CN115526540B - Method and device for evaluating electric life, computer readable medium and electronic equipment - Google Patents
Method and device for evaluating electric life, computer readable medium and electronic equipment Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 175
- 238000011156 evaluation Methods 0.000 claims abstract description 112
- 239000007769 metal material Substances 0.000 claims abstract description 22
- 238000002679 ablation Methods 0.000 claims description 57
- 238000003466 welding Methods 0.000 claims description 56
- 230000004927 fusion Effects 0.000 claims description 46
- 238000004364 calculation method Methods 0.000 claims description 20
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- 230000000694 effects Effects 0.000 abstract description 4
- 229910052709 silver Inorganic materials 0.000 description 21
- 239000004332 silver Substances 0.000 description 21
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 19
- 239000000463 material Substances 0.000 description 18
- 238000012545 processing Methods 0.000 description 15
- 230000003141 anti-fusion Effects 0.000 description 10
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- 238000004451 qualitative analysis Methods 0.000 description 2
- -1 silver ions Chemical class 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
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Abstract
The invention provides an electrical life assessment method, an electrical life assessment device, a computer readable medium and an electronic device, which are used for assessing the electrical life of a metal material contact in a contactor. The method for evaluating the electrical life comprises the following steps: reading contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process; analyzing an electrical life evaluation index of the contact according to the contact working parameters; and evaluating the electrical life of the contact through the electrical life evaluation index of the contact. Based on the scheme, the electric life of the contact in the contactor can be estimated by quantifying data, and the method has a great effect on improving the electric life capacity of a product.
Description
Technical Field
The present invention relates to the field of product evaluation technologies, and in particular, to an electrical lifetime evaluation method, an electrical lifetime evaluation device, a computer readable medium, and an electronic device.
Background
At present, silver-based materials are widely used as contacts of contactors, but different synthesis processes and addition of additives have great differences on fusion welding resistance, ablation resistance and the like of the contacts, and the differences have great influence on the electric life of products, so that how to identify the fusion welding resistance and the ablation resistance of the silver-based materials in the electric life process has great effect on how to improve the electric life capacity of the products.
Therefore, how to provide a method, a device, a computer readable medium and an electronic device for evaluating the electrical life of a metal material contact, so as to solve the defect that the prior art cannot evaluate the electrical life of the metal material contact by quantifying data, has been a technical problem solved by several points of those skilled in the art.
Disclosure of Invention
In view of the foregoing, the present invention provides a method, apparatus, computer-readable medium, and electronic device for evaluating electrical life, which are capable of evaluating electrical life of contacts in a contactor by quantifying data, and have a great effect on improving electrical life capability of a product.
In a first aspect, embodiments of the present invention provide a method for evaluating electrical life of a contact of a metallic material in a contactor; the method for evaluating the electrical life comprises the following steps: reading contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process; analyzing an electrical life evaluation index of the contact according to the contact working parameters; and evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
In one possible implementation, reading the contact operating parameters generated by the contact in different usage categories includes: reading the working parameters of the contact generated in the contact process of the contact; and/or reading the working parameters of the contact generated in the breaking process of the contact.
In one possible implementation, the contact operating parameters generated during contact of the contact include a voltage drop value generated during contact of the contact, a current generated during contact of the contact, and at least one voltage drop period; the pressure drop value generated in the contact process of the contact comprises a single-point bouncing pressure drop value or a double-point bouncing pressure drop value generated in the contact process of the contact; the contact working parameters generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, a current generated in the breaking process of the contact and at least one voltage drop time period. The contact operating parameters generated during contact of the contacts may assist in analyzing the electrical properties of the contacts of the silver-based material from a microscopic level for resistance to fusion welding. The contact working parameters generated in the breaking process of the contact can assist in analyzing the fusion welding resistance and ablation resistance of the contact of the silver-based material in the electrical performance from a microscopic level.
In one possible implementation, the electrical life assessment indicator of the contact includes an electrical life assessment indicator of the resistance of the contact to fusion welding; when the read contact working parameter is a contact working parameter generated in the contact process of the contact, analyzing an electric life evaluation index of the contact according to the contact working parameter, wherein the electric life evaluation index comprises the following steps: selecting a typical voltage value of a contact corresponding to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value in a contact process; wherein, the typical voltage value of the contact in the contact process corresponding to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of the fusion welding resistance of the contact corresponding to each pressure drop time period according to a typical voltage value of the contact in the contact process, current generated in the contact process and at least one pressure drop time period; and accumulating the electric life evaluation indexes of the contact fusion welding resistance corresponding to each pressure drop time period to form the electric life evaluation indexes of the contact fusion welding resistance. The fusion welding resistance of the contact can be accurately identified by analyzing the contact working parameters generated in the contact process of the contact.
In one possible implementation, the electrical life assessment indicator of the contact includes an electrical life assessment indicator that also includes contact ablation resistance; when the read contact working parameter is the contact working parameter generated in the breaking process of the contact, analyzing the electrical life evaluation index of the contact according to the contact working parameter, wherein the electrical life evaluation index comprises the following steps: determining a typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact; wherein, the typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of contact ablation resistance corresponding to each pressure drop time period according to a typical voltage value of the contact in a breaking process, current generated by the contact in the breaking process and at least one pressure drop time period; and accumulating the electric life evaluation indexes of the contact ablation resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact ablation resistance. The contact ablation resistance can be accurately identified by analyzing the contact working parameters generated in the breaking process of the contact.
In one possible implementation manner, the calculation manner of the electric life sub-evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop time period may adopt a manner of calculating the heat energy of each voltage drop time period in the contact connection process; according to a calculation formula of Joule heat, calculating heat energy of each pressure drop time period in the contact point switching-on process; the calculation mode of the electric life sub-evaluation index of the contact ablation resistance corresponding to each pressure drop time period can adopt a mode of calculating the heat energy of each pressure drop time period in the breaking process of the contact; and calculating the heat energy of each pressure drop time period of the contact in the breaking process according to a calculation formula of the Joule heat. The thermal energy of each pressure drop time period in the switching-on process and the thermal energy of each pressure drop time period in the breaking process can be accurately calculated by adopting a Joule heat calculation formula, so that the function of qualitatively analyzing the metal material in the electric life process is realized.
In one possible implementation, the joule heat calculation formula for calculating the thermal energy of each pressure drop period during the contact is:wherein (1)>Indicating the time period t of the voltage drop of the contact during the closing process n -t n+1 U1 represents a typical voltage value at which a contact corresponding to a single-point bounce voltage drop value is in contact, U2 represents a typical voltage value at which a contact corresponding to a double-point bounce voltage drop value is in contact, i (t) represents a voltage drop period t at which a contact is in contact n -t n+1 The generated current is n is greater than or equal to 1, and n is an odd number; m represents a turn-on process; the joule heat calculation formula for calculating the heat energy of each pressure drop time period in the breaking process of the contact is as follows: />Wherein (1)>Representing the time period t of voltage drop of the contact during breaking n -t n+1 U3 represents a typical voltage value corresponding to a voltage drop value generated during breaking of the contact, i (t) represents a voltage drop period t during breaking of the contact n -t n+1 The generated current, n is greater than or equal to 1, and n isAn odd number; b represents a breaking process. The thermal energy of each pressure drop time period in the switching-on process and the thermal energy of each pressure drop time period in the breaking process can be more accurately calculated by adopting an integral mode according to a calculation formula of the Joule heat.
In one possible implementation, estimating the electrical life of the contact by the electrical life estimation indicator of the contact includes: comparing the electric life evaluation index of the contact point anti-fusion welding performance with a preset anti-fusion welding performance evaluation index, and when the electric life evaluation index of the contact point anti-fusion welding performance is larger than the preset anti-fusion welding performance evaluation index, indicating that the electric life of the contact point is short, wherein the electric life evaluation index of the contact point anti-fusion welding performance is poorer.
In one possible implementation, the electrical life of the contact is estimated by an electrical life estimation indicator of the contact, further comprising: comparing the electrical life evaluation index of the contact ablation resistance with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the contact ablation resistance is larger than the preset ablation resistance evaluation index, indicating that the contact is poor in ablation resistance and the electrical life of the contact is short.
In a second aspect, an embodiment of the present invention provides an electrical lifetime assessment device, including: the reading module is used for reading contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process; the analysis module is used for analyzing the electrical life evaluation index of the contact according to the contact working parameters; and the evaluation module is used for evaluating the electrical life of the contact through the electrical life evaluation index of the contact. In a third aspect, embodiments of the present invention provide a computer readable medium having stored thereon computer readable instructions which, when executed by a processor, cause the processor to perform steps in the method of assessing electrical life.
In a fourth aspect, an embodiment of the present invention provides an electronic device, including: at least one memory configured to store computer readable code; at least one processor configured to invoke the computer readable code to perform the steps in the electrical life assessment method of any of claims 1-8.
Drawings
FIG. 1 is a flow chart of an exemplary electrical life assessment method provided by embodiments of the present application;
FIG. 2 is a schematic diagram of the parameters of the contact point generated during the contact process according to the embodiment of the present application;
FIG. 3 is a schematic diagram of the working parameters of the contact generated in the breaking process of the contact read by an oscilloscope in the embodiment of the application;
fig. 4 is a schematic structural view of an exemplary electrical life assessment device provided in an embodiment of the present application.
Fig. 5 is a schematic structural diagram of an exemplary electronic device according to an embodiment of the present application.
List of reference numerals:
400 electric life assessment device 401 reading module 402 analysis module
403 evaluation Module 500 electronic device 501 memory
502 processor
S101: reading contact operating parameters generated by contacts in different usage categories
S102: analyzing electrical life assessment index of contact according to contact working parameters
S103: evaluating the electrical life of a contact by means of an electrical life evaluation index of the contact
Detailed Description
In order to better understand the technical solutions in the embodiments of the present application, the following descriptions will clearly and in detail describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the embodiments of the present application shall fall within the scope of protection of the embodiments of the present application.
It should be understood that the terms "first," "second," and "third," etc. in the claims, specification and drawings of the present disclosure are used for distinguishing between different objects and not for describing a particular sequential order. The terms "comprises" and "comprising" when used in the specification and claims of the present disclosure, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the present disclosure is for the purpose of describing particular embodiments only, and is not intended to be limiting of the disclosure. As used in the specification and claims of this disclosure, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the term "and/or" as used in the present disclosure and claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.
Embodiments of the present application are further described below with reference to the accompanying drawings of embodiments of the present application.
The electrical life assessment method provided by the embodiment is used for assessing the electrical life of the metal material contact in the contactor, and the electrical life assessment method can assess the electrical life of the contact in the contactor through quantitative data, and has a great effect on improving the electrical life capacity of a product. Silver-based materials are currently widely used as contacts for contactors. Thus, the present embodiment is described taking the example of identifying the fusion welding resistance and the ablation resistance of the silver-based material contact during the electrical lifetime, but the present embodiment is not limited to identifying the silver-based material contact.
The execution subject of the electrical life assessment method provided by the embodiment of the application may be a computer device, including but not limited to a server, an industrial personal computer, a PC, and the like. In practical applications, the computer device is in communication with an oscilloscope.
Referring to FIG. 1, a flow chart of an exemplary electrical life assessment method is shown. As shown in fig. 1, the evaluation method of the electrical lifetime includes the steps of:
s101, reading contact working parameters generated by the contacts in different use categories.
In this embodiment, the different usage categories include a contact process and/or a breaking process. The contact operating parameters generated by the contacts in different use categories are read in an oscilloscope, such as the contact operating parameters generated by the contacts in the contact process shown in fig. 2, and such as the contact operating parameters generated by the contacts in the breaking process shown in fig. 3.
In order to more accurately identify the electrical life evaluation index of the contact, the embodiment S101 includes the following steps:
and reading the working parameters of the contact generated in the contact process and/or the working parameters of the contact generated in the breaking process. The contact working parameters generated in the contact process of the contact can be used for judging the fusion welding resistance of the contact (the fusion welding resistance mainly refers to the capability of normally opening the contact due to the fact that the contact surface is melted and condensed between the contacts caused by arc discharge and the like of the finger contact). The contact working parameters generated in the breaking process of the contact can be used for judging the ablation resistance of the contact (the ablation resistance mainly refers to the ablation resistance of flame and electric arc generated when the contact is resistant to breaking).
In an exemplary embodiment, the contact operating parameters generated during contact of the contact include a voltage drop value generated during contact of the contact, a current generated during contact of the contact, and at least one voltage drop period. The pressure drop value generated in the contact process of the contact comprises a single-point bouncing pressure drop value or a double-point bouncing pressure drop value generated in the contact process of the contact. In this embodiment, the contact operating parameters generated during contact of the contact may assist in analyzing the electrical properties of the contact of the silver-based material from a microscopic level for resistance to fusion welding.
The contact working parameters generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, a current generated in the breaking process of the contact and at least one voltage drop time period. In this embodiment, the contact operating parameters generated during breaking of the contact may assist in analyzing the electrical properties of the contact of the silver-based material from a microscopic level for resistance to fusion welding and ablation.
S102, analyzing an electrical life evaluation index of the contact according to the contact working parameters.
In this embodiment, the electrical life assessment indicator of the contact includes an electrical life assessment indicator of the resistance of the contact to fusion welding and/or an electrical life assessment indicator of the resistance of the contact to ablation.
In order to accurately identify the fusion welding resistance of the metal contact during the electrical lifetime, when the read contact operation parameter is the contact operation parameter generated during the contact process of the contact, the embodiment S102 includes the following steps:
S102A, selecting a typical voltage value corresponding to the contact in the contact process according to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value. Typical voltage values at which a contact is in contact, corresponding to a single point bounce voltage drop value or a double point bounce voltage drop value, are determined by the chemical characteristics of the contact metal material.
If the metal material is silver-based, the potential difference is positive aV and negative VbV based on the chemical characteristics of silver ions, so that the voltage drop value of single-point bouncing is only considered as a typical voltage value u1= (a+b) V during thermal energy calculation. Because the contact has two inlet ends and outlet ends, the typical voltage value U2 of the contact corresponding to the double-point bouncing voltage drop value is 2 (a+b) V.
S102B, respectively calculating each voltage drop time period according to the typical voltage value U1/U2 of the contact in the contact process, the current i (t) generated by the contact in the contact process and at least one voltage drop time period (referring to FIG. 2, each voltage drop time period comprises t 1 -t 2 ，t 3 -t 4 ，…，t n -t n+1 ) And (5) an electric life sub-evaluation index of the fusion welding resistance of the corresponding contact.
In an exemplary embodiment, the electrical life sub-evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop period may be calculated by calculating the thermal energy of each voltage drop period during the contact-on process.
In order to realize the function of changing qualitative analysis to quantitative analysis of the metal material in the electric life process. According to the calculation formula of the Joule heat, the embodiment calculates the heat energy of each pressure drop time period in the contact on process.
For example, calculate t during turn-on of silver-based material contacts 1 -t 2 The thermal energy of the pressure drop period is:
calculating t of silver-based material contact in the switching-on process 3 -t 4 The thermal energy of the pressure drop period is:
calculating t of silver-based material contact in the switching-on process n -t n+1 The thermal energy of the pressure drop time period is1 or more, and n is an odd number, < >>Indicating the time period t of the voltage drop of the contact during the closing process n -t n+1 U1 represents a typical voltage value at which a contact corresponding to a single-point bounce voltage drop value is in contact, U2 represents a typical voltage value at which a contact corresponding to a double-point bounce voltage drop value is in contact, i (t) represents a voltage drop period t at which a contact is in contact n -t n+1 The current generated, m, represents the turn-on process.
And S102C, accumulating the electric life sub-evaluation indexes of the contact fusion welding resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact fusion welding resistance.
Specifically, the electrical life evaluation index of the contact fusion welding resistance is:
in order to accurately identify the ablation resistance of the metal contact during the electrical lifetime, when the read contact operating parameter is the contact operating parameter generated by the contact during the breaking process, the embodiment S102 further includes the following steps:
and S102A', determining a typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact. The typical voltage value corresponding to the voltage drop value generated during breaking of the contact is determined by the chemical characteristics of the contact metal material.
If the metal material is a silver-based material, the potential difference is positive aV and negative bV of the cathode based on the chemical characteristics of silver ions. Therefore, the voltage only considers the typical voltage value (a+b) V when calculating the heat energy, and the typical voltage value U3 of the silver-based material contact in the contact process is 2 (a+b) V because the contact has two inlet ends and outlet ends.
S102B', according to the typical voltage value U3 of the contact in breaking process, the current i (t) generated by the contact in breaking process and at least one voltage drop time period (referring to figure 3, each voltage drop time period comprises t 1 -t 2 ，t 3 -t 4 ，…，t n -t n+1 ) And respectively calculating the electric life time evaluation index of the contact ablation resistance corresponding to each pressure drop time period.
In an exemplary embodiment, the electrical lifetime assessment index of the contact ablation resistance corresponding to each pressure drop time period may be calculated by calculating the thermal energy of each pressure drop time period in the breaking process of the contact.
Specifically, according to a joule heat calculation formula, the thermal energy of each pressure drop time period of the contact in the breaking process is calculated.
For example, calculate t during turn-on of silver-based material contacts 1 -t 2 The thermal energy of the pressure drop period is:
calculating t of silver-based material contact in the switching-on process 3 -t 4 At the time of pressure dropThe heat energy of the interval is as follows:
calculating t of silver-based material contact in the switching-on process n -t n+1 The thermal energy of the pressure drop time period is1 or more, and n is an odd number.
And S102C', accumulating the electric life evaluation indexes of the contact ablation resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact ablation resistance.
Specifically, the electrical life assessment index of contact ablation resistance is:
in the present embodiment, the function of performing qualitative analysis to quantitative analysis on the metallic material, for example, the silver-based material contact during the electric lifetime is achieved in the above-described manner. Based on the quantitative analysis, the problems of the contactor in different use categories can be solved more specifically, and the electric life capacity of the contacts in the contactor is improved in the most economical way.
S103, evaluating the electrical life of the contact through an electrical life evaluation index of the contact.
In an exemplary embodiment, S103 includes the following steps:
comparing the electric life evaluation index of the contact point anti-fusion welding performance with a preset anti-fusion welding performance evaluation index, and when the electric life evaluation index of the contact point anti-fusion welding performance is larger than the preset anti-fusion welding performance evaluation index, indicating that the electric life of the contact point is short, wherein the electric life evaluation index of the contact point anti-fusion welding performance is poorer. And comparing the electrical life evaluation index of the contact ablation resistance with a preset ablation resistance evaluation index, wherein when the electrical life evaluation index of the contact ablation resistance is larger than the preset ablation resistance evaluation index, the electrical life of the contact is poor, and the electrical life of the contact is short.
An embodiment of the present application further provides an electrical life assessment device, and referring to fig. 4, a schematic structural diagram of an exemplary electrical life assessment device is shown. As shown in fig. 4, the electrical lifetime assessment device 400 includes: a reading module 401, an analyzing module 402 and an evaluating module 403.
The reading module 401 is configured to read contact operating parameters generated by the contacts in different usage categories.
In this embodiment, the different usage categories include a contact process and/or a breaking process. The contact operating parameters generated by the contacts in different use categories are read in an oscilloscope, such as the contact operating parameters generated by the contacts in the contact process shown in fig. 2, and such as the contact operating parameters generated by the contacts in the breaking process shown in fig. 3.
In order to more accurately identify the electrical life evaluation index of the contact, the reading module 401 of this embodiment is specifically configured to read the contact working parameter generated in the contact process of the contact and/or read the contact working parameter generated in the breaking process of the contact.
The contact working parameters generated in the contact process of the contact can be used for judging the fusion welding resistance of the contact (the fusion welding resistance mainly refers to the capability of normally opening the contact due to the fact that the contact surface is melted and condensed between the contacts caused by arc discharge and the like of the finger contact). The contact working parameters generated in the breaking process of the contact can be used for judging the ablation resistance of the contact (the ablation resistance mainly refers to the ablation resistance of flame and electric arc generated when the contact is resistant to breaking).
In an exemplary embodiment, the contact operating parameters generated during contact of the contact include a voltage drop value generated during contact of the contact, a current generated during contact of the contact, and at least one voltage drop period. The pressure drop value generated in the contact process of the contact comprises a single-point bouncing pressure drop value or a double-point bouncing pressure drop value generated in the contact process of the contact.
The contact working parameters generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, a current generated in the breaking process of the contact and at least one voltage drop time period.
The analysis module 402 is configured to analyze an electrical life assessment indicator of the contact according to the contact operating parameter. In this embodiment, the electrical life assessment indicator of the contact includes an electrical life assessment indicator of the resistance of the contact to fusion welding and/or an electrical life assessment indicator of the resistance of the contact to ablation.
In order to accurately identify the fusion welding resistance of the metal contact during the electrical life, when the read contact working parameter is the contact working parameter generated during the contact process of the contact, the analysis module 402 is specifically configured to select a typical voltage value corresponding to the contact in the contact process according to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value. And respectively calculating electric life sub-evaluation indexes of the fusion welding resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the contact process, the current generated by the contact in the contact process and at least one voltage drop time period. And accumulating the electric life evaluation indexes of the contact fusion welding resistance corresponding to each pressure drop time period to form the electric life evaluation indexes of the contact fusion welding resistance. Wherein a typical voltage value at which a contact is in contact corresponding to a single point bounce voltage drop value or a double point bounce voltage drop value is determined by the chemical characteristics of the contact metal material.
In order to accurately identify the ablation resistance of the metal contact during the electrical lifetime, when the read contact operating parameter is a contact operating parameter generated during the breaking process of the contact, the analysis module 402 is specifically configured to determine a typical voltage value corresponding to the voltage drop value generated during the breaking process of the contact. And respectively calculating electric life sub-evaluation indexes of the contact ablation resistance corresponding to each pressure drop time period according to the typical voltage value of the contact in the breaking process, the current generated by the contact in the breaking process and at least one pressure drop time period. And accumulating the electric life evaluation indexes of the contact ablation resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact ablation resistance. Wherein a typical voltage value corresponding to a voltage drop value generated during breaking of the contact is determined by the chemical characteristics of the contact metal material.
In an exemplary embodiment, the electrical life sub-evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop period may be calculated by calculating the thermal energy of each voltage drop period during the contact-on process. According to a calculation formula of Joule heat, calculating heat energy of each pressure drop time period in the contact point switching-on process;
the calculation mode of the electrical life sub-evaluation index of the contact ablation resistance corresponding to each pressure drop time period can adopt a mode of calculating the heat energy of each pressure drop time period in the breaking process of the contact. And calculating the heat energy of each pressure drop time period of the contact in the breaking process according to a calculation formula of the Joule heat.
The evaluation module 403 is configured to evaluate the electrical life of the contact by an electrical life evaluation index of the contact.
In an exemplary embodiment, the evaluation module 403 is specifically configured to compare the electrical life evaluation index of the contact point resistance to the preset resistance evaluation index, and when the electrical life evaluation index of the contact point resistance to the fusion welding is greater than the preset resistance evaluation index, it indicates that the worse the resistance to the fusion welding is, the shorter the electrical life of the contact point is. And comparing the electrical life evaluation index of the contact ablation resistance with a preset ablation resistance evaluation index, wherein when the electrical life evaluation index of the contact ablation resistance is larger than the preset ablation resistance evaluation index, the electrical life of the contact is poor, and the electrical life of the contact is short.
It should be noted that, it should be understood that the division of the modules of the above apparatus is merely a division of a logic function, and may be fully or partially integrated into a physical entity or may be physically separated. The modules can be realized in a form of calling the processing element through software, can be realized in a form of hardware, can be realized in a form of calling the processing element through part of the modules, and can be realized in a form of hardware. For example: the x module may be a processing element which is independently set up, or may be implemented in a chip integrated in the device. The x module may be stored in the memory of the above device in the form of program codes, and the functions of the x module may be called and executed by a certain processing element of the above device. The implementation of the other modules is similar. All or part of the modules can be integrated together or can be implemented independently. The processing element described herein may be an integrated circuit having signal processing capabilities. In implementation, each step of the above method or each module above may be implemented by an integrated logic circuit of hardware in a processor element or an instruction in a software form. The above modules may be one or more integrated circuits configured to implement the above methods, for example: one or more application specific integrated circuits (Application Specific Integrated Circuit, ASIC for short), one or more microprocessors (Digital Singnal Processor, DSP for short), one or more field programmable gate arrays (Field Programmable Gate Array, FPGA for short), and the like. When a module is implemented in the form of a processing element scheduler code, the processing element may be a general-purpose processor, such as a central processing unit (Central Processing Unit, CPU) or other processor that may invoke the program code. These modules may be integrated together and implemented in the form of a System-on-a-chip (SOC) for short.
The embodiments also provide a computer readable medium having stored thereon computer readable instructions, which when executed by a processor, cause the processor to perform the steps in the method of assessing electrical life as described above.
The present application may be a system, method, and/or computer program product at any possible level of technical detail. The computer program product may include a computer readable storage medium having computer readable program instructions embodied thereon for causing a processor to implement aspects of the present application.
The computer readable storage medium may be a tangible device that can hold and store instructions for use by an instruction execution device. The computer readable storage medium may be, for example, but not limited to, an electronic storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: portable computer disks, hard disks, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static Random Access Memory (SRAM), portable compact disk read-only memory (CD-ROM), digital Versatile Disks (DVD), memory sticks, floppy disks, mechanical coding devices, punch cards or in-groove structures such as punch cards or grooves having instructions stored thereon, and any suitable combination of the foregoing. Computer-readable storage media, as used herein, are not to be construed as transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through waveguides or other transmission media (e.g., optical pulses through fiber optic cables), or electrical signals transmitted through wires.
The computer readable program described herein may be downloaded from a computer readable storage medium to a respective computing/processing device or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmissions, wireless transmissions, routers, firewalls, switches, gateway computers and/or edge servers. The network interface card or network interface in each computing/processing device receives computer readable program instructions from the network and forwards the computer readable program instructions for storage in a computer readable storage medium in the respective computing/processing device. Computer program instructions for carrying out operations of the present application may be assembly instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, integrated circuit configuration data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, c++ or the like and a procedural programming language such as the "C" language or similar programming languages. The computer readable program instructions may be executed entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the present application are implemented by personalizing electronic circuitry, such as programmable logic circuitry, field Programmable Gate Arrays (FPGAs), or Programmable Logic Arrays (PLAs), with state information for computer readable program instructions, which may execute the computer readable program instructions.
The embodiment of the application also provides electronic equipment 500. Fig. 5 is a schematic structural diagram of an exemplary electronic device according to the present application. As shown in fig. 5, the electronic device 500 comprises a processor 502 and a memory 501, the memory 501 having instructions stored therein, wherein the instructions when executed by the processor 502 implement the method as described above.
The at least one processor 502 may include, among other things, a microprocessor, an Application Specific Integrated Circuit (ASIC), a Digital Signal Processor (DSP), a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), a state machine, and the like. Examples of computer readable media include, but are not limited to, floppy diskettes, CD-ROMs, magnetic disks, memory chips, ROM, RAM, ASIC, configured processors, all-optical media, all-magnetic tape, or any other magnetic media, or any other media from which a computer processor can read instructions. In addition, various other forms of computer-readable media may transmit or carry instructions to a computer, including routers, private or public networks, or other wired and wireless transmission devices or channels. The instructions may include code in any computer programming language, including C, C ++, C language, visual Basic, java, and JavaScript.
The foregoing embodiments are merely illustrative of the principles of the present application and their effectiveness, and are not intended to limit the application. Modifications and variations may be made to the above-described embodiments by those of ordinary skill in the art without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications and variations which may be accomplished by persons skilled in the art without departing from the spirit and technical spirit of the disclosure be covered by the claims of this application.
Claims (10)
1. An electrical life assessment method is used for assessing the electrical life of a metal material contact in a contactor; the method for evaluating the electrical life comprises the following steps:
reading contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process;
analyzing an electrical life evaluation index of the contact according to the contact working parameters;
wherein the electrical life assessment indicator of the contact comprises an electrical life assessment indicator of the resistance of the contact to fusion welding; when the read contact working parameter is a contact working parameter generated in the contact process of the contact, analyzing an electric life evaluation index of the contact according to the contact working parameter, wherein the electric life evaluation index comprises the following steps: selecting a typical voltage value of a contact in a contact process according to a single-point bouncing voltage drop value or a double-point bouncing voltage drop value in the contact working parameters; wherein, the typical voltage value of the contact in the contact process corresponding to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of the fusion welding resistance of the contact corresponding to each pressure drop time period according to a typical voltage value of the contact in the contact process, current generated in the contact process and at least one pressure drop time period; accumulating the electric life sub-evaluation indexes of the contact fusion welding resistance corresponding to each pressure drop time period to form the electric life evaluation indexes of the contact fusion welding resistance;
the electrical life evaluation index of the contact point comprises an electrical life evaluation index of the contact point ablation resistance; when the read contact working parameter is the contact working parameter generated in the breaking process of the contact, analyzing the electrical life evaluation index of the contact according to the contact working parameter, wherein the electrical life evaluation index comprises the following steps: determining a typical voltage value corresponding to the contact point working parameter according to a voltage drop value generated in the breaking process of the contact point; wherein, the typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of contact ablation resistance corresponding to each pressure drop time period according to a typical voltage value of the contact in a breaking process, current generated by the contact in the breaking process and at least one pressure drop time period; accumulating the electric life sub-evaluation indexes of the contact ablation resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact ablation resistance;
and evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
2. The method for evaluating an electrical lifetime according to claim 1, wherein,
reading contact working parameters generated by the contacts in different use categories, including:
reading the working parameters of the contact generated in the contact process of the contact; and/or
And reading the working parameters of the contact generated in the breaking process of the contact.
3. The method for evaluating electric life according to claim 2, wherein,
the contact working parameters generated in the contact process of the contact comprise a voltage drop value generated in the contact process of the contact, a current generated in the contact process of the contact and at least one voltage drop time period; the pressure drop value generated in the contact process of the contact comprises a single-point bouncing pressure drop value or a double-point bouncing pressure drop value generated in the contact process of the contact;
the contact working parameters generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, a current generated in the breaking process of the contact and at least one voltage drop time period.
4. A method for evaluating an electrical lifetime according to claim 3, wherein,
the calculation mode of the electric life sub-evaluation index of the fusion welding resistance of the contact corresponding to each pressure drop time period adopts a mode of calculating the heat energy of each pressure drop time period in the contact connection process; according to a calculation formula of Joule heat, calculating heat energy of each pressure drop time period in the contact point switching-on process;
the calculation mode of the electric life sub-evaluation index of the contact ablation resistance corresponding to each pressure drop time period adopts a mode of calculating the heat energy of each pressure drop time period in the breaking process of the contact; and calculating the heat energy of the contact point in each pressure drop time period according to a calculation formula of the Joule heat.
5. A method for evaluating an electrical lifetime according to claim 3, wherein,
the joule heat calculation formula for calculating the heat energy of each pressure drop time period in the contact on process is as follows:
wherein (1)>Indicating the time period t of the voltage drop of the contact during the closing process n -t n+1 U1 represents a typical voltage value at which a contact corresponding to a single-point bounce voltage drop value is in contact, U2 represents a typical voltage value at which a contact corresponding to a double-point bounce voltage drop value is in contact, i (t) represents a voltage drop period t during which the contact is on n -t n+1 The generated current is n is greater than or equal to 1, and n is an odd number; m represents a turn-on process;
the joule heat calculation formula for calculating the heat energy of each pressure drop time period in the breaking process of the contact is as follows:
the method comprises the steps of carrying out a first treatment on the surface of the Wherein,representing the time period t of voltage drop of the contact during breaking q -t q+1 U3 represents a typical voltage value corresponding to the voltage drop value generated by the contact during breaking, i q (t) represents a time period t of voltage drop of the contact during breaking q -t q+1 The generated current, q is more than or equal to 1, and q is an odd number; b represents a breaking process.
6. A method for evaluating an electrical lifetime according to claim 3, wherein,
assessing the electrical life of the contact by the electrical life assessment index of the contact, comprising:
comparing the electric life evaluation index of the contact point fusion welding resistance with a preset fusion welding resistance evaluation index, and when the electric life evaluation index of the contact point fusion welding resistance is larger than the preset fusion welding resistance evaluation index, indicating that the contact point has poor fusion welding resistance and short electric life.
7. The method for evaluating electrical lifetime according to claim 5, wherein,
evaluating the electrical life of the contact by the electrical life evaluation index of the contact, further comprising:
comparing the electrical life evaluation index of the contact ablation resistance with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the contact ablation resistance is larger than the preset ablation resistance evaluation index, indicating that the contact is poor in ablation resistance and the electrical life of the contact is short.
8. An electrical life assessment device is used for assessing the electrical life of a metal material contact in a contactor; the electrical life assessment device comprises:
the reading module is used for reading contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process;
the analysis module is used for analyzing the electrical life evaluation index of the contact according to the contact working parameters; the electrical life evaluation index of the contact comprises an electrical life evaluation index of the resistance of the contact to fusion welding; when the read contact working parameters are the contact working parameters generated in the contact process of the contacts, the analysis module is used for selecting a typical voltage value corresponding to the single-point bouncing pressure drop value or the double-point bouncing pressure drop value in the contact working parameters in the contact process; wherein, the typical voltage value of the contact in the contact process corresponding to the single-point bouncing voltage drop value or the double-point bouncing voltage drop value is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of the fusion welding resistance of the contact corresponding to each pressure drop time period according to a typical voltage value of the contact in the contact process, current generated in the contact process and at least one pressure drop time period; accumulating the electric life sub-evaluation indexes of the contact fusion welding resistance corresponding to each pressure drop time period to form the electric life evaluation indexes of the contact fusion welding resistance;
the electrical life evaluation index of the contact point comprises an electrical life evaluation index of the contact point ablation resistance; when the read contact working parameters are the contact working parameters generated in the breaking process of the contacts, the analysis module is used for determining a typical voltage value corresponding to the contact working parameters according to the voltage drop value generated in the breaking process of the contacts in the contact working parameters; wherein, the typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material; respectively calculating electric life sub-evaluation indexes of contact ablation resistance corresponding to each pressure drop time period according to a typical voltage value of the contact in a breaking process, current generated by the contact in the breaking process and at least one pressure drop time period; accumulating the electric life sub-evaluation indexes of the contact ablation resistance corresponding to each voltage drop time period to form the electric life evaluation indexes of the contact ablation resistance;
and the evaluation module is used for evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
9. A computer-readable medium comprising a computer program product,
the computer readable medium having stored thereon computer readable instructions which, when executed by a processor, cause the processor to perform the steps in the electrical life assessment method according to any one of claims 1 to 7.
10. An electronic device, comprising:
at least one memory configured to store computer readable code;
at least one processor configured to invoke the computer readable code to perform the steps in the electrical life assessment method of any of claims 1-7.
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