CN115184716A - Carrier difference correction method for electrical performance detection of radio frequency filter or duplexer - Google Patents

Carrier difference correction method for electrical performance detection of radio frequency filter or duplexer Download PDF

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CN115184716A
CN115184716A CN202211109615.9A CN202211109615A CN115184716A CN 115184716 A CN115184716 A CN 115184716A CN 202211109615 A CN202211109615 A CN 202211109615A CN 115184716 A CN115184716 A CN 115184716A
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snp
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gont
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CN115184716B (en
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雷启英
邱文斌
祁政
肖如吾
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Suzhou Changheng Communication Technology Co ltd
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/01Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
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Abstract

The invention relates to a carrier difference correction method for electrical property detection of a radio frequency filter or a duplexer, which comprises the following steps: connecting a cable on the network analyzer and completing calibration; connecting a gold carrier to a network analyzer, placing gold material on the gold carrier to start measurement, and collecting the current snp as the snp _ GonG; step two: taking down the gold carrier, connecting the gold carrier with the test carrier, placing the gold material on the test carrier to start measurement, and collecting the current snp and recording the current snp as snp _ GonT; step three: converting the snp _ GonG and the snp _ GonT into a coupling matrix form by a coupling matrix extraction method; the invention can extract the difference between the common test carrier and the gold test carrier, and compensate the difference in real time in the test process to predict the test result of the tested piece on the gold test carrier, thereby realizing the test consistency; the plate alignment is not needed manually, the labor cost of the radio frequency filter testing link is reduced, and the testing consistency and accuracy are improved.

Description

Carrier difference correction method for electrical performance detection of radio frequency filter or duplexer
Technical Field
The invention belongs to the technical field of testing of radio frequency filters, and particularly relates to a carrier difference correction method for electrical property detection of a radio frequency filter or a duplexer.
Background
The radio frequency filter comprises a Monoblock filter, an LTCC low temperature co-fired filter, a dielectric waveguide filter, an SAW/BAW/FBAR filter and the like, and is widely applied to communication equipment such as mobile phone terminals, indoor base stations, wi-Fi access points, routers and the like. The performance of the rf filter directly affects the communication quality of the communication device. Therefore, the test method and test accuracy of the rf filter are of great interest.
Generally, the test of the radio frequency filter comprises two parts of appearance detection and electrical property detection, and the required instrument equipment and environment in the electrical property detection process are as follows; comprising a) a vector network analyzer: a meter capable of measuring an electrical property parameter. Generally, the electrical performance parameters of the rf filter are characterized by S-parameters, by which the insertion loss/rejection/return loss/ripple, etc. of the rf filter are evaluated. b) A radio frequency cable: and the cable is used for connecting the network analyzer with the test carrier. c) SMA connects: the radio frequency electrical performance of the device under test can be transmitted through the test carrier onto the radio frequency cable. d) Testing a carrier: is a Printed Circuit Board (PCB) customized for testing, and the tested piece can be placed on the test carrier by soldering or contact, and then the electrical property of the tested piece is tested by the network analyzer. The service life of the test carrier is generally about 10000 times, and the test carrier is usually replaced by a new test carrier every hour during batch test.
Due to objective factors such as the manufacturing process of the PCB, the difference of the SMA joints, and even the amount of soldering tin during SMA welding, the consistency of the test carriers can be affected, so that different test results can be obtained on different test carriers by the same tested piece. In order to overcome the difference between the test carriers and ensure the test consistency, a piece of PCB is usually screened and defined as a gold test carrier as the final reference of the test in the production and manufacturing process of the filter; in the prior art, a manual plate alignment method is often adopted, and a test carrier is aligned to a gold carrier by adding and subtracting soldering tin to an SMA joint. Requires skilled workers to operate by experience, and has the following disadvantages: low precision, time-consuming operation, high cost and inaccuracy.
Disclosure of Invention
The present invention is directed to a carrier difference correction method for electrical performance detection of a radio frequency filter or a duplexer, so as to solve the problems in the background art.
In order to achieve the purpose, the invention provides the following technical scheme: the carrier difference correction method for electrical property detection of the radio frequency filter or the duplexer comprises the following steps:
the method comprises the following steps: connecting a cable on the network analyzer, and completing calibration; connecting the gold carrier to a network analyzer through a radio frequency cable, placing gold material on the gold carrier, starting measurement, and collecting current snp; is recorded as: snp _ GonG; in the application, the gold material refers to a good product which passes an electrical property test, an appearance test and an aging test, and the insertion loss, the return loss and the out-of-band inhibition index have test margins, namely the gold material is a product which reaches the index after repeated tests, the gold material can be screened out from each batch of products, the gold material represents the good product in the current batch of products, and the gold material can also be called a gold sample; the gold carrier is a PCB which is screened out in the production and manufacturing process of the filter and is used as a final test reference for overcoming the difference between test carriers and ensuring the test consistency, the production factory and the final client send samples, perform sampling inspection, align indexes and other links, the gold carrier is used for testing to obtain data, once the model of the product is set, the gold carrier is sealed immediately, and the final client performs the test on the sampling inspection of the delivered product through the gold carrier; gold carriers may also be referred to as gold plates; the test material is a product to be detected currently; the test carrier is a test carrier used for current detection;
step two: taking down the gold carrier, connecting the test carrier, placing gold material on the test carrier, starting measurement, and collecting current snp; is recorded as: snp _ GonT;
step three: converting the obtained snp _ GonG and the resulting snp _ GonT into a coupling matrix form by a coupling matrix extraction method, wherein the coupling matrix form is as follows:
CM_GonG = CM{ snp_GonG };
CM_GonT = CM{ snp_GonT };
defining the difference of the test carrier compared with the gold carrier as follows: Δ -CM _ GandT = CM _ GonG-CM _ GonT;
step four: placing a test material on a test carrier, starting measurement, and collecting the current snp; is recorded as: snp _ TonT; the corresponding coupling matrix is expressed in the form of CM _ TonT = CM { snp _ TonT };
step five: compensating the difference delta-CM _ GandT of the obtained test carrier compared with the gold carrier to the result of the test material placed on the test carrier to obtain the predicted result of the test material placed on the gold carrier;
CM_TonG = CM_TonT +Δ-CM_GandT;
reconverting CM _ TonG to S-parameter form, snp _ TonG = CM -1 { CM_TonG };
Step six: and analyzing the S parameter characteristic value of the snp _ TonG to judge whether the test material can pass through the gold carrier.
Preferably, the gold material is a product part which is subjected to repeated tests to reach the index, the snp means that the S parameter measured by the network analyzer is stored as a snp file, and n represents the port number of the network analyzer.
Preferably, in step three, CM { · } represents a coupling matrix extraction method, CM _ GonG and CM _ GonT are both M × M matrices, M is related to the order N of the measured filter, and M = N +2.
Preferably, in step five, CM -1 {. Cndot } represents the method of converting the coupling matrix into S parameters.
Compared with the prior art, the invention has the beneficial effects that: the method provided by the invention can extract the difference between the common test carrier and the gold test carrier, and compensate the difference in real time in the test process so as to predict the test result of the tested piece on the gold test carrier and realize the test consistency; the plate alignment is not needed manually, the labor cost of the radio frequency filter testing link is reduced, and the testing consistency and accuracy are improved.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment provides a technical scheme: the carrier difference correction method for electrical property detection of the radio frequency filter or the duplexer comprises the following steps:
the method comprises the following steps: connecting a test cable by using a Keysight E5071C network analyzer, configuring test parameters of the network analyzer, counting 801 points as a measurement point, and calibrating by using a Keysight 85093C calibration piece; connecting the golden carrier to a network analyzer through a radio frequency cable, placing the golden material on the golden carrier, starting measurement, and collecting current s2p (in the embodiment, a two-port network analyzer is used, so that an s2p data file is obtained), wherein the s2p comprises four parts s11/s12/s21/s22, and the measurement data at each 801 point is recorded as: s2p _ GonG:
s2p_GonG =
Figure 177969DEST_PATH_IMAGE001
step two: taking down the gold carrier, connecting the test carrier, placing the gold material on the test carrier, starting measurement, and collecting the current s2p; the s2p includes four parts s11/s12/s21/s22, and the measurement data at each 801 point is expressed as: s2p _ GonT:
s2p_GonT =
Figure 992472DEST_PATH_IMAGE002
step three: the obtained s2p _ GonG and s2p _ GonT are converted into the form of transverse coupling matrices by a coupling matrix extraction method (cauchy method is adopted in the embodiment, and other methods such as vector fitting method and least square method can also achieve the same conclusion), which are respectively denoted as CM _ GonG and CM _ GonT:
CM_GonG = CM{ s2p_GonG };
CM_GonT = CM{ s2p_GonT };
the measured component in this embodiment is a dielectric filter, and the order of the filter is N, so that the coupling matrix expression of the measured component obtained by the coupling matrix extraction method is an N +2 order matrix, as shown below:
Figure DEST_PATH_IMAGE003
here, the difference of the test vehicle compared with the gold vehicle is defined as: Δ -CM _ GandT:
Δ-CM_GandT = CM_GonG - CM_GonT;
step four: placing the test material on a test carrier, starting measurement, and collecting the current s2p; the s2p includes four parts s11/s12/s21/s22, and the measurement data at each 801 point is recorded as: s2p _ TonT; the method is converted into a form of a transverse coupling matrix through an extraction method of the coupling matrix (the method is Cauchy adopted in the embodiment, and other methods such as a vector fitting method and a least square method can also reach the same conclusion):
CM_TonT = CM{ s2p_TonT };
step five: compensating the difference delta-CM _ GandT of the obtained test carrier compared with the gold carrier to the result of the test material placed on the test carrier, so as to obtain the predicted result of the test material placed on the gold carrier;
CM_TonG = CM_TonT +Δ-CM_GandT;
converting the CM _ TonG in the form of the coupling matrix into the form of S parameters to obtain:
s2p_TonG = CM -1 { CM_TonG };
s2p _ TonG is the measurement result after the carrier difference correction;
step six: judging whether the test sample is a PASS material (qualified) or a FAIL material (unqualified) by analyzing the S parameter characteristic value of the S2p _ TonG; the test consistency of using s2p _ tonG to make final judgment is better than that of using s2p _ tonT to make judgment; the gold carrier is a carrier aligned with a final client in the process of product trial production, sample delivery and index confirmation by a filter manufacturer, and is also a carrier used by the final client during spot check after the product is delivered; therefore, it is important that the test material passes or not passes on the gold carrier.
s2p _ TonG includes four parts s11/s12/s21/s22, and for filter products, attention is generally paid to a return loss index of s11/s22 (requiring that the return loss in the passband be higher than a set threshold), an insertion loss index of s21 (requiring that the insertion loss in the passband be lower than the set threshold), and an out-of-band rejection index (requiring that the rejection outside the passband be higher than the set threshold).
In this embodiment, preferably, the S2p means that the S parameter measured by the network analyzer is stored as an snp file, and n represents the port number of the network analyzer.
In this embodiment, preferably, in step three, CM { · } represents a coupling matrix extraction method, CM _ GonG and CM _ GonT are both M × M matrices, M is related to the order N of the filter to be tested, and M = N +2.
In this embodiment, preferably, in step five, CM -1 {. Represents the method for converting the coupling matrix into S parameters.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims (4)

1. A carrier difference correction method for detecting the electrical performance of a radio frequency filter or a duplexer is characterized by comprising the following steps: the method comprises the following steps:
the method comprises the following steps: connecting a cable on the network analyzer, and completing calibration; connecting a gold carrier to a network analyzer through a radio frequency cable, placing gold material on the gold carrier, starting measurement, and collecting current snp; is recorded as: snp _ GonG; the gold material is a good product which passes an electrical property test, an appearance test and an aging test, and the insertion loss, the return loss and the out-of-band inhibition index have test margins; the gold carrier is a PCB which is screened out in the production and manufacturing process of the filter and is used as a final test reference for overcoming the difference between test carriers and ensuring the test consistency;
step two: taking down the gold carrier, connecting the test carrier, placing gold material on the test carrier, starting measurement, and collecting current snp; is recorded as: snp _ GonT;
step three: converting the obtained snp _ GonG and snp _ GonT into a form of a coupling matrix by a coupling matrix extraction method, wherein the form is as follows:
CM_GonG = CM{ snp_GonG };
CM_GonT = CM{ snp_GonT };
the difference between the test vehicle and the gold vehicle is defined as follows: Δ -CM _ GandT = CM _ GonG-CM _ GonT;
step four: placing the test material on a test carrier, starting measurement, and collecting the current snp; is recorded as: snp _ TonT; its corresponding coupling matrix is expressed in the form CM _ TonT = CM { snp _ TonT };
step five: compensating the difference delta-CM _ GandT of the obtained test carrier compared with the gold carrier to the result of the test material placed on the test carrier to obtain the predicted result of the test material placed on the gold carrier;
CM_TonG = CM_TonT +Δ-CM_GandT;
reconverting CM _ TonG into S-parameter form, snp _ TonG = CM -1 { CM_TonG };
Step six: and analyzing the S parameter characteristic value of the snp _ TonG to judge whether the test material can pass through the gold carrier.
2. The carrier variation correction method for electrical performance detection of rf filter or duplexer of claim 1, wherein: the snp means that the S parameter measured by the network analyzer will be stored as a snp file, and n represents the port number of the network analyzer.
3. The carrier variation correction method for electrical performance detection of rf filter or duplexer of claim 1, wherein: in the third step, CM {. Cndot } represents the coupling matrix extraction method, CM _ GonG and CM _ GonT are M × M matrices, M is related to the order N of the tested filter, and M = N +2.
4. The method of claim 1, wherein the carrier difference correction method comprises: in step five, CM -1 {. Represents the method for converting the coupling matrix into S parameters.
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