CN115421019A - Slot detector, method and device and storage medium - Google Patents

Slot detector, method and device and storage medium Download PDF

Info

Publication number
CN115421019A
CN115421019A CN202210854331.6A CN202210854331A CN115421019A CN 115421019 A CN115421019 A CN 115421019A CN 202210854331 A CN202210854331 A CN 202210854331A CN 115421019 A CN115421019 A CN 115421019A
Authority
CN
China
Prior art keywords
card slot
pin
processor
fault
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN202210854331.6A
Other languages
Chinese (zh)
Inventor
顾伟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Suzhou Inspur Intelligent Technology Co Ltd
Original Assignee
Suzhou Inspur Intelligent Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Suzhou Inspur Intelligent Technology Co Ltd filed Critical Suzhou Inspur Intelligent Technology Co Ltd
Priority to CN202210854331.6A priority Critical patent/CN115421019A/en
Publication of CN115421019A publication Critical patent/CN115421019A/en
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2853Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16538Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
    • G01R19/16552Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The application relates to a card slot detector, a method, a device and a storage medium. Wherein, the draw-in groove detector includes: the card slot detection circuit is used for acquiring the actual voltage of at least one pin of the card slot; a processor for determining whether the card slot is faulty according to the actual voltage of the at least one pin; one end of the card slot detection circuit is electrically connected with the card slot, and the other end of the card slot detection circuit is electrically connected with the processor. The problem of draw-in groove detection inefficiency among the prior art can be improved through adopting the draw-in groove detector that this application provided.

Description

Slot detector, method and device and storage medium
Technical Field
The present disclosure relates to the field of integrated circuit design, and in particular, to a card slot detector, a method, an apparatus, and a storage medium.
Background
The card slot is an interface on the master device for connecting with other devices. The main equipment is electrically connected with the golden fingers on other equipment through pins in the card slot to realize data interaction. The main device and other devices cannot be connected correctly due to the fact that faults such as open circuit and short circuit can occur to pins in the card slot. For example, during a Functional Test (FCT) of a server, an error of a memory card slot is often prompted.
To this end, the card slot is often detected by manual detection. The maintenance personnel use the universal meter to detect whether the pin of draw-in groove breaks down one by one to find out the problem point. However, in the case of many pins of the card slot, this method is very time-consuming and labor-consuming. For example, if the memory card slot has 288 pins, a great deal of labor cost and time cost will be wasted if the above-mentioned manual detection method is adopted. Therefore, the prior art has the problem of low card slot detection efficiency.
Disclosure of Invention
Based on this, the application provides a card slot detector, a method, a device and a storage medium, which can solve the problem of low card slot detection efficiency in the prior art.
In a first aspect, the present application provides a card slot detector, which includes: the card slot detection circuit is used for acquiring the actual voltage of at least one pin of the card slot; a processor for determining whether the card slot is faulty according to an actual voltage of the at least one pin; one end of the clamping groove detection circuit is electrically connected with the clamping groove, and the other end of the clamping groove detection circuit is electrically connected with the processor.
With reference to the first aspect, in a first implementable manner of the first aspect, the card slot detection circuit includes: the selection module is used for selecting the tested pin and comprises at least one data selector; the resistance module is used for improving the detection precision and comprises at least one resistance submodule; one end of the selection module is electrically connected with the clamping groove through the resistance module, and the other end of the selection module is electrically connected with the processor.
With reference to the first implementable manner of the first aspect, in a second implementable manner of the first aspect, the data selector includes a gate terminal, an address code terminal, a data output terminal, and a data input terminal, where the gate terminal, the address code terminal, and the data output terminal are respectively electrically connected to the processor, and the data input terminal is electrically connected to the card slot through the resistor module.
With reference to the first aspect, in a third implementable manner of the first aspect, the card slot tester further includes an input device for inputting the failure threshold; the input device is connected with the processor, and the fault threshold value is a critical value used for indicating whether the card slot is in fault or not.
With reference to the first aspect, in a fourth implementable manner of the first aspect, the card slot detector further includes a memory for storing a failure threshold; the memory is connected with the processor, and the fault threshold value is a critical value used for indicating whether the card slot is in fault or not.
With reference to the first aspect, in a fifth implementable manner of the first aspect, the card slot detector further includes a display screen for displaying a detection result; the display screen is connected with the processor, and the detection result is used for indicating whether the card slot breaks down or not.
In a second aspect, the present application provides a card slot detection method, including: acquiring the actual voltage of at least one pin of the card slot; comparing the actual voltage of at least one pin with the corresponding pre-stored voltage respectively to determine the numerical value relationship between the actual voltage of at least one pin and the corresponding pre-stored voltage respectively, wherein the pre-stored voltage is used for indicating the normal voltage of at least one pin under the condition that the card slot has no fault; and determining whether the card slot is in fault according to the numerical value size relation.
With reference to the second aspect, in a first possible implementation manner of the second aspect, the step of determining whether the card slot is faulty according to the magnitude relation of the values includes: determining the difference between the actual voltage of at least one pin and the corresponding pre-stored voltage; receiving a fault threshold value, wherein the fault threshold value is a critical value used for indicating whether a card slot has a fault or not; and if the difference value between the actual voltage of any one pin of the at least one pin and the corresponding pre-stored voltage is greater than the fault threshold value, determining that the card slot has a fault.
The third aspect, this application still provides a draw-in groove detection device, and this draw-in groove detection device includes: the acquisition unit is used for acquiring the voltage of at least one pin of the card slot; the comparison unit is used for comparing the actual voltage of the at least one pin with the corresponding pre-stored voltage respectively so as to determine the numerical value relationship between the actual voltage of the at least one pin and the corresponding pre-stored voltage respectively, wherein the pre-stored voltage is used for indicating the normal voltage of the at least one pin under the condition that the card slot has no fault; and the determining unit is used for determining whether the card slot is in fault according to the numerical value size relationship.
With reference to the third aspect, in a first implementable manner of the third aspect, the determining unit is specifically configured to: determining the difference between the actual voltage of at least one pin and the corresponding pre-stored voltage; receiving a fault threshold value, wherein the fault threshold value is a critical value used for indicating whether the card slot has a fault; and if the difference value between the actual voltage of any one pin of the at least one pin and the corresponding pre-stored voltage is greater than the fault threshold value, determining that the card slot has a fault.
In a fourth aspect, the present application further provides a computer-readable storage medium, in which a plurality of instructions are stored, and the instructions are adapted to be loaded by a processor and to execute the card slot detection method according to the second aspect or any one of the embodiments of the second aspect.
In summary, the present application provides a card slot detector, a method, an apparatus and a storage medium. The card slot detector comprises a card slot detection circuit and a processor, wherein the card slot detection circuit is used for acquiring the actual voltage of at least one pin of the card slot, the processor is used for determining whether the card slot has a fault according to the actual voltage of the at least one pin, one end of the card slot detection circuit is electrically connected with the card slot, and the other end of the card slot detection circuit is electrically connected with the processor. In order to solve the problem of low detection efficiency of the card slot in the prior art, the actual voltage of at least one pin of the card slot can be acquired by using a card slot detection circuit in the card slot detector, and the actual voltage of at least one pin is compared with the corresponding pre-stored voltage by using a processor, so that the numerical value size relationship between the actual voltage of at least one pin and the corresponding pre-stored voltage is determined, and whether the card slot has a fault or not is determined according to the numerical value size relationship. It can be seen that, because the technical scheme of the application realizes the automatic detection of the card slot, and can detect a plurality of pins of the card slot, the card slot detection efficiency is greatly improved.
Drawings
FIG. 1 is a block diagram illustrating the structure of a card slot detector in one embodiment;
FIG. 2 is a block diagram of another embodiment of a card slot detector;
FIG. 3 is a block diagram of another embodiment of a card slot tester;
FIG. 4 is a block diagram of another embodiment of a card slot tester;
FIG. 5 is a block diagram of another embodiment of a card slot detector;
FIG. 6 is a block diagram showing the structure of a card slot detector in another embodiment;
FIG. 7 is a block diagram of another embodiment of a card slot tester;
FIG. 8 is a schematic flow chart diagram illustrating a method for card slot detection in one embodiment;
fig. 9 is a schematic flowchart of a card slot detection method in another embodiment;
fig. 10 is a schematic block diagram of a card slot detection apparatus provided in the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
Since the embodiments of the present application relate to a large number of terms in the art, for the sake of understanding, the following description will be made of terms and concepts related to the embodiments of the present application.
1. Clamping groove
The card slot is an interface used for being connected with other equipment on the main equipment. The card slot comprises at least one pin, and the at least one pin is used for being contacted with a golden finger of other equipment, so that the electrical connection between the main equipment and the other equipment is realized. Generally, there are many pins of the card slot, for example, the number of pins of the memory card slot can be as many as 288. The Memory card slots include a Single Inline Memory Module (SIMM) card slot and a Dual-Inline Memory Module (DIMM) card slot. The application does not limit the types of the card slots and the number of pins of the card slots.
2. Golden finger
A connecting finger (connecting finger) is a connecting part on the above-mentioned other device for connecting with the main device. The golden finger is composed of a plurality of golden yellow conductive contact plates, and is called the golden finger because the surfaces of the golden yellow conductive contact plates are plated with gold and the conductive contact plates are arranged like fingers. In view of cost, tin-plated gold fingers are also used. The golden finger comprises at least one pin with the same number as the pins of the card slot, and the at least one pin on the golden finger is in one-to-one contact with the pins on the card slot respectively, so that other equipment and the main equipment can be connected and carry out data interaction.
3. Processor with a memory having a plurality of memory cells
The processor may be a Central Processing Unit (CPU), a general purpose processor, a coprocessor, a Digital Signal Processor (DSP), an application-specific integrated circuit (ASIC), a Field Programmable Gate Array (FPGA) or other programmable logic device, transistor logic, hardware components, or any combination thereof. The processor may also be a combination of computing functions, e.g., comprising one or more microprocessors, DSPs, and microprocessors, among others. In this embodiment, the processor may adopt a single chip microcomputer, and various control functions may be implemented by programming the single chip microcomputer, for example, in this embodiment, a function of determining whether a card slot has a fault according to an actual voltage of at least one pin is implemented, and the processor has advantages of strong computing capability and fast processing.
It should be further noted that the card slot detection apparatus referred to in the following description may include, but is not limited to, a processor, a Central Processing Unit (CPU), a general purpose processor, a coprocessor, a Digital Signal Processor (DSP), an application-specific integrated circuit (ASIC), a Field Programmable Gate Array (FPGA) or other programmable logic device, a transistor logic device, a hardware component, or any combination thereof in the card slot detector. The card slot detection device may implement the method described in the present application, for example, whether the card slot has a fault or not may be determined according to the actual voltage of the at least one pin, which is not described herein again.
It should be noted that the drawings provided in the present embodiment are only for illustrating the basic idea of the present invention, and the components related to the present invention are only shown in the drawings rather than drawn according to the number, shape and size of the components in actual implementation, and the type, quantity and proportion of the components in actual implementation may be changed freely, and the layout of the components may be more complicated. The structures, proportions, sizes, and other dimensions shown in the drawings and described in the specification are for understanding and reading the present disclosure, and are not intended to limit the scope of the present disclosure, which is defined in the claims, and are not essential to the art, and any structural modifications, changes in proportions, or adjustments in size, which do not affect the efficacy and attainment of the same are intended to fall within the scope of the present disclosure. Meanwhile, the directions or positional relationships referred to in the specification as "upper", "lower", "left", "right", "middle", "longitudinal", "lateral", "horizontal", "inner", "outer", "radial", "circumferential", and the like are directions or positional relationships based on the directions or positional relationships shown in the drawings, and are merely for convenience of description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be constructed and operated in a specific direction, and that changes or adjustments of the relative relationships thereof are considered to be within the scope of the present invention without substantial technical changes. And therefore should not be construed as limiting the invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
It should be further noted that the connection manner in the drawings of the present application is only an example, and should not limit the specific connection in the present application, and the present application does not limit the number of pins connected between the components in the main device and the card slot detector, and between the components in the card slot detector. For example, in fig. 1 and fig. 2, there may be a plurality of pins connected between the card slot and the card slot detection circuit to realize the electrical connection between the card slot detection circuit and the card slot, so that the connection relationship between the two in the figures is a general representation. For another example, a connection line between the resistor module and the selection module in fig. 5 does not represent that the two are connected by only one pin, a connection line between the resistor module and the card slot does not represent that the two are connected by only one pin, one end of the resistor module is connected with at least one pin in the card slot, the other end of the resistor module is connected with at least one port of the selection module, the number of the at least one pin in the card slot is the same as that of the one port of the selection module, and the at least one pin in the card slot corresponds to the one port of the selection module.
At present, in order to detect whether the pin in the card slot has faults such as open circuit and short circuit, the card slot can be detected by adopting a manual detection mode, namely, maintenance personnel use a universal meter to detect whether the pin of the card slot has faults one by one, so that a problem point is found out. However, in the case of many pins of the card slot, this method is very time-consuming and labor-consuming. For example, if the memory card slot has 288 pins, a great deal of labor cost and time cost will be wasted if the above-mentioned manual detection method is adopted. Therefore, the prior art has the problem of low card slot detection efficiency.
In view of the above, the present application provides a card slot detector, a method, an apparatus and a storage medium. The actual voltage of at least one pin of draw-in groove is gathered to draw-in groove detection circuitry among the draw-in groove detector to utilize the treater to compare the actual voltage of at least one pin with the voltage that prestores that corresponds respectively, in order to confirm the actual voltage of at least one pin and the numerical value size relation of the voltage that prestores that corresponds respectively, thereby whether determine the draw-in groove according to this numerical value size relation and break down.
The application provides a draw-in groove detector is as shown in fig. 1, and the draw-in groove detector includes: the card slot detection circuit is used for acquiring the actual voltage of at least one pin of the card slot; a processor for determining whether the card slot is faulty according to the actual voltage of the at least one pin; one end of the card slot detection circuit is electrically connected with the card slot, and the other end of the card slot detection circuit is electrically connected with the processor. Preferably, the processor in the card slot detector is a low-power System on Chip (SoC).
The connection between the card slot detection circuit and the card slot is realized by the connection of a plurality of pins between the card slot detection circuit and the card slot. In addition, the card slot detection circuit is substantially electrically connected with the pins in the card slot through the contact of the golden finger on the card slot detector and the pins in the card slot, so that the card slot detector in the application is connected to the main device in a non-fixed mode, and is electrically connected to the main device and detects the card slot of the main device. It should be noted that the connection between the processor and the card slot detection circuit in the card slot detector may be direct connection or indirect connection, for example, the indirect connection may be through a bus.
It is thus clear that this application utilizes the draw-in groove detector can detect at least one pin in the draw-in groove, whether the rapid judgement draw-in groove is broken down, and does not need the manual work to carry out the one-by-one to the pin and detect, has consequently realized the automation process that the draw-in groove detected, has improved draw-in groove detection efficiency greatly, has improved the problem that draw-in groove detection efficiency is low among the prior art.
In addition, this application provides the draw-in groove detector except can improving draw-in groove detection efficiency, can also realize following three point technological effect at least:
firstly, the accuracy of detection is improved. Among the prior art, maintenance personal can also use traditional tester of taking the lamp to detect the draw-in groove in order to reacquire the result that detects fast, distinguishes whether the draw-in groove breaks down with going out through the bright of diode to and the pin that breaks down among the positioning channel groove. However, the detection result of this method is not accurate, because the tester with lamp can indicate the abnormal state of signal open circuit and short circuit of data line and address line by the on and off of the light-emitting diode, but it still has the disadvantage of low test coverage (only testing data and address line), and the disadvantage of being unable to judge whether the signal is abnormal by observing the brightness of the light-emitting diode by human eyes under the condition that the test line has micro short circuit or micro open circuit.
And secondly, the compatibility of the card slot detector is improved. Because the card slot detector judges whether the card slot has faults according to the actual voltage of the pin, the problem of software interface adaptation can not exist. As long as the draw-in groove detector can insert the draw-in groove of master equipment to through the position alignment of the pin in golden finger and the draw-in groove, alright in order to realize electric connection and carry out the draw-in groove and detect, consequently the draw-in groove detector of this application has good compatibility.
Thirdly, the detachability of the card slot detector is improved. As before, the card slot detector can be connected to the main equipment in a non-fixed mode, so that the card slot detector can be conveniently inserted into the main equipment or detached from the main equipment according to detection requirements.
Optionally, the card slot detector further includes an input device for inputting a failure threshold, the input device is connected to the processor, and the failure threshold is a critical value for indicating whether the card slot fails. The input device refers to an external device for inputting a failure threshold, and the input device includes, for example, a keyboard, a mouse, and the like. The input device can be used for receiving a fault threshold value and an instruction input by a user and transmitting the fault threshold value to the processor, so that the processor judges whether the card slot has errors by taking the fault threshold value as a critical value; and transmitting the instruction to the processor, so that the processor executes the operation corresponding to the instruction. Preferably, the input device used in the present application is a keyboard including keys of "0" to "9", decimal points, and "up", "down", "left", "right", "on", "off", "contrast", and "confirm".
Optionally, the card slot detector further includes a memory for storing a failure threshold, the memory is connected to the processor, and the failure threshold is a critical value for indicating whether the card slot fails. The memory may store not only the failure threshold, but also all data detected by the card slot detector, for example, an actual voltage of at least one pin of the card slot detected by the card slot detection circuit. Preferably, the memory adopted by the application is a low-power consumption flash memory.
Optionally, the card slot detector further includes a display screen for displaying a detection result, the display screen is connected to the processor, and the detection result is used to indicate whether the card slot is faulty. The display screen can display the result of whether the card slot has faults or not, and can also display the specific pin with faults in the card slot and the corresponding actual voltage. Preferably, the display screen adopted by the application is a small-sized graphic dot matrix liquid crystal display screen.
Optionally, the card slot detector further includes a battery, and the battery is connected to other components in the card slot detector, so as to provide power for other components in the card slot detector. Preferably, the battery used in the present application is a rechargeable lithium ion.
Optionally, the card slot detector further includes a power management chip, where the power management chip is connected between the battery and other components, that is, the battery is connected to other components in the card slot detector through the power management chip, so as to implement management and optimization of a power supply. Preferably, the power management chip adopted by the application is a low-power-consumption power management chip.
Optionally, in combination with the above optional modes, the present application provides an implementation mode, as shown in fig. 2, the card slot tester includes a card slot detection circuit 201 for acquiring an actual voltage of at least one pin of the card slot, a processor 202 for determining whether the card slot is faulty according to the actual voltage of the at least one pin, an input device 203 for inputting a fault threshold, a memory 204 for storing the fault threshold, and a display screen 205 for displaying a detection result. The input device 203 is connected with the processor 202, the memory 204 is connected with the processor 202, and the display screen 205 is connected with the processor 202; the fault threshold value is a critical value used for indicating whether the card slot is in fault or not, and the detection result is used for indicating whether the card slot is in fault or not. Wherein the card slot detection circuit may be connected to the card slot 207 of the host device through the gold finger 206. In addition, the card slot detector and the host device may have a grounding point 209 and a grounding point 208, respectively, and the two grounding points may be connected together to realize a common ground.
The present application further provides another implementable manner, as shown in fig. 3, which is a more specific implementation manner based on the card slot detector shown in fig. 1 in the foregoing embodiment. Specifically, the card slot detection circuit in the card slot detector includes: the selection module is used for selecting the tested pin and comprises at least one data selector; the resistance module is used for improving the detection precision and comprises at least one resistance submodule; one end of the selection module is electrically connected with the clamping groove through the resistance module, and the other end of the selection module is electrically connected with the processor.
The card slot detection circuit comprises a resistance module and a selection module, and the processor gates the pin to be detected by controlling the selection module so as to acquire the actual voltage of the pin to be detected. In addition, the processing module improves the precision of the actual voltage of the pin to be detected through the resistance module, so that the actual voltage obtained through detection is more accurate. The selection module comprises one or more than one data selector, the resistance module comprises one or more than one resistance submodule, and the number of the data selector is consistent with that of the resistance submodule. Each resistance submodule comprises at least one resistance, and the number of the resistances in each resistance submodule is consistent with the number of the data input ends of the data selector. It should be noted that, the present application does not limit the type and the number of pins of the data selector, and does not limit the specific resistance value of the resistor. The data selector comprises a four-to-one data selector, an eight-to-one data selector and the like.
In order to improve the detection accuracy, the resistor may be a High precision resistor (High precision resistor), where the High precision resistor refers to a resistor with a small resistance error, and examples of the High precision resistor include a JEPSUN precision resistor and a thin film resistor. High precision resistor precision is common as: 1% one hundredth, 0.5% five thousandths, 0.25%,0.1% one thousandth, 0.05% five thousandths, 0.01% one thousandth.
In order to better understand the card slot detecting apparatus in the above embodiments, the present application will next describe, in conjunction with the structural block diagrams of the card slot detecting apparatus shown in fig. 4 and fig. 5, an embodiment of "the selecting module includes one data selector" and an embodiment of "the selecting module includes more than one data selector", specifically:
in a first implementation manner, the selection module in the card slot detection circuit comprises a data selector, and the resistance module comprises a resistance submodule. Specifically, as shown in fig. 4, the resistance module includes a resistance submodule, and the selection module includes a data selector. A processor in the card slot detector is connected to a card slot in the main device sequentially through the data selector and the resistance submodule to acquire the actual voltage of at least one pin in the card slot and determine whether the card slot has a fault according to the actual voltage of the at least one card slot.
In a second practical mode, the selection module in the card slot detection circuit comprises more than one data selector, and the resistance module comprises more than one resistance submodule. Specifically, as shown in fig. 5, the number of at least one resistor sub-module in the resistor module is the same as the number of at least one selection sub-module in the selection module, and the resistor sub-modules and the selection sub-modules are in one-to-one correspondence and are connected to each other. The selection module comprises N data selectors such as a first data selector and a second data selector, and the resistance module comprises N resistance sub-modules such as a first resistance sub-module and a second resistance sub-module. The processor is connected to the card slots in the master device through the N routes respectively to acquire actual voltage of at least one pin in the card slot and determine whether the card slot has a fault according to the actual voltage of the at least one card slot. The N routes refer to a first route through which the processor is connected to the card slot from the first data selector and the first resistor submodule, and a second route through which the processor is connected to the card slot from the second data selector and the second resistor submodule. Therefore, in the embodiment, the processor can be connected to the card slot through different routes, so that the number of pins which can be detected at one time is increased, and the card slot detection efficiency is further improved.
In summary, the processor in the card slot detector is connected to the card slot in the host device sequentially through the at least one data selector and the at least one resistor submodule to acquire the actual voltage of the at least one pin in the card slot, and determine whether the card slot has a fault according to the actual voltage of the at least one card slot. Therefore, the card slot detector can detect any pin in the card slot, can quickly locate the failed pin, and provides the card slot detector capable of efficiently detecting the card slot failure.
The present application further provides another implementable manner, which is based on a more specific implementation manner of the card slot detector shown in fig. 3 in the foregoing embodiment. Specifically, a data selector of a card slot detection circuit in the card slot detector comprises a gating end, an address code end, a data output end and a data input end, wherein the gating end, the address code end and the data output end are respectively electrically connected with a processor, and the data input end is electrically connected with the card slot through a resistance module.
In order to better understand the card slot detecting apparatus in the foregoing embodiment, the present application will next describe, by taking an example in which the data selector is an eight-to-one data selector, and combining the structural block diagrams of the card slot detecting apparatus shown in fig. 6 and fig. 7, an embodiment in which the "selection module includes one data selector" and an embodiment in which the "selection module includes more than one data selector", specifically:
in a first implementable manner, as shown in fig. 6, the selection module of the card slot detector includes a data selector, where the data selector is an one-out-of-eight data selector, and the one-out-of-eight data selector includes a gating end E0, an address code end A0/A1/A2, a data output end F0, and data input ends D0 to D7; the resistance module of the card slot detector comprises a resistance submodule, and the resistance submodule comprises eight resistors R0-R7. The eight-out-of-one data selector comprises a gating end E0, an address code end A0/A1/A2 and a data output end F0 which are electrically connected with a processor respectively, and data input ends D0-D7 are electrically connected with a clamping groove through R0-R7 of a resistance submodule respectively. Preferably, the resistor used in the present application is a high precision resistor.
The embodiment is substantially based on a more specific implementation of the card slot detector shown in fig. 4. In this embodiment of the application, the processor may select the data selector by controlling the gating end E0 of the data selector, so that the data selector starts to operate, then the processor inputs the address code through the address code end A0/A1/A2 of the data selector, the data selector parses the received address code to acquire the actual voltage of the pin of the card slot indicated by the address code, and finally the data collector transmits the acquired actual voltage to the processor through the data output end F0, so that the processor determines whether the card slot is faulty or not according to the acquired actual voltage of the pin of the card slot.
For example, the processor inputs a high voltage to the gating end E0 of the data selector to select the data selector, then inputs a binary address code 010 to the address code end A0/A1/A2 of the data selector, the data selector analyzes the address code 010 in the secondary system to obtain a decimal 2, acquires an actual voltage of a third pin of the card slot through a data input end D2 port indicated by the decimal 2, and transmits the actual voltage to the processor through the data output end F0, so that the processor determines whether the card slot is faulty according to the acquired actual voltage of the pin of the card slot.
It should be noted that the data input ends D0 to D7 are electrically connected to the card slot through R0 to R7 of the resistor submodule, respectively, that is, one ends of R0 to R7 of the resistor submodule are connected to a power supply Voltage (VCC), and the other ends of R0 to R7 are connected to the data input ends D0 to D7 of the selection module and eight pins of the card slot, respectively. In addition, the equivalent resistances of the eight pins of the pin on the card slot are respectively R0 'to R7', and the data input end of the data selector is selected, so that the detection module actually detects the point potential between the resistance module and the card slot, that is, the point potential between the data selector and the resistance submodule, that is, the point potential between R0 to R7 of the resistance submodule and the equivalent resistances R0 'to R7' of the pin of the card slot. If R0-R7 of the resistor submodule are high-precision resistors, the precision of the point potential obtained through detection is high, a processor in the card slot detector can conveniently and accurately judge whether the card slot is in fault or not according to the point potential with high precision, and the detection efficiency is further improved.
In a second implementable manner, the selection module of the card slot detector includes more than one data selector, each data selector is an eight-out-of-one data selector, the more than one data selectors are respectively a first data selector, a second data selector, an nth data selector, and other N data selectors, and each data selector includes a gating end, an address code end, a data output end, and a data input end. In addition, the card slot detector further comprises more than one resistor submodule, wherein the more than one resistor submodule comprises a first resistor submodule, a second resistor submodule and other N resistor submodules, and each resistor submodule comprises eight resistors. The gating end, the address code end and the data output end of each data selector are electrically connected with the processor respectively, and the data input ends are electrically connected with the clamping grooves through the corresponding resistance submodules respectively. Preferably, the resistor used in the present application is a high precision resistor.
Specifically, as shown in fig. 7, the gate terminal E10, the address code terminal a10/a11/a12, and the data output terminal F10 of the first data selector are electrically connected to the processor, the data input terminals D10 to D17 are electrically connected to eight pins of the card slot through R10 to R17 of the resistor submodule, and the equivalent resistors of the eight pins are R10 'to R17', respectively; the gating end E20, the address code end A20/A21/A22 and the data output end F20 of the second data selector are respectively and electrically connected with the processor, the data input ends D20-D27 are respectively and electrically connected with eight pins of the card slot through R20-R27 of the resistor submodule, the equivalent resistances of the eight pins are respectively R20 'to R27'. The.
The embodiment is substantially based on a more specific implementation of the card slot detector shown in fig. 5. In this embodiment of the application, the processor may select one data selector among the N data selectors by controlling the gating end of each data selector, so that the selected data selector starts to operate, then the processor inputs an address code through the address code end of the data selector, so that the data selector parses the received address code to acquire an actual voltage of a pin of the card slot indicated by the address code, and finally the data collector transmits the acquired actual voltage to the processor through the data output end, so that the processor determines whether the card slot is faulty according to the acquired actual voltage of the pin of the card slot.
For example, the processor inputs a high voltage to the gating ends Em0 of N data selectors to select the mth data selector, wherein m is greater than or equal to 1, and m is less than or equal to N; then the processor inputs a binary address code 010 to an address code end Am0/Am1/Am2 of the mth data selector, the mth data selector analyzes the two-level address code 010 to obtain a decimal 2, actual voltage of the (8 (m-1) + 3) th pin of the card slot is collected through a data input end Dm2 port indicated by the decimal 2, and the actual voltage is transmitted to the processor through a data output end Fm0, so that the processor determines whether the card slot is in fault according to the collected actual voltage of the pin of the card slot.
It should be noted that, in the above two embodiments, the connection between the processor and the card slot detection circuit is a direct connection. The direct connection can improve the efficiency of data transmission, simplify the internal structure of the card slot detector and further improve the efficiency of card slot detection.
It should be noted that, in order to better describe the technical solution of the present application, the present application adopts an eight-out-of-one data selector as an example for description, but the present application does not limit the type and the pin number of the data selector. Any type and pin count data selector may be meaningless used in the card slot test machine of the present application based on the above description, and thus a card slot test machine using any type and pin count data selector is within the scope of the present application.
In summary, the embodiment of the present application explains in detail the structure of the card slot detector on the basis of the foregoing embodiment, and further improves the efficiency of card slot detection.
The application also provides a card slot detection method, which is applied to a card slot detection device, wherein the card slot detection device can be a processor in the card slot detector in any one of the embodiments. Next, the present application will take the processor in the card slot detecting apparatus as an example, and with reference to the flowchart of fig. 8, a more detailed description will be given to the card slot detecting method. Specifically, the method comprises the following steps:
801: and acquiring the actual voltage of at least one pin of the card slot.
The processor in the card slot detector obtains the actual voltage of at least one pin of the card slot through a card slot detection circuit in the card slot detector. It should be noted that the actual voltage refers to the voltage of the pin of the card slot to be detected. The difference from a non-faulty card slot is that the voltage of the pins of the non-faulty card slot is a normal voltage. According to whether the card slot to be detected is in fault or not, the actual voltage of the card slot to be detected may not be consistent with the normal voltage of the card slot without fault, and may also be consistent.
It should be noted that the processor in the card slot detector may gate any number of data selectors in the selection module in the card slot detection circuit, and input an address code to the any number of data selectors, so as to obtain the actual voltage of the pin of the card slot indicated by the address code. Therefore, the method of the application can obtain the actual voltage of any one pin of at least one pin of the card slot through the card slot detection circuit.
In order to obtain the actual voltage of at least one pin of the card slot, the processor of the card slot detector may adopt a "sequential obtaining" mode or a "batch obtaining" mode. Next, the present application will explain these two modes in detail.
In the first "sequential acquisition" mode, a processor of the card slot detector sequentially gates all data selectors in a selection module in the card slot detection circuit, and sequentially inputs address codes into the gated data selectors according to the sequence of the address codes from large to small, so as to acquire actual voltages of pins corresponding to the address codes in the card slot.
For example, as shown in fig. 7, the processor of the card slot tester inputs a high voltage to the gating terminal E10 of the first data selector to gate the first data selector; then, 000, 001, 010, 011, 100, 101, 110, and 111 are sequentially input to the address code terminal a10/a11/a12 of the first data selector, so as to obtain the actual voltage of the 1 st pin and the 2 nd pin. After the actual voltage of the 1 st pin and the 2 nd pin.... 8 th pin of the card slot corresponding to the first data selector is sequentially obtained, the processor of the card slot detector sequentially obtains the actual voltage of the 9 th pin and the 10 th pin.. 16 th pin corresponding to the second data selector, and the actual voltage of the 8N-7 th pin and the 8N-6 th pin.. 8N-th pin corresponding to the Nth data selector is obtained finally.
In the second batch acquisition mode, a processor of the card slot detector gates all data selectors in a selection module in the card slot detection circuit at one time, and sequentially inputs address codes into all data selectors according to the sequence of the address codes from large to small, so as to simultaneously acquire actual voltages of corresponding pins of the same address code in the card slot in all data selectors.
For example, as shown in fig. 7, the processor of the card slot tester inputs a high voltage to the gating terminals E10, E20.... EN0 of the first and second data selectors, respectively, to gate the N data selectors; then, 000 are input to the address code terminal A10/A11/A12 of the first data selector, the address code terminal A20/A21/A22.. Of the second data selector, the address code terminal An0/An1/An2 of the Nth data selector, acquiring the actual voltage of the 1 st pin and the 9 th pin in the card slot through a data input end F10 of the first data selector and a data input end F20 of the second data selector respectively; according to the above-mentioned obtaining method, 001, 010, 011, 100, 101, 110, and 111 are sequentially input to the address code terminals of the N data selectors, so as to obtain the actual voltages of the remaining other pins of the card slot. Therefore, the same address code is input to all the data selectors at the same time, the actual voltage of the pins with the number consistent with that of the data selectors can be obtained, and the data obtaining efficiency is greatly improved.
802: and comparing the actual voltage of at least one pin with the corresponding pre-stored voltage respectively to determine the numerical value relationship between the actual voltage of at least one pin and the corresponding pre-stored voltage respectively.
The comparison refers to comparing the data of the pins respectively and independently, that is, comparing the actual voltage of the pins with the corresponding pre-stored voltage. The pre-stored voltage is used for indicating a normal voltage of at least one pin under the condition that the card slot has no fault, and can be understood as a normal voltage. Unlike the pre-stored voltage, the actual voltage may indicate a card slot failure or may indicate that the card slot is not failing. In order to obtain the pre-stored voltage of the pin, the card slot detector provided by the application can be inserted into a fault-free card slot so as to obtain the actual voltage of the fault-free card slot as the pre-stored voltage, and the pre-stored voltage is stored in the local memory.
For example, as shown in fig. 2, the card slot detecting apparatus is first inserted into the card slot 207 of the host device, the processor 202 in the card slot detecting apparatus obtains actual voltages of the pins in the card slot 207 through the card slot detecting circuit 201 and the gold finger 206, the memory 204 obtains pre-stored voltages corresponding to the pins of the card slot 207, and finally the actual voltages of the pins of the card slot 207 are respectively compared with the corresponding pre-stored voltages to determine whether the card slot 207 fails and the specific pin that fails.
803: and determining whether the card slot is in fault according to the numerical value size relation.
The step of determining whether the card slot is in fault according to the numerical value size relationship refers to determining that the pin is in fault and the card slot to which the pin belongs is in fault under the condition that the numerical value size difference between the actual voltage of the pin and the pre-stored voltage is large; and under the condition that the difference between the actual voltage of the pin and the value of the pre-stored voltage is small, judging that the pin has no fault, and determining that the card slot to which the pin belongs has no fault when all the pins of the card slot to which the pin belongs have no fault. To sum up, if all pins in the card slot have no fault, it is determined that the card slot has no fault, and if at least one pin in the card slot has a fault, it is determined that the card slot has a fault. Specifically, a difference value between the actual voltage of the pin and the pre-stored voltage is calculated, if the difference value is greater than a fault threshold value, a pin fault is determined, and the card slot to which the pin belongs is in fault, otherwise, the pin has no fault. The failure threshold value is a critical value used for indicating whether the card slot fails or not.
Optionally, when it is determined that the pin and the card slot are faulty, information indicating the fault of the card slot and the fault of the pin is sent to a display screen in the card slot detector, so that the display screen can display messages such as "card slot fault" and "x-th pin fault", where x is a positive integer not greater than the number of pins of the card slot.
For example, as shown in fig. 6, assuming that actual voltages obtained by a processor in the card slot tester to eight pins of the card slot are v1 and v2.. A.v 8, the processor obtains pre-stored voltages v1', v2'. A.v 8' corresponding to the eight pins of the card slot from a memory in the card slot tester, compares the magnitude relationship between v1 and v1' to determine whether the first pin of the card slot is faulty, compares v2 and v2' in sequence according to the comparison method, compares v3 and v3', and compares v8 and v8' to respectively compare whether the remaining 7 pins of the card slot are faulty. And if the 2 nd pin is in fault, sending a code 2 to a display screen of the card slot, so that the display screen displays characters such as 'card slot fault' and '2 nd pin fault'.
In summary, according to the card slot detection method provided by the application, the actual voltage of the at least one pin of the card slot is obtained and is compared with the corresponding pre-stored voltage respectively, so as to determine the numerical value relationship between the actual voltage of the at least one pin and the corresponding pre-stored voltage respectively, and determine whether the card slot is faulty or not according to the numerical value relationship. It can be seen that, because the technical scheme of this application has realized the automated inspection of draw-in groove, can detect a plurality of pins of draw-in groove moreover, consequently improved draw-in groove detection efficiency greatly.
The present application further provides another card slot detection method, where the card slot detection method is applied to a card slot detection apparatus, and the card slot detection apparatus may be a processor in the card slot detector in any one of the foregoing embodiments. Next, the present application will take the processor in the card slot detecting apparatus as an example, and with reference to the flowchart of fig. 9, a more detailed description will be given to the card slot detecting method. Specifically, the method comprises the following steps:
901: and acquiring the actual voltage of at least one pin of the card slot.
The processor in the card slot detector obtains the actual voltage of at least one pin of the card slot through a card slot detection circuit in the card slot detector. The implementation process of this step may refer to step 801 in the foregoing method embodiment, and details of this step are not described herein again.
902: and comparing the actual voltage of at least one pin with the corresponding pre-stored voltage respectively to determine the numerical value relationship between the actual voltage of at least one pin and the corresponding pre-stored voltage respectively.
The pre-stored voltage is used for indicating the normal voltage of at least one pin under the condition that the card slot has no fault. The implementation process of this step may refer to step 802 in the foregoing method embodiments, which is not described herein again.
It should be noted that, after the numerical value magnitude relationship between the actual voltage of each pin and the corresponding pre-stored voltage is determined, whether the card slot is faulty or not can be determined according to the numerical value magnitude relationship. The specific implementation process of determining whether the card slot is faulty according to the magnitude relationship of the values includes steps 903 to 905, which will be described in detail below:
903: and determining the difference between the actual voltage of at least one pin and the corresponding pre-stored voltage respectively.
The actual voltage of each pin of the card slot is subtracted from the corresponding pre-stored voltage, and an absolute value is taken from a numerical value obtained by the subtraction, so that a difference value between the actual voltage of each pin and the corresponding pre-stored voltage is obtained.
904: a failure threshold is received.
The failure threshold value is a critical value used for indicating whether the card slot fails or not. The failure threshold may be obtained by manual input from a user. Next, the present application will describe the manual input mode of the user in combination with the card slot detector provided in the present application.
Illustratively, as shown in fig. 2, a processor 202 in the card slot tester receives a fault threshold value input by a user through an input device 203, and stores the fault threshold value in a memory 204, so that when the processor acquires an actual voltage of each pin of the card slot through a card slot testing circuit 201, whether each pin of the card slot is faulty or not is determined according to the fault threshold value stored in the memory 204 and a pre-stored voltage of each pin, and thus, whether the card slot to which the pin belongs is faulty or not is determined.
905: and if the difference value between the actual voltage of any one of the at least one pin and the corresponding pre-stored voltage is greater than the fault threshold value, determining that the card slot has a fault.
The processor of the card slot detector compares the difference value between the actual voltage of each pin and the corresponding pre-stored voltage with a fault threshold value respectively, and determines that the corresponding pin fails and the card slot to which the pin belongs fails under the condition that the difference value is greater than the fault threshold value; and determining that the corresponding pin has no fault when the difference value is less than or equal to the fault threshold value, and determining that the card slot to which the pin belongs has no fault when all the pins of the card slot to which the pin belongs have no fault.
In summary, the embodiment of the present application explains in detail an implementation process of the card slot detection method on the basis of the foregoing embodiment, and further improves the card slot detection efficiency.
Referring to fig. 10, the embodiment of the present invention further provides a card slot detection apparatus. The embodiments of the present invention may perform division of functional units on a device according to the above method examples, for example, each functional unit may be divided corresponding to each function, or two or more functions may be integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit. It should be noted that, the division of the cells in the embodiment of the present invention is schematic, and is only one logic function division, and another division manner may be available in actual implementation. As shown in fig. 10, the card slot detection apparatus includes an obtaining unit 1010, a comparing unit 1020, and a determining unit 1030, specifically:
an obtaining unit 1010 configured to obtain a voltage of at least one pin of the card slot; a comparing unit 1020, configured to compare the actual voltages of the at least one pin with corresponding pre-stored voltages, respectively, to determine a numerical relationship between the actual voltages of the at least one pin and the corresponding pre-stored voltages, where the pre-stored voltages are used to indicate normal voltages of the at least one pin under a condition that the card slot has no fault; the determining unit 1030 is configured to determine whether the card slot is faulty according to the magnitude relationship of the values.
In an implementation manner, the determining unit 1030 is specifically configured to: determining the difference between the actual voltage of at least one pin and the corresponding pre-stored voltage; receiving a fault threshold value, wherein the fault threshold value is a critical value used for indicating whether the card slot has a fault; and if the difference value between the actual voltage of any one pin of the at least one pin and the corresponding pre-stored voltage is greater than the fault threshold value, determining that the card slot has a fault.
In summary, in the card slot detection method provided by the present application, the obtaining unit 1010 obtains an actual voltage of at least one pin of the card slot, the comparing unit 1020 compares the actual voltage of the at least one pin with the corresponding pre-stored voltages respectively to determine a numerical relationship between the actual voltage of the at least one pin and the corresponding pre-stored voltages respectively, and finally the determining unit 1030 determines whether the card slot is faulty according to the numerical relationship. It can be seen that, because the technical scheme of this application has realized the automated inspection of draw-in groove, can detect a plurality of pins of draw-in groove moreover, consequently improved draw-in groove detection efficiency greatly.
The present application further provides a computer-readable storage medium having stored thereon a plurality of instructions adapted to be loaded by a processor and to perform the method of any of the preceding embodiments. A processor 1010 to execute a plurality of instructions; a memory 1020 for storing a plurality of instructions adapted to be loaded by the processor 1010 and to perform the method of fault upload as in the previous embodiments.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above examples only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A stuck groove detector is characterized by comprising:
the card slot detection circuit is used for acquiring the actual voltage of at least one pin of the card slot;
a processor for determining whether the card slot is faulty according to an actual voltage of the at least one pin;
one end of the card slot detection circuit is electrically connected with the card slot, and the other end of the card slot detection circuit is electrically connected with the processor.
2. The card slot tester of claim 1, wherein the card slot testing circuit comprises:
the selection module is used for selecting the tested pin and comprises at least one data selector;
the resistance module is used for improving the detection precision and comprises at least one resistance submodule;
one end of the selection module is electrically connected with the clamping groove through the resistance module, and the other end of the selection module is electrically connected with the processor.
3. The card slot detecting apparatus according to claim 2, wherein the data selector includes a gate terminal, an address code terminal, a data output terminal and a data input terminal, wherein the gate terminal, the address code terminal and the data output terminal are respectively electrically connected to the processor, and the data input terminal is electrically connected to the card slot through the resistor module.
4. The card slot tester of claim 1, further comprising an input device for inputting a fault threshold; the input device is connected with the processor, and the failure threshold is a critical value used for indicating whether the card slot fails.
5. The card slot tester of claim 1, further comprising a memory for storing a fault threshold; the memory is connected with the processor, and the failure threshold is a critical value used for indicating whether the card slot fails or not.
6. The card slot detector of claim 1, further comprising a display screen for displaying the detection result; the display screen is connected with the processor, and the detection result is used for indicating whether the card slot has a fault or not.
7. A card slot detection method is characterized by comprising the following steps:
acquiring the actual voltage of at least one pin of the card slot;
comparing the actual voltage of the at least one pin with corresponding pre-stored voltages respectively to determine the numerical value relationship between the actual voltage of the at least one pin and the corresponding pre-stored voltages respectively, wherein the pre-stored voltages are used for indicating the normal voltage of the at least one pin under the condition that the card slot has no fault;
and determining whether the card slot has a fault according to the numerical value size relation.
8. The method of claim 7, wherein the step of determining whether the card slot is faulty based on the magnitude relationship comprises:
determining the difference value between the actual voltage of the at least one pin and the corresponding pre-stored voltage respectively;
receiving a fault threshold value, wherein the fault threshold value is a critical value used for indicating whether the card slot has a fault;
and if the difference value between the actual voltage of any one pin of the at least one pin and the corresponding pre-stored voltage is greater than the fault threshold value, determining that the card slot has a fault.
9. A kind of card slot checkout gear, characterized by comprising:
the acquisition unit is used for acquiring the voltage of at least one pin of the card slot;
the comparison unit is used for comparing the actual voltage of the at least one pin with the corresponding pre-stored voltage respectively so as to determine the numerical value relationship between the actual voltage of the at least one pin and the corresponding pre-stored voltage respectively, wherein the pre-stored voltage is used for indicating the normal voltage of the at least one pin under the condition that the card slot has no fault;
and the determining unit is used for determining whether the card slot is in fault according to the numerical value size relationship.
10. A computer-readable storage medium having stored thereon a plurality of instructions adapted to be loaded by a processor and to perform the card slot detection method according to any of claims 7-8.
CN202210854331.6A 2022-07-14 2022-07-14 Slot detector, method and device and storage medium Withdrawn CN115421019A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210854331.6A CN115421019A (en) 2022-07-14 2022-07-14 Slot detector, method and device and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210854331.6A CN115421019A (en) 2022-07-14 2022-07-14 Slot detector, method and device and storage medium

Publications (1)

Publication Number Publication Date
CN115421019A true CN115421019A (en) 2022-12-02

Family

ID=84196776

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210854331.6A Withdrawn CN115421019A (en) 2022-07-14 2022-07-14 Slot detector, method and device and storage medium

Country Status (1)

Country Link
CN (1) CN115421019A (en)

Similar Documents

Publication Publication Date Title
US9753445B1 (en) DUT continuity test with only digital IO structures apparatus and methods associated thereof
US3673397A (en) Circuit tester
US4150331A (en) Signature encoding for integrated circuits
EP0182388B1 (en) Logic circuit test probe
US9564765B2 (en) Semiconductor device and battery voltage monitoring device
US20080133165A1 (en) Test apparatus and device interface
US4689551A (en) Testing wiring harnesses
US4183460A (en) In-situ test and diagnostic circuitry and method for CML chips
US4620302A (en) Programmable digital signal testing system
CN211426704U (en) Automatic test system for GPIO (general purpose input/output) of chip
WO2019032152A1 (en) Electronic component state determination
US4130794A (en) Methods and means for identifying and testing circuit connections
US11815560B2 (en) Methods and systems for wire harness test results analysis
CN113567832B (en) Testing device for IO connectivity of circuit board
US4743842A (en) Tri-state circuit tester
JP2015001488A (en) Method for checking electrical continuity and device for checking electrical continuity
CN115421019A (en) Slot detector, method and device and storage medium
CN203733108U (en) X86-based mainboard built-inself-test (BIST) model
CN115384531B (en) Automobile gear identification and diagnosis method and device, electronic equipment and computer readable storage medium
US20190056445A1 (en) Dut continuity test with only digital io structures apparatus and methods associated thereof
CN111562998A (en) Memory diagnosis method and device for integrated circuit and storage medium
CN104062530B (en) A kind of mobile terminal hardware failure detection device and method
CN113985321B (en) Cable connection performance testing device and method with intelligent self-learning capability
CN110570897A (en) Memory detection system, memory detection method and error mapping table establishing method
CN115640185A (en) Slot diagnosis card, slot diagnosis method and diagnosis system

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication

Application publication date: 20221202

WW01 Invention patent application withdrawn after publication