CN115468746A - System and method for testing performance of galvanometer - Google Patents

System and method for testing performance of galvanometer Download PDF

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Publication number
CN115468746A
CN115468746A CN202211047082.6A CN202211047082A CN115468746A CN 115468746 A CN115468746 A CN 115468746A CN 202211047082 A CN202211047082 A CN 202211047082A CN 115468746 A CN115468746 A CN 115468746A
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signal
galvanometer
tested
target
module
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高文刚
鲁公涛
刘思桢
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Goertek Optical Technology Co Ltd
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Goertek Optical Technology Co Ltd
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Priority to CN202211047082.6A priority Critical patent/CN115468746A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0207Details of measuring devices

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  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)

Abstract

The system comprises a galvanometer driving module, a laser, a position detection module and a performance testing module, wherein the galvanometer driving module is set to generate a target driving signal and drive the galvanometer to be tested to swing in a target direction according to the target driving signal; the laser is set to emit a laser signal to the vibrating mirror to be tested so that the vibrating mirror to be tested reflects the laser signal in the swinging process; the position detection module is configured to obtain a target position signal representing a swing position of the galvanometer to be detected in the target direction according to the reflected laser signal; the performance testing module is configured to determine a delay time of the target position signal relative to the target driving signal, and test a performance of the galvanometer under test according to the delay time.

Description

System and method for testing performance of galvanometer
Technical Field
The present disclosure relates to the field of projection technologies, and in particular, to a system and a method for testing performance of a galvanometer.
Background
DLP (Digital Light processing) is a technology for digitally processing an image signal and projecting Light.
A galvanometer is added in part of DLP projection equipment, and the effect of improving the resolution ratio of a projection picture can be realized. And the performance of the galvanometer determines the performance of the projected image such as resolution, smear and the like. Specifically, the oscillating position of the galvanometer needs to be synchronized with the projected frame image, so as to avoid the problems of errors, influence on resolution, smear, color distortion of pixels and the like of the projected image.
The oscillating position of the galvanometer is asynchronous with the driving signal, and the oscillating position and the driving signal have delay therebetween, and the delay is determined by the performance parameters of the galvanometer body. In order to ensure the consistency of the performance of the galvanometer, the delay between the oscillating position of the galvanometer and the driving signal needs to be consistent.
Therefore, it is valuable to provide a scheme capable of detecting whether the delay between the oscillating position of the galvanometer and the driving signal is consistent.
Disclosure of Invention
One object of the present disclosure is to provide a new technical solution capable of testing the performance of the galvanometer.
According to a first aspect of the present disclosure, a galvanometer performance testing system is provided, which includes a galvanometer driving module, a laser, a position detecting module and a performance testing module, wherein the galvanometer driving module is configured to generate a target driving signal and drive a galvanometer to be tested to swing in a target direction according to the target driving signal; the laser is set to emit a laser signal to the vibrating mirror to be tested so that the vibrating mirror to be tested reflects the laser signal in the swinging process; the position detection module is configured to obtain a target position signal representing a swing position of the galvanometer to be detected in the target direction according to the reflected laser signal; the performance testing module is configured to determine a delay time of the target position signal relative to the target driving signal, and test a performance of the galvanometer to be tested according to the delay time.
Optionally, the galvanometer driving module includes a signal generating unit, a digital-to-analog converting unit, and a first power amplifying unit, where the signal generating unit is configured to generate the target driving signal; the analog-to-digital conversion unit is configured to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal; the power amplification unit is set to amplify the analog driving signal to obtain an amplified driving signal, and the amplified driving signal is output to the vibrating mirror to be tested to drive the vibrating mirror to be tested to swing in the target direction.
Optionally, the position detection module includes a position detection unit, a second power amplification unit, and an analog-to-digital conversion unit, where the position detection unit is configured to output an analog position signal indicating a swing position of the galvanometer to be detected according to the reflected laser signal; the second power amplification unit is configured to amplify the analog position signal to obtain an amplified position signal; the analog-to-digital conversion unit is configured to perform analog-to-digital conversion processing on the amplified position signal to obtain the target position signal.
Optionally, the system further includes a control module, a key module, and a switch circuit, where the switch circuit is connected to the driving circuit of the mirror to be tested, and the control module is configured to control the on-off state of the switch circuit according to a key signal input by the key module.
Optionally, the system further includes a display module configured to display a performance test result of the galvanometer to be tested.
Optionally, the performance testing module is further configured to:
determining a first point in time of at least one rising edge of the target drive signal; determining a time point of a first rising edge of the target position signal after the first time point as a corresponding second time point; determining a time difference between the second time point and the corresponding first time point as the delay time; and testing the performance of the vibrating mirror to be tested according to the delay time.
Optionally, the performance testing module is further configured to:
determining the first time point and the second time point after a set number of rising edges in the target position signal.
Optionally, the performance testing module is further configured to:
calculating an average value of the delay times;
judging whether the average value is in a set range or not;
under the condition that the average value is not in the set range, judging that the performance test result of the vibrating mirror to be tested is unqualified; and under the condition that the average value is within the set range, judging that the performance test result of the vibrating mirror to be tested is qualified.
Optionally, the performance testing module is further configured to:
calculating a minimum value and a maximum value of the delay time;
determining the fluctuation amplitude of the delay time according to the maximum value and the minimum value;
comparing the fluctuation range with a set value in the case that the average value is not within the set range;
under the condition that the fluctuation amplitude is larger than a set value, judging that the performance test result of the vibrating mirror to be tested is unqualified; and under the condition that the fluctuation amplitude is less than or equal to the set value, judging that the performance test result of the vibrating mirror to be tested is qualified.
According to a second aspect of the present disclosure, there is provided a galvanometer performance testing method, including:
generating a target driving signal, and driving the galvanometer to be tested to swing in the target direction according to the target driving signal;
transmitting a laser signal to the vibrating mirror to be tested so as to enable the vibrating mirror to be tested to reflect the laser signal in the swinging process;
obtaining a target position signal representing the swing position of the vibrating mirror to be measured in the target direction according to the reflected laser signal;
and determining the delay time of the target position signal relative to the target driving signal, and testing the performance of the vibrating mirror to be tested according to the delay time.
Through the embodiment of the disclosure, the service environment of the vibrating mirror to be tested in the projection equipment can be simulated, the delay performance of the vibrating mirror to be tested is accurately tested, the test efficiency is higher, and the consistency of the delay performance of the vibrating mirror to be tested is ensured. Therefore, under the condition that the galvanometer to be tested is applied to the projection equipment, the swing of the galvanometer to be tested can be ensured to be synchronous with the projection frame signal.
Other features of the present disclosure and advantages thereof will become apparent from the following detailed description of exemplary embodiments thereof, which proceeds with reference to the accompanying drawings.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the disclosure and together with the description, serve to explain the principles of the disclosure.
Fig. 1 is a block schematic diagram of a galvanometer performance testing system according to one embodiment of the present disclosure.
Fig. 2 is a schematic diagram of the oscillating position of the galvanometer.
FIG. 3 is a block diagram schematic diagram of a galvanometer performance testing system of another embodiment of the present disclosure.
FIG. 4 is a signal timing diagram of one embodiment of the present disclosure.
Fig. 5 is a schematic flow chart of a galvanometer performance testing method according to an embodiment of the disclosure.
Detailed Description
Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that: the relative arrangement of the components and steps, the numerical expressions, and numerical values set forth in these embodiments do not limit the scope of the present disclosure unless specifically stated otherwise.
The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the disclosure, its application, or uses.
Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate.
In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, further discussion thereof is not required in subsequent figures.
The present disclosure provides a galvanometer performance testing system 1000, as shown in fig. 1, including a galvanometer driving module 1100, a laser 1200, a position detecting module 1300, and a performance testing module 1400.
The galvanometer driving module 1100 is configured to generate a target driving signal and drive the galvanometer 2000 to be tested to swing around a target direction according to the target driving signal.
In one embodiment of the present disclosure, the galvanometer 2000 to be measured is a biaxial galvanometer, and can swing in both the first direction and the second direction. Wherein the first direction and the second direction may be perpendicular to each other. The galvanometer driving module 1100 may provide a first driving signal and a second driving signal, drive the galvanometer 2000 to be tested to swing in a first direction according to the first driving signal, and drive the galvanometer 2000 to be tested to swing in a second direction according to the second driving signal.
The target direction in this embodiment may be any one of the first direction and the second direction, and may also include the first direction and the second direction. Correspondingly, the target driving signal may be any one of the first driving signal and the second driving signal, or may include the first driving signal and the second driving signal.
Specifically, in the case that the target direction is the first direction, the target driving signal is the first driving signal; in the case that the target direction is a second direction, the target driving signal is a second driving signal; in the case where the target directions are the first direction and the second direction, the target driving signals are the first driving signal and the second driving signal.
As shown in fig. 2, the galvanometer 2000 to be measured swings in the first direction and the second direction under the driving of the first driving signal and the second driving signal, and projects the projection frame signal to a corresponding position among four positions a, b, c, and d in the swing process.
In one embodiment of the present disclosure, as shown in fig. 3, the galvanometer driving module 1100 may include a signal generating unit 1110, a digital-to-analog converting unit 1120, and a first power amplifying unit 1130. The signal generation unit 1110 is arranged to generate the target drive signal. The digital-to-analog conversion unit 1120 is configured to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal. The first power amplifying unit 1130 is configured to amplify the analog driving signal to obtain an amplified driving signal, and output the amplified driving signal to the galvanometer to be measured, so as to drive the galvanometer to be measured to swing in the target direction.
Illustratively, the signal generating unit 1110 may be provided by an FPGA (Field Programmable Gate Array).
The laser 1200 is configured to emit a laser signal to the galvanometer under test such that the galvanometer under test reflects the laser signal during oscillation.
The position detection module 1300 is configured to detect the swing position of the galvanometer to be detected according to the reflected laser signal, and obtain a target position signal indicating the swing position of the galvanometer to be detected in the target direction.
In one embodiment of the present disclosure, as shown in fig. 3, the position detection module 1300 may include a position detection unit 1310, a second power amplification unit 1320, and an analog-to-digital conversion unit 1330. The position detection unit 1310 is configured to output an analog position signal indicating the oscillation position of the galvanometer 2000 to be measured based on the laser signal reflected by the galvanometer 2000 to be measured. The second power amplification unit 1320 is configured to amplify the analog position signal to obtain an amplified position signal. The analog-to-digital conversion unit 1330 is configured to perform an analog-to-digital conversion process on the amplified position signal to obtain a target position signal.
In this embodiment, the position detecting unit 1310 may be provided by a PSD (position sensitive device). During the oscillation of the galvanometer 2000 to be measured, the laser signal may be reflected to the position detecting unit 1310. The position detection unit 1310 reflects the laser signal to the position on the position detection unit 1310 according to the galvanometer 2000 to be measured, and obtains an analog position signal representing the swing position of the galvanometer 2000 to be measured.
In the case where the galvanometer to be measured 2000 is a biaxial galvanometer, the galvanometer to be measured 2000 may be oscillated in the first direction or the second direction. Then, the analog-to-digital conversion unit 1330 performs the analog-to-digital conversion on the amplified position signal to obtain a first position signal indicating the swing position of the galvanometer under test 2000 in the first direction and a second position signal indicating the swing position of the galvanometer under test 2000 in the second direction.
The target position signal is a first position signal when the target direction is a first direction; the target position signal is a second position signal when the target direction is a second direction; in the case where the target direction includes a first direction and a second direction, the target position signal includes a first position signal and a second position signal.
The performance testing module 1400 is configured to determine a delay time of the target position signal relative to the target driving signal, and test a performance of the galvanometer to be tested according to the delay time.
In one example, the performance testing module 1400 may be provided by an FPGA.
In one embodiment, a timing diagram of the first drive signal, the second drive signal, the first position signal, and the second position signal may be as shown in FIG. 4. Under the condition that the first driving signal and the second driving signal are both low level, the vibrating mirror 2000 to be tested can be driven to swing to a position d; under the condition that the first driving signal is at a low level and the second driving signal is at a high level, the vibrating mirror 2000 to be tested can be driven to swing to a position a; under the condition that the first driving signal and the second driving signal are both high level, the vibrating mirror 2000 to be tested can be driven to swing to the position b; when the first driving signal is at a high level and the second driving signal is at a low level, the vibrating mirror 2000 to be tested may be driven to swing to the position c. Correspondingly, under the condition that the first position signal and the second position signal are both low levels, the swing position of the vibrating mirror to be tested is indicated as a position d; under the condition that the first driving signal is at a low level and the second driving signal is at a high level, indicating that the swing position of the vibrating mirror to be tested is a position a; under the condition that the first driving signal and the second driving signal are both high level, indicating that the swing position of the vibrating mirror to be tested is a position b; and under the condition that the first driving signal is at a high level and the second driving signal is at a low level, indicating that the swing position of the vibrating mirror to be tested is a position c.
In the present embodiment, since there is a delay between the oscillation position of the galvanometer under test and the driving signal, as shown in fig. 4, the first position signal is delayed with respect to the first driving signal, and the second position signal is delayed with respect to the second driving signal.
In a normal case, the signal period durations of the first drive signal and the second drive signal are equal, and therefore, in a normal case, the delay time of the first position signal with respect to the first drive signal is equal to the delay time of the second position signal with respect to the second drive signal. Thus, it is possible to have the first drive signal as the target drive signal and the first position signal as the target position signal; alternatively, the second drive signal may be the target drive signal and the second position signal may be the target position signal.
In the example shown in FIG. 4, t 1 Is the starting time point, t, of the oscillating mirror 2000 to be measured swinging to the position d 2 Is a starting point of time, t, at which the driving signal changes to a state of driving the galvanometer 2000 to be measured to the position a 3 Is the starting time point of the oscillating mirror 2000 to be measured swinging to the position a, and t 1 、t 2 、t 3 The following formula is satisfied:
Δt 1 =t 2 -t 1 (formula 1)
Δt 2 =t 3 -t 2 (formula 2)
T=Δt 1 +Δt 2 (formula 3)
Wherein, T is the signal period duration of the target driving signal and is a constant; Δ t 2 Is the delay time.
To synchronize the image frame signal and the oscillating position of the galvanometer in the projection equipment, delta t needs to be ensured 1 Is a constant value.
Under the condition that the galvanometer driving module 1100 and the performance testing module 1400 are both provided by the FPGA, the FPGA can be more accurateTo obtain t 2 The time point. If t is selected 1 At the time point as the start, Δ t is calculated by the above equation 1 1 The performance of the galvanometer to be tested is tested, which may result in an inaccurate test result. Thus, t may be selected 2 The delay time Δ t is calculated according to equation 2 with the time point as the start 2 By Δ t 2 To indirectly judge Δ t 1 Whether or not constant.
In one embodiment of the present disclosure, the performance testing module 1400 may be configured to: determining a first point in time of at least one rising edge of the target drive signal; determining a time point of a first rising edge of the target position signal after each first time point as a corresponding second time point; determining a time difference between the corresponding second time point and the first time point as a delay time; the performance of the galvanometer 2000 to be tested is tested according to the delay time.
In one example, the oscillation of the galvanometer under test may be unstable when the galvanometer under test 2000 is initially tested, and therefore, to ensure the accuracy of the test result, the performance testing module 1400 may determine the first time point and the second time point after a set number of rising edges occur in the target position signal. That is, the performance testing module 1400 may determine the delay time after a set number of rising edges occur in the target position signal, and test the performance of the galvanometer to be tested according to the delay time.
The set number may be set in advance according to an application scenario or a specific requirement. For example, the set number may be 10.
In a first embodiment of the present disclosure, the performance testing module 1400 may be: determining at least one delay time of the target position signal relative to the target driving signal, judging whether each delay time is in a set range, and judging that the performance test result of the galvanometer 2000 to be tested is qualified under the condition that each delay time is in the set range; and under the condition that any delay time is not in the set range, judging that the performance test result of the vibrating mirror 2000 to be tested is unqualified.
In the second embodiment of the present disclosure, the performance testing module 1400 may determine at least one delay time according to the target position signal and the target driving signal, and calculate an average value of the at least one delay time; judging whether the average value is within a set range, and judging that the performance test result of the vibrating mirror 2000 to be tested is qualified under the condition that the average value is within the set range; when the average value is not within the set range, the performance test result of the galvanometer 2000 to be tested is determined to be unqualified.
Further, the performance testing module 1400 may be further configured to: calculating the maximum value and the minimum value of the delay time, and determining the fluctuation amplitude of the delay time according to the maximum value and the minimum value; comparing the fluctuation range with a set value under the condition that the average value is in a set range; judging that the performance test result of the vibrating mirror to be tested is unqualified under the condition that the fluctuation amplitude is larger than a set value; and under the condition that the fluctuation amplitude is less than or equal to the set value, judging that the performance test result of the vibrating mirror to be tested is qualified.
In the foregoing first and second embodiments, the setting range may be Δ t according to the above equation 3 1 Constant value of T, and a preset tolerance ± Δ d. Specifically, the set range may be expressed as [ (T- Δ T) 1 -Δd),(T-Δt 1 +Δd)]. Wherein, the tolerance can be preset according to the application scene or the specific requirement.
In an embodiment of the present disclosure, as shown in fig. 3, the system 1000 may further include a control module 1500, a key module 1600, and a switch circuit 1700, where the switch circuit 1700 is connected to the driving circuit of the vibrating mirror 2000 to be tested, and the control module 1500 is configured to control a switch state of the switch circuit 1700 according to a key signal input by the key module 1600.
When the switch circuit 1700 is turned on, the galvanometer driving module 1100 may drive the galvanometer 2000 to be tested to swing in the target direction according to the target driving signal. When the switching circuit 1700 is turned off, the amplified driving signal cannot be output to the vibrating mirror 2000 to be tested, and the vibrating mirror 2000 to be tested stops swinging. The present embodiment can start or stop the test of the galvanometer 2000 to be tested by controlling the switching state of the switching circuit 1700.
In one example, the key module 1600 may have a first key and a second key. The control module 1500 may control the switch circuit 1700 to be turned on when detecting that the first key is pressed. The control 1500 may also control the switch circuit 1700 to open upon detecting that the second key is pressed.
In another example, the key module 1700 may have a third key. The control module 1500 may change the switch state of the switch circuit 1700 when the third key is detected to be pressed. Specifically, the control module 1500 may control the switch circuit 1700 to be turned off when detecting that the third key is pressed while the switch circuit 1700 is turned on; the control module 1500 may detect that the third button is pressed when the switch circuit 1700 is turned off, and then control the switch circuit 1700 to be turned on.
Further, the key module 1700 in this embodiment may be provided by a mechanical key or a virtual key in the upper computer.
In an embodiment of the present disclosure, as shown in fig. 3, the system 1000 may further include a display module 1800, where the display module 1800 is configured to display a performance test result of the galvanometer 2000 to be tested.
Further, the display module 1800 may be provided by an upper computer.
Through the embodiment of the disclosure, the use environment of the vibrating mirror to be tested in the projection equipment can be simulated, the delay performance of the vibrating mirror to be tested is accurately tested, the test efficiency is higher, and the consistency of the delay performance of the vibrating mirror to be tested is ensured. Therefore, under the condition that the galvanometer to be tested is applied to the projection equipment, the swing of the galvanometer to be tested can be ensured to be synchronous with the projection frame signal.
The disclosure also provides a method for testing the performance of the galvanometer. The method can be implemented by the galvanometer performance testing system.
Fig. 5 is a schematic flow chart of a galvanometer performance testing method according to an embodiment of the disclosure.
According to fig. 5, the method may comprise steps S5100 to S5400 as follows:
and S5100, generating a target driving signal, and driving the galvanometer to be tested to swing in the target direction according to the target driving signal.
Step S5200, a laser signal is emitted to the galvanometer to be measured, so that the galvanometer to be measured reflects the laser signal during the oscillating process.
Step S5300 obtains a target position signal indicating a swing position of the galvanometer to be measured in the target direction based on the reflected laser signal.
And step S5400, determining the delay time of the target position signal relative to the target driving signal, and testing the performance of the galvanometer to be tested according to the delay time.
In one embodiment of the present disclosure, determining a delay time of the target position signal relative to the target driving signal, and testing the performance of the galvanometer under test according to the delay time may include:
determining a first point in time of at least one rising edge of the target drive signal; determining a time point of a first rising edge of the target position signal after the first time point as a second time point; determining a time difference between the second time point and the corresponding first time point as a delay time; and testing the performance of the vibrating mirror to be tested according to the delay time.
In one embodiment of the present disclosure, the method may further include: the step of determining the first point in time and the second point in time is performed after a set number of rising edges in the target position signal.
In an embodiment of the present disclosure, the testing the performance of the galvanometer to be tested according to the delay time may include: calculating an average value of the delay times; judging whether the average value is in a set range; under the condition that the average value is not in the set range, judging that the performance test result of the vibrating mirror to be tested is unqualified; and under the condition that the average value is within the set range, judging that the performance test result of the vibrating mirror to be tested is qualified.
In one embodiment of the present disclosure, the method may further include:
calculating the maximum value and the minimum value of the delay time; determining the fluctuation amplitude of the delay time according to the maximum value and the minimum value; comparing the fluctuation range with a set value in the case that the average value is within a set range; judging that the performance test result of the vibrating mirror to be tested is unqualified under the condition that the fluctuation amplitude is larger than a set value; and under the condition that the fluctuation amplitude is less than or equal to the set value, judging that the performance test result of the vibrating mirror to be tested is qualified.
Through the embodiment of the disclosure, the service environment of the vibrating mirror to be tested in the projection equipment can be simulated, the delay performance of the vibrating mirror to be tested is accurately tested, the test efficiency is higher, and the consistency of the delay performance of the vibrating mirror to be tested is ensured. Therefore, under the condition that the galvanometer to be tested is applied to the projection equipment, the swing of the galvanometer to be tested can be ensured to be synchronous with the projection frame signal.
The present disclosure may also include a computer program product. The computer program product may include a computer-readable storage medium having computer-readable program instructions, i.e., executable instructions, loaded thereon for causing a processor to implement various aspects of the present disclosure.
The computer-readable storage medium may be a tangible device that can hold and store the instructions for use by the instruction execution device. The computer readable storage medium may be, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, semiconductor memory device, or any suitable combination of the foregoing. More specific examples (a non-exhaustive list) of the computer readable storage medium would include the following: a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a Static Random Access Memory (SRAM), a portable compact disc read-only memory (CD-ROM), a Digital Versatile Disc (DVD), a memory stick, a floppy disk, a mechanical coding device, such as punch cards or in-groove projection structures having instructions stored thereon, and any suitable combination of the foregoing. Computer-readable storage media as used herein is not to be interpreted as a transitory signal per se, such as a radio wave or other freely propagating electromagnetic wave, an electromagnetic wave propagating through a waveguide or other transmission medium (e.g., optical pulses through a fiber optic cable), or an electrical signal transmitted through an electrical wire.
The computer-readable program instructions described herein may be downloaded from a computer-readable storage medium to a respective computing/processing device, or to an external computer or external storage device via a network, such as the internet, a local area network, a wide area network, and/or a wireless network. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers and/or edge servers. The network adapter card or network interface in each computing/processing device receives computer-readable program instructions from the network and forwards the computer-readable program instructions for storage in a computer-readable storage medium in the respective computing/processing device.
The computer program instructions for carrying out operations of the present disclosure may be assembler instructions, instruction Set Architecture (ISA) instructions, machine-related instructions, microcode, firmware instructions, state setting data, or source or object code written in any combination of one or more programming languages, including an object oriented programming language such as Smalltalk, C + + or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The computer readable program instructions may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or the connection may be made to an external computer (for example, through the Internet using an Internet service provider). In some embodiments, the electronic circuitry that can execute the computer-readable program instructions implements aspects of the present disclosure by utilizing the state information of the computer-readable program instructions to personalize the electronic circuitry, such as a programmable logic circuit, a Field Programmable Gate Array (FPGA), or a Programmable Logic Array (PLA).
Various aspects of the present disclosure are described herein with reference to flowchart illustrations and/or block diagrams of methods, computing devices and computer program products according to embodiments of the disclosure. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer-readable program instructions.
These computer-readable program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions/acts specified in the flowchart and/or block diagram block or blocks. These computer-readable program instructions may also be stored in a computer-readable storage medium that can direct a computer, programmable data processing apparatus, and/or other devices to function in a particular manner, such that the computer-readable medium storing the instructions comprises an article of manufacture including instructions which implement the function/act specified in the flowchart and/or block diagram block or blocks.
The computer readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other devices to cause a series of operational steps to be performed on the computer, other programmable apparatus or other devices to produce a computer implemented process such that the instructions which execute on the computer, other programmable apparatus or other devices implement the functions/acts specified in the flowchart and/or block diagram block or blocks.
The flowchart and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of computing devices, methods and computer program products according to various embodiments of the present disclosure. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of instructions, which comprises one or more executable instructions for implementing the specified logical function(s). In some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based computing devices that perform the specified functions or acts, or combinations of special purpose hardware and computer instructions. It is well known to those skilled in the art that implementation by hardware, by software, and by a combination of software and hardware are equivalent.
The foregoing description of the embodiments of the present disclosure has been presented for purposes of illustration and description, but is not intended to be exhaustive or limited to the embodiments disclosed. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terms used herein were chosen in order to best explain the principles of the embodiments, the practical application, or technical improvements to the techniques in the marketplace, or to enable others of ordinary skill in the art to understand the embodiments disclosed herein.

Claims (10)

1. A galvanometer performance test system is characterized by comprising a galvanometer driving module, a laser, a position detection module and a performance test module, wherein the galvanometer driving module is set to generate a target driving signal and drive a galvanometer to be tested to swing in a target direction according to the target driving signal; the laser is set to emit a laser signal to the vibrating mirror to be tested so that the vibrating mirror to be tested reflects the laser signal in the swinging process; the position detection module is configured to obtain a target position signal representing a swing position of the galvanometer to be detected in the target direction according to the reflected laser signal; the performance testing module is configured to determine a delay time of the target position signal relative to the target driving signal, and test a performance of the galvanometer to be tested according to the delay time.
2. The system of claim 1, wherein the galvanometer drive module comprises a signal generation unit, a digital-to-analog conversion unit, and a first power amplification unit, the signal generation unit configured to generate the target drive signal; the digital-to-analog conversion unit is arranged to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal; the power amplification unit is set to amplify the analog driving signal to obtain an amplified driving signal, and the amplified driving signal is output to the vibrating mirror to be tested to drive the vibrating mirror to be tested to swing in the target direction.
3. The system of claim 1, wherein the position detection module comprises a position detection unit, a second power amplification unit and an analog-to-digital conversion unit, and the position detection unit is configured to output an analog position signal representing a swing position of the galvanometer under test according to the reflected laser signal; the second power amplification unit is arranged to amplify the analog position signal to obtain an amplified position signal; the analog-to-digital conversion unit is configured to perform analog-to-digital conversion processing on the amplified position signal to obtain the target position signal.
4. The system as claimed in claim 1, further comprising a control module, a key module and a switch circuit, wherein the switch circuit is connected to the driving circuit of the galvanometer under test, and the control module is configured to control the on/off state of the switch circuit according to a key signal input by the key module.
5. The system of claim 1, further comprising a display module configured to display a performance test result of the galvanometer under test.
6. The system of claim 1, wherein the performance testing module is further configured to:
determining a first point in time of at least one rising edge of the target drive signal; determining a time point of a first rising edge of the target position signal after the first time point as a corresponding second time point; determining a time difference between the second time point and the corresponding first time point as the delay time; and testing the performance of the vibrating mirror to be tested according to the delay time.
7. The system of claim 6, wherein the performance testing module is further configured to:
determining the first time point and the second time point after a set number of rising edges in the target position signal.
8. The system of claim 6, wherein the performance testing module is further configured to:
calculating an average value of the delay times;
judging whether the average value is in a set range or not;
under the condition that the average value is not in the set range, judging that the performance test result of the vibrating mirror to be tested is unqualified; and under the condition that the average value is within the set range, judging that the performance test result of the vibrating mirror to be tested is qualified.
9. The system of claim 8, wherein the performance testing module is further configured to:
calculating a minimum value and a maximum value of the delay time;
determining the fluctuation amplitude of the delay time according to the maximum value and the minimum value;
comparing the fluctuation range with a set value in the case that the average value is not within the set range;
under the condition that the fluctuation amplitude is larger than a set value, judging that the performance test result of the vibrating mirror to be tested is unqualified; and under the condition that the fluctuation amplitude is less than or equal to the set value, judging that the performance test result of the vibrating mirror to be tested is qualified.
10. A method for testing the performance of a galvanometer is characterized by comprising the following steps:
generating a target driving signal, and driving the galvanometer to be tested to swing in the target direction according to the target driving signal;
transmitting a laser signal to the vibrating mirror to be tested so that the vibrating mirror to be tested reflects the laser signal in the swinging process;
obtaining a target position signal representing the swing position of the vibrating mirror to be tested in the target direction according to the reflected laser signal;
and determining the delay time of the target position signal relative to the target driving signal, and testing the performance of the vibrating mirror to be tested according to the delay time.
CN202211047082.6A 2022-08-30 2022-08-30 System and method for testing performance of galvanometer Pending CN115468746A (en)

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CN202211047082.6A CN115468746A (en) 2022-08-30 2022-08-30 System and method for testing performance of galvanometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202211047082.6A CN115468746A (en) 2022-08-30 2022-08-30 System and method for testing performance of galvanometer

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