CN115451821A - Calibration method and standard sample plate for cable insulation layer structure dimension tester - Google Patents
Calibration method and standard sample plate for cable insulation layer structure dimension tester Download PDFInfo
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- CN115451821A CN115451821A CN202211318247.9A CN202211318247A CN115451821A CN 115451821 A CN115451821 A CN 115451821A CN 202211318247 A CN202211318247 A CN 202211318247A CN 115451821 A CN115451821 A CN 115451821A
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- layer structure
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The invention relates to the technical field of calibration of a cable insulation layer structure dimension tester, and discloses a calibration method of a cable insulation layer structure dimension tester and a standard sample plate, wherein the calibration method of the cable insulation layer structure dimension tester comprises the following steps: calibrating the perpendicularity of an imaging optical axis and a transmission illumination optical axis of the instrument to the glass table top of the workbench; under different lenses, selecting a proper standard sphere according to the determined depth of field data, namely the radius of the sphere is within the depth of field range, directly obtaining diameter data Di of the sphere by a measurement system in a mode of measuring a standard circle, and obtaining the diameter data Di of the sphere according to a formula
Calculating the vertical angle deviation, wherein D is the diameter of a standard sphere; the height of the standard sample plate is adjusted, the diameter parameters of the outer circle are read in sequence, and the maximum difference value of the indicating values for a plurality of times is calculated to be used as the data of the image imaging consistency, so that the calibration of the image imaging consistency of the instrument is realized.
Description
Technical Field
The invention relates to the technical field of calibration of a cable insulation layer structure size tester, in particular to a calibration method and a standard sample plate of the cable insulation layer structure size tester.
Background
At present, in the cable industry, cable enterprises have widely used a cable insulation layer structure size tester to replace a projector to measure cable insulation layer structure size parameters, so that the measurement is more convenient and efficient, and errors caused by artificial reading are eliminated. However, whether the tester is accurate or not needs to be obtained through quantity value tracing of a metering technical mechanism. At present, more pixel calibration methods are adopted, such as longitudinal and transverse pixel calibration by adopting a standard line ruler; the method is provided aiming at the problems that the pixel calibration in the whole field of view is carried out by adopting a standard ring, no better calibration method exists for the imaging consistency of an instrument image, and no better calibration method exists for calibrating the verticality of an imaging optical axis and a transmission illumination optical axis of the instrument to a glass table top of a workbench at present.
Disclosure of Invention
The invention aims to provide a calibration method and a standard sample plate for a dimension tester of a cable insulation layer structure, and provides a method for calibrating the imaging consistency of an instrument and a method for calibrating the perpendicularity of an imaging optical axis and a transmission illumination optical axis of the instrument to a workbench surface.
The invention is realized by the following technical scheme.
The invention discloses a calibration method of a cable insulation layer structure dimension tester, which comprises the following steps:
calibrating the perpendicularity of an imaging optical axis and a transmission illumination optical axis of the instrument to the glass table top of the workbench; under different lenses, selecting proper standard sphere according to the determined depth of field data, namely the radius of the sphere is within the depth of field range, directly obtaining diameter data Di of the sphere by a measuring system in a mode of measuring a standard circle, and obtaining the diameter data Di of the sphere according to a formula
Calculating the vertical angle deviation, wherein D is the diameter of a standard sphere;
calibrating the consistency of the imaging of the instrument image; under lenses of different specifications, selecting a corresponding standard template, measuring and reading excircle diameter parameters according to an annular measurement mode, raising the height of the standard template for a plurality of times, sequentially reading the excircle diameter parameters, and calculating the maximum difference value of the plurality of readings as data of image imaging consistency.
Further, calibrating the size indication error and the parameter error of the instrument; the method comprises the steps of calibrating by using a standard sample plate, designing the standard sample plate into a plurality of non-concentric layers of circular rings, selecting a corresponding circular ring measuring mode by using a tester, directly obtaining an excircle diameter and thickness indication value, obtaining an eccentricity indication value, and comparing the eccentricity indication value with data of standard sample plate value tracing.
Furthermore, the standard sample plate at least simulates a three-layer cable insulation layer structure and sequentially comprises a conductor, an inner layer, a middle layer and an outer layer from inside to outside.
Further, the diameter size deviation of the standard sample plate is controlled within +/-0.002 mm, and the thickness of the standard sample plate is 1mm.
Further, in the step of consistency of image imaging of the calibration instrument, the standard template height is raised at least twice.
Further, the two standard template elevations were 0.5mm and 1mm, respectively.
Further, the standard template is raised in height by adding a standard thickness membrane under the standard template.
Further, the standard sphere has a diameter of 2mm.
Further, the standard sphere is a steel ball with the precision not lower than G5 level.
The calibration method comprises the step of arranging a plurality of non-concentric rings with different diameters on the diaphragm, wherein the circle centers of the non-concentric rings are positioned on the same straight line.
The invention has the beneficial effects that: using a standard sphere, calibrating the verticality of an imaging optical axis and a transmission illumination optical axis of the instrument on a glass table top of a workbench, measuring the diameter of the standard sphere, and calculating the vertical angle deviation through a formula; through adjusting the height of the standard sample plate, reading the diameter parameters of the outer circle in sequence, calculating the maximum difference value of the indicating values for a plurality of times as the data of the image imaging consistency, realizing the calibration of the image imaging consistency of the instrument, realizing the multiple parameter dimension calibration of the tester, and ensuring the accuracy of the tester detection used by a manufacturer.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
The invention is further illustrated by the following examples in conjunction with the drawings.
FIG. 1 is a schematic diagram of a standard template.
Detailed Description
The cable insulation layer structure dimension tester is a wire and cable insulation layer structure measuring system adopting a machine vision detection mode. The tester mainly comprises two parts, namely hardware and software, wherein the hardware part comprises a plurality of CCD camera systems, a light source and a computer; the software part takes Visual Basic or Visual C + + as a tool to design an image measurement operation interface of the structural dimension of the cable insulation layer.
The tester obtains the image of the cable insulation layer slice through the CCD camera system, and after the image is processed by the computer image processing system, various data (thickness, outer diameter, eccentricity and the like) of the cable insulation layer structure size can be obtained on a software operation interface. CCD cameras with different specifications correspond to different view field ranges and can measure cable insulation layer structures with corresponding sizes.
The tester comprises two parts of hardware and software, wherein the hardware part consists of a plurality of lens imaging systems with different specifications, a light source and a computer; the software part takes Visual Basic or Visual C + + as a tool to realize the measurement of the structure dimension of the cable insulation layer. Lens imaging systems with different specifications correspond to different field ranges, and are generally divided into three ranges of less than or equal to 10mm, (10-50) mm and (50-130).
During measurement, a cable section sample is horizontally arranged on the glass table top of a workbench of the tester, and a corresponding lens is selected according to the diameter of the sample and moved to a field measurement area. And selecting a measurement model corresponding to the sample on a software operation interface, clicking a one-key measurement key, and acquiring various structural size data of the sample in one or two seconds.
In the measurement of the size of the cable insulation layer structure, the error sources of the measured data are three aspects: the hardware of the instrument; second, the field light source intensity; and thirdly, an instrument measuring system.
1. Influence of instrument hardware on measurement errors
A lens, one of the key components of a machine vision system, is used in conjunction with an industrial camera, i.e., light is focused through the lens and imaged on an image sensor inside the camera. At present, the lenses adopted by the tester comprise a common lens and a telecentric lens, the common lens is easy to generate distortion and distortion during imaging, and the brought errors need to be corrected in a software algorithm. Compared with the telecentric lens, the telecentric lens has high resolution, low distortion rate and wide depth of field, can effectively reduce errors caused by image deformation and view angle selection, and avoids the influence of the thickness of a measured piece on measurement.
The perpendicularity of the imaging optical axis and the transmission illumination optical axis to the glass table top of the workbench is a key factor causing image measurement errors. The tester adopts a directional transmission illumination mode, the illumination direction is not perpendicular to the slice sample, image deformation can be generated, and transmission errors are caused. The illumination axis is parallel to the imaging axis and perpendicular to the sliced sample, making the sliced sample very sharp in profile and reducing transmission distortion. If a certain vertical angle deviation exists between the machine lens and the transmission illumination light source when the machine lens and the transmission illumination light source are installed and the glass table top of the workbench, a fixed indication error can be brought when the tester is used, and the measurement can be carried out by adopting a standard steel ball method.
2. The effect of the field source intensity. The tester uses a transmission illumination light source, and mostly adopts white light. The light source intensity is undersaturated, the image is fuzzy, and the edge extraction is inaccurate; over-saturation of the light source intensity can cause shifting of the image edges, resulting in edge position errors. The imaging quality of the sample can be ensured by selecting proper light source intensity. Generally, four positions, i.e., an upper position, a lower position, a left position and a right position, within and outside a 2/3 field of view are detected by a light meter to judge the illuminance of the field of view, and the illuminance is generally controlled to be (1000-1500) lx.
3. Influence of instrumental measurement system algorithms
The key content in the measurement system is the calibration of pixels and the detection and positioning of image edges. In order to obtain the actual size of the measured object, the relationship between the actual physical size and the pixel size needs to be established, i.e. each pixel is calibrated. The pixel calibration algorithm needs to consider the influence caused by the change of object distance due to the change of the thickness of the slice sample and the different positions of the view field. Whether the edge detection algorithm is accurate in extracting the image edge or not brings a certain positioning error. The effect of the measurement system algorithm on the measurement error can be obtained by measurement with a calibration plate.
The calibration of the cable insulation layer structure dimension tester mainly has the metering characteristics of perpendicularity of an imaging optical axis and a transmission illumination optical axis to a glass table top of a workbench, dimension indication errors (diameter and thickness) and parameter errors (eccentricity) and image imaging consistency.
Before calibration, the functions of each part of the tester hardware should be checked to be normal, and the operation of the measurement software should be checked to be normal. And selecting a corresponding CCD camera and a corresponding standard template for calibration according to the measurement range of the tester.
The invention discloses a calibration method of a cable insulation layer structure dimension tester, which comprises the following steps:
calibrating the perpendicularity of an imaging optical axis and a transmission illumination optical axis of the instrument to the glass table top of the workbench; under different lenses, selecting proper depth of field dataThe standard sphere (Di) is directly obtained by a measuring system in a mode of measuring a standard circle, and the diameter data is calculated according to a formula
Calculating the vertical angle deviation, wherein D is the diameter of a standard sphere;
calibrating the consistency of the imaging of the instrument image; considering that the tester is a one-key full-automatic measurement mode, the up-down focusing of a lens is not needed, and the imaging consistency of a sample needs to be evaluated, under lenses with different specifications, a corresponding standard sample plate is selected, the diameter parameter of the outer circle is measured and read according to a double-layer circular ring measurement mode, the height of the standard sample plate is raised for a plurality of times, the diameter parameter of the outer circle is read in sequence, the maximum difference value of the plurality of readings is calculated as the imaging consistency data of the image, the height raising times of the standard sample plate are at least twice, specifically, the standard membranes of 0.5mm and 1.0mm are padded below the standard plate for reading in sequence, and the maximum difference value of the three readings is calculated as the imaging consistency data of the image.
Calibrating the dimensional indication error and the parameter error of the instrument; the dimension indicating value error comprises a diameter error and a thickness error, the parameter error comprises an eccentricity error, the standard template is used for calibration, the standard template is designed into a plurality of non-concentric layers of circular rings, as shown in figure 1, the parameters of the standard template comprise the diameter of the circular ring, the thickness of the circular ring and the eccentricity (the eccentricity is equal to the difference between the maximum thickness and the minimum thickness of the circular ring divided by the maximum thickness), the design data are shown in tables 1, 2 and 3, the diameter dimension deviation is controlled within the range of +/-0.002 mm, the thickness is 1.0mm, a corresponding circular ring measuring mode is selected for the tester, if a single-layer circular ring is used, a single-layer circular ring measuring mode is selected, and a double-layer circular ring measuring mode is used.
Referring to fig. 1, the standard sample plate at least simulates a three-layer cable insulation layer structure, which comprises a conductor, an inner layer, a middle layer and an outer layer in sequence from inside to outside, and consists of four circles which are nested in sequence, wherein the numbers of the circles from inside to outside are 1, 2, 3 and 4, and the centers of the four circles are on the same straight line.
Table 1 unit of parametric design data (inner layer) for standard plates of non-concentric rings: mm (mm)
Table 2 units of parametric design data (outer layer) for standard plates of non-concentric rings: mm (mm)
Table 3 unit of parameter design data (middle layer) of the non-concentric ring standard plate: mm (mm)
The indication error of the cable insulation layer structure dimension tester needs to be evaluated through the quantity tracing of a metering technology mechanism, and measurement errors can be generated by the slicing quality and a transmission light source in practical use. The accuracy of product detection data can be ensured only by measuring the size parameter of the cable insulation layer structure, and the quality of the product is ensured.
The utility model provides a standard model, is applied to foretell cable insulation layer structure dimension tester calibration method, includes the diaphragm, be equipped with the different non-concentric ring of a plurality of diameter on the diaphragm, the ring generally forms for printing, the centre of a circle of non-concentric ring is in same straight line, and standard model has simulated three-layer cable insulation layer structure in this embodiment, is conductor, inlayer, intermediate level and skin from inside to outside in proper order.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.
Claims (10)
1. The calibration method of the cable insulation layer structure dimension tester is characterized by comprising the following steps: the method comprises the following steps:
calibrating the perpendicularity of an imaging optical axis and a transmission illumination optical axis of the instrument to the table top of the workbench; under different lenses, a proper standard sphere is selected according to the determined depth of field data, namely the radius of the sphere is within the depth of field range, and the measuring system directly obtains diameter data D of the sphere by adopting a mode of measuring a standard circle i From the formula
Calculating the vertical angle deviation, wherein D is the diameter of a standard sphere;
calibrating the imaging consistency of the instrument image; under lenses of different specifications, selecting a corresponding standard template, measuring and reading excircle diameter parameters according to an annular measurement mode, raising the height of the standard template for a plurality of times, sequentially reading the excircle diameter parameters, and calculating the maximum difference value of the plurality of readings as data of image imaging consistency.
2. The method for calibrating a cable insulation layer structure dimension tester according to claim 1, wherein: also comprises the following steps: calibrating the size indication error and the parameter error of the instrument; the size indicating value error comprises a diameter error and a thickness error, the parameter error comprises an eccentricity error, the standard sample plate is used for calibration, the standard sample plate is designed into a plurality of non-concentric layers of circular rings, the parameters of the standard sample plate comprise a circular diameter, a circular ring thickness and an eccentricity, a tester selects a corresponding circular ring measurement mode, the external circular diameter and the thickness indicating value are directly obtained, the eccentricity indicating value is obtained, and the data obtained by tracing the standard sample plate value are compared.
3. The cable insulation layer structure dimension tester calibration method according to claim 1 or 2, characterized in that: the standard sample plate at least simulates a three-layer cable insulation layer structure and sequentially comprises a conductor, an inner layer, a middle layer and an outer layer from inside to outside.
4. The method for calibrating a cable insulation layer structure dimension tester according to claim 3, wherein: the diameter size deviation of the standard sample plate is controlled within +/-0.002 mm, and the thickness of the standard sample plate is 1mm.
5. The method for calibrating a cable insulation layer structure dimension tester according to any one of claims 1, 2 and 4, wherein the method comprises the following steps: in the step of consistency of image imaging of the calibration instrument, the standard template height is raised at least twice.
6. The method for calibrating a cable insulation layer structure dimension tester according to claim 5, wherein: the two standard template elevations were 0.5mm and 1mm, respectively.
7. The cable insulation layer structure dimension tester calibration method according to claim 6, characterized in that: the standard template is raised in height by adding a standard thickness membrane under the standard template.
8. The method for calibrating a cable insulation layer structure dimension tester according to any one of claims 1, 2 and 4, wherein the method comprises the following steps: the standard sphere is 2mm in diameter.
9. The cable insulation layer structure dimension tester calibration method according to claim 8, characterized in that: the standard sphere is a steel ball with the precision not lower than G5 level.
10. A standard template applied to the method for calibrating a dimension tester of a cable insulation layer structure according to any one of claims 1 to 9, wherein the method comprises the following steps: the diaphragm comprises a diaphragm (1), wherein a plurality of non-concentric rings with different diameters are arranged on the diaphragm (1), and the circle centers of the non-concentric rings are positioned on the same straight line.
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| CN202211318247.9A CN115451821A (en) | 2022-10-26 | 2022-10-26 | Calibration method and standard sample plate for cable insulation layer structure dimension tester |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115731482A (en) * | 2022-12-27 | 2023-03-03 | 江阴市浩盛电器线缆制造有限公司 | Illegal cable laying scene identification system and method |
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- 2022-10-26 CN CN202211318247.9A patent/CN115451821A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115731482A (en) * | 2022-12-27 | 2023-03-03 | 江阴市浩盛电器线缆制造有限公司 | Illegal cable laying scene identification system and method |
| CN115731482B (en) * | 2022-12-27 | 2024-01-16 | 江阴市浩盛电器线缆制造有限公司 | Illegal cable laying scene identification system and method |
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