CN115167798A - Quantum dot optical simulation method, device and system and computer readable storage medium - Google Patents
Quantum dot optical simulation method, device and system and computer readable storage medium Download PDFInfo
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- CN115167798A CN115167798A CN202210883445.3A CN202210883445A CN115167798A CN 115167798 A CN115167798 A CN 115167798A CN 202210883445 A CN202210883445 A CN 202210883445A CN 115167798 A CN115167798 A CN 115167798A
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/14—Digital output to display device ; Cooperation and interconnection of the display device with other functional units
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Abstract
The application discloses a quantum dot optical simulation method, a quantum dot optical simulation device, a quantum dot optical simulation system and a computer readable storage medium, and relates to the technical field of display. The method comprises the steps of obtaining characteristic parameters corresponding to a display module in a darkroom environment, wherein the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters, or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter. And determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment. This application is through carrying out the settlement of a plurality of quantum dot parameters to the quantum dot color chip, can obtain the characteristic parameter of display module assembly, according to demand information and characteristic parameter, can confirm the target quantum dot parameter of product through the analog computation to the display module assembly in advance, and the effectual cycle that shortens product development makes product development more efficient.
Description
Technical Field
The present disclosure relates to the field of display technologies, and in particular, to a quantum dot optical simulation method, device, system, and computer-readable storage medium.
Background
In the field of display technology, quantum dot display is a key direction for development of various display technology manufacturers due to the performance advantage of high color saturation, and therefore the technology also becomes an innovative technology for laying out next-generation novel displays. The principle of the quantum dot display technology is mainly that blue light in the backlight module penetrates through the quantum dot film to realize color conversion.
At present, in the design process of products based on quantum dot display technology, certain requirements are placed on optical specifications, such as parameters of color gamut, brightness, large viewing angle color cast and the like, so that optical measurement needs to be performed on the developed new products to determine whether the optical specifications are met, and if the optical specifications are not met, each parameter needs to be redesigned to meet the required specifications.
Disclosure of Invention
The application provides a quantum dot optical simulation method, a quantum dot optical simulation device, a quantum dot optical simulation system and a computer readable storage medium, through measuring optical parameters of a display module, quantum dot parameters in a quantum dot display product, such as quantum dot concentration or quantum dot thickness, are accurately simulated according to corresponding different quantum dot parameters under the optical parameters, so that the requirements of the quantum dot display product required by a customer are met in advance, and the product development cycle is effectively shortened.
The technical scheme is as follows:
in a first aspect, a quantum dot optical simulation method is provided, including: acquiring corresponding characteristic parameters of a display module in a darkroom environment, wherein the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment. According to the method and the device, the color gamut parameters of the display module under different quantum dot parameters can be obtained by setting a plurality of quantum dot parameters for the quantum dot color chips, or the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter. Because the display module group corresponds to one color gamut parameter or one optical parameter under each quantum dot parameter in the plurality of quantum dot parameters, the required color gamut parameter or the required optical parameter required by the product can be combined, the color gamut parameter or the optical parameter of the display module group under the plurality of quantum dot parameters is selected, and the quantum dot parameter corresponding to the required color gamut parameter or the required optical parameter is selected, so that the required color gamut parameter or the quantum dot parameter of the required optical parameter of the product can be determined in advance through the simulation calculation of the display module group, the product development period is effectively shortened, and the product development is more efficient.
Optionally, the display module assembly includes backlight unit from supreme down in proper order, and is located on the backlight unit first quantum dot color chip obtains under the darkroom environment display module assembly is every in a plurality of different quantum dot parameters the colour gamut parameter under the quantum dot parameter includes:
acquiring a first color coordinate parameter of the first quantum dot color chip in the display module measured by the optical measurement equipment under different quantum dot parameters;
acquiring a second color coordinate parameter of the backlight module measured by the optical measurement equipment under each quantum dot parameter;
and determining the color gamut parameters of the display module under each quantum dot parameter according to the first color coordinate parameters and the second color coordinate parameters.
Optionally, the optical parameters include a half-peak width parameter or a spectrum parameter, and the obtaining of the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter includes:
and acquiring a half-peak width parameter or the spectrum parameter of the first quantum dot color chip measured by the optical measurement equipment under each quantum dot parameter.
Optionally, the method further includes: and determining the scattering particle concentration corresponding to the demand information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips by taking the target quantum dot parameters as quantum dot parameters of a second quantum dot color chip, wherein the second quantum dot color chip is the first quantum dot color chip or other quantum dot color chips except the second quantum dot color chip.
Optionally, the determining, by using the target quantum dot parameter as a quantum dot parameter of a second quantum dot color chip, the scattering particle concentration corresponding to the demand information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chip includes:
measuring a brightness parameter and a large viewing angle parameter of the second quantum dot color chip under a plurality of scattering particle concentrations under the condition that the target quantum dot parameter is taken as the quantum dot parameter of the second quantum dot color chip;
and determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large viewing angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
Optionally, the first quantum dot color chip is a red quantum dot color chip or a green quantum dot color chip, the backlight module is a blue backlight module, and a wavelength range of blue light of the blue backlight module is 440-470 nm.
Optionally, the quantum dot parameter is a quantum dot concentration or a thickness of the quantum dot color chip.
In a second aspect, there is provided a quantum dot optical simulation device, the device comprising:
the device comprises an acquisition unit, a processing unit and a display module, wherein the acquisition unit is used for acquiring characteristic parameters corresponding to the display module in a darkroom environment, and the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and the determining unit is used for determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment.
In a third aspect, there is provided a quantum dot optical simulation system, the system comprising: the quantum dot optical simulation method comprises optical measurement equipment and a display module, wherein the optical measurement equipment is used for measuring optical characteristics, and the optical measurement equipment operates the quantum dot optical simulation method.
In a fourth aspect, a processing device is provided, the processing device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the quantum dot optical simulation method described above when executing the computer program.
In a fifth aspect, a computer-readable storage medium is provided, wherein instructions are stored in the computer-readable storage medium, and when the instructions are executed, the quantum dot optical simulation method is implemented.
It is to be understood that, for the beneficial effects of the second, third, fourth and fifth aspects, reference may be made to the description of the first aspect, and details are not described herein again.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a flow chart of a quantum dot optical simulation method provided in an embodiment of the present application;
fig. 2 is a schematic view illustrating a measurement of a display module according to an embodiment of the present disclosure;
FIG. 3 is a graph illustrating brightness variation of a display module with different scattering particle concentrations according to an embodiment of the present disclosure;
fig. 4 is a graph illustrating a large-viewing-angle color shift variation of a display module under different concentrations of scattering particles according to an embodiment of the present disclosure;
fig. 5 is a spectrum graph of a quantum dot color chip under different concentrations of scattering particles according to an embodiment of the present application.
Fig. 6 is a schematic diagram of a quantum dot optical simulation apparatus according to an embodiment of the present disclosure.
Wherein, the meanings represented by the reference numerals of the figures are respectively as follows:
60. a quantum dot optical simulation device;
601. a measuring unit;
602. a determination unit;
603. and an analog unit.
Detailed Description
To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.
It should be understood that reference to "a plurality" in this application means two or more. In the description of the present application, "/" means "or" unless otherwise stated, for example, a/B may mean a or B; "and/or" herein is only an association relationship describing an associated object, and means that there may be three relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, for the convenience of clearly describing the technical solutions of the present application, the words "first", "second", and the like are used to distinguish the same items or similar items having substantially the same functions and actions. Those skilled in the art will appreciate that the terms "first," "second," etc. do not denote any order or quantity, nor do the terms "first," "second," etc. denote any order or importance.
Before explaining the embodiments of the present application in detail, an application scenario of the embodiments of the present application will be described.
The quantum dot display is gradually developed into a next-generation innovative technology of novel display due to excellent color performance advantages. The main mode of quantum dot display is to convert red or green quantum dots through a blue backlight source, which is the same as that of a general display product, the quantum dot display product has certain requirements on optical specifications, such as color gamut, color coordinates, brightness, large-viewing-angle color shift, half-peak width and other optical parameters, which are determined on the basis of quantum dot parameters (such as quantum dot concentration, thickness of a quantum dot color sheet and the like), and optical measurement is often required to be performed on a new developed quantum dot display product to determine whether the quantum dot parameters of the quantum dot display product can reach customer specifications. If not, the design is changed again to meet the requirement.
Therefore, the quantum dot optical simulation method provided by the embodiment of the application can accurately simulate the quantum dot display product, and can calculate the quantum dot parameters required by the quantum dot display product according to the requirements of the quantum dot display product, thereby effectively shortening the development cycle of the quantum dot display product.
The following explains a quantum dot optical simulation method provided in the embodiments of the present application in detail.
In the embodiment of the present application, a specific structure of an execution subject of a quantum dot optical simulation method is not particularly limited in the embodiment of the present application, as long as communication can be performed by a quantum dot optical simulation method according to the embodiment of the present application by running a program recorded with a code of a quantum dot optical simulation method of the embodiment of the present application. For example, an execution subject of the quantum dot optical simulation method provided by the embodiment of the present application may be a functional module in a processing apparatus, which is capable of calling a program and executing the program, or a device applied to the processing apparatus, such as a chip. The following embodiments are described taking as an example an execution subject of a quantum dot optical simulation method as a processing apparatus.
Fig. 1 is a method for quantum dot optical simulation according to an embodiment of the present disclosure, where the method includes:
The optical parameter may be a spectral parameter of the quantum dot color chip, or a half-peak width parameter of the quantum dot color chip.
And 102, determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the corresponding characteristic parameters of the display module in the darkroom environment.
The requirement information is a product specification required by the quantum dot display product, such as a required color gamut parameter of the quantum dot display product. The quantum dot parameter can be the quantum dot concentration and can also be the thickness of the quantum dot color chip.
According to the method and the device, the color gamut parameters of the display module under different quantum dot parameters can be obtained by setting a plurality of quantum dot parameters for the quantum dot color chips, or the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter. Because the display module group corresponds to one color gamut parameter or one optical parameter under each quantum dot parameter in the plurality of quantum dot parameters, the required color gamut parameter or the required optical parameter required by the product can be combined, the color gamut parameter or the optical parameter of the display module group under the plurality of quantum dot parameters is selected, and the quantum dot parameter corresponding to the required color gamut parameter or the required optical parameter is selected, so that the required color gamut parameter or the quantum dot parameter of the required optical parameter of the product can be determined in advance through the simulation calculation of the display module group, the product development period is effectively shortened, and the product development is more efficient.
The quantum dot optical simulation method provided by the application can be realized in the following two ways:
the first method is as follows: the characteristic parameters include color gamut parameters of the display module under each of a plurality of different quantum dot parameters.
The method comprises the following steps that step 1, processing equipment obtains first color coordinate parameters of quantum dot color chips in a display module measured by optical measurement equipment in a darkroom environment under different quantum dot parameters, wherein the display module sequentially comprises a backlight module and the quantum dot color chips positioned on the backlight module from bottom to top.
The display module is a detection unit for simulating the quantum dot display product, the structure of the display module is the same as that of the quantum dot display product, and the quantum dot display product can be completely simulated, and if the quantum dot parameters in the display module can represent the quantum dot parameters of the quantum dot display product.
As an example, the processing device may be an optical metrology device. In this case, the optical measurement apparatus may include a collection device and a processor for data processing, and in this case, the optical measurement apparatus may measure the optical parameters of the display module by using the collection device and directly process the measured data by using the processor.
As another example, the processing device may be a device with processing capabilities other than an optical metrology device, in which case the optical metrology device may not include a processor, or in which case the optical metrology device may send the collected optical parameters to a processing device connected externally thereto for processing.
Optionally, before step 1, the processing device may send a measurement starting instruction to the optical measurement device to trigger the optical measurement device to measure a first color coordinate parameter of the quantum dot color chip in the display module under the darkroom environment under different quantum dot parameters and a second color coordinate parameter of the backlight module under different quantum dot parameters.
As an example, in the embodiment of the present application, quantum dot parameters of different portions of the same quantum dot color chip are different, so that the optical measurement apparatus can obtain the first color coordinate parameter under different quantum dot parameters.
As another example, in the embodiment of the present application, a plurality of display modules may be manufactured in advance, the quantum dot parameters of the quantum dot color chips in different display modules are different, but the backlight modules in different display modules are the same, and at this time, the optical measurement device may respectively obtain the first color coordinate parameters under each quantum dot parameter.
Fig. 2 is a schematic structural diagram of a display module and a schematic measurement diagram in a darkroom environment according to an embodiment of the present disclosure. The quantum dot color chip is attached to the first side of the glass substrate and is positioned on the backlight module, in other words, the quantum dot color chip is positioned between the glass substrate and the backlight module. The optical measurement equipment is positioned above the second side of the glass substrate and used for collecting optical parameters, such as color coordinate parameters, of the display module. It is to be understood that the second side may be considered as the front side of the glass substrate and the first side may be considered as the back side of the glass substrate, i.e. the back side of the glass substrate is opposite to the optical measurement device.
As an example, the quantum dot parameter may be a quantum dot concentration or a thickness of the quantum dot color chip. The first color coordinate parameter is a color coordinate parameter of the quantum dot color chip measured by the optical measurement device.
It should be noted that when the processing device is not an optical metrology device, step 101 can be implemented as follows: the processing equipment acquires first color coordinate parameters of the quantum dot color chips in the display module measured by the optical measuring equipment in a darkroom environment under different quantum dot parameters from the optical measuring equipment. For example, the optical measuring device may actively transmit the measured data to the processing device.
And 2, acquiring a second color coordinate parameter of the backlight module in the display module measured by the optical measuring equipment in a darkroom environment under each quantum dot parameter by the processing equipment.
And 3, determining the color gamut parameters of the display module under each quantum dot parameter by the processing equipment according to the first color coordinate parameters and the second color coordinate parameters.
As an example, the backlight module is generally a blue backlight source, the quantum dot color chip is green or red, and when the blue backlight source emits blue light, the blue light is converted by the red or green quantum dot color chip to form a color. The color coordinates of blue light emitted by the blue backlight source, namely the second color coordinate parameters, and the color coordinates of the quantum dot color chips, namely the first color coordinate parameters, are collected by the optical measuring equipment, and are subjected to analog calculation by the processing equipment, so that the color gamut parameters can be obtained.
And 4, the optical measurement equipment determines the quantum dot parameters corresponding to the required color gamut parameters according to the required color gamut parameters and the color gamut parameters of the display module under the multiple quantum dot parameters.
The display module can simulate a quantum dot display product, and the quantum dot parameters, such as the quantum dot concentration or the thickness of a quantum dot color chip, which accord with the color gamut parameters required by a customer or a product are determined according to the color gamut parameters required by the customer or the product and the color gamut parameters under each calculated quantum dot parameter.
In a first embodiment, the backlight module is a MiniBlue led backlight or a MicroBlue led backlight, the quantum dot color chip is a red or green quantum dot color chip, and the quantum dot parameter is quantum dot concentration, and the red or green quantum dot color chip is placed above the MiniBlue led backlight or the MicroBlue led backlight to form the display module. The concentration range of the quantum dots on the red or green quantum dot color chip is 5% -20%, namely, different parts of the red or green quantum dot color chip respectively correspond to one quantum dot concentration. Take the example of setting four quantum dot concentrations of 5%, 10%, 15%, and 20%. In one embodiment of the present disclosure, the display module may be opaque and placed in a dark room environment for measurement. And the optical measurement equipment respectively measures the quantum dot color chip and the backlight module to obtain the color coordinate parameters of the quantum dot color chip and the backlight module. And the processing equipment calculates and processes the two groups of color coordinate parameters to obtain color gamut parameters of the display module respectively at the concentrations of 5%, 10%, 15% and 20% of the four quantum dots. Such as gamut parameter a, gamut parameter B, gamut parameter C, and gamut parameter D. When the required color gamut parameter of the quantum dot display product is the color gamut parameter B, the optical measurement equipment analyzes and calculates the required color gamut parameter to obtain the concentration of the quantum dots which are in line with the requirement of 10%.
Optionally, if the calculated difference between the color gamut parameter X of the display module and the required color gamut parameter is within the preset range, the quantum dot concentration corresponding to the color gamut parameter X may also be considered as the quantum dot parameter corresponding to the required color gamut parameter.
Or, in the case that the required color gamut parameter is a range value (interval value), if the calculated color gamut parameter X of the display module is within the numerical range of the required color gamut parameter, the quantum dot concentration corresponding to the color gamut parameter X within the numerical range may be determined as the quantum dot parameter corresponding to the required color gamut parameter.
In the second embodiment, the quantum dot parameter is taken as the thickness of the quantum dot color chip, and the thickness of the quantum dot color chip is usually set to be in the range of 0.5nm to 10nm. For example, the thickness of four quantum dot color chips is set: 0.5nm, 2.5nm, 5nm and 10nm. The optical measurement equipment optically measures the backlight module and the quantum dot color chips in the display module to obtain color coordinate parameters of the quantum dot color chips and the backlight module. And the processing equipment calculates and processes the two groups of color coordinate parameters to obtain color gamut parameters of the display module respectively under the thicknesses of 0.5nm, 2.5nm, 5nm and 10nm of the four quantum dot color chips, namely a color gamut parameter A, a color gamut parameter B, a color gamut parameter C and a color gamut parameter D. When the required color gamut parameter of the quantum dot display product is the color gamut parameter C, the optical measurement equipment analyzes and calculates the required color gamut parameter to obtain the thickness of the quantum dot color chip which is 5nm.
It should be noted that, for example, the quantum dot parameter is the thickness of the quantum dot color chip or the quantum dot parameter is the quantum dot concentration, of course, the quantum dot parameter may also be a combination of the thickness of the quantum dot color chip and the quantum dot parameter is the quantum dot concentration, and then the processing device may select one quantum dot parameter from the combination, where both the thickness and the quantum dot concentration meet the required color gamut parameter. In one embodiment of the present application, the target quantum dot parameter is used as the quantum dot parameter of the second quantum dot color chip, and the scattering particle concentration corresponding to the demand information is determined from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips, where the second quantum dot color chip is the first quantum dot color chip or another quantum dot color chip except the second quantum dot color chip.
For example, taking a quantum dot parameter meeting a required color gamut parameter as a quantum dot parameter X, after the quantum dot parameter X is selected, scattering particles are added to a quantum dot color chip by taking the quantum dot parameter X as a reference, and different concentrations of the scattering particles are set. Specifically, under the condition that different parts of the same quantum dot color chip respectively correspond to one quantum dot parameter, the scattering particles with different concentrations are added to the target part. The quantum dot parameter of the target site is quantum dot parameter X. Specifically, in order to measure the brightness parameter and the large viewing angle parameter of the display module at each scattering particle concentration conveniently in the later period, the target area can be divided into different areas, and then the concentrations of the scattering particles added in the different areas are different.
As an example, step 4 determines that the required color gamut parameter has a quantum dot concentration of 5%, and different concentrations of scattering particles are added on the basis of the quantum dot concentration of 5%, and the concentration of the scattering particles generally ranges from 0% to 20%. And measuring optical parameters of the display module under each scattering particle concentration, such as brightness parameters, large-viewing-angle color shift parameters and the like, by using optical measuring equipment, and selecting the scattering particle concentration meeting the required color gamut parameters from multiple groups of measured data.
Optionally, the brightness parameter and the large viewing angle parameter of the second quantum dot color chip under the multiple scattering particle concentrations are measured under the condition that the target quantum dot parameter is used as the quantum dot parameter of the second quantum dot color chip. And determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large viewing angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
In one possible implementation manner of the present application, determining, according to a quantum dot parameter corresponding to a required color gamut parameter, a scattering particle concentration corresponding to the required color gamut parameter from a plurality of scattering particle concentrations corresponding to a quantum dot color chip includes: under the condition that the quantum dot parameters corresponding to the required color gamut parameters are determined, the processing equipment acquires the brightness parameters and the large viewing angle parameters of the display module, which are measured by the optical measuring equipment, under the concentration of each scattering particle; and the processing equipment determines the concentration of the scattering particles corresponding to the required color gamut parameter according to the brightness parameters and the large-view-angle color cast parameters under the concentrations of the scattering particles.
The optimal values of the brightness parameter and the large-view-angle color shift parameter usually exist in a certain range, and the optimal values of the brightness parameter and the large-view-angle color shift parameter exist on the premise that the quantum dot display product is in the required color gamut parameter, so that the concentration of the scattering particles when the optimal values of the brightness parameter and the large-view-angle color shift parameter exist is the concentration of the scattering particles corresponding to the required color gamut parameter. In the third embodiment, taking the quantum dot parameter as the quantum dot concentration as an example, after the quantum dot concentration matched with the required color gamut parameter is determined, the scattering particle concentrations of the quantum dot color chip are adjusted, that is, the scattering particles with different concentrations are set, for example, the concentrations of the scattering particles are respectively: the concentration A, the concentration B, the concentration C, the concentration D and the concentration E, wherein the concentration A is less than the concentration B and less than the concentration C and less than the concentration D and less than the concentration E. And measuring the brightness of the display module and the data of the large-viewing-angle color cast under five concentrations by using optical measuring equipment.
Fig. 3 is a graph showing the brightness variation of the display module at different viewing angles under five different concentrations of scattering particles. Concentration A is low for scattering particle concentration in figure 3, and it can be seen that visual angle luminance is asymmetric about the display module assembly (namely visual angle luminance decay degree is inconsistent about, and the decay is very fast), and the light type is poor. When the concentration of scattering particles is increased to concentration B, the brightness at concentration B is slightly improved relative to the brightness at concentration a. As can be seen from fig. 3, the left and right viewing angles of the display module have relatively good brightness when the concentrations of the scattering particles are C to E, i.e., the left and right brightness attenuation degrees are also small. Optionally, as can be seen from fig. 3, when the concentration is the concentration D, the left and right brightness of the display module are symmetric, and the left and right brightness attenuation degrees are also smaller at a large viewing angle, and because the brightness is too small at the concentration E, it can be determined that the optimal scattering particle concentration is the concentration D.
Fig. 4 is a graph showing the change of color shift at large viewing angle for different concentrations of scattering particles. Similar to the brightness parameter, the slower the color cast attenuation of the left and right visual angles of the display module is, the better the change of the left and right sides is, the more symmetrical the better. As can be seen from fig. 4, the color change of the display module is the smallest at the left and right viewing angles, and the two sides are most symmetrical to form a curve of the concentration D, so that the color shift at the large viewing angle is the best when the concentration of the scattering particles is the concentration D.
In an embodiment of the present application, the required color gamut parameter is used to determine a required half-peak-width parameter, and the method provided in the embodiment of the present application may further include: the processing equipment acquires the half-peak width parameter of the quantum dot color chip measured by the optical measurement equipment under each quantum dot parameter. And the processing equipment determines the quantum dot parameter corresponding to the required half-peak width parameter according to the required half-peak width parameter and the half-peak width parameter under each quantum dot parameter. And the half-peak width parameter is used for reflecting the performance of the display module.
The second method comprises the following steps: and acquiring optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter. And acquiring a half-peak width parameter or the spectrum parameter of the first quantum dot color chip measured by the optical measurement equipment under each quantum dot parameter.
In the fourth embodiment, the smaller the half-value width parameter is, the better the performance of the display module is. The required color gamut parameter can be converted to obtain a required half-peak width parameter. Taking quantum dot parameters and quantum dot concentrations as examples, four quantum dot concentrations are set to 5%, 10%, 15%, and 20%. The optical measurement equipment measures the display module to obtain half-peak width parameters of the display module under the conditions that the concentration of the four quantum dots is 5%, 10%, 15% and 20% respectively. And comparing the required half-peak width parameter required by the product with the calculated half-peak width parameters under different concentrations, and selecting the quantum dot concentration when the half-peak width parameter is the minimum.
In the fifth embodiment, taking the quantum dot parameters as the concentrations of the quantum dots as an example, fig. 5 shows a spectrum graph QD-G of a green quantum dot color chip and a spectrum graph QD-R of a red quantum dot color chip under different quantum dot concentrations, where the spectrum principle is the same as the half-peak width parameter, and the required color gamut parameters can be obtained by converting the required color gamut parameters. Setting different quantum dot concentrations, such as the quantum dot concentrations being a to d, or the quantum dot concentrations being e to h, as shown in fig. 5, measuring the quantum dot color chip by the optical measuring device to obtain the spectrum parameter curves of the quantum dot color chip under the different quantum dot concentrations. And comparing the spectral parameters required by the product with the spectral parameters under different concentrations obtained by calculation, and selecting the quantum dot concentration meeting the required spectral parameters. In one embodiment of the present application, the quantum dot color chip is a red quantum dot color chip, or a green quantum dot color chip. The backlight module is a blue backlight module, and the wavelength range of blue light of the blue backlight module is 440-470 nm.
The red quantum dot color chips and the green quantum dot color chips are respectively measured, and the display module is formed through the blue backlight source. The specific wavelength value of the blue light of the blue backlight source is determined according to different quantum absorption spectrums.
Before step 101, the display module is opaque, including the quantum dot color chip being sealed by a black tape. In the schematic view of fig. 2, the display module is opaque in a dark room environment, and in addition, the display module itself is also opaque, as shown in fig. 2, the periphery of the quantum dot color chip is sealed by a black tape.
It should be noted that the display module in the embodiment of the present application is formed by the quantum dot color chip being spread over the glass substrate in a coating or inkjet printing manner, the quantum dot color chip and the glass substrate being formed with the backlight module through exposure, development and baking processes.
The present embodiment provides a quantum dot optical simulation apparatus 60, as shown in fig. 6, including: the obtaining unit 601 is configured to obtain a characteristic parameter corresponding to the display module in a darkroom environment. The characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters, or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter. The determining unit 602 is configured to determine, according to the requirement information and the characteristic parameters corresponding to the display module in the darkroom environment, a target quantum dot parameter corresponding to the requirement information from a plurality of different quantum dot parameters.
The embodiment of the application provides a quantum dot optical simulation system, including: an optical measurement device, and a display module. The optical measurement equipment is used for measuring optical parameters. The optical measurement equipment operates the quantum dot optical simulation method.
The application provides a processing device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the computer program to realize the quantum dot optical simulation method. For example, the processing device may be an optical measurement device from step 101 to step 102.
The Processor may be a Central Processing Unit (CPU), or other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, or the like. The general purpose processor may be a microprocessor or any conventional processor.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the flow in the above method embodiments may be implemented by a computer program, which may be stored in a computer readable storage medium and used by a processor to implement the steps of the above method embodiments. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include at least: any entity or apparatus capable of carrying computer program code to a photographing apparatus/terminal device, a recording medium, computer Memory, ROM (Read-Only Memory), RAM (Random Access Memory), CD-ROM (Compact Disc Read-Only Memory), magnetic tape, floppy disk, optical data storage device, etc. The computer-readable storage medium referred to herein may be a non-volatile storage medium, in other words, a non-transitory storage medium.
In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A quantum dot optical simulation method, comprising:
acquiring corresponding characteristic parameters of a display module in a darkroom environment, wherein the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment.
2. The method of claim 1, wherein the display module sequentially comprises a backlight module and the first quantum dot color chip located on the backlight module from bottom to top, and the obtaining of the color gamut parameter of the display module in the darkroom environment under each of a plurality of different quantum dot parameters comprises:
acquiring a first color coordinate parameter of the first quantum dot color chip in the display module measured by optical measurement equipment under different quantum dot parameters;
acquiring a second color coordinate parameter of the backlight module measured by optical measurement equipment under each quantum dot parameter;
and determining the color gamut parameters of the display module under each quantum dot parameter according to the first color coordinate parameters and the second color coordinate parameters.
3. The method of claim 1, wherein the optical parameters comprise a half-peak width parameter or a spectral parameter, and obtaining the optical parameters of the first quantum dot color chip in the display module under each quantum dot parameter comprises:
and acquiring a half-peak width parameter or the spectrum parameter of the first quantum dot color chip measured by the optical measurement equipment under each quantum dot parameter.
4. The method according to any one of claims 1 to 3, further comprising:
and determining the scattering particle concentration corresponding to the demand information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chips by taking the target quantum dot parameters as quantum dot parameters of a second quantum dot color chip, wherein the second quantum dot color chip is the first quantum dot color chip or other quantum dot color chips except the second quantum dot color chip.
5. The method of claim 4, wherein the determining the scattering particle concentration corresponding to the demand information from a plurality of different scattering particle concentrations corresponding to the quantum dot color chip with the target quantum dot parameter as the quantum dot parameter of the second quantum dot color chip comprises:
measuring the brightness parameter and the large viewing angle parameter of the second quantum dot color chip under a plurality of scattering particle concentrations under the condition that the target quantum dot parameter is taken as the quantum dot parameter of the second quantum dot color chip;
and determining the scattering particle concentration corresponding to the requirement information according to the brightness parameter and the large viewing angle parameter of the second quantum dot color chip under the plurality of scattering particle concentrations.
6. The quantum dot optical simulation method of any one of claims 2 to 3, wherein the first quantum dot color chip is a red quantum dot color chip or a green quantum dot color chip,
the backlight module in the display module is a blue backlight module, and the wavelength range of blue light of the blue backlight module is 440-470 nm.
7. The quantum dot optical simulation method of any one of claims 1 to 3, wherein the quantum dot parameter is a quantum dot concentration or a thickness of a quantum dot color chip.
8. A quantum dot optical simulation apparatus, the apparatus comprising:
the device comprises an acquisition unit, a processing unit and a display module, wherein the acquisition unit is used for acquiring characteristic parameters corresponding to the display module in a darkroom environment, and the characteristic parameters comprise color gamut parameters of the display module under each quantum dot parameter in a plurality of different quantum dot parameters or optical parameters of a first quantum dot color chip in the display module under each quantum dot parameter;
and the determining unit is used for determining a target quantum dot parameter corresponding to the demand information from a plurality of different quantum dot parameters according to the demand information and the characteristic parameters corresponding to the display module in the darkroom environment.
9. A quantum dot optical simulation system, comprising: optical measurement equipment and a display module, wherein the optical measurement equipment is used for measuring optical characteristics, and the optical measurement equipment runs the quantum dot optical simulation method as claimed in any one of claims 1 to 7.
10. A computer-readable storage medium having instructions stored therein which, when executed, implement the quantum dot optical simulation method of any one of claims 1 to 7.
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