface of the receiving antenna 31 as a vertex and taking 45 ° upward as a semi-cone, so that the interference of the laser heating module 1 on the test signal can be reduced, and the test accuracy can be ensured. Of course, a half cone angle of 45 ° is a preferable mode, and a user may also use an angle such as 40 ° or 60 ° as the half cone angle, which is not limited in this application.
In some embodiments, the apex of the circular arc shaped guide track is 0 ° and the transmitting antenna 21 moves within a range of ± 30 ° from the apex. Within this range, the test signal from the transmitting antenna 21 does not fall on the laser heating module 1, so as to ensure the accuracy of the test. It should be noted that the size of the included angle between the transmitting antenna 21 and the vertex is related to the half cone angle of the laser heating module 1, as long as it is ensured that the test signal sent by the transmitting antenna 21 is not interfered by the position of the laser heating module 1.
In some embodiments, the radius of the circular arc-shaped guide rail is not less than 2D 2 Where D is the characteristic dimension of the receiving antenna 31 and λ is the wavelength of the microwave signal emitted by the transmitting antenna 21.
In this embodiment, by providing a circular arcThe radius of the shape guide rail is not less than 2D 2 And/λ, the aperture of the receiving antenna 31 can be made to be in the far field of the transmitting antenna 21 for far field testing.
In some embodiments, the receiving antenna 31 is located below the thermal wave-transparent material, and the receiving antenna 31 may be installed on the bracket 32 transversely or installed on the bracket 32 longitudinally, and the angle between the two installation directions is 90 ° around the vertical center line, and the test angle for the thermal wave-transparent material is changed by adjusting the installation direction of the receiving antenna 31.
In other embodiments, a spot lamp heating system may be used instead of the laser heating module 1. However, the spotlight heating device is large in size, is not suitable for a scene with a limited test site, and has higher energy consumption at the same heating temperature.
The laser heating is adopted in the application, firstly, the laser has directionality, monochromaticity, high brightness, spatial coherence and time consistency, and energy can be transmitted in a long distance; secondly, the laser heating has the advantages of non-contact property, low noise, no pollution and material saving; in addition, the laser beam has high energy density and high heating efficiency, the heat loss to the environment in the heating process is small, the laser beam can be heated relatively remotely, and the energy consumption is low; finally, laser heating is easy to integrate by a machine, the number of the adopted arrays is small, system integration and control are easy, the occupied field is small, and the method is suitable for a scene with a limited test field.
As shown in fig. 4, an embodiment of the present invention provides a method for testing electrical properties of a thermal wave-transparent material, which is applied to a device for testing electrical properties of a thermal wave-transparent material in any of the above embodiments, and the method includes:
and step 410, analyzing the transmission signal and the scattering signal by using the analysis control module 5 to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
In this embodiment, after the electrical property of the thermal wave-transmitting material at the preset temperature is determined, the electrical property of the thermal wave-transmitting material under the non-heating condition is compared with the electrical property of the thermal wave-transmitting material, and the influence of the surface temperature change on the electrical property of the thermal wave-transmitting material can be obtained.
The following describes a method for testing the electrical properties of the thermal wave-transparent material with an embodiment.
Firstly, after a thermal wave-transmitting material to be tested is placed at the central position of a platform 4, the arrangement and power of spot lamps are adjusted, and the thermal wave-transmitting material is heated to 1000 ℃;
then, transversely arranging the receiving antenna 31 on the bracket 32, moving the transmitting antenna 21 to a position of minus 30 degrees of the first guide rail 22, and testing the thermal wave-transmitting material to obtain the electrical property of the thermal wave-transmitting material at the testing angle;
then, moving the transmitting antenna 21 at an angle of 0.5 degrees as an interval to respectively obtain the electrical properties of the heat wave-transmitting material of the transmitting antenna 21 in a range of-30 degrees to +30 degrees;
finally, the receiving antenna 31 is adjusted from the transverse direction to the longitudinal direction, and the electrical properties of the heat wave-transmitting material of the transmitting antenna 21 in the range of-30 degrees to +30 degrees are retested.
Therefore, the electrical performance of the thermal wave-transmitting material at 1000 ℃ and different test angles can be obtained.
By adopting the method, the electrical property of the thermal wave-transmitting material at any temperature (including normal temperature) can be obtained, and a user can compare the electrical property of the thermal wave-transmitting material at each temperature according to actual needs, so that the influence of the surface temperature change on the electrical property of the thermal wave-transmitting material can be obtained.
It can be understood that the apparatus for testing electrical properties of a thermal wave-transparent material provided in this embodiment and the method for testing electrical properties of a thermal wave-transparent material provided in the foregoing embodiments have the same beneficial effects, and are not described herein again.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a …" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. The utility model provides a test device of thermal wave-transparent material electrical property based on laser heating which characterized in that includes:
the device comprises at least two laser heating modules (1) for heating a thermal wave-transparent material to be tested to a preset temperature;
a transmitting module (2) comprising a transmitting antenna (21) and a first guide rail (22), wherein the transmitting antenna (21) is movably arranged on the first guide rail (22), and the transmitting antenna (21) is used for transmitting a microwave signal to the thermal wave-transmitting material;
a receiving module (3) comprising a receiving antenna (31) and a bracket (32), wherein the receiving antenna (31) is movably arranged on the bracket (32), and the receiving antenna (31) is used for receiving the transmission signal and the scattering signal generated by the thermal wave-transmitting material;
a platform (4) disposed between the transmitting antenna (21) and the receiving antenna (31), the platform (4) being for supporting the thermally transparent material;
the analysis control module (5) is connected with the laser heating module (1), the transmitting antenna (21) and the receiving antenna (31), and the analysis control module (5) is used for controlling the heating temperature and the testing angle of the heat wave-transmitting material and obtaining the electrical property of the heat wave-transmitting material at the preset temperature according to the transmission signal and the scattering signal received by the receiving antenna (31).
2. The device according to claim 1, characterized in that each of the laser heating modules (1) comprises a laser emitter (11), a beam expander (12) and a second guide rail (13), the beam expander (12) being arranged on the laser emitter (11), the laser emitter (11) being movably arranged on the second guide rail (13); the laser transmitter (11) is used for emitting a light source, and the beam expander (12) is used for amplifying the light source into a light spot;
the laser emitter (11) is adjusted on the second guide rail (13) to enable the light spot to uniformly heat the thermal wave-transparent material.
3. The device according to claim 2, characterized in that the laser emitter (11) is a fiber laser emitter (11), and the power of the fiber laser emitter (11) is 2-10 kw.
4. The device according to claim 2, wherein the beam expander (12) is a keplerian beam expander (12), and the keplerian beam expander (12) comprises a first lens (121), a second lens (122) and a third lens (123) which are arranged in sequence along the laser emission direction;
the first lens (121) and the third lens (123) are both positive focal length lenses, and the first lens (121) and the third lens (123) are used for magnifying a light source emitted by the laser emitter (11) into a light spot; the second lens (122) is a biconvex lens, and the second lens (122) is used for adjusting the image direction and shortening the optical path distance.
5. The apparatus according to claim 4, wherein the focal point of the first lens (121) coincides with the first focal point of the second lens (122), and the second focal point of the second lens (122) coincides with the focal point of the third lens (123);
the distance between the first lens (121) and the third lens (123) is the sum of the focal lengths of the first lens (121), the second lens (122) and the third lens (123).
6. The apparatus according to claim 5, wherein the magnification of the beam expander (12) is equal to the product of the ratio of the focal length of the third lens (123) to the focal length of the first lens (121) and the magnification of the second lens (122).
7. The device according to claim 1, characterized in that the distance of each laser heating module (1) to the center of the heat wave-transparent material is greater than 5 meters.
8. The device according to claim 1, characterized in that the first guide rail (22) is a circular arc guide rail, and the center of the mouth surface of the receiving antenna (31) coincides with the center of the circular arc guide rail;
each laser heating module (1) is arranged in an area outside a conical area which is formed by taking the center of the mouth surface of the receiving antenna (31) as a vertex and taking a 45-degree semi-cone upwards.
9. The device according to claim 8, characterized in that the vertex of the circular arc-shaped guide rail is 0 °, and the transmitting antenna (21) moves within a range of ± 30 ° from the vertex.
10. A method for testing the electrical property of a thermal wave-transmitting material based on laser heating, which is applied to the device of any one of claims 1-9, and comprises the following steps:
placing the thermal wave-transmitting material to be tested at the central position of the platform (4);
heating the thermal wave-transmitting material to a preset temperature by using the laser heating module (1);
-moving the transmitting antenna (21) to a set position of the first guide (22) and the receiving antenna (31) to a set position of the support (32) with the analysis control module (5) to adjust the test angle;
transmitting a microwave signal with a specified waveband to the thermal wave-transmitting material by using the transmitting antenna (21), wherein the microwave signal is incident to the thermal wave-transmitting material to generate a transmission signal and a scattering signal;
-receiving said transmitted signal and said scattered signal with said receiving antenna (31);
and analyzing the transmission signal and the scattering signal by using the analysis control module (5) to obtain the electrical property of the thermal wave-transmitting material at the preset temperature.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115561557B (en) | 2023-06-09 |
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