CN115200841A - Detection system for high-resolution microscope production - Google Patents

Detection system for high-resolution microscope production Download PDF

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Publication number
CN115200841A
CN115200841A CN202210849551.XA CN202210849551A CN115200841A CN 115200841 A CN115200841 A CN 115200841A CN 202210849551 A CN202210849551 A CN 202210849551A CN 115200841 A CN115200841 A CN 115200841A
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CN
China
Prior art keywords
wall
fixed
production
resolution microscope
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210849551.XA
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Chinese (zh)
Inventor
张学龙
韩雪峰
崔继承
左宏志
张秉京
朱光
庄伟�
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jilin Yatai Zhongke Medical Device Engineering and Technology Research Institute Co Ltd
Original Assignee
Jilin Yatai Zhongke Medical Device Engineering and Technology Research Institute Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Jilin Yatai Zhongke Medical Device Engineering and Technology Research Institute Co Ltd filed Critical Jilin Yatai Zhongke Medical Device Engineering and Technology Research Institute Co Ltd
Priority to CN202210849551.XA priority Critical patent/CN115200841A/en
Publication of CN115200841A publication Critical patent/CN115200841A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G01M11/0214—Details of devices holding the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/04—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with mechanism for focusing or varying magnification

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

The invention discloses a detection system for high-resolution microscope production, and relates to the technical field of microscope production detection; in order to improve the detection efficiency; specifically including lens fixed establishment, light source fixed establishment, lens fixed establishment includes: a support shaft is fixed on the outer wall of one side of the first mounting frame; the fixing frame is rotatably connected to the outer wall of the supporting shaft; the annular frame is fixed on the supporting shaft and is uniformly and circumferentially distributed relative to the supporting shaft; the lens fixing component is arranged on the annular frame and used for fixing the lens; the light source fixing mechanism includes: a second mounting bracket. According to the invention, by arranging the lens fixing mechanism, the light source fixing mechanism and other structures, a plurality of groups of lenses can be detected simultaneously, and the type of the light source output assembly arranged on the mounting seat can be selected according to actual requirements, so that the test efficiency is improved while the test requirements are met.

Description

Detection system for high-resolution microscope production
Technical Field
The invention relates to the technical field of microscope production detection, in particular to a detection system for high-resolution microscope production.
Background
In the production process of a microscope, the processing of lenses is one of the most important links, the processing quality of the lenses directly influences the using effect of the microscope, the lenses are often required to be detected in order to control the product quality, the current detection device is often used for detecting the lenses by applying a light source after the lenses are clamped, the detection mode can only realize detection piece by piece, and the detection efficiency is low, so that the improvement is needed.
Through retrieval, chinese patent application No. CN201510081320.9 discloses a detection system for progressive addition lens diopter, comprising: the lens detection device comprises a light source, a slit and a camera which are sequentially arranged along an optical axis, wherein a lens to be detected is arranged between the slit and the camera and moves along a working path vertical to the optical axis, a plurality of working positions are arranged on the working path of the lens to be detected, and the camera moves along the optical axis for each working position and shoots in real time to obtain a video stream; the data processing module is used for selecting a frame of image with the highest definition from the video stream under each working position and calculating the diopter of the lens to be detected according to the position of the camera corresponding to the moment. The detection system in the above patent has the following disadvantages: when in detection, the detection needs to be fixed piece by piece, which causes low detection efficiency and needs to be improved.
Disclosure of Invention
The invention aims to solve the defects in the prior art and provides a detection system for high-resolution microscope production.
In order to achieve the purpose, the invention adopts the following technical scheme:
an inspection system for high resolution microscope production comprising a lens holding mechanism, a light source holding mechanism, the lens holding mechanism comprising:
a support shaft is fixed on the outer wall of one side of the first mounting frame;
the fixing frame is rotatably connected to the outer wall of the supporting shaft;
the annular frame is fixed on the supporting shaft and is uniformly and circumferentially distributed relative to the supporting shaft;
the lens fixing component is arranged on the annular frame and used for fixing the lens;
the light source fixing mechanism includes:
the second mounting frame is arranged on one side of the first mounting frame, and a central column is fixed on the outer wall of one side of the second mounting frame;
the rotating disc rotates on the outer wall of the central column, and the central axes of the rotating disc, the central column and the supporting shaft are overlapped;
and the light source output assembly is arranged on the rotating disc through a mounting seat, and the position of the light source output assembly is matched with the annular frame.
Preferably, the following components: the lens fixing assembly includes:
the sliding seats are fixed on the upper side and the lower side of the annular frame;
a slide bar is fixed on the outer wall of one side of the clamping plate and is connected in the slide seat in a sliding way, the two clamping plates are symmetrically arranged,
and the spring is fixed between one end of the sliding rod and the sliding seat, and a pull ring is fixed on the outer wall of one end of the sliding rod.
And further: an adjusting stud is fixed on the outer wall of one side of the clamping plate and slides on the inner wall of the sliding seat, a limiting nut is connected to the outer wall of the adjusting stud through threads, and the size of the limiting nut is larger than the inner diameter of the sliding seat.
Further preferred is: the outer wall of one side of the clamping plate is fixed with a reference rod, the reference rod is connected to the inner wall of the sliding seat in a sliding mode, and the outer wall of one side of the reference rod is provided with linear scale marks.
As a preferable aspect of the present invention: the outer wall of one side of the clamping plate is provided with a clamping groove, and the cross section of the clamping groove is of a V-shaped or trapezoidal structure.
Further preferred as the invention: the detection system further comprises a base, an electric adjusting slide rail is fixed to the top of the base, and the bottom of the base is connected to the inner wall of the electric adjusting slide rail in a sliding mode through an electric sliding block.
As a still further scheme of the invention: the outer wall of one side of the central column is provided with second angle datum lines distributed circumferentially, and the outer wall of one side of the rotating disc is provided with a first angle datum line matched with the second angle datum line in position.
On the basis of the scheme: the outer wall of one side of the rotating disc is provided with mounting grooves which are evenly distributed in the circumferential direction, and the mounting seat is detachably mounted in the mounting grooves.
On the basis of the foregoing scheme, it is preferable that: the outer wall of one side of the mounting seat is fixed with an inserting column through screws, the outer wall of one side of the mounting groove is provided with a socket, the inserting column is matched with the socket, and one end, close to the socket, of the inserting column is of a table-shaped structure with the diameter gradually reduced.
It is further preferable on the basis of the foregoing scheme that: the inner wall of one side of the socket is bonded with a first magnetic absorption block, and one end of the inserting column is bonded with a second magnetic absorption block matched with the first magnetic absorption block.
The invention has the beneficial effects that:
1. according to the invention, by arranging the lens fixing mechanism, the light source fixing mechanism and other structures, a plurality of groups of lenses can be detected simultaneously, and the type of the light source output assembly arranged on the mounting seat can be selected according to actual requirements, so that the test efficiency is improved while the test requirements are met.
2. The lens fixing component is arranged, so that the lens can be clamped by the clamping plate based on the elastic force of the spring; through setting up limit nut, adjusting stud isotructure, can change the spacing position to splint through the mode of adjusting limit nut to guarantee splint with the lens centre gripping in the intermediate position of annular frame, promoted the practicality.
3. Through the joint groove that sets up V-arrangement or trapezium structure, ensured the fixed effect of centre gripping, set up the isotructure of electrical control slide rail, do benefit to focus, satisfy the detection demand.
Drawings
FIG. 1 is a schematic diagram of a detection system for high resolution microscope production according to the present invention;
FIG. 2 is a schematic structural diagram of a lens fixing mechanism of an inspection system for high resolution microscope production according to the present invention;
FIG. 3 is a schematic view of a lens holding assembly of an inspection system for high resolution microscope production according to the present invention;
FIG. 4 is a schematic structural diagram of a cross-section of an annular frame of a detection system for high-resolution microscope production according to the present invention;
FIG. 5 is a schematic view of a mounting base of the inspection system for high resolution microscope production according to the present invention, shown removed from the mounting groove;
fig. 6 is a schematic structural diagram of a detection system mount for high resolution microscope production according to the present invention, which is shown in a disassembled state.
In the figure: the device comprises a first mounting frame 1, a base 2, an electric adjusting slide rail 3, a second mounting frame 4, a mounting seat 5, a rotating disc 6, a central column 7, an annular frame 8, a fixing frame 9, a supporting shaft 10, a pull ring 11, a clamping plate 12, an adjusting stud 13, a sliding rod 14, a spring 15, a reference rod 16, a linear scale mark 17, a sliding seat 18, a limiting nut 19, a clamping groove 20, a first angle reference line 21, a second angle reference line 22, a light source output assembly 23, a mounting groove 24, a first magnetic suction block 25, a socket 26, an inserting column 27 and a second magnetic suction block 28.
Detailed Description
The technical solution of the present patent will be described in further detail with reference to the following embodiments.
Reference will now be made in detail to embodiments of the present patent, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative only for the purpose of explaining the present patent and are not to be construed as limiting the present patent.
In the description of this patent, it is to be understood that the terms "center," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientations and positional relationships indicated in the drawings for the convenience of describing the patent and for the simplicity of description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting of the patent.
In the description of this patent, it is noted that unless otherwise specifically stated or limited, the terms "mounted," "connected," and "disposed" are to be construed broadly and can include, for example, fixedly connected, disposed, detachably connected, disposed, or integrally connected and disposed. The specific meaning of the above terms in this patent may be understood by those of ordinary skill in the art as appropriate.
Example 1:
an inspection system for high resolution microscope production, as shown in fig. 1-6, comprising a lens holding mechanism, a light source holding mechanism, the lens holding mechanism comprising:
a support shaft 10 is fixed on the outer wall of one side of the first mounting frame 1;
the fixing frame 9 is rotatably connected to the outer wall of the supporting shaft 10;
the annular frame 8 is fixed on the supporting shaft 10, and the annular frame 8 is uniformly distributed on the circumference of the supporting shaft 10;
the lens fixing component is arranged on the annular frame 8 and used for fixing the lens;
the light source fixing mechanism includes:
the second mounting frame 4 is arranged on one side of the first mounting frame 1, and a central column 7 is fixed on the outer wall of one side of the second mounting frame 4;
the rotating disc 6 rotates on the outer wall of the central column 7, and the central axes of the rotating disc 6, the central column 7 and the supporting shaft 10 are overlapped;
the light source output assembly 23 is arranged on the rotating disc 6 through the mounting seat 5, and the position of the light source output assembly 23 is matched with the annular frame 8;
through setting up lens fixed establishment, light source fixed establishment isotructure, can detect the multiunit lens simultaneously, and install the kind that light source output assembly 23 on mount pad 5 and can select according to actual demand, promoted efficiency of software testing when having satisfied the test demand.
To facilitate securing the lens; as shown in fig. 3 and 4, the lens fixing assembly includes:
the slide seat 18, the slide seat 18 is fixed on the upper and lower sides of the annular frame 8;
a slide bar 14 is fixed on the outer wall of one side of the clamping plate 12, the slide bar 14 is connected in a slide seat 18 in a sliding way, the two clamping plates 12 are symmetrically arranged,
the spring 15 is fixed between one end of the sliding rod 14 and the sliding seat 18, and the outer wall of one end of the sliding rod 14 is fixed with the pull ring 11;
the lens can be held by the chucking plate 12 based on the elastic force of the spring 15 by providing the lens fixing member.
To facilitate secure retention of different sized lenses; as shown in fig. 3 and 4, an adjusting stud 13 is fixed on the outer wall of one side of the clamping plate 12, the adjusting stud 13 slides on the inner wall of the sliding seat 18, a limit nut 19 is connected to the outer wall of the adjusting stud 13 through a thread, and the size of the limit nut 19 is larger than the inner diameter of the sliding seat 18; through setting up limit nut 19, adjusting stud 13 isotructure, can change the spacing position to splint 12 through the mode of adjusting limit nut 19 to guarantee splint 12 with the lens centre gripping in the intermediate position of annular frame 8, promoted the practicality.
In order to improve the lens fixing precision; as shown in FIG. 3, a reference rod 16 is fixed on the outer wall of one side of the clamping plate 12, the reference rod 16 is slidably connected to the inner wall of the sliding seat 18, and the outer wall of one side of the reference rod 16 is provided with linear scale marks 17.
In order to improve the fixing effect; as shown in fig. 3 and 4, a clamping groove 20 is formed in an outer wall of one side of the clamping plate 12, and a cross section of the clamping groove 20 is a V-shaped or trapezoidal structure.
To facilitate adjustment of the focal length; as shown in fig. 1, the detection system further includes a base 2, an electric adjusting slide rail 3 is fixed on the top of the base 2, and the bottom of the base 2 is connected to the inner wall of the electric adjusting slide rail 3 through an electric slider in a sliding manner.
In order to improve the practicability; as shown in fig. 1 and 5, the outer wall of the center post 7 is provided with second angle reference lines 22 distributed circumferentially, and the outer wall of the rotating disc 6 is provided with a first angle reference line 21 matched with the second angle reference line 22 in position.
When the lens fixing device is used, a user clamps the lens between the two clamping plates 12, adjusts the limiting nut 19, and judges through the linear scale mark 17 to ensure that the lens is fixed at the central position of the annular frame 8; after the lens is fixed, can switch different light source output assembly 23 work through the mode of rotatory rolling disc 6, the user can carry out continuous detection to a plurality of lenses through the mode of rotating mount 9, has ensured work efficiency.
Example 2:
a detection system for high resolution microscope production, as shown in fig. 1, to facilitate replacement of the light source; the present embodiment is modified from embodiment 1 as follows: the outer wall of one side of the rotating disc 6 is provided with mounting grooves 24 which are evenly distributed circumferentially, and the mounting seat 5 is detachably mounted in the mounting grooves 24.
The outer wall of one side of the mounting seat 5 is fixed with an inserting column 27 through a screw, the outer wall of one side of the mounting groove 24 is provided with a socket 26, the inserting column 27 is matched with the socket 26, and one end of the inserting column 27 close to the socket 26 is of a table-shaped structure with the diameter gradually reduced.
The inner wall of one side of the socket 26 is adhered with a first magnetic block 25, and one end of the inserting column 27 is adhered with a second magnetic block 28 matched with the first magnetic block 25.
The above description is for the purpose of describing the preferred embodiments of the present invention, and is not intended to be the only embodiments of the present invention, and the scope of the present invention is not limited thereto, and any person skilled in the art can comprehend the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention, which are equivalent, or changed, within the technical scope of the present invention and the common general knowledge of the prior art.

Claims (10)

1. An inspection system for high resolution microscope production, comprising a lens holding mechanism, a light source holding mechanism, the lens holding mechanism comprising:
the support shaft is fixed on the outer wall of one side of the first mounting rack (1) (10);
the fixing frame (9), the fixing frame (9) is connected to the outer wall of the supporting shaft (10) in a rotating way;
the annular frame (8), the said annular frame (8) is fixed on back shaft (10), the annular frame (8) presents the uniform circumference distribution about the back shaft (10);
the lens fixing component is arranged on the annular frame (8) and used for fixing the lens;
the light source fixing mechanism includes:
the second mounting rack (4), the second mounting rack (4) is arranged on one side of the first mounting rack (1), and a central column (7) is fixed on the outer wall of one side of the second mounting rack (4);
the rotating disc (6) rotates on the outer wall of the central column (7), and the central axes of the rotating disc (6), the central column (7) and the supporting shaft (10) are overlapped;
light source output subassembly (23), light source output subassembly (23) pass through mount pad (5) and install on rolling disc (6), the position and the annular frame (8) adaptation of light source output subassembly (23).
2. The inspection system for high resolution microscope production of claim 1, wherein the lens holding assembly comprises:
the sliding seats (18), the sliding seats (18) are fixed on the upper and lower sides of the annular frame (8);
a slide bar (14) is fixed on the outer wall of one side of the clamping plate (12), the slide bar (14) is connected in a slide seat (18) in a sliding way, the two clamping plates (12) are symmetrically arranged,
the spring (15), the spring (15) is fixed in between slide bar (14) one end and slide (18), and slide bar (14) one end outer wall is fixed with pull ring (11).
3. The detection system for the production of the high-resolution microscope according to claim 2, wherein an adjusting stud (13) is fixed on the outer wall of one side of the clamping plate (12), the adjusting stud (13) slides on the inner wall of the sliding seat (18), a limit nut (19) is connected to the outer wall of the adjusting stud (13) through threads, and the size of the limit nut (19) is larger than the inner diameter of the sliding seat (18).
4. The detection system for the production of the high-resolution microscope according to claim 3, wherein a reference rod (16) is fixed on the outer wall of one side of the clamping plate (12), the reference rod (16) is connected with the inner wall of the sliding seat (18) in a sliding way, and the outer wall of one side of the reference rod (16) is provided with linear scale marks (17).
5. The detection system for the production of the high resolution microscope according to claim 4, wherein the outer wall of one side of the clamping plate (12) is provided with a clamping groove (20), and the cross section of the clamping groove (20) is of a V-shaped or trapezoidal structure.
6. The inspection system for high resolution microscope production according to claim 5, wherein the inspection system further comprises a base (2), the top of the base (2) is fixed with an electric adjusting slide rail (3), and the bottom of the base (2) is slidably connected to the inner wall of the electric adjusting slide rail (3) through an electric slider.
7. A detection system for high-resolution microscope production according to claim 6, characterized in that the outer wall of the center column (7) on one side is provided with second angle reference lines (22) distributed circumferentially, and the outer wall of the rotating disc (6) on one side is provided with first angle reference lines (21) matched with the positions of the second angle reference lines (22).
8. The detection system for the production of the high-resolution microscope according to any one of claims 1 to 7, wherein the outer wall of one side of the rotating disc (6) is provided with mounting grooves (24) which are uniformly distributed circumferentially, and the mounting seat (5) is detachably mounted in the mounting grooves (24).
9. The detection system for the production of the high-resolution microscope according to claim 8, wherein the outer wall of one side of the mounting seat (5) is fixed with an insert column (27) through a screw, the outer wall of one side of the mounting groove (24) is provided with a socket (26), the insert column (27) is matched with the socket (26), and one end of the insert column (27) close to the socket (26) is in a truncated cone structure with a gradually reduced diameter.
10. The detection system for the production of the high-resolution microscope according to claim 9, wherein a first magnetic block (25) is adhered to an inner wall of one side of the socket (26), and a second magnetic block (28) matched with the first magnetic block (25) is adhered to one end of the inserted column (27).
CN202210849551.XA 2022-07-19 2022-07-19 Detection system for high-resolution microscope production Pending CN115200841A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210849551.XA CN115200841A (en) 2022-07-19 2022-07-19 Detection system for high-resolution microscope production

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210849551.XA CN115200841A (en) 2022-07-19 2022-07-19 Detection system for high-resolution microscope production

Publications (1)

Publication Number Publication Date
CN115200841A true CN115200841A (en) 2022-10-18

Family

ID=83581513

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210849551.XA Pending CN115200841A (en) 2022-07-19 2022-07-19 Detection system for high-resolution microscope production

Country Status (1)

Country Link
CN (1) CN115200841A (en)

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