CN113640606B - Terminal charging function debugging method and device and terminal equipment - Google Patents
Terminal charging function debugging method and device and terminal equipment Download PDFInfo
- Publication number
- CN113640606B CN113640606B CN202110943219.5A CN202110943219A CN113640606B CN 113640606 B CN113640606 B CN 113640606B CN 202110943219 A CN202110943219 A CN 202110943219A CN 113640606 B CN113640606 B CN 113640606B
- Authority
- CN
- China
- Prior art keywords
- tested
- current
- terminal
- temperature
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Abstract
The invention is applicable to the technical field of software and hardware testing, and provides a terminal charging function debugging method, a terminal charging function debugging device and terminal equipment, wherein the method comprises the following steps: acquiring the voltage and current values of the current terminal to be tested, which are scanned by a voltage and current scanner, and the ADC resistance value of the current terminal to be tested after the current terminal to be tested is put into the intelligent incubator every preset time period; after each preset time period, the current intelligent incubator adjusts the output temperature of the next preset time period according to a preset temperature level until the output temperature reaches the maximum value or the current terminal to be tested is charged; and analyzing the high-low temperature charging characteristics of the N terminals to be tested according to the voltage and current values of the N terminals to be tested in the total debugging time and the characteristic curve of the output temperature of the intelligent temperature box, and/or forming ADC calibration data according to the ADC resistance values, and analyzing the high-low temperature charging characteristics of the N terminals to be tested. The invention can simplify the steps of debugging and data processing, and improve the debugging efficiency and the accuracy of the debugging result.
Description
Technical Field
The present invention relates to the field of software and hardware testing technologies, and in particular, to a method and an apparatus for debugging a terminal charging function, and a terminal device.
Background
The terminal charging function is an important performance index for products, however, the terminal charging function is affected by temperature, and the used batteries may have different specifications and different requirements of terminals produced by different manufacturers, so that the limitation range of the battery charging temperature is different, and therefore, the charging temperature range is a necessary configuration item when the terminal charging function is debugged.
Typically, a commissioning system builds a commissioning environment using an incubator and a temperature scanner. The temperature of the incubator is often required to be manually regulated, so that the debugging step is nodified, and meanwhile, the data obtained in the process also need to be spliced to obtain a debugging result; in addition, there is a deviation of the battery temperature from the temperature of the incubator, but the scanner is only used to detect the temperature of the incubator. Therefore, the currently used debugging method has low efficiency, complex data processing and inaccurate debugging result.
Disclosure of Invention
The invention mainly aims to provide a terminal charging function debugging method, device and terminal equipment, and aims to solve the problems that the terminal charging function debugging method used in the prior art is low in efficiency, complex in data processing and inaccurate in debugging result.
In order to achieve the above object, a first aspect of the embodiments of the present invention provides a terminal charging function debugging method, which is applied to a charging debugging system, where the charging debugging system includes N terminals to be tested, N voltage and current scanners for scanning the N terminals to be tested, N intelligent incubators for placing the N terminals to be tested, and a control analysis unit for receiving and analyzing data of the voltage and current scanners, where N is a positive integer;
the terminal charging function debugging method comprises the following steps:
when a current terminal to be tested is put into the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator, starting to acquire the voltage and current value of the current terminal to be tested and the ADC resistance value of the current terminal to be tested, which are scanned by the voltage and current scanner, after the current terminal to be tested is put into the intelligent incubator every preset time period;
after each preset time period, the current intelligent incubator adjusts the output temperature of the next preset time period according to a preset temperature level until the output temperature reaches the maximum value or the current terminal to be tested is charged;
analyzing the high-low temperature charging characteristics of the N terminals to be tested according to the voltage and current values of the N terminals to be tested in the total debugging time and the characteristic curve of the output temperature of the intelligent temperature box; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
With reference to the first aspect of the present invention, in a first embodiment of the present invention, before obtaining the voltage and current value of the terminal to be tested, which is scanned by the voltage and current scanner, the method includes:
recording the battery temperature change of the current terminal to be tested;
and when the temperature change of the battery is within a stable threshold value, the voltage and current scanner scans the voltage and current value of the current terminal to be tested.
With reference to the second embodiment of the first aspect of the present invention, in a second embodiment of the present invention, before the current intelligent incubator adjusts the output temperature of the next preset time period according to the preset temperature level, the method includes:
and acquiring whether the battery temperature change fed back by the current terminal to be tested is at a stable threshold value or not, and whether the current terminal to be tested completes the test time under the output temperature of the current intelligent temperature box or not.
With reference to the first aspect of the present invention, in a third embodiment of the present invention, before the terminal to be tested is placed in the intelligent incubator, the method includes:
setting the initial temperature, the cut-off temperature and the value of a preset time period of the intelligent incubator and the preset temperature level to be adjusted in the adjacent preset time period.
With reference to the first aspect of the present invention, in a fourth embodiment of the present invention, forming ADC calibration data according to ADC resistance values of N terminals to be tested in a total debug time includes:
taking any group of terminals to be tested and a voltage and current scanner as a host machine, and taking other N-1 groups of terminals to be tested and voltage and current scanners as auxiliary machines;
n-1 auxiliary machines synchronize test data to the host machine and reprocess the synchronized test data; the test data comprise the battery temperature of the terminal to be tested, the output temperature of the intelligent temperature box, the preset temperature value of the intelligent temperature box in each preset time period and the ADC resistance value of the terminal to be tested;
and screening the test data of the auxiliary machine and the test data of the host machine through deviation and the host machine, and taking the rest test data as ADC calibration data.
With reference to the first aspect of the present invention, in a fifth embodiment of the present invention, the charging of the terminal to be tested is completed, including:
acquiring charging current and maximum charging voltage set in a register, and setting the charging current and the maximum charging voltage of the current terminal to be tested;
and when the charging voltage of the current terminal to be tested reaches the highest charging voltage, the charging of the current terminal to be tested is completed.
The second aspect of the embodiment of the invention provides a terminal charging function debugging device, which is applied to a charging debugging system, wherein the charging debugging system comprises N terminals to be tested, N voltage and current scanners for scanning the N terminals to be tested, N intelligent incubators for placing the N terminals to be tested, and a control analysis unit for receiving and analyzing data of the voltage and current scanners, wherein N is a positive integer;
the terminal charging function debugging device comprises:
the data acquisition module is used for acquiring the voltage and current value of the current terminal to be tested, which is scanned by the voltage and current scanner, and the ADC resistance value of the current terminal to be tested after the current terminal to be tested is put into the intelligent incubator, when the current terminal to be tested is put into the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator;
the temperature adjustment module is used for adjusting the output temperature of the current intelligent incubator in the next preset time period according to a preset temperature level after each preset time period is spaced until the output temperature reaches the maximum value or the charging of the current terminal to be tested is completed;
the function debugging module is used for analyzing the high-low temperature charging characteristics of the N terminals to be tested according to the voltage and current values of the N terminals to be tested and the characteristic curve of the output temperature of the intelligent temperature box in the total debugging time; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
A third aspect of an embodiment of the present invention provides a terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the steps of the method as provided in the first aspect above when executing the computer program.
A fourth aspect of the embodiments of the present invention provides a computer readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method as provided in the first aspect above.
The embodiment of the invention provides a terminal charging function debugging method, which uses a charging debugging system to realize continuous terminal function debugging and uniformly processes data in a voltage and current scanner, thereby simplifying the steps of debugging and data processing and improving the debugging efficiency and the accuracy of a debugging result.
Drawings
Fig. 1 is a schematic implementation flow chart of a terminal charging function debugging method provided by an embodiment of the present invention;
fig. 2 is a component structure diagram of a charging debug system according to an embodiment of the present invention;
fig. 3 is a schematic diagram of a characteristic curve of a charging current of a terminal to be tested and an output temperature of an intelligent incubator according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a characteristic curve of a charging voltage of a terminal to be tested and an output temperature of an intelligent incubator according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a composition structure of a terminal charging function debugging device according to an embodiment of the present invention.
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
In this document, suffixes such as "module", "component" or "unit" used to represent elements are used only for facilitating the description of the present invention, and have no particular meaning in themselves. Thus, "module" and "component" may be used in combination.
As shown in fig. 1, the embodiment of the invention provides a terminal charging function debugging method, which is applied to a charging debugging system 200 shown in fig. 2, and uses an intelligent incubator to realize continuous terminal function debugging and temperature compensation, and uniformly processes data in a voltage and current scanner, thereby improving the debugging efficiency and the accuracy of the debugging result.
As shown in fig. 2, the charge commissioning system 200 includes N terminals to be tested 20, N voltage and current scanners 30 scanning N terminals to be tested 20, N intelligent incubators 40 placing N terminals to be tested 20, and a control analysis unit 10 receiving and analyzing data of the voltage and current scanners 30, wherein N is a positive integer.
In the embodiment of the present invention, N terminals 20 to be tested are the same terminal, and the same battery is used, and by using the terminal charging function debugging method provided in the embodiment of the present invention, voltage and current values based on N terminals to be tested are obtained and uniformly processed, so as to obtain the high and low temperature charging characteristics of the type of terminals to be tested, where the high and low temperature charging characteristics are used to determine whether the charging current accords with the temperature range in which the charging current should be located, so as to determine whether the terminal charging function of the terminals to be tested is normal.
Based on this, as shown in fig. 1, the terminal charging function debugging method provided by the embodiment of the invention includes, but is not limited to, the following steps:
s101, placing a current terminal to be tested into the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator, and obtaining the voltage and current value of the current terminal to be tested, which is scanned by the voltage and current scanner, and the ADC resistance value of the current terminal to be tested after the current terminal to be tested is placed into the intelligent incubator;
in the step S101, whether the battery temperature of the terminal to be tested reaches the initial temperature of the intelligent incubator is identified by whether the battery temperature change is within the stable threshold.
In the embodiment of the invention, the voltage and current scanner always uploads the voltage and current values of the terminal to be tested within a preset time period, but the control analysis unit does not use all the voltage and current values, so in the embodiment of the invention, the voltage and current values are obtained only every preset time period, wherein the preset time period is the sum of the time used when the battery temperature of the current terminal to be tested can reach the current output temperature of the intelligent incubator and the set test time after the battery temperature of the current terminal to be tested reaches the output temperature of the intelligent incubator.
After each preset time period, the current intelligent incubator adjusts the output temperature of the next preset time period according to a preset temperature level until the output temperature reaches the maximum value or the current terminal to be tested is charged.
The output temperature reaches the maximum value and can be finished by setting the maximum output temperature, and whether the current terminal to be tested is charged or not is judged, and the method can be realized by the following steps:
acquiring charging current and maximum charging voltage set in a register, and setting the charging current and the maximum charging voltage of the current terminal to be tested;
and when the charging voltage of the current terminal to be tested reaches the highest charging voltage, the charging of the current terminal to be tested is completed.
In the step S101, the preset time period indicates the working time of the intelligent incubator at any temperature, for example, the length of the current preset time period is 5 minutes, and the intelligent incubator sets the working time of the environment temperature to 30 degrees to 5 minutes and the working time of the environment temperature to 32 degrees to 5 minutes.
It should be noted that, the preset time period includes a time used for the temperature change of the intelligent incubator, for example, after the first 5 minutes and the 30-degree ambient temperature are completed, in the second 5 minutes, the 30-degree ambient temperature needs to be adjusted to 32 degrees, and a time consumed for the 30-degree ambient temperature to be adjusted to 32 degrees is included in the preset time period of 5 minutes.
In the embodiment of the invention, the preset temperature levels are the difference between the output temperatures of the intelligent temperature boxes in two adjacent preset time periods, and the difference between the output temperatures of the intelligent temperature boxes in any two preset time periods is the same in the total debugging time, and can be set according to actual needs. Thus, in one embodiment, before the terminal to be tested is currently placed in the intelligent incubator, the following steps are further included:
setting the initial temperature, the cut-off temperature and the value of a preset time period of the intelligent incubator and the preset temperature level to be adjusted in the adjacent preset time period.
S102, analyzing the high-low temperature charging characteristics of N terminals to be tested according to the voltage and current values of the N terminals to be tested in the total debugging time and the characteristic curve of the output temperature of the intelligent incubator; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
In the step S102, the total debug time is the time from the start of debug to the maximum output temperature or the completion of charging the current terminal to be tested. In the total debugging time, the debugging of the terminals to be tested is continuous, so in the embodiment, the characteristic curves of the voltage and current values of the N terminals to be tested, the battery temperature change and the time are all non-nodal, and the ADC resistance values of the N terminals to be tested in the total debugging time are also non-nodal.
In specific application, the high-low temperature charging characteristics of each terminal to be tested can be respectively analyzed by combining the voltage and current values output by voltage and current scanning and the output temperature of the intelligent incubator, ADC calibration data can be formed by using the ADC resistance values of N terminals to be tested, and the high-low temperature charging characteristics of N terminals to be tested can be statistically analyzed. The two modes can be used simultaneously for analysis.
In an embodiment, in the analyzing method of step S102, the forming the ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debug time may include the following steps:
s1021, taking any group of terminals to be tested and a voltage and current scanner as a host, and taking other N-1 groups of terminals to be tested and voltage and current scanners as auxiliary machines;
s1022, synchronizing test data to the host by the N-1 auxiliary machines, and reprocessing the synchronized test data;
the test data comprise the battery temperature of the terminal to be tested, the output temperature of the intelligent temperature box, the preset temperature value of the intelligent temperature box in each preset time period and the ADC resistance value of the terminal to be tested;
s1023, screening the test data of the auxiliary machine and the test data of the host machine through deviation and in the host machine, and taking the rest test data as ADC calibration data.
In a specific application, the voltage and current value obtained by scanning output by the voltage and current scanner should be a value obtained after the output temperature of the intelligent incubator is stable and the output temperature of the intelligent incubator permeates the terminal to be tested, so before the control analysis unit obtains the voltage and current value of the terminal to be tested scanned by the voltage and current scanner, in one embodiment, the method comprises the following steps:
recording the battery temperature change of the terminal to be tested;
and when the temperature change of the battery is within a stable threshold value, the voltage and current scanner scans the voltage and current value of the terminal to be tested.
In the embodiment of the invention, the preset time period comprises two times, namely, the time used by the current battery temperature of the terminal to be tested to reach the current output temperature of the intelligent temperature box and the set test time after the battery temperature of the terminal to be tested reaches the output temperature of the intelligent temperature box. Therefore, the current intelligent incubator can also judge the time point of adjusting the output temperature of the next preset time period according to the preset temperature level through the conditions, such as:
before the current intelligent incubator adjusts the output temperature of the next preset time period according to the preset temperature level, the intelligent incubator comprises:
and acquiring whether the battery temperature change fed back by the current terminal to be tested is at a stable threshold value or not, and whether the current terminal to be tested completes the test time under the output temperature of the current intelligent temperature box or not.
It is conceivable that the battery temperature fed back by the current terminal to be tested changes at the stable threshold, and the current terminal to be tested completes the test time under the output temperature of the current intelligent incubator, which means that the current intelligent incubator can adjust the output temperature of the next preset time period according to the preset temperature level. If the temperature change of the battery fed back by the current terminal to be tested exceeds the stable threshold value, or the current terminal to be tested does not finish the test time, the current state indicates that the test of the next preset time period is not performed although the test of the next preset time period is performed, and the value of the current preset time period is increased at the moment, or the values of all the preset time periods after the current state are adjusted at the same time.
The embodiment of the invention also takes practical application as an example to describe the detailed application process of the terminal charging function debugging method:
firstly, setting the initial temperature of an intelligent incubator to be minus 10 ℃, the cut-off temperature to be 60 ℃, the preset temperature step to be adjusted in the preset time period to be 5min, after the terminal charging function is debugged, the intelligent incubator firstly outputs the initial temperature of minus 10 ℃, when the intelligent incubator considers that the intelligent incubator reaches the initial temperature, the intelligent incubator immediately tells the terminal to be tested that the intelligent incubator reaches the initial temperature, the terminal to be tested tells the intelligent incubator to keep the temperature until the battery temperature fed back by the current terminal to be tested reaches minus 10 ℃, then the intelligent incubator starts to execute a heating instruction, and then in the first preset time period, namely the first 5min, the intelligent incubator can heat the output temperature of the intelligent incubator from minus 10 ℃ to minus 5 ℃ according to the preset temperature step, and the voltage current value of the battery of the terminal to be tested, scanned by the voltage current scanner, can be obtained after the first preset time period is finished.
As shown in fig. 3 and fig. 4, according to the above data, the present embodiment exemplarily shows a characteristic curve of a voltage and current value of a terminal to be tested and an output temperature of an intelligent incubator, where fig. 3 is a characteristic curve of a charging current of the terminal to be tested and the output temperature of the intelligent incubator, and an abscissa represents the output temperature of the intelligent incubator, where a unit is celsius, a symbol is a degree of c, a magnitude of a change thereof, that is, a value of a preset temperature level is 5, and a time used for temperature level adjustment is a preset time period in the present embodiment, but it is to be noted that an ordinate of a value of each preset time period represents a charging current of the terminal to be tested, a unit is milliamp, and a symbol is mA. Fig. 4 is a characteristic curve of a charging voltage of a terminal to be tested and an output temperature of an intelligent incubator, wherein an abscissa indicates the output temperature of the intelligent incubator in degrees celsius, a sign of the output temperature is in degrees celsius, a magnitude of a change thereof, that is, a value of a preset temperature level is 5, and an ordinate indicates the charging voltage of the terminal to be tested in volts, and a sign of the output temperature is in V.
The charging current/charging voltage of the terminal to be tested recorded in fig. 3 and fig. 4 is the value of the charging current/charging voltage of the terminal to be tested, which is scanned by the voltage-current scanner after the temperature change of the battery fed back by the current terminal to be tested is at the stable threshold in the preset time period. And before entering the next stage, whether the testing time under the output temperature of the current intelligent temperature box is finished is also judged.
In the second preset time period, the intelligent incubator adjusts the initial temperature according to the preset temperature level, and in the second preset time period, the preset temperature value of the intelligent incubator in the current preset time period is the initial temperature plus or minus the preset temperature level, so that the latter value of minus 10 ℃ in the abscissa is minus 5 ℃ in fig. 3 and 4, and then the content in the first preset time period is repeated until the temperature reaches the maximum (60 ℃ in fig. 3 and 4) or the charging is completed.
Then, for the implementation of "analyzing the high-low temperature charging characteristics of N terminals to be tested according to the voltage and current values of N terminals to be tested in the total debug time and the characteristic curve of the output temperature of the intelligent incubator", it is assumed that one of the test terminals generates fig. 3 and fig. 4 through the above steps, if the characteristic curves shown in fig. 3 and fig. 4 are in accordance with the characteristic curves provided by the battery manufacturer, the high-low temperature charging characteristics of the terminal to be tested are normal, and if they are not in accordance, the high-low temperature charging characteristics of the terminal to be tested are abnormal.
For the followingRealizing 'forming ADC calibration data according to ADC resistance values of N terminals to be tested in total debugging time', and assuming that 10 terminals to be tested and 10 voltage and current scanners are all arranged, through the steps, the data in the 10 voltage and current scanners are respectively the battery temperature T of each terminal to be tested Pn Output temperature T of intelligent incubator in each preset time period Bn A preset temperature value T of each preset time period Sn The voltage and current value change of each terminal to be tested is represented by ADC resistance value and is marked as R Bn The above data is summarized as Tablen. In 10 groups of terminals to be tested and a voltage and current scanner, the terminals to be tested comprise 1 host machine and 9 auxiliary machines, the data in the host machine are assumed to be Table1, the data in the 9 auxiliary machines are assumed to be Table2 to Table9, and when high and low temperature charging characteristic analysis is carried out, the 9 auxiliary machines synchronize the data to the host machine, namely the data in the host machine are caused to be Table1 to Table9.
Then the rest 9 machines (auxiliary) in the 10 machines are started to centralize to the other 1 machines (main) to synchronize their table, in the main machine, the two data of preset temperature value of every preset time period and voltage and current value change of each terminal to be tested are used as statistical standard to calculate and obtain 10 terminals to be tested<T Sn ,R Bn >In (a) and (b)
Finally form->
Then 10 terminals to be tested<T Sn ,R Bn >R in (a) Bn Sequentially and->
Calculating deviation
Select bias Sum Rm Maximum and minimum two data tables<k,j>And delete it; statistics of remaining 8 prototypes<T Sn ,R Bn >Corresponding->
And then, completing data calibration to form a calibration result. Finally sharing the calibration result to other 9 auxiliary machines, and outputting +.10 machines after the calibration result is completed>
and <T Sn ,T Pn ,T Bn ,R Bn >The report is ADC calibration data of N terminals to be tested, wherein the ADC resistance in the ADC calibration data can determine equivalent voltage or current value, so that the characteristic curve of the current voltage data of each terminal to be tested and the output temperature of the intelligent temperature box is finally output according to the report, and the high-low temperature charging characteristics of 10 terminals to be tested can be obtained.
As shown in fig. 3, an embodiment of the present invention provides a terminal charging function debugging device 50, which is also applied to the charging debugging system shown in fig. 2, and the terminal charging function debugging device 30 includes:
the data obtaining module 51 is configured to, when the current terminal to be tested is placed in the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator, start to obtain a voltage and current value of the current terminal to be tested and an ADC resistance value of the current terminal to be tested, which are scanned by the voltage and current scanner after the current terminal to be tested is placed in the intelligent incubator;
the temperature adjustment module 52 is configured to adjust, after each interval of the preset time period, the output temperature of the current intelligent incubator in a next preset time period according to a preset temperature level until the output temperature reaches a maximum value or the charging of the current terminal to be tested is completed;
the function debugging module 53 is configured to analyze high-low temperature charging characteristics of the N terminals to be tested according to characteristic curves of voltage and current values of the N terminals to be tested and output temperatures of the intelligent incubator within total debugging time; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
The embodiment of the invention also provides a terminal device which comprises a memory, a processor and a computer program stored in the memory and capable of running on the processor, wherein when the processor executes the computer program, the steps in the terminal charging function debugging method are realized.
The embodiment of the invention also provides a storage medium, which is a computer readable storage medium and stores a computer program, wherein the computer program realizes each step in the terminal charging function debugging method according to the embodiment when being executed by a processor.
The above embodiments are only for illustrating the technical solution of the present invention, and not for limiting the same; while the foregoing embodiments are illustrative of the present invention in detail, those skilled in the art will appreciate that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention, and are intended to be included in the scope of the present invention.
Claims (9)
1. The terminal charging function debugging method is characterized by being applied to a charging debugging system, wherein the charging debugging system comprises N terminals to be tested, N voltage and current scanners for scanning the N terminals to be tested, N intelligent incubators for placing the N terminals to be tested, and a control analysis unit for receiving and analyzing data of the voltage and current scanners, wherein N is a positive integer;
the terminal charging function debugging method comprises the following steps:
when a current terminal to be tested is put into the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator, starting to acquire the voltage and current value of the current terminal to be tested and the ADC resistance value of the current terminal to be tested, which are scanned by the voltage and current scanner, after the current terminal to be tested is put into the intelligent incubator every preset time period;
after each preset time period, the current intelligent incubator adjusts the output temperature of the next preset time period according to a preset temperature level until the output temperature reaches the maximum value or the charging of the current terminal to be tested is completed;
analyzing the high-low temperature charging characteristics of the N terminals to be tested according to the voltage and current values of the N terminals to be tested in the total debugging time and the characteristic curve of the output temperature of the intelligent temperature box; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
2. The terminal charging function debugging method of claim 1, wherein before obtaining the voltage and current value of the terminal to be tested scanned by the voltage and current scanner, comprising:
recording the battery temperature change of the current terminal to be tested;
and when the temperature change of the battery is within a stable threshold value, the voltage and current scanner scans the voltage and current value of the current terminal to be tested.
3. The method for debugging the charging function of a terminal according to claim 2, wherein before the current intelligent incubator adjusts the output temperature of the next preset time period according to the preset temperature level, the method comprises:
and acquiring whether the battery temperature change fed back by the current terminal to be tested is at a stable threshold value or not, and whether the current terminal to be tested completes the test time under the output temperature of the current intelligent temperature box or not.
4. The terminal charging function debugging method of claim 1, wherein before the terminal to be tested is put into the intelligent incubator, comprising:
setting the initial temperature, the cut-off temperature and the value of a preset time period of the intelligent incubator and the preset temperature level to be adjusted in the adjacent preset time period.
5. The method for debugging a terminal charging function according to claim 1, wherein forming ADC calibration data according to ADC resistance values of N terminals to be tested in a total debugging time comprises:
taking any group of terminals to be tested and a voltage and current scanner as a host machine, and taking other N-1 groups of terminals to be tested and voltage and current scanners as auxiliary machines;
n-1 auxiliary machines synchronize test data to the host machine and reprocess the synchronized test data; the test data comprise the battery temperature of the terminal to be tested, the output temperature of the intelligent temperature box, the preset temperature value of the intelligent temperature box in each preset time period and the ADC resistance value of the terminal to be tested;
and screening the test data of the auxiliary machine and the test data of the host machine through deviation and the host machine, and taking the rest test data as ADC calibration data.
6. The terminal charging function debugging method of claim 1, wherein the current terminal to be tested is charged, comprising:
acquiring charging current and maximum charging voltage set in a register, and setting the charging current and the maximum charging voltage of the current terminal to be tested;
and when the charging voltage of the current terminal to be tested reaches the highest charging voltage, the charging of the current terminal to be tested is completed.
7. The terminal charging function debugging device is characterized by being applied to a charging debugging system, wherein the charging debugging system comprises N terminals to be tested, N voltage and current scanners for scanning the N terminals to be tested, N intelligent incubators for placing the N terminals to be tested, and a control analysis unit for receiving and analyzing data of the voltage and current scanners, wherein N is a positive integer;
the terminal charging function debugging device comprises:
the data acquisition module is used for acquiring the voltage and current value of the current terminal to be tested, which is scanned by the voltage and current scanner, and the ADC resistance value of the current terminal to be tested after the current terminal to be tested is put into the intelligent incubator, when the current terminal to be tested is put into the intelligent incubator until the battery temperature of the current terminal to be tested reaches the initial temperature of the intelligent incubator;
the temperature adjustment module is used for adjusting the output temperature of the current intelligent incubator in the next preset time period according to a preset temperature level after each preset time period is spaced until the output temperature reaches the maximum value or the charging of the current terminal to be tested is completed;
the function debugging module is used for analyzing the high-low temperature charging characteristics of the N terminals to be tested according to the voltage and current values of the N terminals to be tested and the characteristic curve of the output temperature of the intelligent temperature box in the total debugging time; and/or forming ADC calibration data according to the ADC resistance values of the N terminals to be tested in the total debugging time, and analyzing the high-low temperature charging characteristics of the N terminals to be tested.
8. A terminal device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the terminal charging function debugging method of any of claims 1 to 6 when the computer program is executed.
9. A storage medium, which is a computer-readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, realizes the respective steps in the terminal charging function debugging method as claimed in any one of claims 1 to 6.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110943219.5A CN113640606B (en) | 2021-08-17 | 2021-08-17 | Terminal charging function debugging method and device and terminal equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202110943219.5A CN113640606B (en) | 2021-08-17 | 2021-08-17 | Terminal charging function debugging method and device and terminal equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN113640606A CN113640606A (en) | 2021-11-12 |
| CN113640606B true CN113640606B (en) | 2023-07-07 |
Family
ID=78422570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202110943219.5A Active CN113640606B (en) | 2021-08-17 | 2021-08-17 | Terminal charging function debugging method and device and terminal equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN113640606B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108427126A (en) * | 2018-01-31 | 2018-08-21 | 交通运输部水运科学研究所 | The test method and device of baseband chip property at high and low temperature |
| CN108595296A (en) * | 2018-04-27 | 2018-09-28 | 上海与德通讯技术有限公司 | A kind of high/low temperature test method and terminal to be measured |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008243440A (en) * | 2007-03-26 | 2008-10-09 | Nissan Motor Co Ltd | Abnormality detecting device of secondary battery and abnormality detecting method of battery |
| CN103033693B (en) * | 2011-09-29 | 2015-08-26 | 比亚迪股份有限公司 | A kind of mobile terminal charging measurement system and method |
| JP5656884B2 (en) * | 2012-01-17 | 2015-01-21 | 三菱電機株式会社 | Thermal stability evaluation test method and apparatus for power storage device |
| JP5994452B2 (en) * | 2012-07-24 | 2016-09-21 | 日産自動車株式会社 | Manufacturing method of secondary battery |
| CN104319427B (en) * | 2014-08-26 | 2017-05-10 | 惠州Tcl移动通信有限公司 | Acquiring apparatus of cell temperature, mobile terminal and debugging method |
| CN205120935U (en) * | 2015-11-12 | 2016-03-30 | 中国检验检疫科学研究院 | Lithium ion battery temperature comprehensive properties test system |
| CN105633498B (en) * | 2016-03-15 | 2018-05-08 | 北京小米移动软件有限公司 | Battery temperature detection method and device |
| JP6928425B2 (en) * | 2016-03-28 | 2021-09-01 | 古河電気工業株式会社 | Power storage system and its temperature control method |
| WO2020051808A1 (en) * | 2018-09-12 | 2020-03-19 | Oppo广东移动通信有限公司 | Charging control method and apparatus, electronic device and computer-readable storage medium |
| CN109814037A (en) * | 2018-12-29 | 2019-05-28 | 深圳市比克动力电池有限公司 | Acquisition methods, terminal device and the medium of the hot coefficient of lithium ion battery entropy |
| JPWO2020246558A1 (en) * | 2019-06-07 | 2020-12-10 | ||
| CN110470992B (en) * | 2019-08-29 | 2020-06-19 | 清华大学 | Durability test method and system for pulse heating of battery and data table generation method |
| CN112180267B (en) * | 2020-09-27 | 2023-05-05 | 欣旺达电动汽车电池有限公司 | Battery testing system, battery testing method, electronic device and storage medium |
| CN112636418A (en) * | 2020-12-11 | 2021-04-09 | 重庆蓝岸通讯技术有限公司 | Charging system, charging method, mobile terminal and charger |
-
2021
- 2021-08-17 CN CN202110943219.5A patent/CN113640606B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108427126A (en) * | 2018-01-31 | 2018-08-21 | 交通运输部水运科学研究所 | The test method and device of baseband chip property at high and low temperature |
| CN108595296A (en) * | 2018-04-27 | 2018-09-28 | 上海与德通讯技术有限公司 | A kind of high/low temperature test method and terminal to be measured |
Also Published As
| Publication number | Publication date |
|---|---|
| CN113640606A (en) | 2021-11-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107228719B (en) | Temperature calibration method, module to be tested and temperature calibration device | |
| CN108254697B (en) | Battery type detection method, detection terminal and storage medium | |
| CN108039921B (en) | Calibration method of mobile terminal, terminal equipment and storage medium | |
| CN107918076B (en) | Power adapter detection method and power adapter detection device | |
| Moghaddam et al. | Sensitivity analysis of an excitation system in order to simplify and validate dynamic model utilizing plant test data | |
| CN111327372B (en) | Radio frequency test method, system and device | |
| CN113640606B (en) | Terminal charging function debugging method and device and terminal equipment | |
| CN112948233A (en) | Interface testing method, device, terminal equipment and medium | |
| CN114130713A (en) | Screening method and device for battery echelon utilization | |
| CN112353411B (en) | SIPM temperature drift self-adaptive system and compensation method | |
| CN111610816A (en) | Power supply voltage calibration device and power supply voltage calibration method | |
| CN111044964A (en) | Voltage and current reference debugging method and device | |
| CN112964999B (en) | Battery state of charge acquisition method, device, equipment, medium and program product | |
| CN115858270A (en) | Domestic component functional performance application verification method and system | |
| CN110716860B (en) | Cloud platform-based automatic test tool management method and system | |
| CN110162467B (en) | Software testing method, device, computer equipment and readable storage medium | |
| CN117169749A (en) | Method for generating battery capacity prediction model, prediction method and device thereof | |
| CN113703836A (en) | SCPI instruction management method for spacecraft power system evaluation | |
| CN112994973A (en) | Automatic batch testing method and device for Internet of things equipment and computer-readable storage medium | |
| CN109308162B (en) | Flash memory optimization device, optimization method and equipment | |
| CN101588647A (en) | Automatic starting device | |
| CN111737072A (en) | Eye pattern testing system and system for hard disk TX signal and related components | |
| CN115900835B (en) | Detection method and system for basic parameters of power inspection robot | |
| CN115065364A (en) | Temperature optimization method and device based on sampling voltage and storage medium | |
| CN114234816B (en) | New energy vehicle-mounted connector connection test method, system and storage medium |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: No. 16, cuixing Road, Hui Xing street, Yubei District, Chongqing Applicant after: Chongqing Lanan Technology Co.,Ltd. Address before: No. 16, cuixing Road, Hui Xing street, Yubei District, Chongqing Applicant before: CHONGQING BLUEBANK COMMUNICATION TECHNOLOGY Co.,Ltd. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |