CN115201888A - Device for enhancing photon collection of scintillation detector - Google Patents
Device for enhancing photon collection of scintillation detector Download PDFInfo
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- CN115201888A CN115201888A CN202210799941.0A CN202210799941A CN115201888A CN 115201888 A CN115201888 A CN 115201888A CN 202210799941 A CN202210799941 A CN 202210799941A CN 115201888 A CN115201888 A CN 115201888A
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- 230000002708 enhancing effect Effects 0.000 title claims abstract description 9
- 239000000463 material Substances 0.000 claims abstract description 9
- 230000008021 deposition Effects 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims description 3
- 238000002310 reflectometry Methods 0.000 claims description 3
- 229910001385 heavy metal Inorganic materials 0.000 claims description 2
- 229910003471 inorganic composite material Inorganic materials 0.000 claims description 2
- 230000003014 reinforcing effect Effects 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims description 2
- 239000012780 transparent material Substances 0.000 claims description 2
- 238000002834 transmittance Methods 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 14
- 230000007774 longterm Effects 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 7
- 239000002245 particle Substances 0.000 description 5
- 230000008569 process Effects 0.000 description 5
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- 230000003287 optical effect Effects 0.000 description 3
- 230000006872 improvement Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000002059 diagnostic imaging Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T7/00—Details of radiation-measuring instruments
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Abstract
The invention belongs to the technical field of scintillation detectors, and particularly relates to a device for enhancing photon collection of a scintillation detector. The X-ray detector comprises a scintillator device, a light transport device and an escape ray reflection device, and is based on the existing scintillation detector reflection layer structure, and the reflection layer structure is further designed by combining the total reflection principle and related materials for X-ray reflection and scattering. On one hand, the collection of scintillation photons is optimized, and the energy resolution of the scintillation detector is improved; on the other hand, the escaping rays are further reflected back, so that the detection efficiency of the scintillation detector is improved. The device has simple structure and lower cost, and can be conveniently debugged and further improved while reducing the assembly difficulty. Meanwhile, the structure is stable, the device is suitable for different detection environments, the requirement for long-term use can be met, and the service life of the scintillation detector is guaranteed.
Description
Technical Field
The invention belongs to the technical field of scintillation detectors, and particularly relates to a device for enhancing photon collection of a scintillation detector.
Background
In the field of nuclear radiation detection, a scintillation detector is a commonly used detection instrument, and compared with other types of detectors, the scintillation detector has the advantages of high detection efficiency, good resolution, strong irradiation resistance and the like, and is widely applied to the fields of medical imaging, homeland security, deep space detection, basic research and the like. Important indexes for evaluating the performance of a scintillation detector mainly include energy resolution, detection efficiency, peak-to-average ratio and the like, and improvement is required from the indexes in order to improve the performance of the detector.
The basic structure of the scintillation detector system mainly comprises a scintillator, a reflecting layer, a photomultiplier, a preamplifier, a main amplifier, a multi-channel analyzer and the like. When particles enter a scintillator, energy deposition occurs in the scintillator, atoms in the scintillator are excited to emit photons, the photons are emitted from an exit window of the scintillator after a series of transport processes, a photoelectric effect occurs at a photocathode of a photomultiplier, and photoelectrons form current pulses after a series of multiplication processes. The pulse is rectified and filtered by an amplifier, and finally, an energy spectrum is formed in a multi-channel analyzer, so that the detection of the ray particles is completed.
The reflective layer of the scintillator plays a crucial role in the photon transport process, it is able to reflect back scintillation photons of different directions and eventually move them to the exit window. For the reflective layer, the performance of the scintillation detector is directly affected by the reflective effect. The currently used reflective layers are mainly classified into two types: diffuse reflection and specular reflection, which have characteristics respectively, are suitable for different situations. However, in practical use, due to the limited reflectivity of the reflective layer material, a photon loss problem inevitably occurs during the reflection process. Meanwhile, due to the phenomena of scattering and X-ray escape of particles in the scintillator, the measured particle energy is small, and the detection efficiency and the accuracy of the particle energy are affected.
Disclosure of Invention
Aiming at the defects in the prior art, the invention provides a device for enhancing photon collection of a scintillation detector, which is used for solving the problems of limited reflection efficiency and low detection efficiency of a reflecting layer in the prior art.
In order to solve the technical problems, the invention adopts the following technical scheme:
the utility model provides an apparatus for reinforcing scintillation detector photon collection, includes scintillator device, light transport device, escape ray reflection device, its characterized in that:
the scintillator device is a scintillation unit consisting of one or more scintillators;
the scintillation unit can generate a fluorescence phenomenon after ray incidence and emit scintillation photons, one surface of the scintillation unit is a scintillation photon emergent surface, and the other surfaces of the scintillation unit are scintillation photon reflecting surfaces;
the scintillation photon emergent surface is a flat surface and is used for being coupled with the end surface of the photomultiplier;
the scintillation photon reflecting surface is the other surface of the scintillator except the emergent surface and is used for being combined with the light transport device and the escape ray reflecting device to complete the functions of light transport enhancement, escape ray reflection and the like;
the optical transport device comprises a total reflection enhancement layer and a photon reflection layer;
the total reflection enhancement layer is made of a transparent material with the refractive index far smaller than that of the scintillation unit, and can uniformly cover the surface of the scintillation unit and form good contact;
the photon reflection layer is made of a reflection material with higher reflectivity, has the characteristics of lower absorptivity and transmissivity, and can be flatly covered on the surface of the total reflection enhancement layer;
the escape ray reflection device comprises a low-energy ray reflection layer and a high-energy ray reflection layer;
the low-energy ray reflecting layer is made of a multi-layer inorganic composite material and can reflect lower-energy X rays;
the high-energy ray reflecting layer is a thin-film material made of heavy metal, and can scatter X rays with higher energy, so that part of the rays return to the scintillation crystal to continue to generate energy deposition.
The invention further designs the reflecting layer structure based on the reflecting layer structure of the existing scintillation detector and by combining the total reflection principle and relevant materials for X-ray reflection and scattering. On one hand, the collection of scintillation photons is optimized, and the energy resolution of the scintillation detector is improved; on the other hand, the escaping rays are further reflected back, so that the detection efficiency of the scintillation detector is improved.
Compared with the prior art, the invention has the following beneficial effects:
1. the photon transport process in the scintillator is improved, the number of output scintillation photons is increased, the output pulse of the detector is increased, and the energy resolution is improved.
2. The escaped partial X-rays are reflected back to the scintillator, so that the total energy deposition of the incident rays in the scintillator is improved, the detection efficiency of the detector is improved, and the energy spectrum is more accurate.
3. The device simple structure, the material that uses all is common reflecting material, and the cost is lower, also can be convenient for debug and further improvement when having reduced the equipment degree of difficulty.
4. The device stable in structure is applicable to different detection environments, can meet the requirement of long-term use, and ensures the service life of the scintillation detector.
Drawings
FIG. 1 is a schematic cross-sectional view of the present invention;
fig. 2 is a schematic view of a part of enlarged structures at 2, 3 and 4 in fig. 1.
Reference numerals referred to in the drawings are:
1-incident ray direction, 2-escape ray reflector, 3-optical transport device, 4-scintillator device, 5-photomultiplier, 6-total reflection enhancement layer, 7-photon reflector, 8-low energy ray reflector, 9-high energy ray reflector.
Detailed Description
In order that those skilled in the art can better understand the present invention, the following technical solutions are further described with reference to the accompanying drawings and examples. The advantages and features of the present invention will be more apparent from the following detailed description. It should be noted that: the drawings are in a very simplified form and are not to scale, simply for the purpose of facilitating and distinctly claiming the embodiments of the present invention; second, the structures shown in the drawings are often part of actual structures.
The device for enhancing photon collection of the scintillation detector comprises a scintillator device, a light transport device, an escape ray reflection device and the like, and is shown in figure 1. The scintillator device 4 is a CsI (Tl) inorganic scintillator, the light emission center wavelength is 415nm, the shape is a cylinder, the size is Φ 25 × 50mm, one bottom surface of the cylinder is used as a scintillation photon emergence surface, the side surface and the other bottom surface are used as scintillation photon reflection surfaces, and the scintillation photon emergence surface and the photomultiplier are coupled by using EJ-550 optical silicone grease.
The light transport device 3 comprises two parts: total reflection enhancement layer 6 and photon reflection stratum 7, total reflection enhancement layer 7 component is air, uses the support frame to separate total reflection enhancement layer 6 and photon reflection stratum 7, and the thickness is 0.1mm. Because the refractive index of air is far smaller than that of the CsI (Tl) crystal, the probability of total reflection of photons on the interface can be increased to the maximum extent. The photon reflection layer 7 uses ESR optical reflection film produced by 3M company, the thickness is 0.065mm, the reflection rate is high, the structure is stable, and the assembly is convenient. The photons emitted from the scintillation photon reflection surface are reflected in the photon reflection layer 7 after passing through the total reflection enhancement layer 6, and most of the photons can be reflected back to the inside of the scintillator device 4, so that the photons are further collected to the scintillation photon emission surface.
The escape ray reflection device 2 comprises two parts: the low-energy ray reflecting layer 8 and the high-energy ray reflecting layer 9, the low-energy ray reflecting layer 8 is a multilayer Cr/Sc composite reflecting mirror, the thickness is 0.003mm, the low-energy ray reflecting layer has a high reflecting effect on low-energy X rays with the wavelength of about 3nm, and partial escaped X rays can be reflected back to the scintillator device 4 for further energy deposition. The high-energy ray reflecting layer 9 is a reflecting layer shell made of a thin Pb sheet, the thickness of the reflecting layer shell is 1mm, due to the fact that Pb is high in atomic number and mass number, the reflecting layer shell can scatter X rays which are irradiated to the high-energy ray reflecting layer shell, when the photon scattering angle is larger than 90 degrees, the photon scattering angle can be reflected back to the scintillator device 4, and therefore energy deposition occurs again.
The light transport device 3 is combined with the escape ray reflection device 2, so that the overall detection efficiency is improved while the collection rate of scintillation photons is further improved, the measurement work of a scintillation detector is facilitated, and the energy resolution of the detector can be further improved.
The foregoing is merely an example of the present invention, and common general knowledge in the field of known specific structures and characteristics is not described herein in any greater extent than that known in the art at the filing date or prior to the priority date of the application, so that those skilled in the art can now appreciate that all of the above-described techniques in this field and have the ability to apply routine experimentation before this date can be combined with one or more of the present teachings to complete and implement the present invention, and that certain typical known structures or known methods do not pose any impediments to the implementation of the present invention by those skilled in the art. It should be noted that, for those skilled in the art, without departing from the structure of the present invention, several changes and modifications can be made, which should also be regarded as the protection scope of the present invention, and these will not affect the effect of the implementation of the present invention and the practicability of the patent.
Claims (5)
1. The utility model provides an apparatus for reinforcing scintillation detector photon is collected, includes scintillator device, light transport device, escape ray reflection device which characterized in that:
the scintillator device is a scintillation unit consisting of one or more scintillators;
the scintillation unit can generate fluorescence phenomenon after ray incidence and emit scintillation photons, one surface of the scintillation unit is a scintillation photon emergent surface, and the other surfaces of the scintillation unit are scintillation photon reflecting surfaces;
the scintillation photon emergent surface is a flat surface and is used for being coupled with the end surface of the photomultiplier;
the scintillation photon reflecting surface is the other surface of the scintillator except the emergent surface and is used for being combined with the light transport device and the escape ray reflecting device to complete the functions of light transport enhancement, escape ray reflection and the like.
2. The apparatus of claim 1 for enhancing scintillation detector photon collection, wherein:
the light transport device comprises a total reflection enhancement layer and a photon reflection layer.
3. The apparatus of claim 2, wherein:
the total reflection enhancement layer is made of a transparent material with the refractive index far smaller than that of the scintillation unit, and can uniformly cover the surface of the scintillation unit and form good contact;
the photon reflection layer is made of reflection materials with high reflectivity, has the characteristics of low absorptivity and transmittance, and can be flatly covered on the surface of the total reflection enhancement layer.
4. The apparatus of claim 1 for enhancing scintillation detector photon collection, wherein:
the escape ray reflection device comprises a low-energy ray reflection layer and a high-energy ray reflection layer.
5. The apparatus of claim 4 for enhancing scintillation detector photon collection, wherein:
the low-energy ray reflecting layer is made of a multi-layer inorganic composite material and can reflect lower-energy X rays;
the high-energy ray reflecting layer is a thin-film material made of heavy metal, and can scatter X rays with higher energy, so that part of the rays return to the scintillation crystal to continue to generate energy deposition.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210799941.0A CN115201888A (en) | 2022-07-08 | 2022-07-08 | Device for enhancing photon collection of scintillation detector |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210799941.0A CN115201888A (en) | 2022-07-08 | 2022-07-08 | Device for enhancing photon collection of scintillation detector |
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| CN115201888A true CN115201888A (en) | 2022-10-18 |
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| CN202210799941.0A Pending CN115201888A (en) | 2022-07-08 | 2022-07-08 | Device for enhancing photon collection of scintillation detector |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100767384B1 (en) * | 2007-02-08 | 2007-10-17 | 라드텍주식회사 | An x-ray dual energy detector |
| TW200923399A (en) * | 2007-10-01 | 2009-06-01 | Hamamatsu Photonics Kk | Radiation detector |
| CN107688193A (en) * | 2017-09-20 | 2018-02-13 | 吉林大学 | A kind of scintillation detector of new high photon efficiency of transmission |
| CN109085634A (en) * | 2018-08-14 | 2018-12-25 | 同济大学 | A kind of nuclear radiation detection device based on photonic crystal scintillator |
| CN109298474A (en) * | 2018-11-29 | 2019-02-01 | 同济大学 | A kind of X-ray wide spectrum trilamellar membrane mirror structure design method |
| CN111338178A (en) * | 2020-02-19 | 2020-06-26 | 深圳市安健科技股份有限公司 | Three-dimensional scintillator fiber array X-ray detector and preparation method thereof |
| US20200233100A1 (en) * | 2019-01-23 | 2020-07-23 | Viken Detection Corporation | X-Ray Detector With Multi-Layer Dielectric Reflector |
-
2022
- 2022-07-08 CN CN202210799941.0A patent/CN115201888A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100767384B1 (en) * | 2007-02-08 | 2007-10-17 | 라드텍주식회사 | An x-ray dual energy detector |
| TW200923399A (en) * | 2007-10-01 | 2009-06-01 | Hamamatsu Photonics Kk | Radiation detector |
| CN107688193A (en) * | 2017-09-20 | 2018-02-13 | 吉林大学 | A kind of scintillation detector of new high photon efficiency of transmission |
| CN109085634A (en) * | 2018-08-14 | 2018-12-25 | 同济大学 | A kind of nuclear radiation detection device based on photonic crystal scintillator |
| CN109298474A (en) * | 2018-11-29 | 2019-02-01 | 同济大学 | A kind of X-ray wide spectrum trilamellar membrane mirror structure design method |
| US20200233100A1 (en) * | 2019-01-23 | 2020-07-23 | Viken Detection Corporation | X-Ray Detector With Multi-Layer Dielectric Reflector |
| CN111338178A (en) * | 2020-02-19 | 2020-06-26 | 深圳市安健科技股份有限公司 | Three-dimensional scintillator fiber array X-ray detector and preparation method thereof |
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