CN115248246A - High-sensitivity aerosol single-particle laser ionization device and mass spectrometer - Google Patents

High-sensitivity aerosol single-particle laser ionization device and mass spectrometer Download PDF

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CN115248246A
CN115248246A CN202110467036.0A CN202110467036A CN115248246A CN 115248246 A CN115248246 A CN 115248246A CN 202110467036 A CN202110467036 A CN 202110467036A CN 115248246 A CN115248246 A CN 115248246A
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laser
lens
reflecting
aerosol
focusing lens
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朱星高
杜绪兵
卓泽铭
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Guangzhou Hexin Instrument Co Ltd
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Guangzhou Hexin Instrument Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/64Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using wave or particle radiation to ionise a gas, e.g. in an ionisation chamber
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/164Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]

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Abstract

The invention discloses a high-sensitivity aerosol single-particle laser ionization device and a mass spectrometer. The high-sensitivity aerosol single-particle laser ionization device comprises a pulse laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens and a concave reflecting mirror; the laser system comprises a pulse laser, an ultraviolet laser reflection lens, a focusing lens, a re-reflection lens and a concave surface reflection mirror, wherein the pulse laser, the ultraviolet laser reflection lens, the focusing lens, the re-reflection lens and the concave surface reflection mirror are sequentially distributed along the forward direction of a light path, the pulse laser is used for generating pulse laser ionized aerosol single particles, the ultraviolet laser reflection lens is used for reflecting pulse laser generated by the pulse laser to the focusing lens, the focusing lens is used for focusing the pulse laser to the front surface of the aerosol single particles, the re-reflection lens is used for reflecting amplified laser which is re-amplified after being focused to the aerosol single particles to the concave surface reflection mirror, and the concave surface reflection mirror is used for reflecting and re-focusing the amplified laser to the rear surface of the aerosol single particles. The high-sensitivity aerosol single-particle laser ionization device can improve the ionization sensitivity.

Description

High-sensitivity aerosol single-particle laser ionization device and mass spectrometer
Technical Field
The invention relates to the technical field of mass spectrometry detection, in particular to a high-sensitivity aerosol single-particle laser ionization device and a mass spectrometer.
Background
As is well known, atmospheric aerosols have a great influence on the environment and on human health, and therefore, people pay more and more attention to and have further research on the atmospheric aerosols. Due to the complexity of the source and evolution of the atmospheric aerosol, the intensive research on the source, physicochemical properties and evolution mechanism of the atmospheric aerosol becomes difficult. As a novel aerosol analysis instrument, the single-particle aerosol mass spectrometer can measure the size and chemical composition of particles from a single-particle layer, and has an important role in researching the types, mixing states, sources and evolution processes of the particles in atmospheric aerosol.
The single-particle aerosol mass spectrometer comprises a sample introduction system, a vacuum system, a laser diameter measuring system, an ionization system, a mass analyzer, an electric control system, a software analysis system and the like. When the instrument works normally, a sample to be detected firstly passes through the sample introduction system, aerosol particles in the sample are converged into a particle beam passing through the center of the aerodynamic lens, particles with different particle sizes have different speeds, and the speed of the particles is smaller along with the increase of the particle sizes. After passing through the multi-stage vacuum system, the collected particles are detected by the laser diameter measuring system, information such as particle size, speed and the like of the particles is obtained through calculation, and meanwhile, the time T1 when the particles generate pulse trigger signals when passing through the diameter measuring system is recorded. According to the information, the time T2 of triggering light-emitting of the ionization laser is obtained through calculation, so that the ionization system operates when ions fly to the ionization position of the ionization laser, the particles are ionized, and the ionized band
The electric particles are analyzed in the mass analyzer, the composition information of the obtained particles can be known from the working principle of the instrument, the laser ionization system is an important component of a single-particle aerosol mass spectrometer, and the laser ionization system determines the ionization effect of the particles. Common aerosol particle ionization methods include chemical ionization, electron bombardment, ultraviolet photoionization, and laser desorption ionization. The laser desorption ionization can efficiently ionize aerosol particles with different chemical components, including low-volatility aerosol particles such as soot, dust and sea salt, and is a necessary means for realizing real-time online omnibearing detection by an instrument. However, in the conventional laser ionization mode, pulsed laser emitted by laser is reflected by a three-dimensional adjusting device and an optical lens is focused to the center of an ionization region for ionization, the ionization can only ionize one surface (close to the emitting direction of the laser) of aerosol particles, the ionization efficiency is insufficient, the ionization sensitivity is low, and the existing detection requirements are difficult to adapt.
Disclosure of Invention
Based on the above, there is a need for a high-sensitivity aerosol single-particle laser ionization device capable of recovering laser spots to be reflected and focused on aerosol particles for ionization, and improving ionization sensitivity.
A high-sensitivity aerosol single-particle laser ionization device comprises a pulse laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens and a concave reflecting mirror; the pulse laser, the ultraviolet laser reflection lens, the focusing lens, the re-reflection lens and the concave surface reflection mirror are sequentially distributed along the advancing direction of the optical path, the pulse laser is used for generating pulse laser to ionize single aerosol particles, the ultraviolet laser reflection lens is used for reflecting the pulse laser generated by the pulse laser to the focusing lens, the focusing lens is used for focusing the pulse laser to the front surface of the single aerosol particles, the re-reflection lens is used for reflecting the amplified laser which is re-amplified after being focused to the single aerosol particles to the concave surface reflection mirror, and the concave surface reflection mirror is used for reflecting and re-focusing the amplified laser to the rear surface of the single aerosol particles.
In one embodiment, the angle between the re-reflecting mirror and the plane where the focusing lens is located is 45 degrees, the angle between the concave reflecting mirror and the plane where the focusing lens is located is 45 degrees, and the reflecting surface of the re-reflecting mirror and the reflecting surface of the concave reflecting mirror are arranged in opposite directions.
In one embodiment, the high sensitivity aerosol single particle laser ionization device further comprises a lens adjustment assembly coupled to the focusing lens for adjusting the position of the focusing lens.
In one embodiment, the lens adjustment assembly can drive the focusing lens to move in a first direction, a second direction and a third direction, wherein the first direction, the second direction and the third direction are perpendicular to each other.
In one embodiment, the lens adjusting assembly comprises a lens XY moving platform and a lens Y-axis lifting platform, the focusing lens is connected to the lens XY moving platform, the lens XY moving platform is mounted on the lens Y-axis lifting platform, the lens XY moving platform is used for driving the focusing lens to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting platform is used for driving the lens XY moving platform and the focusing lens to move along the Y-axis direction.
In one embodiment, the high sensitivity aerosol single particle laser ionization device further comprises a bracket assembly to which the ultraviolet laser reflecting mirror is mounted.
In one embodiment, the position of the ultraviolet laser reflecting mirror on the bracket component is adjustable.
In one embodiment, the pulsed laser is a 266nm ultraviolet pulsed laser.
In one embodiment, the ultraviolet laser reflection lens forms an angle of 45 degrees with the emitting direction of the pulse laser and the plane where the focusing lens is located, and the ultraviolet laser reflection lens can reflect the pulse laser generated by the pulse laser to the focusing lens in an angle of 90 degrees.
It is another object of the present invention to provide a mass spectrometer.
A mass spectrometer comprises the high-sensitivity aerosol single-particle laser ionization device.
The high-sensitivity aerosol single-particle laser ionization device can recover laser spots to reflect and focus on aerosol particles again for ionization, and improves ionization sensitivity. The traditional ionization structure is that a 266nm ultraviolet pulse laser reflects emitted pulse laser and then focuses the reflected pulse laser on single aerosol particles through a focusing lens, but the structure can only focus a focusing light spot on a single surface of the single aerosol particles, and the back surface of the single aerosol particles cannot be ionized by the laser, so that the ionization efficiency of the single particle aerosol is greatly influenced, and the ionization sensitivity is further influenced; the high-sensitivity aerosol single-particle laser ionization device is additionally provided with the re-reflecting lens and the concave reflecting mirror, and the concave reflecting mirror not only has the function of reflecting laser, but also can refocus the reflected light spot on the back surface of the aerosol single particle, so that the back surface of the aerosol single particle is also focused and ionized by the laser when the pulse laser emitted by the pulse laser reaches the front surface of the aerosol single particle, and the ionization efficiency and the ionization sensitivity of the aerosol single particle are greatly improved.
When the high-sensitivity aerosol single-particle laser ionization device is used, the pulse laser generates pulse laser for ionizing aerosol single particles; the bracket component is used for fixing the ultraviolet laser reflection lens; the ultraviolet laser reflection lens is used for reflecting laser emitted by the pulse laser to the focusing lens; the lens Y-axis lifting platform and the lens XY moving platform are used for fixing the focusing lens and adjusting the movement of the focusing lens in the X-axis direction, the Y-axis direction and the Z-axis direction; the re-reflecting mirror is used for reflecting amplified laser which is re-amplified after pulse laser emitted by the pulse laser is focused on aerosol single particles to the concave reflecting mirror; the pulse laser, the ultraviolet laser reflection lens, the focusing lens, the re-reflection lens and the concave reflector are mutually matched to realize simultaneous ionization of the front surface and the rear surface of the single aerosol particle, so that the ionization efficiency and the ionization sensitivity of the single aerosol particle are improved.
According to the high-sensitivity aerosol single-particle laser ionization device, the lens adjusting assembly is arranged to drive the focusing lens to move in the first direction, the second direction and the third direction, and the focusing lens can move in the first direction, the second direction and the third direction according to actual needs so as to adjust the position and the angle.
The high-sensitivity aerosol single-particle laser ionization device realizes the movement of the focusing lens in the X-axis direction, the Y-axis direction and the Z-axis direction by arranging the lens XY moving platform and the lens Y-axis lifting platform, and the lens XY moving platform and the lens Y-axis lifting platform are simple in structure, easy to set, easy to obtain materials and low in cost.
According to the high-sensitivity aerosol single-particle laser ionization device, the bracket component is arranged for mounting the ultraviolet laser reflection lens, the ultraviolet laser reflection lens is adjustable in position on the bracket component, the angle and the position of the ultraviolet laser reflection lens can be adjusted according to actual needs, and the operation is convenient.
The mass spectrometer using the high-sensitivity aerosol single-particle laser ionization device can greatly improve the ionization efficiency and the ionization sensitivity of aerosol single particles and also improve the detection efficiency and the detection sensitivity of the mass spectrometer.
Drawings
FIG. 1 is a schematic diagram of a high sensitivity aerosol single particle laser ionization device according to one embodiment of the present invention;
fig. 2 is a schematic structural diagram of a high-sensitivity aerosol single-particle laser ionization device according to an embodiment of the present invention.
Description of the reference numerals
10. A high sensitivity aerosol single particle laser ionization device; 100. a pulsed laser; 200. an ultraviolet laser reflection lens; 300. a focusing lens; 400. a re-reflective mirror; 500. a concave reflector; 600. a lens adjustment assembly; 610. a lens XY moving stage; 620. a lens Y-axis lifting platform; 700. a bracket assembly; 20. an optical path.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the invention.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be interconnected within two elements or in a relationship where two elements interact with each other unless otherwise specifically limited. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the present invention, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may be directly contacting the second feature or the first and second features may be indirectly contacting each other through intervening media. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and the like as used herein are for illustrative purposes only and do not denote a unique embodiment.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.
Referring to fig. 1 and 2, an embodiment of the present invention provides a high sensitivity aerosol single particle laser ionization device 10.
A high sensitivity aerosol single particle laser ionization device 10 includes a pulsed laser 100, an ultraviolet laser mirror 200, a focusing lens 300, a re-mirror 400, and a concave mirror 500.
Referring to fig. 1, the pulse laser 100, the ultraviolet laser mirror 200, the focusing lens 300, the re-reflecting mirror 400 and the concave reflecting mirror 500 are sequentially distributed along the forward direction of the optical path 20.
The pulsed laser 100 is used for generating pulsed laser light to ionize aerosol single particles, the ultraviolet laser reflection mirror 200 is used for reflecting the pulsed laser light generated by the pulsed laser 100 to the focusing lens 300, the focusing lens 300 is used for focusing the pulsed laser light to the front surface of the aerosol single particles, the re-reflection mirror 400 is used for reflecting the amplified laser light which is re-amplified after being focused to the aerosol single particles to the concave mirror 500, and the concave mirror 500 is used for reflecting and re-focusing the amplified laser light to the back surface of the aerosol single particles.
In one embodiment, as shown in fig. 1, the re-reflecting mirror 400 forms an included angle of 45 ° with the plane of the focusing lens 300, the concave reflecting mirror 500 forms an included angle of 45 ° with the plane of the focusing lens 300, and the reflecting surface of the re-reflecting mirror 400 is disposed opposite to the reflecting surface of the concave reflecting mirror 500.
In one embodiment, referring to fig. 1, the high sensitivity aerosol single particle laser ionization device 10 further comprises a lens adjusting assembly 600, the lens adjusting assembly 600 is connected to the focusing lens 300, and the lens adjusting assembly 600 is used for adjusting the position of the focusing lens 300.
In one embodiment, the lens adjustment assembly 600 can drive the focusing lens 300 to move in a first direction, a second direction, and a third direction, wherein the first direction, the second direction, and the third direction are perpendicular to each other. The high-sensitivity aerosol single-particle laser ionization device 10 drives the focusing lens 300 to move in the first direction, the second direction and the third direction by arranging the lens adjusting assembly 600, and the focusing lens 300 can move in the first direction, the second direction and the third direction according to actual needs so as to adjust the position and the angle.
In one embodiment, as shown in fig. 1, the lens adjusting assembly 600 includes a lens XY moving stage 610 and a lens Y-axis elevating stage 620. The focusing lens 300 is connected to a lens XY moving platform 610, the lens XY moving platform 610 is installed on a lens Y-axis lifting platform 620, the lens XY moving platform 610 is used for driving the focusing lens 300 to move along the X-axis direction or the Y-axis direction, and the lens Y-axis lifting platform 620 is used for driving the lens XY moving platform 610 and the focusing lens 300 to move along the Y-axis direction. The high-sensitivity aerosol single-particle laser ionization device 10 realizes the movement of the focusing lens 300 in the X-axis direction, the Y-axis direction and the Z-axis direction by arranging the lens XY moving platform 610 and the lens Y-axis lifting platform 620, and the lens XY moving platform 610 and the lens Y-axis lifting platform 620 have simple structures, are easy to set, can take materials easily and have low cost.
In one embodiment, referring to fig. 1, the high sensitivity aerosol single particle laser ionization device 10 further comprises a bracket assembly 700, and the uv laser reflecting mirror 200 is mounted on the bracket assembly 700.
In one embodiment, the position of the uv laser mirror 200 on the carriage assembly 700 is adjustable. The high-sensitivity aerosol single-particle laser ionization device 10 is used for installing the ultraviolet laser reflecting lens 200 by arranging the bracket assembly 700, realizes the position adjustment of the ultraviolet laser reflecting lens 200 on the bracket assembly 700, can adjust the angle and the position of the ultraviolet laser reflecting lens 200 according to actual needs, and is convenient to operate.
In one embodiment, the pulsed laser 100 is a 266nm UV pulsed laser 100. It is understood that in other embodiments, the pulsed laser 100 is not limited to the above, and that the pulsed laser 100 may be selected from other lasers as desired.
In one embodiment, referring to fig. 2, the ultraviolet laser mirror 200 forms an angle of 45 ° with the emitting direction of the pulse laser 100 and the plane where the focusing lens 300 is located, and the ultraviolet laser mirror 200 can reflect the pulse laser generated by the pulse laser 100 to the focusing lens 300 at an angle of 90 °.
When the high-sensitivity aerosol single-particle laser ionization device 10 is used, the pulse laser 100 generates pulse laser for ionizing aerosol single particles; the bracket assembly 700 is used for fixing the ultraviolet laser reflection lens 200; the ultraviolet laser reflection mirror 200 is used for reflecting the laser light emitted by the pulse laser 100 to the focusing lens 300; the lens Y-axis elevating platform 620 and the lens XY-moving platform 610 are for fixing the focusing lens 300 and adjusting the movement of the focusing lens 300 in the X-axis direction, the Y-axis direction, and the Z-axis direction; the re-reflecting mirror 400 is used for reflecting the amplified laser light, which is re-amplified after the pulsed laser light emitted by the pulsed laser 100 is focused on the aerosol single particle, onto the concave reflecting mirror 500; the concave reflecting mirror 500 reflects and focuses the light spots reflected by the re-reflecting mirror 400 onto the single aerosol particle, and the pulse laser 100, the ultraviolet laser reflecting mirror 200, the focusing lens 300, the re-reflecting mirror 400 and the concave reflecting mirror 500 are mutually matched to realize simultaneous ionization of the front surface and the rear surface of the single aerosol particle, so that the ionization efficiency and the ionization sensitivity of the single aerosol particle are improved.
The embodiment also provides a mass spectrometer.
A mass spectrometer comprising the high sensitivity aerosol single particle laser ionization device 10 described above. The mass spectrometer using the high-sensitivity aerosol single-particle laser ionization device 10 can greatly improve the ionization efficiency and the ionization sensitivity of the aerosol single particles, and also improve the detection efficiency and the detection sensitivity of the mass spectrometer.
The mass spectrometer may be a conventional mass spectrometer such as a gas chromatography-mass spectrometer, a liquid chromatography-quadrupole mass spectrometer, a liquid chromatography-ion trap mass spectrometer, a liquid chromatography-time-of-flight mass spectrometer, a liquid chromatography-mass spectrometer, a matrix-assisted laser desorption time-of-flight mass spectrometer, a fourier transform mass spectrometer, or the like.
The high-sensitivity aerosol single-particle laser ionization device 10 can recover laser spots to reflect and focus on aerosol particles for ionization, and improves ionization sensitivity. The traditional ionization structure is that a 266nm ultraviolet pulse laser 100 reflects emitted pulse laser and then focuses the reflected pulse laser on single aerosol particles through a focusing lens 300, but the structure can only focus a focusing light spot on a single surface of the single aerosol particles, and the back surface of the single aerosol particles cannot be ionized by the laser, so that the ionization efficiency of the single particle aerosol is greatly influenced, and the ionization sensitivity is further influenced; the high-sensitivity aerosol single-particle laser ionization device 10 is additionally provided with the re-reflecting mirror 400 and the concave reflecting mirror 500, and the concave reflecting mirror 500 not only has the function of reflecting laser light, but also can refocus the reflected light spot on the back surface of the aerosol single particle, so that the back surface of the aerosol single particle is also focused and ionized by the laser light when the pulse laser light emitted by the pulse laser 100 reaches the front surface of the aerosol single particle, and the ionization efficiency and the ionization sensitivity of the aerosol single particle are greatly improved.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that various changes and modifications can be made by those skilled in the art without departing from the spirit of the invention, and these changes and modifications are all within the scope of the invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A high-sensitivity aerosol single-particle laser ionization device is characterized by comprising a pulse laser, an ultraviolet laser reflecting lens, a focusing lens, a re-reflecting lens and a concave reflecting mirror; the pulse laser, the ultraviolet laser reflection lens, the focusing lens, the re-reflection lens and the concave surface reflection mirror are sequentially distributed along the advancing direction of a light path, the pulse laser is used for generating pulse laser to ionize single aerosol particles, the ultraviolet laser reflection lens is used for reflecting the pulse laser generated by the pulse laser to the focusing lens, the focusing lens is used for focusing the pulse laser to the front surface of the single aerosol particles, the re-reflection lens is used for reflecting the amplified laser which is focused to the single aerosol particles and is amplified again to the concave surface reflection mirror, and the concave surface reflection mirror is used for reflecting and re-focusing the amplified laser to the back surface of the single aerosol particles.
2. The high sensitivity aerosol single particle laser ionization device of claim 1 wherein the re-reflecting optic forms a 45 ° angle with the plane of the focusing lens, the concave mirror forms a 45 ° angle with the plane of the focusing lens, and the reflecting surface of the re-reflecting optic is disposed opposite the reflecting surface of the concave mirror.
3. The high sensitivity aerosol single particle laser ionization device of claim 1 further comprising a lens adjustment assembly connected to the focusing lens for adjusting the position of the focusing lens.
4. The high sensitivity aerosol single particle laser ionization device of claim 3 wherein the lens adjustment assembly is capable of actuating the focusing lens to move in a first direction, a second direction and a third direction, wherein the first direction, the second direction and the third direction are perpendicular to each other.
5. The high sensitivity aerosol single particle laser ionization device of claim 3 wherein the lens adjustment assembly includes a lens XY motion stage and a lens Y axis elevation stage, the focusing lens being connected to the lens XY motion stage, the lens XY motion stage being mounted on the lens Y axis elevation stage, the lens XY motion stage being configured to drive the focusing lens to move in either the X axis direction or the Y axis direction, the lens Y axis elevation stage being configured to drive the lens XY motion stage and the focusing lens to move in the Y axis direction.
6. The high sensitivity aerosol single particle laser ionization device of any one of claims 1-5, further comprising a bracket assembly to which the ultraviolet laser reflecting mirror is mounted.
7. The high sensitivity aerosol single particle laser ionization device of claim 6 wherein the position of said uv laser reflecting mirror on said carriage assembly is adjustable.
8. The high sensitivity aerosol single particle laser ionization device of any one of claims 1-5, 7, wherein the pulsed laser is a 266nm uv pulsed laser.
9. The aerosol single particle laser ionization device with high sensitivity as claimed in any one of claims 1 to 5, 7, wherein the uv laser reflecting mirror forms an angle of 45 ° with the emitting direction of the pulse laser and the plane of the focusing lens, respectively, and the uv laser reflecting mirror can reflect the pulse laser generated by the pulse laser to the focusing lens at an angle of 90 °.
10. A mass spectrometer comprising the high sensitivity aerosol single particle laser ionization device of any of claims 1-9.
CN202110467036.0A 2021-04-28 2021-04-28 High-sensitivity aerosol single-particle laser ionization device and mass spectrometer Pending CN115248246A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115629118A (en) * 2022-11-01 2023-01-20 广东省麦思科学仪器创新研究院 Mass spectrometry device and mass spectrometry method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115629118A (en) * 2022-11-01 2023-01-20 广东省麦思科学仪器创新研究院 Mass spectrometry device and mass spectrometry method
CN115629118B (en) * 2022-11-01 2024-05-14 广东省麦思科学仪器创新研究院 Mass spectrometry apparatus and mass spectrometry method

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