CN115395312A - Connector assembly, display panel, detection equipment and alignment test method - Google Patents

Connector assembly, display panel, detection equipment and alignment test method Download PDF

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Publication number
CN115395312A
CN115395312A CN202210999915.2A CN202210999915A CN115395312A CN 115395312 A CN115395312 A CN 115395312A CN 202210999915 A CN202210999915 A CN 202210999915A CN 115395312 A CN115395312 A CN 115395312A
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China
Prior art keywords
alignment
connector
signal
detection
pins
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CN202210999915.2A
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CN115395312B (en
Inventor
周庄奇
张博
文小雪
王云志
李重录
付焕章
陈重阳
洪自强
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BOE Technology Group Co Ltd
Mianyang BOE Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Mianyang BOE Optoelectronics Technology Co Ltd
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Priority to CN202210999915.2A priority Critical patent/CN115395312B/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/64—Means for preventing incorrect coupling
    • H01R13/641—Means for preventing incorrect coupling by indicating incorrect coupling; by indicating correct or full engagement
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R24/00—Two-part coupling devices, or either of their cooperating parts, characterised by their overall structure
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R27/00—Coupling parts adapted for co-operation with two or more dissimilar counterparts
    • H01R27/02—Coupling parts adapted for co-operation with two or more dissimilar counterparts for simultaneous co-operation with two or more dissimilar counterparts
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/26—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for engaging or disengaging the two parts of a coupling device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

The embodiment of the disclosure provides a connector assembly, a display panel, detection equipment and an alignment test method. The scheme of the connector assembly is as follows: the two connectors which are aligned are respectively provided with a plurality of detection pins and signal wires, and the two detection pins on one connector are connected through the signal wires, so that the two detection pins aligned on the other connector are not connected through the signal wires, when the first connector and the second connector are in crimping alignment, the detection pins in each crimping alignment form a series connection channel, and whether the channel is open or not is detected by inputting alignment signals into the series connection channel so as to determine whether the connectors are aligned accurately or not. The embodiment of the disclosure can realize the alignment detection between the connectors and avoid damaging products due to misconnection or virtual connection after electrification.

Description

Connector assembly, display panel, detection equipment and alignment test method
Technical Field
The disclosure relates to the technical field of display, and in particular relates to a connector assembly, a display panel, detection equipment and an alignment test method.
Background
Before the display panel is shipped, a lighting test is generally performed on the display panel by a plurality of lighting inspection work stations. Therefore, the stability of the lighting detection device is important. In the process of testing the display panel by adopting the lighting detection equipment, even if the testing personnel are trained properly and the testing process is normal, the phenomenon that the IC of the display panel burns or the screen is burnt can also exist, so that the product is scrapped. The main reason is that when lighting detection equipment and display panel crimping, the tester and lighting detection equipment can not accurately judge whether the pin crimping of the connector of the lighting detection equipment and the display panel connector is aligned correctly. If the pins are in virtual connection or are in dislocation, the lighting equipment directly provides power-on signals for the display panel, and IC burn or screen burn of the display panel can occur.
Disclosure of Invention
The embodiment of the disclosure provides a connector assembly, a display panel, a detection device and an alignment test method, so as to solve or alleviate one or more technical problems in the prior art.
As a first aspect of embodiments of the present disclosure, embodiments of the present disclosure provide a connector assembly including:
a first connector comprising:
a plurality of first signal connection pins arranged in parallel side by side; and
a plurality of first alignment detection pins arranged in parallel with the first signal connection pins, and a signal line connected between a part of the first alignment detection pins;
a second connector comprising:
the second signal connecting pins are arranged in parallel side by side and are arranged in an alignment mode with the first signal connecting pins; and
the second alignment detection pins are arranged in alignment with the first alignment detection pins, and signal lines are connected among part of the second alignment detection pins;
the first connector is provided with two first alignment detection pins connected with signal lines, and the second connector is provided with two second alignment detection pins connected with signal lines;
and under the condition that the first connector and the second connector are in press connection and are in correct alignment, the first alignment detection pin and the second alignment detection pin of each pair of press connection are used as a node, and the nodes form a serial path through the connection of the signal wires.
In some possible implementations, at least one side of at least one first alignment detection pin in the first connector is provided with a first ground pin, and the first ground pin and the first alignment detection pin are arranged in parallel side by side;
the second connector is provided with a second ground pin aligned with the first ground pin.
In some possible implementations, the first alignment detection pin has a width smaller than that of the first signal connection pin, and the second alignment detection pin has a width smaller than that of the second signal connection pin.
In some possible implementations, the second alignment detection pin corresponding to the start node in the serial path serves as an alignment signal input terminal, and the second alignment detection pin corresponding to the end node in the serial path serves as an alignment signal detection terminal.
In some possible implementations, at least one first signal connection pin is spaced between two adjacent first alignment detection pins.
As a second aspect of embodiments of the present disclosure, embodiments of the present disclosure provide a display panel including a first connector of the connection assembly of any one of the embodiments of the present disclosure.
As a third aspect of embodiments of the present disclosure, embodiments of the present disclosure provide a detection apparatus including a second connector in a connection assembly according to any of the embodiments of the present disclosure.
In some possible implementations, the detection device further includes:
the alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector;
the alignment signal input end is a second alignment detection pin corresponding to a start node in the series circuit, and the alignment signal detection end is a second alignment detection pin corresponding to a stop node in the series circuit.
In some possible implementations, the detection device further includes:
and the test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector.
As a fourth aspect of the embodiments of the present disclosure, an alignment test method is provided in the embodiments of the present disclosure, and is applied to a detection device in any embodiment of the present disclosure, where a second connector in the detection device is connected to a first connector in a display panel provided in any embodiment of the present disclosure, and the test method includes:
before inputting a signal to a second signal connection pin in the second connector, providing a counterpoint signal to any second counterpoint detection pin in the second connector, and detecting whether the counterpoint signal exists in other second counterpoint detection pins in the second connector;
and generating a first alignment detection result under the condition that the alignment signals are detected in the other second alignment detection pins, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In some possible implementations, the alignment testing method further includes:
and generating a second alignment detection result under the condition that the alignment signal cannot be detected in a second alignment detection pin in the other second alignment detection pins, wherein the second alignment detection result is used for indicating that the first connector and the second connector are not aligned correctly.
In some possible implementations, the second alignment detection result includes an identification of a second alignment detection pin at which the alignment signal is not detected.
As a fifth aspect of the embodiments of the present disclosure, an alignment test method is provided in the embodiments of the present disclosure, and is applied to a detection device in any embodiment of the present disclosure, where a second connector in the detection device is connected to a first connector in a display panel provided in any embodiment of the present disclosure, and the test method includes:
before inputting a signal to a second signal connection pin in the second connector, providing a counterpoint signal to a counterpoint signal input end in the second connector, and detecting whether the counterpoint signal exists or not aiming at a counterpoint signal detection end in the second connector;
and generating a first alignment detection result under the condition that the alignment signal is detected to exist at the alignment signal detection end, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In some possible implementations, the alignment testing method further includes:
and generating a second alignment detection result under the condition that the alignment signal at the alignment signal detection end cannot be detected, wherein the second alignment detection result is used for indicating that the first connector and the second connector are in alignment error.
In some possible implementations, the alignment signal in the alignment test method is a direct current signal.
According to the technical scheme provided by the embodiment of the disclosure, a plurality of alignment detection pins and signal lines are respectively arranged in two connectors which are aligned, the two detection pins on one connector are connected through the signal lines, so that the two detection pins aligned on the other connector are not connected through the signal lines, and when the first connector and the second connector are in crimping alignment correctly, the alignment detection pins of each alignment crimping form a series circuit. Thus, before powering up after crimping, it is determined whether the two connector crimps are properly aligned by detecting whether the series path is open.
The foregoing summary is provided for the purpose of description only and is not intended to be limiting in any way. In addition to the illustrative aspects, embodiments, and features described above, further aspects, embodiments, and features of the present disclosure will be readily apparent by reference to the drawings and following detailed description.
Drawings
In the drawings, like reference characters designate like or similar parts or elements throughout the several views unless otherwise specified. The figures are not necessarily to scale. It is appreciated that these drawings depict only some embodiments in accordance with the disclosure and are not to be considered limiting of its scope.
FIG. 1A is a schematic view of a connector crimp of an embodiment of the present disclosure;
FIG. 1B is a schematic view of a connector crimp of another embodiment of the present disclosure;
FIG. 1C is a schematic view of a connector crimp of another embodiment of the present disclosure;
fig. 2 is a flowchart illustrating a lighting test performed on a display panel according to an embodiment of the disclosure;
fig. 3 is a flowchart illustrating a lighting test performed on a display panel according to another embodiment of the disclosure;
FIG. 4 is a schematic view of a connector assembly of an embodiment of the present disclosure;
FIG. 5 is a schematic view of a connector according to an embodiment of the present disclosure;
FIG. 6 is a schematic view of a connector of another embodiment of the present disclosure;
FIG. 7 is a schematic view of a connector assembly crimp of an embodiment of the present disclosure;
FIG. 8 is a schematic view of a connector assembly crimp of another embodiment of the present disclosure;
FIG. 9 is a flow chart of a method of alignment testing according to an embodiment of the present disclosure;
fig. 10 is a flowchart of a method for testing alignment according to another embodiment of the disclosure.
Detailed Description
In the following, only certain exemplary embodiments are briefly described. As those skilled in the art would realize, the described embodiments may be modified in various different ways, all without departing from the spirit or scope of the present disclosure. Accordingly, the drawings and description are to be regarded as illustrative in nature, and not as restrictive.
Fig. 1A, 1B, and 1C are schematic diagrams of a connector crimp according to an embodiment of the present disclosure. As shown in fig. 1A, the left image is a connector of the lighting test equipment, and the middle image is a connector of the display panel. When the connector of the lighting test equipment is press-contacted with the connector of the display panel, an image which is observable from the external appearance after the press-contact is the right image in fig. 1A. As can be seen from this, when the tester connects the two connectors of the lighting test equipment and the display panel, it is subjectively impossible to determine whether or not the connectors of the display panel and the connectors of the lighting test equipment are properly aligned and connected. If the two connectors have pins which are connected in a virtual or wrong way, the lighting test equipment directly powers on the display panel, and the IC of the display panel may be damaged.
Fig. 2 is a flowchart illustrating a lighting test performed on a display panel according to an embodiment of the disclosure. As shown in fig. 2, in order to solve the above problem, a conventional solution is to perform card control (power off) of AVDD _ EN and card control of a power-on current to the display panel after crimping the connector. However, both of these card control procedures make a decision in the case where the IC has been powered up. At this time, the virtual connection or the misconnection may already cause the abnormality of the large current, and the card control can only reduce the influence of the abnormality. Powering up in such an abnormal state may also cause damage to the poorly protected IC, eventually resulting in burn and burn-in.
Fig. 3 is a flowchart of a lighting test performed on a display panel according to another embodiment of the disclosure. As shown in fig. 3, in this embodiment, after the display panel is crimped with the two connectors of the lighting detection device, and before the lighting detection device is powered on, the connectors are subjected to the alignment test. If the two connectors are determined to be aligned correctly, the lighting detection equipment can normally power on the display panel. If the two connectors are determined to be misaligned, the two connectors are reconnected until the alignment is correct. After subsequent power-on, the card control (power off) of AVDD _ EN and the card control of power-on current can still be carried out, thereby avoiding the burn and screen burn of the display panel and improving the yield of products.
Fig. 4 is a schematic view of a connector assembly according to an embodiment of the disclosure.
As shown in fig. 4, embodiments of the present disclosure provide a connector assembly including a first connector 410 and a second connector 420. Both connectors in fig. 4 are provided with alignment detection pins arranged in alignment and signal lines connecting part of the alignment detection pins. As shown in fig. 5, the connector is a connector not provided with alignment detection pins. As shown in fig. 6, the connector is provided with alignment detection pins and signal lines connecting the alignment detection pins. Ground pins may also be provided on one or both sides of the alignment detection pins of the connector in some embodiments. The pins of the connectors of the above examples are both two columns, which is merely an example and does not mean that all of the connectors are provided as two columns of pins. In the case of a connector with fewer pins, it may be a row of pins arranged side by side in parallel. In the case of a connector with a large number of pins, the number of pins may be two or three, and each of the two or three pins may be arranged in parallel with each other.
The connector assembly provided by the embodiment of the present disclosure will be described below with reference to fig. 4. The connector assembly includes a first connector 410 and a second connector 420.
A first connector 410, comprising: the first signal connection pins and the first alignment detection pins are arranged in parallel side by side. They may be arranged in one or two or three columns, etc. Each column of pins includes a plurality of first signal connection pins and a plurality of first alignment detection pins. Taking fig. 4 as an example, it includes two columns of pins. In each column of pins, a plurality of first alignment detection pins are arranged in parallel with the first signal connection pins in the column. In the first connector 410, only some of the first alignment detection pins are connected with signal lines therebetween, and the other part of the second alignment detection pins are not connected with signal lines therebetween. For example, in fig. 4, a signal is connected between the first pair of bit detection pins TPIN 1 and TPIN 2, and a signal line is not connected between TPIN 1 and TPIN 3.
The pins of the second connector 420 are aligned with the pins of the first connector 410. The second connector 420 includes a plurality of second signal connection pins and a plurality of second alignment detection pins arranged in parallel side by side. Each second signal connection pin is arranged in alignment with a corresponding first signal connection pin in the first connector 410; each second alignment detection pin is aligned with a corresponding first alignment detection pin in the first connector 410. And signal lines are connected between one part of the second alignment detection pins, and signal lines are not connected between the other part of the second alignment detection pins. For example, in FIG. 4, no signal is connected between the second pair of position detect pins TPIN 1-1 and TPIN 2-1, and a signal line is connected between TPIN 2-1 and TPIN 3-1. The first alignment detection pin TPIN 1 and the second alignment detection pin TPIN 1-1 are disposed in an alignment manner. The first alignment detection pin TPIN 2 and the second alignment detection pin TPIN 2-1 are disposed in alignment. The first alignment detection pin TPIN 3 and the second alignment detection pin TPIN 3-1 are arranged in alignment. Other alignment detection pins for alignment are also arranged in the alignment way, and so on.
The two first alignment detection pins connected with the signal lines in the first connector 410 are aligned between the two second alignment detection pins in the second connector 420, and the two second alignment detection pins connected with the signal lines in the second connector 420 are aligned between the two first alignment detection pins in the first connector 410. For example, in FIG. 4, a signal is connected between the first pair of bit detection pins TPIN 1 and TPIN 2, and a signal is not connected between the second pair of bit detection pins TPIN 1-1 and TPIN 2-1. A signal line is connected between the second pair of test pins TPIN 2-1 and TPIN 4-1, while no signal line is connected between the first pair of test pins TPIN 2 and TPIN 4.
The connections between the alignment detection pins and the signal lines in fig. 4 are only examples, and more or fewer alignment detection pins may be provided. The wiring rules in fig. 4 are included within the scope of the embodiments of the present disclosure as long as they meet the requirements of the examples of the present disclosure.
As shown in fig. 7 and 8, when the first connector 410 and the second connector 420 are crimped and aligned correctly, the first alignment detection pin and the second alignment detection pin of each pair of crimps are used as a node, and the nodes form a serial path through the connection of signal lines.
In this example, since the alignment detection pins are arranged as described above, when the first connector 410 is crimped with the second connector 420 and the alignment is correct, the first alignment detection pin and the second alignment detection pin of each pair of crimps are used as a node, the nodes form a serial path through the connection of signal lines, the alignment signal is input to the starting point of the serial path, i.e., the alignment signal can be received from each node, thereby proving that the two connectors are aligned correctly. If a pair of bit signals is input to the start point or other node in the series path, but if a node does not receive the signals, a virtual or misconnected pin is identified, requiring the two connectors to be reconnected.
In the above example, the first signal connection pins in the first connector 410 and the second signal connection pins in the second connector 420 are arranged in a one-to-one alignment. As shown in fig. 5, the signal connection pins include various signal pins such as ELVDD signals, MIPI signals, and the like. Illustratively, the SPIN1 pin of the first connector 410 and the SPIN1-1 pin of the second connector 420 in fig. 4 are aligned, and when the two connectors are connected and aligned correctly, the SPIN1 pin and the SPIN1-1 pin are attached and connected.
For example, the wiring pattern of the signal lines between the respective alignment detection pins in the first connector 410 may be interchanged with the wiring pattern of the signal lines between the respective alignment detection pins in the second connector 420.
Illustratively, as shown in fig. 4, the wiring pattern in the first connector 410 may be:
a signal line is connected between the pin TPIN 1 and the pin TPIN 2, a signal line is connected between the pin TPIN 3 and the pin TPIN4, a signal line is connected between the pin TPIN 5 and the pin TPIN 6, and no signal line is connected between other pairwise combined pins in the 6 pins.
The wiring pattern of the second connector 420 may be:
a signal line is connected between the pin TPIN 2-1 and the pin TPIN 4-1, a signal line is connected between the pin TPIN 3-1 and the pin TPIN 5-1, and no signal line is connected between other pairwise combined pins of the 6 alignment detection pins in the second connector 420.
In some possible implementations, at least one side of at least one first alignment detection pin in the first connector 410 is provided with a first ground pin, and the first ground pin and the first alignment detection pin are arranged in parallel side by side. The second connector 420 has a second ground pin aligned with the first ground pin.
Illustratively, as shown in fig. 4, one side of each of the pins TPIN 1, TPIN 2, and TPIN 3 is provided with a ground pin, and the other side of each of the pins TPIN4 is provided with a ground pin. Since each pin in the first connector 410 is arranged in alignment with a corresponding pin in the second connector 420, the pin in the second connector 420 where the pin of the above example is aligned is also provided with a ground pin. For example, one side of each of pins TPIN 1-1, TPIN 2-1, and TPIN 3-1 is provided with a ground pin, and both sides of pin TPIN 4-1 are provided with ground pins.
In this example, by providing the ground pins on one or both sides of the alignment detection pin, when the alignment detection pin is misaligned and butted, the alignment detection pin is connected to the ground pin beside the alignment detection pin, and a short circuit occurs. When a counterpoint signal is input to one counterpoint detection pin and the other counterpoint detection pins cannot detect the signal, a short circuit occurs, namely, misconnection occurs. Thereby improving the detection efficiency of the misconnection pins.
In some possible implementations, the width of the first alignment detection pin is smaller than the width of the first signal connection pin, and the width of the second alignment detection pin is smaller than the width of the second signal connection pin.
In this example, since the width of the alignment detection pin is smaller than that of the signal connection pin, the detection efficiency of the alignment test can be improved.
In some possible implementations, the second alignment detection pin corresponding to the start node in the serial path serves as an alignment signal input terminal, and the second alignment detection pin corresponding to the end node in the serial path serves as an alignment signal detection terminal.
For example, as shown in FIG. 4, assuming that the second connector 420 is a connector of the detection device, in the second connector 420, the alignment signal input terminal is pin TPIN 1-1 and the alignment signal detection terminal is pin TPIN 6-1. Assuming that the first connector 410 is a connector of a detection device, in the first connector 410, the alignment signal input terminal is a pin TPIN 1, and the alignment signal detection terminal is a pin TPIN 6.
In some possible implementations, at least one first signal connection pin is spaced between two adjacent first alignment detection pins. One or more signal connection pins can be arranged between two alignment detection pins adjacent in parallel at intervals.
In the above example, the first connector 410 is a connector of the display panel, and the second connector 420 is a connector of the inspection apparatus. The two connectors may be interchanged, for example, the first connector 410 is a connector of a detection device, and the second connector 420 is a connector of a display panel.
The following description of the embodiment is made by taking the second connector 420 as a connector of the detection device, by way of example only:
the embodiment of the present disclosure provides a display panel, which includes a first connector 410 in the connection assembly of any embodiment of the present disclosure.
The embodiment of the present disclosure provides a detection device, which includes the second connector 420 in the connection assembly according to any embodiment of the present disclosure.
In some possible implementations, the detection device further includes:
and the alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector. The alignment signal input end is a second alignment detection pin corresponding to a starting point node in the series circuit, and the alignment signal detection end is a second alignment detection pin corresponding to a termination node in the series circuit.
In this example, two connectors are mated to enable connection of the detection device to the display panel. Before power-on, a bit alignment signal is input to the starting node, and whether the bit alignment signal is received or not is detected at the termination node to detect whether the connection of the two connectors is correct or not. If the termination node detects the pair of signals, the connection of the two connectors is determined to be correct for the pair. If the alignment signal is not detected by the termination node, the connection of the two connectors is determined to be an alignment error. The alignment error comprises a pin misconnection and a pin virtual connection.
In some possible implementations, the detection device further includes:
and the test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector 420.
In this example, after determining that the connections of the two connectors are aligned correctly, the test circuit may input a power-on signal to the display panel to detect various functions of the display panel.
Fig. 9 is a flowchart of an alignment detection method according to an embodiment of the disclosure.
As shown in fig. 9, an alignment test method provided in an embodiment of the present disclosure is applied to a detection device provided in any embodiment of the present disclosure, where a second connector in the detection device is connected to a first connector in a display panel provided in any embodiment of the present disclosure, and the test method includes:
s910, before inputting a signal to a second signal connection pin in a second connector, providing a counterpoint signal to any second counterpoint detection pin in the second connector, and detecting whether the counterpoint signal exists in other second counterpoint detection pins in the second connector;
s920, under the condition that the alignment signals are detected in all the other second alignment detection pins, a first alignment detection result is generated, where the first alignment detection result is used to indicate that the first connector and the second connector are aligned correctly.
In this example, after the first connector and the second connector are connected, each second alignment detection pin in the second connector forms a series circuit, if an alignment signal is input to a certain node in the series circuit, if the series circuit is open, the alignment signal can be detected by all other nodes in the series circuit, and if the series circuit is short-circuited or open, the alignment signal cannot be detected by all other nodes in the series circuit. Therefore, under the condition that other nodes in the series circuit can detect the alignment signals, the series circuit is determined to be an open circuit, the alignment of each pin is correct, and a first alignment detection result is generated to indicate the correct alignment, so that whether the power-on test is carried out or not can be conveniently determined in the subsequent process.
In some possible implementations, the alignment testing method further includes:
and generating a second alignment detection result under the condition that the second alignment detection pin does not detect the alignment signal in other second alignment detection pins, wherein the second alignment detection result is used for indicating that the first connector and the second connector are not aligned correctly.
In this example, when the alignment signal is detected at any other node in the series circuit, it is determined whether the series circuit is open (pin virtual connection exists) or short (pin misalignment exists), and a second alignment detection result is generated to indicate an alignment error, which facilitates a subsequent determination of whether to power on the test.
In some possible implementations, the second alignment detection result includes an identification of the second alignment detection pin where the alignment signal was not detected.
In this example, the detection result indicates which of the marks of the second alignment detection pins of the undetected alignment signal is, so that a tester can conveniently determine which part of the pins has alignment errors, and the efficiency of subsequent alignment is improved.
Fig. 10 is a flowchart of a registration detection method according to an embodiment of the disclosure.
As shown in fig. 10, an alignment test method is provided in the embodiment of the present disclosure, and is applied to the detection device in any embodiment of the present disclosure, and the second connector in the detection device is provided with the alignment signal input terminal and the alignment signal detection terminal. The second connector in the detection device is connected with the first connector in the display panel provided by any embodiment of the disclosure. The test method comprises the following steps:
s110, before inputting a signal to a second signal connection pin in the second connector, providing a counterpoint signal to a counterpoint signal input terminal in the second connector, and detecting whether a counterpoint signal exists at a counterpoint signal detection terminal in the second connector;
and S120, generating a first alignment detection result under the condition that the alignment signal detection end is detected to have the alignment signal, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
In this example, the alignment signal is input only to the start point of the serial circuit, and whether the alignment signal is received is detected at the end point of the serial circuit, so that whether the two connectors are aligned correctly can be quickly determined, and the alignment detection efficiency can be improved.
In some possible implementations, the alignment testing method further includes:
and generating a second alignment detection result under the condition that the alignment signal at the alignment signal detection end cannot be detected, wherein the second alignment detection result is used for indicating the alignment error of the first connector and the second connector.
In some possible implementations, the alignment signal in the alignment test method is a direct current signal.
In some possible implementations, the alignment signal in the alignment test method is an ac signal.
The form of the above-mentioned alignment signal is merely an example, and other types of signals, for example, a pulse signal, etc., may be used as the alignment signal.
The embodiment of the disclosure also provides an electronic device including the display panel of any one of the embodiments of the disclosure. The electronic equipment can be any product or part with a display function, such as a mobile phone, a tablet computer, a television, a display, a notebook computer, a digital camera, a navigator and the like.
In the present disclosure, the terms "first", "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present disclosure, "a plurality" means two or more unless specifically limited otherwise.
In the present disclosure, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integral; the connection can be mechanical connection, electrical connection or communication; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present disclosure can be understood as a specific case by a person of ordinary skill in the art.
In the present disclosure, unless expressly stated or limited otherwise, the recitation of a first feature "on" or "under" a second feature may include the recitation of the first and second features being in direct contact, and may also include the recitation that the first and second features are not in direct contact, but are in contact via another feature between them. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. The first feature being "under," "beneath," and "under" the second feature includes the first feature being directly above and obliquely above the second feature, or simply meaning that the first feature is at a lesser level than the second feature.
The above disclosure provides many different embodiments, or examples, for implementing different features of the disclosure. Specific example components and arrangements are described above to simplify the present disclosure. Of course, they are merely examples and are not intended to limit the present disclosure. Moreover, the present disclosure may repeat reference numerals and/or reference letters in the various examples, which have been repeated for purposes of simplicity and clarity and do not in themselves dictate a relationship between the various embodiments and/or arrangements discussed.
While the present disclosure has been described with reference to specific embodiments, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the disclosure. Therefore, the protection scope of the present disclosure shall be subject to the protection scope of the claims.

Claims (15)

1. A connector assembly, comprising:
a first connector comprising:
a plurality of first signal connection pins arranged in parallel side by side; and
a plurality of first alignment detection pins arranged in parallel with the first signal connection pins, and a signal line connected between a part of the first alignment detection pins;
a second connector comprising:
the second signal connecting pins are arranged in parallel side by side and are arranged in an alignment mode with the first signal connecting pins; and
the second alignment detection pins are arranged in alignment with the first alignment detection pins, and signal lines are connected between part of the second alignment detection pins;
the first connector is provided with two first alignment detection pins connected with signal lines, and the second connector is provided with two second alignment detection pins connected with signal lines;
and under the condition that the first connector and the second connector are in press connection and are in correct alignment, the first alignment detection pin and the second alignment detection pin of each pair of press connection are used as a node, and the nodes form a serial circuit through the connection of the signal wires.
2. The connector assembly of claim 1, wherein at least one side of at least one first alignment detection pin in the first connector is provided with a first ground pin, the first ground pin and the first alignment detection pin being arranged side-by-side in parallel;
the second connector is provided with a second ground pin aligned with the first ground pin.
3. The connector assembly of claim 1, wherein the first alignment detection pin has a width less than a width of the first signal connection pin, and the second alignment detection pin has a width less than a width of the second signal connection pin.
4. The connector assembly according to any one of claims 1 to 3, wherein the second alignment detection pin corresponding to the start node in the serial path serves as an alignment signal input terminal, and the second alignment detection pin corresponding to the end node in the serial path serves as an alignment signal detection terminal.
5. The connector assembly according to any one of claims 1 to 4, wherein at least one of the first signal connection pins is spaced between two adjacent first alignment detection pins.
6. A display panel comprising a first connector of the connection assembly of any one of claims 1 to 5.
7. A test device comprising a second connector of the connection assembly of any one of claims 1 to 5.
8. The apparatus of claim 7, further comprising:
the alignment circuit is provided with a signal output end and a signal receiving end, the signal output end is connected with an alignment signal input end in the second connector, and the signal receiving end is connected with an alignment signal detection end in the second connector;
the alignment signal input end is a second alignment detection pin corresponding to a start node in the series circuit, and the alignment signal detection end is a second alignment detection pin corresponding to a stop node in the series circuit.
9. The apparatus of claim 7 or 8, further comprising:
and the test circuit is provided with a plurality of signal test ends, and the signal test ends are connected with the second signal connection pins in the second connector.
10. An alignment testing method applied to the testing apparatus of any one of claims 7 to 9, wherein the second connector of the testing apparatus is connected to the first connector of the display panel of claim 6, the testing method comprising:
before inputting a signal to a second signal connection pin in the second connector, providing a counterpoint signal to any second counterpoint detection pin in the second connector, and detecting whether the counterpoint signal exists in other second counterpoint detection pins in the second connector;
and generating a first alignment detection result under the condition that the alignment signals are detected in the other second alignment detection pins, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
11. The method of claim 10, further comprising:
and generating a second alignment detection result under the condition that the alignment signal cannot be detected in a second alignment detection pin in the other second alignment detection pins, wherein the second alignment detection result is used for indicating that the first connector and the second connector are in alignment error.
12. The method of claim 11, wherein the second alignment detection result comprises an identification of a second alignment detection pin at which the alignment signal was not detected.
13. An alignment testing method applied to the inspection apparatus of claim 8, wherein the second connector of the inspection apparatus is connected to the first connector of the display panel of claim 6, the testing method comprising:
before inputting a signal to a second signal connection pin in the second connector, providing a counterpoint signal to a counterpoint signal input end in the second connector, and detecting whether the counterpoint signal exists or not aiming at a counterpoint signal detection end in the second connector;
and generating a first alignment detection result under the condition that the alignment signal is detected to exist at the alignment signal detection end, wherein the first alignment detection result is used for indicating that the first connector and the second connector are aligned correctly.
14. The method of claim 13, further comprising:
and generating a second alignment detection result under the condition that the alignment signal at the alignment signal detection end cannot be detected, wherein the second alignment detection result is used for indicating that the first connector and the second connector are in alignment error.
15. The method of any one of claims 10 to 14, wherein the alignment signal is a dc signal.
CN202210999915.2A 2022-08-19 2022-08-19 Connector assembly, display panel, detection equipment and alignment test method Active CN115395312B (en)

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US20070004270A1 (en) * 2005-06-29 2007-01-04 Young-Chan Kim Display apparatus to detect a connecting state of a cable
US20160341781A1 (en) * 2015-05-19 2016-11-24 Boe Technology Group Co., Ltd. Printed circuit board and detection method for detecting connection between printed circuit board and flexible circuit board, and display panel
CN110261717A (en) * 2019-07-15 2019-09-20 立讯精密工业（滁州）有限公司 A kind of connector assembly test circuit and its test method
US20190311663A1 (en) * 2017-11-01 2019-10-10 Ordos Yuansheng Optoelectronics Co., Ltd. Substrate, panel, detection device and alignment detection method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070004270A1 (en) * 2005-06-29 2007-01-04 Young-Chan Kim Display apparatus to detect a connecting state of a cable
US20160341781A1 (en) * 2015-05-19 2016-11-24 Boe Technology Group Co., Ltd. Printed circuit board and detection method for detecting connection between printed circuit board and flexible circuit board, and display panel
US20190311663A1 (en) * 2017-11-01 2019-10-10 Ordos Yuansheng Optoelectronics Co., Ltd. Substrate, panel, detection device and alignment detection method
CN110261717A (en) * 2019-07-15 2019-09-20 立讯精密工业（滁州）有限公司 A kind of connector assembly test circuit and its test method

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