CN115508671B - Fault positioning method and system based on line voltage lowest point calculation - Google Patents

Fault positioning method and system based on line voltage lowest point calculation Download PDF

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CN115508671B
CN115508671B CN202211401819.XA CN202211401819A CN115508671B CN 115508671 B CN115508671 B CN 115508671B CN 202211401819 A CN202211401819 A CN 202211401819A CN 115508671 B CN115508671 B CN 115508671B
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calculation
curve
line
point
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CN115508671A (en
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张永伍
姚程
王刚
陈涛
贺春
刘涛
陈亮
王洋
袁中琛
黄潇潇
杨畅
赵玉新
李大勇
时燕新
马红祥
彭桂喜
何佳伟
李斌
胡泽鹏
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State Grid Corp of China SGCC
State Grid Tianjin Electric Power Co Ltd
Electric Power Research Institute of State Grid Tianjin Electric Power Co Ltd
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State Grid Corp of China SGCC
State Grid Tianjin Electric Power Co Ltd
Electric Power Research Institute of State Grid Tianjin Electric Power Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
    • G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
    • G01R31/085—Locating faults in cables, transmission lines, or networks according to type of conductors in power transmission or distribution lines, e.g. overhead
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/08—Locating faults in cables, transmission lines, or networks
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    • Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
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    • Y04S10/50—Systems or methods supporting the power network operation or management, involving a certain degree of interaction with the load-side end user applications
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Abstract

The invention discloses a fault positioning method and a fault positioning system based on voltage lowest point calculation along a line, wherein the method comprises the steps of performing voltage calculation along the line based on a Bergeron model, and performing complex integral calculation in a unit data window to obtain a voltage distribution curve; and calculating a voltage distribution curve, and performing fault location judgment on the line according to the calculation result of the voltage distribution curve. The invention is less influenced by fault transient process and line distributed capacitance, has higher fault positioning speed and precision, is hardly influenced by different fault moments, and greatly improves the fault location accuracy of the long-distance transmission line.

Description

Fault positioning method and system based on line voltage lowest point calculation
Technical Field
The invention relates to the technical field of power system relay protection, in particular to a fault positioning method and system based on line voltage lowest point calculation.
Background
With the development of economy, the demand for long-distance and large-range power transmission is increased, and meanwhile, high-voltage power transmission lines are widely distributed, and the terrain of a crossing area is complex and changeable. The fault location is rapidly and accurately carried out after the transmission line has a fault, so that the fault is rapidly repaired, the stability of a power system is improved, and the fault location method is also very important for normal operation of national economy.
The single-ended impedance method for fault location only needs to measure information of one end of the power transmission line, and has the advantages of low requirement on hardware, easiness in implementation, stable algorithm and the like, so that the method is widely applied. The traditional fault location uses a line model based on centralized parameters, and when the fault location is applied to a longer power transmission line, the influence of line distributed capacitance becomes non-negligible, and a larger error is caused to the remote fault location precision. Therefore, it is very important to research a fault location model and algorithm suitable for long lines and improve the precision of fault location.
Disclosure of Invention
The invention aims to provide a fault location method and a fault location system based on the calculation of the lowest point of the voltage along the line, which are less influenced by the fault transient process and the distributed capacitance of the line, have higher fault location speed and precision, are hardly influenced by different fault moments, and greatly improve the fault location accuracy of a long-distance power transmission line
In order to achieve the above object, the present invention provides a fault location method based on the calculation of the lowest point of the line voltage, which comprises:
performing voltage calculation along the line based on the Bergeron model, and performing complex integral calculation in a unit data window to obtain a voltage distribution curve;
and calculating a voltage distribution curve, and performing fault location judgment on the line according to the calculation result of the voltage distribution curve.
Further, the obtaining of the voltage distribution curve includes,
determining the starting time of the complex integral calculation according to the full length of the line;
and determining a line fault phase through a phase selection element based on the initial moment, and calculating a voltage distribution curve of the corresponding fault phase through a Bergeron model according to the voltage and the current obtained by sampling.
Further, the starting time should satisfy the following condition:
Figure 558200DEST_PATH_IMAGE001
（1）
wherein the content of the first and second substances,t 1 which is indicative of the time of the start,lin order to obtain the full length of the line,
Figure 793003DEST_PATH_IMAGE002
representing the mode wave velocity.
Further, the voltage distribution curve is:
Figure 324479DEST_PATH_IMAGE003
（2）
wherein the content of the first and second substances,U inte (x) Which represents the curve of the voltage distribution,xindicating the distance, Δ, of any point on the line from the protective mountingTWhich represents the time between the sampling of the samples,urepresenting the instantaneous voltage at a point on the line,t 1 indicating a starting time within a unit data window,t 2 indicating the stop time within a unit data window,Nis shown in (t 2 -t 1 ) The number of voltage samples in the period;iindicating the number of calculations of the voltage profile.
Further, calculating a voltage distribution curve, and performing fault location judgment on the line according to the calculation result of the voltage distribution curve, including,
calculating the required line step length according to the Bergeron model, and determining the sampling rate and the interpolation mode of the line protection device;
calculating instantaneous values of step voltages of all points of a line from the initial time to the stopping time in a fault phase unit data window by using a Bergeron model;
and (4) calculating the integral value of the voltage of each point through the voltage distribution curve, comparing and judging to obtain the minimum point of the voltage integral value, and confirming the fault point.
Further, the calculating the required line step according to the berelon model includes,
the line step is obtained by:
Figure 277522DEST_PATH_IMAGE004
（3）
wherein, the first and the second end of the pipe are connected with each other,
Figure 123118DEST_PATH_IMAGE005
represents a line step, <' > based on>
Figure 602641DEST_PATH_IMAGE006
Representing the velocity of the mode wave, ΔTRepresenting the sampling interval time.
Furthermore, the integral value of the voltage of each point is obtained through a voltage distribution curve for comparison and judgment, the minimum point of the voltage integral value is obtained, the fault point is confirmed, and the method comprises the following steps of,
selecting calculation interval time, and calculating a voltage distribution curve every other calculation interval time to obtain a complete complex voltage integral curve;
defining a comparison window
Figure 180384DEST_PATH_IMAGE007
I.e. each calculation will have the latest successive->
Figure 745358DEST_PATH_IMAGE007
Carrying out cyclic comparison judgment on the integral value of the secondary complex voltage integral curve;
after calculating the initial time, continuously carrying out the operation of the complex voltage integral curve
Figure 129066DEST_PATH_IMAGE007
Starting the first judgment after the secondary calculation;
defining a time window for overall computationt set When the fault positioning judgment condition is not met and the current time is less than the time windowt set And then, along with the increase of the current moment, the complete cyclic judgment calculation of the complex voltage integral curve is continuously carried out.
Further, selecting calculation interval time, calculating a voltage distribution curve every other calculation interval time to obtain a complete complex voltage integral curve, including,
before each time of calculating the voltage distribution curve, obtaining the current time according to the calculation interval time and the initial time;
the current time is obtained by:
Figure 338461DEST_PATH_IMAGE008
（3）
wherein the content of the first and second substances,tas the current time of day, the time of day,t 1 which indicates the starting moment in time of the day,nis shown asnThe sub-cycle calculates a complex voltage integral curve,Δ tthe table calculates the interval time.
Furthermore, after the initial time is calculated, the voltage integral curve is continuously repeated
Figure 211739DEST_PATH_IMAGE009
Starting the first judgment after the second calculation, and judging the firstnUpon sub-calculation of a complex voltage integration curve>
Figure 467271DEST_PATH_IMAGE009
Whether or not it is greater than or equal ton：
If it is
Figure 326774DEST_PATH_IMAGE010
Then continue to return to executenCalculating a voltage integral curve repeatedly for +1 times and entering judgment cycle calculation again;
if it is
Figure 984152DEST_PATH_IMAGE011
If so, judge thatnAnd whether a plurality of minimum value points exist in the complex voltage integral curve obtained by secondary calculation or not.
Further, if
Figure 28331DEST_PATH_IMAGE012
If so, it is judged asnWhether a plurality of minimum value points exist in the complex voltage integral curve obtained by the secondary calculation or not comprises,
if there are multiple minimum values in the said integrated curve, define the firstnThe minimum value point with the minimum integral value in the complex voltage integral curve obtained by the secondary calculation is
Figure 771159DEST_PATH_IMAGE013
The next smallest extreme point of the integration value is->
Figure 168773DEST_PATH_IMAGE014
Judgment is made>
Figure 742974DEST_PATH_IMAGE015
And/or>
Figure 895738DEST_PATH_IMAGE016
Whether or not the integrated value of (b) satisfies a determination condition; wherein the content of the first and second substances,
when in use
Figure 797966DEST_PATH_IMAGE017
And &>
Figure 327168DEST_PATH_IMAGE016
When the integrated value of (b) does not satisfy the determination condition:
if the current time of the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set If yes, the loop is exited and the fault location is not possible;
when in use
Figure 755875DEST_PATH_IMAGE017
And &>
Figure 79540DEST_PATH_IMAGE016
If the integrated value of (a) meets the decision condition, then the comparison window is compared for consecutive @>
Figure 734643DEST_PATH_IMAGE009
And judging the minimum value point of the secondary composite voltage integral curve.
Further, the judgment is made by the following formula
Figure 801956DEST_PATH_IMAGE017
And/or>
Figure 85170DEST_PATH_IMAGE016
Whether or not the integrated value of (b) satisfies the determination condition:
Figure 845316DEST_PATH_IMAGE018
（4）
wherein, the first and the second end of the pipe are connected with each other,
Figure 456557DEST_PATH_IMAGE019
represents the minimum point in the duplicated voltage integration curve>
Figure 389878DEST_PATH_IMAGE020
Based on the value integrated in>
Figure 465281DEST_PATH_IMAGE021
Represents the next smallest extreme point in the duplicated voltage integration curve>
Figure 334011DEST_PATH_IMAGE016
Is greater than or equal to>
Figure 760444DEST_PATH_IMAGE022
And the setting value which excludes other minimum value point interference is judged.
Further, if
Figure 231877DEST_PATH_IMAGE009
＜nIf so, it is judged asnWhether a plurality of minimum value points exist in the complex voltage integral curve obtained by the secondary calculation or not comprises,
if the plurality of minimum value points do not exist in the complex voltage integral curve, judging whether the complex voltage integral curve has one minimum value point or not; wherein the content of the first and second substances,
when the complex voltage integral curve has one and only one minimum value point, the continuous comparison window is compared
Figure 427366DEST_PATH_IMAGE023
Judging minimum value points of the secondary repetition voltage integral curve;
when there is no minimum point on the complex voltage integral curve:
if the current time of the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set The loop exits and the fault location is deemed to be impossible.
Further, the continuity in the comparison window is compared by the following formula
Figure 466998DEST_PATH_IMAGE009
And (3) judging minimum value points of the secondary complex voltage integral curve:
Figure 115148DEST_PATH_IMAGE024
（5）
wherein the content of the first and second substances,x n representing continuities within a comparison window
Figure 390271DEST_PATH_IMAGE009
The minimum point of the second-time-multiplexed voltage integral curve,x i is shown asiAs a result of the secondary fault location,ithe number of calculations for fault location.
Further, when the comparison window is continuous
Figure 705846DEST_PATH_IMAGE009
When the minimum value point of the secondary multiplexing voltage integral curve meets the condition of a judgment formula, determining that the calculated value of the fault distance is greater or less than the preset value>
Figure 650799DEST_PATH_IMAGE025
；
When continuous in the comparison window
Figure 51825DEST_PATH_IMAGE009
When the minimum value point of the secondary complex voltage integral curve does not meet the condition of the judgment formula; wherein, the first and the second end of the pipe are connected with each other,
if the current time of the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set And the calculation range of the output fault distance is the minimum value point of the complex voltage integral curve in the comparison time window
Figure 576043DEST_PATH_IMAGE026
To a maximum minimum point->
Figure 683808DEST_PATH_IMAGE027
。
The invention also provides a fault positioning system based on the calculation of the lowest point of the line voltage, which comprises a calculating unit and a judging unit,
the calculating unit is used for performing voltage calculation along the line based on the Bergeron model and performing complex integration in a unit data window to obtain a voltage distribution curve;
and the judging unit is used for calculating a voltage distribution curve and carrying out fault positioning judgment on the line according to the result of the voltage distribution curve.
Further, the calculating unit is configured to determine a starting time of the complex integral calculation according to the full length of the line;
the calculating unit is used for determining a fault phase through the phase selection element based on the initial moment, and calculating a voltage distribution curve of the corresponding fault phase through the Bergeron model according to the sampled voltage and current.
Further, the determination unit is configured to calculate a required line step length according to the berelon model, and determine a sampling rate and an interpolation mode of the line protection device;
calculating instantaneous values of step voltages of all points of a line from the initial time to the stopping time in a fault phase unit data window by using a Bergeron model;
and (4) calculating the integral value of the voltage of each point through the voltage distribution curve, comparing and judging to obtain the minimum point of the voltage integral value, and confirming the fault point.
The invention has the technical effects and advantages that: according to the invention, the voltage along the line is calculated based on the Bergeron model, and the complex integration is carried out in a unit data window, so that a complex voltage integration curve is obtained. Considering the different situations that the integral curve has only one minimum value point, a plurality of minimum value points and no minimum value point, the comprehensive analysis provides a fault positioning scheme based on the calculation of the lowest point of the voltage along the line. The invention is less influenced by fault transient process and line distributed capacitance, has higher fault positioning speed and precision, is hardly influenced by different fault moments, and greatly improves the fault location accuracy of the long-distance transmission line.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a voltage distribution diagram illustrating an exemplary metallic single-phase ground fault in an embodiment of the present invention;
FIG. 2 is a flow chart of a method for fault location based on along-line voltage nadir calculation in an embodiment of the present invention;
FIG. 3 is a flowchart of a method for computing a fault in a fault location based on along-line voltage nadir computation in accordance with an embodiment of the present invention;
FIG. 4 is a partial flow chart of a calculation determination fault in a fault location method based on along-line voltage nadir calculation in accordance with an embodiment of the present invention;
FIG. 5 is a partial flowchart of a method for computing a fault in a fault location based on along-line voltage nadir computation in accordance with an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a fault location system based on line voltage minimum point calculation according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
When breaking down on the transmission line, the bersulfuron model of whole transmission line is destroyed, can't calculate the whole line voltage distribution condition through single-ended bersulfuron model, nevertheless still satisfies the bersulfuron model between protection installation department and the fault point this moment, and accessible bersulfuron model calculates and seeks the fault point: for three-phase symmetrical short circuit and single-phase earth fault, the voltage value at the fault point of the short circuit earth phase is minimum; for a two-phase short circuit grounding fault, the phase voltage or the line voltage at the fault point of the short circuit grounding phase is the minimum value; for a two-phase short-circuit fault, the line voltage at the short-circuit phase fault point has a minimum value. Taking a metallic single-phase earth fault as an example, the voltage distribution is shown in fig. 1, and the equivalent power voltages of the power grids at two ends of the line are respectively shown asE m AndE n equivalent supply voltage acrossE m AndE n are respectively connected with system impedanceZ m AndZ n and the voltages at the two ends of the line are respectivelyU m AndU n if a fault at a certain point of the line is a fault pointFThen a point of failure in the lineFThe voltage of (2) is 0.
Therefore, after the protection is started after the line fault, after the fault phase is confirmed through the phase selection element, the corresponding voltage distribution is calculated through the Bergeron model, and then the fault point can be confirmed. However, due to various factors such as sampling noise, there may be a large error in calculating the line voltage distribution once.
In order to solve the defects of the prior art, the invention selects the voltage data of a certain data window to carry out the complex trapezoidal integration, and then the complex integral value of the line voltage is obtainedUinte(x)And comparing, searching for a fault point and enhancing the anti-interference capability.
The invention discloses a fault positioning method based on line voltage lowest point calculation, which comprises the following steps of:
calculating voltage along the line based on a Bergeron model, and performing complex integration in a unit data window to obtain a voltage distribution curve;
and calculating a voltage distribution curve, and performing fault location judgment on the line according to the result of the voltage distribution curve.
In particular to a method for preparing a high-performance nano-silver alloy,
and determining the step length required by calculation of the Bergeron equation according to the requirement of protection precision, thereby determining the sampling rate and the interpolation mode of the protection device. The line step is obtained by:
Figure 861979DEST_PATH_IMAGE028
（3）
wherein the content of the first and second substances,X step which represents the step size of the line,
Figure 15880DEST_PATH_IMAGE029
representing the velocity of the mode wave, ΔTRepresenting the sampling interval time.
After the fault occurs, calculating the starting time to the stopping time in the fault phase unit data window by using a Bergeron model (t 2 -t 1 ) Step length of each point of the internal line (x step ，2x step ，3x step …) voltage.
It should be noted that, according to the characteristics of the beraprone model, the on-line route
Figure 367227DEST_PATH_IMAGE030
Starting time evaluation line>
Figure 329498DEST_PATH_IMAGE031
At a voltage of (a) is actually requiredt 1 -x/v m ) And (t) 1 +x/v m ) Sampled data of time instants. For the sake of explanation, assume the wave velocity v m 3 x 105km/s, if the voltage at the position of 300km of the line 1ms after the fault is calculated, the voltage isx/v m = 1ms, the calculation also requires voltage and current sampling data at 0 time after the failure and 2ms after the failure. />
And after reading the voltage and current information at the protection installation position, carrying out complex voltage integral calculation positioning.
Firstly, determining the starting time of the complex integral calculation according to the full length of the line, wherein the starting time meets the following condition:
Figure 740888DEST_PATH_IMAGE032
（1）
wherein, the first and the second end of the pipe are connected with each other,
Figure 850926DEST_PATH_IMAGE033
represents the starting time, l is the full length of the line,/>
Figure 615751DEST_PATH_IMAGE034
Representing the mode wave velocity.
The fault phase of the line is determined through the phase selection element, and after protection is started, the voltage distribution curve of the corresponding fault phase is calculated based on the voltage and the current obtained through samplingU inte (x) The calculation formula is as follows:
Figure 822741DEST_PATH_IMAGE035
（2）
wherein the content of the first and second substances,U inte (x) A voltage profile is shown in the form of a voltage profile,xindicating the distance, Δ, of any point on the line from the protective mountingTWhich represents the time between the sampling of the samples,urepresenting the instantaneous voltage at a point on the line,t 1 indicating a starting time within a unit data window,t 2 indicating the stop time within a unit data window,Nis shown in (A)t 2 -t 1 ) The number of voltage samples in the period,iexpressed as the number of calculations of the voltage profile and finallyi=N-2。
Voltage distribution curve by equation (2)U inte (x) And (4) calculating and comparing the integral value of the voltage of each point, wherein the minimum point of the integral value of the voltage is the fault point. In particular to a method for preparing a high-performance nano-silver alloy,
next, n =0,n was set as the number of times the voltage distribution curve was calculated before the calculation. Selecting proper calculation interval time
Figure 14820DEST_PATH_IMAGE036
And every other->
Figure 612154DEST_PATH_IMAGE036
Calculating a primary voltage distribution curve, and obtaining a complete complex voltage integral curve after n times of calculation;
before each voltage distribution curve is calculated, the current time is obtained according to the starting time and the calculation interval time, so that the complex voltage integral curve is judged in the subsequent cycle judgment, and the current time is obtained according to the following formula:
Figure 305304DEST_PATH_IMAGE037
（3）
wherein the content of the first and second substances,tas the current time of day, the time of day,t 1 which indicates the starting moment in time of the day,nis shown asnThe sub-cycle calculates a complex voltage integral curve,Δ tthe table calculates the interval time.
Defining a comparison window
Figure 242167DEST_PATH_IMAGE038
I.e. each calculation will have the latest successive->
Figure 995359DEST_PATH_IMAGE038
And carrying out cyclic comparison judgment on the integral value of the calculation result of the secondary complex voltage integral curve so as to enhance the reliability of fault positioning.
Therefore, at the calculation start timet 1 Then, the complex voltage integral curve is required to be continuously carried out
Figure 79990DEST_PATH_IMAGE038
The first decision is started after the second calculation.
Defining a time window for overall computationt set When the fault positioning judgment condition is not met and the current momenttLess than the time windowt set At the current momenttThe calculation of the complete complex voltage integral curve continues.
Finally, the determination is performed according to the calculation result of the complete complex voltage integral curve, and the calculation and determination process of the complex voltage integral curve is shown in fig. 3, 4 and 5:
after calculating the starting time, obtaining the current time and the integrated curve of the complex voltage
Figure 186617DEST_PATH_IMAGE039
Is taken continuously>
Figure 102621DEST_PATH_IMAGE038
Starting the first judgment after the second calculation, judging the firstnUpon sub-calculation of a complex voltage integration curve>
Figure 229977DEST_PATH_IMAGE038
Whether or not it is greater than or equal ton(ii) a Wherein the content of the first and second substances,
if it is
Figure 474007DEST_PATH_IMAGE038
If n is greater than or equal to n, the execution is continued to return ton+1 time multiplexing voltage integration curve->
Figure 774539DEST_PATH_IMAGE040
And calculating and entering the judgment loop again for calculation.
If it is
Figure 482732DEST_PATH_IMAGE038
＜nIf so, it is judged asnThe recalculated voltage integration curve->
Figure 767607DEST_PATH_IMAGE040
Whether a plurality of minimum value points exist; the method comprises the following steps: />
If it is firstnThe integrated curve of the complex voltage obtained by the secondary calculation
Figure 889147DEST_PATH_IMAGE040
If there are multiple minimum value points, defining the minimum value point of the integral value in the complex voltage integral curve as ^ greater than or equal to>
Figure 337577DEST_PATH_IMAGE041
The extreme point with the next smaller integrated value is->
Figure 165855DEST_PATH_IMAGE042
And the integral value corresponding to the two is
Figure 697331DEST_PATH_IMAGE043
And &>
Figure 978271DEST_PATH_IMAGE044
(ii) a Judgment->
Figure 761550DEST_PATH_IMAGE041
And/or>
Figure 444335DEST_PATH_IMAGE042
Whether or not the integrated value of (2) satisfies the determination condition.
Is judged by the following formulaBreak-off
Figure 818816DEST_PATH_IMAGE041
And/or>
Figure 524735DEST_PATH_IMAGE042
Whether or not the integrated value of (b) satisfies a determination condition:
Figure 439601DEST_PATH_IMAGE045
（4）
wherein the content of the first and second substances,
Figure 242472DEST_PATH_IMAGE046
represents the minimum point in the duplicated voltage integration curve>
Figure 991116DEST_PATH_IMAGE041
Is greater than or equal to>
Figure 43386DEST_PATH_IMAGE047
Represents the next smallest extreme point in a complex voltage integration curve>
Figure 965206DEST_PATH_IMAGE042
Is greater than or equal to>
Figure 294687DEST_PATH_IMAGE048
Setting values for eliminating interference of other minimum value points are judged;
Figure 338866DEST_PATH_IMAGE048
the smaller the value, i.e.. Sup>
Figure 777236DEST_PATH_IMAGE049
And/or>
Figure 502746DEST_PATH_IMAGE047
The greater the phase difference, at which a decision can be made>
Figure 76947DEST_PATH_IMAGE050
The greater the confidence probability for the fault distance. />
Figure 229711DEST_PATH_IMAGE048
The greater the value, i.e.>
Figure 866360DEST_PATH_IMAGE049
And/or>
Figure 457878DEST_PATH_IMAGE047
The smaller the phase difference is, the moment->
Figure 824269DEST_PATH_IMAGE050
The smaller the confidence probability for the distance to failure.
When in use
Figure 85617DEST_PATH_IMAGE050
And/or>
Figure 599775DEST_PATH_IMAGE051
When the integrated value of (b) does not satisfy the determination condition:
if the current time of the complex voltage integral curve is still in the total calculation time windowt set In, i.e.t<t set Then, after a calculation interval time, the execution is continuednCalculating a composite voltage integral curve +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set I.e. byt≥t set The loop is exited and it is believed that fault location by the present method is not possible at this time due to transition resistance, etc.
When the temperature is higher than the set temperature
Figure 667088DEST_PATH_IMAGE050
And &>
Figure 825668DEST_PATH_IMAGE051
When the integrated value of (4) meets a decision condition, then successive in the comparison window are compared>
Figure 585813DEST_PATH_IMAGE052
Judging minimum value points of the secondary complex voltage integral curve; wherein the content of the first and second substances,
comparing the window internal continuity by
Figure 587267DEST_PATH_IMAGE052
And (3) judging minimum value points of the secondary composite voltage integral curve:
Figure 192692DEST_PATH_IMAGE053
（5）
wherein the content of the first and second substances,
Figure 471358DEST_PATH_IMAGE054
indicates a continuation in the comparison window>
Figure 402405DEST_PATH_IMAGE055
The minimum point of the second-order voltage integral curve,x i denotes the firstiAs a result of the secondary fault location, the fault location,ithe number of calculations for fault location.
When continuous in the comparison window
Figure 359997DEST_PATH_IMAGE055
When the minimum value point of the secondary multiplexing voltage integral curve meets the condition of the judgment formula (5), determining that the fault distance calculation value is greater than or equal to>
Figure 972375DEST_PATH_IMAGE054
。
When continuous in the comparison window
Figure 167864DEST_PATH_IMAGE055
When the minimum value point of the second-order composite voltage integral curve does not meet the condition of the judgment formula (5); wherein the content of the first and second substances,
if the current time of the complex voltage integral curve is still in the total calculation time windowt set In, i.e.t<t set If the calculation interval is one, the method continues to executenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set I.e. byt≥t set If the calculated range of the output fault distance is the minimum value point of the complex voltage integral curve in the comparison time window
Figure 66550DEST_PATH_IMAGE056
To a maximum minimum point->
Figure 652383DEST_PATH_IMAGE057
。
If the complex voltage integral curve obtained by the nth calculation does not have a plurality of minimum value points, judging whether the complex voltage integral curve has one minimum value point or not; wherein, the first and the second end of the pipe are connected with each other,
when the complex voltage integral curve has one and only one minimum value point, the continuous comparison window is compared
Figure 865190DEST_PATH_IMAGE058
Judging minimum value points of the secondary multiplexing voltage integral curve; wherein the content of the first and second substances,
the decision is made by equation (5):
when continuous in the comparison window
Figure 977502DEST_PATH_IMAGE059
When the minimum value point of the secondary multiplexing voltage integral curve meets the condition of the judgment formula (5), determining that the fault distance calculation value is greater than or equal to>
Figure 250352DEST_PATH_IMAGE060
。
When continuous in the comparison window
Figure 57902DEST_PATH_IMAGE059
Minimum point of secondary voltage integral curveWhen the condition of the decision formula (5) is not satisfied; wherein the content of the first and second substances,
if the current time of the complex voltage integral curve is still in the total calculation time windowt set In, i.e.t<t set Then, after a calculation interval time, the execution is continuednAnd calculating a voltage integral curve for +1 times, and entering a judgment loop again.
If the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set I.e. byt≥t set If the calculated range of the output fault distance is the minimum value point of the complex voltage integral curve in the comparison time window
Figure 136716DEST_PATH_IMAGE056
To a maximum minimum point->
Figure 306797DEST_PATH_IMAGE057
。
When there is no minimum point on the complex voltage integral curve:
if the current time of the complex voltage integral curve is still in the total calculation time windowt set In, i.e.t<t set Then, after a calculation interval time, the execution is continuednAnd calculating a voltage integral curve for +1 times, and entering a judgment loop again.
If the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set I.e. byt≥t set The loop is exited and it is believed that the fault location cannot be performed by the present method due to, for example, transition resistance.
The invention also discloses a fault location system based on the calculation of the lowest point of the voltage along the line, as shown in fig. 4, the system comprises a calculation unit and a determination unit,
and the calculating unit is used for calculating the voltage along the line based on the Bergeron model and performing complex integration in a unit data window to obtain a voltage distribution curve.
Specifically, the calculating unit is used for determining the starting moment of the complex integral calculation according to the full length of the line; the calculating unit is used for determining a fault phase through the phase selection element based on the initial moment, and calculating a voltage distribution curve of the corresponding fault phase through the Bergeron model according to the voltage and the current obtained through sampling.
And the judging unit is used for calculating a voltage distribution curve and carrying out fault positioning judgment on the line according to the result of the voltage distribution curve.
Specifically, the judging unit is used for calculating the required line step length according to the Bergeron model and determining the sampling rate and the interpolation mode of the line protection device;
the judging unit is used for calculating the instantaneous value of the step voltage of each point of the line from the starting time to the stopping time in the fault phase unit data window by using the Bergeron model;
and the judging unit is used for obtaining the integral value of the voltage at each point through the voltage distribution curve, comparing and judging to obtain the minimum point of the voltage integral value and confirm the fault point.
With regard to the system in the above embodiment, the specific manner in which each unit module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications may be made to the embodiments or portions thereof without departing from the spirit and scope of the invention.

Claims (15)

1. A fault location method based on the calculation of the lowest point of voltage along the line is characterized by comprising the following steps,
performing voltage calculation along the line based on the Bergeron model, and performing complex integral calculation in a unit data window to obtain a voltage distribution curve;
calculating a voltage distribution curve, and performing fault location judgment on the line according to a calculation result of the voltage distribution curve;
wherein the obtaining of the voltage profile comprises the following operations:
determining the starting time of the complex integral calculation according to the full length of the line;
determining a line fault phase through a phase selection element based on the initial moment, and calculating a voltage distribution curve of the corresponding fault phase through a Bergeron model according to the voltage and the current obtained by sampling;
the voltage distribution curve is as follows:
Figure 851269DEST_PATH_IMAGE001
（2）
wherein, the first and the second end of the pipe are connected with each other,Uinte(x)which represents the curve of the voltage distribution,xindicating the distance of any point on the line from the protective installation,ΔTwhich represents the time between the sampling of the samples,urepresenting the instantaneous voltage at a point on the line,t 1 indicating a starting time within a unit data window,t 2 indicating the stop time within a unit data window,Nis shown in(t 2 -t 1 )The number of voltage samples in the period;iindicating the number of calculations of the voltage profile.
2. The method of claim 1 wherein the fault location is based on line voltage nadir calculation,
the starting time should satisfy the following condition:
Figure 174934DEST_PATH_IMAGE002
（1）
wherein, the first and the second end of the pipe are connected with each other,t 1 which indicates the starting moment in time of the day,lin order to obtain the full length of the line,
Figure 751409DEST_PATH_IMAGE003
representing the mode wave velocity.
3. The fault location method based on the line voltage minimum point calculation according to claim 1 or 2, wherein a voltage distribution curve is calculated, and a fault location determination is made on a line according to the calculation result of the voltage distribution curve, comprising,
calculating the required line step length according to the Bergeron model, and determining the sampling rate and the interpolation mode of the line protection device;
calculating the instantaneous value of the step voltage of each point of the circuit from the initial moment to the stop moment in a unit data window of the fault phase by using a Bergeron model;
and (4) calculating the integral value of the voltage of each point through the voltage distribution curve, comparing and judging to obtain the minimum point of the voltage integral value, and confirming the fault point.
4. The fault location method based on the line voltage nadir calculation according to claim 3, wherein the calculating the required line step size according to the Bergeron model comprises,
the line step is obtained by:
Figure 67990DEST_PATH_IMAGE004
（3）
wherein the content of the first and second substances,
Figure 288886DEST_PATH_IMAGE005
which represents the step size of the line,
Figure 908087DEST_PATH_IMAGE006
representing the velocity of the mode wave, ΔTRepresenting the sampling interval time.
5. The method for locating a fault based on the calculation of the lowest point of the line voltage according to claim 3, wherein the integral value of the voltages at each point is obtained through the voltage distribution curve for comparison and determination, the minimum point of the integral value of the voltages is obtained, and the fault point is identified, comprising,
selecting calculation interval time, and calculating a voltage distribution curve every other calculation interval time to obtain a complete complex voltage integral curve;
defining a comparison window
Figure 332377DEST_PATH_IMAGE007
I.e. each calculation will be the latest successive
Figure 124753DEST_PATH_IMAGE008
Carrying out cyclic comparison judgment on the integral value of the secondary composite voltage integral curve;
after calculating the initial time, continuously carrying out the operation of the complex voltage integral curve
Figure 216468DEST_PATH_IMAGE007
Starting the first judgment after the second calculation;
defining a time window for overall computationt set When the fault positioning judgment condition is not met and the current time is less than the time windowt set And then, along with the increase of the current moment, the complete cyclic judgment calculation of the complex voltage integral curve is continuously carried out.
6. The method of claim 5 wherein the calculation intervals are selected and the voltage profile is calculated every other calculation interval to obtain a complete and reproducible voltage integral curve, comprising,
before each time of calculating the voltage distribution curve, obtaining the current moment according to the calculation interval time and the initial moment;
the current time is obtained by:
Figure 616356DEST_PATH_IMAGE009
（3）
wherein the content of the first and second substances,tis the current time of day and is,t 1 which indicates the starting moment in time of the day,nis shown asnThe sub-cycle calculates a complex voltage integral curve,Δtthe table calculates the interval time.
7. A method for fault location based on along-line voltage nadir calculation according to claim 5 or 6,
after calculating the initial time, the method continuously carries out the operation of the composite voltage integral curve
Figure 167423DEST_PATH_IMAGE010
Starting the first judgment after the second calculation, judging the firstnWhen the complex voltage integral curve is calculated
Figure 560227DEST_PATH_IMAGE011
Whether or not it is greater than or equal ton：
If it is
Figure 614771DEST_PATH_IMAGE012
Then continue to return to executen+1Calculating a secondary complex voltage integral curve and entering judgment cycle calculation again;
if it is
Figure 716719DEST_PATH_IMAGE013
If so, judge thatnAnd whether a plurality of minimum value points exist in the complex voltage integral curve obtained by secondary calculation or not.
8. The method as claimed in claim 7, wherein the fault location is based on the calculation of the lowest point of the line voltage
Figure 115602DEST_PATH_IMAGE013
If so, it is judged asnWhether a plurality of minimum value points exist in the complex voltage integral curve obtained by the secondary calculation or not comprises,
if there are multiple minimum values in the said integrated curve, define the firstnComplex obtained by sub-calculationThe minimum point of the integration value in the integration curve of the voltage is
Figure 187463DEST_PATH_IMAGE014
The second smallest extreme point of the integral value is
Figure 237458DEST_PATH_IMAGE015
Judgment of
Figure 493996DEST_PATH_IMAGE014
And
Figure 19656DEST_PATH_IMAGE016
whether or not the integrated value of (b) satisfies a determination condition; wherein the content of the first and second substances,
when in use
Figure 770574DEST_PATH_IMAGE014
And
Figure 425808DEST_PATH_IMAGE015
when the integrated value of (b) does not satisfy the determination condition:
if the current time of calculating the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set If yes, the loop is exited and the fault location is not possible;
when in use
Figure 728614DEST_PATH_IMAGE014
And
Figure 351356DEST_PATH_IMAGE017
when the integral value of (2) satisfies the judgment condition, the comparison window is continuously checked
Figure 765020DEST_PATH_IMAGE007
And judging the minimum value point of the secondary composite voltage integral curve.
9. The method of claim 8 wherein the fault location is based on line voltage nadir calculation,
is judged by the following formula
Figure 38875DEST_PATH_IMAGE014
And
Figure 387948DEST_PATH_IMAGE018
whether or not the integrated value of (b) satisfies a determination condition:
Figure 357041DEST_PATH_IMAGE019
（4）
wherein the content of the first and second substances,
Figure 200495DEST_PATH_IMAGE020
representing the minimum point in the complex voltage integral curve
Figure 345168DEST_PATH_IMAGE014
The value of the integral of (a) is,
Figure 989776DEST_PATH_IMAGE021
representing the next smallest extreme point in the complex voltage integral curve
Figure 836378DEST_PATH_IMAGE015
The value of the integral of (a) is,
Figure 732790DEST_PATH_IMAGE022
and the setting value excluding other minimum value point interference is judged.
10. The method of claim 7 wherein the fault location is based on along-line voltage nadir calculationA process characterized in that said
Figure 325445DEST_PATH_IMAGE013
If so, judge thatnWhether a plurality of minimum value points exist in the complex voltage integral curve obtained by the secondary calculation or not comprises,
if the plurality of minimum value points do not exist in the complex voltage integral curve, judging whether the complex voltage integral curve has one minimum value point or not; wherein the content of the first and second substances,
when the said complex voltage integral curve has only one minimum value point, the comparison window is compared continuously
Figure 32632DEST_PATH_IMAGE023
Judging minimum value points of the secondary repetition voltage integral curve;
when there is no minimum point on the complex voltage integral curve:
if the current time of the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set Then the loop is exited and the fault location is deemed to be impossible.
11. The fault location method based on the along-line voltage nadir calculation according to claim 8 or 10,
comparing the window internal continuity by
Figure 976318DEST_PATH_IMAGE023
And (3) judging minimum value points of the secondary composite voltage integral curve:
Figure 676420DEST_PATH_IMAGE024
（5）
Figure 513795DEST_PATH_IMAGE025
wherein, the continuity in the comparison window is represented
Figure 500206DEST_PATH_IMAGE023
The minimum point of the second-order voltage integral curve,x i denotes the firstiAs a result of the secondary fault location,ithe number of calculations for fault location.
12. The method of claim 11 wherein the fault location is based on line voltage nadir calculation,
when continuous in the comparison window
Figure 806553DEST_PATH_IMAGE026
When the minimum value point of the secondary complex voltage integral curve meets the condition of a judgment formula, determining the calculated value of the fault distance as
Figure 903822DEST_PATH_IMAGE014
；
When continuous in the comparison window
Figure 640046DEST_PATH_IMAGE027
When the minimum value point of the secondary complex voltage integral curve does not meet the condition of the judgment formula; wherein the content of the first and second substances,
if the current time of the complex voltage integral curve is still in the total calculation time windowt set If so, after a calculation interval time, continuing to execute the step onenCalculating a voltage integration curve for +1 times, and entering a judgment cycle again;
if the current time for calculating the complex voltage integral curve exceeds the total calculation time windowt set And the calculation range of the output fault distance is the minimum value point of the complex voltage integral curve in the comparison time window
Figure 672724DEST_PATH_IMAGE028
To the point of maximum minimum
Figure 591001DEST_PATH_IMAGE029
。
13. A fault location system based on the calculation of the lowest point of the voltage along the line is characterized by comprising a calculation unit and a determination unit,
the calculating unit is used for performing voltage calculation along the line based on the Bergeron model and performing complex integration in a unit data window to obtain a voltage distribution curve;
and the judging unit is used for calculating a voltage distribution curve and carrying out fault positioning judgment on the line according to the result of the voltage distribution curve.
14. The fault location system based on along-line voltage nadir calculation of claim 13,
the calculating unit is used for determining the starting time of the complex integral calculation according to the full length of the line;
the calculating unit is used for determining a fault phase through the phase selection element based on the initial moment, and calculating a voltage distribution curve of the corresponding fault phase through the Bergeron model according to the voltage and the current obtained through sampling.
15. The fault location system based on along-line voltage nadir calculation of claim 13,
the judging unit is used for calculating the required line step length according to the Bergeron model and determining the sampling rate and the interpolation mode of the line protection device;
calculating the instantaneous value of the step voltage of each point of the circuit from the initial moment to the stop moment in a unit data window of the fault phase by using a Bergeron model;
and (4) calculating the integral value of the voltage of each point through the voltage distribution curve, comparing and judging to obtain the minimum point of the voltage integral value, and confirming the fault point.
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