CN115436721A - A test circuit and charger for aging experiment - Google Patents

Abstract

The utility model provides a test circuit and charger for ageing experiments, this test circuit includes: one end of the power device is connected with the power supply end through the connected main switching tube, the other end of the power device is connected with the load end, and the power device and the main switching tube are synchronously switched on or off; the test module is connected to a connection node of the power device and the load end through an inductor and used for simulating an aging period in a charge-discharge process and providing electric energy for the load end; and the positive end of the capacitor is connected with the test module, the negative end of the capacitor is grounded, and the capacitor is used for charging or releasing energy in cooperation with the charging and discharging process of the test circuit. Therefore, the switching of the voltage boosting mode and the voltage reducing mode can be easily realized through the conduction and the disconnection of the main switch tube by the test circuit, the charge and discharge process is simulated, the time of an aging experiment and the required power quantity can be effectively shortened, the operability of the experiment is improved, and the cost is saved and the efficiency is improved.

Description

A test circuit and charger for aging experiment

technical field

The disclosure relates to the technical field of integrated circuits, in particular to a test circuit and a charger for aging experiments.

Background technique

With the popularity of handheld digital products such as smartphones, tablet computers, and digital cameras, these power-hungry smart devices have spawned products such as fast-charge chargers, mobile power supplies (that is, charging treasures), and fast-charge mobile power supplies. enter the market. Fast charging technology and mobile power supply provide a better solution to the shortcomings of high power consumption and low battery life of smart devices. It can quickly charge mobile phones, tablet computers, digital camera batteries, etc., and is easy to carry and charge on the go. , is expected to capture most of the market in the short term. Along with the application of these fast-charging products, it has brought aging test problems in the production of similar products such as fast-charging chargers, mobile power supplies, and fast-charging mobile power supplies. Quality assurance, low cost, and high efficiency , Equipment capable of batch aging testing is widely demanded.

At present, the aging test of these three types of products in the market is facing many difficulties.

For example, manufacturers use DC constant voltage power supplies to charge products, and one power supply corresponds to one product. The disadvantages of such equipment are: high cost, manual control of charging time, inability to record charging data in real time, and low intelligence.

Another example is the use of power resistors to perform discharge aging tests on products, resulting in the inability to monitor the actual size of the discharge current and discharge power, and the discharge speed and efficiency cannot be determined. The discharge time needs to be manually timed and stopped manually.

Another example is to use an electronic load meter to discharge the product, so that a single load meter corresponds to a single product for discharge aging. Although the discharge aging voltage and current can be determined, it is faced with the high cost of multiple electronic load meters when aging many products. Discharge time, discharge capacity need manual control and low efficiency of calculation.

Above-mentioned three kinds of situations also all can't realize charging and discharging, automatic conversion between discharging and charging.

In addition, if the fast charging charger and the fast charging mobile power supply can only use special instruments to realize the fast charging function test and aging test of the fast charging step-up and step-down, and in the face of various fast charging technology protocols currently on the market, it is necessary to use A variety of testing instruments are used for aging testing, which is costly and has low compatibility.

The chip (IC) of the charger generally needs to verify two functions, the battery charging mode and the discharging mode, and the two modes are verified separately. Sometimes, the aging test of the two modes can be carried out at the same time, but when the power supply is insufficient, batch experiments are required, which is inefficient and extremely inconvenient.

Contents of the invention

In order to solve the above technical problems, the present disclosure provides a test circuit and a charger for aging experiments, which can effectively shorten the experiment time and the number of power sources, and improve the operability of the experiment.

On the one hand, the present disclosure provides a test circuit for aging experiments, the test circuit is connected to the power supply terminal through the main switch tube, wherein the test circuit includes:

The power device is connected between the aforementioned main switch tube and the load terminal, and is turned on or off synchronously with the aforementioned main switch tube;

A test module, the test module is connected to the connection node between the power device and the load terminal through an inductance, and is used to simulate the aging cycle of the charging and discharging process and provide electric energy for the load terminal;

A capacitor. The positive end of the capacitor is connected to the aforementioned test module, and the negative end is grounded. The capacitor is used for charging or releasing energy in cooperation with the charging and discharging process of the aforementioned testing circuit.

Preferably, the aforementioned power device is one of a field effect transistor or a bipolar transistor.

Preferably, the aforementioned test module includes a first switch tube, a second switch tube, and a third switch tube connected in series between the positive terminal of the aforementioned capacitor and the ground,

The first end of the first switch tube is grounded, and the second end is connected to the aforementioned inductor,

The first end of the second switch tube is connected to the connection node between the aforementioned first switch tube and the aforementioned inductor,

The first end of the third switch tube is connected to the second end of the second switch tube, and the second end is connected to the positive terminal of the capacitor.

Preferably, the control terminal of the first switch tube is connected to the first control signal, and the control terminal of the second switch tube is connected to the second control signal,

The first switch tube and the second switch tube are turned on alternately to cooperate with the charging and discharging process of the aforementioned test circuit.

Preferably, the aforementioned first switch tube and the aforementioned second switch tube have the same channel type, then the aforementioned first control signal and the aforementioned second control signal are mutually inverse signals;

Alternatively, the channel type of the aforementioned first switch transistor is opposite to that of the aforementioned second switch transistor, so the aforementioned first control signal and the aforementioned second control signal are the same signal.

Preferably, the aforementioned main switch tube and the aforementioned power device are both in a closed conduction state, the aforementioned test circuit works in a boost mode, and the power supply end supplies power to the load end while charging the aforementioned capacitor;

Both the aforementioned main switching tube and the aforementioned power device are in an off state, the aforementioned testing circuit works in a step-down mode, and the aforementioned capacitor releases energy during the discharge process to supply power to the load terminal through the inductor.

Preferably, the aforementioned test circuit also includes:

The detection control module is used to detect the stored power of the capacitor, and adjust the duty ratio of the control signal connected to the control terminal of the main switch according to the detection information.

Preferably, the aforementioned power device, inductor and aforementioned testing module are integrated on the same chip.

On the other hand, the present disclosure provides a charger, which includes the aforementioned test circuit.

The beneficial effects of the present disclosure are: the present disclosure provides a test circuit and charger for aging experiments, wherein the test circuit includes: a power device, one end of the power device is connected to the power supply terminal through a connected main switch tube, and the other One end is connected to the load end, and the power device is turned on or off synchronously with the aforementioned main switching tube; the test module is connected to the connection node between the power device and the load end through an inductance, and is used to simulate the aging of the charging and discharging process Period, to provide electric energy for the load terminal; capacitor, the positive terminal of the capacitor is connected to the aforementioned test module, and the negative terminal is grounded, and the capacitor is used to charge or release energy in conjunction with the charging and discharging process of the test circuit. Therefore, the test circuit can easily realize the switching of the two (boost and buck) modes by turning on and off the main switch tube, and the circuit structure is used to simulate the completion of the charge and discharge process. Compared with the prior art, it can Effectively shorten the time of aging experiments and the number of required power supplies, improve the operability of experiments, and thus save costs and improve efficiency.

Description of drawings

The above and other objects, features and advantages of the present disclosure will be more apparent through the following description of the embodiments of the present disclosure with reference to the accompanying drawings.

FIG. 1 shows a schematic structural diagram of a test circuit provided by an embodiment of the present disclosure;

Fig. 2 shows the working sequence diagram of each control signal of the test circuit shown in Fig. 1;

Fig. 3 shows the equivalent circuit diagram of the charging process of the test circuit shown in Fig. 1 working in boost mode;

Fig. 4 shows the equivalent circuit diagram of the discharge process of the test circuit shown in Fig. 1 working in the step-down mode;

FIG. 5 shows a schematic diagram of a chip integrated with a part of the structure of the test circuit shown in FIG. 1 provided by an embodiment of the present disclosure.

detailed description

In order to facilitate understanding of the present disclosure, the present disclosure will be described more fully below with reference to the related drawings. Preferred embodiments of the present disclosure are shown in the accompanying drawings. However, the present disclosure can be implemented in different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the understanding of the present disclosure will be thorough.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure belongs. Terms used in the description of the present disclosure are for the purpose of describing specific embodiments only, and are not intended to limit the present disclosure.

Hereinafter, the present disclosure will be described in detail with reference to the accompanying drawings.

FIG. 1 shows a schematic structural diagram of a test circuit provided by an embodiment of the present disclosure.

Referring to FIG. 1 , on the one hand, the embodiment of the present disclosure provides a test circuit 100 for aging experiments. Taking a charger as an example, the test circuit 100 is built into the charger chip. Other structures or circuits of the platform simulate the charging and discharging process of the normal use of the charger, and obtain the detection data of each signal in the test circuit during the aging experiment. The detection data can be used to improve the performance evaluation of the charger and improve the quality and goodness of the factory products. rate and improve its security.

The input terminal of the test circuit 100 is connected to the power supply terminal through the main switch tube Q1, and connected to the power supply voltage VB, and the control terminal of the main switch tube Q1 is connected to the enable signal EN, and the enable signal EN is used to control the main switch tube Q1. on and off. Specifically, the test circuit 100 includes at least: a power device Qa, an inductor L, a test module 101 and a capacitor CSTR,

Wherein, the power device Qa is connected between the aforementioned main switching tube Q1 and the load terminal Rload, and is turned on or off synchronously with the aforementioned main switching tube Q1. In this embodiment, the control terminal of the power device Qa is connected to Input the control signal Sa, the control signal Sa and the enable signal EN can be the same pulse signal, for example, as shown in Figure 2, in other alternative embodiments, the high level of the control signal Sa and the enable signal EN , can also be adapted to the respective conduction voltages of the corresponding power device Qa and the main switch tube Q1, as long as the same frequency and the same cycle of the two are satisfied;

The test module 101 is connected to the connection node between the aforementioned power device Qa and the load terminal Rload through the inductance L, and is used to simulate the aging cycle of the charging and discharging process, and provide electric energy for the load terminal Rload;

The positive end of the capacitor CSTR is connected to the aforementioned testing module 101 , and the negative end is grounded. The capacitor CSTR is used for charging or releasing energy in cooperation with the charging and discharging process of the aforementioned testing circuit 100 .

In a disclosed embodiment, the aforementioned power device Qa is one of a field effect transistor (Field Effect Transistor, FET) or a bipolar junction transistor (Bipolar Junction Transistor, BJT).

In a disclosed embodiment, the aforementioned testing module 101 includes a first switching tube Qb, a second switching tube Qc, and a third switching tube Qd connected in series between the positive terminal of the aforementioned capacitor CSTR and ground, the first switching tube The first end of the tube Qb is grounded, and the second end is connected to the aforementioned inductance L; the first end of the second switching tube Qc is connected to the connection node between the aforementioned first switching tube Qb and the aforementioned inductor L; the first end of the third switching tube Qd One end is connected to the second end of the aforementioned second switching transistor Qc, and the second end is connected to the positive end of the aforementioned capacitor CSTR.

In a further embodiment of the present disclosure, the aforementioned power device Qa, the first switch tube Qb, the second switch tube Qc, and the third switch tube Qd are metal-oxide-semiconductor field-effect transistors (MOSFETs). The MOS process controls the area of the chip, improves the integration level, and is conducive to the miniaturization of products.

In a disclosed embodiment, the control terminal of the first switching tube Qb is connected to the first control signal Sb, and the control terminal of the second switching tube Qc is connected to the second control signal Sc. In the experiment, the first switch The transistor Qb and the second switching transistor Qc are turned on alternately to cooperate with the charging and discharging process of the aforementioned test circuit 100 .

In a disclosed embodiment, the channel type of the aforementioned first switching tube Qb and the aforementioned second switching tube Qc are the same, for example, both are N-channel MOS tubes, then the aforementioned first control signal Sb and the aforementioned The second control signals Sc are mutually inverse signals, as shown in FIG. 2 .

In another disclosed embodiment, the channel types of the aforementioned first switching tube Qb and the aforementioned second switching tube Qc may also be reversed, for example, the first switching tube Qb is an N-channel MOS tube, and the second switching tube Qb is an N-channel MOS tube. Qc is a P-channel MOS transistor, the aforementioned first control signal Sb and the aforementioned second control signal Sc are the same signal, the former is in the conduction state when the first control signal Sb is at a high level, and the latter is in the second When the control signal Sc is at a high level, it is in an off state, so as to realize the alternate conduction of the first switching tube Qb and the second switching tube Qc.

For the convenience of description, in the following disclosed embodiments, the aforementioned main switching transistor Q1, power device Qa, first switching transistor Qb, second switching transistor Qc, and third switching transistor Qd are all N-channel type MOS transistors. The respective control timings are shown in Fig. 2 .

Specifically, in a disclosed embodiment, the power supply terminal is connected to a normal DC power supply, which stably provides the power supply voltage VB required by the circuit, for example, 12V. When the enable signal EN is at a logic high level, the main switch transistor Q1 is in the closed state. In the on state, the test circuit 100 is connected to the input voltage Vin to start supplying power to the test module 101, and the control signal Sa connected to the control terminal of the power device Qa is the same as the enable signal EN, so the main switch tube Q1 and the power device Qa at this time All are in the closed conduction state, the test circuit 100 works in the boost mode, the control terminal of the third switch tube Qd is connected to the third control signal Sd, and the third control signal Sd continues to be in the state of logic high level. The three switch tubes Qd are maintained in the on state, the first switch tube Qb and the second switch tube Qc are turned on alternately, at this time, the power supply terminal supplies power to the circuit load terminal Rload through the main switch tube Q1, and also charges the aforementioned capacitor CSTR , the circuit state at this time is equivalent to Figure 3, in order to simulate the normal charging process of the charger. As shown in Figure 2, the output of the load terminal Rload has a stable voltage Vout, and at the same time, the voltage VSTR of the positive terminal of the capacitor CSTR is maintained at a stable level state after the charging voltage is saturated, until the falling edge of the enable signal EN arrives;

As the charging of the capacitor CSTR is completed, the enable signal EN and the control signal Sa turn to a logic low level, the main switch tube Q1 and the power device Qa are both turned off, the power supply terminal stops supplying power to the circuit load terminal Rload, and the test circuit 100 works In the step-down mode, the aforementioned capacitor CSTR is released through the energy of the discharge process, and the inductor L connected to the test module 101 is used to discharge to provide electric energy for the load terminal Rload. The discharge process under work. As shown in Figure 2, the load terminal Rload maintains a stable output voltage Vout, and at the same time the voltage VSTR at the positive end of the capacitor CSTR begins to drop until the rising edge of the enable signal EN in the next cycle arrives.

In this way, the test circuit 100 alternately works in the boost mode and the buck mode in a continuous cycle to simulate the charging and discharging process under the normal working environment of the charger, and realizes the aging experiment. Compared with the prior art, the aging experiment can be effectively shortened. The time and the number of power supplies required improve the operability of the experiment, thereby saving costs. Furthermore, the performance test of the charger can be completed by using the detection results of each signal in the work, which can greatly improve the efficiency of the experiment.

In a disclosed embodiment, the aforementioned testing circuit 100 further includes:

Detection and control module (not shown), for controlling and processing various information in the experimental process, such as the detection and control module can be used to detect the storage power of the aforementioned capacitor CSTR, when the energy stored in the capacitor CSTR is not enough for the circuit load When the terminal Rload supplies power, set the logic of the enable signal EN to high, switch to the power supply terminal to supply power to the load terminal Rload, so as to adjust the enable signal EN connected to the control terminal of the main switch tube Q1 according to the detection information of the capacitor CSTR. The duty cycle effectively controls the output power.

In a disclosed embodiment, the aforementioned test circuit 100 can also be connected with: a host computer monitoring module (not shown), which can establish a communication connection with the test circuit and the aforementioned detection control module, and send All kinds of information can be displayed and controlled to realize data monitoring.

In a disclosed embodiment, the aforementioned power device Qa, the inductor L and the aforementioned testing module 101 are integrated on the same chip, as shown in FIG. 5 . In this way, on the one hand, the integration of the chip can be improved, and the circuit area can be reduced. At the same time, the on-chip technology is used to isolate the capacitor and the load terminal outside the chip, avoiding heat dissipation problems and interference between signals, and improving circuit stability.

On the other hand, the present disclosure provides a charger, wherein the charger may include the aforementioned test circuit 100 .

To sum up, the test circuit 100 and charger for aging experiments provided by the present disclosure, the test circuit 100 includes: a power device Qa, one end of the power device Qa is connected to the power supply end through the main switching tube Q1 connected, and the other end connected to the load terminal Rload, and the power device Qa is turned on or off synchronously with the aforementioned main switch tube Q1; a test module 101, the test module 101 is connected to the connection node of the power device Qa and the load terminal Rload through an inductance L, It is used to simulate the aging cycle of the charging and discharging process, and provides electric energy for the load terminal Rload; the capacitor CSTR, the positive terminal of the capacitor CSTR is connected to the aforementioned test module 101, and the negative terminal is grounded, and the capacitor CSTR is used to cooperate with the charging and discharging process of the test circuit 100 To charge or release energy. Thus, the test circuit 100 can easily switch between the two (boost and buck) modes by turning on and off the main switch tube Q1, and use this circuit structure to simulate the completion of the charging and discharging process. Compared with the prior art , can effectively shorten the time of the aging experiment and the number of power supplies required, improve the operability of the experiment, thereby saving costs and improving efficiency.

It should be noted that in the description of the present disclosure, it should be understood that the terms "upper", "lower", "inner" and the like indicate orientation or positional relationship, and are only for the convenience of describing the present disclosure and simplifying the description, rather than indicating Or imply that a referenced component or element must have a particular orientation, be constructed and operate in a particular orientation and therefore should not be construed as limiting the present disclosure.

Furthermore, herein, the inclusive term "comprises," "comprising," or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article, or apparatus that includes a set of elements includes not only those elements, but also Other elements not expressly listed, or inherent to the process, method, article, or apparatus are also included. Without further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article or apparatus comprising said element.

In addition, in this document, descriptions related to "first", "second" and so on are only used for descriptive purposes, and cannot be understood as indicating or implying their relative importance or implicitly specifying the quantity of indicated technical features. Thus, the features defined as "first" and "second" may explicitly or implicitly include at least one of these features. In addition, the technical solutions of the various embodiments can be combined with each other, but it must be based on the realization of those skilled in the art. When the combination of technical solutions is contradictory or cannot be realized, it should be considered that the combination of technical solutions does not exist , nor within the scope of protection required by the present invention.

Finally, it should be noted that obviously, the above-mentioned embodiments are only examples for clearly illustrating the present disclosure, rather than limiting the implementation manner. For those of ordinary skill in the art, other changes or changes in different forms can be made on the basis of the above description. It is not necessary and impossible to exhaustively list all the implementation manners here. However, the obvious changes or modifications derived therefrom are still within the protection scope of the present disclosure.

Claims (9)

1. A test circuit for burn-in experiments, the test circuit is connected to a power supply terminal through a main switch tube, wherein the test circuit comprises:

the power device is connected between the main switching tube and the load end and is synchronously switched on or off with the main switching tube;

the test module is connected to a connection node of the power device and the load end through an inductor and used for simulating an aging period in a charging and discharging process and providing electric energy for the load end;

and the positive end of the capacitor is connected with the test module, the negative end of the capacitor is grounded, and the capacitor is used for charging or releasing energy in cooperation with the charging and discharging process of the test circuit.

2. The test circuit of claim 1, wherein the power device is one of a field effect transistor or a bipolar transistor.

3. The test circuit of claim 1, wherein the test module comprises a first switch tube, a second switch tube and a third switch tube connected in series between the positive terminal of the capacitor and ground,

the first end of the first switch tube is grounded, the second end of the first switch tube is connected with the inductor,

the first end of the second switch tube is connected with the connection node of the first switch tube and the inductor,

and the first end of the third switching tube is connected with the second end of the second switching tube, and the second end of the third switching tube is connected with the positive electrode end of the capacitor.

4. The test circuit of claim 3, wherein a control terminal of the first switch tube is coupled to the first control signal, and a control terminal of the second switch tube is coupled to the second control signal,

the first switch tube and the second switch tube are alternately conducted to match the charging and discharging process of the test circuit.

5. The test circuit of claim 4, wherein the first switch tube and the second switch tube have the same channel type, and the first control signal and the second control signal are opposite signals;

or, if the channel types of the first switching tube and the second switching tube are opposite, the first control signal and the second control signal are the same signal.

6. The test circuit of claim 4, wherein the main switching tube and the power device are both in a closed conducting state, the test circuit operates in a boost mode, and a power supply terminal supplies power to a load terminal and charges the capacitor at the same time;

the main switching tube and the power device are both in an off state, the test circuit works in a voltage reduction mode, the capacitor releases energy in a discharging process, and power is supplied to the load end through the inductor.

7. The test circuit of claim 5, further comprising:

and the detection control module is used for detecting the stored electric quantity of the capacitor and adjusting the duty ratio of a control signal accessed by the control end of the main switching tube according to the detection information.

8. The test circuit of claim 1, wherein the power device, inductor, and test module are integrated on the same chip.

9. A charger, comprising:

a test circuit as claimed in any one of claims 1 to 8.

Images