CN115219971A - Oscilloscope waveform checking method, device, equipment and storage medium - Google Patents
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Abstract
The application discloses an oscilloscope waveform checking method, device, equipment and storage medium, which relate to the technical field of electronics and comprise the following steps: performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform; calling a standard envelope curve which is prestored in an oscilloscope under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of a target envelope curve to obtain a corresponding calculation result; it is determined whether the target waveform belongs to a distorted state based on the calculation result. The method comprises the steps of obtaining a target envelope curve by performing fast Fourier transform on an obtained measured target waveform, performing corresponding calculation on frequency points corresponding to the target envelope curve and a standard envelope curve in a software system of an oscilloscope to obtain a corresponding calculation result of each frequency point, and determining whether the target waveform is distorted based on the calculation results, so that automatic real-time inspection or inspection of single-time waveform capture triggered by a user manually is realized, and invalid waveform testing is avoided.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to an oscilloscope waveform checking method, device, equipment and storage medium.
Background
Oscilloscopes are instruments that are widely used in circuits to measure signals and are based on time domain measurements, which are curves of voltage versus time. However, the Digital sampling oscilloscope mainly used at present has a principle of discrete Digital sampling of signals input to the oscilloscope by an ADC (Analog-to-Digital Converter) and reconstruction recovery by a computer system integrated in the oscilloscope. The analog input channel is limited by the electrical characteristics of the analog input channel, the ADC sampling rate has an upper limit, and the effective bandwidths of different oscilloscopes are different. When the oscilloscope is used, the cable for connecting the tested signal and the probe or the connector at one end of the cable also have the upper bandwidth limit, and the bandwidth of the whole test system is formed by combining the bandwidth of the oscilloscope. The lowest of the two determines the bandwidth of the system as a whole. Signals exceeding the bandwidth of the measurement system are attenuated, that is, signals exceeding the bandwidth of an oscilloscope, an equipment cable and a probe are attenuated, and finally waveform signals observed from a time domain angle are distorted. The current oscilloscope does not have a detection function for measuring whether the system bandwidth is higher than the signal bandwidth, and an oscilloscope user can judge according to a measured signal and self experience technology only by displaying the current sampling rate and the current test bandwidth. When the oscilloscope is used, the bandwidth of a test system formed by the oscilloscope and the probe is lower than that of a tested signal, so that the test result is invalid.
In summary, when the measurement bandwidth of the oscilloscope and the probe is lower than the actual bandwidth of the signal, how to prompt the user to confirm the validity of the current waveform and avoid obtaining an incorrect check result is a technical problem to be solved in the field.
Disclosure of Invention
In view of the above, the present invention provides a method, an apparatus, a device, and a storage medium for checking an oscilloscope waveform, which can prompt a user to confirm validity of a current waveform and avoid obtaining an erroneous checking result when a bandwidth measured by an oscilloscope and a probe is lower than an actual bandwidth of a signal. The specific scheme is as follows:
in a first aspect, the present application discloses an oscilloscope waveform checking method, comprising:
performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform;
calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result;
determining whether the target waveform belongs to a distorted state based on the calculation result.
Optionally, before performing the fast fourier transform on the acquired target waveform, the method further includes:
and detecting the signal to be detected by using an oscilloscope to obtain a corresponding target waveform.
Optionally, before the method for calling the standard envelope curve under the same test condition stored in the oscilloscope in advance, the method further includes:
and detecting the signal with the bandwidth larger than the measurement system bandwidth of the oscilloscope by using the oscilloscope to obtain the corresponding standard waveform.
Optionally, before the detecting, by using the oscilloscope, a signal larger than a measurement system bandwidth of the oscilloscope to obtain a corresponding standard waveform, the method further includes:
and determining the bandwidth of the test system through the bandwidth of a cable connected with a signal, the bandwidth of a probe and/or a connector at one end of the cable and the bandwidth of the oscilloscope.
Optionally, the detecting, by using the oscilloscope, a signal larger than a measurement system bandwidth of the oscilloscope to obtain a corresponding standard waveform includes:
and detecting the signals transmitted by the continuous step signals or the high-frequency signal elements by using the oscilloscope to obtain corresponding standard waveforms.
Optionally, after the standard envelope curve under the same test condition pre-stored in the oscilloscope is retrieved, the method further includes:
and carrying out corresponding scaling processing on the target envelope line according to the calculated scaling ratio to obtain a scaled target envelope line.
Optionally, the determining whether the target waveform belongs to a distortion state based on the calculation result includes:
and if the calculation result is smaller than a preset difference value, determining that the actual bandwidth of the signal corresponding to the target waveform exceeds a standard bandwidth, and determining that the target waveform belongs to a distortion state.
In a second aspect, the present application discloses an oscilloscope waveform inspecting apparatus, comprising:
the envelope curve acquisition module is used for carrying out fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform;
the result calculation module is used for calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result;
and the waveform detection module is used for determining whether the target waveform belongs to a distortion state or not based on the calculation result.
In a third aspect, the present application discloses an electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program to implement the steps of the oscilloscope waveform inspection method disclosed in the foregoing.
In a fourth aspect, the present application discloses a computer readable storage medium for storing a computer program; wherein the computer program when executed by a processor implements the steps of the oscilloscope waveform inspection method disclosed above.
Therefore, the application discloses an oscilloscope waveform checking method, which comprises the following steps: performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform; calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result; determining whether the target waveform belongs to a distorted state based on the calculation result. Therefore, the obtained measured target waveform is subjected to fast Fourier transform to obtain a target envelope curve, then frequency points corresponding to the target envelope curve and the standard envelope curve are correspondingly calculated in a software system of the oscilloscope, the calculation result of each corresponding frequency point is obtained, whether the target waveform is distorted or not is determined based on the calculation result, when the existing situation that the measurement bandwidth of the oscilloscope and the probe is lower than the actual bandwidth of a signal occurs, a user can be prompted to confirm the validity of the current waveform, automatic real-time inspection or inspection of single-time waveform capture triggered by the user manually is realized, and invalid waveform test is avoided.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flow chart of an oscilloscope waveform inspection method disclosed in the present application;
FIG. 2 is a diagram of an oscilloscope apparatus according to the present disclosure;
FIG. 3 is a flow chart of a particular oscilloscope waveform inspection method disclosed herein;
FIG. 4 is a graph comparing frequency response curves disclosed herein;
FIG. 5 is a schematic diagram of an oscilloscope waveform inspection apparatus according to the present disclosure;
fig. 6 is a block diagram of an electronic device disclosed in the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Oscilloscopes are instruments that are widely used in circuits to measure signals and are based on time domain measurements, which are curves of voltage versus time. However, the principle of the digital sampling oscilloscope mainly used at present is based on that the ADC performs discrete digital sampling on the signal input to the oscilloscope and the reconstruction is recovered through a computer system integrated in the oscilloscope. The analog input channel is limited by the electrical characteristics of the analog input channel, the sampling rate of the ADC has an upper limit, and effective bandwidths of different oscilloscopes are different. When the oscilloscope is used, the cable for connecting the tested signal and the probe or the connector at one end of the cable also have the upper bandwidth limit, and the bandwidth of the whole test system is formed by combining the bandwidth of the oscilloscope. The lowest of the two determines the bandwidth of the system as a whole. Signals exceeding the bandwidth of the measurement system are attenuated, that is, signals exceeding the bandwidths of the oscilloscope, the equipment cable and the probe are attenuated, and finally waveform signals observed from time domain angles are distorted. The current oscilloscope has no detection function for measuring whether the system bandwidth is higher than the signal bandwidth, and the oscilloscope user can judge according to the measured signal and the self experience technology only by displaying the current sampling rate and the test bandwidth. When the oscilloscope is used, the bandwidth of a test system formed by the oscilloscope and the probe is lower than that of a tested signal, so that the test result is invalid.
Therefore, the application discloses an oscilloscope waveform checking scheme, which can prompt a user to confirm the validity of the current waveform and avoid obtaining an error checking result when the situation that the measurement bandwidth of an oscilloscope and a probe is lower than the actual bandwidth of a signal occurs.
Referring to fig. 1, an embodiment of the present invention discloses an oscilloscope waveform checking method, including:
step S11: and performing fast Fourier transform on the acquired target waveform to obtain a target envelope of the frequency domain waveform.
In this embodiment, the signal generated by the capturing instrument is subjected to FFT (Fast Fourier Transform) conversion. And storing the frequency domain curve after the FFT, and taking an envelope curve of the frequency domain curve. The horizontal axis of the FFT-transformed curve and its envelope represents frequency, and the vertical axis represents power level.
In this embodiment, before performing fast fourier transform on the acquired target waveform, the method further includes: and detecting the signal to be detected by using an oscilloscope to obtain a corresponding target waveform. It will be appreciated that the oscilloscope is used to capture the signal under test and generate the corresponding target waveform profile and record the voltage range, cable and probe type currently in use.
Step S12: and calling a standard envelope curve which is pre-stored in an oscilloscope under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result.
In this embodiment, a corresponding stored frequency response curve is selected according to a currently used voltage range, a cable, and a probe type, that is, a corresponding standard envelope is selected, it can be understood that corresponding integral calculation is performed on the selected standard envelope, a corresponding power effective value is determined, a corresponding scaling ratio is obtained, a standard frequency point on the standard envelope and a target frequency point on the target envelope are correspondingly calculated, and an error result of a corresponding frequency point between corresponding curves is obtained.
In this embodiment, before the step of calling the standard envelope curve under the same test condition pre-stored in the oscilloscope, the method further includes: and detecting a signal with a bandwidth larger than the measurement system bandwidth of the oscilloscope by using the oscilloscope to obtain a corresponding standard waveform. It can be understood that, first, a step signal generator or a high frequency signal source is connected to the oscilloscope and the test cable to obtain a corresponding signal larger than the bandwidth of the measurement system of the oscilloscope, where the high frequency signal source may be a vector network analyzer, or a function generator or other instrument that can generate a specific high frequency sine wave signal according to a setting, and the bandwidth of the signal that can be generated at the highest level should be higher than the bandwidth of the oscilloscope, and in this embodiment, it is recommended that the bandwidth of the oscilloscope should be higher than 1.5 times. During testing, the vector network analyzer or the function generator should generate a sine signal with constant amplitude, which is equivalent to 0.75 to 1.5 times of the bandwidth of the oscilloscope, and perform scanning. The oscilloscope synchronously records the amplitude of input signals under different frequencies, and draws a frequency response curve according to the horizontal axis as frequency and the vertical axis as signal power. The step signal generator should generate a step signal rise time Tr less than 0.35 divided by the oscilloscope bandwidth. It is recommended in this embodiment that Tr be less than 0.2 divided by the oscilloscope bandwidth. The oscilloscope performs FFT conversion on the measured step signal and stores the envelope curve of the result. The obtained frequency response curve and the corresponding voltage range, channel, cable and probe information of the oscilloscope used for testing are stored in a memory of the oscilloscope, and when a user uses the same configuration combination to test, the frequency response curve measured in advance can be used for checking whether the current test waveform has the possibility of distortion caused by insufficient instrument measurement bandwidth. The standard envelope curve can be tested and solidified into a product by an oscilloscope manufacturer in a research and development stage, and can also be a bandwidth calibration curve obtained by a user through self calibration test. The verification test is characterized by the possibility of using a high frequency signal source which generates a signal frequency that should be 1.5 times higher than the oscilloscope bandwidth. The high-frequency signal source can be a vector network analyzer or a function generator. A step signal generator may also be used whose rise time should be 0.25 divided by the oscilloscope bandwidth. The curve is obtained by taking envelope lines after FFT conversion of signals generated by an oscilloscope through a specified cable and a probe test signal generating instrument. The horizontal axis is frequency in Hz, and the vertical axis is power in dBm.
In this embodiment, before the detecting, by using the oscilloscope, a signal larger than a measurement system bandwidth of the oscilloscope to obtain a corresponding standard waveform, the method further includes: and determining the bandwidth of the test system through the bandwidth of a cable connected with a signal, the bandwidth of a probe and/or a connector at one end of the cable and the bandwidth of the oscilloscope. It will be appreciated that the result detection method of the present invention, as described with reference to fig. 2, may be implemented by a software program running on an oscilloscope system. The bandwidth of the oscilloscope is affected by not only the oscilloscope itself, but also different voltage ranges of the oscilloscope, and a test cable, a probe, or a connector used for connecting the oscilloscope and a signal to be tested during testing, so that a frequency response calibration curve, referred to as a calibration curve for short, needs to be obtained for different voltage ranges, cable, and probe combinations for checking whether the signal to be tested is higher than the bandwidth of the oscilloscope measurement system.
Step S13: determining whether the target waveform belongs to a distorted state based on the calculation result.
In this embodiment, it is determined whether the actual bandwidth of the measurement signal exceeds the bandwidths of the oscilloscope, the cable and the probe used in the oscilloscope, based on the error calculation result of each frequency point, and if the actual bandwidth of the measurement signal exceeds the bandwidths of the oscilloscope, the detection result is in a distorted state, that is, the detection result is inaccurate, and a user needs to be prompted.
Therefore, the application discloses an oscilloscope waveform checking method, which comprises the following steps: performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform; calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result; determining whether the target waveform belongs to a distorted state based on the calculation result. Therefore, the obtained measured target waveform is subjected to fast Fourier transform to obtain a target envelope curve, then frequency points corresponding to the target envelope curve and the standard envelope curve are correspondingly calculated in a software system of the oscilloscope, the calculation result of each corresponding frequency point is obtained, whether the target waveform is distorted or not is determined based on the calculation result, when the existing situation that the measurement bandwidth of the oscilloscope and the probe is lower than the actual bandwidth of a signal occurs, a user can be prompted to confirm the validity of the current waveform, automatic real-time inspection or inspection of single-time waveform capture triggered by the user manually is realized, and invalid waveform test is avoided.
Referring to fig. 3, the embodiment of the present invention discloses a specific method for inspecting waveform of an oscilloscope, and compared with the previous embodiment, the present embodiment further describes and optimizes the technical solution. Specifically, the method comprises the following steps:
step S21: and performing fast Fourier transform on the acquired target waveform to obtain a target envelope of the frequency domain waveform.
Step S22: and detecting the signals transmitted by the continuous step signals or the high-frequency signal elements by using an oscilloscope to obtain corresponding standard waveforms, and performing corresponding fast Fourier transform on the standard waveforms to obtain and store corresponding standard envelope curves.
For a more detailed processing procedure in steps S21 and S22, please refer to the foregoing disclosed embodiment, which is not described herein again.
Step S23: and calling a standard envelope curve which is pre-stored in the oscilloscope under the same test condition, and carrying out corresponding scaling processing on the target envelope curve according to the calculated scaling ratio to obtain a scaled target envelope curve.
In this embodiment, the waveform stored in the oscilloscope further includes a voltage range shift, an oscilloscope channel, an externally connected test cable, and probe information, so that when performing comparison, the oscilloscope control system automatically retrieves a curve that is the same as the current test condition, that is, the voltage range shift, the oscilloscope channel, the externally connected test cable, and the probe information are completely the same, and performs comparison. Referring to fig. 4, after performing fast fourier transform on a signal captured by the current oscilloscope to obtain a frequency domain curve of the signal captured by the current oscilloscope, a corresponding stored frequency response curve is selected according to a currently used voltage range, a cable, and a probe type for comparison. It should be noted that the voltage range of the oscilloscope, and the stored standard frequency corresponding curves corresponding to the cable and the probe type must be selected for comparison, because the comparison steps are as follows: firstly, searching a frequency interval in which the amplitude attenuation slope is greater than 10 dB/decade frequency in a stored curve, taking a waveform W1 within 20% -80% of the interval, marking the frequency as F1 and F2, and calculating the effective power value within the frequency band through integration, and marking the effective power value as A. And performing FFT operation on the test result, taking a envelope curve, taking a waveform W2 in the frequency range of F1-F2, and calculating the effective power value to be B through integration, thereby obtaining the curve scaling ratio A = A/B. And scaling the envelope W3 after the test result is subjected to FFT by taking A as a proportion to obtain a curve W2, and prompting the oscilloscope user that no corresponding verification curve exists currently if the user finds that no corresponding verification curve exists currently during execution, so that verification test can be performed or neglected.
Step S24: and calculating the standard frequency point of the standard envelope curve and the target frequency point of the target envelope curve after scaling to obtain a corresponding calculation result.
In this example, W3 was compared with W1. And calculating whether the frequency point error of more than 50% of the two curves is less than 3dB or not, and obtaining corresponding calculation results.
Step S25: and if the calculation result is smaller than a preset difference value, determining that the actual bandwidth of the signal corresponding to the target waveform exceeds a standard bandwidth, and determining that the target waveform belongs to a distortion state.
In this embodiment, if more than 50% of the frequency point errors of the two curves are less than 3dB, it is considered that the actual bandwidth of the measurement signal at this time exceeds the bandwidths of the oscilloscope, the cable and the probe used in the oscilloscope, and a user should be prompted.
Therefore, in the embodiment, the standard envelope curve which is the same as the current detection condition is automatically called by the oscilloscope control system to perform parameter calculation and comparison with the current target envelope curve, so that a corresponding calculation result is obtained, whether the current signal to be detected is a signal meeting the requirement is judged based on the calculation result, and the result is prompted to a user, so that the problem of inaccuracy caused by the fact that the oscilloscope does not have a detection function of measuring whether the system bandwidth is higher than the signal bandwidth and needs to judge the detection result by depending on the detected signal and the self experience technology is solved, the accuracy of signal detection is improved, and the waste of labor cost is reduced.
Referring to fig. 5, an embodiment of the present invention discloses a specific oscilloscope waveform checking apparatus, including:
an envelope acquisition module 11, configured to perform fast fourier transform on the acquired target waveform to obtain a target envelope of the frequency domain waveform;
the result calculating module 12 is configured to call a standard envelope curve under the same test condition, which is pre-stored in the oscilloscope, and calculate a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result;
and a waveform detection module 13, configured to determine whether the target waveform belongs to a distorted state based on the calculation result.
Therefore, the application discloses an oscilloscope waveform checking method, which comprises the following steps: performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform; calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result; determining whether the target waveform belongs to a distorted state based on the calculation result. Therefore, the obtained measured target waveform is subjected to fast Fourier transform to obtain a target envelope curve, then corresponding calculation is carried out on frequency points corresponding to the target envelope curve and the standard envelope curve in a software system of the oscilloscope, corresponding calculation results of all the frequency points are obtained, whether the target waveform is distorted or not is determined based on the calculation results, when the existing situations that the measurement bandwidth of the oscilloscope and the probe is lower than the actual bandwidth of a signal occur, a user can be prompted to confirm the validity of the current waveform, automatic real-time inspection or inspection of single-time captured waveform triggered by the user manually is realized, and invalid waveform test is avoided.
In some specific embodiments, the envelope acquiring module 11 may specifically include:
and the signal detection unit is used for detecting the signal to be detected by using the oscilloscope so as to acquire a corresponding target waveform.
In some embodiments, the result calculating module 12 may specifically include:
and the waveform acquisition submodule is used for detecting the signals with the bandwidth larger than the measurement system bandwidth of the oscilloscope by using the oscilloscope so as to acquire the corresponding standard waveform.
In some specific embodiments, the waveform obtaining sub-module may specifically include:
and the bandwidth determining unit is used for determining the bandwidth of the test system through the bandwidth of a cable connected with a signal, the bandwidth of a probe and/or a connector at one end of the cable and the bandwidth of the oscilloscope.
In some specific embodiments, the waveform obtaining sub-module may specifically include:
and the waveform acquisition unit is used for detecting the signals transmitted by the continuous step signals or the high-frequency signal elements by using the oscilloscope so as to acquire corresponding standard waveforms.
In some embodiments, the result calculating module 12 may specifically include:
and the envelope scaling unit is used for carrying out corresponding scaling processing on the target envelope according to the calculated scaling ratio so as to obtain a scaled target envelope.
In some specific embodiments, the waveform detecting module 13 may specifically include:
and the waveform detection unit is used for determining that the actual bandwidth of the signal corresponding to the target waveform exceeds a standard bandwidth if the calculation result is smaller than a preset difference value, and then the target waveform belongs to a distortion state.
Further, an electronic device is disclosed in the embodiments of the present application, and fig. 6 is a block diagram of an electronic device 20 according to an exemplary embodiment, which should not be construed as limiting the scope of the application.
Fig. 6 is a schematic structural diagram of an electronic device 20 according to an embodiment of the present disclosure. The electronic device 20 may specifically include: at least one processor 21, at least one memory 22, a power supply 23, a communication interface 24, an input output interface 25, and a communication bus 26. The memory 22 is used for storing a computer program, and the computer program is loaded and executed by the processor 21 to implement the relevant steps in the oscilloscope waveform checking method disclosed in any of the foregoing embodiments. In addition, the electronic device 20 in the present embodiment may be specifically an electronic computer.
In this embodiment, the power supply 23 is configured to provide a working voltage for each hardware device on the electronic device 20; the communication interface 24 can create a data transmission channel between the electronic device 20 and an external device, and a communication protocol followed by the communication interface is any communication protocol applicable to the technical solution of the present application, and is not specifically limited herein; the input/output interface 25 is configured to obtain external input data or output data to the outside, and a specific interface type thereof may be selected according to specific application requirements, which is not specifically limited herein.
The processor 21 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and the like. The processor 21 may be implemented in at least one hardware form of a DSP (Digital Signal Processing), an FPGA (Field-Programmable Gate Array), and a PLA (Programmable Logic Array). The processor 21 may also include a main processor and a coprocessor, where the main processor is a processor for Processing data in an awake state, and is also called a Central Processing Unit (CPU); a coprocessor is a low power processor for processing data in a standby state. In some embodiments, the processor 21 may be integrated with a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content required to be displayed on the display screen. In some embodiments, the processor 21 may further include an AI (Artificial Intelligence) processor for processing a calculation operation related to machine learning.
In addition, the storage 22 is used as a carrier for storing resources, and may be a read-only memory, a random access memory, a magnetic disk or an optical disk, etc., and the resources stored thereon may include an operating system 221, a computer program 222, etc., and the storage manner may be a transient storage manner or a permanent storage manner.
The operating system 221 is used for managing and controlling each hardware device and the computer program 222 on the electronic device 20, so as to realize the operation and processing of the mass data 223 in the memory 22 by the processor 21, and may be Windows Server, netware, unix, linux, and the like. The computer program 222 may further include a computer program that can be used to perform other specific tasks in addition to the computer program that can be used to perform the oscilloscope waveform checking method executed by the electronic device 20 disclosed in any of the foregoing embodiments. The data 223 may include data received by the electronic device and transmitted from an external device, or may include data collected by the input/output interface 25 itself.
Further, the present application also discloses a computer-readable storage medium for storing a computer program; wherein the computer program when executed by a processor implements the oscilloscope waveform inspection method disclosed above. For the specific steps of the method, reference may be made to corresponding contents disclosed in the foregoing embodiments, and details are not repeated here.
In the present specification, the embodiments are described in a progressive manner, and each embodiment focuses on differences from other embodiments, and the same or similar parts between the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the technical solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application. The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrases "comprising a," "8230," "8230," or "comprising" does not exclude the presence of additional like elements in a process, method, article, or apparatus that comprises the element.
The method, the device, the equipment and the storage medium for inspecting the waveform of the oscilloscope provided by the invention are described in detail, a specific example is applied in the text to explain the principle and the implementation mode of the oscilloscope, and the description of the embodiment is only used for helping to understand the method and the core idea of the oscilloscope; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (10)
1. An oscilloscope waveform checking method, comprising:
performing fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform;
calling a standard envelope curve which is prestored in an oscilloscope under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result;
determining whether the target waveform belongs to a distorted state based on the calculation result.
2. The method of claim 1, wherein prior to performing the fast fourier transform on the acquired target waveform, further comprising:
and detecting the signal to be detected by using an oscilloscope to obtain a corresponding target waveform.
3. The method for inspecting oscilloscope waveforms according to claim 1, wherein before said retrieving a standard envelope curve under the same test condition stored in advance in an oscilloscope, further comprising:
and detecting a signal with a bandwidth larger than the measurement system bandwidth of the oscilloscope by using the oscilloscope to obtain a corresponding standard waveform.
4. The method of claim 3, wherein before detecting a signal with the oscilloscope having a measurement system bandwidth greater than the oscilloscope to obtain the corresponding standard waveform, the method further comprises:
and determining the bandwidth of the test system through the bandwidth of a cable connected with a signal, the bandwidth of a probe and/or a connector at one end of the cable and the bandwidth of the oscilloscope.
5. The method of claim 3, wherein said detecting with the oscilloscope a signal greater than a measurement system bandwidth of the oscilloscope to obtain a corresponding standard waveform comprises:
and detecting the signals transmitted by the continuous step signals or the high-frequency signal elements by using the oscilloscope to obtain corresponding standard waveforms.
6. The method for inspecting the waveform of an oscilloscope according to claim 1, wherein after said retrieving a standard envelope curve under the same test condition stored in advance in the oscilloscope, further comprising:
and carrying out corresponding scaling processing on the target envelope line according to the calculated scaling ratio to obtain a scaled target envelope line.
7. An oscilloscope waveform checking method according to any one of claims 1 to 6, wherein said determining whether said target waveform belongs to a distorted state based on said calculation result comprises:
and if the calculation result is smaller than a preset difference value, determining that the actual bandwidth of the signal corresponding to the target waveform exceeds a standard bandwidth, and determining that the target waveform belongs to a distortion state.
8. An oscilloscope waveform inspecting apparatus, comprising:
the envelope curve acquisition module is used for carrying out fast Fourier transform on the acquired target waveform to obtain a target envelope curve of the frequency domain waveform;
the result calculation module is used for calling a standard envelope curve which is prestored in an oscilloscope and is under the same test condition, and calculating a standard frequency point of the standard envelope curve and a target frequency point of the target envelope curve to obtain a corresponding calculation result;
and the waveform detection module is used for determining whether the target waveform belongs to a distortion state or not based on the calculation result.
9. An electronic device, comprising:
a memory for storing a computer program;
a processor for executing the computer program to carry out the steps of the oscilloscope waveform inspection method according to any one of claims 1 to 7.
10. A computer-readable storage medium for storing a computer program; wherein the computer program when executed by a processor implements the steps of the oscilloscope waveform inspection method according to any one of claims 1 to 7.
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| CN101131419A (en) * | 2007-09-29 | 2008-02-27 | 上海市计量测试技术研究院 | Frequency span calibration and detection method for digital oscilloscope |
| CN111044962A (en) * | 2019-12-26 | 2020-04-21 | 北京航天测控技术有限公司 | Bandwidth flatness calibration method based on FFT |
| CN111122935A (en) * | 2020-03-30 | 2020-05-08 | 深圳市鼎阳科技股份有限公司 | Frequency response adjusting method of digital oscilloscope and digital oscilloscope |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101131419A (en) * | 2007-09-29 | 2008-02-27 | 上海市计量测试技术研究院 | Frequency span calibration and detection method for digital oscilloscope |
| CN111044962A (en) * | 2019-12-26 | 2020-04-21 | 北京航天测控技术有限公司 | Bandwidth flatness calibration method based on FFT |
| CN111122935A (en) * | 2020-03-30 | 2020-05-08 | 深圳市鼎阳科技股份有限公司 | Frequency response adjusting method of digital oscilloscope and digital oscilloscope |
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