CN115436721A - A test circuit and charger for aging experiment - Google Patents
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Abstract
Description
技术领域technical field
本公开涉及集成电路技术领域,具体涉及一种用于老化实验的测试电路和充电器。The disclosure relates to the technical field of integrated circuits, in particular to a test circuit and a charger for aging experiments.
背景技术Background technique
随着智能手机,平板电脑,数码相机等手持式数码产品的大量流行,这些耗电量大的智能设备催生了快充充电器、移动电源(即充电宝)、快充式移动电源等产品开始进入市场。快充技术和移动电源对智能设备的高耗电量、低续航力的缺点提供了较好的解决方案,它可以给手机、平板电脑、数码相机电池等快速充电,并且携带方便,随走随充,预计在短期内就会占领大部分市场。伴随着这些快充产品的应用,随之而来就带来了对快充充电器、移动电源、快充式移动电源等同类产品在生产中的老化测试问题,品质保障、低成本、高效率、可批量老化测试的设备被广泛需求。With the popularity of handheld digital products such as smartphones, tablet computers, and digital cameras, these power-hungry smart devices have spawned products such as fast-charge chargers, mobile power supplies (that is, charging treasures), and fast-charge mobile power supplies. enter the market. Fast charging technology and mobile power supply provide a better solution to the shortcomings of high power consumption and low battery life of smart devices. It can quickly charge mobile phones, tablet computers, digital camera batteries, etc., and is easy to carry and charge on the go. , is expected to capture most of the market in the short term. Along with the application of these fast-charging products, it has brought aging test problems in the production of similar products such as fast-charging chargers, mobile power supplies, and fast-charging mobile power supplies. Quality assurance, low cost, and high efficiency , Equipment capable of batch aging testing is widely demanded.
目前市场上对这三类产品的老化测试却面临许多困局。At present, the aging test of these three types of products in the market is facing many difficulties.
比如生产厂家利用直流恒压电源给产品充电,一台电源对应充电一台产品,这样的设备的缺点是:成本高、充电时间需要人为手动控制、充电数据无法方便实时记录、智能化程度低。For example, manufacturers use DC constant voltage power supplies to charge products, and one power supply corresponds to one product. The disadvantages of such equipment are: high cost, manual control of charging time, inability to record charging data in real time, and low intelligence.
又比如利用功率电阻对产品进行放电老化测试,导致无法监控放电电流实际大小和放电功率大小,无法确定放电速度和效率,放电时间需要人工计时和手动停止。Another example is the use of power resistors to perform discharge aging tests on products, resulting in the inability to monitor the actual size of the discharge current and discharge power, and the discharge speed and efficiency cannot be determined. The discharge time needs to be manually timed and stopped manually.
又如利用电子负载仪对产品进行放电,这样单台负载仪对应单个产品进行放电老化,虽然可以确定放电老化电压电流的大小,但却面临老化众多产品时需要多台电子负载仪的高成本以及放电时间,放电容量需要人工控制和计算的低效率。Another example is to use an electronic load meter to discharge the product, so that a single load meter corresponds to a single product for discharge aging. Although the discharge aging voltage and current can be determined, it is faced with the high cost of multiple electronic load meters when aging many products. Discharge time, discharge capacity need manual control and low efficiency of calculation.
上述三种情况也都无法实现充电与放电,放电与充电之间的自动转换。Above-mentioned three kinds of situations also all can't realize charging and discharging, automatic conversion between discharging and charging.
此外如果快充充电器和快充式移动电源只能使用专用仪器实现快充的升压降压的快充功能测试和老化测试,并且面对目前市场上的多种快充技术协议,需要使用多种测试仪器进行老化测试,成本高,兼容性低。In addition, if the fast charging charger and the fast charging mobile power supply can only use special instruments to realize the fast charging function test and aging test of the fast charging step-up and step-down, and in the face of various fast charging technology protocols currently on the market, it is necessary to use A variety of testing instruments are used for aging testing, which is costly and has low compatibility.
而充电器类的芯片(IC)一般需要验证两种功能,电池充电模式和放电模式,两种模式单独验证,两次老化实验总时间较长且需要电源的数量也较多,在电源足够的时候,两种模式的老化测试可同时进行,但电源不足的时候就需要分批实验,效率低且极不方便。The chip (IC) of the charger generally needs to verify two functions, the battery charging mode and the discharging mode, and the two modes are verified separately. Sometimes, the aging test of the two modes can be carried out at the same time, but when the power supply is insufficient, batch experiments are required, which is inefficient and extremely inconvenient.
发明内容Contents of the invention
为了解决上述技术问题,本公开提供了一种用于老化实验的测试电路和充电器,可以有效缩短实验时间和电源数量,改善实验的可操作性。In order to solve the above technical problems, the present disclosure provides a test circuit and a charger for aging experiments, which can effectively shorten the experiment time and the number of power sources, and improve the operability of the experiment.
一方面本公开提供了一种用于老化实验的测试电路,该测试电路通过主开关管连接到供电端,其中,该测试电路包括:On the one hand, the present disclosure provides a test circuit for aging experiments, the test circuit is connected to the power supply terminal through the main switch tube, wherein the test circuit includes:
功率器件,连接于前述的主开关管与负载端之间,且与前述的主开关管同步导通或关断;The power device is connected between the aforementioned main switch tube and the load terminal, and is turned on or off synchronously with the aforementioned main switch tube;
测试模块,该测试模块通过电感连接在前述功率器件与负载端的连接节点上,用于模拟充放电过程的老化周期,为负载端提供电能;A test module, the test module is connected to the connection node between the power device and the load terminal through an inductance, and is used to simulate the aging cycle of the charging and discharging process and provide electric energy for the load terminal;
电容,该电容的正极端连接前述的测试模块,负极端接地,该电容用于配合前述测试电路的充放电过程进行充能或能量释放。A capacitor. The positive end of the capacitor is connected to the aforementioned test module, and the negative end is grounded. The capacitor is used for charging or releasing energy in cooperation with the charging and discharging process of the aforementioned testing circuit.
优选地,前述的功率器件为场效应晶体管或双极型晶体管中的其中一种。Preferably, the aforementioned power device is one of a field effect transistor or a bipolar transistor.
优选地,前述的测试模块包括串联连接在前述电容的正极端与地之间的第一开关管、第二开关管和第三开关管,Preferably, the aforementioned test module includes a first switch tube, a second switch tube, and a third switch tube connected in series between the positive terminal of the aforementioned capacitor and the ground,
该第一开关管的第一端接地,第二端连接前述的电感,The first end of the first switch tube is grounded, and the second end is connected to the aforementioned inductor,
该第二开关管的第一端连接前述第一开关管与前述电感的连接节点,The first end of the second switch tube is connected to the connection node between the aforementioned first switch tube and the aforementioned inductor,
该第三开关管的第一端与前述第二开关管的第二端连接,第二端连接前述电容的正极端。The first end of the third switch tube is connected to the second end of the second switch tube, and the second end is connected to the positive terminal of the capacitor.
优选地,前述第一开关管的控制端接入第一控制信号,前述第二开关管的控制端接入第二控制信号,Preferably, the control terminal of the first switch tube is connected to the first control signal, and the control terminal of the second switch tube is connected to the second control signal,
该第一开关管和第二开关管交替导通,以配合前述测试电路的充放电过程。The first switch tube and the second switch tube are turned on alternately to cooperate with the charging and discharging process of the aforementioned test circuit.
优选地,前述的第一开关管与前述的第二开关管的沟道类型相同,则前述的第一控制信号与前述的第二控制信号互为反相信号;Preferably, the aforementioned first switch tube and the aforementioned second switch tube have the same channel type, then the aforementioned first control signal and the aforementioned second control signal are mutually inverse signals;
或者,前述的第一开关管与前述的第二开关管的沟道类型相反,则前述的第一控制信号与前述的第二控制信号为相同信号。Alternatively, the channel type of the aforementioned first switch transistor is opposite to that of the aforementioned second switch transistor, so the aforementioned first control signal and the aforementioned second control signal are the same signal.
优选地,前述主开关管与前述功率器件均处于闭合导通状态,前述的测试电路工作在升压模式,供电端为负载端供电的同时为前述的电容充电;Preferably, the aforementioned main switch tube and the aforementioned power device are both in a closed conduction state, the aforementioned test circuit works in a boost mode, and the power supply end supplies power to the load end while charging the aforementioned capacitor;
前述主开关管与前述功率器件均处于关断状态,前述的测试电路工作在降压模式,前述电容通过放电过程的能量释放,通过电感为负载端供电。Both the aforementioned main switching tube and the aforementioned power device are in an off state, the aforementioned testing circuit works in a step-down mode, and the aforementioned capacitor releases energy during the discharge process to supply power to the load terminal through the inductor.
优选地,前述的测试电路还包括:Preferably, the aforementioned test circuit also includes:
检测控制模块,用于检测前述电容的存储电量,并根据检测信息调节前述主开关管控制端接入的控制信号的占空比。The detection control module is used to detect the stored power of the capacitor, and adjust the duty ratio of the control signal connected to the control terminal of the main switch according to the detection information.
优选地,前述的功率器件、电感和前述的测试模块集成于同一芯片上。Preferably, the aforementioned power device, inductor and aforementioned testing module are integrated on the same chip.
另一方面本公开提供了一种充电器,其中,包括如前所述的测试电路。On the other hand, the present disclosure provides a charger, which includes the aforementioned test circuit.
本公开的有益效果是:本公开提供了一种用于老化实验的测试电路和充电器,其中,该测试电路包括:功率器件,该功率器件一端通过连接的主开关管与供电端连接,另一端与负载端连接,且该功率器件与前述的主开关管同步导通或关断;测试模块,该测试模块通过电感连接在功率器件与负载端的连接节点上,用于模拟充放电过程的老化周期,为负载端提供电能;电容,该电容的正极端连接前述的测试模块,负极端接地,该电容用于配合测试电路的充放电过程进行充能或能量释放。由此该测试电路通过主开关管的导通和关断即可轻易实现两种(升压和降压)模式的切换,利用该电路结构模拟完成充放电过程,相比于现有技术,能有效缩短老化实验的时间和所需的电源数量,改善实验的可操作性,进而节省成本和提高效率。The beneficial effects of the present disclosure are: the present disclosure provides a test circuit and charger for aging experiments, wherein the test circuit includes: a power device, one end of the power device is connected to the power supply terminal through a connected main switch tube, and the other One end is connected to the load end, and the power device is turned on or off synchronously with the aforementioned main switching tube; the test module is connected to the connection node between the power device and the load end through an inductance, and is used to simulate the aging of the charging and discharging process Period, to provide electric energy for the load terminal; capacitor, the positive terminal of the capacitor is connected to the aforementioned test module, and the negative terminal is grounded, and the capacitor is used to charge or release energy in conjunction with the charging and discharging process of the test circuit. Therefore, the test circuit can easily realize the switching of the two (boost and buck) modes by turning on and off the main switch tube, and the circuit structure is used to simulate the completion of the charge and discharge process. Compared with the prior art, it can Effectively shorten the time of aging experiments and the number of required power supplies, improve the operability of experiments, and thus save costs and improve efficiency.
附图说明Description of drawings
通过以下参照附图对本公开实施例的描述,本公开的上述以及其他目的、特征和优点将更为清楚。The above and other objects, features and advantages of the present disclosure will be more apparent through the following description of the embodiments of the present disclosure with reference to the accompanying drawings.
图1示出本公开实施例提供的测试电路的结构示意图;FIG. 1 shows a schematic structural diagram of a test circuit provided by an embodiment of the present disclosure;
图2示出图1所示测试电路各个控制信号的工作时序图;Fig. 2 shows the working sequence diagram of each control signal of the test circuit shown in Fig. 1;
图3示出图1所示测试电路工作在升压模式下充电过程的等效电路图;Fig. 3 shows the equivalent circuit diagram of the charging process of the test circuit shown in Fig. 1 working in boost mode;
图4示出图1所示测试电路工作在降压模式下放电过程的等效电路图;Fig. 4 shows the equivalent circuit diagram of the discharge process of the test circuit shown in Fig. 1 working in the step-down mode;
图5示出本公开实施例提供的充电器集成有图1所示测试电路中部分结构的芯片示意图。FIG. 5 shows a schematic diagram of a chip integrated with a part of the structure of the test circuit shown in FIG. 1 provided by an embodiment of the present disclosure.
具体实施方式detailed description
为了便于理解本公开,下面将参照相关附图对本公开进行更全面的描述。附图中给出了本公开的较佳实施例。但是,本公开可以通过不同的形式来实现,并不限于本文所描述的实施例。相反的,提供这些实施例的目的是使对本公开内容的理解更加透彻全面。In order to facilitate understanding of the present disclosure, the present disclosure will be described more fully below with reference to the related drawings. Preferred embodiments of the present disclosure are shown in the accompanying drawings. However, the present disclosure can be implemented in different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the understanding of the present disclosure will be thorough.
除非另有定义,本文所使用的所有的技术和科学术语与属于本公开的技术领域的技术人员通常理解的含义相同。在本公开的说明书中所使用的术语只是为了描述具体的实施例的目的,不是旨在于限制本公开。Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. Terms used in the description of the present disclosure are for the purpose of describing specific embodiments only, and are not intended to limit the present disclosure.
下面,参照附图对本公开进行详细说明。Hereinafter, the present disclosure will be described in detail with reference to the accompanying drawings.
图1示出本公开实施例提供的测试电路的结构示意图。FIG. 1 shows a schematic structural diagram of a test circuit provided by an embodiment of the present disclosure.
参考图1,一方面本公开实施例提供了一种用于老化实验的测试电路100,以充电器为例,该测试电路100内置于充电器芯片中,在出厂检验中例如可通过配合老化实验平台的其他结构或电路以模拟充电器正常使用的充放电过程,获取在老化实验过程该测试电路中各个信号的检测数据,利用该检测数据可完善充电器的性能评估,提高出厂产品的质量和良率,提高其安全性。Referring to FIG. 1 , on the one hand, the embodiment of the present disclosure provides a
该测试电路100输入端通过主开关管Q1连接到供电端,接入电源电压VB,该主开关管Q1的控制端接入使能信号EN,该使能信号EN用以控制该主开关管Q1的导通和关断。具体的,该测试电路100至少包括:功率器件Qa、电感L、测试模块101和电容CSTR,The input terminal of the
其中,该功率器件Qa连接于前述的主开关管Q1与负载端Rload之间,且与前述的主开关管Q1同步导通或关断,在本实施例中,该功率器件Qa的控制端接入控制信号Sa,该控制信号Sa与使能信号EN例如可以为相同的脉冲信号,如图2所示,在其他可替代的实施例中,该控制信号Sa与使能信号EN的高电平,亦可以适配对应的该功率器件Qa和主开关管Q1各自的导通电压,只要满足二者的同频同相同周期即可;Wherein, the power device Qa is connected between the aforementioned main switching tube Q1 and the load terminal Rload, and is turned on or off synchronously with the aforementioned main switching tube Q1. In this embodiment, the control terminal of the power device Qa is connected to Input the control signal Sa, the control signal Sa and the enable signal EN can be the same pulse signal, for example, as shown in Figure 2, in other alternative embodiments, the high level of the control signal Sa and the enable signal EN , can also be adapted to the respective conduction voltages of the corresponding power device Qa and the main switch tube Q1, as long as the same frequency and the same cycle of the two are satisfied;
该测试模块101通过电感L连接在前述功率器件Qa与负载端Rload的连接节点上,用于模拟充放电过程的老化周期,为负载端Rload提供电能;The
该电容CSTR的正极端连接前述的测试模块101,负极端接地,该电容CSTR用于配合前述测试电路100的充放电过程进行充能或能量释放。The positive end of the capacitor CSTR is connected to the
在一公开的实施例中,前述的功率器件Qa为场效应晶体管(Field EffectTransistor,FET)或双极结型晶体管(Bipolar Junction Transistor,BJT)中的其中一种。In a disclosed embodiment, the aforementioned power device Qa is one of a field effect transistor (Field Effect Transistor, FET) or a bipolar junction transistor (Bipolar Junction Transistor, BJT).
在一公开的实施例中,前述的测试模块101包括串联连接在前述电容CSTR的正极端与地之间的第一开关管Qb、第二开关管Qc和第三开关管Qd,该第一开关管Qb的第一端接地,第二端连接前述的电感L;该第二开关管Qc的第一端连接前述第一开关管Qb与前述电感L的连接节点;该第三开关管Qd的第一端与前述第二开关管Qc的第二端连接,第二端连接前述电容CSTR的正极端。In a disclosed embodiment, the
在本公开进一步的实施方式中,前述的功率器件Qa、第一开关管Qb、第二开关管Qc和第三开关管Qd均为金属氧化物半导体场效应晶体管(MOSFET),这样生产中可通过MOS工艺控制芯片的面积,提高集成度,有利于产品的小型化。In a further embodiment of the present disclosure, the aforementioned power device Qa, the first switch tube Qb, the second switch tube Qc, and the third switch tube Qd are metal-oxide-semiconductor field-effect transistors (MOSFETs). The MOS process controls the area of the chip, improves the integration level, and is conducive to the miniaturization of products.
在一公开的实施例中,前述第一开关管Qb的控制端接入第一控制信号Sb,前述第二开关管Qc的控制端接入第二控制信号Sc,在实验中,该第一开关管Qb和第二开关管Qc交替导通,以配合前述测试电路100的充放电过程。In a disclosed embodiment, the control terminal of the first switching tube Qb is connected to the first control signal Sb, and the control terminal of the second switching tube Qc is connected to the second control signal Sc. In the experiment, the first switch The transistor Qb and the second switching transistor Qc are turned on alternately to cooperate with the charging and discharging process of the
在一公开的实施例中,前述的第一开关管Qb与前述的第二开关管Qc的沟道类型相同,例如均为N沟道的MOS管,则前述的第一控制信号Sb与前述的第二控制信号Sc互为反相信号,如图2所示。In a disclosed embodiment, the channel type of the aforementioned first switching tube Qb and the aforementioned second switching tube Qc are the same, for example, both are N-channel MOS tubes, then the aforementioned first control signal Sb and the aforementioned The second control signals Sc are mutually inverse signals, as shown in FIG. 2 .
在另一公开的实施例中,前述的第一开关管Qb与前述的第二开关管Qc的沟道类型也可以相反,例如第一开关管Qb为N沟道的MOS管,第二开关管Qc为P沟道的MOS管,则前述的第一控制信号Sb与前述的第二控制信号Sc为相同信号,前者在第一控制信号Sb为高电平时处于导通状态,后者在第二控制信号Sc为高电平时处于关断状态,以此实现该第一开关管Qb和第二开关管Qc的交替导通。In another disclosed embodiment, the channel types of the aforementioned first switching tube Qb and the aforementioned second switching tube Qc may also be reversed, for example, the first switching tube Qb is an N-channel MOS tube, and the second switching tube Qb is an N-channel MOS tube. Qc is a P-channel MOS transistor, the aforementioned first control signal Sb and the aforementioned second control signal Sc are the same signal, the former is in the conduction state when the first control signal Sb is at a high level, and the latter is in the second When the control signal Sc is at a high level, it is in an off state, so as to realize the alternate conduction of the first switching tube Qb and the second switching tube Qc.
为方便描述,在以下公开实施例中,前述的主开关管Q1、功率器件Qa、第一开关管Qb、第二开关管Qc和第三开关管Qd均为N沟道型的MOS管,其各自对应的控制时序如图2所示。For the convenience of description, in the following disclosed embodiments, the aforementioned main switching transistor Q1, power device Qa, first switching transistor Qb, second switching transistor Qc, and third switching transistor Qd are all N-channel type MOS transistors. The respective control timings are shown in Fig. 2 .
具体的在一公开实施例中,供电端连接有正常的直流电源,稳定提供电路所需的电源电压VB,例如为12V,当使能信号EN为逻辑高电平时,主开关管Q1处于闭合导通状态,该测试电路100接入输入电压Vin,开始为测试模块101供电,而功率器件Qa控制端接入的控制信号Sa与使能信号EN相同,故此时的主开关管Q1与功率器件Qa均处于闭合导通状态,该测试电路100工作在升压模式,第三开关管Qd的控制端接入第三控制信号Sd,该第三控制信号Sd持续为逻辑高电平的状态,该第三开关管Qd维持在导通状态,第一开关管Qb和第二开关管Qc交替导通,此时供电端通过主开关管Q1为电路负载端Rload供电的同时,也为前述的电容CSTR充电,此时的电路状态等效为图3,以此模拟充电器正常的充电过程。如图2所示,负载端Rload输出有稳定的电压Vout,同时电容CSTR正极端的电压VSTR在充电电压饱和后维持在以稳定的电平状态,直到使能信号EN的下降沿到来;Specifically, in a disclosed embodiment, the power supply terminal is connected to a normal DC power supply, which stably provides the power supply voltage VB required by the circuit, for example, 12V. When the enable signal EN is at a logic high level, the main switch transistor Q1 is in the closed state. In the on state, the
随着电容CSTR的充电完成,使能信号EN和控制信号Sa转为逻辑低电平,主开关管Q1与功率器件Qa均关断,供电端停止为电路负载端Rload供电,该测试电路100工作在降压模式,前述的电容CSTR通过放电过程的能量释放,利用测试模块101连接的电感L放电,为负载端Rload提供电能,此时的电路状态等效为图4,以此模拟充电器正常工作下的放电过程。如图2所示,负载端Rload维持输出稳定的电压Vout,同时电容CSTR正极端的电压VSTR开始下降,直到下一周期的使能信号EN的上升沿到来。As the charging of the capacitor CSTR is completed, the enable signal EN and the control signal Sa turn to a logic low level, the main switch tube Q1 and the power device Qa are both turned off, the power supply terminal stops supplying power to the circuit load terminal Rload, and the
以此通过连续周期下测试电路100交替工作在升压和降压模式下,以模拟充电器正常工作环境下的充放电过程,实现了老化实验,相比于现有技术,能有效缩短老化实验的时间和所需的电源数量,改善实验的可操作性,进而节省成本,再者利用工作中各个信号的检测结果,完成充电器的性能测试,可极大的提高实验效率。In this way, the
在一公开的实施例中,前述的测试电路100还包括:In a disclosed embodiment, the
检测控制模块(未示出),用于对实验过程中的各种信息进行控制和处理,如该检测控制模块可用于检测前述电容CSTR的存储电量,当电容CSTR中存储的能量不足以为电路负载端Rload供电时,将使能信号EN的逻辑置为高,切换到供电端为负载端Rload供电,以此根据电容CSTR的检测信息调节前述主开关管Q1控制端接入的使能信号EN的占空比,有效控制输出功率。Detection and control module (not shown), for controlling and processing various information in the experimental process, such as the detection and control module can be used to detect the storage power of the aforementioned capacitor CSTR, when the energy stored in the capacitor CSTR is not enough for the circuit load When the terminal Rload supplies power, set the logic of the enable signal EN to high, switch to the power supply terminal to supply power to the load terminal Rload, so as to adjust the enable signal EN connected to the control terminal of the main switch tube Q1 according to the detection information of the capacitor CSTR. The duty cycle effectively controls the output power.
在一公开的实施例中,前述的测试电路100还可以连接有:上位机监控模块(未示出),该上位机监控模块可以与测试电路以及前述的检测控制模块建立通信连接,将发送过来的各种信息并进行显示与控制,实现数据监控。In a disclosed embodiment, the
在一公开的实施例中,前述的功率器件Qa、电感L和前述的测试模块101集成于同一芯片上,如图5所示。这样一方面可提高芯片集成度,降低电路面积,同时利用片上技术,将电容及负载端隔离在芯片外部,避免了散热问题和信号间的干扰,提高了电路稳定性。In a disclosed embodiment, the aforementioned power device Qa, the inductor L and the
另一方面本公开提供了一种充电器,其中,该充电器可以包括如前所述的测试电路100。On the other hand, the present disclosure provides a charger, wherein the charger may include the
综上所述,本公开提供的用于老化实验的测试电路100和充电器,该测试电路100包括:功率器件Qa,该功率器件Qa一端通过连接的主开关管Q1与供电端连接,另一端与负载端Rload连接,且该功率器件Qa与前述的主开关管Q1同步导通或关断;测试模块101,该测试模块101通过电感L连接在功率器件Qa与负载端Rload的连接节点上,用于模拟充放电过程的老化周期,为负载端Rload提供电能;电容CSTR,该电容CSTR的正极端连接前述的测试模块101,负极端接地,该电容CSTR用于配合测试电路100的充放电过程进行充能或能量释放。由此该测试电路100通过主开关管Q1的导通和关断即可轻易实现两种(升压和降压)模式的切换,利用该电路结构模拟完成充放电过程,相比于现有技术,能有效缩短老化实验的时间和所需的电源数量,改善实验的可操作性,进而节省成本和提高效率。To sum up, the
应当说明的是,在本公开的描述中,需要理解的是,术语“上”、“下”、“内”等指示方位或位置关系,仅是为了便于描述本公开和简化描述,而不是指示或暗示所指的组件或元件必须具有特定的方位,以特定的方位构造和操作,因此不能理解为对本公开的限制。It should be noted that in the description of the present disclosure, it should be understood that the terms "upper", "lower", "inner" and the like indicate orientation or positional relationship, and are only for the convenience of describing the present disclosure and simplifying the description, rather than indicating Or imply that a referenced component or element must have a particular orientation, be constructed and operate in a particular orientation and therefore should not be construed as limiting the present disclosure.
此外,在本文中,所含术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、物品或者设备不仅包括那些要素,而且还包括没有明确列出的其他要素,或者是还包括为这种过程、方法、物品或者设备所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。Furthermore, herein, the inclusive term "comprises," "comprising," or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus that includes a set of elements includes not only those elements, but also Other elements not expressly listed, or inherent to the process, method, article, or apparatus are also included. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.
另外,在本文中,涉及“第一”、“第二”等的描述仅用于描述目的,而不能理解为指示或暗示其相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括至少一个该特征。另外,各个实施例之间的技术方案可以相互结合,但是必须是以本领域普通技术人员能够实现为基础,当技术方案的结合出现相互矛盾或无法实现时应当认为这种技术方案的结合不存在,也不在本发明要求的保护范围之内。In addition, in this document, descriptions related to "first", "second" and so on are only used for descriptive purposes, and cannot be understood as indicating or implying their relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features. In addition, the technical solutions of the various embodiments can be combined with each other, but it must be based on the realization of those skilled in the art. When the combination of technical solutions is contradictory or cannot be realized, it should be considered that the combination of technical solutions does not exist , nor within the scope of protection required by the present invention.
最后应说明的是:显然,上述实施例仅仅是为清楚地说明本公开所作的举例,而并非对实施方式的限定。对于所属领域的普通技术人员来说,在上述说明的基础上还可以做出其它不同形式的变化或变动。这里无需也无法对所有的实施方式予以穷举。而由此所引申出的显而易见的变化或变动仍处于本公开的保护范围之中。Finally, it should be noted that obviously, the above-mentioned embodiments are only examples for clearly illustrating the present disclosure, rather than limiting the implementation manner. For those of ordinary skill in the art, other changes or changes in different forms can be made on the basis of the above description. It is not necessary and impossible to exhaustively list all the implementation manners here. However, the obvious changes or modifications derived therefrom are still within the protection scope of the present disclosure.
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