CN115356673A - Calibration method and correction method for device dispersion - Google Patents
Calibration method and correction method for device dispersion Download PDFInfo
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- CN115356673A CN115356673A CN202211082120.1A CN202211082120A CN115356673A CN 115356673 A CN115356673 A CN 115356673A CN 202211082120 A CN202211082120 A CN 202211082120A CN 115356673 A CN115356673 A CN 115356673A
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Abstract
The invention discloses a calibration method and a correction method of device dispersion difference, wherein the calibration method of the device dispersion difference comprises the following steps: testing the voltage deviation of the part to be tested, and acquiring a voltage deviation test result of the part to be tested; and judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested, if so, generating an identification code according to the voltage deviation test result, and marking the identification code at a preset position of the part to be tested. The calibration method of the dispersion of the device of the invention determines the gain coefficients of different circuit boards by adopting a standard voltage source test method, and solidifies the gain coefficients in a memory of software, so that the requirement on the deviation between a theoretical design value and an actual manufacturing value can be reduced, and the same or higher sampling precision can be realized without spending a large amount of cost to improve the precision of the device, thereby reducing the production cost of the whole circuit board.
Description
Technical Field
The invention relates to the field of device deviation testing, in particular to a calibration method of device dispersion and a correction method of the device dispersion.
Background
When a new energy automobile is controlled by a power motor, bus voltage needs to be acquired and fed back to a control system for vector control, and three circuits, namely a divider resistor, an isolator and an operational amplifier, are mainly involved in the whole bus voltage acquisition process; the divider resistor has the problem of resistance precision, each resistance value manufactured in actual production has certain deviation with the resistance value analyzed by a circuit principle, the isolation device has the problem of precision, the relation between input and output has certain deviation, and the same operational amplifier also has the problems of input offset, null shift, amplification factor drift and the like. The combination of the three results in a voltage division ratio of the whole circuit, and the theoretical and practical deviations exist, and in order to reduce the deviation of the part, the above devices all need to select products with higher precision, but the high-precision devices are generally expensive, and thus the high cost is required. However, once the electronic device is mounted on the circuit board, the resistance value is changed to a predetermined value, and the deviation of the mounted circuit board is determined.
Disclosure of Invention
The present invention is directed to a method for calibrating device dispersion and a method for correcting device dispersion, so as to solve at least one of the above technical problems.
The invention provides the following scheme:
according to an aspect of the present invention, there is provided a method for calibrating device dispersion, the method comprising:
testing the voltage deviation of the part to be tested, and acquiring a voltage deviation test result of the part to be tested;
judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested, if so, judging that the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested
And generating an identification code according to the voltage deviation test result, and marking the identification code at a preset position of the part to be tested.
Optionally, before testing the voltage deviation of the component to be tested, testing the resistance deviation of the component to be tested is further included;
the testing the resistance deviation of the part to be tested comprises:
determining the resistance value of a preset test point of a part to be tested;
judging whether the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested, if so, judging that the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested, and if so, judging that the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested
And testing the voltage deviation of the part to be tested.
Optionally, the part to be tested comprises a drive board;
and if the resistance value of the part to be tested exceeds the preset resistance deviation range of the part to be tested, determining that the data of the drive board of the part to be tested is abnormal, and throwing out the drive board of the part to be tested.
Optionally, the testing the voltage deviation of the part to be tested comprises:
injecting standard voltage into a preset first test position of a part to be tested;
acquiring a feedback voltage of a preset second test position of the part to be tested after the standard voltage is injected;
and judging whether the feedback voltage of the part to be tested meets the requirement of voltage limit deviation, and if so, acquiring a proportionality coefficient of the feedback voltage of the part to be tested and the standard voltage.
Optionally, if the feedback voltage of the to-be-tested part does not meet the voltage limit deviation requirement, considering that the data of the drive board of the to-be-tested part is abnormal, and throwing out the drive board of the to-be-tested part.
Optionally, the generating the identification code according to the voltage deviation test result includes:
generating an identification code according to a proportional coefficient of the feedback voltage and the standard voltage of the part to be tested;
and marking the identification code at a preset position of a driving plate of the part to be tested.
Optionally, when the driving plate identification code of the part to be tested is scanned, a proportionality coefficient of the feedback voltage and the standard voltage of the part to be tested can be obtained.
The application also provides a method for correcting device dispersion, which comprises the following steps:
scanning an identification code of a part to be tested;
and uploading the data acquired after scanning the identification code of the part to be tested to a tracing system.
Optionally, the scanning the identification code of the to-be-tested part comprises scanning a drive board identification code and a scanning control board identification code;
the step of uploading the data acquired after scanning the identification code of the part to be tested to the tracing system comprises the following steps:
binding the driving plate identification code of the part to be tested with the control plate identification code of the part to be tested;
and storing the binding relation data of the drive board of the part to be tested and the control board of the part to be tested to a tracing system.
Optionally, the method for correcting device dispersion further includes:
acquiring a proportional coefficient of a feedback voltage and a standard voltage of a to-be-tested part obtained after scanning a drive plate identification code;
and storing the proportionality coefficient of the feedback voltage of the part to be tested and the standard voltage into a control board memory.
Compared with the prior art, the invention has the following advantages:
the invention determines the gain coefficients of different circuit boards by adopting a standard voltage source test method, generates identification codes for the gain coefficients to be marked on the circuit boards, obtains the gain coefficients of the circuit boards after scanning the identification codes and solidifies the gain coefficients in a memory of software, and can reduce the requirement on the deviation between a theoretical design value and an actual manufacturing value by determining the voltage deviation of each circuit board, thereby realizing the same or higher sampling precision without spending a large amount of cost to improve the precision of devices and further reducing the production cost of the whole circuit board; and the mode of recording the circuit board data by adopting the identification code can not only mark the gain coefficient of the circuit board, but also expand more data marks and provide data support for tracing products in the later period.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic flow chart of a calibration method of device variation according to an embodiment of the present invention;
FIG. 2 is a schematic flow chart of a method for calibrating device variation according to another embodiment of the present invention;
FIG. 3 is a system diagram of an isolated sampling circuit to be tested calibrated using the calibration method for device variation of the present invention;
FIG. 4 is a flowchart illustrating a method for correcting device variation according to an embodiment of the present invention;
fig. 5 is a block diagram of an electronic device implementing the present invention.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is to be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 1 is a schematic flow chart of a calibration method for device variation according to an embodiment of the present application.
The calibration method of the device dispersion as shown in fig. 1 comprises the following steps:
step 1: testing the voltage deviation of the part to be tested, and acquiring a voltage deviation test result of the part to be tested;
and 2, step: judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested, if so, judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested, and if so, judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested
And step 3: and generating an identification code according to the voltage deviation test result, and marking the identification code at a preset position of the part to be tested.
Compared with the prior art, the invention has the following advantages:
the invention determines the gain coefficients of different circuit boards by adopting a standard voltage source test method, generates identification codes for the gain coefficients to be marked on the circuit boards, obtains the gain coefficients of the circuit boards after scanning the identification codes and solidifies the gain coefficients in a memory of software, and can reduce the requirement on the deviation between a theoretical design value and an actual manufacturing value by determining the voltage deviation of each circuit board, thereby realizing the same or higher sampling precision without spending a large amount of cost to improve the precision of devices and further reducing the production cost of the whole circuit board; and the mode of recording the circuit board data by adopting the identification code can not only mark the gain coefficient of the circuit board, but also expand more data marks and provide data support for the product tracing in the later period.
In this embodiment, before testing the voltage deviation of the part to be tested, testing the resistance deviation of the part to be tested is also included;
testing the part under test for resistance deviation comprises:
determining the resistance value of a preset test point of a part to be tested;
judging whether the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested, if so, judging that the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested, and if so, judging that the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested
And testing the voltage deviation of the part to be tested.
In the present embodiment, the part to be tested includes a driving board;
and if the resistance value of the part to be tested exceeds the preset deviation range of the resistance of the part to be tested, determining that the data of the drive board of the part to be tested is abnormal, and throwing out the drive board of the part to be tested.
In the present embodiment, testing the voltage deviation of the part to be tested includes:
injecting standard voltage into a preset first test position of a part to be tested;
acquiring feedback voltage of a preset second test position of the part to be tested after standard voltage injection;
judging whether the feedback voltage of the part to be tested meets the requirement of voltage limit deviation, if so, judging that the feedback voltage meets the requirement of voltage limit deviation
And acquiring a proportionality coefficient of the feedback voltage and the standard voltage of the part to be tested.
In this embodiment, if the feedback voltage of the to-be-tested component does not satisfy the voltage limit deviation requirement, it is considered that the data of the drive board of the to-be-tested component is abnormal, and the drive board of the to-be-tested component is ejected.
In this embodiment, generating the identification code according to the voltage deviation test result includes:
generating an identification code according to a proportionality coefficient of the feedback voltage and the standard voltage of the part to be tested;
and marking the identification code at a preset position of the driving plate of the part to be tested.
In the embodiment, when the driving plate identification code of the to-be-tested part is scanned, the proportionality coefficient of the feedback voltage and the standard voltage of the to-be-tested part can be obtained.
Referring to fig. 2, fig. 2 is a schematic flow chart of a device variation calibration method according to another embodiment of the present invention;
the calibration method of the device dispersion as shown in fig. 2 comprises the following steps:
s00: mounting a drive plate on a test needle bed;
s01: testing whether the resistance at two ends of the test point is within the limit deviation, if so, turning to S02, and if not, turning to S05;
s02: injecting a standard power supply voltage into the circuit board through a first test point;
s03: measuring a feedback voltage through a second test point, judging whether the requirement of limit deviation is met, and if so, turning to S04;
s04: a proportionality coefficient of the feedback voltage and the input voltage is engraved on a driving plate in a two-dimensional code mode;
s05: if the resistance value is out of limit, the quality of the drive plate is considered to be unqualified, and the drive plate is thrown out;
s06: and if the feedback voltage value exceeds the limit, the quality of the drive plate is considered to be unqualified, and the drive plate is thrown out.
The present application is described in further detail below by way of examples, it being understood that the examples do not constitute any limitation to the present application.
Referring to fig. 3, fig. 3 is an isolated sampling circuit to be tested.
As shown in fig. 3, R1, R2, R3, and R4 together form a voltage division sampling circuit, the sampled voltage is coupled from the high voltage side to the low voltage side through an isolation device, and the sampled voltage is amplified by a differential amplifier and sent to a test device;
the whole circuit comprises a test point 1, a test point 2, a test point 3 and a test point 4, wherein the test point 1 and the test point 2 are a resistance test point and a standard voltage injection point, and the test point 3 and the test point 4 are test points for measuring feedback voltage;
the circuit board tests the resistance values of the test point 1 and the test point 2, judges whether the resistance values are in the limit deviation range, if not,
the quality of the driving plate is considered to be unqualified, and the driving plate is thrown out;
if yes, closing S1 and S2;
the standard power supply voltage is injected into the circuit board through the test point 1 and the test point 2, reaches the test equipment through the isolation device and the differential amplifier, and the feedback voltage is measured at the test point 3 and the test point 4 on two sides of the test equipment;
judging whether the feedback voltage meets the requirement of limit deviation or not, if not,
the quality of the drive plate is considered to be unqualified, and the drive plate is thrown out;
if so, then
And acquiring a proportionality coefficient of the feedback voltage and the input standard power supply voltage.
Because the R1 to R8, the isolation devices and the differential amplifier have dispersion differences, the accumulation of the dispersion differences can cause that the proportionality coefficient of the whole loop has certain deviation, in a high-precision control system, the precision of the devices is required to be improved to reduce the deviation, the selection of the high-precision devices can directly cause the rise of the cost, the gain coefficients of different circuit boards are determined by adopting a standard voltage source test method, the gain coefficients are generated into identification codes to be marked on the circuit boards, the gain coefficients of the circuit boards are obtained after the identification codes are scanned and are solidified in a memory of software, the deviation requirement between a theoretical design value and an actual manufacturing value can be reduced by determining the voltage deviation of each circuit board, the precision of the devices is not required to be increased by spending a large amount of cost, the same or higher sampling precision can be realized, and the production cost of the whole circuit board is reduced.
Referring to fig. 4, fig. 4 is a schematic flow chart illustrating a method for correcting device variation according to an embodiment of the present invention;
the method for correcting the device dispersion as shown in fig. 4 includes:
scanning an identification code of a part to be tested;
and uploading the data acquired after scanning the identification code of the part to be tested to a tracing system.
In the embodiment, the scanning of the identification code of the to-be-tested part comprises scanning a drive board identification code and a scanning control board identification code;
the method for uploading the data acquired after scanning the identification code of the part to be tested to the tracing system comprises the following steps:
binding a driving plate identification code of a part to be tested with a control plate identification code of the part to be tested;
and storing the binding relation data of the drive board of the part to be tested and the control board of the part to be tested to a tracing system.
In this embodiment, the method for correcting device dispersion further includes:
obtaining a proportional coefficient of a feedback voltage and a standard voltage of the part to be tested, which is obtained after scanning the identification code of the driving plate;
and storing the proportionality coefficient of the feedback voltage of the part to be tested and the standard voltage into a control board memory.
Specifically, when the control board is subjected to offline detection, the scanner scans the identification code of the driving board to obtain the proportionality coefficient of the feedback voltage and the standard voltage, the proportionality coefficient is written into a control board memory for solidification, at the moment, the two circuit boards are paired, and the proportionality coefficient in the software is in one-to-one correspondence with the actual proportionality coefficient of the hardware;
when the software runs, firstly reading the data from the memory to the memory, and then taking the data as a proportionality coefficient to run a program;
the proportion coefficient is not directly written in a program for solidification when the program is written, the device model selection and the program design are decoupled through the calibration compensation mode, and the overall cost is reduced.
The specific implementation mode is as follows:
scanning the unique identification code of the control panel;
scanning the unique identification code of the drive board;
binding the control board and the drive board through the identification code;
storing the binding relationship between the control board and the drive board to a cloud database;
writing gain coefficients of the feedback voltage and the standard voltage acquired after scanning the identification code on the driving plate into a memory of the control plate through a testing needle bed;
the whole test system mainly comprises a standard power supply, test equipment, scanning equipment and cloud storage equipment;
the scanning device is used for scanning identification codes on the drive plate and the control plate, the testing needle bed is used for calibrating and writing data, and the cloud database is used for recording data so as to control the binding relation between the data and the drive plate and provide data support for product tracing in the later period.
Referring to fig. 5, the present application further provides an electronic device comprising: the system comprises a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory complete mutual communication through the communication bus; the memory has stored therein a computer program which, when executed by the processor, causes the processor to carry out the steps described above.
The present application also provides a computer-readable storage medium storing a computer program executable by an electronic device, which, when run on the electronic device, causes the electronic device to perform the steps of the above-mentioned method.
The communication bus mentioned in the electronic device may be a Peripheral Component Interconnect (PCI) bus, an Extended Industry Standard Architecture (EISA) bus, or the like. The communication bus may be divided into an address bus, a data bus, a control bus, etc. For ease of illustration, only one thick line is shown, but this is not intended to represent only one bus or type of bus.
The electronic device includes a hardware layer, an operating system layer running on top of the hardware layer, and an application layer running on top of the operating system. The hardware layer includes hardware such as a Central Processing Unit (CPU), a Memory Management Unit (MMU), and a Memory. The operating system may be any one or more computer operating systems that implement control of an electronic device through a Process (Process), such as a Linux operating system, a Unix operating system, an Android operating system, an iOS operating system, or a windows operating system. In the embodiment of the present invention, the electronic device may be a handheld device such as a smart phone and a tablet computer, or an electronic device such as a desktop computer and a portable computer, which is not particularly limited in the embodiment of the present invention.
The execution main body of the electronic device control in the embodiment of the present invention may be an electronic device, or a functional module capable of calling a program and executing the program in the electronic device. The electronic device may obtain the firmware corresponding to the storage medium, the firmware corresponding to the storage medium is provided by a vendor, and the firmware corresponding to different storage media may be the same or different, which is not limited herein. After the electronic device acquires the firmware corresponding to the storage medium, the firmware corresponding to the storage medium may be written into the storage medium, specifically, the firmware corresponding to the storage medium is burned into the storage medium. The process of burning the firmware into the storage medium can be realized by adopting the prior art, and details are not described in the embodiment of the present invention.
The electronic device may further acquire a reset command corresponding to the storage medium, where the reset command corresponding to the storage medium is provided by a vendor, and the reset commands corresponding to different storage media may be the same or different, and are not limited herein.
At this time, the storage medium of the electronic device is a storage medium in which the corresponding firmware is written, and the electronic device may respond to the reset command corresponding to the storage medium in which the corresponding firmware is written, so that the electronic device resets the storage medium in which the corresponding firmware is written according to the reset command corresponding to the storage medium. The process of resetting the storage medium according to the reset command can be implemented by the prior art, and is not described in detail in the embodiment of the present invention.
For convenience of description, the above devices are described as being divided into various units and modules by functions, respectively. Of course, the functions of the units and modules may be implemented in one or more software and/or hardware when the present application is implemented.
It will be understood by those skilled in the art that, unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. It will be further understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the prior art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.
For simplicity of explanation, the method embodiments are described as a series of acts or combinations, but those skilled in the art will appreciate that the embodiments are not limited by the order of acts described, as some steps may occur in other orders or concurrently with other steps in accordance with the embodiments of the invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
From the above description of the embodiments, it is clear to those skilled in the art that the present application can be implemented by software plus necessary general hardware platform. Based on such understanding, the technical solutions of the present application may be essentially or partially implemented in the form of a software product, which may be stored in a storage medium, such as a ROM/RAM, a magnetic disk, an optical disk, etc., and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A calibration method for device dispersion is characterized by comprising the following steps:
testing the voltage deviation of the part to be tested, and acquiring a voltage deviation test result of the part to be tested;
judging whether the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested, if so, judging that the voltage deviation test result of the part to be tested meets the voltage limit deviation requirement of the part to be tested
And generating an identification code according to the voltage deviation test result, and marking the identification code at a preset position of the part to be tested.
2. The method for calibrating device dispersion according to claim 1, wherein the step of testing the voltage deviation of the component to be tested further comprises testing the resistance deviation of the component to be tested;
the testing the resistance deviation of the part to be tested comprises the following steps:
determining the resistance value of a preset test point of a part to be tested;
judging whether the resistance value of the part to be tested is within a preset deviation range of the resistance of the part to be tested, if so, judging whether the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested, and if not, judging whether the resistance value of the part to be tested is within the preset deviation range of the resistance of the part to be tested or not
And testing the voltage deviation of the part to be tested.
3. The method for calibrating device variation according to claim 2, wherein the part to be tested comprises a driving board;
and if the resistance value of the to-be-tested part exceeds the preset deviation range of the resistance of the to-be-tested part, determining that the data of the drive plate of the to-be-tested part is abnormal.
4. The method for calibrating device dispersion according to claim 2, wherein said testing the voltage deviation of the part to be tested comprises:
injecting standard voltage into a preset first test position of a part to be tested;
acquiring a feedback voltage of a preset second test position of the part to be tested after the standard voltage is injected;
and judging whether the feedback voltage of the to-be-tested part meets the requirement of voltage limit deviation, if so, acquiring a proportional coefficient of the feedback voltage of the to-be-tested part and the standard voltage.
5. The method for calibrating device dispersion according to claim 4, wherein the data of the driving board of the part to be tested is considered abnormal if the feedback voltage of the part to be tested does not satisfy the requirement of voltage limit deviation.
6. The method for calibrating device variation according to claim 4, wherein the generating the identification code according to the voltage deviation test result comprises:
generating an identification code according to a proportionality coefficient of the feedback voltage and the standard voltage of the to-be-tested part;
and marking the identification code at a preset position of a driving plate of the part to be tested.
7. The method for calibrating device dispersion as claimed in claim 6, wherein when the identification code of the driving board of the component to be tested is scanned, the proportionality coefficient of the feedback voltage and the standard voltage of the component to be tested can be obtained.
8. A method for correcting device variation, comprising:
scanning an identification code of a part to be tested;
and uploading the data acquired after scanning the identification code of the part to be tested to a tracing system.
9. The device variation correction method of claim 8, wherein the scanning of the identification code of the part to be tested comprises scanning a drive board identification code and a scanning control board identification code;
the step of uploading the data acquired after scanning the identification code of the part to be tested to the tracing system comprises the following steps:
binding the driving plate identification code of the part to be tested with the control plate identification code of the part to be tested;
and storing the binding relation data of the drive board of the part to be tested and the control board of the part to be tested to a tracing system.
10. The method for correcting device dispersion of claim 9, further comprising:
acquiring a proportional coefficient of a feedback voltage and a standard voltage of a to-be-tested part obtained after scanning a drive plate identification code;
and storing the proportionality coefficient of the feedback voltage of the part to be tested and the standard voltage into a control board memory.
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| CN202211082120.1A CN115356673A (en) | 2022-09-06 | 2022-09-06 | Calibration method and correction method for device dispersion |
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| CN202211082120.1A CN115356673A (en) | 2022-09-06 | 2022-09-06 | Calibration method and correction method for device dispersion |
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