CN115120255A - X-ray flat panel detector and detection system - Google Patents
X-ray flat panel detector and detection system Download PDFInfo
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- CN115120255A CN115120255A CN202210634187.5A CN202210634187A CN115120255A CN 115120255 A CN115120255 A CN 115120255A CN 202210634187 A CN202210634187 A CN 202210634187A CN 115120255 A CN115120255 A CN 115120255A
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- 238000003384 imaging method Methods 0.000 abstract description 16
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4241—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
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- A—HUMAN NECESSITIES
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Abstract
The invention provides an X-ray flat panel detector and a detection system, wherein a strain gauge is arranged in the X-ray flat panel detector and is tightly attached to the bottom surface of a carbon plate, and when the flat panel detector is acted by an external force, the strain gauge can accurately sense and generate a signal for preventing the flat panel detector from being exposed, so that the flat panel detector stops being exposed when the flat panel detector is acted by the external force. The X-ray flat panel detector provided by the invention can avoid the problem of artifact on an imaging image caused by external force, and ensure the accuracy of an imaging effect; when the flat panel detector is subjected to external force, the exposure is stopped, unnecessary exposure times can be reduced, the ray intake of a patient is reduced, and a complete high-quality image without abnormality can be obtained by one-time shooting.
Description
Technical Field
The invention relates to the field of medical detection, in particular to an X-ray flat panel detector and a detection system.
Background
The X-ray photography technology has the characteristics of high imaging speed, convenience in operation, high imaging resolution and the like, has become the leading direction of the digital X-ray photography technology, and is widely applied to the fields of medical detection and the like. The core of the digital X-ray photography technology is a flat panel detector, but in the clinical shooting process, a human body or a heavy object can frequently touch or press the surface of the flat panel detector, so that the surface of the flat panel detector is deformed, the interior of the flat panel detector is coupled, imaging abnormity is caused, local large fluctuation of gray values in an imaged image is caused, and finally, non-uniform artifacts exist on the imaged image, and the clinical judgment of the image is influenced.
Disclosure of Invention
In view of the above drawbacks of the prior art, the present invention provides an X-ray flat panel detector and a detection system, wherein a strain gauge is disposed in the X-ray flat panel detector, the strain gauge is tightly attached to the bottom surface of a carbon plate, and when the flat panel detector is subjected to an external force, the strain gauge can accurately sense and generate a signal for preventing the flat panel detector from being exposed, so that the flat panel detector stops being exposed when the flat panel detector is subjected to the external force. By arranging the strain gauge in the X-ray flat panel detector, the problem that an imaging image has artifacts due to external force can be avoided, and the accuracy of an imaging effect is ensured; when the flat panel detector is subjected to external force, the exposure is stopped, unnecessary exposure times can be reduced, the ray intake of a patient is reduced, and a complete high-quality image without abnormality can be obtained by one-time shooting.
The invention provides an X-ray flat panel detector, comprising:
a carbon plate;
a scintillator layer located below the carbon plate for receiving X-rays and generating a light signal;
the thin film transistor is positioned below the scintillator layer and used for converting the optical signal into an electric signal;
the strain gauge is located between the carbon plate and the scintillator layer, generates a first signal when being pressed by an external force, and the first signal is used for preventing the flat panel detector from being exposed.
Optionally, the strain gauge is a resistance strain gauge, and a resistance value of the resistance strain gauge when the resistance strain gauge is not subjected to an external force is R 1 The resistance value after external force is R 2 ，R 1 ≠R 2 。
Optionally, the X-ray flat panel detector further includes:
a metal support located below the thin film transistor;
and the circuit board is positioned below the metal support.
Optionally, a control chip is disposed in the circuit board and used for monitoring a resistance value of the resistance strain gauge.
Alternatively to this, the first and second parts may,the resistance value of the resistance strain gauge monitored by the control chip after being subjected to external force is R 2 And if R is 2 ＞1.3R 1 Or R is 2 ＜0.7R 1 And the control chip generates a second signal, and the second signal is used for preventing the flat panel detector from being exposed.
The present invention also provides an X-ray detection system comprising:
the flat panel detector is the X-ray flat panel detector as claimed in any one of claims 1 to 5;
and the high-voltage generator is in communication connection with the flat panel detector and is used for generating an exposure signal or stopping the exposure signal.
Optionally, the high voltage generator is in communication connection with the strain gauge, and if the high voltage generator receives the first signal, the exposure stop signal is generated; and if the high-voltage generator does not receive the first signal, generating the exposure signal.
Optionally, the high voltage generator is in communication connection with a control chip of the flat panel detector, and if the high voltage generator receives a second signal from the control chip, the high voltage generator generates the exposure stop signal; and if the high voltage generator does not receive the second signal, generating the exposure signal.
Optionally, the detection system further includes a human-computer interaction module, connected to the high voltage generator, and configured to receive the exposure stop signal and the manual selection signal, and generate an emission signal or an emission stop signal according to the manual selection signal.
Optionally, the detection system further includes a ray bulb tube, the ray bulb tube is connected to the human-computer interaction module, and stops transmitting the X-ray to the flat panel detector according to the transmission stop signal, and transmits the X-ray to the flat panel detector according to the transmission stop signal.
The X-ray flat panel detector and the detection system provided by the invention at least have the following beneficial effects:
the X-ray flat panel detector provided by the invention is provided with the strain gauge, the strain gauge is tightly attached to the bottom surface of the carbon plate, and when the flat panel detector is acted by an external force, the strain gauge can accurately sense and generate a signal for preventing the flat panel detector from being exposed, so that the flat panel detector stops being exposed when being acted by the external force. The strain gauge is arranged in the X-ray flat panel detector, so that the problem that an imaged image has artifacts due to external force can be avoided, and the accuracy of an imaging effect is ensured; when the flat panel detector is subjected to external force, the exposure is stopped, unnecessary exposure times can be reduced, the ray intake of a patient is reduced, and a complete high-quality image without abnormality can be obtained by one-time shooting.
The X-ray detection system is formed based on the X-ray flat panel detector, so that the beneficial technical effects are also achieved.
Drawings
Fig. 1 shows a schematic structural diagram of an X-ray flat panel detector provided as an embodiment.
Fig. 2 shows a schematic diagram of an X-ray detection system according to a second embodiment.
Description of the element reference numerals
10 carbon plate
11 strain gage
12 scintillator layer
13 thin film transistor
14 Metal support
15 circuit board
Detailed Description
The embodiments of the present invention are described below with reference to specific embodiments, and other advantages and effects of the present invention will be easily understood by those skilled in the art from the disclosure of the present specification. The invention is capable of other and different embodiments and of being practiced or of being carried out in various ways, and its several details are capable of modification in various respects, all without departing from the spirit and scope of the present invention.
It should be noted that the drawings provided in the present embodiment are only for illustrating the basic idea of the present invention, and although the drawings only show the components related to the present invention and are not drawn according to the number, shape and size of the components in actual implementation, the form, quantity, position relationship and proportion of the components in actual implementation can be changed freely on the premise of implementing the technical solution of the present invention, and the layout form of the components may be more complicated.
Example one
The present embodiment provides an X-ray flat panel detector, as shown in fig. 1, including a carbon plate 10, a strain gauge 11, a scintillator 12, and a thin film transistor 13.
As shown in fig. 1, the carbon plate 10 is selected as an incident window of the X-ray flat panel detector, and the carbon plate 10 has the characteristics of high strength, low density and low radiation attenuation, and can reduce the degradation of X-rays. As an example, the carbon plate 10 is a composite plate material with carbon fibers as a reinforcement and epoxy resin as a matrix, and the carbon fiber reinforced resin composite material has a very low absorption rate to X-rays.
As shown in fig. 1, a strain gauge 11 is disposed below the carbon plate 10, the strain gauge 11 is tightly bonded to the lower surface of the carbon plate 10 by an adhesive, and when the surface of the carbon plate 10 is subjected to an external force, the strain gauge 11 can sense the external force and generate a first signal, and the first signal is used for preventing the exposure of the X-ray flat panel detector. In the present embodiment, the strain gauge 11 is a resistance strain gauge made of a semiconductor material, and the working principle thereof is based on the piezoresistive effect of the semiconductor material, that is, when the strain gauge 11 is subjected to an external force, the resistivity of the strain gauge changes, for example, the resistance value when the strain gauge is not subjected to the external force is R 1 The resistance value after external force is R 2 ，R 1 ≠R 2 . As an example, the strain gauge 11 is prepared by attaching a sensitive grid on a substrate and then covering a covering layer, wherein the sensitive grid is a conversion element of the strain gauge; the substrate is used for fixing and protecting the sensitive grid, and the thickness of the substrate is generally 0.02 nm-0.04 nm; the covering layer is used for fixing and protecting the sensitive grid and preventing the sensitive grid from contacting with external metal objects so as to avoid short circuit or mechanical damage. The strain gauge is arranged in the X-ray flat panel detector, the strain gauge can generate a signal for preventing the detector from being exposed when being subjected to an external force, the detector stops the exposure, thereby avoiding uneven artifacts on the final imaged image,more accurate imaging effect is obtained.
As shown in fig. 1, a scintillator layer 12 is disposed below the strain gauge 11 for receiving X-rays and generating light signals. By way of example, the scintillator layer 12 may be selected from, including but not limited to, GOS (Gd) 2 O 2 S)、NaI(T 1 )、LaC 13 (Ce)、CsI(T 1 、Na)、LaBr 3 (Ce)、YAlO 3 (Ce)、CsI、GOS(Tb、Pr、Ce、F)、CaWO 4 、Gd 3 Ga 5 O 12 (Cr、Ce)、Lu 2 Si 2 O 7 (Ce)、CdWO 4 、BGO、Lu 2 SiO 5 (Ce)、Lu 2 AlO 3 (Ce)、YTaO 4 (Nb) is one or more.
As shown in fig. 1, a thin film transistor 13 is disposed below the scintillator layer 12 for converting an optical signal into an electrical signal. As an example, the thin film transistor 13 includes, in order from top to bottom, a focusing microlens layer, an image sensor layer, and a substrate glass, the focusing microlens layer is attached to the lower surface of the scintillator layer 12, and is configured to collect stray visible light emitted from the scintillator layer 12; the image sensor layer is used for detecting incident visible light and generating a corresponding electric signal; the substrate glass is preferably an amorphous silicon substrate glass, and in alternative embodiments, other types of substrate glass may be used, and is not limited herein.
As shown in fig. 1, a circuit board 15 is disposed below the thin film transistor 13, and a control chip is disposed in the circuit board 15 and used for monitoring the resistance value of the strain gauge 11. As an example, the resistance value of the strain gauge 11 when not subjected to an external force is R 1 When the strain gauge 11 is subjected to an external force, the control chip monitors that the resistance value of the strain gauge 11 is R 2 If R is 2 ＞1.3R 1 Or R is 2 ＜0.7R 1 The control chip generates a second signal, and the second signal is used for preventing the X-ray flat panel detector from being exposed. In this embodiment, the control chip is a Field Programmable Gate Array (FPGA) chip. The resistance value change of the strain gauge is judged by using the control chip, whether the flat panel detector is under the action of external force can be judged more accurately, and therefore the influence of interference factors is eliminatedAnd obtaining more accurate results.
As shown in fig. 1, a metal support 14 is further disposed between the thin film transistor 13 and the circuit board 15 for connecting the thin film transistor 13 and the circuit board 15. By way of example, the metal support 14 may be an aluminum alloy or a magnesium alloy, but of course may be other suitable materials.
The X-ray flat panel detector provided by the embodiment is provided with the strain gauge, the strain gauge is tightly attached to the bottom surface of the carbon plate, and when the flat panel detector is acted by an external force, the strain gauge can accurately sense and generate a signal for preventing the flat panel detector from being exposed, so that the flat panel detector stops being exposed when being acted by the external force, thereby avoiding the problem that an imaging image has an artifact caused by the external force and ensuring the accuracy of an imaging effect; in addition, when the flat panel detector is subjected to external force, the exposure is stopped, unnecessary exposure times can be reduced, the ray intake of a patient can be reduced, and a complete high-quality image without abnormality can be obtained through one-time shooting.
Example two
The embodiment provides an X-ray detection system, as shown in fig. 2, including a flat panel detector, a high voltage generator, a human-computer interaction module, and a radiation bulb.
As an example, the flat panel detector is an X-ray flat panel detector provided in the first embodiment, as shown in fig. 1, the flat panel detector includes a carbon plate 10, a strain gauge 11, a scintillator 12, a thin film transistor 13, a metal support 14, and a circuit board 15, and the specific structure may refer to the description of the first embodiment, and is not described herein again.
As shown in fig. 2, the high voltage generator is communicatively connected to the flat panel detector for generating an exposure signal or a stop exposure signal. As an example, the high voltage generator is in communication connection with the strain gauge 11 in the flat panel detector, generates a first signal when the strain gauge 11 senses an external force, and generates an exposure stop signal after receiving the first signal; if the high voltage generator does not receive the first signal, an exposure signal is generated.
In another alternative embodiment, the high voltage generator is connected in communication with the control chip in the flat panel detector, and the strain gauge 11 is not subjected toResistance value to external force is R 1 The resistance value becomes R after receiving an external force 2 The control chip monitors the change of the resistance value of the strain gauge 11 and judges, if R is judged 2 ＞1.3R 1 Or R 2 ＜0.7R 1 The control chip sends a second signal to the high-voltage generator, and the high-voltage generator generates an exposure stopping signal after receiving the second signal; if the high voltage generator does not receive the second signal, an exposure signal is generated. The resistance value change of the strain gauge is further judged by utilizing the control chip, and whether the flat panel detector is under the action of external force or not can be judged more accurately, so that the influence of interference factors is eliminated, and a more accurate result is obtained.
As shown in fig. 2, the human-computer interaction module is in communication connection with the high voltage generator, and is configured to receive an exposure stop signal sent by the high voltage generator, and also receive an artificial selection signal sent by a user, and generate a transmission signal or a transmission stop signal according to the artificial selection signal. For example, the human-computer interaction module can present the exposure stopping signal sent by the high-voltage generator to a user after receiving the exposure stopping signal, the user can select whether to perform exposure imaging, and if the user selects not to perform exposure imaging, the human-computer interaction module generates an emission stopping signal after receiving the artificial selection signal; if the user selects to carry out exposure imaging, the man-machine interaction module generates a transmitting signal after receiving the artificial selection signal.
As shown in fig. 2, the ray tube is in communication connection with the human-computer interaction module, and determines whether to send X-rays according to a signal sent by the human-computer interaction module. As an example, if the emission stopping signal is received by the ray tube, the emission of the X-ray to the flat panel detector is stopped, that is, the X-ray detection system does not expose for imaging; if the ray bulb tube receives the emission signal, the X ray is emitted to the flat panel detector, and the X ray detection system is exposed for imaging.
The foregoing embodiments are merely illustrative of the principles and utilities of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or change the above-mentioned embodiments without departing from the spirit and scope of the present invention. Accordingly, it is intended that all equivalent modifications or changes which can be made by those skilled in the art without departing from the spirit and technical spirit of the present invention be covered by the claims of the present invention.
Claims (10)
1. An X-ray flat panel detector, comprising:
a carbon plate;
a scintillator layer located below the carbon plate for receiving X-rays and generating a light signal;
the thin film transistor is positioned below the scintillator layer and used for converting the optical signal into an electric signal;
the strain gauge is located between the carbon plate and the scintillator layer, generates a first signal when being pressed by an external force, and the first signal is used for preventing the flat panel detector from being exposed.
2. The X-ray flat panel detector according to claim 1, wherein the strain gauge is a resistance strain gauge, and the resistance value of the resistance strain gauge when not subjected to an external force is R 1 The resistance value after external force is R 2 ，R 1 ≠R 2 。
3. The X-ray flat panel detector according to claim 2, further comprising:
a metal support located below the thin film transistor;
and the circuit board is positioned below the metal support.
4. The X-ray flat panel detector according to claim 3, wherein a control chip is arranged in the circuit board and used for monitoring the resistance value of the resistance strain gauge.
5. The X-ray flat panel detector according to claim 4, wherein the resistance value of the resistance strain gauge monitored by the control chip after being subjected to an external force is R 2 And if R is 2 ＞1.3R 1 Or R is 2 ＜0.7R 1 And the control chip generates a second signal, and the second signal is used for preventing the flat panel detector from being exposed.
6. An X-ray detection system, comprising:
the flat panel detector is the X-ray flat panel detector as claimed in any one of claims 1 to 5;
and the high-voltage generator is in communication connection with the flat panel detector and is used for generating an exposure signal or stopping the exposure signal.
7. The X-ray detection system of claim 6, wherein the high voltage generator is in communication with the strain gauge, and generates the exposure stop signal if the high voltage generator receives the first signal; and if the high voltage generator does not receive the first signal, generating the exposure signal.
8. The X-ray detection system according to claim 6, wherein the high voltage generator is connected with a control chip of the flat panel detector in a communication manner, and generates the exposure stop signal if the high voltage generator receives a second signal of the control chip; and if the high voltage generator does not receive the second signal, generating the exposure signal.
9. The X-ray detection system according to claim 7 or 8, further comprising a human-machine interaction module connected to the high voltage generator for receiving the exposure stop signal and the human selection signal and generating an emission signal or an emission stop signal according to the human selection signal.
10. The X-ray detection system of claim 9, further comprising a ray tube, wherein the ray tube is connected to the human-computer interaction module, and stops transmitting X-rays to the flat panel detector according to the emission stop signal, and transmits X-rays to the flat panel detector according to the emission stop signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210634187.5A CN115120255A (en) | 2022-06-06 | 2022-06-06 | X-ray flat panel detector and detection system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210634187.5A CN115120255A (en) | 2022-06-06 | 2022-06-06 | X-ray flat panel detector and detection system |
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| Publication Number | Publication Date |
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| CN115120255A true CN115120255A (en) | 2022-09-30 |
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| CN202210634187.5A Pending CN115120255A (en) | 2022-06-06 | 2022-06-06 | X-ray flat panel detector and detection system |
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| CN (1) | CN115120255A (en) |
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- 2022-06-06 CN CN202210634187.5A patent/CN115120255A/en active Pending
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