CN115526540A - Method and device for evaluating electric life, computer readable medium and electronic equipment - Google Patents
Method and device for evaluating electric life, computer readable medium and electronic equipment Download PDFInfo
- Publication number
- CN115526540A CN115526540A CN202211333463.0A CN202211333463A CN115526540A CN 115526540 A CN115526540 A CN 115526540A CN 202211333463 A CN202211333463 A CN 202211333463A CN 115526540 A CN115526540 A CN 115526540A
- Authority
- CN
- China
- Prior art keywords
- contact
- voltage drop
- life
- generated
- electrical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 199
- 238000011156 evaluation Methods 0.000 claims abstract description 103
- 239000007769 metal material Substances 0.000 claims abstract description 17
- 238000002679 ablation Methods 0.000 claims description 54
- 238000003466 welding Methods 0.000 claims description 54
- 238000004364 calculation method Methods 0.000 claims description 22
- 230000004927 fusion Effects 0.000 claims description 21
- 239000000126 substance Substances 0.000 claims description 11
- 238000004458 analytical method Methods 0.000 claims description 7
- 238000004590 computer program Methods 0.000 claims description 4
- 230000000694 effects Effects 0.000 abstract description 4
- 229910052709 silver Inorganic materials 0.000 description 21
- 239000004332 silver Substances 0.000 description 21
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 19
- 239000000463 material Substances 0.000 description 18
- 238000012545 processing Methods 0.000 description 14
- 238000010586 diagram Methods 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- 230000006870 function Effects 0.000 description 4
- 238000004445 quantitative analysis Methods 0.000 description 4
- 238000010891 electric arc Methods 0.000 description 3
- 238000004451 qualitative analysis Methods 0.000 description 3
- 238000009833 condensation Methods 0.000 description 2
- 230000005494 condensation Effects 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- -1 silver ions Chemical class 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 235000019800 disodium phosphate Nutrition 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q10/00—Administration; Management
- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
- G06Q10/063—Operations research, analysis or management
- G06Q10/0639—Performance analysis of employees; Performance analysis of enterprise or organisation operations
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
- G06Q50/00—Information and communication technology [ICT] specially adapted for implementation of business processes of specific business sectors, e.g. utilities or tourism
- G06Q50/06—Energy or water supply
Landscapes
- Business, Economics & Management (AREA)
- Human Resources & Organizations (AREA)
- Engineering & Computer Science (AREA)
- Economics (AREA)
- Strategic Management (AREA)
- General Physics & Mathematics (AREA)
- Development Economics (AREA)
- Health & Medical Sciences (AREA)
- Educational Administration (AREA)
- Marketing (AREA)
- Entrepreneurship & Innovation (AREA)
- Theoretical Computer Science (AREA)
- Tourism & Hospitality (AREA)
- Physics & Mathematics (AREA)
- General Business, Economics & Management (AREA)
- Operations Research (AREA)
- Quality & Reliability (AREA)
- Game Theory and Decision Science (AREA)
- Public Health (AREA)
- Water Supply & Treatment (AREA)
- General Health & Medical Sciences (AREA)
- Primary Health Care (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention provides an electric life evaluation method, an electric life evaluation device, a computer readable medium and electronic equipment, which are used for evaluating the electric life of a metal material contact in a contactor. The method for evaluating the electrical life comprises the following steps: reading the contact working parameters generated by the contact in different use categories; the different categories of use include a contacting process and/or a breaking process; analyzing the electrical life evaluation index of the contact according to the contact working parameter; and evaluating the electrical life of the contact through the electrical life evaluation index of the contact. Based on the scheme, the electric service life of the contact in the contactor can be evaluated through quantitative data, and the method has a great effect on improving the electric service life capacity of products.
Description
Technical Field
The present invention relates to the field of product evaluation technologies, and in particular, to a method and an apparatus for evaluating an electrical lifetime, a computer-readable medium, and an electronic device.
Background
At present, silver-based materials are widely used as contacts of contactors, but different synthesis processes and addition of additives have great differences on the fusion welding resistance, the ablation resistance and the like of the contacts, and the differences have great influence on the electric life of products, so how to identify the fusion welding resistance and the ablation resistance of the silver-based material contacts in the process of the electric life has great effect on how to improve the electric life capacity of the products.
Therefore, how to provide a method, an apparatus, a computer-readable medium and an electronic device for evaluating electrical lifetime to solve the defect that the prior art cannot evaluate the electrical lifetime of a metal contact by quantifying data has become a technical problem that several points of the skilled person solve.
Disclosure of Invention
In view of the above, the present invention provides a method, an apparatus, a computer-readable medium, and an electronic device for evaluating an electrical lifetime, which can evaluate the electrical lifetime of a contact in a contactor by quantifying data, and have a great effect on improving the electrical lifetime capability of a product.
In a first aspect, embodiments of the present invention provide a method for evaluating electrical lifetime, which is used to evaluate electrical lifetime of a metallic material contact in a contactor; the method for evaluating the electrical life comprises the following steps: reading the contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process; analyzing the electrical life evaluation index of the contact according to the contact working parameter; and evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
In one possible implementation, reading the operating parameters of the contact generated by the contact in different usage categories includes: reading contact working parameters generated in the contact process of the contact; and/or reading the working parameters of the contact generated in the breaking process of the contact.
In a possible implementation manner, the working parameters of the contact generated when the contact is in the contact process include a voltage drop value generated when the contact is in the contact process, a current generated when the contact is in the contact process and at least one voltage drop time period; the pressure drop value generated in the contact process of the contact comprises a single-point bounce pressure drop value or a double-point bounce pressure drop value generated in the contact process of the contact; the working parameters of the contact generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, current generated in the breaking process of the contact and at least one voltage drop time period. The contact operating parameters generated during the contact-making process of the contact may assist in analyzing the resistance of the silver-based material contact to fusion welding in electrical performance from a microscopic level. The operating parameters of the contacts generated during the breaking process of the contacts can assist in analyzing the welding resistance and ablation resistance of the contacts of the silver-based material in the electrical performance from a microscopic level.
In one possible implementation, the electrical life assessment indicator of the contact includes an electrical life assessment indicator of the fusion welding resistance of the contact; when the read contact working parameters are the contact working parameters generated in the contact process of the contact, analyzing the electrical life evaluation indexes of the contact according to the contact working parameters, wherein the step comprises the following steps: selecting a typical voltage value corresponding to the single-point bounce voltage drop value or the double-point bounce voltage drop value in a contact process; the typical voltage value of the contact corresponding to the single-point bounce pressure drop value or the double-point bounce pressure drop value in the contact process is determined by the chemical characteristics of the contact metal material; respectively calculating the electric life electronic evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the contact process, the current generated by the contact in the contact process and at least one voltage drop time period; and accumulating the electric service life electronic evaluation indexes of the welding resistance of the contact corresponding to each voltage drop time period to form the electric service life evaluation index of the welding resistance of the contact. The welding resistance of the contact can be accurately identified by analyzing the contact working parameters generated in the contact process of the contact.
In one possible implementation, the electrical life assessment indicator for the contact includes an electrical life assessment indicator that also includes ablation resistance of the contact; when the read contact working parameters are generated in the breaking process of the contact, analyzing the electric service life evaluation index of the contact according to the contact working parameters, wherein the electric service life evaluation index comprises the following steps: determining a typical voltage value corresponding to a voltage drop value generated in the breaking process of the contact; the typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material; respectively calculating the electric service life electronic evaluation indexes of the ablation resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the breaking process, the current generated by the contact in the breaking process and at least one voltage drop time period; and accumulating the contact ablation resistance electric life sub-evaluation indexes corresponding to each voltage drop time period to form the contact ablation resistance electric life evaluation index. The ablation resistance of the contact can be accurately identified by analyzing the working parameters of the contact generated in the breaking process of the contact.
In a possible implementation manner, the calculation manner of the electronic service life evaluation index of the welding resistance of the contact corresponding to each voltage drop time period may be a manner of calculating the thermal energy of each voltage drop time period in the connection process of the contact; the thermal energy of each voltage drop time period of the contact in the connection process is calculated according to a calculation formula of joule heat; the calculation mode of the electronic service life evaluation index of the ablation resistance of the contact corresponding to each voltage drop time period can adopt a mode of calculating the thermal energy of each voltage drop time period in the breaking process of the contact; and calculating the heat energy of each voltage drop time period of the contact in the breaking process according to a calculation formula of the joule heat. The heat energy of each voltage drop time period in the switching-on process and the heat energy of each voltage drop time period in the breaking process can be accurately calculated by adopting a calculation formula of joule heat, so that the function of converting the qualitative analysis to the quantitative analysis of the metal material in the electric service life process is realized.
In one possible implementation manner, the joule heat calculation formula for calculating the heat energy of each voltage drop time period during the closing process of the contact is as follows:
wherein, the first and the second end of the pipe are connected with each other,
indicating the pressure drop time t of the contact in the closing process n -t n+1 U1 represents a typical voltage value of a contact point corresponding to a single-point bounce voltage drop value in a contact process, U2 represents a typical voltage value of a contact point corresponding to a double-point bounce voltage drop value in a contact process, i (t) represents a voltage drop time period t when the contact point is in the contact process n -t n+1 The generated current, n is more than or equal to 1 and is an odd number; m represents a switch-on process; the joule heat calculation formula for calculating the heat energy of each voltage drop time section in the breaking process of the contact is as follows:
wherein, the first and the second end of the pipe are connected with each other,
indicating the pressure drop time t of the contact in the breaking process n -t n+1 U3 represents a typical voltage value corresponding to the voltage drop value generated during the breaking process of the contact, i (t) represents the voltage drop time period t during the breaking process of the contact n -t n+1 The generated current, n is more than or equal to 1 and is an odd number; b represents the breaking process. The calculation formula of the joule heat can more accurately calculate the heat energy of each voltage drop time period in the switching-on process and the heat energy of each voltage drop time period in the breaking process by adopting an integral mode.
In one possible implementation, the evaluating the electrical life of the contact by the electrical life evaluation indicator of the contact includes: and comparing the electric service life evaluation index of the welding resistance of the contact with the preset welding resistance evaluation index, and when the electric service life evaluation index of the welding resistance of the contact is larger than the preset welding resistance evaluation index, indicating that the welding resistance of the contact is worse and the electric service life of the contact is short.
In one possible implementation, the evaluating the electrical life of the contact by the electrical life evaluation index of the contact further includes: and comparing the electrical life evaluation index of the ablation resistance of the contact with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the ablation resistance of the contact is greater than the preset ablation resistance evaluation index, indicating that the ablation resistance of the contact is poor and the electrical life of the contact is short.
In a second aspect, an embodiment of the present invention provides an apparatus for evaluating an electrical lifetime, including: the reading module is used for reading the contact working parameters generated by the contacts in different use categories; the different use categories comprise a contact process and/or a breaking process; the analysis module is used for analyzing the electric service life evaluation index of the contact according to the contact working parameters; and the evaluation module is used for evaluating the electrical life of the contact through the electrical life evaluation index of the contact. In a third aspect, the present invention provides a computer-readable medium, on which computer-readable instructions are stored, and when executed by a processor, the computer-readable instructions cause the processor to execute the steps in the method for evaluating electrical lifetime.
In a fourth aspect, an embodiment of the present invention provides an electronic device, including: at least one memory configured to store computer readable code; at least one processor configured to invoke the computer readable code to perform the steps in the method of assessing electrical lifetime of any one of claims 1 to 8.
Drawings
FIG. 1 is a schematic flow chart diagram illustrating an exemplary method for evaluating electrical lifetime provided by an embodiment of the present application;
FIG. 2 is a schematic diagram illustrating contact working parameters generated during a contact process of a contact according to an embodiment of the present application and read by an oscilloscope;
FIG. 3 is a schematic diagram of the contact working parameters read by an oscilloscope, generated in the breaking process of the contact according to the embodiment of the application;
fig. 4 is a schematic structural diagram of an exemplary electrical lifetime assessment apparatus provided in an embodiment of the present application.
Fig. 5 is a schematic structural diagram of an exemplary electronic device provided in an embodiment of the present application.
List of reference numerals:
400 electric life evaluation device 401 reading module 402 analysis module
403 evaluation module 500 electronic device 501 memory
502 processor
S101: reading operating parameters of contacts generated in different use categories
S102: analyzing electrical life assessment indicator of contact according to contact operating parameters
S103: evaluating electrical life of a contact by an electrical life assessment indicator of the contact
Detailed Description
In order to make the technical solutions in the embodiments of the present application better understood, the following will be combined with the present application
The technical solutions in the embodiments of the present application are clearly and specifically described in the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application shall fall within the scope of the protection of the embodiments in the present application.
It should be understood that the terms "first," "second," and "third," etc. in the claims, description, and drawings of the present disclosure are used to distinguish between different objects and not to describe a particular order. The terms "comprises" and "comprising," when used in the specification and claims of this disclosure, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the disclosure herein is for the purpose of describing particular embodiments only, and is not intended to be limiting of the disclosure. As used in the specification and claims of this disclosure, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It should be further understood that the term "and/or" as used in the specification and claims of this disclosure refers to any and all possible combinations of one or more of the associated listed items and includes such combinations.
The following further describes specific implementations of embodiments of the present application with reference to the drawings of the embodiments of the present application.
The method for evaluating the electric life is used for evaluating the electric life of the metal material contact in the contactor, and the method for evaluating the electric life can evaluate the electric life of the contact in the contactor through quantitative data, and has a great effect on improving the electric life capability of a product. Silver-based materials are currently widely used as contacts for contactors. Therefore, the present embodiment is described by taking as an example the resistance to fusion welding and the ablation resistance of the silver-based material contact during the electrical life, but the present embodiment is not limited to only the identification of the silver-based material contact.
The execution main body of the method for evaluating the electric life provided by the embodiment of the application can be computer equipment, and the computer equipment comprises but is not limited to a server, an industrial personal computer, a PC and the like. In practical applications, the computer device needs to be connected to an oscilloscope in a communication manner.
Referring to fig. 1, a flow chart of an exemplary method for electrical lifetime assessment is shown. As shown in fig. 1, the method for evaluating the electrical lifetime includes the steps of:
and S101, reading the operating parameters of the contact generated in different use categories.
In this embodiment, the different categories of use include a contacting process and/or a breaking process. The working parameters of the contacts generated in different use categories are read in an oscilloscope, such as the working parameters of the contacts generated in the contact process of the contacts shown in fig. 2, and the working parameters of the contacts generated in the breaking process of the contacts shown in fig. 3.
In order to more accurately identify the electrical life evaluation index of the contact, the present embodiment S101 includes the following steps:
and reading the contact working parameters generated by the contact in the contact process and/or reading the contact working parameters generated by the contact in the breaking process. The contact working parameters generated in the contact process of the contact can be used for judging the fusion welding resistance of the contact (the fusion welding resistance mainly refers to the capability of the finger contact for resisting arc and other discharge and normal disconnection caused by joule heat due to the melting of the contact surface and condensation between contacts). The working parameters of the contact generated in the breaking process of the contact can be used for judging the ablation resistance of the contact (the ablation resistance mainly refers to the ablation resistance of flame and electric arc generated when the contact is broken).
In an exemplary embodiment, the operating parameters of the contact that occur during the contact of the contact include a voltage drop value that occurs during the contact of the contact, a current that occurs during the contact of the contact, and at least one voltage drop time period. The pressure drop value generated in the contact process of the contact comprises a single-point bounce pressure drop value or a double-point bounce pressure drop value generated in the contact process of the contact. In this embodiment, the operating parameters of the contact that are generated during the contact-making process of the contact may assist in analyzing the resistance of the silver-based material contact to fusion welding in electrical performance from a microscopic level.
The working parameters of the contact generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, current generated in the breaking process of the contact and at least one voltage drop time period. In this embodiment, the operating parameters of the contact generated during the breaking process of the contact can assist in analyzing the welding resistance and ablation resistance of the silver-based material contact in the electrical property from the microscopic level.
And S102, analyzing the electrical life evaluation index of the contact according to the contact working parameter.
In this embodiment, the electrical life assessment indicator for the contact includes an electrical life assessment indicator for the resistance of the contact to welding and/or an electrical life assessment indicator for the resistance of the contact to ablation.
In order to accurately identify the fusion welding resistance of the metal contact in the electrical life process, when the read contact operating parameters are the contact operating parameters generated in the contact process of the contact, the step S102 of this embodiment includes the following steps:
and S102A, selecting a typical voltage value corresponding to the single-point bounce voltage drop value or the double-point bounce voltage drop value in the contact process. The typical voltage value of the contact point in the contact process corresponding to the single-point bounce pressure drop value or the double-point bounce pressure drop value is determined by the chemical characteristics of the contact point metal material.
If the metal material is a silver-based material, the potential difference is positive at the anode aV and negative at the cathode VbV based on the chemical characteristics of silver ions, and therefore, only the typical voltage value U1= (a + b) V is considered as the voltage drop value of single point bounce in the calculation of thermal energy. Because the contact has two wire inlet ends and two wire outlet ends, the typical voltage value U2 of the contact corresponding to the double-point bounce voltage drop value is 2 (a + b) V.
S102B, respectively calculating each voltage drop time period according to the typical voltage value U1/U2 of the contact in the contact process, the current i (t) generated in the contact process of the contact and at least one voltage drop time period (see fig. 2, each voltage drop time period comprises t 1 -t 2 ，t 3 -t 4 ，…，t n -t n+1 ) Electrical lifetime electronic evaluation of the corresponding contact resistance to welding.
In an exemplary embodiment, the electronic evaluation index of the welding resistance of the contact corresponding to each voltage drop time period may be calculated by calculating the thermal energy of the contact for each voltage drop time period during the connection process.
In order to realize the function of converting the qualitative analysis to the quantitative analysis of the metal material in the electric life process. In the embodiment, the thermal energy of each voltage drop time period during the contact connection process is calculated according to a calculation formula of joule heat.
For example, calculating t during the closing process of a silver-based material contact 1 -t 2 The thermal energy for the pressure drop period is:
calculating t of silver-based material contact in connection process 3 -t 4 The thermal energy for the pressure drop period is:
…
calculating t of silver-based material contact in connection process n -t n+1 The heat energy of the pressure drop period is
Greater than or equal to 1, and n is an odd number,
indicating the pressure drop time t of the contact in the closing process n -t n+1 U1 represents a typical voltage value of a contact point in a contact process corresponding to a single-point bounce voltage drop value, and U2 represents a typical voltage value of a contact point in a contact process corresponding to a double-point bounce voltage drop valueTypical voltage values of the contact in the contact process, i (t) represents the voltage drop time t of the contact in the contact process n -t n+1 The resulting current, m, represents the switching-on process.
And S102C, accumulating the electric life electronic evaluation indexes of the contact fusion welding resistance corresponding to each voltage drop time period to form the electric life evaluation index of the contact fusion welding resistance.
Specifically, the electrical life evaluation indicators of the contact fusion welding resistance are:
in order to accurately identify the ablation resistance of the metal contact in the electrical life process, when the read contact working parameter is a contact working parameter generated in the contact breaking process, the step S102 of this embodiment further includes the following steps:
and S102A', determining a typical voltage value corresponding to the voltage drop value generated in the contact breaking process. The typical voltage value corresponding to the value of the voltage drop generated by the contact during breaking is determined by the chemical characteristics of the metallic material of the contact.
If the metal material is silver-based, the potential difference is positive anode aV and negative cathode bV based on the chemical characteristics of silver ions. Therefore, only the typical voltage value (a + b) V is considered in the voltage during the calculation of the heat energy, and the typical voltage value U3 of the silver-based material contact in the contact process is 2 (a + b) V due to the fact that the contact has two wire inlet ends and wire outlet ends.
S102B', according to a typical voltage value U3 of the contact in the breaking process, the current i (t) generated in the breaking process of the contact and at least one voltage drop time period (refer to fig. 3, each voltage drop time period comprises t 1 -t 2 ，t 3 -t 4 ，…，t n -t n+1 ) And respectively calculating the electronic service life evaluation indexes of the ablation resistance of the contact corresponding to each voltage drop time period.
In an exemplary embodiment, the calculation of the electronic life evaluation index of the ablation resistance of the contact corresponding to each voltage drop time period may adopt a manner of calculating the thermal energy of each voltage drop time period in the breaking process of the contact.
Specifically, according to a calculation formula of joule heat, the heat energy of each voltage drop time period in the breaking process of the contact is calculated.
For example, calculating t during the closing process of a silver-based material contact 1 -t 2 The thermal energy for the pressure drop period is:
calculating t of silver-based material contact in connection process 3 -t 4 The thermal energy for the pressure drop period is:
…
calculating t of silver-based material contact in connection process n -t n+1 The heat energy of the pressure drop period is
1 or more, and n is an odd number.
And S102C', accumulating the contact ablation resistance electric life sub-evaluation indexes corresponding to each voltage drop time period to form the contact ablation resistance electric life evaluation index.
Specifically, the electrical life evaluation index of the ablation resistance of the contact is as follows:
in the embodiment, the function of converting the qualitative analysis to the quantitative analysis of the metal material, for example, the silver-based material contact in the electric life process is realized through the mode. Based on the quantitative analysis, the problems of the contactor in different use categories can be solved more pertinently, and the electrical service life capability of the contact in the contactor is improved in the most economical mode.
And S103, evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
In an exemplary embodiment, S103 includes the following steps:
and comparing the electric life evaluation index of the welding resistance of the contact with the preset welding resistance evaluation index, and when the electric life evaluation index of the welding resistance of the contact is greater than the preset welding resistance evaluation index, indicating that the welding resistance of the contact is worse and the electric life of the contact is short. And comparing the electrical life evaluation index of the ablation resistance of the contact with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the ablation resistance of the contact is greater than the preset ablation resistance evaluation index, indicating that the ablation resistance of the contact is poor and the electrical life of the contact is short.
An electrical lifetime assessment apparatus is further provided in the embodiments of the present application, please refer to fig. 4, which is a schematic structural diagram of an exemplary electrical lifetime assessment apparatus. As shown in fig. 4, the apparatus 400 for evaluating electrical life includes: a reading module 401, an analysis module 402 and an evaluation module 403.
The reading module 401 is configured to read operating parameters of the contacts generated in different usage categories.
In this embodiment, the different categories of use include a contacting process and/or a breaking process. The working parameters of the contacts generated in different use categories are read in an oscilloscope, such as the working parameters of the contacts generated in the contact process of the contacts shown in fig. 2, and the working parameters of the contacts generated in the breaking process of the contacts shown in fig. 3.
In order to more accurately identify the electrical life evaluation index of the contact, the reading module 401 of this embodiment is specifically configured to read a contact operating parameter generated by the contact in a contacting process and/or read a contact operating parameter generated by the contact in a breaking process.
The contact working parameters generated in the contact process of the contact can be used for judging the fusion welding resistance of the contact (the fusion welding resistance mainly refers to the capability of the finger contact for resisting the melting of the contact surface and the condensation between the contacts caused by electric discharge such as electric arc and joule heat so as to normally open). The working parameters of the contact generated in the breaking process of the contact can be used for judging the ablation resistance of the contact (the ablation resistance mainly refers to the ablation resistance of flame and electric arc generated when the contact is broken).
In an exemplary embodiment, the operating parameters of the contact that occur during the contact of the contact include a voltage drop value that occurs during the contact of the contact, a current that occurs during the contact of the contact, and at least one voltage drop time period. The pressure drop value generated in the contact process of the contact comprises a single-point bounce pressure drop value or a double-point bounce pressure drop value generated in the contact process of the contact.
The working parameters of the contact generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, current generated in the breaking process of the contact and at least one voltage drop time period.
The analysis module 402 is configured to analyze an electrical life assessment indicator of the contact according to the contact operating parameter. In this embodiment, the electrical life assessment indicator for the contact includes an electrical life assessment indicator for contact fusion weld resistance and/or an electrical life assessment indicator for contact erosion resistance.
In order to accurately identify the fusion welding resistance of the metal contact in the electrical life process, when the read contact operating parameter is a contact operating parameter generated in the contact process of the contact, the analysis module 402 is specifically configured to select a typical voltage value corresponding to the single-point bounce pressure drop value or the double-point bounce pressure drop value in the contact process of the contact. And respectively calculating the electric service life electronic evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the contact process, the current generated in the contact process of the contact and at least one voltage drop time period. And accumulating the electric service life electronic evaluation indexes of the welding resistance of the contact corresponding to each voltage drop time period to form the electric service life evaluation index of the welding resistance of the contact. Wherein, the typical voltage value of the contact point in the contact process corresponding to the single-point bounce pressure drop value or the double-point bounce pressure drop value is determined by the chemical characteristics of the contact point metal material.
In order to accurately identify the ablation resistance of the metal contact in the process of the electrical life, when the read contact working parameter is a contact working parameter generated in the breaking process of the contact, the analysis module 402 is specifically configured to determine a typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact. And respectively calculating the electronic service life evaluation indexes of the ablation resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the breaking process, the current generated by the contact in the breaking process and at least one voltage drop time period. And accumulating the contact ablation resistance electric life sub-evaluation indexes corresponding to each voltage drop time period to form the contact ablation resistance electric life evaluation index. Wherein, the typical voltage value corresponding to the pressure drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material.
In an exemplary embodiment, the electronic evaluation index of the welding resistance of the contact corresponding to each voltage drop time period may be calculated by calculating the thermal energy of the contact for each voltage drop time period during the connection process. Calculating the heat energy of each voltage drop time period in the connection process of the contact according to a calculation formula of the Joule heat;
the calculation mode of the electronic service life evaluation index of the ablation resistance of the contact corresponding to each voltage drop time period can adopt a mode of calculating the thermal energy of each voltage drop time period in the breaking process of the contact. And calculating the heat energy of each voltage drop time period of the contact in the breaking process according to a calculation formula of the joule heat.
The evaluation module 403 is used for evaluating the electrical life of the contact by the electrical life evaluation index of the contact.
In an exemplary embodiment, the evaluation module 403 is specifically configured to compare the electrical lifetime evaluation index of the welding resistance of the contact with a preset welding resistance evaluation index, and when the electrical lifetime evaluation index of the welding resistance of the contact is greater than the preset welding resistance evaluation index, it indicates that the poorer the welding resistance of the contact, the shorter the electrical lifetime of the contact. And comparing the electrical life evaluation index of the ablation resistance of the contact with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the ablation resistance of the contact is greater than the preset ablation resistance evaluation index, indicating that the ablation resistance of the contact is poor and the electrical life of the contact is short.
It should be noted that the division of the modules of the above apparatus is only a logical division, and the actual implementation may be wholly or partially integrated into one physical entity, or may be physically separated. And the modules can be realized in a form that all the modules are called by the processing element through software, can also be realized in a form that all the modules are called by the hardware, can also be realized in a form that part of the modules are called by the processing element through software, and can also be realized in a form that part of the modules are called by the hardware. For example: the x module can be a separately established processing element, and can also be integrated in a certain chip of the device. In addition, the x-module may be stored in the memory of the apparatus in the form of program codes, and may be called by a certain processing element of the apparatus to execute the functions of the x-module. The other modules are implemented similarly. All or part of the modules can be integrated together or can be independently realized. The processing element described herein may be an integrated circuit having signal processing capabilities. In implementation, each step of the above method or each module above may be implemented by an integrated logic circuit of hardware in a processor element or an instruction in the form of software. These above modules may be one or more integrated circuits configured to implement the above methods, such as: one or more Application Specific Integrated Circuits (ASICs), one or more microprocessors (DSPs), one or more Field Programmable Gate Arrays (FPGAs), and the like. When some of the above modules are implemented in the form of a Processing element scheduler code, the Processing element may be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. These modules may be integrated together and implemented in the form of a System-on-a-chip (SOC).
An embodiment of the present application further provides a computer readable medium, which has computer readable instructions stored thereon, and when executed by a processor, causes the processor to execute the steps in the method for evaluating electrical lifetime as described above.
The present application may be embodied as systems, methods, and/or computer program products, in any combination of technical details. The computer program product may include a computer-readable storage medium having computer-readable program instructions embodied therewith for causing a processor to implement various aspects of the present application.
The computer-readable storage medium may be a tangible device that can hold and store the instructions for use by the instruction execution device. The computer readable storage medium may be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a Static Random Access Memory (SRAM), a portable compact disc read-only memory (CD-ROM), a Digital Versatile Disc (DVD), a memory stick, a floppy disk, a mechanical coding device, such as punch cards or in-groove projection structures having instructions stored thereon, and any suitable combination of the foregoing. Computer-readable storage media as used herein is not to be construed as transitory signals per se, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through a waveguide or other transmission medium (e.g., optical pulses through a fiber optic cable), or electrical signals transmitted through electrical wires.
The computer readable program described herein may be downloaded from a computer readable storage medium to a respective computing/processing device, or to an external computer or external storage device over a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives the computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in a computer-readable storage medium in the respective computing/processing device. Computer program instructions for carrying out operations of the present application may be assembler instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, integrated circuit configuration data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C + + or the like and procedural programming languages, such as the "C" programming language or similar programming languages. The computer-readable program instructions may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, aspects of the present application are implemented by personalizing an electronic circuit, such as a programmable logic circuit, a Field Programmable Gate Array (FPGA), or a Programmable Logic Array (PLA), with state information of computer-readable program instructions, which can execute the computer-readable program instructions.
The embodiment of the present application further provides an electronic device 500. FIG. 5 is a schematic diagram of an exemplary electronic device according to the present application. As shown in fig. 5, the electronic device 500 comprises a processor 502 and a memory 501, the memory 501 having stored therein instructions, wherein the instructions, when executed by the processor 502, implement the method as described above.
Among other things, the at least one processor 502 may include a microprocessor, an Application Specific Integrated Circuit (ASIC), a Digital Signal Processor (DSP), a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), a state machine, and so forth. Examples of computer readable media include, but are not limited to, floppy diskettes, CD-ROMs, magnetic disks, memory chips, ROMs, RAMs, ASICs, configured processors, all-optical media, all-magnetic tape or other magnetic media, or any other medium from which a computer processor can read instructions. In addition, various other forms of computer-readable media may transmit or carry instructions to a computer, including a router, private or public network, or other wired or wireless transmission device or channel. The instructions may include code in any computer programming language, including C, C + +, C, visual Basic, java, and JavaScript.
The above embodiments are merely illustrative of the principles and utilities of the present application and are not intended to limit the application. Any person skilled in the art can modify or change the above-described embodiments without departing from the spirit and scope of the present application. Accordingly, it is intended that all equivalent modifications or changes which may be made by those skilled in the art without departing from the spirit and technical spirit of the present disclosure be covered by the claims of the present application.
Claims (12)
1. An electric life evaluation method is used for evaluating the electric life of a metal material contact in a contactor; the method for evaluating the electrical life comprises the following steps:
reading the contact working parameters generated by the contacts in different use categories; the different categories of use include a contacting process and/or a breaking process;
analyzing the electrical life evaluation index of the contact according to the contact working parameter;
and evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
2. The method of evaluating electrical life according to claim 1,
reading the operating parameters of the contact point generated by the contact point in different use categories, comprising the following steps:
reading contact working parameters generated in the contact process of the contact; and/or
And reading the working parameters of the contact generated in the breaking process of the contact.
3. The method of evaluating electrical life according to claim 2,
the working parameters of the contact generated in the contact process of the contact comprise a voltage drop value generated in the contact process of the contact, current generated in the contact process of the contact and at least one voltage drop time period; the pressure drop value generated in the contact process of the contact comprises a single-point bounce pressure drop value or a double-point bounce pressure drop value generated in the contact process of the contact;
the working parameters of the contact generated in the breaking process of the contact comprise a voltage drop value generated in the breaking process of the contact, current generated in the breaking process of the contact and at least one voltage drop time period.
4. The method of evaluating electrical life according to claim 3,
the electric life evaluation index of the contact comprises an electric life evaluation index of the fusion welding resistance of the contact;
when the read contact working parameters are generated in the contact process of the contact, analyzing the electric service life evaluation indexes of the contact according to the contact working parameters, wherein the steps comprise:
selecting a typical voltage value of a contact corresponding to the single-point bounce voltage drop value or the double-point bounce voltage drop value in a contact process according to the single-point bounce voltage drop value or the double-point bounce voltage drop value; the typical voltage value of the contact corresponding to the single-point bounce pressure drop value or the double-point bounce pressure drop value in the contact process is determined by the chemical characteristics of the contact metal material;
respectively calculating the electric life electronic evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the contact process, the current generated by the contact in the contact process and at least one voltage drop time period;
and accumulating the electric service life electronic evaluation indexes of the welding resistance of the contact corresponding to each voltage drop time period to form the electric service life evaluation index of the welding resistance of the contact.
5. The method of evaluating electrical life according to claim 4,
the electrical life assessment indicator of the contact comprises an electrical life assessment indicator further comprising ablation resistance of the contact;
when the read contact working parameters are the contact working parameters generated in the breaking process of the contact, analyzing the electrical life evaluation indexes of the contact according to the contact working parameters, wherein the evaluation indexes comprise:
determining a typical voltage value corresponding to a voltage drop value generated in the breaking process of the contact; the typical voltage value corresponding to the voltage drop value generated in the breaking process of the contact is determined by the chemical characteristics of the contact metal material; respectively calculating the electric service life electronic evaluation indexes of the ablation resistance of the contact corresponding to each voltage drop time period according to the typical voltage value of the contact in the breaking process, the current generated by the contact in the breaking process and at least one voltage drop time period;
and accumulating the contact ablation resistance electric life sub-evaluation indexes corresponding to each voltage drop time period to form the contact ablation resistance electric life evaluation index.
6. The method of evaluating electrical life according to claim 5,
the calculation mode of the electronic service life evaluation index of the fusion welding resistance of the contact corresponding to each voltage drop time period can adopt a mode of calculating the heat energy of each voltage drop time period in the connection process of the contact; calculating the heat energy of each voltage drop time period in the connection process of the contact according to a calculation formula of the Joule heat;
the calculation mode of the electronic service life evaluation index of the ablation resistance of the contact corresponding to each voltage drop time period can adopt a mode of calculating the thermal energy of each voltage drop time period in the breaking process of the contact; and calculating the heat energy of the contact in each voltage drop time period according to a calculation formula of the joule heat.
7. The method of evaluating electrical life according to claim 4,
the joule heat calculation formula for calculating the heat energy of each voltage drop time period in the contact connection process is as follows:
the joule heat calculation formula for calculating the heat energy of each voltage drop time section in the breaking process of the contact is as follows:
8. The method of evaluating electrical life according to claim 5,
evaluating the electrical life of a contact by an electrical life assessment indicator of the contact, comprising:
and comparing the electric service life evaluation index of the welding resistance of the contact with the preset welding resistance evaluation index, and when the electric service life evaluation index of the welding resistance of the contact is larger than the preset welding resistance evaluation index, indicating that the welding resistance of the contact is worse and the electric service life of the contact is short.
9. The method of evaluating electrical life according to claim 7,
evaluating the electrical life of the contact by an electrical life evaluation indicator of the contact, further comprising:
and comparing the electrical life evaluation index of the ablation resistance of the contact with a preset ablation resistance evaluation index, and when the electrical life evaluation index of the ablation resistance of the contact is greater than the preset ablation resistance evaluation index, indicating that the ablation resistance of the contact is poor and the electrical life of the contact is short.
10. An electrical lifetime assessment apparatus comprising:
the reading module is used for reading the contact working parameters generated by the contacts in different use categories; the different categories of use include a contacting process and/or a breaking process;
the analysis module is used for analyzing the electrical life evaluation index of the contact according to the contact working parameter;
and the evaluation module is used for evaluating the electrical life of the contact through the electrical life evaluation index of the contact.
11. A computer-readable medium having stored thereon a computer program product,
the computer readable medium has stored thereon computer readable instructions which, when executed by a processor, cause the processor to carry out the steps in the method of assessing electrical lifetime according to any one of claims 1 to 9.
12. An electronic device, comprising:
at least one memory configured to store computer readable code;
at least one processor configured to invoke the computer readable code to perform the steps in the method of assessing electrical lifetime of any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211333463.0A CN115526540B (en) | 2022-10-28 | 2022-10-28 | Method and device for evaluating electric life, computer readable medium and electronic equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211333463.0A CN115526540B (en) | 2022-10-28 | 2022-10-28 | Method and device for evaluating electric life, computer readable medium and electronic equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115526540A true CN115526540A (en) | 2022-12-27 |
| CN115526540B CN115526540B (en) | 2024-02-23 |
Family
ID=84704084
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211333463.0A Active CN115526540B (en) | 2022-10-28 | 2022-10-28 | Method and device for evaluating electric life, computer readable medium and electronic equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115526540B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100027259A (en) * | 2008-09-02 | 2010-03-11 | 한국전기연구원 | System for predicting life time of arcing contacts in vacuum circuit breaker and method thereof |
| CN102706498A (en) * | 2012-05-16 | 2012-10-03 | 昆明贵研金峰科技有限公司 | Disconnected electrical contact fusion welding force detection device and method |
| CN106093769A (en) * | 2016-06-29 | 2016-11-09 | 中国西电电气股份有限公司 | A kind of analysis method of arc-extinguishing chamber of circuit breaker electric life |
| CN110824267A (en) * | 2018-08-10 | 2020-02-21 | 深圳市虹鹏能源科技有限责任公司 | Information processing method and device and energy storage system |
| CN113567785A (en) * | 2021-07-24 | 2021-10-29 | 福州大学 | Intelligent electromagnetic appliance performance evaluation method and system |
| CN114035032A (en) * | 2021-09-15 | 2022-02-11 | 国营芜湖机械厂 | Airplane alternating current contactor full-life experiment platform and characteristic parameter extraction method |
-
2022
- 2022-10-28 CN CN202211333463.0A patent/CN115526540B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100027259A (en) * | 2008-09-02 | 2010-03-11 | 한국전기연구원 | System for predicting life time of arcing contacts in vacuum circuit breaker and method thereof |
| CN102706498A (en) * | 2012-05-16 | 2012-10-03 | 昆明贵研金峰科技有限公司 | Disconnected electrical contact fusion welding force detection device and method |
| CN106093769A (en) * | 2016-06-29 | 2016-11-09 | 中国西电电气股份有限公司 | A kind of analysis method of arc-extinguishing chamber of circuit breaker electric life |
| CN110824267A (en) * | 2018-08-10 | 2020-02-21 | 深圳市虹鹏能源科技有限责任公司 | Information processing method and device and energy storage system |
| CN113567785A (en) * | 2021-07-24 | 2021-10-29 | 福州大学 | Intelligent electromagnetic appliance performance evaluation method and system |
| CN114035032A (en) * | 2021-09-15 | 2022-02-11 | 国营芜湖机械厂 | Airplane alternating current contactor full-life experiment platform and characteristic parameter extraction method |
Non-Patent Citations (2)
| Title |
|---|
| 曲炳锋 等: "接触器在电动机控制中触头熔焊分析与研究", 《低压电器》, no. 02, pages 5 - 8 * |
| 牟明川 等: "无极性直流微型断路器电寿命评估研究", 《电气技术》, no. 3, pages 11 - 16 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115526540B (en) | 2024-02-23 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20220014556A1 (en) | Cybersecurity profiling and rating using active and passive external reconnaissance | |
| CN108737155A (en) | Network state is assessed | |
| CN113168473A (en) | Network utilization-based network security vulnerability classification and repair | |
| CN108876464B (en) | Cheating behavior detection method and device, service equipment and storage medium | |
| JP6413537B2 (en) | Predictive failure notification device, predictive notification method, predictive notification program | |
| KR101046752B1 (en) | Transformer life assessment method | |
| CN113326181A (en) | Fuzzy test method, device and storage medium for stateful network protocol | |
| CN110932894A (en) | Network fault positioning method and device of cloud storage system and electronic equipment | |
| CN109818808B (en) | Fault diagnosis method and device and electronic equipment | |
| CN115526540A (en) | Method and device for evaluating electric life, computer readable medium and electronic equipment | |
| KR101215800B1 (en) | System and method for evaluating integrity of Gas Insulated Switchgear | |
| Helbig et al. | Selecting and prioritizing material resources by criticality assessments | |
| CN112308455B (en) | Root cause positioning method, root cause positioning device, root cause positioning equipment and computer storage medium | |
| CN111044859A (en) | GIS equipment fault processing method, storage medium and equipment | |
| KR101632532B1 (en) | Method and Apparatus for Measurement of Relay Contacts | |
| JP4794503B2 (en) | Method for measuring contact resistance and method for estimating remaining life of electrical equipment | |
| US20200396737A1 (en) | Configuring an hvac wireless communication device | |
| CN115184808A (en) | Battery thermal runaway risk detection method, device, equipment and computer storage medium | |
| CN114641045A (en) | Power transmission line communication channel switching method and system based on communication quality perception | |
| CN113805050A (en) | Phase selection closing angle monitoring method and device, computer equipment and storage medium | |
| CN111858782A (en) | Database construction method, device, medium and equipment based on information security | |
| CN103760322A (en) | Method of evaluating working condition of insulating oil of power transformer | |
| CN113572865B (en) | Dual-stack flow switching method, device, storage medium and equipment | |
| CN117349710B (en) | Method for predicting breaking capacity of vacuum arc-extinguishing chamber, electronic equipment and medium | |
| CN112213634B (en) | Method and device for detecting running state of circuit breaker |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |