CN115290971A - Spectrum waveform synchronization method and system based on multiple spectrum analysis devices - Google Patents
Spectrum waveform synchronization method and system based on multiple spectrum analysis devices Download PDFInfo
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Abstract
The application discloses a frequency spectrum waveform synchronization method and a frequency spectrum waveform synchronization system based on a plurality of frequency spectrum analysis devices, which belong to the technical field of data processing, wherein the method comprises the following steps: connecting a first spectrum analysis device and a second spectrum analysis device, and performing time correction on the devices; acquiring signal generation position information and constructing a three-dimensional coordinate system; generating direction verification constraint information; carrying out waveform feature capture on waveform acquisition signals acquired by analysis equipment, and generating a feature verification point set according to a feature capture result; and judging whether the time alignment direction with the characteristic in the characteristic verification point set is consistent with the direction verification constraint information, and if so, synchronizing the frequency spectrum waveforms of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the characteristic verification point set. The method and the device solve the technical problems that in the prior art, a plurality of spectrum analysis devices are low in spectrum waveform analysis accuracy and inaccurate in waveform synchronization, and achieve the technical effect of improving the accuracy of synchronization of a plurality of spectrum waveforms.
Description
Technical Field
The present application relates to the field of data processing technologies, and in particular, to a method and a system for synchronizing spectrum waveforms based on multiple spectrum analysis devices.
Background
In the observation and analysis of electrical signals, the electrical signals are superimposed by one or more sine waves of appropriate frequency, amplitude and phase. Therefore, the analysis of the electrical signal can be realized by collecting the waveform of the electrical signal and analyzing the frequency spectrum.
However, in the process of actually measuring a spectrum, a single spectrum analysis device is used to analyze the spectrum, which is prone to generate errors, and in the process of analyzing by using a plurality of spectrum analysis devices, due to the influence of an external environment, the accuracy of measurement is not sufficient, and the measurement results of the plurality of spectrum analysis devices cannot be accurately and comprehensively analyzed, so that the error of signal analysis is large, and a reliable analysis result cannot be provided. The technical problems that the spectrum waveform analysis accuracy of a plurality of spectrum analysis devices is low and the waveform synchronization is inaccurate exist in the prior art.
Disclosure of Invention
The application aims to provide a method and a system for synchronizing frequency spectrum waveforms based on a plurality of frequency spectrum analysis devices, and the method and the system are used for solving the technical problems that the frequency spectrum waveforms of the plurality of frequency spectrum analysis devices are low in analysis accuracy and waveform synchronization is inaccurate in the prior art.
In view of the above problems, the present application provides a method and a system for spectrum waveform synchronization based on a plurality of spectrum analysis devices.
In a first aspect, the present application provides a spectrum waveform synchronization method based on multiple spectrum analysis devices, where the method is applied to a spectrum waveform synchronization system, and the spectrum waveform synchronization system is communicatively connected with a first spectrum analysis device and a second spectrum analysis device, and the method includes: connecting the first spectrum analysis device and the second spectrum analysis device, and performing time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result; obtaining device location information for the first spectrum analysis device and the second spectrum analysis device; acquiring signal generation position information, constructing a three-dimensional coordinate system by using the signal generation position information as a coordinate origin, and acquiring equipment distribution coordinates according to the equipment position information and the three-dimensional coordinate system; performing waveform adjustment direction evaluation according to the equipment distribution coordinates to generate direction verification constraint information; acquiring waveform signals acquired by the first spectrum analysis equipment and the second spectrum analysis equipment, and capturing waveform characteristics of the waveform acquired signals to acquire characteristic capture results; generating a feature verification point set based on the feature capture result, wherein each point in the feature verification point set has a time identifier; and judging whether the time alignment direction with the feature in the feature verification point set is consistent with the direction verification constraint information, and if so, synchronizing the frequency spectrum waveforms of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the feature verification point set.
On the other hand, the application also provides a spectrum waveform synchronization system based on a plurality of spectrum analysis devices, wherein the system comprises: the time correction module is used for connecting a first spectrum analysis device and a second spectrum analysis device and performing time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result; a device location obtaining module, configured to obtain device location information of the first spectrum analysis device and the second spectrum analysis device; the distributed coordinate acquisition module is used for acquiring signal generation position information, constructing a three-dimensional coordinate system by taking the signal generation position information as a coordinate origin, and acquiring equipment distributed coordinates according to the equipment position information and the three-dimensional coordinate system; the constraint information generation module is used for carrying out waveform adjustment direction evaluation according to the equipment distribution coordinates and generating direction verification constraint information; the characteristic capturing module is used for acquiring device acquisition waveform signals of the first spectrum analysis device and the second spectrum analysis device, and performing waveform characteristic capturing on the waveform acquisition signals to acquire a characteristic capturing result; a verification point set generating module, configured to generate a feature verification point set based on the feature capture result, where each point in the feature verification point set has a time identifier; and the frequency spectrum waveform synchronization module is used for judging whether the time alignment direction with the characteristic in the characteristic verification point set is consistent with the direction verification constraint information or not, and if so, carrying out frequency spectrum waveform synchronization of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the characteristic verification point set.
One or more technical solutions provided in the present application have at least the following technical effects or advantages:
the method comprises the steps of connecting a first spectrum analysis device with a second spectrum analysis device, carrying out time correction on the first spectrum analysis device and the second spectrum analysis device, enabling the time of the two analysis devices to be synchronous, then establishing device distribution coordinates by combining signal generation position information according to device position information of the first spectrum analysis device and the second spectrum analysis device, establishing a three-dimensional coordinate system by using the signal generation position information as a coordinate origin, then carrying out device distribution according to the device position information and the three-dimensional coordinate system, further carrying out waveform adjustment direction evaluation according to the device distribution coordinates to generate direction verification constraint information, then acquiring waveform signals through devices of the first spectrum analysis device and the second spectrum analysis device, carrying out waveform feature capture on the waveform acquired signals to obtain a feature capture result, and obtaining a feature verification point set based on the feature capture result, wherein each point in the feature verification point set is provided with a time identifier, and further judging whether the waveform alignment direction in the feature verification point set is consistent with the direction verification constraint information, and when the waveform alignment direction alignment information in the first spectrum analysis device and the second spectrum analysis device is consistent with the feature verification point set. The technical effects of improving the accuracy of frequency spectrum waveform synchronization and improving the synchronization quality are achieved.
Drawings
In order to more clearly illustrate the technical solutions in the present application or the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only exemplary, and for those skilled in the art, other drawings can be obtained according to the provided drawings without inventive effort.
Fig. 1 is a schematic flowchart of a spectrum waveform synchronization method based on multiple spectrum analysis devices according to an embodiment of the present disclosure;
fig. 2 is a schematic flowchart illustrating a process of capturing waveform characteristics of a waveform acquisition signal in a spectrum waveform synchronization method based on a plurality of spectrum analysis devices according to an embodiment of the present disclosure;
fig. 3 is a schematic flowchart illustrating adjustment of corresponding feature verification points according to abnormal adjustment time in a spectrum waveform synchronization method based on multiple spectrum analysis devices according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a spectrum waveform synchronization system based on a plurality of spectrum analysis devices according to the present application.
Description of reference numerals: the device comprises a time correction module 11, an equipment position obtaining module 12, a distribution coordinate obtaining module 13, a constraint information generating module 14, a feature capturing module 15, a verification point set generating module 16 and a frequency spectrum waveform synchronizing module 17.
Detailed Description
The application provides a frequency spectrum waveform synchronization method and system based on a plurality of frequency spectrum analysis devices, and solves the technical problems that in the prior art, the frequency spectrum waveform analysis accuracy of the plurality of frequency spectrum analysis devices is low, and the waveform synchronization is inaccurate. The technical effect of improving the accuracy of the synchronization of a plurality of frequency spectrum waveforms is achieved.
According to the technical scheme, the data acquisition, storage, use, processing and the like meet relevant regulations of national laws and regulations.
In the following, the technical solutions in the present application will be clearly and completely described with reference to the accompanying drawings, and it is to be understood that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments of the present application, and it is to be understood that the present application is not limited by the example embodiments described herein. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application. It should be further noted that, for the convenience of description, only some but not all of the elements relevant to the present application are shown in the drawings.
Example one
As shown in fig. 1, the present application provides a spectrum waveform synchronization method based on a plurality of spectrum analysis devices, wherein the method is applied to a spectrum waveform synchronization system, and the spectrum waveform synchronization system is in communication connection with a first spectrum analysis device and a second spectrum analysis device, and the method includes:
step S100: connecting the first spectrum analysis device and the second spectrum analysis device, and performing time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result;
specifically, the first spectrum analysis device is a device for acquiring and analyzing the emission signal, and the second spectrum analysis device is a device for acquiring and analyzing the emission signal and analyzing the generated spectrum, wherein the acquisition positions of the signals by the first spectrum analysis device and the second spectrum analysis device are different. In the process of acquiring the transmitted signal, due to the generation of the doppler effect, the signals acquired by the spectrum analysis device at different positions are different, and therefore, in order to ensure the accuracy of waveform analysis, the waveforms acquired by the two devices need to be synchronously adjusted. The first spectrum analysis device is in communication connection with the second spectrum analysis device, the device time on the analysis devices is corrected after connection, and the time on the two analysis devices is adjusted and synchronized to be the same time, so that errors caused by device reasons in subsequent analysis are avoided. The technical effect of synchronously bedding for subsequent frequency spectrum waveform analysis is achieved.
Step S200: obtaining device location information for the first and second spectrum analysis devices;
step S300: acquiring signal generation position information, constructing a three-dimensional coordinate system by taking the signal generation position information as a coordinate origin, and acquiring equipment distribution coordinates according to the equipment position information and the three-dimensional coordinate system;
specifically, the device location information is a location of the first spectrum analysis device and the second spectrum analysis device when signal acquisition is performed, and includes first spectrum analysis device location information and second spectrum analysis device location information. The device location information may reflect an actual distance of the device from a location where the signal occurred. And acquiring the position of the signal generation to obtain the signal generation position information, constructing a three-dimensional space coordinate system by taking the signal generation position point as a coordinate origin, and obtaining the position coordinate of the first spectrum analysis device and the position coordinate of the second spectrum analysis device by combining the device position coordinate. By establishing the distribution coordinates of the equipment, the equipment can be accurately positioned, so that an adjustment basis is provided for subsequent frequency spectrum waveform adjustment.
Step S400: performing waveform adjustment direction evaluation according to the equipment distribution coordinates to generate direction verification constraint information;
specifically, the signal is collected after passing through the first spectrum analysis device and the second spectrum analysis device, so as to obtain a first spectrum waveform and a second spectrum waveform. The first spectrum waveform is a spectrum waveform obtained after the first spectrum analysis device collects signals, and the second spectrum waveform is a spectrum waveform obtained after the second spectrum analysis device collects signals. After the first spectrum waveform and the second spectrum waveform are obtained, when the waveform is adjusted, the direction of waveform adjustment needs to be determined. The waveform adjustment direction evaluation refers to a direction which needs to be adjusted when the spectrum waveform obtained by the spectrum analysis equipment is adjusted. The direction verification constraint information is information for verifying a direction at the time of actual waveform adjustment.
Illustratively, after obtaining the device distribution coordinates, the signal transmission speed is obtained, and the device information where the signal arrives first is determined according to the positions of the first spectrum analysis device and the second spectrum analysis device and the signal generation position. And taking the coordinates of the first arrived equipment as a reference point, and adjusting the frequency spectrum waveform of the other equipment. When the coordinates of the first spectrum analysis device are taken as a reference point, the time of the first spectrum analysis device acquiring the signal is earlier than that of the second spectrum analysis device, so that in the process of waveform synchronization, the waveform obtained in the second spectrum analysis device needs to move to the left, and then the waveform diagrams of the first spectrum analysis device and the second spectrum analysis device can be consistent.
Step S500: acquiring waveform signals acquired by the first spectrum analysis equipment and the second spectrum analysis equipment, and capturing waveform characteristics of the waveform acquired signals to acquire characteristic capture results;
further, as shown in fig. 2, step S500 in the embodiment of the present application further includes:
step S510: constructing a time window according to the demand information;
step S520: setting an extreme characteristic acquisition parameter, wherein the extreme characteristic acquisition parameter comprises an extreme characteristic constraint weight value;
step S530: and capturing the waveform characteristics of the waveform acquisition signal through the extreme value characteristic acquisition parameters and the time window.
Specifically, signals are collected by the first spectrum analysis device and the second spectrum analysis device, so that spectrum waveforms are obtained. The waveform characteristics are collected, so that a basis is provided for subsequent waveform synchronous movement. Due to the loss in the signal transmission process, although the amplitudes of the waveforms obtained by the first spectrum analyzing device and the second spectrum analyzing device are different, the shape characteristics of the waveforms are the same. Therefore, by collecting the waveform characteristics, the spectrum waveform can be adjusted according to the waveform characteristics. The characteristic capture result refers to the shape characteristic of the frequency spectrum waveform, and optionally comprises a peak, a trough, an inflection point, a maximum value point, a minimum value point and the like.
Specifically, the requirement information is an analysis requirement of the signal, that is, an object when the spectrum waveform is analyzed. The time window is a time period during which the signal is acquired. The extreme value characteristic acquisition parameter is an object characteristic when the frequency spectrum waveform is subjected to characteristic acquisition. The extreme value feature constraint weight value refers to the proportion of different extreme value features when the extreme value features are collected. And according to the extreme value characteristic acquisition parameters, carrying out characteristic acquisition on the frequency spectrum waveform in the time window. Therefore, the technical effects of carrying out waveform acquisition according to requirements and improving the accuracy of waveform acquisition are achieved.
Further, step S530 in this embodiment of the present application further includes:
step S531: obtaining a maximum characteristic parameter of the extreme characteristic acquisition parameter;
step S532: constructing an initial time distance evaluation value set;
step S533: matching the waveform acquisition signals in a time window through the maximum characteristic parameters to obtain maximum waveform characteristics;
step S534: obtaining adjacent peak information according to the maximum waveform characteristics, and generating a maximum correlation influence value according to the adjacent peak information and the time distance evaluation value set;
step S535: and capturing waveform characteristics according to the maximum correlation influence value and the maximum waveform characteristics.
Specifically, the maximum characteristic parameter is a parameter reflecting a waveform maximum condition in the spectrum waveform, and optionally includes a maximum value, a time point at which the maximum value is located, and the like. The initial time distance evaluation value set is an evaluation value set obtained after the time distance between the maximum value features is evaluated. And matching the waveform acquisition signals in the time window according to the maximum characteristic parameters, and acquiring the waveform characteristics which accord with the maximum characteristic parameters in the signals, thereby obtaining the maximum waveform characteristics. And then, collecting the wave crest condition adjacent to the maximum wave crest according to the maximum wave crest characteristics, thereby obtaining the maximum correlation influence value according to the adjacent wave crest information and the time distance evaluation value set. And evaluating the influence degree of the maximum waveform on the frequency spectrum waveform according to the amplitude information of the adjacent wave crests and the time distance between the two maximum waveforms to obtain the maximum correlation influence value. The maximum correlation influence value reflects a degree of correlation of the surrounding waveform with the maximum waveform. And then, maximum value waveform characteristics which accord with the influence values are collected according to the maximum correlation influence values and the maximum value waveform characteristics, so that a plurality of maximum value waveform characteristics are screened, and the condition that the screened characteristics are too many, so that the follow-up frequency spectrum waveform synchronization is carried out, and the characteristic points are too many and cannot be fitted is avoided. The technical effect of improving the accuracy of the frequency spectrum waveform synchronization is achieved.
Further, step S530 in the embodiment of the present application further includes:
step S536: obtaining a minimum characteristic parameter of the extreme characteristic acquisition parameter;
step S537: matching the waveform acquisition signal in a time window through the minimum value characteristic parameter to obtain a minimum value waveform characteristic;
step S538: obtaining adjacent trough information according to the minimum value waveform characteristics, and generating a minimum association influence value according to the adjacent trough information and the time distance evaluation value set;
step S539: and carrying out feature screening according to the maximum correlation influence value and the minimum correlation influence value, and carrying out feature capture according to a feature screening result.
Specifically, the minimum characteristic parameter is a parameter reflecting the occurrence of a waveform minimum in the spectrum waveform, and optionally includes a minimum value, a time point at which the minimum value is located, and the like. And matching the waveform acquisition signals in the time window according to the minimum characteristic parameter, and acquiring the waveform characteristics which accord with the minimum characteristic parameter in the signals, thereby obtaining the minimum waveform characteristics. And then collecting the wave trough conditions adjacent to the minimum value waveform according to the minimum value waveform characteristics, wherein the adjacent wave trough information comprises the amplitude value of the wave trough. And obtaining the minimum association influence value according to the adjacent trough information and the time distance evaluation value set. And evaluating the influence degree of the minimum value waveform on the frequency spectrum waveform according to the amplitude information of the adjacent wave troughs and the time distance between the two minimum value waveforms to obtain the minimum correlation influence value. The minimal correlation influence value reflects the degree of correlation of the surrounding waveform with the minimal value waveform. And then, according to the maximum correlation influence value and the minimum correlation influence value, the corresponding waveform characteristics are collected, so that a plurality of waveform characteristics are screened, and the technical effect of improving the frequency spectrum waveform synchronization efficiency and accuracy is achieved.
Step S600: generating a feature verification point set based on the feature capture result, wherein each point in the feature verification point set has a time identifier;
further, as shown in fig. 3, step S600 in the embodiment of the present application further includes:
step S610: obtaining an adjusted time value set of matching feature points in the feature verification point set, wherein each adjusted time value in the adjusted time value set comprises a direction identifier;
step S620: obtaining an adjustment time average value according to the adjustment time value set, and generating an initial threshold value according to the adjustment time average value;
step S630: generating a fluctuation constraint threshold according to the demand information, and constructing a characteristic point adjustment constraint threshold according to the fluctuation constraint threshold and the initial threshold;
step S640: and judging whether the adjustment time value set has abnormal adjustment time which does not meet the characteristic point adjustment constraint threshold value, and adjusting the corresponding characteristic verification point according to the abnormal adjustment time.
Specifically, the feature verification point set is a feature point set obtained from the feature capture result. And each point in the feature verification point set has corresponding acquisition time, and the time is recorded through the time identification. The adjustment time value set is obtained by calculating the time difference between the same characteristic points in the spectrum waveforms obtained by the first spectrum analysis device and the second spectrum analysis device. The direction identification is used for identifying the time adjustment direction determined by taking the time point of the first spectrum analysis device characteristic point as a reference. And further carrying out averaging processing on all the adjusting time values in the adjusting time value set according to the adjusting time value set to obtain the adjusting time average value. And taking the adjusted time average value as an initial threshold for performing time adjustment on the spectrum waveform of the second spectrum analysis device. And then, obtaining a key waveform of waveform analysis according to the demand information, obtaining a feature verification point of the key waveform, determining a fluctuation constraint threshold according to the time difference of the feature verification point in the two devices, and then obtaining the feature point adjustment constraint threshold according to the fluctuation constraint threshold and the initial threshold. The adjustment constraint threshold refers to an adjustment amplitude of the spectrum waveform in the second spectrum analysis device when the spectrum waveform is adjusted to be at the same time point as the spectrum waveform of the first spectrum analysis device. By adjusting the abnormal adjustment time which does not meet the characteristic point adjustment constraint threshold value in the adjustment time value set, the corresponding characteristic point needs to be adjusted independently, and the characteristic verification point can be adjusted according to the corresponding abnormal adjustment time. Therefore, the technical effects of ensuring the synchronous adjustment efficiency and the adjustment precision and improving the synchronous quality are achieved.
Further, step S600 in the embodiment of the present application further includes:
step S650: obtaining a matching time window of the corresponding feature verification point;
step S660: obtaining unselected features in the feature screening process in the matching time window;
step S670: and updating the characteristics of the corresponding characteristic verification points according to the unselected characteristics.
Specifically, the matching time window is a time period corresponding to the corresponding feature verification point. And after the corresponding feature verification point is obtained, taking the time point of the corresponding feature verification point appearing first as the starting point of the matching time window, taking the time point of the corresponding feature verification point appearing last as the ending point of the matching time window, and setting the time interval between the starting point and the ending point as the matching time window. And acquiring the feature set in the matching time window, acquiring the features which are not selected in the feature screening process, and adding the unselected features into the corresponding feature verification points, thereby realizing the aim of enriching the feature verification points and achieving the technical effect of improving the accuracy of the features.
Step S700: and judging whether the time alignment direction with the characteristic in the characteristic verification point set is consistent with the direction verification constraint information, and if so, synchronizing the frequency spectrum waveforms of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the characteristic verification point set.
Further, step S700 in the embodiment of the present application further includes:
step S710: when the same characteristic time alignment direction in the characteristic verification point set is inconsistent with the direction verification constraint information, obtaining an abnormal characteristic verification point set;
step S720: feature points of the abnormal verification feature point set are collected again, and the feature verification point set is updated according to a collection result;
step S730: and performing spectrum waveform synchronization of the first spectrum analysis device and the second spectrum analysis device according to the updating result.
Specifically, by determining whether the same-feature time alignment direction in the feature verification point set is consistent with the direction verification constraint information, it can be determined whether the time scales of the feature points are consistent when performing waveform synchronization, and when the same-feature time alignment direction is consistent with the direction verification constraint information, it indicates that the spectrum waveform machines obtained by the first spectrum analysis device and the second spectrum analysis device are synchronized according to the feature verification point, so that the technical effect of improving synchronization accuracy can be achieved.
Specifically, when the same characteristic time is inconsistent with the direction verification constraint information, it indicates that the selected time scale of the characteristic verification point is not correct, optionally, because a signal in the signal transmission process is blocked, the time difference between the time point acquired by the first spectrum analysis device and the time point acquired by the second spectrum analysis device of the signal at a time point is different from the time difference acquired by different spectrum analysis devices of the signal at other time points, so that the adjustment direction of the corresponding characteristic verification point is inconsistent with the direction verification constraint information. And collecting inconsistent feature verification points to obtain the abnormal feature verification point set. And acquiring the positions corresponding to the feature points in the abnormal verification feature point set, thereby re-acquiring the feature points at the corresponding positions and updating the feature verification point set. And fitting the frequency spectrum waveforms of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the updated feature verification point set, and realizing the synchronization of the two obtained frequency spectrum waveforms in the time dimension, thereby realizing the technical effects of accurately obtaining the signal waveforms and improving the accuracy of the waveforms.
In summary, the spectrum waveform synchronization method based on multiple spectrum analysis devices provided by the present application has the following technical effects:
according to the method, the system time of the equipment is kept consistent through time correction of the first spectrum analysis equipment and the second spectrum analysis equipment, so that the accuracy of signal acquisition can be guaranteed, a three-dimensional coordinate system of signal acquisition and analysis is constructed according to the position information of the equipment and the position information of signal generation, the quantitative determination of distance is realized, then the waveform adjustment direction is evaluated according to the equipment distribution coordinates, the direction verification constraint information for constraining the adjustment direction is obtained, then waveform signals are acquired by utilizing the equipment of the first spectrum analysis equipment and the second spectrum analysis equipment, waveform feature capture is carried out on the waveform acquired signals, a feature capture result is obtained, a feature verification point set is obtained, a synchronization point is provided for subsequent waveform synchronization, whether the alignment direction of the same feature time in the feature verification point set is consistent with the direction verification constraint information is judged, when the alignment direction of the same feature verification point is consistent with the preset direction, and then the spectrum waveforms of the first spectrum analysis equipment and the second spectrum analysis equipment can be synchronized through the feature verification point set. The technical effects of improving the synchronization quality of the frequency spectrum waveform and further improving the reliability of signal capture analysis are achieved.
Example two
Based on the same inventive concept as the spectrum waveform synchronization method based on a plurality of spectrum analysis devices in the foregoing embodiments, as shown in fig. 4, the present application further provides a spectrum waveform synchronization system based on a plurality of spectrum analysis devices, wherein the system includes:
a time correction module 11, where the time correction module 11 is configured to connect a first spectrum analysis device and a second spectrum analysis device, and perform time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result;
a device location obtaining module 12, where the device location obtaining module 12 is configured to obtain device location information of the first spectrum analysis device and the second spectrum analysis device;
a distribution coordinate obtaining module 13, where the distribution coordinate obtaining module 13 is configured to obtain signal generation position information, construct a three-dimensional coordinate system using the signal generation position information as a coordinate origin, and obtain device distribution coordinates according to the device position information and the three-dimensional coordinate system;
the constraint information generation module 14, the constraint information generation module 14 is configured to perform waveform adjustment direction evaluation according to the device distribution coordinates, and generate direction verification constraint information;
a feature capture module 15, where the feature capture module 15 is configured to obtain device-collected waveform signals of the first spectrum analysis device and the second spectrum analysis device, and perform waveform feature capture on the waveform-collected signals to obtain a feature capture result;
a verification point set generating module 16, wherein the verification point set generating module 16 is configured to generate a feature verification point set based on the feature capturing result, and each point in the feature verification point set has a time identifier;
a spectrum waveform synchronization module 17, where the spectrum waveform synchronization module 17 is configured to determine whether a time alignment direction with a feature in the feature verification point set is consistent with the direction verification constraint information, and if so, perform spectrum waveform synchronization of the first spectrum analysis device and the second spectrum analysis device according to the feature verification point set.
Further, the system further comprises:
a time value set obtaining unit, configured to obtain an adjusted time value set of matching feature points in the feature verification point set, where each adjusted time value in the adjusted time value set includes a direction identifier;
an initial threshold generating unit, configured to obtain an adjustment time average value according to the adjustment time value set, and generate an initial threshold according to the adjustment time average value;
the adjustment constraint threshold building unit is used for generating a fluctuation constraint threshold according to the demand information and building a characteristic point adjustment constraint threshold according to the fluctuation constraint threshold and the initial threshold;
and the verification point adjusting unit is used for judging whether the abnormal adjusting time which does not meet the characteristic point adjusting constraint threshold exists in the adjusting time value set or not and adjusting the corresponding characteristic verification point according to the abnormal adjusting time.
Further, the system further comprises:
the time window construction unit is used for constructing a time window according to the requirement information;
the system comprises an acquisition parameter setting unit, a parameter setting unit and a parameter processing unit, wherein the acquisition parameter setting unit is used for setting extreme value feature acquisition parameters, and the extreme value feature acquisition parameters comprise extreme value feature constraint weight values;
and the waveform feature capturing unit is used for capturing the waveform features of the waveform acquisition signals through the extreme value feature acquisition parameters and the time window.
Further, the system further comprises:
the characteristic parameter acquisition unit is used for acquiring a maximum characteristic parameter of the extreme characteristic acquisition parameter;
the evaluation value set construction unit is used for constructing an initial time distance evaluation value set;
the signal matching unit is used for matching the waveform acquisition signals in a time window through the maximum characteristic parameters to obtain maximum waveform characteristics;
the association influence value generation unit is used for obtaining adjacent peak information according to the maximum value waveform characteristic and generating a maximum association influence value according to the adjacent peak information and the time distance evaluation value set;
and the maximum waveform characteristic capturing unit is used for capturing waveform characteristics according to the maximum correlation influence value and the maximum waveform characteristics.
Further, the system further comprises:
the minimum value characteristic parameter acquisition unit is used for acquiring a minimum value characteristic parameter of the extreme value characteristic acquisition parameter;
a minimum value waveform characteristic obtaining unit, configured to perform waveform acquisition signal matching within a time window according to the minimum value characteristic parameter to obtain a minimum value waveform characteristic;
the minimum association influence value generation unit is used for acquiring adjacent trough information according to the minimum value waveform characteristics and generating a minimum association influence value according to the adjacent trough information and the time distance evaluation value set;
and the characteristic screening unit is used for screening characteristics according to the maximum correlation influence value and the minimum correlation influence value and capturing the characteristics according to a characteristic screening result.
Further, the system further comprises:
the time window matching unit is used for obtaining a matching time window of the corresponding feature verification point;
the unselected feature obtaining unit is used for obtaining unselected features in the feature screening process in the matching time window;
and the characteristic updating unit is used for updating the characteristics of the corresponding characteristic verification points according to the unselected characteristics.
Further, the system further comprises:
an abnormal feature verification point obtaining unit, configured to obtain an abnormal feature verification point set when a time alignment direction with a feature in the feature verification point set is inconsistent with the direction verification constraint information;
the characteristic point re-acquisition unit is used for re-acquiring the characteristic points of the abnormal verification characteristic point set and updating the characteristic verification point set according to an acquisition result;
a spectrum waveform synchronization unit configured to perform spectrum waveform synchronization of the first spectrum analysis device and the second spectrum analysis device according to an update result.
In the present specification, each embodiment is described in a progressive manner, and each embodiment focuses on differences from other embodiments, and the spectrum waveform synchronization method based on multiple spectrum analysis devices in the first embodiment of fig. 1 and the specific example are also applicable to the spectrum waveform synchronization system based on multiple spectrum analysis devices in this embodiment. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. A spectrum waveform synchronization method based on a plurality of spectrum analysis devices, wherein the method is applied to a spectrum waveform synchronization system, and the spectrum waveform synchronization system is in communication connection with a first spectrum analysis device and a second spectrum analysis device, and the method comprises the following steps:
connecting the first spectrum analysis device and the second spectrum analysis device, and performing time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result;
obtaining device location information for the first and second spectrum analysis devices;
acquiring signal generation position information, constructing a three-dimensional coordinate system by taking the signal generation position information as a coordinate origin, and acquiring equipment distribution coordinates according to the equipment position information and the three-dimensional coordinate system;
performing waveform adjustment direction evaluation according to the equipment distribution coordinates to generate direction verification constraint information;
acquiring waveform signals acquired by the first spectrum analysis equipment and the second spectrum analysis equipment, and capturing waveform characteristics of the waveform acquired signals to acquire characteristic capture results;
generating a feature verification point set based on the feature capture result, wherein each point in the feature verification point set has a time identifier;
and judging whether the time alignment direction with the characteristic in the characteristic verification point set is consistent with the direction verification constraint information, and if so, synchronizing the frequency spectrum waveforms of the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the characteristic verification point set.
2. The method of claim 1, wherein the method further comprises:
obtaining an adjusted time value set of matching feature points in the feature verification point set, wherein each adjusted time value in the adjusted time value set comprises a direction identifier;
obtaining an adjustment time average value according to the adjustment time value set, and generating an initial threshold value according to the adjustment time average value;
generating a fluctuation constraint threshold according to the demand information, and constructing a characteristic point adjustment constraint threshold according to the fluctuation constraint threshold and the initial threshold;
and judging whether the adjustment time value set has abnormal adjustment time which does not meet the characteristic point adjustment constraint threshold value, and adjusting the corresponding characteristic verification point according to the abnormal adjustment time.
3. The method of claim 2, wherein the method further comprises:
constructing a time window according to the demand information;
setting an extreme characteristic acquisition parameter, wherein the extreme characteristic acquisition parameter comprises an extreme characteristic constraint weight value;
and capturing the waveform characteristics of the waveform acquisition signal through the extreme value characteristic acquisition parameters and the time window.
4. The method of claim 3, further comprising:
obtaining a maximum characteristic parameter of the extreme characteristic acquisition parameter;
constructing an initial time distance evaluation value set;
matching the waveform acquisition signals in a time window through the maximum characteristic parameters to obtain maximum waveform characteristics;
obtaining adjacent peak information according to the maximum value waveform characteristic, and generating a maximum correlation influence value according to the adjacent peak information and the time distance evaluation value set;
and capturing waveform characteristics according to the maximum correlation influence value and the maximum waveform characteristics.
5. The method of claim 4, wherein the method further comprises:
obtaining a minimum value characteristic parameter of the extreme value characteristic acquisition parameter;
matching the waveform acquisition signals in a time window through the minimum value characteristic parameters to obtain minimum value waveform characteristics;
obtaining adjacent trough information according to the minimum value waveform characteristics, and generating a minimum association influence value according to the adjacent trough information and the time distance evaluation value set;
and carrying out feature screening according to the maximum correlation influence value and the minimum correlation influence value, and carrying out feature capture according to a feature screening result.
6. The method of claim 5, wherein the method further comprises:
obtaining a matching time window of the corresponding feature verification point;
obtaining unselected features in the feature screening process in the matching time window;
and updating the characteristics of the corresponding characteristic verification points according to the unselected characteristics.
7. The method of claim 1, wherein the method further comprises:
when the time alignment direction of the same feature in the feature verification point set is inconsistent with the direction verification constraint information, obtaining an abnormal feature verification point set;
feature points of the abnormal verification feature point set are collected again, and the feature verification point set is updated according to a collection result;
and performing spectrum waveform synchronization of the first spectrum analysis device and the second spectrum analysis device according to the updating result.
8. A spectrum waveform synchronization system based on a plurality of spectrum analysis devices, the system comprising:
the time correction module is used for connecting a first spectrum analysis device and a second spectrum analysis device and performing time correction on the first spectrum analysis device and the second spectrum analysis device according to a connection result;
a device location obtaining module, configured to obtain device location information of the first spectrum analysis device and the second spectrum analysis device;
the distribution coordinate acquisition module is used for acquiring signal generation position information, constructing a three-dimensional coordinate system by taking the signal generation position information as a coordinate origin, and acquiring equipment distribution coordinates according to the equipment position information and the three-dimensional coordinate system;
the constraint information generation module is used for carrying out waveform adjustment direction evaluation according to the equipment distribution coordinates and generating direction verification constraint information;
the characteristic capturing module is used for acquiring device acquisition waveform signals of the first spectrum analysis device and the second spectrum analysis device, and performing waveform characteristic capturing on the waveform acquisition signals to acquire characteristic capturing results;
a verification point set generating module, configured to generate a feature verification point set based on the feature capture result, where each point in the feature verification point set has a time identifier;
and the frequency spectrum waveform synchronization module is used for judging whether the same characteristic time alignment direction in the characteristic verification point set is consistent with the direction verification constraint information or not, and if so, carrying out frequency spectrum waveform synchronization on the first frequency spectrum analysis device and the second frequency spectrum analysis device according to the characteristic verification point set.
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