CN115184654A - Test pin die, test method, and storage medium - Google Patents
Test pin die, test method, and storage medium Download PDFInfo
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- CN115184654A CN115184654A CN202210852950.1A CN202210852950A CN115184654A CN 115184654 A CN115184654 A CN 115184654A CN 202210852950 A CN202210852950 A CN 202210852950A CN 115184654 A CN115184654 A CN 115184654A
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- 238000003860 storage Methods 0.000 title claims abstract description 10
- 238000010998 test method Methods 0.000 title abstract description 9
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- 238000003825 pressing Methods 0.000 claims description 11
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2813—Checking the presence, location, orientation or value, e.g. resistance, of components or conductors
Abstract
The invention relates to the technical field of electronic test, and discloses a test pin die, a test method and a storage medium, wherein the method comprises the following steps: acquiring a test request; starting a test pin die based on the test request, and generating a current detection request; based on the current detection request, detecting components of a product to be detected by using a detection probe to obtain a detection result, and if the detection result indicates that the product to be detected has components, testing the product to be detected by using the detection probe; if the detection result shows that no component exists in the product to be detected, the product to be detected is unqualified, and the method can avoid that the flexible circuit board is mistakenly identified as a qualified product under the conditions that the component is missed and the electric measurement is passed.
Description
Technical Field
The invention relates to the technical field of electronic testing, in particular to a testing needle die, a testing method and a storage medium.
Background
Along with the popularization of mobile electronic products and the coming of the 5G era, electronic products such as mobile phones and wearable devices have higher and higher requirements on the volume and the functions of the electronic products, people have higher requirements on the quality of the products, and a Flexible Printed Circuit (FPC) is used as a widely used component in the electronic products to provide higher requirements on the test and the detection of the flexible printed circuit.
In the production of the flexible circuit board, a flexible board with a specified shape is manufactured, after soldering tin and soldering flux are brushed on a welding disc of the flexible board, a Surface Mounted Technology (SMT) chip mounter is used for mounting components, then the flexible board is placed into a heating furnace for welding, and then the situation that the components are leaked and Mounted sometimes occurs, but the situation is not allowed to pass the test in the electrical testing stage. However, when the connector is tested, the long probe is stuck on the PIN of the connector, in order to achieve stable test, the probe is compressed for a certain length after contacting the PIN, when the connector is tested by using the spring PIN sleeve, the compression amount of the probe is large, if the flexible board is leaked to adhere to the connector, the probe is stuck on a pad to be welded with the connector, and the test is passed.
Therefore, the flexible circuit board is subjected to electrical measurement due to the fact that components are not attached, but the flexible circuit board is mistakenly identified as a qualified product.
Disclosure of Invention
The embodiment of the invention provides a test pin die, a test method and a storage medium, which are used for avoiding the problem that a flexible circuit board is mistakenly identified as a qualified product under the condition that components are missed and tested electrically.
In order to solve the above technical problem, an embodiment of the present application provides a testing pin die, which includes a probe module, a pin die assembly, and a pin die main body, where the pin die assembly includes a first pin die, a third pin die, a fourth pin die, and a fifth pin die, and the pin die main body is a second pin die, where:
the first needle die is connected with the second needle die through an elastic module, is positioned above the second needle die and is used for bearing a product to be tested;
the second needle die is respectively connected with the first needle die and the third needle die and is positioned above the third needle die, and the second needle die is connected with the third needle die through a support column and is used for fixing the test probe;
the fourth needle die is connected with the fifth needle die and used for installing the switching module;
when the test needle die works, the probe module penetrates through the third needle die, the second needle die and the first needle die and is used for testing the product to be tested and detecting whether components of the product to be tested are missed or not.
Further, the test needle mould still include the apron, the product that awaits measuring includes the connector, first needle mould still includes the constant head tank, wherein:
the cover plate is positioned above the connector and used for pressing the connector and enabling the product to be tested to be placed into the positioning groove of the first needle die for fixing;
the positioning groove of the first needle die is used for positioning the testing position of the product to be tested. Further, the cover plate includes a torsion spring and a pin, wherein:
the cover plate rotates around the pin, and the torsion spring provides pressure;
based on the pressure, the cover plate presses the connector, and the connector of the product to be tested is placed into the connector positioning groove of the first needle die to be fixed.
Further, the test needle mould still includes linear bearing pin, linear bearing, activity copper sheathing, wherein:
the linear bearing pin is arranged on the first needle die, the linear bearing is arranged on the second needle die, and the first needle die and the second needle die move up and down through the linear bearing and the linear bearing pin;
the movable copper sleeve is installed on the first needle die and used for locking the second needle die and combining with the elastic module to limit the distance between the first needle die and the second needle die through elasticity, so that the first needle die and the second needle die move up and down in a preset distance range.
Further, the test needle mould still includes that the rubber line ball piece of dominant force, needle cover, wherein:
the needle sleeve is arranged on the fourth needle die and the fifth needle die and used for fixing needle die lines;
and the stress application rubber line pressing block is arranged on the fifth needle die and used for pressing the needle die line to prevent the needle die line from influencing the test.
Further, the test probe is put into the back pinhole of the third pin die and extends to the first pin die;
when the test needle die works and starts, the test probe is positioned in the needle hole of the first needle die and presses the surface of the first needle die, so that the floating distance between the first needle die and the second needle die is reduced, and the test probe extends out of the needle hole of the first needle die and pricks at a test part corresponding to the product to be tested.
Further, the probe module comprises a first probe and a second probe, the connector comprises a left PIN foot and a right PIN foot, wherein the first probe comprises at least six test probes, and the second probe comprises at least four detection probes;
the testing device comprises a connector, a testing probe, a left PIN PIN, a right PIN PIN, a grounding point and a grounding point, wherein the testing probe is connected with the left PIN PIN of the connector, the testing probe is connected with the right PIN PIN of the connector, the left PIN PIN and the right PIN PIN are connected with the grounding point of an internal circuit of a product to be tested, and the testing probe is used for ensuring the stability of testing;
adopt two at least detection probe with connector PIN foot upper left end and left lower extreme are connected, simultaneously, adopt two at least detection probe with connector PIN foot upper right end and right lower extreme are connected, are used for detecting whether components and parts exist in the product that awaits measuring.
In order to solve the foregoing technical problem, an embodiment of the present application provides a test method, including:
acquiring a test request;
starting a test pin die based on the test request, and generating a current detection request;
based on the current detection request, performing component detection on a product to be detected by adopting a detection probe to obtain a detection result;
if the detection result is that the product to be detected has components, testing the product to be detected by adopting a test probe;
and if the detection result indicates that no component exists in the product to be detected, the product to be detected is unqualified.
In order to solve the above technical problem, an embodiment of the present application further provides a computer-readable storage medium, where a computer program is stored, and the computer program, when executed by a processor, implements the steps of the above test method.
The test pin die, the test method and the storage medium provided by the embodiment of the invention obtain the test request; starting a test pin die based on the test request, and generating a current detection request; based on the current detection request, performing current detection by using each test probe in the probe module to obtain a detection result corresponding to each test probe, wherein the current detection is to detect whether a preset test component exists; and when all the detection results show that no component exists, determining that the component is not pasted, otherwise, determining that the test is passed. Whether the flexible circuit board is missed with the components or not is detected in the electrical testing stage through the method, the method has the advantages of being simple in structure, low in cost, convenient to use and maintain and high in stability, and the problem that the flexible circuit board is mistakenly identified as a qualified product due to the fact that the components are missed and tested through electrical testing is solved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments of the present invention will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained according to these drawings without inventive labor.
FIG. 1 is an exemplary architecture diagram of a test pin die of the present application;
FIG. 2 is a schematic view of a connector pad of the present application;
FIG. 3 is a flow chart of one embodiment of a testing method of the present application.
Description of the figure numbers:
01. a first pin die; 02. a second pin die; 03. a third needle die; 04. a fourth pin die; 05. a fifth needle die; 06. a cover plate; 07. a connector; 08. a linear bearing pin; 09. a linear bearing; 10. a movable copper sleeve; 11. a first probe; 12. a second probe.
Detailed Description
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs; the terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application; the terms "including" and "having," and any variations thereof in the description and claims of this application and the description of the figures above, are intended to cover non-exclusive inclusions. The terms "first," "second," and the like in the description and claims of this application or in the above-described drawings are used for distinguishing between different objects and not for describing a particular order.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
Referring to fig. 1, fig. 1 shows a testing pin mold according to an embodiment of the present invention, which is detailed as follows:
the test needle mould includes probe module, needle mould subassembly and needle mould main part, and the needle mould subassembly includes first needle mould 01, third needle mould 03, fourth needle mould 04 and fifth needle mould 05, and the needle mould main part is second needle mould 02, wherein:
the first needle die 01 is connected with the second needle die 02 through an elastic module, is positioned above the second needle die 02 and is used for bearing a product to be tested;
the second needle die 02 is respectively connected with the first needle die 01 and the third needle die 03 and is positioned above the third needle die 03, and the second needle die 02 is connected with the third needle die 03 through a support column and used for fixing a test probe;
the fourth needle die 04 is connected with the fifth needle die 05 and is used for installing the switching module;
when the test needle mold works, the probe module penetrates through the third needle mold 03, the second needle mold 02 and the first needle mold 01 to test whether the components of the product to be tested and the product to be tested are missed or not.
Specifically, the first pin mold 01 is a part for carrying a product to be tested, and has positioning and testing functions. The function of first needle mould 01 is that the product that awaits measuring is fixed a position and set up the probe hole site in concrete position, will await measuring the product and place in the positioning groove of first needle mould 01, and the recess is the constant head tank of the product that awaits measuring, and concrete clearance is relevant with test element, and the recess is in the bottom of connector constant head tank, guarantees the coarse positioning to the product that awaits measuring, guarantees simultaneously that test connector carries out the high accuracy of the constant head tank of fixing a position to the connector. The height of the groove is generally 2-3mm, and is related to the flatness of a product to be measured, so that the product to be measured is well positioned, the flatness of the product to be measured is good, 2mm is enough, and the product to be measured is large or needs about 3mm when being bent.
The elastic module can be a spring, and is limited according to practical application scenes.
The second pin mold 02 is a main body part of the pin mold and is mounted on the carrier plate assembly.
The second pin mold 02 and the third pin mold 03 are connected by a support column to fix the probe, and provide an adjustable probe elastic force with a designated support distance. The supporting structure of the probe is formed by the supporting columns between the first needle mold and the second needle mold, the probe penetrates from the tail of the third needle mold 03 and extends out of the second needle mold 02, the lengths of the probes with different lengths are different, the supporting distance between the second needle mold 02 and the third needle mold 03 is also different, and the lengths of the supporting columns are different.
The fourth needle die 04 and the fifth needle die 05 are used for mounting needle sleeves, such as hollow needle sleeves, spring needle sleeves and the like. The probe is a conductor, and the probe contacts with the needle cover, and the needle cover guides the current into the probe through the needle cover line, and then flows into the specific test part of the product to be tested. The switching mode has hollow needle cover line, solid needle cover line, spring needle cover line, PCB board etc. and the probe will be let in the electric current and need be connected with machine test loop, has multiple switching mode with the leading-in probe of electric current, and different switching modes have different characteristics.
It should be noted here that the pin die mainly performs a normal OS on-off test on a product to be tested, and it is one of the accessory functions to detect whether a component is missed, and when the detection probe of the pin die detects that the component exists, the normal OS test is performed through the test probe, and if the component passes the OS test, it is determined that the product to be tested is a good product meeting the requirements.
Through the test needle mould that above-mentioned probe module, needle mould subassembly and needle mould main part were found, whether have the missed paste to the connector on the flexible circuit board before the test and detect, the accurate wastrel of discerning, simple structure is limited, and stability is high, avoids because of missing the components and parts and through the electric problem that leads to the flexible circuit board scrapped of survey.
Further, the test needle mould still includes apron 06, the product that awaits measuring includes connector 07, and first needle mould 01 still includes the constant head tank, wherein:
the cover plate 06 is positioned above the connector 07 and used for pressing the connector 07 and enabling a product to be tested to be placed into the positioning groove of the first needle die 01 for fixing;
the positioning groove of the first needle mold 01 is used for positioning the test position of the product to be tested.
Specifically, the cover plate 06 can press the connector 07 into a positioning groove of the connector 07 for fixation, which is beneficial to stable testing.
It should be noted here that there are actually two positioning grooves, one for the product to be tested, which is a coarse positioning, and the connector on the product to be tested also needs to be precisely positioned, and for the connector, there is also one positioning groove,
the cover plate 06 presses the connector 07 into a fine positioning groove of the connector 07 for positioning. Specifically, when a product to be tested is placed in the product positioning groove, the connector positioning groove is located below the product positioning groove, a chamfer is formed in the edge of the connector positioning groove, and when the product to be tested is placed in the connector positioning groove, the connector 07 can enter the connector positioning groove along the chamfer.
Further, the cover plate 06 includes a torsion spring and a pin, wherein:
the cover plate 06 rotates around the pin, and the torsion spring provides pressure;
based on the pressure, the cover plate 06 presses the connector 07 and the product to be tested is put into the positioning groove of the first needle mold 01 for fixation.
It should be noted here that the cover plate 06 mainly fixes the connector 07 in the connector positioning groove, and since the positioning gap of the connector positioning groove to the connector 07 is very small, only 0.02mm or even smaller, it is not easy to put the connector 07 into the connector positioning groove at one time, and it is pressed by the cover plate 06, pressed in and then fixed. Simultaneously, put into the recess back of locating with the product that awaits measuring, owing to there are three connector 07, and the clearance between the positioning groove of connector 07 and the connector 07 of the product that awaits measuring is very little, generally be zero few millimeters or even several microns at zero point, it is once only difficult to all place three connector 07 into the positioning groove of connector 07 to rely on the suction of the product that awaits measuring to inhale with the vacuum on the first needle mould 01, consequently, need use apron 06 to add torsional spring and pin, apron 06 rotates round the pin, the torsional spring provides pressure, the pressure of apron 06 is fixed a position in with the connector voltage sharing connector groove.
Through the steps, the connector is pressed into the positioning groove of the connector to be fixed, and the stability of the test is facilitated.
Further, the test needle die also comprises a linear bearing pin 08, a linear bearing 09 and a movable copper sleeve 10, wherein:
a linear bearing pin 08 is installed on the first needle die 01, a linear bearing 09 is installed on the second needle die 02, and the first needle die 01 and the second needle die 02 move up and down through the linear bearing 09 and the linear bearing pin 08;
the movable copper bush 10 is installed on the first needle die 01 and used for locking the second needle die 02 and combining with the elastic module to limit the distance between the first needle die 01 and the second needle die 02 by elasticity, so that the first needle die 01 and the second needle die 02 move up and down in a preset distance range.
Specifically, have the spring to provide elasticity between first needle mould 01 and the second needle mould 02 and make first needle mould 01 keep the certain distance, first needle mould 01 dress linear bearing pin, second needle mould 02 dress linear bearing, the effect of accurate direction about both cooperations reach, first needle mould 01 dress activity copper sheathing is locked on second needle mould 02, makes the unsteady distance restriction of first needle mould 01 and second needle mould 02 to the appointed requirement.
Because the probe does not stretch out below the pinhole of first needle mould 01, first needle mould 01 leads through pin and linear bearing with second needle mould 02, and the activity copper sheathing carries out the spacing of the concrete size that first needle mould 01 and second needle mould 02 floated, and the spring provides the support between first needle mould 01 and second needle mould 02. First needle mould 01 removes to second needle mould 02, and the probe will stretch out from first needle mould 01 pinhole, and first needle mould 01 and second needle mould 02 move to the coincidence, and the probe stretches out appointed length and pricks the product concrete test position that awaits measuring, and the length of stretching out is equivalent to what the compression has been how much, and the elasticity that the probe decrement provided greatly is just big.
Through above-mentioned linear bearing pin, linear bearing and activity copper sheathing, controlled the distance of first needle mould and second needle mould and realized the activity of first needle mould and second needle mould, be favorable to follow-up testing the product that awaits measuring.
Further, the test needle mould still includes rubber line ball piece, needle cover of the dominant force, wherein:
the needle sleeve is arranged on the fourth needle die 04 and the fifth needle die 05 and is used for fixing needle die lines;
the rubber line pressing block is arranged on the fifth needle die 05 and used for pressing needle die lines and preventing the needle die lines from influencing the test.
In particular, the needle hub includes, but is not limited to, hollow needle hubs and spring needle hubs.
Because the probe is a conductor, the probe is contacted with the needle sleeve, and the needle sleeve leads current into the probe through the needle sleeve line and then flows into a specific test part of a product to be tested.
The rubber line pressing block is installed on a needle die five pressing needle die line, and the influence on the test caused by pulling in the motion process is prevented.
Through above-mentioned line ball piece, needle cover are glued to excelling in, be favorable to the stability of follow-up test.
Further, the test probes of the probe module are put in from the back side pinholes of the third pin mold 03 and extend to the first pin mold 01;
when the test needle mold starts, the probes in the probe module are positioned in the needle holes of the first needle mold 01, and pressure is applied to the surface of the first needle mold 01, so that the floating distance between the first needle mold 01 and the second needle mold 02 is reduced, and the test probes 11 extend out of the needle holes of the first needle mold 01 and prick the test parts corresponding to a product to be tested.
In particular, the test of the flexible circuit board is generally divided into a functional test and an ICT test. The ICT test is generally a test for on/off of internal circuits of a product to be tested, and determines whether one circuit is a through circuit or not and whether different circuits have short circuits or not. In the ICT test for the connector, generally a connector positioning groove is arranged for fine positioning of the connector, and then a PIN pricking test is performed on a PIN PIN of the connector by using a probe, the connector generally has a small height which is 0.5mm or less, the compression amount of the probe is related to a matched needle sleeve used by the connector, if the probe passes through the hollow needle sleeve, a solid needle sleeve or a PCB (printed circuit board) introduces an electric signal, the compression amount is generally less than 0.5mm, the test is stable and less than the height of the connector, if the connector is leaked and adhered on the flexible board, the probe cannot prick a bonding pad of the flexible board and passes the test, if the spring needle sleeve is used, the compression amount is about 0.5 to 1.2mm, the connector is not arranged on the flexible board, the probe can prick the bonding pad of the flexible board and still passes the test, which is not allowed, and in some cases, the spring still needs to be preferentially used, and can provide buffer during the test, so that the probe can be prevented from generating the PIN pricking due to large elasticity or impact.
Different flexible board internal line is different, and different circuit both ends all have the extreme point, and some are connected to the PIN foot in the middle of the connector, and some are connected to the HOTBAR pad, and a connector has with more circuit and is concerned with, and more extreme point is connected to the connector, and the PIN foot of connector is more, and the big PIN foot in connector both ends is acquiescence ground connection, so it is more to divide apart the PIN foot of two big PIN feet promptly in the structure center equivalently. Some flexible board internal lines can be connected with LEDs or SWITCH keys to realize some functions, and the influence of needle inserting on the connector with a needle module is small. The test method is only to accurately insert the pin at the connector by the pin die and detect whether the connector is missed.
Through the process, the test part of the product to be tested is quickly positioned, so that the subsequent test of the product to be tested is facilitated.
Further, the probe module comprises a first probe 11 and a second probe 12, and the connector comprises a left PIN foot and a right PIN foot, wherein the first probe 11 comprises at least six test probes, and the second probe 12 comprises at least four detection probes;
the testing method comprises the following steps that at least three testing probes are adopted to be connected with a left PIN foot of a connector, at the same time, at least three testing probes are adopted to be connected with a right PIN foot of the connector, and the left PIN foot and the right PIN foot are connected with a grounding point of an internal circuit of a product to be tested and used for guaranteeing the stability of testing;
adopt two piece at least detecting probe and connector PIN foot upper left end and left lower extreme to be connected, simultaneously, adopt two piece at least detecting probe and connector PIN foot upper right end and right lower extreme to be connected for whether detect the product that awaits measuring and have components and parts.
Specifically, the PIN foot at connector structure center participates in the inside line of walking of flexbile and realizes different functions, and the position is limited and only one PIN foot is pricked a probe, and the big PIN foot surface at connector both ends is great, can prick several probe tests, and both ends PIN foot almost all is used for the earth connection, and the PIN foot at both ends is connected to the flexbile and is through the three small region pad of unilateral.
It should be noted here that the probe module is a module for testing PIN PINs at two ends of a connector on a product to be tested, and the PIN PINs at two ends of the connector are special and can be used for judging whether the connector is missed. It should be understood that there are many PIN PINs between the PIN PINs at the two ends of the connector to be tested for PIN insertion, and this is not limited in any way.
The left PIN is connected with the grounding point of the internal circuit of the flexible board and is a point, current is introduced by using one test probe to realize testing, but the PIN is pricked by using three test probes for testing stability, because the pricking testing by using one test probe is risky, the pricking testing by using only one test probe is supposed to be carried out, if the test probe is not pricked, the testing is not passed, and the wrong detection is caused because the testing is not passed although the product is good. Therefore, three test probes are needed to prick the PIN at the left end to keep the test stable, the lines connected by the three test probes are short-circuited together and are equivalent to one test line, the test can be carried out as long as one test probe is pricked, and misdetection caused by a machine is avoided.
Because the connector is welded on the flexible board, the area where the connector is welded becomes a pad, and the pad is connected with the internal circuit of the flexible board and can conduct electricity. As shown in fig. 2, fig. 2 is a schematic diagram of a connector pad. The pad area corresponding to the PIN foot at the left end is three rectangular areas at the left end. The three regions are just under the three test probes, if the connector does not exist and the test probes are pricked in the bonding pad region, the circuit can still be conducted, so that a product to be tested passes the test, but the product with the leaked and pasted components is a defective product, and the product is selected. Therefore, two detection probes are required to be arranged and are positioned at the upper left end PIN foot and the lower left end PIN foot.
During testing, if the connector exists, the testing probes can prick the PIN feet on the left side to conduct a circuit, if the connector is missed, the circuit cannot be conducted due to the fact that the two testing probes cannot prick a pad area, and therefore whether the connector exists can be judged according to whether the circuit is conducted, the PIN feet on the left end are grounding points and are points, lines connected with the two testing probes are short-circuited together, and the functions of the lines are the same.
It should be noted here that PIN legs are present at both left and right ends of a connector, i.e. the above description applies equally to PIN legs at the right end of a connector. That is, whether 4 detection probes exist in the connector or not is detected, so that the detection stability is ensured, and the condition of error detection is avoided.
If a plurality of detection probes are not adopted, the connector exists, the detection probes detect that the connector does not exist when current is introduced, at the moment, the detection probes do not detect the circuit of the flexible board any more, but directly judge that the flexible board is a defective product, and misdetect the good flexible board as the defective product, so that the yield is reduced.
The testing needle die has the advantages of simple structure, low cost, convenience in use and maintenance and high stability, and avoids the problem that the flexible circuit board is mistakenly identified as a qualified product due to the fact that the flexible circuit board is leaked to be pasted with components and parts and is electrically tested.
Referring to fig. 3, fig. 3 shows a testing method provided by the embodiment of the invention, which is described by taking the testing needle module in fig. 1 as an example, and is detailed as follows:
s201, obtaining a test request.
In step S201, the test request refers to a request for testing a product to be tested.
The test request includes, but is not limited to, a functional test and a system test.
It should be appreciated that since the missing connector is a very rare event, it cannot cause false positives to reduce the test yield, such as a situation where the test probe is identified as a missing connector because it does not have a stabbed connector or a slip pin. Therefore, the test procedure needs to be analyzed. If the part is missed, the probes except the four diagonal probes can be pricked to the bonding pad to test the bonding pad, and normal test can still be carried out, so the detection mode is before the test mode.
By acquiring the test request, before the product to be tested is tested, the test needle die is opened to test whether the missed component is attached or not, so that the problem that the product to be tested is mistakenly identified as a qualified product under the condition that the component is attached in a missing manner and is electrically tested is solved.
S202, starting a test pin die based on the test request, and generating a current detection request.
In step S202, the current detection request is used to input a current to the detection probe to detect whether or not a component is present.
By opening the test needle die and generating the current detection request, whether the leakage pasting component exists or not is tested through the current, so that the problem that the product to be tested is mistakenly identified as a qualified product under the condition that the component is pasted due to leakage and is electrically tested is solved.
And S203, based on the current detection request, detecting the components of the product to be detected by adopting the detection probe to obtain a detection result.
In step S203, the component is a connector.
And S204, if the detection result shows that the product to be detected has components, testing the product to be detected by adopting the test probe.
In step S204, since the process may generate misjudgment, that is, some probes are not stabbed, in order to reduce the misjudgment probability, the four detection probes are judged to be without connectors only if all the detection probes display open circuits, and one detection probe passes the test and is also judged to be with connectors, so that the misjudgment probability can be greatly reduced, if the probability needs to be further reduced, timeliness can be added, and the detection probe detects that all the detection probes are open circuits in a very short period and is judged to be without connectors.
S205, if the detection result shows that no component exists in the product to be detected, the product to be detected is unqualified.
In step S205, if the component is detected to be missing by the detection probe, the product to be detected is directly determined to be a defective product without performing subsequent circuit detection on the flexible board.
In the embodiment, a test request is obtained; starting a test pin die based on the test request, and generating a current detection request; based on the current detection request, performing current detection by using each test probe in the probe module to obtain a detection result corresponding to each test probe, wherein the current detection is to detect whether a preset test component exists or not; and when all the detection results show that no component exists, determining that the component is missed, otherwise, determining that the test is passed. The four detection probes input current for detection firstly, if no connector exists, the test is not carried out, since misjudgment possibly occurs in the process, namely, some probes do not have the condition of stabbing stably, in order to reduce the misjudgment probability, the four detection probes judge that no connector exists only if all the detection probes display the condition of open circuit, and one probe judges that the connector exists when the test is passed, the misjudgment probability can be greatly reduced, if the probability needs to be further reduced, timeliness can be added, and the connector does not exist only if the detection probes detect that the detection probes are all open circuits in an extremely short period. Whether the flexible circuit board is leaked and pasted with the components or not is detected in the electrical testing stage, and the flexible circuit board leakage and pasting testing device has the advantages of being simple in structure, low in cost, convenient to use and maintain and high in stability, and therefore the problem that the flexible circuit board is mistakenly identified as a qualified product under the condition that the components are leaked and pasted with the components or the components and the electrical testing is conducted is avoided.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.
The present application further provides another embodiment, which is to provide a computer readable storage medium storing an interface display program, which is executable by at least one processor to cause the at least one processor to execute the steps of the testing method as described above.
Through the description of the foregoing embodiments, it is clear to those skilled in the art that the method of the foregoing embodiments may be implemented by software plus a necessary general hardware platform, and certainly may also be implemented by hardware, but in many cases, the former is a better implementation. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present application.
It should be understood that the above-described embodiments are merely exemplary of some, and not all, embodiments of the present application, and that the drawings illustrate preferred embodiments of the present application without limiting the scope of the claims appended hereto. This application is capable of embodiments in many different forms and is provided for the purpose of enabling a thorough understanding of the disclosure of the application. Although the present application has been described in detail with reference to the foregoing embodiments, it will be apparent to one skilled in the art that the present application may be practiced without modification or with equivalents of some of the features described in the foregoing embodiments. All equivalent structures made by using the contents of the specification and the drawings of the present application are directly or indirectly applied to other related technical fields, and all the equivalent structures are within the protection scope of the present application.
Claims (9)
1. The utility model provides a test needle mould, its characterized in that, test needle mould includes probe module, needle mould subassembly and needle mould main part, the needle mould subassembly includes first needle mould, third needle mould, fourth needle mould and fifth needle mould, the needle mould main part is the second needle mould, wherein:
the first needle die is connected with the second needle die through an elastic module, is positioned above the second needle die and is used for bearing and positioning a product to be tested;
the second needle die is respectively connected with the first needle die and the third needle die and is positioned above the third needle die, and the second needle die is connected with the third needle die through a support column and is used for fixing the test probe;
the fourth needle die is connected with the fifth needle die and used for installing a switching module;
when the test needle die works, the probe module penetrates through the third needle die, the second needle die and the first needle die and is used for testing the product to be tested and detecting whether components of the product to be tested are missed or not.
2. The test pin die of claim 1, wherein the test pin die further comprises a cover plate, the product to be tested comprises a connector, the first pin die further comprises a product positioning slot and a connector positioning slot, wherein:
the cover plate is positioned above the connector and used for pressing the connector and enabling the product to be tested to be placed into the product positioning groove of the first needle die for fixing;
the connector positioning groove of the first needle die is used for positioning the testing position of the connector of the product to be tested.
3. The test pin die of claim 2, wherein the cover plate comprises a torsion spring and a pin, wherein:
the cover plate rotates around the pin, and the torsion spring provides pressure;
based on the pressure, the cover plate presses the connector, and the connector of the product to be tested is placed into the connector positioning groove of the first needle die to be positioned and fixed.
4. The test pin die of claim 1, further comprising a linear bearing pin, a linear bearing, a movable copper sleeve, wherein:
the linear bearing pin is arranged on the first needle die, the linear bearing is arranged on the second needle die, and the first needle die and the second needle die move up and down through the linear bearing and the linear bearing pin;
the movable copper sleeve is mounted on the first needle die and used for locking the second needle die and combining with the elastic module to limit the distance between the first needle die and the second needle die through elasticity, so that the first needle die and the second needle die move up and down in a preset distance range.
5. The test pin die of claim 1, further comprising a high-force glue punch, a pin sleeve, wherein:
the needle sleeve is arranged on the fourth needle die and the fifth needle die and used for fixing needle die lines;
and the stress application rubber line pressing block is arranged on the fifth needle die and used for pressing the needle die line to prevent the needle die line from influencing the test.
6. The test pin die of any one of claims 1 to 5, wherein the test probe is inserted from a back side pin hole of the third pin die to extend to the first pin die;
when the test needle die works and starts, the test probe is positioned in the needle hole of the first needle die and presses the surface of the first needle die, so that the floating distance between the first needle die and the second needle die is reduced, and the test probe extends out of the needle hole of the first needle die and pricks at a test part corresponding to the product to be tested.
7. The test PIN die of claim 6, wherein the probe module comprises a first probe, a second probe, and the connector comprises a left PIN leg and a right PIN leg, wherein the first probe comprises at least six test probes and the second probe comprises at least four test probes;
the testing device comprises a connector, at least three testing probes, a left PIN PIN and a right PIN PIN, wherein the at least three testing probes are connected with the left PIN PIN of the connector, meanwhile, the at least three testing probes are connected with the right PIN PIN of the connector, and the left PIN PIN and the right PIN PIN are connected with a grounding point of an internal circuit of a product to be tested and used for ensuring the stability of testing;
adopt two at least detection probe with connector PIN foot upper left end and left lower extreme are connected, simultaneously, adopt two at least detection probe with connector PIN foot upper right end and right lower extreme are connected, are used for detecting whether components and parts exist in the product that awaits measuring.
8. A testing method applied to the testing pin mold of any one of claims 1 to 7, wherein the testing method comprises:
acquiring a test request;
starting a test pin die based on the test request, and generating a current detection request;
based on the current detection request, performing component detection on a product to be detected by adopting a detection probe to obtain a detection result;
if the detection result is that the product to be detected has components, testing the product to be detected by adopting a test probe;
and if the detection result is that the product to be detected does not have components, the product to be detected is unqualified.
9. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the testing method according to claim 8.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210852950.1A CN115184654A (en) | 2022-07-20 | 2022-07-20 | Test pin die, test method, and storage medium |
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| CN202210852950.1A CN115184654A (en) | 2022-07-20 | 2022-07-20 | Test pin die, test method, and storage medium |
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