CN115473503A - Method, device, medium and electronic equipment for representing gain of signal amplifier - Google Patents
Method, device, medium and electronic equipment for representing gain of signal amplifier Download PDFInfo
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Abstract
The application discloses a method and a device for characterizing gain of a signal amplifier, wherein the method comprises the following steps: determining an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device located in a room temperature interval and an attenuator located in a low temperature interval which are connected through the signal transmission line, and the low temperature interval is a target working temperature interval of a signal amplifier; determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier which are connected in series in a low temperature region, and the measuring equipment which is connected with the attenuator and the signal amplifier through a signal transmission line and is located in a room temperature environment; and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator. The characterization method can directly characterize the gain parameters of the signal amplifier working in the low-temperature environment, and is simple in process and low in cost.
Description
Technical Field
The application belongs to the quantum field, and particularly relates to a method, a device, a medium and an electronic device for representing the gain of a signal amplifier.
Background
In the field of quantum computing, quantum computing tasks are run by a quantum processor, analog signals carrying computing results are output after computing is finished, and the analog signals are demodulated and analyzed by a signal analyzer to determine the computing results. It is well known that quantum processors, and in particular superconducting quantum processors, typically operate in very low temperature environments, such as 10mK temperatures, requiring the quantum processors to be placed in refrigeration equipment, such as dilution refrigerators. The dilution refrigerator is provided with a plurality of temperature zones in a grading manner, and the quantum processor is usually arranged at the bottommost layer of the dilution refrigerator, namely the lowest temperature layer. In addition, a signal analysis device that analyzes an analog signal carrying a calculation result is generally operated in a room temperature environment outside the dilution refrigerator. The quantum processor is connected with the signal analysis instrument through a plurality of temperature zones of the dilution refrigerator by signal transmission lines.
Because the analog signal output by the quantum processor is very weak, generally as low as-100 dB, the signal analyzer cannot directly perform demodulation analysis processing, and the analog signal needs to be amplified before demodulation analysis. Specifically, a signal amplifier is disposed on a connection signal transmission line between the quantum processor and the signal analyzer, and in order to ensure an amplification effect, a plurality of signal amplifiers are typically disposed on the connection signal transmission line, and the plurality of amplifiers are disposed in different temperature regions, for example, a parametric amplifier located in the same temperature region as the quantum processor, a signal amplifier located in a low-temperature region of 4K, a signal amplifier located at room temperature, and the like.
Gain is an extremely important one of the performance parameters of a signal amplifier, which directly determines the signal amplification effect and requires characterization of the gain before use. The gain parameters of the signal amplifier positioned at the room temperature can be directly tested in the room temperature environment, and the signal amplifier positioned at the low-temperature area is inaccurate in test result at the room temperature due to the extremely low working temperature, needs to be tested and characterized at the corresponding working temperature, and determines whether the preset requirement is met. The prior art lacks a means to directly characterize the gain of a signal amplifier operating in a low temperature environment.
Disclosure of Invention
The method can directly represent gain parameters of the signal amplifier working in a low-temperature environment, is simple in process and low in cost, and makes up for the vacancy in the prior art.
The technical scheme of the application is as follows:
one aspect of the present application provides a method for characterizing a gain of a signal amplifier, the method comprising:
determining an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device located in a room temperature interval and an attenuator located in a low temperature interval which are connected through the signal transmission line, and the low temperature interval is a target working temperature interval of a signal amplifier;
determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series in a low temperature region, and the measuring device connected with the attenuator and the signal amplifier through the signal transmission line in a room temperature environment;
and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
Preferably, the method for characterizing the gain of the signal amplifier, the determining an attenuation parameter of a signal transmission line in the first quantum link specifically includes:
applying a test signal to an input of the first quantum link;
determining a first power of an output signal at an output of the first quantum link;
and determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator.
Preferably, the method for characterizing the gain of the signal amplifier according to the above includes determining an attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator, and specifically includes:
and determining the difference value of the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
Preferably, the method for characterizing the gain of the signal amplifier determines a scattering parameter of the second quantum link, and specifically includes:
applying a test signal to an input of the second quantum link;
and determining a second power of an output signal of the output end of the second quantum link as the scattering parameter.
Preferably, the method for characterizing the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator determines the gain of the signal amplifier, and specifically includes:
determining a gain of the signal amplifier as:
P 1 ＝P out -Loss 1 -Loss 2
wherein, the P 1 Is the gain of the signal amplifier, the P out As the scattering parameter, the Loss 1 Is an attenuation parameter of the signal transmission line, the Loss 2 Is the attenuation parameter of the attenuator.
In the method for characterizing the gain of the signal amplifier, preferably, the frequency of the test signal includes 4GHz-8GH.
In the method for characterizing the gain of the signal amplifier, preferably, the target operating temperature interval includes 4K.
In the method for characterizing the gain of the signal amplifier as described above, preferably, the signal transmission line includes a microwave coaxial line.
In the method for characterizing the gain of the signal amplifier as described above, preferably, the measuring device includes a vector network analyzer.
In another aspect, the present application provides a device for characterizing gain of a signal amplifier, including:
a first measurement module configured to determine an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link includes a measurement device located in a room temperature interval and an attenuator located in a low temperature interval, which is a target operating temperature interval of the signal amplifier, connected by the signal transmission line;
a second measurement module configured to determine a scattering parameter of a second quantum link, wherein the second quantum link includes the attenuator and the signal amplifier connected in series in a low temperature region, the measurement device connecting the attenuator and the signal amplifier through the signal transmission line in a room temperature environment;
a parameter calculation module configured to determine a gain of the signal amplifier based on the scattering parameter, an attenuation parameter of the signal transmission line, and an attenuation parameter of the attenuator.
In still another aspect, the present application provides a storage medium, which stores at least one computer instruction for causing the computer to execute the method described above.
Yet another aspect of the present application provides an electronic device, which includes a processor and a memory, where the memory stores computer instructions, and the processor is configured to execute the computer instructions to perform the method described above.
Compared with the prior art, the method for characterizing the gain of the signal amplifier comprises the following steps: determining an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device located in a room temperature interval and an attenuator located in a low temperature interval which are connected through the signal transmission line, and the low temperature interval is a target working temperature interval of a signal amplifier; determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier which are connected in series in a low temperature region, and the measuring equipment which is connected with the attenuator and the signal amplifier through a signal transmission line and is located in a room temperature environment; and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator. The first quantum link and the second quantum link are both built quantum processor test circuits, and signal transmission line performance parameters in the two links are the same. The method comprises the steps of testing loss parameters of a signal transmission line in a first quantum link through an attenuator which is located in the same temperature range with a signal amplifier, loading the signal amplifier into a second quantum link, and determining gain parameters of the signal amplifier located in a low-temperature region according to the loss parameters of the signal transmission line, the loss parameters of the attenuator and scattering parameters of the whole link, which are determined through testing and measured by measuring equipment. The method and the device have the advantages that the gain parameters of the signal amplifier working in the low-temperature environment are directly represented by the testing circuit of the quantum processor, the process is simple, the cost is low, and the blank of the prior art is made up.
Drawings
FIG. 1 is a diagram of a quantum computer system according to an embodiment of the present disclosure;
fig. 2 is a flowchart of a method for characterizing a gain of a signal amplifier according to an embodiment of the present application;
fig. 3 is a schematic diagram of a first quantum link and a second quantum link provided in an embodiment of the present application;
fig. 4 is a flowchart of determining an attenuation parameter of a signal transmission line in a first quantum link according to an embodiment of the present disclosure;
fig. 5 is a flowchart for determining a scattering parameter of a second quantum link according to an embodiment of the present disclosure;
fig. 6 is a schematic diagram of a device for characterizing a gain of a signal amplifier according to an embodiment of the present application.
Description of the reference numerals:
10-a first measuring module, 20-a second measuring module, 30-a parameter calculating module.
Detailed Description
The following detailed description is merely illustrative and is not intended to limit the embodiments and/or the application or uses of the embodiments. Furthermore, there is no intention to be bound by any expressed or implied information presented in the preceding "background" or "summary" sections or "detailed description" sections.
To further clarify the objects, aspects and advantages of embodiments of the present application, one or more embodiments are now described with reference to the drawings, wherein like reference numerals are used to refer to like elements throughout. In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a more thorough understanding of one or more embodiments. It may be evident, however, that one or more embodiments may be practiced without these specific details in various instances, and that the various embodiments are incorporated by reference into each other without departing from the scope of the present disclosure.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
The quantum computer system shown in fig. 1 is an operating quantum computer system designed by the applicant, and comprises a signal source device located outside the dilution refrigerator and a quantum processor located inside the dilution refrigerator, wherein the signal source device and the quantum processor are connected through a signal transmission line. The outside of the dilution refrigerator is in a room temperature environment, a plurality of temperature regions are arranged in the dilution refrigerator in a grading mode to realize the lowest temperature region at the bottommost layer, the quantum processor usually works in the lowest temperature region, such as a 10mK layer in the figure, and the signal transmission line penetrates through the plurality of temperature regions of the dilution refrigerator to realize the connection of the quantum processor and the signal source equipment. It should be added that only 3 signal transmission lines are illustrated in the figure, and in practical applications, because the number of qubits integrated on the quantum processor is large, each qubit needs to be connected with several signal transmission lines, and therefore, the number of signal transmission lines in the dilution refrigerator reaches several hundreds or even thousands.
Because the analog signal output by the quantum processor is very weak, even as low as-100 dB, the signal processing device cannot directly perform demodulation analysis processing, and the analog signal needs to be amplified before demodulation analysis. Specifically, a signal amplifier is provided on a connection signal transmission line between the quantum processor and the signal processing device, and in order to ensure an amplification effect, a plurality of signal amplifiers are generally provided on the connection signal transmission line, and the plurality of amplifiers are provided in different temperature regions, for example, a parametric amplifier located in the same temperature region as the quantum processor, a low temperature amplifier located in a low temperature region of 4K, a room temperature amplifier located at room temperature, and the like. The parametric amplifier and the quantum processor are usually fixed on a support disc or a tray at the bottommost layer in the dilution refrigerator, and the low-temperature amplifier is usually fixed on a refrigeration disc of each temperature zone.
Gain is an extremely important one of the performance parameters of a signal amplifier, which directly determines the signal amplification effect and requires characterization of the gain before use. The gain parameters of the signal amplifier at room temperature can be directly tested in the room temperature environment, and the low-temperature amplifier at the 4K temperature area has inaccurate test result at room temperature due to the very low working temperature, and needs to be tested and characterized at the corresponding working temperature. The prior art lacks a means to directly characterize the gain of a signal amplifier operating in a low temperature environment.
As shown in fig. 2, an embodiment of the present application provides a method for characterizing a gain of a signal amplifier, the method comprising the steps of:
step S10: and determining an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device located in a room temperature interval and an attenuator located in a low temperature interval which are connected through the signal transmission line, and the low temperature interval is a target working temperature interval of the signal amplifier.
Step S20: determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier connected in series in a low temperature region, and the measuring device connected with the attenuator and the signal amplifier through a signal transmission line in a room temperature environment.
With reference to fig. 1 and 3, a first quantum link and a second quantum link are established by using a test line in a dilution refrigerator in a quantum computer system. Specifically, the first quantum link comprises measuring equipment located in a room temperature interval and an attenuator located in a low temperature interval, the attenuator is arranged in a low temperature area of the signal amplifier to be characterized, and the attenuator is connected through a signal transmission line. The measuring equipment is provided with a signal output port and a signal receiving port, and the signal output port and the signal receiving port are respectively connected with two ends of the attenuator through signal transmission lines, so that the attenuation parameters of the signal transmission lines in the first quantum link can be tested.
The second quantum link comprises an attenuator, a signal amplifier and measuring equipment, wherein the attenuator and the signal amplifier are located in a low-temperature interval and are connected in series, the measuring equipment is located in a room-temperature environment, a signal output port of the measuring equipment is connected with the other end of the attenuator, a signal receiving port of the measuring equipment is connected with the other end of the signal amplifier, signals received by a signal receiving end of the measuring equipment can be tested and analyzed, and scattering parameters of the whole second quantum link are determined, wherein the scattering parameters are also called S parameters and can be used for representing signal transmission performance. The first quantum link is adopted to determine the attenuation parameters of the signal transmission line, and the second quantum link is used to test the scattering parameters amplified by the signal amplifier, so that the performance parameters of the signal amplifier can be determined. It needs to be supplemented that, the signal transmission line in this application is in diluting the refrigerator, what connect on diluting the refrigerator outer test equipment's the signal output port is the test cable, is with test equipment direct match connection.
Step S30: and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
Specifically, the scattering parameters of the second quantum link include an attenuation parameter of an attenuator, a gain parameter of a signal amplifier, and an attenuation parameter of a signal transmission line in the whole link. Wherein the scattering parameter can be directly measured and determined by a measuring device, the attenuation parameter of the signal transmission line is determined by testing the attenuation parameter of the first quantum link, and the attenuation parameter of the attenuator is determined, so that the gain parameter of the signal amplifier can be determined.
It is to be supplemented that the first quantum link and the second quantum link both directly adopt signal transmission lines connected to the quantum processor in the dilution refrigerator in the quantum computer system, each signal transmission line is switched over on the refrigeration disks of the two adjacent temperature zones through a signal switching device, and when the first quantum link and the second quantum link are built, the attenuator and the signal amplifier are both fixed on the refrigeration disks in the target temperature zone, that is, the model, the length and the connection mode of the signal transmission lines in the first quantum link and the second quantum link are all the same, so the attenuation parameters of the signal transmission lines in the second quantum link and the attenuation parameters of the signal transmission lines determined through the test of the first quantum link are the same.
According to the method, the first quantum link and the second quantum link are built by adopting the test circuit of the quantum processor in the dilution refrigerator, the attenuation constant of the signal transmission line is determined through the first quantum link, the scattering parameter of the second quantum link including the signal amplifier is tested, the gain parameter of the signal amplifier can be determined, the gain parameter of the signal amplifier working in a low-temperature environment is represented, the process is simple, and the cost is low.
As shown in fig. 4, as an implementation manner of the embodiment of the present application, the determining an attenuation parameter of a signal transmission line in a first quantum link specifically includes the following steps:
step S110: applying a test signal to an input of the first quantum link.
Step S120: a first power of an output signal at an output of the first quantum link is determined.
Step S130: and determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator.
Specifically, a test signal is output to an input end of the first quantum link through a signal output port of the measuring device, a signal output from an output end of the first quantum link is received through a signal receiving port of the measuring device, a first power is determined through the measuring device, and then an attenuation parameter of the whole signal transmission line in the first quantum link can be determined according to the first power and the attenuation parameter of the attenuator. Both ends of the first quantum link can be used as input ends or output ends, and the signal flow direction in the first quantum link is not limited.
As an implementation manner of the embodiment of the present application, the determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator specifically includes: and determining the difference value of the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
Specifically, the first power of the output signal of the first quantum link includes attenuation parameters of all elements and signal transmission lines in the whole link, that is, the attenuation parameter of the attenuator and the attenuation parameter of the signal transmission line. And determining the difference value between the first power and the attenuation parameter of the attenuator as the attenuation parameter of the signal transmission line through calculation.
As shown in fig. 5, as an implementation manner of the embodiment of the present application, determining a scattering parameter of a second quantum link specifically includes the following steps:
step S210: applying a test signal to an input of the second quantum link.
Step S220: and determining second power of an output signal of the output end of the second quantum link as the scattering parameter.
Specifically, the test signal is output to the input end of the second quantum link through the signal output port of the measuring device, the signal output from the output end of the second quantum link is received through the signal receiving port of the measuring device, and the second power of the output signal is determined through the measuring device. And the second power parameter of the output signal comprises scattering parameters of all electronic elements in the second quantum link and the signal transmission line, and is determined through testing of the measuring equipment. It is necessary to supplement that a signal amplifier is arranged in the second quantum link, so that when the signal output port and the signal receiving port of the measuring device are connected with the second quantum link, the signal application direction needs to be ensured. As an implementation manner of the embodiment of the present application, the determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator specifically includes: determining a gain of the signal amplifier as:
P 1 ＝P out -Loss 1 -Loss 2
wherein, the P is 1 Is the gain of the signal amplifier, the P out As the scattering parameter, the Loss 1 Is an attenuation parameter of the signal transmission line, the Loss 2 Is the attenuation parameter of the attenuator.
Specifically, the scattering parameter of the second quantum link includes the sum of the attenuation parameter of the attenuator, the gain parameter of the signal amplifier, and the attenuation parameter of the signal transmission line in the whole link. Thus, the gain parameter of the signal amplifier can be calculated from the scattering parameter determined by the measurement. The attenuation parameter of the signal transmission line is determined by testing the attenuation parameter of the first quantum link, and the attenuation parameter of the attenuator is determined.
As an implementation manner of the embodiment of the application, the frequency of the test signal comprises 4GHz-8GH. The signal amplifier is mainly used for amplifying signals output by a quantum processor, the working frequency section of the quantum processor is usually 4GHz-8GHz, and the frequency is set to be 4GHz-8GHz when a measuring device outputs a test signal, so that the attenuation parameters and the scattering parameters of a signal transmission line determined through measurement are ensured to be more accurate.
As an implementation manner of the embodiment of the present application, the target operating temperature interval includes 4K. The temperature zones in the dilution refrigerator are arranged in a grading manner, the temperature is reduced to 10mK for the work of the quantum processor layer by layer, the temperature zone of about 4K-10K can be arranged on the 10mK temperature zone, the signal amplifier works in the temperature zone and is connected with the parametric amplifier for carrying out secondary amplification on the signal output by the quantum processor. The 4K temperature layer and the 50K temperature layer labeled in fig. 3 are examples of one of them, and may be at other temperatures, such as 10K or 70K.
As an implementation of this embodiment of the present application, the signal transmission line includes a microwave coaxial line. The microwave coaxial line is connected with the measuring equipment outside the dilution refrigerator and the attenuator or the signal amplifier in the dilution refrigerator, so that the phenomenon that the line loss is large due to the fact that the line is long is avoided, the microwave coaxial line is high in anti-interference capacity and stable in performance under the extremely-low-temperature environment, and the accuracy of a measuring result is ensured.
As an implementation manner of the embodiment of the present application, the measurement device includes a vector network analyzer. When the first quantum link and the second quantum link are built for testing, parameters to be tested are attenuation parameters and scattering parameters of the signal transmission line, the vector network analyzer is adopted to execute testing, and testing is simple, convenient and quick.
As shown in fig. 6, based on the same application concept, an embodiment of the present application further provides a characterization apparatus for gain of a signal amplifier, including: a first measurement module 10 configured to determine an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link includes a measurement device located in a room temperature interval and an attenuator located in a low temperature interval, which are connected by the signal transmission line, and the low temperature interval is a target operating temperature interval of the signal amplifier; a second measurement module 20 configured to determine a scattering parameter of a second quantum link, wherein the second quantum link includes the attenuator and the signal amplifier connected in series in a low temperature region, and the measurement device connected to the attenuator and the signal amplifier through a signal transmission line in a room temperature environment; a parameter calculation module 30 configured to determine a gain of the signal amplifier based on the scattering parameter, an attenuation parameter of the signal transmission line, and an attenuation parameter of the attenuator.
Based on the same application concept, embodiments of the present application further provide a storage medium, where the storage medium stores at least one computer instruction, and the computer instruction is configured to execute the above method when executed.
Based on the same application concept, embodiments of the present application further provide an electronic device, where the electronic device includes a processor and a memory, where the memory stores computer instructions, and the processor is configured to execute the computer instructions to perform the method described above.
The construction, features and functions of the present application are described in detail in the embodiments illustrated in the drawings, which are only preferred embodiments of the present application, but the present application is not limited by the drawings, and all equivalent embodiments that can be modified or changed according to the idea of the present application are within the scope of the present application without departing from the spirit of the present application.
Claims (12)
1. A method for characterizing gain of a signal amplifier, the method comprising:
determining an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link comprises a measuring device which is connected through the signal transmission line and is positioned in a room temperature interval and an attenuator which is connected through the signal transmission line and is positioned in a low temperature interval, and the low temperature interval is a target working temperature interval of a signal amplifier;
determining a scattering parameter of a second quantum link, wherein the second quantum link comprises the attenuator and the signal amplifier which are connected in series and located in a low temperature interval, and the measuring equipment which is located in a room temperature environment and is connected with the attenuator and the signal amplifier through the signal transmission line;
and determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line and the attenuation parameter of the attenuator.
2. The method for characterizing the gain of a signal amplifier according to claim 1, wherein the determining the attenuation parameter of the signal transmission line in the first quantum link specifically comprises:
applying a test signal to an input of the first quantum link;
determining a first power of an output signal at an output of the first quantum link;
and determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator.
3. The method for characterizing the gain of a signal amplifier according to claim 2, wherein the determining the attenuation parameter of the signal transmission line according to the first power and the attenuation parameter of the attenuator specifically comprises:
and determining the difference value of the first power and the attenuation parameter as the attenuation parameter of the signal transmission line.
4. The method for characterizing the gain of a signal amplifier according to claim 1, wherein determining the scattering parameter of the second quantum link specifically comprises:
applying a test signal to an input of the second quantum link;
and determining second power of an output signal of the output end of the second quantum link as the scattering parameter.
5. The method for characterizing the gain of a signal amplifier according to claim 1, wherein the determining the gain of the signal amplifier according to the scattering parameter, the attenuation parameter of the signal transmission line, and the attenuation parameter of the attenuator specifically comprises:
determining a gain of the signal amplifier as:
P 1 ＝P out -Loss 1 -Loss 2
wherein, the P is 1 Is the gain of the signal amplifier, the P out As the scattering parameter, the Loss 1 Is an attenuation parameter of the signal transmission line, the Loss 2 Is the attenuation parameter of the attenuator.
6. A method of characterizing the gain of a signal amplifier as claimed in any one of claims 2 or 4, wherein the frequency of the test signal comprises 4GHz-8GH.
7. The method of characterizing a gain of a signal amplifier as claimed in claim 1, wherein the target operating temperature interval comprises 4K.
8. The method of characterizing the gain of a signal amplifier according to claim 1, wherein the signal transmission line comprises a microwave coaxial line.
9. The method of characterizing a signal amplifier gain according to claim 1, wherein the measuring device comprises a vector network analyzer.
10. An apparatus for characterizing the gain of a signal amplifier, comprising:
a first measurement module configured to determine an attenuation parameter of a signal transmission line in a first quantum link, wherein the first quantum link includes the measurement device located in a room temperature interval and an attenuator located in a low temperature interval, which are connected by the signal transmission line, and the low temperature interval is a target operating temperature interval of the signal amplifier;
a second measurement module configured to determine a scattering parameter of a second quantum link, wherein the second quantum link includes the attenuator and the signal amplifier connected in series in a low temperature region, the measurement device connecting the attenuator and the signal amplifier through the signal transmission line in a room temperature environment;
a parameter calculation module configured to determine a gain of the signal amplifier based on the scattering parameter, an attenuation parameter of the signal transmission line, and an attenuation parameter of the attenuator.
11. A storage medium having stored thereon at least one computer instruction arranged, when executed, to perform the method of any one of claims 1-9.
12. An electronic device comprising a processor and a memory, the memory having stored therein computer instructions, the processor being arranged to execute the computer instructions to perform the method of any of claims 1-9.
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| CN117849594A (en) * | 2024-03-06 | 2024-04-09 | 成都世源频控技术股份有限公司 | Quick gain test and compensation calculation method for microwave channel module and test platform thereof |
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