CN115473503B - Characterization method, device, medium and electronic equipment of signal amplifier gain - Google Patents
Characterization method, device, medium and electronic equipment of signal amplifier gain Download PDFInfo
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- CN115473503B CN115473503B CN202210566828.8A CN202210566828A CN115473503B CN 115473503 B CN115473503 B CN 115473503B CN 202210566828 A CN202210566828 A CN 202210566828A CN 115473503 B CN115473503 B CN 115473503B
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- 238000012512 characterization method Methods 0.000 title claims abstract description 8
- 230000008054 signal transmission Effects 0.000 claims abstract description 86
- 238000000034 method Methods 0.000 claims abstract description 35
- 238000012360 testing method Methods 0.000 claims description 29
- 238000005259 measurement Methods 0.000 claims description 18
- 239000012895 dilution Substances 0.000 description 20
- 238000010790 dilution Methods 0.000 description 20
- 238000004458 analytical method Methods 0.000 description 8
- 230000003321 amplification Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- 238000005057 refrigeration Methods 0.000 description 4
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- 239000002096 quantum dot Substances 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03G—CONTROL OF AMPLIFICATION
- H03G3/00—Gain control in amplifiers or frequency changers without distortion of the input signal
- H03G3/20—Automatic control
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
- G06N10/00—Quantum computing, i.e. information processing based on quantum-mechanical phenomena
- G06N10/40—Physical realisations or architectures of quantum processors or components for manipulating qubits, e.g. qubit coupling or qubit control
Abstract
The application discloses a characterization method and a device of a signal amplifier gain, wherein the method comprises the following steps: determining attenuation parameters of a signal transmission line in a first quantum link, wherein the first quantum link comprises measuring equipment which is connected through the signal transmission line and is positioned in a room temperature interval and an attenuator which is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of a signal amplifier; determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier which are connected in series and positioned in a low-temperature interval, and the measuring equipment which is positioned in a room-temperature environment and is connected with the attenuator and the signal amplifier through a signal transmission line; and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator. The characterization method can directly characterize the gain parameters of the signal amplifier working in the low-temperature environment, and has simple flow and low cost.
Description
Technical Field
The application belongs to the field of quanta, and particularly relates to a characterization method and device of a signal amplifier gain, a medium and electronic equipment.
Background
In the field of quantum computing, a quantum processor is used for running a quantum computing task, outputting an analog signal carrying an operation result after the operation is completed, and demodulating and analyzing the analog signal by a signal analysis instrument to determine the operation result. It is well known that quantum processors, particularly superconducting quantum processors, typically operate in very low temperature environments, such as 10mK temperatures, requiring the quantum processor to be placed in a refrigeration device, such as a dilution refrigerator. The dilution refrigerator is provided with a plurality of temperature areas in a grading manner, and the quantum processor is usually arranged at the bottommost layer of the dilution refrigerator, namely the lowest temperature layer. In addition, a signal analysis device for analyzing an analog signal carrying the operation result is generally operated in a room temperature environment outside the dilution refrigerator. The quantum processor is connected with the signal analysis instrument through a plurality of temperature areas of the dilution refrigerator by a signal transmission line.
Because the analog signal output by the quantum processor is very weak and is usually as low as-100 dB, the signal analyzer cannot directly perform demodulation analysis processing, and the analog signal needs to be amplified before demodulation analysis. Specifically, a signal amplifier is disposed on a signal transmission line connected between the quantum processor and the signal analyzer, and in order to ensure an amplification effect, a plurality of signal amplifiers are generally disposed on the signal transmission line, and the plurality of amplifiers are disposed in different temperature areas, such as a parametric amplifier located in the same temperature area as the quantum processor, a signal amplifier located in a low temperature area of 4K, a signal amplifier located at room temperature, and the like.
The gain is an extremely important one of the performance parameters of a signal amplifier, which directly determines the signal amplification effect, and the gain needs to be characterized before use. The gain parameters of the signal amplifier at room temperature can be directly tested in a room temperature environment, and the signal amplifier at a low temperature region has inaccurate test results at room temperature due to very low working temperature, and needs to be tested and characterized at the corresponding working temperature to determine whether the signal amplifier meets the preset requirement. The prior art lacks means for directly characterizing the gain of a signal amplifier operating in a low temperature environment.
Disclosure of Invention
The purpose of the application is to provide a characterization method, a device, a medium and electronic equipment of the gain of a signal amplifier, wherein the characterization method can directly characterize the gain parameter of the signal amplifier working in a low-temperature environment, has simple flow and low cost, and makes up for the gap in the prior art.
The technical scheme of the application is as follows:
an aspect of the present application provides a method for characterizing a gain of a signal amplifier, the method comprising:
determining attenuation parameters of a signal transmission line in a first quantum link, wherein the first quantum link comprises measurement equipment which is connected through the signal transmission line and is positioned in a room temperature interval and an attenuator which is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of a signal amplifier;
determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series and located in a low temperature interval, and the measuring device connected with the attenuator and the signal amplifier through the signal transmission line and located in a room temperature environment;
and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
Preferably, the determining the attenuation parameter of the signal transmission line in the first quantum link specifically includes:
applying a test signal to an input of the first quantum link;
determining a first power of an output signal of the output end of the first quantum link;
and determining the attenuation parameters of the signal transmission line according to the first power and the attenuation parameters of the attenuator.
Preferably, the determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator specifically includes:
and determining the difference value between the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
The method for characterizing the gain of the signal amplifier as described above preferably determines a scattering parameter of the second quantum link, and specifically includes:
applying a test signal to an input of the second quantum link;
and determining the second power of the signal output by the output end of the second quantum link as the scattering parameter.
The method for characterizing the gain of the signal amplifier as described above, preferably, the determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator specifically includes:
determining the gain of the signal amplifier as:
P 1 ＝P out -Loss 1 -Loss 2
wherein the P is 1 For the gain of the signal amplifier, the P out For the scattering parameter, the Loss 1 The Loss is the attenuation parameter of the signal transmission line 2 Is an attenuation parameter of the attenuator.
The method for characterizing the gain of a signal amplifier as described above, preferably, the frequency of the test signal comprises 4GHz-8GH.
The method for characterizing the gain of a signal amplifier as described above, preferably, the target operating temperature interval includes 4K.
The method for characterizing the gain of a signal amplifier as described above, preferably, the signal transmission line comprises a microwave coaxial line.
The method of characterizing the gain of a signal amplifier as described above, preferably, the measuring device comprises a vector network analyzer.
In yet another aspect, the present application provides an apparatus for characterizing gain of a signal amplifier, comprising:
the signal amplifier comprises a first measuring module and a second measuring module, wherein the first measuring module is configured to determine attenuation parameters of a signal transmission line in a first quantum link, the first quantum link comprises measuring equipment which is connected through the signal transmission line and is located in a room temperature interval and an attenuator which is located in a low temperature interval, and the low temperature interval is a target working temperature interval of the signal amplifier;
a second measurement module configured to determine a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series at a low temperature interval, the measurement device connected to the attenuator and the signal amplifier through the signal transmission line at room temperature environment;
a parameter calculation module configured to determine a gain of the signal amplifier based on the scattering parameter, an attenuation parameter of the signal transmission line, and an attenuation parameter of the attenuator.
In yet another aspect, the present application provides a storage medium storing at least one computer instruction for causing the computer to perform the above method.
In a further aspect the present application provides an electronic device comprising a processor and a memory, the memory having stored therein computer instructions, the processor being arranged to execute the computer instructions to perform the method as described above.
Compared with the prior art, the application provides a method for characterizing the gain of a signal amplifier, which comprises the following steps: determining attenuation parameters of a signal transmission line in a first quantum link, wherein the first quantum link comprises measuring equipment which is connected through the signal transmission line and is positioned in a room temperature interval and an attenuator which is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of a signal amplifier; determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier which are connected in series and positioned in a low-temperature interval, and the measuring equipment which is positioned in a room-temperature environment and is connected with the attenuator and the signal amplifier through a signal transmission line; and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator. The first quantum link and the second quantum link are test circuits of the built quantum processor, and the performance parameters of the signal transmission lines in the two quantum links are the same. According to the method, firstly, the loss parameters of the signal transmission line in the first quantum link are tested through the attenuator which is located in the same temperature interval with the signal amplifier, then the signal amplifier is loaded into the second quantum link, and the gain parameters of the signal amplifier located in the low temperature region can be determined according to the loss parameters of the signal transmission line, the loss parameters of the attenuator and the scattering parameters of the whole link which are determined by measurement of measurement equipment. According to the method, the gain parameters of the signal amplifier working in the low-temperature environment are directly represented by the test circuit of the quantum processor, so that the flow is simple, the cost is low, and the blank of the prior art is made up.
Drawings
FIG. 1 is a schematic diagram of a quantum computer system according to an embodiment of the present application;
fig. 2 is a flowchart of a method for characterizing gain of a signal amplifier according to an embodiment of the present application;
fig. 3 is a schematic diagram of a first quantum link and a second quantum link provided in an embodiment of the present application;
fig. 4 is a flowchart of determining attenuation parameters of a signal transmission line in a first quantum link according to an embodiment of the present application;
FIG. 5 is a flowchart of determining scattering parameters of a second quantum link according to an embodiment of the present application;
fig. 6 is a schematic diagram of a device for characterizing gain of a signal amplifier according to an embodiment of the present application.
Reference numerals illustrate:
10-a first measurement module, 20-a second measurement module, 30-a parameter calculation module.
Detailed Description
The following detailed description is merely illustrative and is not intended to limit the embodiments and/or the application or uses of the embodiments. Furthermore, there is no intention to be bound by any expressed or implied information presented in the preceding background or brief summary or the detailed description section.
For purposes of clarity, technical solutions, and advantages of embodiments of the present application, one or more embodiments will now be described with reference to the drawings, wherein like reference numerals are used to refer to like components throughout. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a more thorough understanding of one or more embodiments. It may be evident, however, that one or more embodiments may be practiced without these specific details, and that such embodiments may be incorporated by reference herein without departing from the scope of the claims.
It should be noted that the terms "first," "second," and the like in the description and claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate such that embodiments of the present application described herein may be implemented in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The quantum computer system shown in fig. 1 is an operating quantum computer system designed by the applicant and comprises a signal source device positioned outside the dilution refrigerator and a quantum processor positioned in the dilution refrigerator, wherein the signal source device is connected with the quantum processor through a signal transmission line. The outside of the dilution refrigerator is a room temperature environment, a plurality of temperature areas are arranged in the dilution refrigerator in a grading manner to realize the lowest temperature area of the bottommost layer, the quantum processor usually works in the lowest temperature area, such as a 10mK layer in the figure, and the signal transmission line passes through the plurality of temperature areas of the dilution refrigerator to realize the connection of the quantum processor and the signal source equipment. It should be added that only 3 signal transmission lines are illustrated in the figure, and in practical application, because the number of the qubits integrated on the quantum processor is large, each qubit needs to be connected with a plurality of signal transmission lines, so the number of the signal transmission lines in the dilution refrigerator reaches hundreds or even thousands.
Because the analog signal output by the quantum processor is very weak and even as low as-100 dB, the signal processing equipment cannot directly perform demodulation analysis processing, and the analog signal needs to be amplified before demodulation analysis. Specifically, a signal amplifier is disposed on a connection signal transmission line between a quantum processor and a signal processing device, and in order to ensure an amplification effect, a plurality of signal amplifiers are generally disposed on the connection signal transmission line, and the plurality of amplifiers are disposed in different temperature areas, such as a parametric amplifier located in the same temperature area as the quantum processor, a low-temperature amplifier located in a low-temperature area of 4K, a room-temperature amplifier located at room temperature, and the like. Wherein the parametric amplifier and the quantum processor are usually fixed on a support plate or tray at the bottom layer in the dilution refrigerator, and the low-temperature amplifier is usually fixed on a refrigeration plate at each temperature zone.
The gain is an extremely important one of the performance parameters of a signal amplifier, which directly determines the signal amplification effect, and the gain needs to be characterized before use. The gain parameter of the signal amplifier at room temperature can be directly tested in the room temperature environment, while the low-temperature amplifier at 4K temperature region has inaccurate test result in room temperature due to very low working temperature, and needs to be tested and characterized at the corresponding working temperature. The prior art lacks means for directly characterizing the gain of a signal amplifier operating in a low temperature environment.
As shown in fig. 2, an embodiment of the present application provides a method for characterizing a gain of a signal amplifier, the method including the steps of:
step S10: and determining attenuation parameters of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device which is connected through the signal transmission line and is positioned in a room temperature interval and an attenuator which is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of a signal amplifier.
Step S20: determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series and located in a low temperature interval, and the measuring device connected with the attenuator and the signal amplifier through a signal transmission line and located in a room temperature environment.
As shown in fig. 1 and 3, a first quantum link and a second quantum link are built by using a test circuit in a dilution refrigerator in a quantum computer system. Specifically, the first quantum link comprises a measuring device located in a room temperature interval and an attenuator located in a low temperature interval, and the attenuator is arranged in a low temperature area of a signal amplifier to be characterized and is connected through a signal transmission line. The measuring equipment is provided with a signal output port and a signal receiving port, wherein the signal output port and the signal receiving port are respectively connected with two ends of the attenuator through signal transmission lines, and therefore attenuation parameters of the signal transmission lines in the first quantum link can be tested.
The second quantum link comprises an attenuator and a signal amplifier which are connected in series and positioned in a low-temperature zone, and measuring equipment positioned in a room-temperature environment, wherein a signal output port of the measuring equipment is connected with the other end of the attenuator, a signal receiving port of the measuring equipment is connected with the other end of the signal amplifier, a signal received by a signal receiving end of the measuring equipment can be subjected to test analysis, and a scattering parameter of the whole second quantum link is determined, wherein the scattering parameter is also called as an S parameter and can be used for representing signal transmission performance. The attenuation parameters of the signal transmission line are determined by adopting the first quantum link, and the scattering parameters amplified by the signal amplifier are tested by the second quantum link, so that the performance parameters of the signal amplifier can be determined. It is to be added that the signal transmission lines in the application are all in the dilution refrigerator, and the signal output ports of the test equipment outside the dilution refrigerator are connected with the test cables in a direct matching way.
Step S30: and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
Specifically, the scattering parameters of the second quantum link include the attenuation parameters of the attenuator, the gain parameters of the signal amplifier, and the attenuation parameters of the signal transmission line in the entire link. The scattering parameter can be determined by direct measurement by a measuring device, the attenuation parameter of the signal transmission line is determined by testing the attenuation parameter of the first quantum link, and the attenuation parameter of the attenuator is determined, so that the gain parameter of the signal amplifier can be determined.
It is to be added that the first quantum link and the second quantum link are both directly signal transmission lines of a dilution refrigerator connected with a quantum processor in the quantum computer system, each signal transmission line is switched on a refrigeration disc of two adjacent temperature areas through a signal switching device, and when the first quantum link and the second quantum link are built, an attenuator and a signal amplifier are both fixed on the refrigeration disc of a target temperature area, namely, the model, the length and the connection mode of the signal transmission lines in the first quantum link and the second quantum link are the same, so that the attenuation parameters of the signal transmission lines in the second quantum link are the same as those of the signal transmission lines determined through the test of the first quantum link.
According to the method, the first quantum link and the second quantum link are built by the test circuit of the quantum processor in the dilution refrigerator, the attenuation constant of the signal transmission line is determined through the first quantum link, the scattering parameter of the second quantum link comprising the signal amplifier is tested, the gain parameter of the signal amplifier can be determined, the gain parameter of the signal amplifier which works in a low-temperature environment is represented, and the method is simple in flow and low in cost.
As shown in fig. 4, as an implementation manner of the embodiment of the present application, the determining the attenuation parameter of the signal transmission line in the first quantum link specifically includes the following steps:
step S110: a test signal is applied to an input of the first quantum link.
Step S120: a first power of an output signal of the first quantum link is determined.
Step S130: and determining the attenuation parameters of the signal transmission line according to the first power and the attenuation parameters of the attenuator.
Specifically, a test signal is output to the input end of the first quantum link through the signal output port of the measuring equipment, the signal output by the output end of the first quantum link is received through the signal receiving port of the measuring equipment, the first power is determined through the measuring equipment, and then the attenuation parameter of the whole signal transmission line in the first quantum link can be determined according to the first power and the attenuation parameter of the attenuator. Both ends of the first quantum link can be used as an input end or an output end, and the signal flow direction in the first quantum link is not limited.
As an implementation manner of the embodiment of the present application, the determining, according to the first power and the attenuation parameter of the attenuator, the attenuation parameter of the signal transmission line specifically includes: and determining the difference value between the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
Specifically, the first power of the output signal of the first quantum link includes attenuation parameters of all elements and signal transmission lines in the whole link, namely, attenuation parameters of the attenuator and attenuation parameters of the signal transmission lines. The attenuation parameters of the attenuator are determined, and the difference value between the first power and the attenuation parameters of the attenuator is determined as the attenuation parameters of the signal transmission line through calculation.
As shown in fig. 5, as an implementation manner of the embodiment of the present application, determining the scattering parameter of the second quantum link specifically includes the following steps:
step S210: applying a test signal to an input of the second quantum link.
Step S220: and determining the second power of the signal output by the output end of the second quantum link as the scattering parameter.
Specifically, a test signal is output to the input end of the second quantum link through the signal output port of the measuring device, the signal output by the output end of the second quantum link is received through the signal receiving port of the measuring device, and the second power of the output signal is determined through the measuring device. The second power parameter of the output signal comprises scattering parameters of all electronic elements in the second quantum link and the signal transmission line, and is determined through testing of the measuring equipment. It is to be added that a signal amplifier is provided in the second quantum link, and therefore, when the second quantum link is connected to the signal output port and the signal receiving port of the measuring apparatus, it is necessary to secure the signal application direction. As one implementation manner of the embodiment of the present application, the determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator specifically includes: determining the gain of the signal amplifier as:
P 1 ＝P out -Loss 1 -Loss 2
wherein the P is 1 For the gain of the signal amplifier, the P out For the scattering ofParameters of the Loss 1 The Loss is the attenuation parameter of the signal transmission line 2 Is an attenuation parameter of the attenuator.
In particular, the scattering parameters of the second quantum link include the sum of the attenuation parameters of the attenuator, the gain parameters of the signal amplifier, and the attenuation parameters of the signal transmission line throughout the link. Thus, the gain parameter of the signal amplifier can be calculated from the scattering parameter determined by the measurement. The attenuation parameters of the signal transmission line are determined by testing the attenuation parameters of the first quantum link, and the attenuation parameters of the attenuator are determined.
As one implementation of the embodiments of the present application, the frequency of the test signal includes 4GHz-8GH. The signal amplifier is mainly used for amplifying signals output by the quantum processor, the working frequency band of the quantum processor is usually 4GHz-8GHz, and the frequency is set to be 4GHz-8GHz when test signals are output through measurement equipment, so that the attenuation parameters and the scattering parameters of the signal transmission line determined through measurement are more accurate.
As an implementation of the embodiment of the present application, the target operating temperature interval includes 4K. The temperature in the dilution refrigerator is set in a grading manner, the temperature is gradually reduced to the temperature of 10mK when the quantum processor works, the temperature can be set to be about 4K-10K in the 10mK temperature region, the signal amplifier works in the temperature region, and the signal amplifier is connected with the parametric amplifier and used for amplifying the signal output by the quantum processor for the second time. The 4K temperature layer and the 50K temperature layer shown in FIG. 3 are examples of one of the two, and may be other temperatures, such as 10K or 70K.
As an implementation of the embodiment of the present application, the signal transmission line includes a microwave coaxial line. The microwave coaxial line is connected with the measuring equipment outside the dilution refrigerator and the attenuator or the signal amplifier in the dilution refrigerator, so that the problem that the line loss is large due to long lines is avoided, the interference resistance of the microwave coaxial line is high, the performance is stable in an extremely low temperature environment, and the accuracy of a measuring result is ensured.
As an implementation of the embodiments of the present application, the measuring device includes a vector network analyzer. When the first quantum link and the second quantum link are built for testing, the parameters to be tested are the attenuation parameters and the scattering parameters of the signal transmission line, and the vector network analyzer is adopted for testing, so that the testing is simple, convenient and quick.
As shown in fig. 6, based on the same application concept, the embodiment of the present application further provides a device for characterizing a gain of a signal amplifier, including: a first measurement module 10 configured to determine an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measurement device located in a room temperature interval and an attenuator located in a low temperature interval, which is a target operating temperature interval of the signal amplifier, connected by the signal transmission line; a second measurement module 20 configured to determine a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series at a low temperature interval, the measurement device being located in a room temperature environment, the attenuator and the signal amplifier being connected by a signal transmission line; a parameter calculation module 30 configured to determine the gain of the signal amplifier based on the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator.
Based on the same application concept, the embodiments of the present application also provide a storage medium storing at least one computer instruction, where the computer instruction is configured to perform the above method when executed.
Based on the same application concept, the embodiment of the application also provides an electronic device, which comprises a processor and a memory, wherein the memory stores computer instructions, and the processor is configured to execute the computer instructions to perform the method.
The foregoing detailed description of the construction, features and advantages of the present application will be presented in terms of embodiments illustrated in the drawings, wherein the foregoing description is merely illustrative of preferred embodiments of the application, and the scope of the application is not limited to the embodiments illustrated in the drawings.
Claims (10)
1. A method of characterizing the gain of a signal amplifier, the method comprising:
applying a test signal to an input of the first quantum link; the first quantum link comprises measuring equipment which is connected through a signal transmission line and is located in a room temperature interval and an attenuator which is located in a low temperature interval, wherein the low temperature interval is a target working temperature interval of the signal amplifier;
determining attenuation parameters of the signal transmission line according to the first power of the signal output by the output end of the first quantum link and the attenuation parameters of the attenuator;
determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series and located in a low temperature interval, and the measuring device connected with the attenuator and the signal amplifier through the signal transmission line and located in a room temperature environment;
determining the difference between the scattering parameter and the measured attenuation parameter as the gain of the signal amplifier; wherein the measured attenuation parameter is the sum of the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
2. The method for characterizing gain of a signal amplifier according to claim 1, wherein said determining an attenuation parameter of said signal transmission line based on said first power and an attenuation parameter of said attenuator, comprises:
and determining the difference value between the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
3. The method for characterizing gain of a signal amplifier according to claim 1, wherein determining the scattering parameter of the second quantum link comprises:
applying a test signal to an input of the second quantum link;
and determining the second power of the signal output by the output end of the second quantum link as the scattering parameter.
4. A method of characterizing the gain of a signal amplifier according to any of claims 1 or 3, wherein the frequency of the test signal comprises 4GHz-8GH.
5. The method of characterizing the gain of a signal amplifier according to claim 1, wherein the target operating temperature interval comprises 4K.
6. The method of characterizing the gain of a signal amplifier according to claim 1, wherein the signal transmission line comprises a microwave coaxial line.
7. The method of characterizing the gain of a signal amplifier according to claim 1, wherein the measurement device comprises a vector network analyzer.
8. A signal amplifier gain characterization apparatus, comprising:
the first measuring module is configured to apply a test signal to an input end of a first quantum link, wherein the first quantum link comprises a measuring device which is connected through a signal transmission line and is positioned in a room temperature interval and an attenuator which is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of the signal amplifier; determining attenuation parameters of the signal transmission line according to the first power of the signal output by the output end of the first quantum link and the attenuation parameters of the attenuator;
a second measurement module configured to determine a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series at a low temperature interval, the measurement device connected to the attenuator and the signal amplifier through the signal transmission line at room temperature environment;
a parameter calculation module configured to determine a difference between the scattering parameter and a measured attenuation parameter as a gain of the signal amplifier; wherein the measured attenuation parameter is the sum of the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
9. A storage medium storing at least one computer instruction arranged to perform the method of any one of claims 1-7 when run.
10. An electronic device comprising a processor and a memory, the memory having stored therein computer instructions, the processor being arranged to execute the computer instructions to perform the method of any of claims 1-7.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2042987A1 (en) * | 1990-05-25 | 1991-11-26 | Giorgio Grasso | Unit for amplifying light signals in optical fiber transmission lines |
| US9176174B1 (en) * | 2013-03-15 | 2015-11-03 | Anritsu Company | Systems and methods for simultaneously measuring forward and reverse scattering parameters |
| CN109004995A (en) * | 2018-07-26 | 2018-12-14 | Oppo广东移动通信有限公司 | Multi-path equipment radio frequency communication performance test macro, test method and device |
| CN111900939A (en) * | 2020-08-28 | 2020-11-06 | 中国电子科技集团公司第十六研究所 | Single-chip low-noise amplifier used for external matching of input port of liquid helium temperature zone |
| CN113300771A (en) * | 2020-07-30 | 2021-08-24 | 阿里巴巴集团控股有限公司 | Optical amplifier, optical transmission system and optical signal processing method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9876588B2 (en) * | 2014-09-04 | 2018-01-23 | Apple Inc. | Systems and methods for performing tester-less radio-frequency testing on wireless communications circuitry |
-
2022
- 2022-05-23 CN CN202210566828.8A patent/CN115473503B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA2042987A1 (en) * | 1990-05-25 | 1991-11-26 | Giorgio Grasso | Unit for amplifying light signals in optical fiber transmission lines |
| US9176174B1 (en) * | 2013-03-15 | 2015-11-03 | Anritsu Company | Systems and methods for simultaneously measuring forward and reverse scattering parameters |
| CN109004995A (en) * | 2018-07-26 | 2018-12-14 | Oppo广东移动通信有限公司 | Multi-path equipment radio frequency communication performance test macro, test method and device |
| CN113300771A (en) * | 2020-07-30 | 2021-08-24 | 阿里巴巴集团控股有限公司 | Optical amplifier, optical transmission system and optical signal processing method |
| CN111900939A (en) * | 2020-08-28 | 2020-11-06 | 中国电子科技集团公司第十六研究所 | Single-chip low-noise amplifier used for external matching of input port of liquid helium temperature zone |
Non-Patent Citations (2)
| Title |
|---|
| "Cryo-CMOS Circuits and Systems for Quantum Computing Applications";B. Patra等;《IEEE Journal of Solid-State Circuits》;20170917;第53卷(第1期);全文 * |
| L波段宽带低温低噪声放大器的设计与测量;何川;王自力;王生旺;吴志华;刘玲玲;;微波学报;20151215(第06期);全文 * |
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