CN115479873A - Diamond micro-powder concentration distribution tester in diamond dust plating solution - Google Patents
Diamond micro-powder concentration distribution tester in diamond dust plating solution Download PDFInfo
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- CN115479873A CN115479873A CN202210915340.1A CN202210915340A CN115479873A CN 115479873 A CN115479873 A CN 115479873A CN 202210915340 A CN202210915340 A CN 202210915340A CN 115479873 A CN115479873 A CN 115479873A
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- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 114
- 239000010432 diamond Substances 0.000 title claims abstract description 114
- 238000007747 plating Methods 0.000 title claims abstract description 51
- 238000009826 distribution Methods 0.000 title claims abstract description 46
- 239000000843 powder Substances 0.000 title claims abstract description 36
- 239000000428 dust Substances 0.000 title claims abstract description 29
- 230000005855 radiation Effects 0.000 claims abstract description 70
- 230000001360 synchronised effect Effects 0.000 claims abstract description 6
- 238000001514 detection method Methods 0.000 claims description 32
- 238000013527 convolutional neural network Methods 0.000 claims description 9
- 238000009713 electroplating Methods 0.000 claims description 9
- 239000000203 mixture Substances 0.000 claims description 5
- 229910001651 emery Inorganic materials 0.000 claims description 4
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 239000007788 liquid Substances 0.000 claims description 3
- 101000840267 Homo sapiens Immunoglobulin lambda-like polypeptide 1 Proteins 0.000 claims description 2
- 102100029616 Immunoglobulin lambda-like polypeptide 1 Human genes 0.000 claims description 2
- 229910010271 silicon carbide Inorganic materials 0.000 claims 2
- 238000012544 monitoring process Methods 0.000 abstract description 6
- 230000001737 promoting effect Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 238000005070 sampling Methods 0.000 description 5
- 238000012549 training Methods 0.000 description 4
- 229910000831 Steel Inorganic materials 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 239000004576 sand Substances 0.000 description 3
- 239000010959 steel Substances 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000000725 suspension Substances 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 238000013528 artificial neural network Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- MCMSPRNYOJJPIZ-UHFFFAOYSA-N cadmium;mercury;tellurium Chemical compound [Cd]=[Te]=[Hg] MCMSPRNYOJJPIZ-UHFFFAOYSA-N 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
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- G01N15/075—
Abstract
This scheme provides a diamond powder concentration distribution tester in diamond dust plating solution, including control module, control module be connected with ripples transmitter and wave receiver, the ripples transmitter be used for sending the time-varying wave signal according to the synchronizing signal that contains intensity time-varying control command that control module sent, wave receiver be used for gathering according to the synchronous clock synchronization in the synchronizing signal the time-varying wave signal direction is to the time-varying radiation signal that the plating solution takes place, wave receiver be connected with the judging module, the judging module be used for judging diamond powder concentration distribution result according to time-varying radiation signal and time-varying wave signal. This scheme utilization diffraction phenomenon provides the real time monitoring that can be to the concentration of the diamond miropowder in the cavity to can be used for monitoring the scheme that the two-dimentional of diamond miropowder distributes in real time in the cavity, help promoting the quality of buddha's warrior attendant line.
Description
Technical Field
The invention belongs to the field of diamond micro powder concentration detection, and particularly relates to a diamond micro powder concentration distribution tester in diamond sand plating solution.
Background
The diamond wire is a diamond cutting wire made by embedding diamond particles on a high-strength steel wire. The diamond wire has diamond micro saw teeth, the cutting capability of the steel wire is improved, and the cutting speed can be greatly accelerated.
And (4) sanding in the process of embedding the diamond on the steel wire. In the diamond wire sanding cavity, the nickel-plated diamond micro powder in the plating solution is uniformly distributed and fully stirred by the stirrer, so that the concentration of the diamond micro powder in the sanding cavity needs to be detected. To ensure the uniform distribution of the nickel-plated diamond micropowder in the plating solution, two angles are needed to be used, one is the angle of the device, and the other is the angle detection. At present, research on the technology is generally focused on the device itself, namely, how to improve the distribution uniformity degree by improving the device is focused on, for example, a diamond wire eight-wire machine production sanding device disclosed in a chinese patent [ publication number: CN212771026U ]. In terms of detection, the existing method for detecting the concentration of the diamond micropowder in the sanding cavity generally comprises the steps of periodically sampling, detecting by using a turbidity meter, and correspondingly adjusting the amount of the diamond micropowder in the plating solution, but firstly, the detection method is a sampling detection method, so that the detection precision is not high, and secondly, the method is long from sampling to adjustment, usually in hours, so that the efficiency is low, and the sanding efficiency is influenced. In addition, because the concentration distribution of the diamond micropowder in the plating solution in the upper sand cavity cannot be continuously monitored in real time, when the content of the diamond micropowder in the plating solution is reduced/increased due to the occurrence of an accident condition on a production line, timely mastering cannot be realized, and continuous small-amount supplement can be continuously carried out only according to the original setting, the content of the diamond micropowder in the plating solution is greatly fluctuated due to the regulation and control process, the density fluctuation of diamond particles on a diamond wire can be caused due to the fluctuation of the content of the diamond micropowder, and the quality fluctuation of the diamond wire can be further caused.
Disclosure of Invention
The invention aims to solve the problems and provides a diamond micro powder concentration distribution tester in diamond dust plating solution.
In order to achieve the purpose, the invention adopts the following technical scheme:
the utility model provides a buddha's warrior attendant miropowder concentration distribution tester in diamond dust plating bath, includes control module, control module be connected with ripples transmitter and ripples receiver, the ripples transmitter be used for sending time-varying wave signal according to the synchronizing signal that contains intensity time-varying control command that control module sent, ripples receiver be used for gathering according to the synchronization clock in the synchronizing signal is synchronous the time-varying radiation signal that time-varying wave signal direction took place to the plating solution, ripples receiver be connected with the judging module, the judging module be used for judging buddha's warrior attendant miropowder concentration distribution result according to time-varying radiation signal and time-varying wave signal.
In the above diamond dust concentration distribution tester in diamond dust plating solution, the wave emitter and the wave receiver use waves with wavelengths equivalent to the size of the diamond dust.
In the diamond dust concentration distribution tester in the diamond dust plating solution, the wave corresponding to the wave emitter and the wave receiver is infrared, and the wave emitter comprises an infrared light-emitting diode array and a light-emitting control circuit; the light-emitting control circuit is used for controlling each infrared light-emitting diode to emit a time-varying infrared signal with gradually-varying intensity according to the intensity time-varying control command;
the wave receiver comprises an infrared radiation detection array and a two-dimensional radiation image acquisition module, wherein the infrared radiation detection array is used for detecting infrared radiation signals of the electroplating liquid, and the two-dimensional radiation image acquisition module is used for synchronously acquiring time-varying radiation signals from the infrared radiation signals according to a synchronous clock.
In the diamond powder concentration distribution tester in diamond dust plating solution, the infrared radiation detection array adopts an infrared detector array with an array structure consistent with that of the infrared light-emitting diode array and the density greater than or equal to that of the infrared light-emitting diode array to detect the infrared radiation of the plating solution, and converts the detected infrared radiation into an electric signal in a photoelectric conversion mode, thereby obtaining a two-dimensional infrared radiation signal.
In the diamond micro powder concentration distribution tester in the diamond dust plating solution, the infrared light-emitting diode array comprises a plurality of base pieces in n-polygon structures, n infrared light-emitting diodes are uniformly distributed in each base piece, and n is more than or equal to 3.
In the diamond fine powder concentration distribution tester in the diamond dust plating solution, n infrared light-emitting diodes in each base piece have different wavelengths;
the wavelength of each infrared light-emitting diode is within a lambda +/-5 um range, and the lambda is the size of the diamond micro powder;
the detection range of the infrared radiation detection array comprises all infrared radiation of a wave band from lambda-5 um to lambda +5 um.
In the diamond powder concentration distribution tester in the diamond dust plating solution, the n-edge of each base piece is divided into n triangles with equal area, and the n infrared light-emitting diodes are distributed in the centers of the n triangles so as to be uniformly distributed in the corresponding base pieces;
any two of the base members forming the infrared light emitting diode array have the same infrared light emitting diode and wavelength composition, and the infrared light emitting diodes with the same wavelength on any two base members correspond to the same position in the two base members, so that the distance between two adjacent infrared light emitting diodes with any fixed wavelength in the infrared light emitting diode array is equal in length.
In the diamond powder concentration distribution tester in the diamond dust plating solution, the wavelength of each infrared light-emitting diode is more than or equal to 3um and less than or equal to 8um, and the detection range of the infrared radiation detection array comprises all infrared radiation in a wave band from 3um to 8um;
n =6, and the wavelengths of the 6 infrared light emitting diodes are respectively 3um, 4um, 5um, 6um, 7um and 8um; in the infrared light emitting diode array, all the base pieces have the same wavelength and composition of the infrared light emitting diodes, and the infrared light emitting diodes with the same wavelength among the base pieces are located at the same position in the base pieces.
In the diamond micro powder concentration distribution tester in the diamond dust plating solution, the infrared wave is a middle infrared wave;
the infrared light-emitting diode array is a circular array formed by a plurality of base pieces.
In the diamond dust concentration distribution tester in the diamond dust plating solution, the judgment module acquires the time-varying wave signal from a wave transmitter, a wave receiver or a control module;
the judging module comprises a trained convolutional neural network.
The invention has the advantages that:
the diffraction phenomenon is utilized to provide a scheme which can monitor the concentration of the diamond micro powder in the cavity in real time and can be used for monitoring the two-dimensional real-time distribution of the diamond micro powder in the cavity, thereby being beneficial to improving the quality of diamond wires;
the convolutional neural network technology is used, the trained convolutional neural network is utilized, an original time-varying wave signal and a time-varying radiation signal subjected to the action of diamond micropowder are used as input, the concentration distribution condition can be output, and a more accurate judgment result can be given.
Drawings
FIG. 1 is a block diagram of the system structure of a tester for the concentration distribution of diamond micropowder in emery plating solution according to the present invention;
FIG. 2 is a block diagram of a system structure of a diamond micro powder concentration distribution tester in diamond dust plating solution according to the present invention, taking infrared wavelength as an example;
FIG. 3 is a schematic structural diagram of a base member of a trilateral structure in the diamond micropowder concentration distribution tester in the diamond grit plating solution of the present invention;
FIG. 4 is a schematic structural view of a base member of a quadrilateral structure in the diamond micro powder concentration distribution tester in the diamond dust plating solution of the present invention;
FIG. 5 is a schematic structural view of a base member of a hexagonal structure in the diamond micro powder concentration distribution tester of the diamond dust plating solution of the present invention;
FIG. 6 is an array structure diagram of an infrared light emitting diode array composed of a hexagonal base structure in a diamond fine powder concentration distribution tester of diamond dust plating solution according to the present invention.
Reference numerals are as follows: a control module 1; a wave emitter 2; an infrared light emitting diode array 21; a light emission control circuit 22; a wave receiver 3; an infrared radiation detection array 31; a two-dimensional radiation image acquisition module 32; and a judging module 4.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
The embodiment discloses a diamond micro powder concentration distribution tester in diamond sand plating solution for solving the real-time monitoring of the diamond micro powder concentration in a cavity and monitoring the two-dimensional real-time distribution of the diamond micro powder in the cavity, so that a user can timely and pertinently adjust the diamond micro powder concentration in the plating solution, and further the quality of diamond wires is improved.
As shown in fig. 1, the tester specifically includes a control module 1, the control module 1 is connected with a wave emitter 2 and a wave receiver 3, the control module 1 sends a synchronization signal to the wave emitter 2 and the wave receiver 3 at the same time, the synchronization signal includes an intensity time-varying control signal and a synchronization clock, the wave emitter 2 sends out an intensity-varying time-varying wave signal according to an intensity time-varying control command of the control module 1, the wave receiver 3 synchronously collects a time-varying radiation signal guided to a plating solution according to the synchronization clock, the wave receiver 3 is connected with a judgment module 4, the judgment module 4 obtains the time-varying wave signal from the wave emitter 2, obtains the time-varying radiation signal from the wave receiver 3, and judges a diamond micropowder concentration distribution result according to the time-varying radiation signal and the time-varying wave signal. The wave can be diffracted when meeting an obstacle in the propagation process, the wave is guided to the electroplating solution by utilizing the diffraction phenomenon of the wave, the wave can be diffracted when meeting the obstacle-diamond micropowder in the electroplating solution, and the judgment module can judge the concentration distribution result of the diamond micropowder according to the original time-varying wave signal and the time-varying radiation signal acted by the diamond micropowder. Wave transmitter 2 and wave receiver 3 both can both be located the plating solution, can be located outside the plating solution again, do not restrict it to set up the position and set up the mode here, as long as can satisfy this application demand, the wave guide that makes wave transmitter 2 transmission to the plating solution, and wave receiver 3 can receive the radiation wave through the plating solution effect can, the whole direction plating solutions of wave of preferred wave transmitter 2 transmission, wave receiver 3 can completely receive corresponding radiation wave.
Specifically, the judging module 4 includes a trained convolutional neural network CNN, and may be trained using a typical diamond dust suspension sample until convergence. The network structure, the loss function, and the like used by the convolutional neural network CNN may be directly used in the prior art, which is not limited herein, and a person skilled in the art may select any available model for training, and the specific training mode is also consistent with the general neural network training, which is not described herein in detail. The collection of the samples can be to perform sampling detection of any traditional method on each diamond micropowder suspension liquid sample, label the diamond micropowder concentration distribution situation according to the sampling detection result, acquire the time-varying radiation signal and the time-varying wave signal of each sample through the wave transmitter 2 and the wave receiver 3, and input the time-varying radiation signal and the time-varying wave signal with the labeled concentration distribution situation into the model in batches or in non-batches for training and testing until the model converges.
Specifically, the wave emitter 2 and the wave receiver 3 herein use waves with a wavelength equivalent to the size of the diamond micro powder, for example, the embodiment selects the mid-infrared wave with a wavelength equivalent to the general size λ micron of the diamond micro powder, and certainly, the wave emitter and the wave receiver may also select near-infrared, far-infrared or other types of waves in practical application. The dimension of the diamond micropowder refers to the diameter of the diamond micropowder, and the common dimension lambda micrometer can be determined by measuring the dimension of part of the diamond micropowder and then averaging the dimensions. Comparable means that both are approximately in the same order of magnitude.
In the embodiment, the mid-infrared is taken as an example, the waves corresponding to the wave emitter 2 and the wave receiver 3 are mid-infrared, infrared light with continuously variable intensity is emitted by utilizing a multi-wavelength mid-infrared light emitting diode array, and an infrared light emitting diode with the average size of lambda micrometer equivalent to that of the diamond micro powder is selected, so that the infrared light emitting diode can generate obvious infrared light diffraction when being guided to electroplating solution, and a receiving end can observe a complex diffraction pattern, thereby realizing accurate detection.
Specifically, as shown in fig. 2, the wave emitter 2 includes an infrared light emitting diode array 21 and a light emitting control circuit 22, and the light emitting control circuit 22 controls each infrared light emitting diode in the infrared light emitting diode array 21 to emit a time varying infrared signal with gradually changing intensity according to an intensity time varying control command. The light-emitting control circuit 22 is used for controlling each infrared light-emitting diode to emit a time-varying infrared signal with gradually-varying intensity according to the intensity time-varying control command, guiding the electroplating solution, and simultaneously using intensity information (instant wave-varying signal) at different times as an input signal of the convolutional neural network. The wave receiver 3 comprises an infrared radiation detection array 31 and a two-dimensional radiation image acquisition module 32, wherein the infrared radiation detection array 31 is used for detecting infrared radiation signals of the electroplating solution, and the two-dimensional radiation image acquisition module 32 is used for synchronously acquiring time-varying radiation signals from the infrared radiation signals according to a synchronous clock.
Further, the outer surface of the infrared radiation detecting array 31 is preferably protected with an infrared transmitting PC plastic. The infrared radiation detection array 31 detects infrared radiation of the plating solution, such as a mercury cadmium telluride array, by using an infrared detector array, and converts the detected infrared radiation into an electric signal in a photoelectric conversion manner, so as to obtain a two-dimensional infrared radiation signal for the two-dimensional radiation image acquisition module 32 to acquire.
The infrared light emitting diode array 21 includes a plurality of base members in an n-polygonal structure, each base member has n infrared light emitting diodes with different wavelengths uniformly distributed therein, n is greater than or equal to 3, one base member can have n infrared light emitting diodes with different wavelengths or less than n wavelengths, and when there are n infrared light emitting diodes with different wavelengths, all the infrared light emitting diodes in one base member have different wavelengths. One wave emitter 2 may have only one lighting control circuit 22, or one wave emitter 2 may have a plurality of lighting control circuits 22, one lighting control circuit 22 for each base member.
As shown in fig. 3-5, the n-polygonal structure may be a polygon structure such as a triangle, a quadrangle, a hexagon, etc. which can be spread over the whole plane. The n-edge structure of each base piece is divided into n triangles with equal area, and the n infrared light-emitting diodes are distributed in the centers of the n triangles so as to be uniformly distributed in the corresponding base pieces. In the plurality of base members constituting the infrared light emitting diode array 21, any two of the base members have the same infrared light emitting diode and wavelength composition, and the infrared light emitting diodes of the same wavelength of any two of the base members correspond to the same position in the two base members, so that the distances between two adjacent infrared light emitting diodes of any fixed wavelength in the infrared light emitting diode array are equal.
The base member of hexagonal structure is preferred in this embodiment, and fig. 5 shows the base member structure of the infrared led array 21 preferred in this embodiment. Wherein each circle in the hexagon is exactly the locating position of an infrared light emitting diode LED, namely the central position of an equilateral triangle, and the wavelengths of six infrared light emitting diode LEDs are respectively: the size of the common diamond micro powder is about 6um, so the wavelength of the six infrared light-emitting diodes is 3 microns, 4 microns, 5 microns, 6 microns, 7 microns and 8 microns, and the number beside the circle in the figure represents the wavelength of the infrared light-emitting diodes.
As shown in fig. 6, among the plurality of base members constituting the infrared light emitting diode array 21, any two base members have the same arrangement of infrared light emitting diodes in the hexagonal structure, the infrared light emitting diodes of the same wavelength correspond to the same position of the two base members, as shown in fig. 6, the hexagonal structure of the uppermost base member has 5um, 7um, 3um, 8um, 4um, and 6um infrared light emitting diodes in sequence from 12 point position clockwise circumferential direction, and the rest base members are 5um, 7um, 3um, 8um, 4um, and 6um infrared light emitting diodes in sequence from 12 point position clockwise circumferential direction, so that the distances between two adjacent lights of any fixed wavelength (e.g. 4 um) are equal, such a structure can make the infrared light in the emitted equal wavelength uniformly distributed, the diffraction pattern is more regular, and is helpful for the receiving end to determine, the array size of the emitting end can be changed according to actual needs, but the arrangement is retracted or extended as a rule in the manner shown in fig. 6.
The array structure of the infrared radiation detecting array 31 is the same as the infrared light emitting diode array 21, but the density of the infrared radiation detecting array 31 can be larger than or equal to the infrared light emitting diode array 21, and the detection range of the infrared radiation detecting array 31 includes all infrared radiation of the 3um to 8um wave bands so as to detect all infrared radiation generated by the instrument.
When other types of waves are adopted, the above devices may be replaced in a targeted manner, for example, the infrared light emitting diode array 21 is changed into a device array capable of emitting other types of waves, the infrared radiation detection array 31 is changed into a device array capable of detecting other types of wave radiation, and the like, and details are not repeated here.
The scheme utilizes the diffraction phenomenon of the wave, and then judges the distribution condition of the diamond micropowder in the electroplating solution based on the original time-varying wave signal and the time-varying radiation signal acted by the diamond micropowder, thereby realizing the real-time monitoring of the concentration of the diamond micropowder. In addition, the scheme adopts the wave with the wavelength equivalent to the dimension of the diamond micro powder, so that the diamond micro powder can lead the wave of the guide electroplating solution to generate more obvious diffraction phenomenon, and the diffraction image can be more clearly obtained. In addition, this scheme has further ensured the detection effect of instrument through unique transmitting terminal structure and receiving terminal structure that corresponds with it, like a base member evenly distributed a plurality of transmitting tubes, and each transmitting tube has different wavelengths, makes the synchronous crisscross change of different wavelengths through time-varying control signal simultaneously, can make the receiving terminal judge the concentration distribution of the different thickness diamond differential according to the change of diffraction image. Also, as in the present embodiment, the distance between two leds with any fixed wavelength in an infrared led array 21 is equal, so that the emitted infrared light with equal wavelength is distributed uniformly, and thus the diffraction pattern is more regular, and the detection of the receiving end is easier and more accurate.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit or ambit of the invention as defined in the appended claims. In addition, those skilled in the art should understand the circuit diagram manner in the electrical field, that is, the circuits are marked with the same labels to indicate that the two terminals are connected, and the specific connection relationship may refer to the drawings.
Although control module 1 is used more herein; a wave emitter 2; an infrared light emitting diode array 21; a light emission control circuit 22; a wave receiver 3; an infrared radiation detection array 31; a two-dimensional radiation image acquisition module 32; decision block 4, etc., but does not exclude the possibility of using other terms. These terms are used merely to more conveniently describe and explain the nature of the present invention; they are to be construed as being without limitation to any additional limitations that may be imposed by the spirit of the present invention.
Claims (10)
1. The utility model provides a diamond dust concentration distribution tester in diamond dust plating solution, characterized in that, includes control module (1), control module (1) be connected with wave transmitter (2) and wave receiver (3), wave transmitter (2) be used for sending time-varying wave signal according to the synchronizing signal that contains intensity time-varying control command that control module (1) sent, wave receiver (3) be used for gathering in step according to the synchronizing clock in the synchronizing signal time-varying wave signal direction to the time-varying radiation signal that the plating solution takes place, wave receiver (3) be connected with judging module (4), judging module (4) be used for judging diamond dust concentration distribution result according to time-varying radiation signal and time-varying wave signal.
2. The tester for the concentration distribution of diamond micropowder in carborundum plating solution according to claim 1, wherein said wave emitter (2) and wave receiver (3) adopt waves with the wavelength corresponding to the size of diamond micropowder.
3. The diamond powder concentration distribution tester in emery plating solution according to claim 2, characterized in that the wave corresponding to said wave emitter (2) and wave receiver (3) is infrared, and said wave emitter (2) includes infrared light emitting diode array (21) and light emitting control circuit (22); the light-emitting control circuit (22) is used for controlling each infrared light-emitting diode to emit a time-varying infrared signal with gradually-varying intensity according to the intensity time-varying control command;
the wave receiver (3) comprises an infrared radiation detection array (31) and a two-dimensional radiation image acquisition module (32), wherein the infrared radiation detection array (31) is used for detecting infrared radiation signals of the electroplating liquid, and the two-dimensional radiation image acquisition module (32) is used for synchronously acquiring time-varying radiation signals from the infrared radiation signals according to a synchronous clock.
4. The tester for the concentration distribution of diamond micropowder in diamond dust plating solution according to claim 3, characterized in that the infrared radiation detection array (31) detects the infrared radiation of the plating solution by adopting an infrared detector array with an array structure consistent with that of the infrared light emitting diode array (21) and a density greater than or equal to that of the infrared light emitting diode array (21), and converts the detected infrared radiation into an electric signal by a photoelectric conversion mode, thereby obtaining a two-dimensional infrared radiation signal.
5. The tester for the concentration distribution of diamond micropowder in diamond dust plating solution according to claim 4, wherein the infrared light emitting diode array (21) comprises a plurality of base members in n-polygonal structure, each base member is internally provided with n infrared light emitting diodes which are uniformly distributed, and n is more than or equal to 3.
6. The diamond powder concentration distribution tester in diamond dust plating solution according to claim 5, wherein n infrared light emitting diodes in each base member have different wavelengths;
the wavelength of each infrared light-emitting diode is within a lambda +/-5 um range, and the lambda is the common size of the diamond micro powder;
the detection range of the infrared radiation detection array (31) comprises all infrared radiation of a lambda-5 um wave band to a lambda +5um wave band.
7. A diamond micropowder concentration distribution tester in diamond grit plating solution as in claim 6, wherein n-sided polygon of each base member is divided into n triangles with equal area size, and n infrared light emitting diodes are distributed in the centers of the n triangles so that the n infrared light emitting diodes are uniformly distributed in the corresponding base member;
any two of the base members forming the infrared light emitting diode array (21) have the same infrared light emitting diode and wavelength composition, and the infrared light emitting diodes with the same wavelength on any two base members correspond to the same position in the two base members, so that the distance between two adjacent infrared light emitting diodes with any fixed wavelength in the infrared light emitting diode array (21) is equal in length.
8. The diamond powder concentration distribution tester in emery plating solution according to claim 7, characterized in that, the wavelength of each infrared light emitting diode is not less than 3um and not more than 8um, the detection range of the infrared radiation detection array (31) includes all infrared radiation of 3um to 8um wave band;
n =6, and the wavelengths of the 6 infrared light-emitting diodes are respectively 3um, 4um, 5um, 6um, 7um and 8um; in the infrared light emitting diode array (21), all the base pieces have the same wavelength and composition of the infrared light emitting diodes, and the infrared light emitting diodes with the same wavelength among all the base pieces are located at the same position in the base pieces.
9. The tester for the concentration distribution of diamond micropowder in emery plating solution according to claim 8, wherein the infrared wave is a mid-infrared wave;
the infrared light-emitting diode array (21) is a circular array formed by a plurality of base pieces.
10. The tester for the concentration distribution of diamond micropowder in carborundum plating solution according to claim 1, wherein said judging module (4) obtains said time-varying wave signal from a wave transmitter (2), a wave receiver (3) or a control module (1);
the judging module (4) comprises a trained convolutional neural network.
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