CN115541972A - Direct-current voltage isolation sampling method, device and circuit - Google Patents
Direct-current voltage isolation sampling method, device and circuit Download PDFInfo
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- CN115541972A CN115541972A CN202211514816.7A CN202211514816A CN115541972A CN 115541972 A CN115541972 A CN 115541972A CN 202211514816 A CN202211514816 A CN 202211514816A CN 115541972 A CN115541972 A CN 115541972A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/22—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-emitting devices, e.g. LED, optocouplers
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Abstract
The invention is suitable for the technical field of circuit sampling, and particularly relates to a direct-current voltage isolation sampling method, which comprises the following steps: acquiring sampling pulses of the sampled direct-current voltage; processing the sampling pulse according to a preset sampling value conversion algorithm; and outputting the sampled direct-current voltage value obtained after the processing. The invention also provides a DC voltage isolation sampling device and a circuit. According to the direct-current voltage isolation sampling method provided by the embodiment of the invention, the direct-current voltage signal of the circuit to be sampled is converted into the sampling pulse, and the sampling direct-current voltage value is calculated by adopting the algorithm meter through the sampling pulse, so that the sampling pulse is linearly changed, the precision is higher, the speed is high, the sampling circuit is simple, and the device cost is low.
Description
Technical Field
The invention belongs to the technical field of circuit sampling, and particularly relates to a direct-current voltage isolation sampling method, a direct-current voltage isolation sampling device and a direct-current voltage isolation sampling circuit.
Background
The direct-current voltage isolation sampling is to sample the direct-current voltage in a sampled circuit through a sampling isolation circuit, is used for acquiring the direct-current voltage value of the sampled circuit, and is electrically isolated from the sampling circuit by the sampling circuit.
At present, methods such as linear opto-coupler isolation, isolation amplifier isolation or serial interface isolation are generally adopted for direct current voltage isolation sampling.
The existing direct-current voltage isolation sampling method is low in sampling precision and high in sampling device cost.
Disclosure of Invention
The embodiment of the invention provides a direct-current voltage isolation sampling method, which aims to solve the problems of low sampling precision and high cost of a sampling device of the direct-current voltage isolation sampling method in the prior art.
The embodiment of the invention is realized in such a way that a direct-current voltage isolation sampling method is provided, which comprises the following steps:
acquiring sampling pulses of the sampled direct-current voltage;
processing the sampling pulse according to a preset sampling value conversion algorithm;
and outputting the sampled direct-current voltage value obtained after the processing.
The embodiment of the invention also provides a direct current voltage isolation sampling device, which comprises:
the sampling pulse acquisition unit is used for acquiring sampling pulses of the sampled direct-current voltage;
the computing unit is used for processing the sampling pulse according to a preset sampling value conversion algorithm;
and the output unit is used for outputting the sampled direct-current voltage value obtained after the processing.
The embodiment of the invention also provides a direct current voltage isolation sampling circuit, which comprises:
the triangular wave modulation module is used for generating a triangular wave modulation signal;
the sampling comparison module is connected with the triangular wave modulation module and the sampled circuit and used for acquiring a sampled direct current voltage signal and comparing the direct current voltage signal with the triangular wave modulation signal to generate an initial sampling pulse;
the optical coupling isolation module is connected with the sampling comparison module and is used for forming sampling pulses after the initial sampling pulses are subjected to optical coupling isolation;
and the MCU module is connected with the optical coupling isolation module and used for processing the sampling pulse according to a preset sampling value conversion algorithm and outputting a sampling direct-current voltage value.
In the embodiment of the invention, sampling pulses of sampled direct-current voltage are obtained; processing the sampling pulse according to a preset sampling value conversion algorithm; and outputting the sampled direct-current voltage value obtained after the processing. The direct-current voltage signal of the circuit to be sampled is converted into the sampling pulse, and the algorithm meter is adopted to calculate the sampling direct-current voltage value through the sampling pulse, so that the sampling pulse is linearly changed, the precision is high, the speed is high, the sampling circuit is simple, and the device cost is low.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required in the description of the embodiments or the prior art will be briefly described below. It is obvious that the drawings in the following description are only embodiments of the invention, and that other drawings can be derived from the provided drawings by a person skilled in the art without inventive effort.
Fig. 1 is a flowchart of a dc voltage isolation sampling method according to an embodiment of the present invention;
fig. 2 is a schematic diagram of sampling pulse acquisition in a dc voltage isolation sampling method according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating duty cycle calculation of a sampling pulse according to a DC voltage isolation sampling method provided by an embodiment of the present invention;
FIG. 4 is a flow chart of a DC voltage isolation sampling method according to another embodiment of the present invention;
fig. 5 is a block diagram of a dc voltage isolation sampling apparatus according to an embodiment of the present invention;
fig. 6 is a block diagram of a dc voltage isolation sampling apparatus according to another embodiment of the present invention;
fig. 7 is a circuit schematic diagram of a dc voltage isolation sampling circuit according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and do not limit the invention.
In the embodiment of the invention, sampling pulses of sampled direct-current voltage are obtained; processing the sampling pulse according to a preset sampling value conversion algorithm; and outputting the sampled direct-current voltage value obtained after the processing. The direct-current voltage isolation sampling method solves the problems that in the prior art, the direct-current voltage isolation sampling method is low in sampling precision and high in cost of a sampling device.
Fig. 1 shows a flow chart of a dc voltage isolation sampling method suitable for use in an embodiment of the present invention, which includes the following steps.
Step S101 acquires a sampling pulse of the sampled dc voltage.
In the embodiment of the present invention, in order to protect the secondary device, the dc voltage value in the sampled circuit generally cannot be directly sampled and acquired, and the sampled circuit needs to be electrically isolated from the sampling circuit. In order to realize the isolated sampling of the direct current voltage, the sampled direct current voltage signal is converted into a sampling pulse, and the sampling pulse is processed to obtain the sampled direct current voltage value. There are various methods for converting the sampled dc voltage signal into sampling pulses. For example, as shown in fig. 2, when the dc voltage signal is compared with the periodic triangular wave modulation signal, different dc voltages will generate different pulse duty widths, and when the dc voltage is high, a pulse with a narrower duty ratio is obtained compared with the triangular wave; when the direct-current voltage is lower, a pulse with a wider duty ratio is obtained by comparing the triangular wave, and the duty ratio width of the pulse is inversely proportional to the height of the direct-current voltage.
And S102, processing the sampling pulse according to a preset sampling value conversion algorithm.
In the embodiment of the present invention, after the sampling pulse of the sampled dc voltage is obtained, the sampling pulse needs to be further processed to obtain the dc voltage value of the sampled circuit. Therefore, the sampling pulse is isolated in a photoelectric coupling mode and then input into the MCU, and the MCU performs operation processing on the sampling pulse through a preset sampling value conversion algorithm to obtain a direct current voltage value of a sampled circuit. As one of ordinary skill in the art will appreciate, the sampling value conversion algorithm may be one or more, and any algorithm capable of converting the sampling pulse into a dc voltage value is within the scope of the present invention.
Preferably, the sampling value conversion algorithm needs to calculate the pulse duty ratio width of the sampling pulse, and the pulse duty ratio width of the sampling pulse is calculated by adopting a single chip timer. By using the pulse capture function of the timer of the single chip microcomputer, the sampling value of the voltage can be obtained by calculating the duty ratio width of the sampling pulse in the single chip microcomputer, so that the sampling of the direct-current voltage signal is realized, and the method is high in precision and high in speed. The timer of the singlechip for calculating the duty ratio width of the sampling pulse only needs to have the capture function. Preferably, the single chip microcomputer can adopt STM32 series.
Preferably, in order to accurately obtain the pulse duty cycle width of the sampling pulse, the timer of the single chip microcomputer is set to be in a double-edge triggering mode. For example, as shown in fig. 3, in the input capture mode, the single chip sets the timing to be TIM _ icpolicy _ bothoedge, that is, the rising edge and the falling edge both trigger double edges, and by detecting an edge signal of an input channel of the timer, when the edge signal jumps and falls, an interrupt is generated, and the count value TIMx _ CNT of the current timer is cleared. When the edge signal jumps to the rising edge, an interrupt is generated, and the value of the count value TIMx _ CNT of the current timer is read, which is the required value n for calculating the pulse duty cycle width.
Preferably, because the duty cycle width of the sampling pulse and the magnitude of the sampled dc voltage are linearly varied, the sampling value conversion algorithm is:
a sampling direct-current voltage value = (n-n 1) × u/(n 2-n 1);
wherein u is a preset voltage value, n1 is a reading value of the singlechip timer when the sampled direct-current voltage is 0V, n2 is a reading value of the singlechip timer when the sampled direct-current voltage is u, and n is a reading value of the singlechip timer of the real-time sampled direct-current voltage.
In the embodiment of the invention, the preset voltage value u can be set according to the sampling precision, for example, when the sampled direct current voltage given by the sampled circuit is 0V, the singlechip timer reads the sampling pulse duty ratio width value n1 (if the voltage at the lowest point of the triangular wave is 0V, the value of n1 is 0, and if the voltage at the lowest point of the triangular wave is negative pressure, 0V calibration is needed, and the principle can also sample negative voltage) and stores the sampling pulse duty ratio width value in the singlechip memory. The sampled direct current voltage is given to be 2.5V at the direct current sampling end (the 2.5V is a preset voltage value), the single chip timer reads the sampling pulse duty ratio width value to be n2, and the sampling pulse duty ratio width value is stored in the single chip memory. Then, it is known that the voltage value of the sampling value Liu represented by the unit number n is u/(n 2-n 1), and when the duty cycle width of the sampling pulse is (n-n 1), the sampling voltage value is (n-n 1) × u/(n 2-n 1).
And step S103, outputting the processed sampled direct-current voltage value.
In the embodiment of the invention, the sampling direct-current voltage value can be output after being calculated by a sampling value conversion algorithm. Preferably, in order to better manage and analyze the sampled dc voltage value, the sampled dc voltage value may be stored, or may be output or may form a voltage curve output display.
In summary, the dc voltage signal of the sampled circuit is converted into the sampling pulse by the above dc voltage isolation sampling method, and the sampling dc voltage value is calculated by the sampling pulse using the algorithm meter, so that the sampling pulse is linearly changed, and the method has the advantages of high precision, high speed, simple sampling circuit and low device cost.
Fig. 4 shows a flow chart of another dc voltage isolation sampling method applicable to the embodiment of the present invention, which further includes:
in step S1011, a sampled dc voltage signal is obtained.
In an embodiment of the present invention, the dc voltage signal is a dc voltage signal of a sampled circuit before isolated conversion.
Step S1012, comparing the dc voltage signal with the triangular wave modulation signal to obtain a sampling pulse.
In the embodiment of the invention, the triangular wave modulation signal is preset and used for being compared with the direct current voltage signal. The direct current voltage signal is compared with the triangular wave modulation signal, pulse square waves with a certain duty ratio width are generated at the output end of the comparator, and then the pulse duty ratio width signal is converted through optical coupling isolation to obtain sampling pulses, so that the sampling of the direct current voltage signal is realized. As shown in fig. 2, when the dc voltage is high, the dc voltage is compared with the triangular wave to obtain a pulse with a relatively narrow duty ratio, and when the dc voltage is low, a pulse with a relatively wide duty ratio is obtained. The duty cycle width of the pulse is inversely proportional and linearly varied with the voltage level.
When the direct current voltage signal is compared with the triangular wave modulation signal, if the triangular wave modulation signal voltage is lower than the direct current voltage signal voltage, the comparator outputs a low level; if the triangular wave modulation signal voltage is higher than the direct current voltage signal voltage, the comparator outputs a high level. Thus, the comparison result outputs a periodic pulse square wave, i.e., a sampling pulse, which varies according to the voltage level of the dc voltage signal. When the sampled direct current voltage signal is higher, the occupied width of n is wider, and conversely, the occupied width of n is narrower and is in a linear change relation.
Fig. 5 shows a block diagram of a dc voltage isolation sampling apparatus suitable for use in an embodiment of the present invention, including:
a sampling pulse acquiring unit 501, configured to acquire a sampling pulse of the sampled dc voltage.
In the embodiment of the present invention, in order to protect the secondary device, the dc voltage value in the sampled circuit generally cannot be directly sampled and acquired, and the sampled circuit needs to be electrically isolated from the sampling circuit. In order to implement isolated sampling of the dc voltage, the sampling pulse acquiring unit 501 converts a sampled dc voltage signal into a sampling pulse, and processes the sampling pulse to obtain a sampled dc voltage value. There are various methods for converting the sampled dc voltage signal into sampling pulses. For example, as shown in fig. 2, when the dc voltage signal is compared with the periodic triangular wave modulation signal, different dc voltages will generate different pulse duty cycle widths, and when the dc voltage is high, a pulse with a narrower duty cycle is obtained by comparing with the triangular wave modulation signal; when the direct current voltage is lower, a pulse with a wider duty ratio is obtained by comparing the triangular wave, and the duty ratio width of the pulse is inversely proportional to the height of the direct current voltage.
The calculating unit 502 is configured to process the sampling pulse according to a preset sampling value conversion algorithm.
In the embodiment of the present invention, after the sampling pulse of the sampled dc voltage is obtained, the sampling pulse needs to be further processed to obtain the dc voltage value of the sampled circuit. Therefore, the sampling pulse is isolated in a photoelectric coupling mode and then input into the calculating unit 502, and the calculating unit 502 performs operation processing on the sampling pulse through a preset sampling value conversion algorithm to obtain a direct-current voltage value of the sampled circuit. As one of ordinary skill in the art will appreciate, the sampling value conversion algorithm may be one or more, and any algorithm capable of converting the sampling pulse into a dc voltage value is within the scope of the present invention.
Preferably, the sampling value conversion algorithm needs to calculate the pulse duty ratio width of the sampling pulse, and the pulse duty ratio width of the sampling pulse is calculated by adopting a single chip timer. By using the pulse capture function of the timer of the single chip microcomputer, the sampling value of the voltage can be obtained by calculating the duty ratio width of the sampling pulse in the single chip microcomputer, so that the sampling of the direct-current voltage signal is realized, and the method is high in precision and high in speed. The timer of the singlechip for calculating the duty ratio width of the sampling pulse only needs to have a capturing function. Preferably, the single chip microcomputer can adopt STM32 series.
Preferably, in order to accurately obtain the pulse duty ratio width of the sampling pulse, the timer of the single chip microcomputer is set to be in a double-edge triggering mode. For example, as shown in fig. 3, in the input capture mode, the single chip sets the timing to be TIM _ icpolicy _ bothoedge, that is, the rising edge and the falling edge both trigger double edges, and by detecting an edge signal of an input channel of the timer, when the edge signal jumps and falls, an interrupt is generated, and the count value TIMx _ CNT of the current timer is cleared. When the edge signal jumps to the rising edge, an interrupt is generated, and the value of the count value TIMx _ CNT of the current timer is read, which is the required value n for calculating the pulse duty cycle width.
Preferably, because the duty cycle width of the sampling pulse and the magnitude of the sampled dc voltage are linearly varied, the sampling value conversion algorithm is:
a sampling direct-current voltage value = (n-n 1) × u/(n 2-n 1);
wherein u is a preset voltage value, n1 is a reading value of the singlechip timer when the sampled direct-current voltage is 0V, n2 is a reading value of the singlechip timer when the sampled direct-current voltage is u, and n is a reading value of the singlechip timer of the real-time sampled direct-current voltage.
In the embodiment of the present invention, the preset voltage value u may be set according to the sampling precision, for example, when the sampled dc voltage given by the sampled circuit is 0V, the single chip timer reads that the duty cycle width of the sampling pulse is n1 (if the voltage at the lowest point of the triangular wave is 0V, n1 is 0, and if the lowest point of the triangular wave is negative voltage, 0V calibration is required, which may also be a sampling negative voltage.) and stores the value in the single chip memory. The sampled direct current voltage is given to be 2.5V at the direct current sampling end (the 2.5V is a preset voltage value), the single chip timer reads the sampling pulse duty ratio width value to be n2, and the sampling pulse duty ratio width value is stored in the single chip memory. Then, it is known that the voltage value of the sampling value Liu represented by the unit number n is u/(n 2-n 1), and when the duty cycle width of the sampling pulse is (n-n 1), the sampling voltage value is (n-n 1) × u/(n 2-n 1).
And an output unit 503, configured to output the processed sampled dc voltage value.
In the embodiment of the present invention, the sampled dc voltage value calculated by the sampling value conversion algorithm may be output by the output unit 503. Preferably, in order to better manage and analyze the sampled dc voltage value, the sampled dc voltage value may be stored, or may be output and displayed or may form a voltage curve to be output and displayed.
In summary, the direct-current voltage isolation sampling device converts the direct-current voltage signal of the sampled circuit into the sampling pulse, and then the algorithm meter is adopted to calculate the sampling direct-current voltage value through the sampling pulse, so that the sampling pulse is linearly changed, the precision is high, the speed is high, the sampling circuit is simple, and the device cost is low.
Fig. 6 shows a block diagram of another dc voltage isolation sampling apparatus suitable for use in the embodiment of the present invention, the apparatus further includes:
the dc voltage signal obtaining module 601 is configured to obtain a sampled dc voltage signal.
In an embodiment of the present invention, the dc voltage signal is a dc voltage signal of a sampled circuit before isolation conversion.
And a sampling pulse obtaining module 602, configured to compare the dc voltage signal with the triangular wave modulation signal to obtain a sampling pulse.
In the embodiment of the invention, the triangular wave modulation signal is preset and is used for being compared with the direct current voltage signal. The sampling pulse acquisition module 602 compares the dc voltage signal with the triangular wave modulation signal to generate a pulse square wave with a certain duty ratio width, and then obtains a sampling pulse by optically coupled isolation conversion of the sampling pulse acquisition module 602 on the pulse duty ratio width signal, thereby realizing sampling of the dc voltage signal. As shown in fig. 2, when the dc voltage is high, the dc voltage is compared with the triangular wave to obtain a pulse with a relatively narrow duty ratio, and when the dc voltage is low, a pulse with a relatively wide duty ratio is obtained. The duty cycle width of the pulse is inversely proportional and linearly varied with the voltage level.
When the direct current voltage signal is compared with the triangular wave modulation signal, if the voltage of the triangular wave modulation signal is lower than the voltage of the direct current voltage signal, the comparator outputs low level; if the triangular wave modulation signal voltage is higher than the direct current voltage signal voltage, the comparator outputs a high level. Thus, the comparison result outputs a periodic pulse square wave, i.e., a sampling pulse, which varies according to the voltage level of the dc voltage signal. When the sampled direct current voltage signal is higher, the occupied width of n is wider, and conversely, the occupied width of n is narrower and is in a linear change relation.
Fig. 7 shows a schematic diagram of a dc voltage isolation sampling circuit to which an embodiment of the present invention is applied, including:
the triangular wave modulation module 1 is used for generating a triangular wave modulation signal; the triangular wave modulation module 1 is a triangular waveform generator, and the invention realizes triangular wave modulation by using as few elements as possible. For example, a 555 timer IC is adopted, and 2 resistors and two capacitors form a triangular wave generator circuit. The IC constitutes a square wave oscillator circuit whose 50% duty cycle is unstable, and outputs a square wave signal from 3 pins. And then outputs the triangular wave signal through an RC shaping circuit.
When the 555 timer square wave output goes high, C2 starts to charge through R2 and the C2 voltage increases. When the output of the circuit goes low, C2 begins to discharge through R2 and the C2 voltage drops. The waveform generated at both ends of C2 is triangular in shape.
The sampling comparison module 2 is connected with the triangular wave modulation module and the sampled circuit and is used for acquiring a sampled direct current voltage signal and comparing the direct current voltage signal with the triangular wave modulation signal to generate an initial sampling pulse;
and the optical coupling isolation module 3 is connected with the sampling comparison module and is used for isolating the initial sampling pulse through the optical coupling to form a sampling pulse. Preferably, the chip model of the optical coupling isolation module is 6N137
And the MCU module 4 is connected with the optical coupling isolation module and used for processing the sampling pulse according to a preset sampling value conversion algorithm and outputting a sampling direct-current voltage value.
The initial sampling pulse is converted into the sampling pulse through the optical coupling isolation module 3 and then input into the MCU module 4, the MCU module 4 adopts the single chip microcomputer to perform data processing, the pulse capture function of the timer of the single chip microcomputer is used, and the sampling direct current voltage value can be obtained by calculating the pulse duty ratio width of the sampling pulse in the single chip microcomputer. Therefore, the sampling of the direct-current voltage signal is realized, the precision is high, and the speed is high.
It will be appreciated by those skilled in the art that the above description of the dc voltage isolation sampling apparatus or circuit is merely an example, and is not intended to limit the dc voltage isolation sampling apparatus or circuit, and may include more or less components than those described, or some components may be combined, or different components may be included, such as input-output devices, memory devices, etc.
The integrated module/unit of the dc voltage isolation sampling device may be stored in a computer readable storage medium if it is implemented in the form of a software functional unit and sold or used as a stand-alone product. Based on such understanding, all or part of the functions of the units in the above embodiments may be implemented by a computer program, which may be stored in a computer-readable storage medium and used by a processor to implement the functions of the above embodiments. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A direct-current voltage isolation sampling method is characterized by comprising the following steps:
acquiring sampling pulses of the sampled direct-current voltage;
processing the sampling pulse according to a preset sampling value conversion algorithm;
and outputting the sampled direct-current voltage value obtained after the processing.
2. The isolated sampling method of claim 1, wherein the step of obtaining the sampling pulse of the sampled dc voltage specifically comprises:
acquiring a sampled direct-current voltage signal;
and comparing the direct current voltage signal with the triangular wave modulation signal to obtain a sampling pulse.
3. The isolated DC voltage sampling method according to claim 1, wherein the step of processing the sampling pulse according to a preset sampling value conversion algorithm comprises:
and calculating the pulse duty ratio width of the sampling pulse by adopting a singlechip timer.
4. The direct-current voltage isolation sampling method according to claim 3, wherein the single chip microcomputer adopts STM32 series.
5. The isolated sampling method of claim 3, wherein the one-chip timer is set to a double-edge triggered mode.
6. The isolated DC voltage sampling method according to claim 1, wherein the sampling value conversion algorithm is:
a sampling direct-current voltage value = (n-n 1) × u/(n 2-n 1);
wherein u is a preset voltage value, n1 is a reading value of the singlechip timer when the sampled direct-current voltage is 0V, n2 is a reading value of the singlechip timer when the sampled direct-current voltage is u, and n is a reading value of the singlechip timer of the real-time sampled direct-current voltage.
7. A DC voltage isolation sampling device, comprising:
the sampling pulse acquisition unit is used for acquiring sampling pulses of the sampled direct-current voltage;
the computing unit is used for processing the sampling pulse according to a preset sampling value conversion algorithm;
and the output unit is used for outputting the sampled direct-current voltage value obtained after the processing.
8. The dc voltage isolation sampling device according to claim 7, wherein the sampling pulse acquiring unit specifically comprises:
the direct current voltage signal acquisition module is used for acquiring a sampled direct current voltage signal;
and the sampling pulse acquisition module is used for comparing the direct-current voltage signal with the triangular wave modulation signal to obtain a sampling pulse.
9. A DC voltage isolation sampling circuit, comprising:
the triangular wave modulation module is used for generating a triangular wave modulation signal;
the sampling comparison module is connected with the triangular wave modulation module and the sampled circuit and is used for acquiring a sampled direct-current voltage signal and comparing the direct-current voltage signal with the triangular wave modulation signal to generate an initial sampling pulse;
the optical coupling isolation module is connected with the sampling comparison module and is used for forming sampling pulses after the initial sampling pulses are subjected to optical coupling isolation;
and the MCU module is connected with the optical coupling isolation module and used for processing the sampling pulse according to a preset sampling value conversion algorithm and outputting a sampling direct-current voltage value.
10. The direct-current voltage isolation sampling circuit according to claim 9, wherein the chip model of the optical coupling isolation module is 6N137.
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| CN117723812A (en) * | 2024-02-07 | 2024-03-19 | 中国铁塔股份有限公司 | Voltage isolation sampling circuit |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000304777A (en) * | 1999-04-20 | 2000-11-02 | Mitsubishi Heavy Ind Ltd | Dc voltage detecting device |
| JP2001281273A (en) * | 2000-03-31 | 2001-10-10 | Noritz Corp | Detection method for fan motor current and current detector |
| CN201589806U (en) * | 2009-12-10 | 2010-09-22 | 厦门科华恒盛股份有限公司 | Direct current isolation sampling device |
| CN205374571U (en) * | 2015-12-28 | 2016-07-06 | 上海致远绿色能源股份有限公司 | Keep apart sampling device |
| CN205861749U (en) * | 2016-07-13 | 2017-01-04 | 南京国电南自轨道交通工程有限公司 | A kind of high_voltage isolation DC voltage and current transmitter |
| CN207318569U (en) * | 2017-08-17 | 2018-05-04 | 深圳市科瑞爱特科技开发有限公司 | Direct current sample circuit |
| CN108627690A (en) * | 2018-04-03 | 2018-10-09 | 芜湖美的厨卫电器制造有限公司 | A kind of ac voltage detection circuit, detection method and detection device |
| CN113835038A (en) * | 2021-09-30 | 2021-12-24 | 中国船舶重工集团公司第七二四研究所 | Isolated sampling method applied to power supply |
| CN113866492A (en) * | 2021-09-17 | 2021-12-31 | 厦门市爱维达电子有限公司 | Linear isolation sampling method for direct-current voltage signal |
| CN215641494U (en) * | 2021-04-27 | 2022-01-25 | 潍柴动力股份有限公司 | High-voltage isolation sampling circuit |
-
2022
- 2022-11-30 CN CN202211514816.7A patent/CN115541972A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000304777A (en) * | 1999-04-20 | 2000-11-02 | Mitsubishi Heavy Ind Ltd | Dc voltage detecting device |
| JP2001281273A (en) * | 2000-03-31 | 2001-10-10 | Noritz Corp | Detection method for fan motor current and current detector |
| CN201589806U (en) * | 2009-12-10 | 2010-09-22 | 厦门科华恒盛股份有限公司 | Direct current isolation sampling device |
| CN205374571U (en) * | 2015-12-28 | 2016-07-06 | 上海致远绿色能源股份有限公司 | Keep apart sampling device |
| CN205861749U (en) * | 2016-07-13 | 2017-01-04 | 南京国电南自轨道交通工程有限公司 | A kind of high_voltage isolation DC voltage and current transmitter |
| CN207318569U (en) * | 2017-08-17 | 2018-05-04 | 深圳市科瑞爱特科技开发有限公司 | Direct current sample circuit |
| CN108627690A (en) * | 2018-04-03 | 2018-10-09 | 芜湖美的厨卫电器制造有限公司 | A kind of ac voltage detection circuit, detection method and detection device |
| CN215641494U (en) * | 2021-04-27 | 2022-01-25 | 潍柴动力股份有限公司 | High-voltage isolation sampling circuit |
| CN113866492A (en) * | 2021-09-17 | 2021-12-31 | 厦门市爱维达电子有限公司 | Linear isolation sampling method for direct-current voltage signal |
| CN113835038A (en) * | 2021-09-30 | 2021-12-24 | 中国船舶重工集团公司第七二四研究所 | Isolated sampling method applied to power supply |
Non-Patent Citations (1)
| Title |
|---|
| 范红刚等: "STM8单片机自学笔记", vol. 2, 北京航空航天大学出版社, pages: 153 - 154 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117723812A (en) * | 2024-02-07 | 2024-03-19 | 中国铁塔股份有限公司 | Voltage isolation sampling circuit |
| CN117723812B (en) * | 2024-02-07 | 2024-05-14 | 中国铁塔股份有限公司 | Voltage isolation sampling circuit |
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