CN215493968U - Radio frequency low noise amplifier chip test system - Google Patents
Radio frequency low noise amplifier chip test system Download PDFInfo
- Publication number
- CN215493968U CN215493968U CN202121518841.3U CN202121518841U CN215493968U CN 215493968 U CN215493968 U CN 215493968U CN 202121518841 U CN202121518841 U CN 202121518841U CN 215493968 U CN215493968 U CN 215493968U
- Authority
- CN
- China
- Prior art keywords
- radio frequency
- frequency switch
- port
- selectable
- switch module
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Abstract
The utility model relates to the technical field of chip testing, and discloses a radio frequency low noise amplifier chip testing system, which comprises: the first side of the first radio frequency switch module is connected with the noise source, the signal generator and the first port of the network analyzer, and the second side of the first radio frequency switch module is connected with the second side of the second radio frequency switch module; the first side of the second radio frequency switch module is connected with the second ports of the frequency spectrograph and the network analyzer; the first radio frequency switch module and the second switch module both comprise two connected radio frequency switches. Has the advantages that: the test system can be switched randomly in the tests of S parameters, OIP3, P1db and Noise Factor (NF), a plurality of tests are completed through one test system, testers are liberated from instrument connection and instrument verification, the test efficiency is improved, and the test cost is reduced.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a radio frequency low noise amplifier chip testing system.
Background
During the testing process of the rf lna chip, the main rf performance indicators to be detected are the S parameter, OIP3, P1db, and Noise Figure (NF).
1: s-parameters are most commonly measured using a network analyzer.
2: p1db can be measured with a signal generator + spectrometer, or by a network analyzer.
3: the OIP3 generates a double-tone signal through a signal source, and reads the power of a main tone signal and the power of a third-order intermodulation signal through a frequency spectrograph, thereby calculating an OIP3 value.
4: noise figure test methods generally have two methods: both the cold source method and the Y factor method require a spectrometer for testing, but the Y factor method requires one more noise source than the cold source method, and the Y factor method is mostly adopted under the condition of low noise coefficient.
For the to-be-tested piece, as for the above 4 parameter tests, a network analyzer, a signal generator, a frequency spectrograph and a noise source instrument are required to be used, connection of multiple circuits and instrument calibration are required to complete a group of tests, the system is complex to build, and a large amount of manpower and time are required to be consumed. If the batch test is carried out, a huge burden is brought to a tester, time and energy are consumed in repeated instrument connection and verification, and the batch test efficiency is extremely low.
Therefore, a radio frequency low noise amplifier chip test system is needed, which can realize convenient and fast tests of the S parameter, the OIP3, the P1db and the Noise Factor (NF), liberate testers from instrument connection and instrument verification, improve test efficiency and reduce test cost.
SUMMERY OF THE UTILITY MODEL
The purpose of the utility model is: the application provides a radio frequency low noise amplifier chip automated test system, can compatible multiple parameter's test, liberates the tester from instrument connection and instrument check-up, improves efficiency of software testing, reduces test cost.
In order to achieve the above object, the present invention provides a radio frequency low noise amplifier chip test system, including:
the first side of the first radio frequency switch module is connected with the first ports of the noise source, the signal generator and the network analyzer, and the second side of the first radio frequency switch module is connected with the second side of the second radio frequency switch module.
And the first side of the second radio frequency switch module is connected with the second ports of the frequency spectrograph and the network analyzer.
The first radio frequency switch module and the second switch module both comprise two connected radio frequency switches.
Furthermore, the first radio frequency switch module comprises a first radio frequency switch and a second radio frequency switch, a public port of the first radio frequency switch is connected with a public port of the second radio frequency switch, a plurality of selectable ports of the first radio frequency switch are respectively connected with the first ports of the noise source, the signal generator and the network analyzer, and the selectable ports of the second radio frequency switch are connected with the second side of the second radio frequency switch module.
Further, the first radio frequency switch comprises a first selectable port, a second selectable port and a third selectable port, the first selectable port is connected with the noise source, the second selectable port is connected with the signal generator, and the third selectable port is connected with the first port of the network analyzer.
Further, the second radio frequency switch comprises a fifth selectable port and a sixth selectable port, the fifth selectable port is connected with the piece to be tested, and the sixth selectable port is connected with the second side of the second radio frequency switch module.
Furthermore, the second radio frequency switch module comprises a third radio frequency switch and a fourth radio frequency switch, a common end of the third radio frequency switch is connected with a common end of the fourth radio frequency switch, an optional port of the third radio frequency switch is connected with the second side of the first radio frequency switch module, and a plurality of optional ports of the fourth radio frequency switch are respectively connected with second ports of the spectrometer and the network analyzer.
Further, the third radio frequency switch comprises a seventh selectable port and an eighth selectable port, the seventh selectable port is connected with the piece to be tested, and the eighth selectable port is connected with the second side of the first radio frequency switch module.
Further, the fourth rf switch includes a ninth selectable port and a tenth selectable port, the ninth selectable port is connected to the spectrometer, and the tenth selectable port is connected to the second port of the network analyzer.
Further, the model of the radio frequency switch is PXIE-2543.
Compared with the prior art, the radio frequency low noise amplifier chip test system disclosed by the embodiment of the utility model has the beneficial effects that: the test system comprises a first radio frequency switch module and a second radio frequency switch module, and when parameter tests are carried out, different parameter tests can be carried out only by adjusting the radio frequency switch states in the first radio frequency switch module and the second radio frequency switch module. The test system can be conveniently and rapidly switched in the test of S parameters, OIP3, P1db and Noise Factor (NF), a plurality of tests are completed through one test system, testers are liberated from instrument connection and instrument verification, the test efficiency is improved, and the test cost is reduced.
Drawings
FIG. 1 is a schematic diagram of an overall structure of a radio frequency low noise amplifier chip test system according to the present invention.
In the figure, 1, a first radio frequency switch module; 2. a second radio frequency switch module; 3. a noise source; 4. a signal generator; 5. a network analyzer; 6. a frequency spectrograph; 7. a first radio frequency switch; 8. a second radio frequency switch; 9. a third radio frequency switch; 10. and a fourth radio frequency switch.
Detailed Description
The following detailed description of embodiments of the present invention is provided in connection with the accompanying drawings and examples. The following examples are intended to illustrate the utility model but are not intended to limit the scope of the utility model.
As shown in fig. 1, the present invention discloses a radio frequency low noise amplifier chip test system, which comprises:
the first side of the first radio frequency switch module 1 is connected with the first ports of the noise source 3, the signal generator 4 and the network analyzer 5, and the second side of the first radio frequency switch module 1 is connected with the second side of the second radio frequency switch module 2.
And the first side of the second radio frequency switch module 2 is connected with the second ports of the frequency spectrograph 6 and the network analyzer 5.
The first radio frequency switch module 1 and the second switch module 2 both comprise two connected radio frequency switches.
In this embodiment, when the test system of the present invention is used to perform a parameter test, the connection state of the rf switches in the first switch module and the second switch module can be adjusted according to the performed parameter test, so that one or more of the noise source 3, the signal generator 4, the network analyzer 5, and the spectrometer 6 are connected to the test system, thereby implementing the parameter test.
In this embodiment, the first rf switch module 1 includes a first rf switch 7 and a second rf switch 8, a common port of the first rf switch 7 is connected to a common port of the second rf switch 8, a plurality of selectable ports of the first rf switch 7 are respectively connected to the first ports of the noise source 3, the signal generator 4 and the network analyzer 5, and a selectable port of the second rf switch 8 is connected to the second side of the second rf switch module 2.
In this embodiment, the first rf switch 7 includes a first selectable port, a second selectable port and a third selectable port, the first selectable port is connected to the noise source 3, the second selectable port is connected to the signal generator 4, and the third selectable port is connected to the first port of the network analyzer 5.
Referring to fig. 1, the first selectable port is a port a of the first rf switch 7; the second selectable port is a port b of the first radio frequency switch 7; the third selectable port is the c port of the first radio frequency switch 7.
In this embodiment, the second rf switch 8 includes a fifth selectable port and a sixth selectable port, the fifth selectable port is connected to the to-be-tested device, and the sixth selectable port is connected to the second side of the second rf switch module 2.
Referring to fig. 1, the fifth selectable port is a port a of the second rf switch 8; the sixth selectable port is a port b of the second radio frequency switch 8.
In this embodiment, the ports to which the switches of the first and second rf switches 7 and 8 are connected are adjusted according to the type of parametric test performed.
In this embodiment, the second rf switch module 2 includes a third rf switch 9 and a fourth rf switch 10, a common terminal of the third rf switch 9 is connected to a common terminal of the fourth rf switch 10, an optional port of the third rf switch 9 is connected to the second side of the first rf switch module 1, and a plurality of optional ports of the fourth rf switch 10 are respectively connected to the second ports of the spectrometer 6 and the network analyzer 5.
In this embodiment, the third rf switch 9 includes a seventh selectable port and an eighth selectable port, the seventh selectable port is connected to the device to be tested, and the eighth selectable port is connected to the second side of the first rf switch module 1.
Referring to fig. 1, the seventh optional port is the a port of the third rf switch 9; the eighth selectable port is the b port of the third rf switch 9.
In this embodiment, the fourth rf switch 10 includes a ninth selectable port connected to the spectrometer 6 and a tenth selectable port connected to the second port of the network analyzer 5.
Referring to fig. 1, the ninth optional port is a port a of the fourth rf switch 10; the tenth selectable port is a b port of the fourth rf switch 10.
In this embodiment, the ports to which the switches of the third rf switch 9 and the fourth rf switch 10 are connected will be adjusted according to the type of parametric test performed.
In this embodiment, the rf switch is model PXIE-2543. Those skilled in the art can select different types of rf switches according to the requirement, and select an rf switch with an appropriate selectable port number according to the embodiment of the present invention. In this embodiment, an alternative implementation is that the first rf switch 7 has three selectable ports, and the second rf switch 8, the third rf switch 9 and the fourth rf switch 10 have two selectable ports.
In this implementation, the frequency of the RF switch is up to 6.6GHz and all channels are matched using 50 Ohm.
The method for testing the parameters by applying the automatic testing system of the radio frequency low noise amplifier chip comprises the following steps:
1: and (3) testing S parameters:
step 1: the first radio frequency switch 7 is switched to the third optional port, so that the first radio frequency switch 7 is connected to the first port of the network analyzer 5;
step 2: the second radio frequency switch 8 is connected to the fifth selectable port thereof and is connected with the first port of the piece to be tested;
step 3: the third radio frequency switch 9 is connected to a seventh optional port;
step 4: the fourth radio frequency switch 10 is connected to the tenth selectable port thereof, so that the fourth radio frequency switch 10 is connected to the second port of the network analyzer 5; the S parameter of the piece to be tested can be tested.
When calibrating the network analyzer 5:
step 1: the first radio frequency switch 7 is switched to the third optional port, so that the first radio frequency switch 7 is connected to the first port of the network analyzer 5;
step 2: the second radio frequency switch 8 is connected to a sixth selectable port thereof;
step 3: the third radio frequency switch 9 is connected to the eighth selectable port thereof;
step 4: the fourth radio frequency switch 10 is connected to the tenth optional port thereof, so that the fourth radio frequency switch 10 is connected to the second port of the network analyzer 5;
an electronic calibration element or other calibration element is connected between the sixth selectable port of the second radio frequency switch 8 and the eighth selectable port of the third radio frequency switch 9 to calibrate the network analyzer 5 and the signal link.
2: test O1P3 and P1db parameters:
step 1: the first radio frequency switch 7 is switched to the second selectable port, so that the first radio frequency switch 7 is connected with the signal generator 4;
step 2: the second radio frequency switch 8 is connected to the fifth selectable port of the second radio frequency switch, so that the second radio frequency switch 8 is connected with the piece to be tested;
step 3: the third radio frequency switch 9 is connected to the seventh optional port of the second radio frequency switch, so that the third radio frequency switch 9 is connected with the piece to be tested;
step 4: the fourth rf switch 10 is connected to the ninth selectable port thereof, so that the fourth rf switch 10 is connected to the receiving end of the spectrometer 6.
The OIP3 test generates a two-tone signal through a signal source, and the power of the main tone and the third-order intermodulation signal is sampled by the frequency spectrograph 6 through the to-be-tested element, and then the two-tone signal is obtained through calculation.
P1db finds the 1db point of gain compression by the signal source extrapolating the different signal powers.
When calibrating the signal source and spectrometer 6:
step 1: the first radio frequency switch 7 is switched to the second selectable port, so that the first switch is connected to the signal generator 4;
step 2: the second radio frequency switch 8 is connected to a sixth selectable port thereof;
step 3: the third radio frequency switch 9 is connected to the eighth selectable port thereof;
step 4: the fourth radio frequency switch 10 is connected to the tenth optional port thereof, so that the fourth radio frequency switch 10 is connected to the second port of the network analyzer 5;
a radio frequency line is connected between the sixth selectable port of the second radio frequency switch 8 and the eighth selectable port of the third radio frequency switch 9 to calibrate the signal source and the frequency spectrograph 6, and to perform compensation on an actual measurement result, so that the measurement result is more accurate.
3: testing noise coefficient parameters:
measuring noise coefficient of spectrometer 6:
step 1: the first radio frequency switch 7 is switched to the first selectable port, so that the first radio frequency switch 7 is connected with the noise source 3;
step 2: the second radio frequency switch 8 is connected to a sixth selectable port thereof;
step 3: the third radio frequency switch 9 is connected to the eighth selectable port thereof;
step 4: the fourth radio frequency switch 10 is connected to its ninth selectable port, so that the fourth radio frequency switch 10 is connected to the spectrometer 6.
The sixth selectable port of the second rf switch 8 and the eighth selectable port of the third rf switch 9 are connected to the through rf line.
Measuring the noise coefficient of the whole system after the piece to be measured is added:
step 1: the first radio frequency switch 7 is switched to the first selectable port, so that the first radio frequency switch 7 is connected to the noise source 3;
step 2: the second radio frequency switch 8 is connected to the fifth selectable port of the second radio frequency switch, so that the second radio frequency switch 8 is connected with the piece to be tested;
step 3: the third radio frequency switch 9 is connected to the seventh optional port of the second radio frequency switch, so that the third radio frequency switch 9 is connected with the piece to be tested;
step 4: the fourth radio frequency switch 10 is connected to its ninth selectable port, so that the fourth radio frequency switch 10 is connected to the spectrometer 6.
And substituting the noise coefficient into the frequency spectrograph 6 and the noise coefficient of the whole system after the part to be detected is added by a noise coefficient cascade formula to calculate the self to be detected coefficient to be detected.
To sum up, the embodiment of the present invention provides a radio frequency low noise amplifier chip test system, which has the following beneficial effects: the test system comprises a first radio frequency switch module and a second radio frequency switch module, and when parameter tests are carried out, different parameter tests can be carried out only by adjusting the radio frequency switch states in the first radio frequency switch module and the second radio frequency switch module. The test system can be conveniently and rapidly switched in the test of S parameters, OIP3, P1db and Noise Factor (NF), a plurality of tests are completed through one test system, testers are liberated from instrument connection and instrument verification, the test efficiency is improved, and the test cost is reduced.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and substitutions can be made without departing from the technical principle of the present invention, and these modifications and substitutions should also be regarded as the protection scope of the present invention.
Claims (8)
1. A radio frequency low noise amplifier chip test system, comprising:
the first side of the first radio frequency switch module is connected with the noise source, the signal generator and the first port of the network analyzer, and the second side of the first radio frequency switch module is connected with the second side of the second radio frequency switch module;
the first side of the second radio frequency switch module is connected with the second ports of the frequency spectrograph and the network analyzer;
the first radio frequency switch module and the second switch module both comprise two connected radio frequency switches.
2. The system for testing the radio frequency low noise amplifier chip as recited in claim 1, wherein the first radio frequency switch module comprises a first radio frequency switch and a second radio frequency switch, a common port of the first radio frequency switch is connected to a common port of the second radio frequency switch, a plurality of selectable ports of the first radio frequency switch are respectively connected to the first ports of the noise source, the signal generator and the network analyzer, and a selectable port of the second radio frequency switch is connected to the second side of the second radio frequency switch module.
3. The radio frequency low noise amplifier chip test system according to claim 2, wherein the first radio frequency switch includes a first selectable port, a second selectable port and a third selectable port, the first selectable port is connected to the noise source, the second selectable port is connected to the signal generator, and the third selectable port is connected to the first port of the network analyzer.
4. The system for testing a radio frequency low noise amplifier chip as claimed in claim 2, wherein the second radio frequency switch includes a fifth selectable port and a sixth selectable port, the fifth selectable port is connected to the device under test, and the sixth selectable port is connected to the second side of the second radio frequency switch module.
5. The system for testing a radio frequency low noise amplifier chip of claim 1, wherein the second radio frequency switch module comprises a third radio frequency switch and a fourth radio frequency switch, a common terminal of the third radio frequency switch is connected to a common terminal of the fourth radio frequency switch, the selectable port of the third radio frequency switch is connected to the second side of the first radio frequency switch module, and the selectable ports of the fourth radio frequency switch are respectively connected to the second ports of the spectrometer and the network analyzer.
6. The radio frequency low noise amplifier chip test system according to claim 5, wherein the third radio frequency switch includes a seventh selectable port and an eighth selectable port, the seventh selectable port is connected to the device under test, and the eighth selectable port is connected to the second side of the first radio frequency switch module.
7. The radio frequency low noise amplifier chip test system according to claim 5, wherein the fourth radio frequency switch includes a ninth selectable port and a tenth selectable port, the ninth selectable port is connected to a spectrometer, and the tenth selectable port is connected to the second port of the network analyzer.
8. The system for testing the chip of the RF low noise amplifier as claimed in any one of claims 1 to 7, wherein the RF switch is PXIE-2543.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121518841.3U CN215493968U (en) | 2021-07-05 | 2021-07-05 | Radio frequency low noise amplifier chip test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121518841.3U CN215493968U (en) | 2021-07-05 | 2021-07-05 | Radio frequency low noise amplifier chip test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215493968U true CN215493968U (en) | 2022-01-11 |
Family
ID=79724595
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121518841.3U Active CN215493968U (en) | 2021-07-05 | 2021-07-05 | Radio frequency low noise amplifier chip test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215493968U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114814442A (en) * | 2022-06-28 | 2022-07-29 | 北京京瀚禹电子工程技术有限公司 | Low-noise amplifier test system and test method |
| CN116593874A (en) * | 2023-07-17 | 2023-08-15 | 宁波吉品科技有限公司 | Chip testing method |
-
2021
- 2021-07-05 CN CN202121518841.3U patent/CN215493968U/en active Active
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114814442A (en) * | 2022-06-28 | 2022-07-29 | 北京京瀚禹电子工程技术有限公司 | Low-noise amplifier test system and test method |
| CN114814442B (en) * | 2022-06-28 | 2022-09-13 | 北京京瀚禹电子工程技术有限公司 | Low-noise amplifier test system and test method |
| CN116593874A (en) * | 2023-07-17 | 2023-08-15 | 宁波吉品科技有限公司 | Chip testing method |
| CN116593874B (en) * | 2023-07-17 | 2023-10-13 | 宁波吉品科技有限公司 | Chip testing method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN215493968U (en) | Radio frequency low noise amplifier chip test system | |
| CN105067989B (en) | A kind of general power amplifier Auto-Test System and its automatic test approach | |
| US6397160B1 (en) | Power sensor module for microwave test systems | |
| CA2364189A1 (en) | High frequency circuit analyzer | |
| CN203658537U (en) | Automatic test system for continuous wave radio frequency power amplifier | |
| CN104635049B (en) | A kind of spectrum analyzer with calibration function | |
| US20080297172A1 (en) | Method for Measuring the Noise Figure of a Device Under Test with a Network Analyser | |
| CN210112015U (en) | Radio frequency switch chip test system | |
| US20090174415A1 (en) | Method for Calibrating a Real-Time Load-Pull System | |
| US20080238441A1 (en) | Vector Network Analyzer-Noise Figure Measurement | |
| CN106771554A (en) | Multiport microwave device test system and method | |
| CN110763977B (en) | System and method for quantitatively measuring and evaluating precision of noise test system | |
| CN113992280B (en) | Insertion loss calibration device of broadband channel production testing clamp and working method thereof | |
| CN112751627B (en) | Power calibration method and device of wireless module | |
| CN101598751B (en) | Measuring method and measuring device of dynamic impedance of high-power radio-frequency module | |
| CN114035016A (en) | Power device transmission parameter determination method, device, terminal and storage medium | |
| CN112530825A (en) | On-chip multi-parameter measuring device | |
| CN117375736B (en) | Differential mode injection test method and system for electromagnetic compatibility sensitivity test | |
| Li et al. | Behavioral Model Extraction for Low Noise Amplifier | |
| Singh et al. | Commissioning of a VNA dynamic uncertainty tool for microwave S-parameter measurements | |
| Du et al. | Research on the UOSM four-port Calibration algorithm and determination method of the Transmission error term | |
| CN115656651A (en) | Noise coefficient test method for spectrum analyzer | |
| Reveyrand et al. | Calibrated measurements of waveforms at internal nodes of MMICs with a LSNA and high impedance probes | |
| Srinivasan et al. | Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms | |
| CN117310465A (en) | Switch matrix test platform and switch matrix test method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant |