CN115225885A - Electronic device and method for inspecting defect of display area of display - Google Patents

Abstract

The invention relates to an electronic device and a method for inspecting defects of a display area of a display. The method comprises the following steps: acquiring an image corresponding to a display, wherein the image comprises a display area and a non-display area, and the edge of the display area is adjacent to the non-display area; capturing an edge image corresponding to the edge of a display area of the display according to the image, wherein the edge image comprises a part of the display area and a part of a non-display area; obtaining a pixel array in the edge image and generating a regression model of the pixel array; judging whether pixels in the pixel array are abnormal or not according to the pixel array and the regression model to generate a judgment result; and outputting the judgment result. The invention can be used for detecting flaws on the edge of the display area of the display without being influenced by high-brightness contrast at the boundary of the display area and the non-display area.

Description

Electronic device and method for inspecting a display area of a display for defects

technical field

The present invention relates to an electronic device and method for inspecting a display area of a display for defects.

Background technique

After the LCD flat panel display is assembled, the display needs to be lit for image detection. The liquid crystal flat panel display is, for example, a thin film transistor liquid crystal display (TFT-LCD), and the image inspection can be used to detect whether the image of the display contains defects such as foreign objects, bright spots or dark spots. In the display area of a monitor, an area defect in which brightness or color exhibits low contrast is called Mura (the Romanized spelling of the Japanese character "風" [むら]). In the past, the detection method of the display was carried out by the quality control personnel looking at the display with the human eye. However, staring at the defects of the display for a long time, especially the low-contrast defects such as Mura, can easily cause the eyestrain of the quality control personnel, and the inspection by different quality control personnel is prone to inconsistent standards. Therefore, the detection method of implementing automated optical inspection (AOI) through optical instruments has gradually become the mainstream in the industry.

Most of the existing AOI detection methods are based on background estimation. However, since a part of the display area and part of the non-display area included in the edge area of the display have significant brightness differences, the background estimation method is difficult to be applied to detect the edge area of the display. For example, the low-contrast flaws in the display area are very inconspicuous compared to the brightness difference at the interface between the display area and the non-display area, so the low-contrast flaws are easily ignored. If the position of the display area of the display can be accurately positioned, the optical instrument can eliminate the interference caused by the above-mentioned difference in brightness. However, it is difficult to completely fix the position of the monitor or the camera.

The "Background Art" section is only used to help understand the content of the present invention, so the content disclosed in the "Background Art" section may contain some that do not constitute the prior art known to those with ordinary knowledge in the technical field. The content disclosed in the "Background Art" section does not represent the content or the problem to be solved by one or more embodiments of the present invention, and has been known or recognized by those of ordinary skill in the art before the present invention is filed.

SUMMARY OF THE INVENTION

The present invention provides an electronic device and method for inspecting a display area of a display for defects, which can be applied to an edge area of the display area of a display.

The present invention provides an electronic device for inspecting a display area of a display for defects, comprising a transceiver, a storage medium and a processor. The storage medium stores a plurality of modules. The processor is coupled to the storage medium and the transceiver, and accesses and executes a plurality of modules, wherein the plurality of modules includes a data collection module and an operation module. The data collection module obtains an image corresponding to the display through the transceiver, wherein the image includes a display area and a non-display area, wherein the edge of the display area is adjacent to the non-display area. The computing module is configured to perform: extracting an edge image corresponding to an edge of a display area of the display according to the image, wherein the edge image includes part of the display area and part of the non-display area; obtaining a pixel array in the edge image, and generating the pixel array according to the pixel array and the regression model to determine whether the pixels in the pixel array are abnormal to generate a judgment result; and output the judgment result through the transceiver.

The present invention provides a method for inspecting a display area of a display for defects, comprising: obtaining an image corresponding to the display, wherein the image includes a display area and a non-display area, wherein the edge of the display area is adjacent to the non-display area; Corresponding to the edge image of the edge of the display area of the display, wherein the edge image includes part of the display area and part of the non-display area; obtain the pixel array in the edge image, and generate a regression model of the pixel array; judge according to the pixel array and the regression model whether a pixel in the pixel array is abnormal to generate a judgment result; and output the judgment result.

Based on the above, the present invention can be used to detect defects at the edges of the display area of a display without being affected by the high brightness contrast at the interface between the display area and the non-display area.

In order to make the above-mentioned features and advantages of the present invention more obvious and easy to understand, the following embodiments are given and described in detail with the accompanying drawings as follows.

Description of drawings

FIG. 1 is a schematic diagram illustrating an electronic device according to an embodiment of the present invention.

FIG. 2 is a schematic diagram illustrating a plurality of images of a display according to an embodiment of the present invention.

FIG. 3 is a schematic diagram illustrating capturing an edge image of a display area of a display according to an embodiment of the present invention.

4 is a flowchart illustrating a method of inspecting a display area of a display for defects according to an embodiment of the present invention.

Reference number:

100: Electronics

110: Processor

120: Storage Media

121: Data Collection Module

122: Operation module

130: Transceiver

200: Video

30: Display

300: Processed image

310: Non-display area

320: Display area

321, 322, 323, 324: Edge image

400: Mask image

50: Flaws

S401, S402, S403, S404, S405: Steps

Detailed ways

In order to make the content of the present invention more comprehensible, the following specific embodiments are given as examples according to which the present invention can indeed be implemented. Additionally, where possible, elements/components/steps using the same reference numerals in the figures and embodiments represent the same or similar parts.

FIG. 1 is a schematic diagram illustrating an electronic device 100 according to an embodiment of the present invention. The electronic device 100 may be used to inspect the display area of the display for defects (eg, Mura defects). The electronic device 100 may include a processor 110 , a storage medium 120 and a transceiver 130 .

The processor 110 is, for example, a central processing unit (CPU), or other programmable general-purpose or special-purpose micro control unit (micro control unit, MCU), microprocessor (microprocessor), digital signal processor (digital signal processor) signal processor, DSP), programmable controller, application specific integrated circuit (ASIC), graphics processor (graphics processing unit, GPU), image signal processor (image signal processor, ISP), image processing unit (image processing unit) unit, IPU), arithmetic logic unit (arithmetic logic unit, ALU), complex programmable logic device (complex programmable logic device, CPLD), field programmable gate array (field programmable gate array, FPGA) or other similar components or the above components The combination. The processor 110 may be coupled to the storage medium 120 and the transceiver 130 , and access and execute various modules and various application programs stored in the storage medium 120 .

The storage medium 120 is, for example, any type of fixed or removable random access memory (RAM), read-only memory (ROM), flash memory, hard disk drive , HDD), solid state drive (solid state drive, SSD) or similar elements or a combination of the above elements, and are used to store a plurality of modules or various application programs that can be executed by the processor 110. In this embodiment, the storage medium 120 can store a plurality of modules including the data collection module 121 and the operation module 122, and the functions thereof will be described later.

The transceiver 130 transmits and receives signals in a wireless or wired manner. Transceiver 130 may also perform operations such as low noise amplification, impedance matching, frequency mixing, up or down frequency conversion, filtering, amplification, and the like.

FIG. 2 is a schematic diagram illustrating a plurality of images of a display according to an embodiment of the present invention. The data collection module 121 can obtain the image 200 corresponding to the display through the transceiver 130 . Image 200 may correspond to a closed display or a display showing a black screen.

The image 200 may be a grayscale image. If the image 200 is not a grayscale image, the operation module 122 may first convert the image 200 into a grayscale image. Although the image 200 in FIG. 2 only includes a partial image of the upper left corner of the display, the present invention is not limited thereto. For example, a complete display may be included in image 200 .

The image 200 may include a display area and a non-display area of the display (eg, the display area 320 and the non-display area 310 of the display 30 as shown in FIG. 3 ). The edge of the display area 320 may be adjacent to the non-display area 310 . In other words, in the image 200, the boundary between the display area and the non-display area of the display may be an image with high brightness contrast or high color contrast. The existing automatic optical inspection technology is easily affected by images with high brightness contrast or high color contrast, resulting in erroneous judgment results. For example, image 200 contains flaw 50 . However, the flaw 50 appears very inconspicuous compared to the high contrast image at the interface of the display area and the non-display area.

In order to inspect the edge of the display area of the display for defects, the arithmetic module 122 may obtain an edge image of the edge of the display area 320 of the display 30 . FIG. 3 is a schematic diagram illustrating capturing an edge image of a display area of a display according to an embodiment of the present invention.

In order to make the defects in the display area of the display more obvious and filter out the lattice texture of the display, after the data collection module 121 obtains the image 200 corresponding to the display, the computing module 122 may first perform image preprocessing on the image 200 to A processed image 300 is generated, as shown in FIG. 2 . The image preprocessing may include gamma correction or low-pass filtering, etc., but the invention is not limited thereto.

The computing module 122 can capture edge images corresponding to the edges of the display area 320 of the display 30 from the processed image 300 . In this embodiment, the computing module 122 can obtain, from the processed image 300 , the edge image 321 corresponding to the left edge of the display area 320 of the display 30 , the edge image 322 corresponding to the right edge of the display area 320 of the display 30 , the edge image 322 corresponding to the right edge of the display area 320 of the display 30 . The edge image 323 at the upper edge of the display area 320 of the display 30 and the edge image 324 corresponding to the lower edge of the display area 320 of the display 30 are shown. The above-mentioned edge images 321 , 322 , 323 , and 324 respectively include an edge portion of the display area 310 of the display 30 and a portion of the non-display area. That is to say, the computing module 122 can capture two edge images (ie, the edge image 321 and the edge image 322 ) respectively from the two short sides corresponding to the display area 320 , and can capture two edge images corresponding to the two long sides of the display area 320 , respectively. Two edge images (ie, the edge image 323 and the edge image 324) are captured respectively. For the convenience of description, the following will take the edge image 321 as an example to describe the embodiments of the present invention.

The edge image 321 may include part of the display area 320 and part of the non-display area 310 . After obtaining the edge image 321 , the computing module 122 can obtain the pixel array from the edge image 321 . In one embodiment, the edge image 321 can be a rectangle, and the extending direction of the pixel array is parallel to the long side of the rectangle. For example, the long side of the edge image 321 (a short side of the display area 320 ) is parallel to the y-axis. Therefore, the operation module 122 can obtain the image of the pixel array parallel to the y-axis from the edge image 321 .

After obtaining the pixel array parallel to the y-axis, the operation module 122 can generate a regression model of the pixel array. The regression model is, for example, a polynomial regression model I', as shown in formula (1), where d is the polynomial order and am is the _mth order polynomial parameter. The operation module 122 may, for example, obtain each polynomial parameter am according to the least squares method ( _LS ).

I′(y)=∑ _0≤m≤d a _m y ^m …(1)

After obtaining the regression model, the operation module 122 can determine whether the pixels in the pixel array are abnormal according to the pixel array and the regression model to generate a determination result, and can output the determination result through the transceiver 130 for reference by quality control personnel. Specifically, the operation module can calculate the norm r(y) of the difference between the pixel array and the regression model according to formula (2), where I(y) is the value of the pixel in the pixel array.

r(y)=||I(y)-I′(y)||…(2)

After obtaining the norm r(y) of the difference between the pixel array and the regression model, the operation module 122 can determine whether the pixel corresponding to the norm r(y) is an abnormal pixel according to the norm r(y). Specifically, the operation module 122 may determine that the pixel corresponding to the norm r(y) is abnormal in response to the norm r(y) being greater than the threshold. For example, the operation module 122 may determine that the pixel whose y-coordinate value is equal to y1 in the pixel array is an abnormal pixel in response to the norm r(y1) being greater than the threshold. The operation module 122 can generate a judgment result accordingly.

In one embodiment, the computing module 122 can dynamically adjust the threshold. For example, the operation module 122 may dynamically adjust the threshold, eg, based on the Niblack algorithm.

In addition to outputting the judgment result, the operation module 122 can also generate a mask image corresponding to the edge image according to the judgment result, wherein the mask image can include marks corresponding to abnormal pixels. The operation module 122 can output the mask image through the transceiver 130 for reference by the quality control personnel. Specifically, the operation module 122 can generate a mask image of the edge image according to formula (3), where m(y) is a value corresponding to a pixel in the mask image of the pixel array, and th is a threshold.

For example, m(y1) equal to 1 means that the pixel with y coordinate value y1 in the mask image can be marked as black, and m(y1) equal to 0 means that the pixel with y coordinate value y1 in the mask image can be marked as black. Marked in white. The mask image 400 is shown in FIG. 2 . The operation module 122 can generate the mask image 400 corresponding to the processed image 300 according to the formula (3). In the mask image 400, the arithmetic module 122 may mark the pixels corresponding to the defect 50 as black (abnormal pixels), and mark the remaining pixels as white. In this way, the quality control personnel can easily identify the position of the defect 50 on the display from the mask image 400 .

According to the above method, the computing module 122 can respectively generate a mask image corresponding to the edge image 321 , a mask image corresponding to the edge image 322 , a mask image corresponding to the edge image 323 and a mask image corresponding to the edge image 324 . . The computing module 122 can fuse the four mask images into one defect mask image, and output the defect mask image through the transceiver 130 for reference by quality control personnel.

FIG. 4 is a flowchart illustrating a method for inspecting a display area of a display for defects according to an embodiment of the present invention, wherein the method may be implemented by the electronic device 100 shown in FIG. 1 . In step S401, an image corresponding to the display is obtained, wherein the image includes a display area and a non-display area of the display, and an edge of the display area is adjacent to the non-display area. In step S402, an edge image corresponding to the edge of the display area of the display is captured according to the image, wherein the edge image includes part of the display area and part of the non-display area. In step S403, the pixel array in the edge image is obtained, and a regression model of the pixel array is generated. In step S404, it is determined whether the pixels in the pixel array are abnormal according to the pixel array and the regression model to generate a determination result. In step S405, the judgment result is output.

To sum up, the present invention can be used to detect the edge area of the display area of the display without being affected by the high brightness contrast at the interface between the display area and the non-display area. The regression model generated according to the pixel array can be used to detect each pixel in the pixel array, so as to determine whether there is an abnormal pixel. The present invention can also perform image preprocessing or grayscale on the image with the display, so as to make the defects more obvious. After judging the abnormal pixels, the present invention can generate a mask image related to the judgment result. Quality control personnel can easily determine the exact location of defects on the display based on the mask image.

The above descriptions are only preferred embodiments of the present invention, and should not limit the scope of implementation of the present invention, all simple equivalent changes and modifications made according to the claims of the present invention and the contents of the description are still within the scope of the present invention. within the scope of the invention patent. In addition, any embodiment of the present invention or the solutions of the claims are not required to achieve all of the objects or advantages or features disclosed in the present invention. In addition, the abstract section and the title are only used to aid the search of patent documents and are not intended to limit the scope of the present invention. In addition, the terms such as "first" and "second" mentioned in this specification or the claims are only used to name the elements or to distinguish different embodiments or ranges, and are not used to limit the number of elements. upper or lower limit.

Claims (20)

1. An electronic device for inspecting defects in a display area of a display, wherein the electronic device comprises: a transceiver, a storage medium and a processor; wherein, the storage medium stores a plurality of modules; and The processor is coupled to the storage medium and the transceiver, and accesses and executes the plurality of modules, wherein the plurality of modules includes: a data collection module to obtain, through the transceiver, an image corresponding to the display, wherein the image includes the display area and a non-display area, wherein an edge of the display area is adjacent to the non-display area; and an arithmetic module configured to perform: capturing an edge image corresponding to the edge of the display area of the display according to the image, wherein the edge image includes a portion of the display area and a portion of the non-display area; obtaining a pixel array in the fringe image, and generating a regression model of the pixel array; Judging whether the pixels in the pixel array are abnormal according to the pixel array and the regression model to generate a judgment result; and The judgment result is output through the transceiver. 2 . The electronic device according to claim 1 , wherein the operation module calculates a norm of the difference between the pixel array and the regression model, and in response to the norm being greater than a threshold, judging that the The pixels of the norm are anomalous. 3 . The electronic device of claim 1 , wherein the edge image is a rectangle, and an extending direction of the pixel array is parallel to a long side of the rectangle. 4 . 4. The electronic device of claim 1, wherein the image is a grayscale image. 5 . The electronic device of claim 1 , wherein the computing module performs image preprocessing on the image to generate a processed image, and extracts the edge image from the processed image, wherein the The operation module performs the image preprocessing according to at least one of the following: Gamma correction and low pass filtering. 6 . The electronic device according to claim 1 , wherein the regression model is a polynomial regression model. 7 . 7 . The electronic device according to claim 1 , wherein the operation module generates the regression model according to a least squares method. 8 . 8 . The electronic device according to claim 1 , wherein the operation module generates a mask image corresponding to the edge image according to the judgment result, wherein the mask image comprises a mask image corresponding to the pixel. 9 . mark. 9 . The electronic device according to claim 8 , wherein the display area is a rectangle, wherein the operation module captures two edge images from two long sides corresponding to the display area, respectively, 9 . And two edge images are respectively captured from the two short sides corresponding to the display area, wherein the computing module generates the mask images according to the respective edge images, and fuses the four mask images into a blemish mask image. 10. The electronic device of claim 1, wherein the image is mapped on one of the following: the display that is turned off and the display that displays a black screen. 11. A method of inspecting a display area of a display for defects, comprising: obtaining an image corresponding to the display, wherein the image includes the display area and a non-display area, wherein an edge of the display area is adjacent to the non-display area; capturing an edge image corresponding to the edge of the display area of the display according to the image, wherein the edge image includes a portion of the display area and a portion of the non-display area; obtaining a pixel array in the fringe image, and generating a regression model of the pixel array; Judging whether the pixels in the pixel array are abnormal according to the pixel array and the regression model to generate a judgment result; and The judgment result is output. 12. The method according to claim 11, wherein the step of judging whether the pixels in the pixel array are abnormal to generate the judgment result according to the pixel array and the regression model comprises: A norm of the difference between the pixel array and the regression model is calculated, and the pixel corresponding to the norm is determined to be abnormal in response to the norm being greater than a threshold. 13 . The method of claim 11 , wherein the edge image is a rectangle, and an extending direction of the pixel array is parallel to a long side of the rectangle. 14 . 14. The method of claim 11, wherein the image is a grayscale image. 15. The method of claim 11, wherein the step of capturing the edge image corresponding to the edge according to the image comprises: Image preprocessing is performed on the image to generate a processed image, and the edge image is extracted from the processed image, wherein the step of performing the image preprocessing on the image to generate the processed image comprises: The image preprocessing is performed according to at least one of gamma correction and low pass filtering. 16. The method of claim 11, wherein the regression model is a polynomial regression model. 17. The method of claim 11, further comprising: The regression model is generated according to the least squares method. 18. The method of claim 11, further comprising: A mask image corresponding to the edge image is generated according to the determination result, wherein the mask image includes a mark corresponding to the pixel. 19 . The method of claim 18 , wherein the display area is a rectangle, and the method further comprises: capturing two edge images from two long sides corresponding to the display area, respectively. 20 . ; extract two of the edge images from the two short sides corresponding to the display area; generate the mask image according to each of the edge images; and fuse the four mask images into a defect mask image . 20. The method of claim 11, wherein the image is mapped to one of: the display turned off and the display showing a black screen.

Images