CN115033053A - Signal processing method and storage medium - Google Patents
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Abstract
The invention discloses a signal processing method and a storage medium. The method comprises the following steps: eliminating the local oscillation leakage signal from the first waveform signal to obtain a second waveform signal; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type quantum bit or comprises a transmon type quantum bit. The invention solves the technical problem of low accuracy of waveform signal processing.
Description
The present application is a divisional application of chinese patent application entitled "signal processing method and storage medium" filed on 03/2022 under the filing number 202210200389.9.
Technical Field
The present invention relates to the field of computers, and in particular, to a signal processing method and a storage medium.
Background
At present, when a waveform signal is processed, a waveform error is generally corrected through local oscillator leakage compensation and mixer calibration, but the method has the technical problems of incomplete consideration and low accuracy of waveform signal processing.
In view of the above problems, no effective solution has been proposed.
Disclosure of Invention
Embodiments of the present invention provide a signal processing method and a storage medium to at least solve the technical problem of low accuracy of waveform signal processing.
According to an aspect of an embodiment of the present invention, there is provided a signal processing method. The method can comprise the following steps: eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
According to another aspect of the embodiment of the invention, a signal processing method is also provided. The method can comprise the following steps: detecting defects on the surface of a target object to obtain a first waveform signal; eliminating the local oscillation leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator; and determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, wherein the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
According to another aspect of the embodiment of the invention, a signal processing method is also provided. The method can comprise the following steps: acquiring a first waveform signal by calling a first interface, wherein the first interface comprises a first parameter, and a parameter value of the first parameter is the first waveform signal; eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and outputting a compensated fourth waveform signal by calling a second interface, wherein the second interface comprises a second parameter, and a parameter value of the second parameter is the compensated fourth waveform signal, the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
According to an aspect of an embodiment of the present invention, there is provided a signal processing apparatus. The apparatus may include: the first elimination unit is used for eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; a first conversion unit for converting the second waveform signal into a third waveform signal in the target signal channel; the first correction unit is used for correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and the first compensation unit is used for compensating the fourth waveform signal based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting the defects of the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or comprises a transmon type qubit.
According to another aspect of the embodiment of the invention, a signal processing device is also provided. The apparatus may include: the detection unit is used for detecting the defects of the surface of the target object to obtain a first waveform signal; the second elimination unit is used for eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; a second conversion unit for converting the second waveform signal into a third waveform signal in the target signal channel; the second correction unit is used for correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; a second compensation unit for compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator; and the first determining unit is used for determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, wherein the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or comprises a transmon type qubit.
According to another aspect of the embodiment of the invention, a signal processing device is also provided. The apparatus may include: the acquisition unit is used for acquiring a first waveform signal by calling a first interface, wherein the first interface comprises a first parameter, and a parameter value of the first parameter is the first waveform signal; the third eliminating unit is used for eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; a third conversion unit for converting the second waveform signal into a third waveform signal in the target signal channel; the third correction unit is used for correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and the output unit is used for outputting the compensated fourth waveform signal by calling the second interface, wherein the second interface comprises a second parameter, the parameter value of the second parameter is the compensated fourth waveform signal, the first waveform signal is obtained by detecting the defect of the surface of the target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or comprises a transmon type qubit.
According to another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium, which includes a stored program, wherein when the program runs, the apparatus on which the storage medium is located is controlled to execute the method of signal processing according to any one of the above.
According to another aspect of the embodiments of the present invention, there is also provided a processor for executing a program, wherein the method of signal processing according to any one of the above is performed when the program is executed.
According to another aspect of the embodiments of the present invention, there is also provided a signal processing system including: a processor; a memory coupled to the processor for providing instructions to the processor for processing the following processing steps: eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
In the embodiment of the invention, a local oscillator leakage signal is eliminated from a first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit. That is to say, according to the present application, a third waveform signal is obtained by converting a signal after compensation of a first waveform signal (for example, LO leakage), a fourth waveform signal is obtained by correcting the third waveform signal based on a mixing signal, and the obtained waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal), so that the fourth waveform signal and the target waveform signal are as consistent as possible, thereby achieving a technical effect of improving accuracy of waveform signal processing, and solving a technical problem of low accuracy of waveform signal processing.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention and do not constitute a limitation of the invention. In the drawings:
fig. 1 is a block diagram of a hardware configuration of a computer terminal (or mobile device) of a signal processing method according to an embodiment of the present invention;
FIG. 2 is a flow chart of a method of signal processing according to an embodiment of the present invention;
FIG. 3 is a flow chart of another signal processing method according to an embodiment of the present invention;
FIG. 4 is a flow chart of another signal processing method according to an embodiment of the present invention;
fig. 5 is a schematic diagram of obtaining a demodulated wave packet signal according to an embodiment of the present invention;
FIG. 6 is a schematic diagram of a signal processing apparatus according to an embodiment of the present invention;
FIG. 7 is a schematic diagram of another signal processing apparatus according to an embodiment of the present invention;
FIG. 8 is a schematic diagram of another signal processing apparatus according to an embodiment of the present invention;
fig. 9 is a block diagram of a computer terminal according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
First, some terms or terms appearing in the description of the embodiments of the present application are applicable to the following explanations:
an Arbitrary Waveform Generator (AWG for short) is a special signal source, and comprehensively has Waveform generation capability of other signal sources, so that the AWG is suitable for various simulation experiment requirements;
a high frequency carrier (LO) is a radio wave of a high frequency;
an I channel (AWG I channel for short) of an Arbitrary wave Generator is a standardized wire gauge channel;
the Q channel (AWG Q channel for short) of an Arbitrary wave Generator is a standardized wire gauge channel;
an ultrasonic radio frequency signal (RF signal) for driving a signal of the qubit;
a spectrum analyzer (spectrum analyzer), an instrument for studying the spectral structure of electrical signals;
a high-speed oscilloscope (high-speed oscilloscope) is an electronic measuring instrument;
local oscillator leakage (LO leakage) compensation, which refers to a local oscillator signal leaked to an output port or an input port, and a local oscillator may refer to local oscillation;
demodulation, which is a process of replying a message from a modulated signal carrying the message, and can modulate a carrier with information to be transmitted for a transmitting end to generate a signal carrying the message, and the receiving end can use the transmitted message only by recovering the transmitted message;
mixer calibration, which refers to outputting a precise frequency;
the fluxonium is a first-level quantum bit (Qubit for short) below a sensitive quantum bit (flux Qubit) in the superconducting quantum bit, and is used for connecting a plurality of large junctions (large capacitors) in series and then connecting the large junctions and the small junctions in parallel after the large junctions and the small junctions are connected in series; when the oscillation frequency of the system is far lower than the plasma oscillation frequency of a large junction, the fluxonium can well inhibit the low-frequency charge drift and simultaneously reserve the high-frequency oscillation part of the charge; when the loop magnetic flux of fluxonium is changed, the energy level structure of the fluxonium can be adjusted in a large range (0.5-10 GHz);
a transform line grounded quantization qubit, which is a first-order qubit under a capacitive qubit (also called a charge-qubit-pair) in the superconducting qubit, for increasing the ratio between the josephson Energy (EJ) and the charge Energy (EC) to flatten the dispersion relation of the system energy state to the gate charge, wherein a larger capacitor is connected in parallel at two ends of the josephson junction to reduce the sensitivity to charge noise, and the coupling capacitance between the josephson junction and a linear resonant cavity makes the coupled capacitance and the linear resonant cavity form a circuit Quantum Electrodynamics (QED) system, which can realize the manipulation and readout of the qubit.
Example 1
There is also provided, in accordance with an embodiment of the present invention, a method embodiment of signal processing, it being noted that the steps illustrated in the flowchart of the figure may be carried out in a computer system such as a set of computer-executable instructions, and that, although a logical order is illustrated in the flowchart, in some cases, the steps illustrated or described may be carried out in an order different than here.
The method provided by the first embodiment of the present application may be executed in a mobile terminal, a computer terminal, or a similar computing device. Fig. 1 shows a hardware configuration block diagram of a computer terminal (or mobile device) for implementing a signal processing method. As shown in fig. 1, the computer terminal 10 (or mobile device 10) may include one or more processors (shown as 102a, 102b, … …, 102n in the figures) which may include, but are not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA, a memory 104 for storing data, and a transmission module 106 for communication functions. Besides, the method can also comprise the following steps: a display, an input/output interface (I/O interface), a Universal Serial BUS (USB) port (which may be included as one of the ports of the BUS), a network interface, a power source, and/or a camera. It will be understood by those skilled in the art that the structure shown in fig. 1 is only an illustration and is not intended to limit the structure of the electronic device. For example, the computer terminal 10 may also include more or fewer components than shown in FIG. 1, or have a different configuration than shown in FIG. 1.
It should be noted that the one or more processors and/or other signal processing circuitry described above may be generally referred to herein as "signal processing circuitry". The signal processing circuitry may be embodied in whole or in part in software, hardware, firmware, or any combination thereof. Further, the signal processing circuit may be a single, stand-alone processing module, or incorporated, in whole or in part, into any of the other elements in the computer terminal 10 (or mobile device). As referred to in the embodiments of the application, the signal processing circuit acts as a processor control (e.g., selection of a variable resistance termination path connected to the interface).
The memory 104 may be used to store software programs and modules of application software, such as program instructions/data storage devices corresponding to the signal processing method in the embodiment of the present invention, and the processor executes various functional applications and signal processing by running the software programs and modules stored in the memory 104, so as to implement the signal processing method described above. The memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include memory located remotely from the processor, which may be connected to the computer terminal 10 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The transmission device 106 is used for receiving or transmitting data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider of the computer terminal 10. In one example, the transmission device 106 includes a Network adapter (NIC) that can be connected to other Network devices through a base station to communicate with the internet. In one example, the transmission device 106 can be a Radio Frequency (RF) module, which is used to communicate with the internet in a wireless manner.
The display may be, for example, a touch screen type Liquid Crystal Display (LCD) that may enable a user to interact with the user interface of the computer terminal 10 (or mobile device).
It should be noted that in some alternative embodiments, the computer device (or mobile device) shown in fig. 1 may include hardware elements (including circuitry), software elements (including computer code stored on a computer-readable medium), or a combination of both hardware and software elements. It should be noted that fig. 1 is only one example of a particular specific example and is intended to illustrate the types of components that may be present in the computer device (or mobile device) described above.
In the operating environment shown in fig. 1, the present application provides a signal processing method as shown in fig. 2. It should be noted that the signal processing method of this embodiment may be executed by the mobile terminal of the embodiment shown in fig. 1.
Fig. 2 is a flow chart of a signal processing method according to an embodiment of the present invention, as shown in fig. 2, the method may include the steps of:
step S202, a local oscillator leakage signal is eliminated from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator.
In the technical solution provided in step S202 of the present invention, the wave generator outputs a first waveform signal, adjusts the magnitude of the output first waveform signal, and eliminates the local oscillator leakage signal in the first waveform signal to obtain a second waveform signal, where the first waveform signal may be a bias dc signal output by the wave generator, and the second waveform signal may be a bias dc signal satisfying a condition with the local oscillator leakage signal eliminated.
Optionally, a first waveform signal (e.g., an offset dc signal) is obtained, and the magnitude of the first waveform signal is adjusted to remove the local oscillator leakage signal from the first waveform signal, so as to obtain a second waveform signal, e.g., an offset dc signal of an AWG satisfying the condition.
Step S204, the second waveform signal is converted into a third waveform signal in the target signal channel.
In the technical solution provided by step S204 of the present invention, the obtained second waveform signal is converted to obtain a third waveform signal in the target signal channel, where the third waveform signal may be a waveform signal obtained after compensating a sub-waveform signal in the target signal channel, and the target signal channel may be a channel I/Q, where the I channel is used to control rotation in the X direction, and the Q channel is used to control rotation in the Y direction, which is favorable for controlling a qubit.
Optionally, the obtained second waveform signal (e.g., the bias dc signal of the AWG satisfying the condition) is demodulated and low-pass filtered to obtain a demodulated waveform signal, a phase difference of the demodulated waveform signal in the target signal channel is determined, and the sub-waveform signal in the target signal channel is compensated based on the determined phase difference to obtain a third waveform signal.
In step S206, the third waveform signal is corrected based on the mixed signal, and a fourth waveform signal is obtained.
In the technical solution provided by step S206 of the present invention, a mixed signal is input, and the third waveform signal in the mixer is corrected to obtain a fourth waveform signal, where the mixed signal may be a signal (RF signal) for driving a qubit obtained by mixing an input constant wave packet signal, and the fourth waveform signal may be a waveform signal compensated by an IQ channel after correction.
Alternatively, a constant wave packet signal is input, an RF signal is obtained after mixing in the mixer, the RF signal is connected to the spectrometer, the amplitude of the wave packet signal of the target channel (for example, channel I/Q) is adjusted until there is only one peak on the spectrometer, so as to complete further correction of the third waveform signal in the mixer, and a fourth waveform signal is output, which may be an IQ channel compensated waveform signal satisfying the condition.
And a step S208 of compensating the fourth waveform signal based on difference information between the fourth waveform signal and the target waveform signal of the wave generator, and outputting the compensated fourth waveform signal.
In the technical solution provided in step S208 of the present invention, the first waveform signal is obtained by performing defect detection on a surface of a target object, the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
And performing an identification algorithm on the fourth waveform signal and the target waveform signal of the wave generator to obtain a difference between the fourth waveform signal and the target waveform signal of the wave generator, compensating the fourth waveform signal based on the obtained difference, and outputting the compensated fourth waveform signal, wherein the waveform compensation can be realized by modifying a code for generating the amplitude and the phase of the waveform on a terminal, and the target waveform signal can be an ideal waveform signal.
Optionally, a constant wave packet signal is input, an RF signal is obtained after mixing in the mixer, the RF signal is corrected, a fourth waveform signal is output, the fourth waveform signal is connected to an oscilloscope, the fourth waveform signal is demodulated and low-pass filtered, an identification algorithm is performed to obtain a difference between an amplitude and a phase of the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal) of the wave generator, the fourth waveform signal is compensated by inputting or modifying a code for generating the amplitude and the phase of the waveform on a terminal, and the compensated fourth waveform signal is output.
In this embodiment, the quantum chip is a basic constituent unit of a chip, and is a processor using a superposition effect of quantum states as a principle and using a quantum bit as an information processing carrier, the quantum chip has at least one quantum bit therein, and the quantum chip may include a superconducting quantum chip, a semiconductor quantum chip, a quantum dot chip, an ion well, a diamond (NV) color center, and the like, wherein the quantum chip may include a fluxonium-type qubit or the quantum chip includes a transmon-type qubit.
Optionally, the embodiment determines the defect detection result of the surface plate of the fluxonium type qubit or the transmon type qubit based on the compensated fourth waveform signal by performing defect detection on the surface plate of the fluxonium type qubit or the transmon type qubit based on the probe, thereby preventing the problem that in the detection of the surface plate of the fluxonium type qubit or the transmon type qubit, the probe is directly used for contacting the positive plate and the negative plate of the fluxonium type qubit or the transmon type qubit for detection, so that the contact pressure is too large, and the surface of the fluxonium type qubit or the transmon type qubit causes damage to the qubit.
Optionally, the method includes performing defect detection on a surface of a fluxonium-type qubit or a transmon-type qubit to obtain a first waveform signal, removing a local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, transmitting the second waveform signal to a terminal (e.g., a computer terminal), demodulating the waveform signal by inputting a demodulation code to the terminal to obtain a demodulated waveform signal, determining a first phase of the second waveform signal in the first signal channel and a second phase of the second waveform signal in the second signal channel by a least square recognition algorithm or a curve fitting method after obtaining the demodulated waveform signal, determining a first phase difference between the first phase and the second phase, compensating the first phase difference to a sub-waveform signal of the second waveform signal in a target signal channel to obtain a third waveform signal, and correcting the third waveform signal based on the mixing signal, and obtaining a fourth waveform signal, comparing the fourth waveform signal with the target waveform signal to compensate the fourth waveform signal to obtain a compensated fourth waveform signal, and comparing the compensated fourth waveform signal with an ideal waveform signal obtained by detecting the surface of the fluxonium type qubit or the transmon type qubit during smoothing to achieve the purpose of determining the defect detection result of the surface of the fluxonium type qubit or the transmon type qubit.
Through the above steps S202 to S208, a local oscillator leakage signal is eliminated from the first waveform signal to obtain a second waveform signal, where the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit. That is to say, according to the present application, a third waveform signal is obtained by converting a signal after compensation of a first waveform signal (for example, LO leakage), a fourth waveform signal is obtained by correcting the third waveform signal based on a mixing signal, and the obtained waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal), so that the fourth waveform signal and the target waveform signal are as consistent as possible, thereby achieving a technical effect of improving accuracy of waveform signal processing, and solving a technical problem of low accuracy of waveform signal processing.
The above method of this embodiment is further described below.
As an alternative implementation, step S204, converting the second waveform signal into a third waveform signal in the target signal channel, includes: acquiring a first phase of a second waveform signal in a first signal channel and a second phase of the second waveform signal in a second signal channel, wherein the wave generator comprises the first signal channel and the second signal channel, and the target signal channel is the first signal channel or the second signal channel; a third waveform signal in the target signal channel is determined based on the first phase and the second phase.
In this embodiment, the wave generator includes a first signal channel and a second signal channel, a first phase of the second waveform signal in the first signal channel and a second phase in the second signal channel are obtained, the second waveform signal is converted into a third waveform signal in the target signal channel, and the third waveform signal in the target signal channel is determined based on the first phase and the second phase, wherein the first signal channel may be an I signal channel of the AWG and the second signal channel may be a Q signal channel of the AWG.
Optionally, the local oscillator leakage signal is eliminated from the first waveform signal to obtain a second waveform signal, the second waveform signal is transmitted to a terminal (for example, a computer terminal), then demodulation of the waveform signal is implemented by inputting a demodulation code on the terminal to obtain a demodulated waveform signal, after the demodulated waveform signal is obtained, a first phase of the second waveform signal in the first signal channel and a second phase of the second waveform signal in the second signal channel are determined by a least square identification algorithm or a curve fitting method, and a third waveform signal in the target signal channel is determined based on the first phase and the second phase, where the demodulation code may be used to multiply a high-frequency signal set according to practice on the second waveform signal first, and then obtain the demodulated waveform signal by a low-pass filter.
As an alternative embodiment, determining the third waveform signal in the target signal channel based on the first phase and the second phase includes: acquiring a first phase difference between the first phase and the second phase; and compensating the first phase difference to the sub-waveform signal of the second waveform signal in the target signal channel to obtain a third waveform signal.
In this embodiment, a first phase of the second waveform signal in the first signal channel and a second phase of the second waveform signal in the second signal channel are obtained by a least square identification algorithm or a curve fitting method, a first phase difference between the first phase and the second phase is determined, and the first phase difference is compensated to the sub-waveform signal of the second waveform signal in the target signal channel to obtain a third waveform signal, wherein the first phase difference may be a difference between the first phase and the second phase.
Optionally, a first phase of the second waveform signal in the first signal channel and a second phase of the second waveform signal in the second signal channel are determined by a least square identification algorithm or a curve fitting method, a difference is made between the first phase and the second phase to obtain a first phase difference between the first phase and the second phase, and the first phase difference is supplemented to the sub-waveform signal of the second waveform signal in the target signal channel to obtain a third waveform signal.
For example, the first phase difference between the first phase in the first signal channel and the second phase in the second signal channel is 1 degree, i.e., I-Q is 1 degree, and the 1 degree phase difference may be added or subtracted when the second signal channel signal is generated or the 1 degree phase difference is subtracted when the first signal channel signal is generated.
As an alternative implementation, the obtaining a first phase of the second waveform signal in the first signal path and a second phase of the second waveform signal in the second signal path includes: determining a plurality of wave packet signals corresponding to the second waveform signal, wherein wave packet frequencies of the plurality of wave packet signals are different, and the wave packet frequencies are determined by the offset frequency of the wave generator; a first phase and a second phase are determined based on the plurality of wave packet signals.
In this embodiment, a plurality of wave packet signals corresponding to the second waveform signal are determined, and the first phase and the second phase are determined based on the plurality of wave packet signals, so as to achieve the purpose of obtaining the first phase of the second waveform signal in the first signal channel and the second phase of the second waveform signal in the second signal channel, wherein the wave packet frequencies of the plurality of wave packet signals are different; the wave packet signal may be a cosine wave packet (cosine wave packet, abbreviated as cos wave packet) of a specified frequency; and determining the wave packet frequency corresponding to the plurality of wave packet signals, wherein the wave packet frequency is determined by the offset frequency of the wave generator, for example, the wave packet frequency can be one twentieth to one twentieth of the offset frequency of the wave generator, and when the offset frequency of the wave generator is 100MHz, the wave packet frequency can be calculated to be 5-100 MHz.
Optionally, a plurality of wave packet signals corresponding to the second waveform signal are determined, cosine wave packets with different frequencies are input, and a first phase in the first signal channel and a second phase in the second signal channel obtained by demodulating the input damped cosine wave packets are utilized.
It should be noted that, the cos wave packet of a certain specified frequency is corrected, when the frequency of 5MHz to 50MHz is considered, the 5MHz wave packet may be corrected first, then the 10MHz wave packet is corrected, then the 15MHz wave packet is corrected, then the 20MHz wave packet is corrected, and so on, the correction is performed once every 5MHz, and finally the 50MHz wave packet is corrected (the interval may also be shortened, and then more frequencies are corrected), where the sine wave (Sin wave) is the same as the cos wave in nature, and the use of the cos wave has the advantage that the parameters that need to be adjusted are few, and only the amplitude and the frequency need to be adjusted, and the cos wave packet has definite start and end times and does not need to be normalized like the Sin wave, so the embodiment uses cosine wave packets of different frequencies.
As an alternative embodiment, determining the first phase and the second phase based on a plurality of wave packet signals includes: carrying out frequency mixing processing on the multiple wave packet signals to obtain a target wave packet signal; detecting the target wave packet signal to obtain a driving quantum bit signal; at least the driving qubit signal is demodulated to obtain a first phase and a second phase.
In this embodiment, a plurality of wave packet signals are subjected to frequency mixing processing to obtain a target wave packet signal, the target wave packet signal is detected to obtain a driving qubit signal, the driving qubit signal is demodulated and low-pass filtered, and a first phase and a second phase are obtained through an identification algorithm, where the driving qubit signal may be an RF signal measured by an oscilloscope after frequency mixing and may be used to drive a qubit.
Optionally, wave packet signals of different frequencies are input, frequency mixing processing is performed on the input multiple wave packet signals to obtain a target wave packet signal, the target wave packet signal is detected by an oscilloscope to obtain a driving qubit signal (for example, an RF signal), the driving qubit signal is demodulated and low-pass filtered, and the first phase and the second phase are obtained by an identification algorithm.
As an alternative embodiment, the wave packet signal is a cosine wave packet signal.
In this embodiment, the cosine wave packet signal is a cosine wave packet signal because the cosine wave packet signal requires less parameters to be adjusted, only the amplitude and frequency need to be adjusted, and there are definite start and end times.
As an alternative embodiment, step S208, based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator, compensates the fourth waveform signal, including: acquiring an amplitude difference between a first amplitude of the fourth waveform signal and a second amplitude of the target waveform signal; the first amplitude of the fourth waveform signal is compensated based on the amplitude difference.
Optionally, due to the action of the wire and the mixer, the amplitude of the obtained fourth waveform signal (which may be an actually obtained signal) is certainly greatly attenuated compared with the target waveform signal of the wave generator, and the target waveform signal can be obtained by compensating the amplitude; for phase, if the phase difference is at an allowable threshold, no correction may be used.
In this embodiment, the fourth waveform signal is compared with a target waveform signal of the wave generator, an amplitude difference between a first amplitude of the fourth waveform signal and a second amplitude of the target waveform signal is determined, and the first amplitude of the fourth waveform signal is compensated based on the amplitude difference between the fourth waveform signal and the target waveform signal of the wave generator, wherein the target waveform signal of the wave generator may be an initially set waveform signal.
As an alternative embodiment, in step S208, compensating the fourth waveform signal based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator includes: acquiring a second phase difference between a third phase of the fourth waveform signal and a fourth phase of the target waveform signal; the third phase of the fourth waveform signal is compensated based on the second phase difference.
In this embodiment, the fourth waveform signal is compared with the target waveform signal of the wave generator, a second phase difference between a third phase of the fourth waveform signal and a fourth phase of the target waveform signal is determined, and the third phase of the fourth waveform signal is compensated based on the second phase difference between the third phase of the fourth waveform signal and the fourth phase of the target waveform signal.
Optionally, a second phase difference between the third phase of the fourth waveform signal and the fourth phase of the target waveform signal is determined by a least square identification algorithm or a curve fitting method, and the second phase difference is compensated to the second phase difference. For example, if the second phase difference between the third phase of the fourth waveform signal and the fourth phase of the target waveform signal is 1 degree, 1 degree may be added to the third phase of the fourth waveform signal, and it should be noted that the phase is compensated by modifying the code of the production waveform at the terminal.
As an optional implementation, compensating the third phase of the fourth waveform signal based on the second phase difference includes: in response to the second phase difference being greater than the first threshold, a third phase of the fourth waveform signal is compensated based on the second phase difference.
In this embodiment, a second phase difference between the third phase of the fourth waveform signal and the fourth phase of the target waveform signal is determined, and if the second phase difference is greater than a first threshold, the third phase of the fourth waveform signal is compensated based on the second phase difference in response to the second phase difference being greater than the first threshold, wherein the first threshold may be a value set according to actual requirements.
Alternatively, if the second phase difference is smaller than the first threshold (the second phase difference is at an allowable threshold), the third phase of the fourth waveform signal may not be corrected.
As an alternative embodiment, the difference information between the compensated fourth waveform signal and the target waveform signal is smaller than the second threshold.
In this embodiment, the fourth waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and the difference information between the compensated fourth waveform signal and the target waveform signal is smaller than a second threshold, where the second threshold may be a value set according to actual needs.
In the embodiment of the present invention, a first waveform signal (for example, LO leakage) is compensated and then converted to obtain a mixed signal, the mixed signal is corrected to obtain a fourth waveform signal, and the obtained waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal), so that the fourth waveform signal and the target waveform signal are as consistent as possible, thereby achieving a technical effect of improving accuracy of waveform signal processing and solving a technical problem of low accuracy of waveform signal processing.
The embodiment of the invention also provides another signal processing method.
Fig. 3 is a flow chart of another signal processing method according to an embodiment of the present invention. As shown in fig. 3, the method may include the following steps.
Step S302, defect detection is carried out on the surface of the target object to obtain a first waveform signal.
In the technical solution provided by the above step S302 of the present invention, defect detection is performed on the surface of the target object to obtain a first waveform signal, where the target object may be an industrial object to be detected, and the first waveform signal may be a bias direct current signal.
Optionally, the wave generator outputs a wave signal to detect the defect on the surface of the target object, and the first wave signal is obtained based on the detection result of the defect on the surface of the target object.
And step S304, eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator.
In the technical solution provided in step S304 of the present invention, based on the obtained first waveform signal, the magnitude of the output first waveform signal is adjusted, and the local oscillator leakage signal in the first waveform signal is eliminated to obtain a second waveform signal, where the local oscillator leakage signal may be represented by LO leakage, the wave generator may be represented by AWG, and the second waveform signal may be a bias dc signal satisfying the condition, where the local oscillator leakage signal is eliminated.
Optionally, a first waveform signal (e.g., an offset dc signal) is obtained, and the magnitude of the first waveform signal is adjusted to remove the local oscillator leakage signal from the first waveform signal, so as to obtain a second waveform signal, e.g., an offset dc signal of an AWG satisfying the condition.
Step S306, the second waveform signal is converted into a third waveform signal in the target signal channel.
In the technical solution provided in step S306 of the present invention, the obtained second waveform signal is converted to obtain a third waveform signal in the target signal channel, where the third waveform signal may be a waveform signal obtained after compensating a sub-waveform signal in the target signal channel, the target signal channel may be a channel I/Q, the I channel controls the rotation in the X direction, and the Q channel controls the rotation in the Y direction, which is beneficial to controlling the qubit.
Optionally, the obtained second waveform signal (e.g., the bias dc signal of the AWG satisfying the condition) is demodulated and low-pass filtered to obtain a demodulated waveform signal, a phase difference of the demodulated waveform signal in the target signal channel is determined, and the sub-waveform signal in the target signal channel is compensated based on the determined phase difference to obtain a third waveform signal.
Step S308, the third waveform signal is corrected based on the mixed signal, and a fourth waveform signal is obtained.
In the technical solution provided in step S308 of the present invention, a mixing signal is input, and the third waveform signal in the mixer is corrected to obtain a fourth waveform signal, where the mixing signal may be a signal for driving a qubit obtained by mixing an input constant-value wave packet signal, and the fourth waveform signal may be a corrected waveform signal for IQ channel compensation.
Alternatively, a constant wave packet signal is input, an RF signal is obtained after mixing in the mixer, the RF signal is connected to the spectrometer, the amplitude of the wave packet signal of the target channel (for example, channel I/Q) is adjusted until there is only one peak on the spectrometer, so as to complete further correction of the third waveform signal in the mixer, and a fourth waveform signal is output, which may be an IQ channel compensated waveform signal satisfying the condition.
In step S310, the fourth waveform signal is compensated based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator.
In the technical solution provided by step S310 of the present invention, an identification algorithm is performed on the fourth waveform signal and the target waveform signal of the wave generator to obtain a difference between the fourth waveform signal and the target waveform signal of the wave generator, and the fourth waveform signal is compensated based on the obtained difference, wherein the waveform compensation can be realized by modifying a code for generating an amplitude and a phase of a waveform on the terminal, and the target waveform signal can be an ideal waveform signal.
Optionally, a constant wave packet signal is input, an RF signal is obtained after mixing in the mixer, the RF signal is corrected, a fourth waveform signal is output, the fourth waveform signal is connected to an oscilloscope, the fourth waveform signal is demodulated and low-pass filtered, an identification algorithm is performed to obtain a difference between an amplitude and a phase of the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal) of the wave generator, and the fourth waveform signal is compensated by inputting or modifying a code for generating the amplitude and the phase of the waveform on a terminal.
In step S312, a defect detection result of the surface of the target object is determined based on the compensated fourth waveform signal.
In the technical solution provided by step S312 of the present invention, the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
Due to the action of the conducting wire and the frequency mixer, the actually obtained signal amplitude is greatly attenuated compared with the target waveform signal, if the target waveform signal is required to be achieved, amplitude compensation is carried out on the fourth waveform signal, and the defect detection result of the surface of the target object is determined based on the compensated fourth waveform signal.
As an optional implementation, the industrial object is a quantum chip, wherein the performing defect detection on the surface of the target object to obtain the first waveform signal includes: detecting defects of a surface polar plate of the quantum chip based on the probe to obtain a first waveform signal; determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, including: and determining the defect detection result of the surface plate of the quantum chip based on the compensated fourth waveform signal.
Optionally, the defect detection method includes performing defect detection on a surface plate of the quantum chip based on the probe to obtain a first waveform signal, eliminating a local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, converting the second waveform signal into a third waveform signal in a target signal channel, correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal, compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and determining a defect detection result of the surface plate of the quantum chip based on the compensated fourth waveform signal.
As an alternative embodiment, the industrial object is a quantum chip, wherein the quantum chip comprises fluxonium type qubits or the quantum chip comprises transmon type qubits.
In this embodiment, the quantum chip is a basic constituent unit of a chip, is a processor that uses a superposition effect of quantum states as a principle and uses a quantum bit as an information processing carrier, and the quantum chip has at least one quantum bit inside, and may include a superconducting quantum chip, a semiconductor quantum chip, a quantum dot chip, an ion well, a diamond (NV) color center, and the like, where the quantum chip may include a fluxonium type qubit or the quantum chip includes a transmon type qubit.
Optionally, the embodiment determines the defect detection result of the surface plate of the fluxonium type qubit or the transmon type qubit based on the compensated fourth waveform signal by performing defect detection on the surface plate of the fluxonium type qubit or the transmon type qubit based on the probe, thereby preventing the problem that in the detection of the surface plate of the fluxonium type qubit or the transmon type qubit, the probe is directly used for contacting the positive plate and the negative plate of the fluxonium type qubit or the transmon type qubit for detection, so that the contact pressure is too large, and the surface of the fluxonium type qubit or the transmon type qubit causes damage to the qubit.
Optionally, the method includes performing defect detection on a surface of a fluxonium-type qubit or a transmon-type qubit to obtain a first waveform signal, removing a local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, transmitting the second waveform signal to a terminal (e.g., a computer terminal), demodulating the waveform signal by inputting a demodulation code to the terminal to obtain a demodulated waveform signal, determining a first phase of the second waveform signal in the first signal channel and a second phase of the second waveform signal in the second signal channel by a least square recognition algorithm or a curve fitting method after obtaining the demodulated waveform signal, determining a first phase difference between the first phase and the second phase, compensating the first phase difference to a sub-waveform signal of the second waveform signal in a target signal channel to obtain a third waveform signal, and correcting the third waveform signal based on the mixing signal, and obtaining a fourth waveform signal, comparing the fourth waveform signal with the target waveform signal to compensate the fourth waveform signal to obtain a compensated fourth waveform signal, and comparing the compensated fourth waveform signal with an ideal waveform signal obtained by detecting the surface of the fluxonium type qubit or the transmon type qubit during smoothing to achieve the purpose of determining the defect detection result of the surface of the fluxonium type qubit or the transmon type qubit.
The embodiment of the invention also provides another signal processing method.
Fig. 4 is a flow chart of another signal processing method according to an embodiment of the present invention. As shown in fig. 4, the method may include the following steps.
Step S402, obtaining a first waveform signal by calling a first interface, where the first interface includes a first parameter, and a parameter value of the first parameter is the first waveform signal.
In the technical solution provided by step S402 of the present invention, the first interface may be an interface for performing data interaction between the server and the client. The client may transmit at least one detected first waveform signal to the first interface as a first parameter of the first interface, so as to achieve the purpose of uploading the detected first waveform signal of the target object to the server.
Optionally, the surface of the target object is subjected to defect detection, and a first waveform signal is obtained.
Optionally, the platform acquires the first waveform signal of the detected target object by calling a first interface, where the first interface may be used for accessing the first waveform signal into the measurement system, so as to acquire the first waveform signal of the detected target object.
And S404, eliminating the local oscillation leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator.
In step S406, the second waveform signal is converted into a third waveform signal in the target signal channel.
Step S408, the third waveform signal is corrected based on the mixed signal, and a fourth waveform signal is obtained.
And step S410, outputting the compensated fourth waveform signal by calling a second interface, where the second interface includes a second parameter, and a parameter value of the second parameter is the compensated fourth waveform signal.
In the technical solution provided by step S410 of the present invention, the first waveform signal is obtained by performing defect detection on a surface of a target object, the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
The second interface may be an interface for data interaction between the server and the client, and the server may transmit the compensated fourth waveform signal to the second interface as a parameter of the second interface, so as to achieve the purpose of issuing the compensated fourth waveform signal to the client. Optionally, the platform outputs the compensated fourth waveform signal by calling a second interface, where the second interface is configured to deploy and access the compensated fourth waveform signal into the measurement system through the internet, so as to output the compensated fourth waveform signal.
In the embodiment of the invention, the local oscillator leakage signal is eliminated from the first waveform signal to obtain the second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal. That is to say, according to the present application, a third waveform signal is obtained by converting a signal after compensation of a first waveform signal (for example, LO leakage), a fourth waveform signal is obtained by correcting a mixed signal of the third waveform signal, and the obtained waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal (for example, an ideal waveform signal), so that the fourth waveform signal and the target waveform signal are as consistent as possible, thereby achieving a technical effect of improving accuracy of waveform signal processing, and solving a technical problem of low accuracy of waveform signal processing.
Example 2
The following further describes a preferred implementation of the above method of this embodiment, specifically illustrated as a method of control pulse calibration based on instrument defects.
The qubit gate can cause waveform errors due to device defects, and in order to correct the errors, a method of LO leakage compensation and mixer calibration is proposed, but the method does not discuss the condition that the phase difference of I/Q of two channels of AWG is caused by the wave packet frequency, and the problem that the obtained signal and the ideal waveform are close in amplitude and phase cannot be guaranteed exists.
In order to solve the above problem, a four-step waveform correction scheme is proposed, which may include: firstly, the leakage of an LO is processed through compensation; secondly, demodulating to obtain the phase difference of the two channels of the AWG IQ by inputting cos wave packets with different frequencies; thirdly, calibrating the mixer through compensation; and fourthly, pre-correcting the input signal to enable the input signal to be consistent with the ideal waveform as much as possible. It should be noted that the solution is based on an error model, and the solutions for different error models are different.
The above method of this embodiment is further described from the input-output perspective below.
In the first step, the leakage of the LO is compensated, so that the bias direct current signal of the AWG can be input, the magnitude of the direct current signal is adjusted until the frequency domain signal on the frequency spectrograph is approximate to a straight line, the straight line means that the leakage of the LO is eliminated, and the output is the magnitude of the bias direct current signal of the AWG meeting the condition.
And step two, considering wave packet correction, demodulating to obtain the phase difference of two channels of IQ by inputting cosine wave packets with different frequencies, and solving the problem of the phase difference caused by the wave packet frequency by compensating the phase difference.
Optionally, on the basis of the first step, wave packet signals with different frequencies are input, an oscilloscope is used for measuring an RF signal after mixing, the RF signal is demodulated and low-pass filtered, a phase difference between two channels of IQ is obtained through an identification algorithm, and the phase difference is compensated.
Alternatively, fig. 5 is a schematic diagram of obtaining a demodulated wave packet signal according to an embodiment of the invention, and as shown in fig. 5, an RF signal (V) is collected RT (t)), the collected data (V) is processed RT (t)) to the terminal, and then writing the code on the terminal to implement demodulation, which may include: by multiplying a high frequency signal by the RF signal, e.g. by 2cos (ω) LO +ω AWG ) t and 2sin (ω) LO +ω AWG ) t, it should be noted that the high frequency signal here is only an example, and is not limited specifically, and the demodulated wave packet signal is obtained through a low pass filter, and after the demodulated wave packet signal is obtained, the phases of the two channels are obtained respectively through a least square identification algorithm or a curve fitting methodAndand then, performing difference to obtain the phase difference of the two channels, and compensating the difference to any channel. For example, if I-Q is 1 degree, the phase difference of 1 degree may be added when generating the Q channel signal, or the phase difference of 1 degree may be subtracted when generating the I channel signal, and the actual operation is to modify the code of the production waveform at the terminal to implement compensation.
Alternatively, the packet frequency is one twentieth to one twentieth of the AWG bias frequency, e.g., 100MHz for an AWG bias frequency, and a packet frequency of 5-100MHz may be obtained.
Optionally, the wave packet modification may be to modify a cos wave packet of a certain specified frequency each time, for example, considering a frequency of 5MHz-50MHz, the cos wave packet may be modified once every 5MHz, that is, the 5MHz wave packet may be modified first, then the 10MHz wave packet may be modified, and so on, and finally the 50MHz wave packet may be modified, or the interval may be shortened, where the type of the wave packet may be a Sin wave or a cos wave, and the Sin wave and the cos wave are the same in nature, and the cos wave packet has the advantage that the parameters that need to be adjusted are few, and only the amplitude and the frequency need to be adjusted, and in addition, the cos wave packet has an explicit start and end time, and does not need to be normalized like the Sin wave packet.
Optionally, an I channel in the IQ channel controls the rotation in the X direction, and a Q channel controls the rotation in the Y direction, which is beneficial to control the qubits.
And thirdly, calibrating the mixer through compensation, wherein the calibration comprises the steps of inputting a constant wave packet on the basis of the first two steps, obtaining an RF signal after mixing, connecting the RF signal to a frequency spectrograph, and adjusting the amplitude values of the wave packets of the IQ two channels until only one peak value exists on the frequency spectrograph, so that the calibration of the mixer is realized, and the amplitude value of IQ channel compensation meeting the condition is output.
And fourthly, pre-correcting the input signal to enable the input signal to be consistent with the ideal waveform as far as possible, wherein the method comprises the following steps of outputting a cos wave packet on the basis of the previous three steps, obtaining an RF signal after frequency mixing, connecting the RF to an oscilloscope, demodulating and low-pass filtering after data are obtained, then carrying out an identification algorithm to obtain the difference between the amplitude and the phase of the ideal signal, and compensating the difference. It should be noted that all the above mentioned compensations are achieved by modifying the code on the terminal that generates the amplitude and phase of the waveform.
In this embodiment, a mixed signal is obtained by converting a signal compensated by a first waveform signal (e.g., LO leakage), the mixed signal is corrected to obtain a fourth waveform signal, and the obtained waveform signal is compensated based on difference information between the fourth waveform signal and a target waveform signal (e.g., an ideal waveform signal), so that the fourth waveform signal and the target waveform signal are as consistent as possible, thereby achieving a technical effect of improving accuracy of waveform signal processing and solving a technical problem of low accuracy of waveform signal processing.
It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present invention is not limited by the order of acts, as some steps may occur in other orders or concurrently in accordance with the invention. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required by the invention.
Through the above description of the embodiments, those skilled in the art can clearly understand that the signal processing method according to the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.
Example 3
According to an embodiment of the present invention, there is also provided a signal processing apparatus for implementing the signal processing method shown in fig. 2.
Fig. 6 is a schematic diagram of a signal processing apparatus according to an embodiment of the present invention. As shown in fig. 6, the signal processing apparatus 600 may include: a first cancellation unit 602, a first conversion unit 604, a first correction unit 606 and a first compensation unit 608.
The first eliminating unit 602 is configured to eliminate the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, where the first waveform signal is output by the wave generator.
A first conversion unit 604, configured to convert the second waveform signal into a third waveform signal in the target signal channel.
The first correcting unit 606 is configured to correct the third waveform signal based on the mixed signal, so as to obtain a fourth waveform signal.
The first compensation unit 608 is configured to compensate the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and output the compensated fourth waveform signal, where the first waveform signal is obtained by performing defect detection on a surface of a target object, the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
It should be noted here that the first eliminating unit 602, the first converting unit 604, the first correcting unit 606 and the first compensating unit 608 correspond to steps S202 to S208 in embodiment 1, and the four units are the same as the corresponding steps in the implementation example and application scenario, but are not limited to the disclosure in the first embodiment. It should be noted that the above units as a part of the apparatus may operate in the computer terminal 10 provided in the first embodiment.
According to an embodiment of the present invention, there is also provided a signal processing apparatus for implementing the signal processing method shown in fig. 3.
Fig. 7 is a schematic diagram of another signal processing apparatus according to an embodiment of the present invention. As shown in fig. 7, the signal processing apparatus 700 may include: a detection unit 702, a second cancellation unit 704, a second conversion unit 706, a second correction unit 708, a second compensation unit 710, and a determination unit 712.
The detecting unit 702 is configured to perform defect detection on the surface of the target object to obtain a first waveform signal.
And a second eliminating unit 704, configured to eliminate the local oscillator leakage signal from the first waveform signal, which is output by the wave generator, to obtain a second waveform signal.
A second conversion unit 706, configured to convert the second waveform signal into a third waveform signal in the target signal channel.
The second correcting unit 708 is configured to correct the third waveform signal based on the mixed signal, so as to obtain a fourth waveform signal.
A second compensation unit 710 for compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator.
And a determining unit 712, configured to determine a defect detection result of the surface of the target object based on the compensated fourth waveform signal, where the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
It should be noted here that the detection unit 702, the second elimination unit 704, the second conversion unit 706, the second correction unit 708, the second compensation unit 710 and the determination unit 712 correspond to steps S302 to S312 in embodiment 1, and the six units are the same as the examples and application scenarios realized by the corresponding steps, but are not limited to the disclosure in the first embodiment. It should be noted that the above units as a part of the apparatus may operate in the computer terminal 10 provided in the first embodiment.
According to an embodiment of the present invention, there is also provided a signal processing apparatus for implementing the signal processing method shown in fig. 4.
Fig. 8 is a schematic diagram of another signal processing apparatus according to an embodiment of the present invention. As shown in fig. 8, the signal processing apparatus 800 may include: an acquisition unit 802, a third cancellation unit 804, a third conversion unit 806, a third correction unit 808, and an output unit 810.
The obtaining unit 802 is configured to obtain a first waveform signal by invoking a first interface, where the first interface includes a first parameter, and a parameter value of the first parameter is the first waveform signal.
And a third eliminating unit 804, configured to eliminate the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, where the first waveform signal is output by the wave generator.
And a third conversion unit 806, configured to convert the second waveform signal into a third waveform signal in the target signal channel.
The third correcting unit 808 is configured to correct the third waveform signal based on the mixed signal, so as to obtain a fourth waveform signal.
And the output unit 810 is configured to output the compensated fourth waveform signal by invoking a second interface, where the second interface includes a second parameter, a parameter value of the second parameter is the compensated fourth waveform signal, the first waveform signal is obtained by performing defect detection on a surface of a target object, the target object is a quantum chip to be detected, and the quantum chip includes a fluxonium type qubit or the quantum chip includes a transmon type qubit.
It should be noted here that the above-mentioned obtaining unit 802, third eliminating unit 804, third converting unit 806, third correcting unit 808 and output unit 810 correspond to steps S402 to S410 in embodiment 1, and the four units are the same as the examples and application scenarios realized by the corresponding steps, but are not limited to what is disclosed in the above-mentioned embodiment one. It should be noted that the above units as a part of the apparatus may operate in the computer terminal 10 provided in the first embodiment.
In the signal processing apparatus of this embodiment, the local oscillator leakage signal is canceled from the first waveform signal by the first canceling unit to obtain the second waveform signal, wherein the first waveform signal is output by the wave generator; converting, by the first conversion unit, the second waveform signal into a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal through a first correction unit to obtain a fourth waveform signal; the first compensation unit is used for compensating the fourth waveform signal based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator and outputting the compensated fourth waveform signal, so that the technical effect of improving the accuracy of waveform signal processing is achieved, and the technical problem of low accuracy of waveform signal processing is solved.
Example 4
Embodiments of the present invention may provide a signal processing system, which may include a computer terminal, which may be any one of computer terminal devices in a computer terminal group. Optionally, in this embodiment, the computer terminal may also be replaced with a terminal device such as a mobile terminal.
Optionally, in this embodiment, the computer terminal may be located in at least one network device of a plurality of network devices of a computer network.
In this embodiment, the computer terminal may execute program codes of the following steps in the signal processing method of the application program: eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal.
Alternatively, fig. 9 is a block diagram of a computer terminal according to an embodiment of the present invention. As shown in fig. 9, the computer terminal a may include: one or more processors 902 (only one shown), a memory 904, and a transmitting device 906.
The memory may be used to store software programs and modules, such as program instructions/modules corresponding to the signal processing method and apparatus in the embodiments of the present invention, and the processor executes various functional applications and signal processing by running the software programs and modules stored in the memory, so as to implement the signal processing method. The memory may include high speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory may further include memory remotely located from the processor, which may be connected to the computer terminal a through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The processor can call the information and application program stored in the memory through the transmission device to execute the following steps: eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
Optionally, the processor may further execute the program code of the following steps: acquiring a first phase of a second waveform signal in a first signal channel and a second phase of the second waveform signal in a second signal channel, wherein the wave generator comprises the first signal channel and the second signal channel, and the target signal channel is the first signal channel or the second signal channel; a third waveform signal in the target signal channel is determined based on the first phase and the second phase.
Optionally, the processor may further execute the program code of the following steps: acquiring a first phase difference between the first phase and the second phase; and compensating the first phase difference to the sub-waveform signal of the second waveform signal in the target signal channel to obtain a third waveform signal.
Optionally, the processor may further execute the program code of the following steps: determining a plurality of wave packet signals corresponding to the second waveform signal, wherein wave packet frequencies of the plurality of wave packet signals are different, and the wave packet frequencies are determined by the offset frequency of the wave generator; a first phase and a second phase are determined based on the plurality of wave packet signals.
Optionally, the processor may further execute the program code of the following steps: carrying out frequency mixing processing on the multiple wave packet signals to obtain a target wave packet signal; detecting the target wave packet signal to obtain a driving quantum bit signal; at least the driving qubit signal is demodulated to obtain a first phase and a second phase.
Optionally, the processor may further execute the program code of the following steps: acquiring an amplitude difference between a first amplitude of the fourth waveform signal and a second amplitude of the target waveform signal; the first amplitude of the fourth waveform signal is compensated based on the amplitude difference.
Optionally, the processor may further execute the program code of the following steps: acquiring a second phase difference between a third phase of the fourth waveform signal and a fourth phase of the target waveform signal; the third phase of the fourth waveform signal is compensated based on the second phase difference.
Optionally, the processor may further execute the program code of the following steps: in response to the second phase difference being greater than the first threshold, a third phase of the fourth waveform signal is compensated based on the second phase difference.
As an alternative example, the processor may invoke the information stored in the memory and the application program via the transmission means to perform the following steps: detecting defects on the surface of a target object to obtain a first waveform signal; eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator; and determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, wherein the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
Optionally, the processor may further execute the program code of the following steps: detecting defects of a surface polar plate of the quantum chip based on the probe to obtain a first waveform signal; and determining the defect detection result of the surface plate of the quantum chip based on the compensated fourth waveform signal.
As an alternative example, the processor may invoke the information stored in the memory and the application program via the transmission means to perform the following steps: acquiring a first waveform signal by calling a first interface, wherein the first interface comprises a first parameter, and a parameter value of the first parameter is the first waveform signal; eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and outputting a compensated fourth waveform signal by calling a second interface, wherein the second interface comprises a second parameter, and a parameter value of the second parameter is the compensated fourth waveform signal, wherein the first waveform signal is obtained by performing defect detection on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or comprises a transmon type qubit.
The embodiment of the invention provides a signal processing method, which comprises the steps of eliminating a local oscillator leakage signal from a first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; based on the difference information between the fourth waveform signal and the target waveform signal of the wave generator, the fourth waveform signal is compensated, and the compensated fourth waveform signal is output, wherein the first waveform signal is obtained by detecting the defects of the surface of the target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type quantum bit or a transmon type quantum bit, so that the technical effect of improving the accuracy of processing the waveform signal is realized, and the technical problem of low accuracy of processing the waveform signal is solved.
It can be understood by those skilled in the art that the structure shown in fig. 9 is only an illustration, and the computer terminal a may also be a terminal device such as a smart phone (e.g., an Android phone, an iOS phone, etc.), a tablet computer, a palmtop computer, a Mobile Internet Device (MID), a PAD, and the like. Fig. 9 does not limit the structure of the computer terminal a. For example, the computer terminal a may also include more or fewer components (e.g., network interfaces, display devices, etc.) than shown in fig. 9, or have a different configuration than shown in fig. 9.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by a program instructing hardware associated with the terminal device, where the program may be stored in a computer-readable storage medium, and the storage medium may include: flash disks, Read-Only memories (ROMs), Random Access Memories (RAMs), magnetic or optical disks, and the like.
Example 5
Embodiments of the present invention also provide a computer-readable storage medium. Optionally, in this embodiment, the computer-readable storage medium may be used to store the program code executed by the signal processing method provided in the first embodiment.
Optionally, in this embodiment, the computer-readable storage medium may be located in any one of a group of computer terminals in a computer network, or in any one of a group of mobile terminals.
As an alternative example, the computer readable storage medium is arranged to store program code for performing the steps of: eliminating the local oscillation leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal, wherein the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: acquiring a first phase of a second waveform signal in a first signal channel and a second phase of the second waveform signal in a second signal channel, wherein the wave generator comprises the first signal channel and the second signal channel, and the target signal channel is the first signal channel or the second signal channel; a third waveform signal in the target signal channel is determined based on the first phase and the second phase.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: acquiring a first phase difference between the first phase and the second phase; and compensating the first phase difference to the sub-waveform signal of the second waveform signal in the target signal channel to obtain a third waveform signal.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: determining a plurality of wave packet signals corresponding to the second waveform signal, wherein wave packet frequencies of the plurality of wave packet signals are different, and the wave packet frequencies are determined by the offset frequency of the wave generator; a first phase and a second phase are determined based on the plurality of wave packet signals.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: carrying out frequency mixing processing on the multiple wave packet signals to obtain a target wave packet signal; detecting the target wave packet signal to obtain a driving quantum bit signal; at least the driving qubit signal is demodulated to obtain a first phase and a second phase.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: acquiring an amplitude difference between a first amplitude of the fourth waveform signal and a second amplitude of the target waveform signal; the first amplitude of the fourth waveform signal is compensated based on the amplitude difference.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: acquiring a second phase difference between a third phase of the fourth waveform signal and a fourth phase of the target waveform signal; the third phase of the fourth waveform signal is compensated based on the second phase difference.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: in response to the second phase difference being greater than the first threshold, a third phase of the fourth waveform signal is compensated based on the second phase difference.
As an alternative example, the computer readable storage medium is arranged to store program code for performing the steps of: detecting defects on the surface of a target object to obtain a first waveform signal; eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator; and determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, wherein the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for performing the following steps: detecting defects of a surface polar plate of the quantum chip based on the probe to obtain a first waveform signal; and determining a defect detection result of the surface plate of the quantum chip based on the compensated fourth waveform signal.
As an alternative example, the computer readable storage medium is arranged to store program code for performing the steps of: acquiring a first waveform signal by calling a first interface, wherein the first interface comprises a first parameter, and a parameter value of the first parameter is the first waveform signal; eliminating the local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by the wave generator; converting the second waveform signal to a third waveform signal in the target signal channel; correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal; and outputting a compensated fourth waveform signal by calling a second interface, wherein the second interface comprises a second parameter, and a parameter value of the second parameter is the compensated fourth waveform signal, wherein the first waveform signal is obtained by performing defect detection on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or comprises a transmon type qubit.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units is only one type of division of logical functions, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (15)
1. A signal processing method, comprising:
eliminating a local oscillator leakage signal from a first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator;
converting the second waveform signal to a third waveform signal in a target signal channel;
correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal;
compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator, and outputting the compensated fourth waveform signal;
the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
2. The method of claim 1, wherein converting the second waveform signal to a third waveform signal in a target signal path comprises:
acquiring a first phase of the second waveform signal in a first signal channel and a second phase of the second waveform signal in a second signal channel, wherein the wave generator comprises the first signal channel and the second signal channel, and the target signal channel is the first signal channel or the second signal channel;
determining the third waveform signal in the target signal channel based on the first phase and the second phase.
3. The method of claim 2, wherein determining the third waveform signal in the target signal channel based on the first phase and the second phase comprises:
obtaining a first phase difference between the first phase and the second phase;
and compensating the first phase difference to the sub-waveform signal of the second waveform signal in the target signal channel to obtain the third waveform signal.
4. The method of claim 1, wherein obtaining a first phase of the second waveform signal in a first signal path and a second phase in a second signal path comprises:
determining a plurality of wave packet signals corresponding to the second waveform signal, wherein wave packet frequencies of the plurality of wave packet signals are different, and the wave packet frequencies are determined by a bias frequency of the wave generator;
determining the first phase and the second phase based on the plurality of wave packet signals.
5. The method of claim 4, wherein determining the first phase and the second phase based on the plurality of wave packet signals comprises:
performing frequency mixing processing on the plurality of wave packet signals to obtain a target wave packet signal;
detecting the target wave packet signal to obtain a driving quantum bit signal;
demodulating at least the driving qubit signal to obtain the first phase and the second phase.
6. The method of claim 4, wherein the wave packet signal is a cosine wave packet signal.
7. The method of claim 1, wherein compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator comprises:
acquiring an amplitude difference between a first amplitude of the fourth waveform signal and a second amplitude of the target waveform signal;
compensating the first amplitude of the fourth waveform signal based on the amplitude difference.
8. The method of claim 1, wherein compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator comprises:
acquiring a second phase difference between a third phase of the fourth waveform signal and a fourth phase of the target waveform signal;
compensating the third phase of the fourth waveform signal based on the second phase difference.
9. The method of claim 8, wherein compensating the third phase of the fourth waveform signal based on the second phase difference comprises:
in response to the second phase difference being greater than a first threshold, compensating the third phase of the fourth waveform signal based on the second phase difference.
10. The method according to any one of claims 1 to 9, wherein the difference information between the compensated fourth waveform signal and the target waveform signal is smaller than a second threshold.
11. A signal processing method, comprising:
detecting defects on the surface of a target object to obtain a first waveform signal;
eliminating a local oscillator leakage signal from the first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator;
converting the second waveform signal to a third waveform signal in a target signal channel;
correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal;
compensating the fourth waveform signal based on difference information between the fourth waveform signal and a target waveform signal of the wave generator;
determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal;
the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or the quantum chip comprises a transmon type qubit.
12. The method of claim 11, wherein the target object is an industrial object to be detected.
13. The method of claim 11, wherein,
the method for detecting the defects of the surface of the target object to obtain a first waveform signal comprises the following steps: detecting the defects of the surface polar plate of the quantum chip based on the probe to obtain the first waveform signal;
determining a defect detection result of the surface of the target object based on the compensated fourth waveform signal, including: and determining a defect detection result of the surface plate of the quantum chip based on the compensated fourth waveform signal.
14. A signal processing method, comprising:
acquiring a first waveform signal by calling a first interface, wherein the first interface comprises a first parameter, and a parameter value of the first parameter is the first waveform signal;
eliminating a local oscillator leakage signal from a first waveform signal to obtain a second waveform signal, wherein the first waveform signal is output by a wave generator;
converting the second waveform signal to a third waveform signal in a target signal channel;
correcting the third waveform signal based on the mixing signal to obtain a fourth waveform signal;
outputting the compensated fourth waveform signal by calling a second interface, wherein the second interface comprises a second parameter, and a parameter value of the second parameter is the compensated fourth waveform signal;
the first waveform signal is obtained by detecting defects on the surface of a target object, the target object is a quantum chip to be detected, and the quantum chip comprises a fluxonium type qubit or a transmon type qubit.
15. A computer-readable storage medium, comprising a stored program, wherein the program, when executed by a processor, controls an apparatus in which the computer-readable storage medium is located to perform the method of any of claims 1-14.
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