CN114994371A

CN114994371A - Probe testing device

Info

Publication number: CN114994371A
Application number: CN202210518592.0A
Authority: CN
Inventors: 贺少波; 弗兰克·陈; 付文明; 石环
Original assignee: Exascend Technology Wuhan Co ltd
Current assignee: Exascend Technology Wuhan Co ltd
Priority date: 2022-05-12
Filing date: 2022-05-12
Publication date: 2022-09-02

Abstract

The invention relates to a probe testing device which comprises a mother board, a base, a rocker arm, a slider and a probe PCB, wherein the base is arranged on the upper side of the mother board, the rocker arm is arranged at one end of the base and is rotationally connected with the base, the slider is arranged at the other end of the base and is in sliding fit with the base, and the probe PCB is arranged in the middle below the rocker arm. The probe testing device provided by the invention has the beneficial effects that: rational in infrastructure, convenient operation has very high practical value, through the action of operation rocking arm and slider, drives probe PCB board and removes corresponding position, accomplishes the data connection when CFexpressTYPEA card inserts the card box test, withdraws from the data disconnection before the card box test at CFexpressTYPEA card, has accomplished a plug-in card many times and has tested, and can used repeatedly.

Description

Probe testing device

Technical Field

The invention relates to the field of probe testing, in particular to a probe testing device.

Background

There are three kinds of CFexpress memory cards on the market, i.e., type a, type b and type c, and the CFexpress type card is small, so that it is widely used in small cameras and devices, and the market demand is very large. When the CFexpress type a card is subjected to a production test, the CFexpress type a card needs to be subjected to a plug-in test for a plurality of times, and the CFexpress type a card is connected to a test terminal through a data line, so that data in the CFexpress type a card can be detected when the CFexpress type a card is inserted, and disconnection of the CFexpress type a card can be realized when the CFexpress type a card is extracted. In the prior art, the tester needs to repeatedly insert and extract the CFexpress type a card, which not only damages the interface of the CFexpress type a card, but also reduces the testing efficiency of the tester. Therefore, it is desirable to provide a probe test apparatus which has a simple structure and is convenient to operate, can realize data connection when a card is inserted into a connector for testing, can realize data disconnection before the card is withdrawn from the connector, and can be used repeatedly.

Disclosure of Invention

The embodiment of the invention provides a probe testing device, which aims to solve the technical problems that in the prior art, a CFexpress TypeA card needs to be repeatedly plugged and pulled, an interface of the CFexpress TypeA card is damaged, and the testing efficiency of testers is reduced.

On one hand, the embodiment of the invention provides a probe testing device which comprises a mother board, a base, a rocker arm, a sliding block and a probe PCB, wherein the base is arranged on the upper side of the mother board, the rocker arm is arranged at one end of the base and is rotationally connected with the base, the sliding block is arranged at the other end of the base and is in sliding fit with the base, and the probe PCB is arranged in the middle of the lower portion of the rocker arm.

In some embodiments, the probe PCB is connected through a screw, the probe PCB is provided with a probe in a connected mode, and one side, away from the rocker arm, of the probe PCB is provided with a probe PCB wiring harness connecting plug-in unit.

In some embodiments, a motherboard harness connector is fixedly arranged on one side of the motherboard far away from the probe PCB harness connector, and a data harness is arranged between the probe PCB harness connector and the motherboard harness connector and used for electrically connecting the probe PCB harness connector and the motherboard harness connector.

In some embodiments, the motherboard is provided with a probe socket in a penetrating manner, and a card box is further connected below the probe socket, and a CFexpress type a card is inserted in the card box.

In some embodiments, a protruding block is arranged at one end of the rocker arm, which is far away from the pin shaft, and a first arc-shaped surface is arranged at one side, which is close to the sliding block, below the protruding block; one side that the slider is close to the lug is established to 7 shapes, be used for with the lug joint, one side that the slider top is close to the lug is equipped with first inclined plane.

In some embodiments, the base is connected with the motherboard through screws, and the base is provided with a plurality of arc surfaces for preventing collision.

In some embodiments, a pin shaft is inserted into one end of the rocker arm, which is far away from the slider, the rocker arm is connected with the base through the pin shaft, a rocker arm spring is arranged between the rocker arm and the base, and the rocker arm spring is positioned on one side close to the pin shaft; and a slider spring is arranged between the slider and the base, and the slider is elastically connected with the base through the slider spring.

In some embodiments, a first circular groove is formed at a joint of the rocker arm and the rocker arm spring, a second circular groove is formed at a joint of the base and the rocker arm spring, the first circular groove and the second circular groove are used for fixing the rocker arm spring, and round guides are arranged at openings of the first circular groove and the second circular groove.

The technical scheme provided by the invention has the beneficial effects that: when the CFexpress Type A card needs to be detected, the rocker arm is pressed, at the moment, the first arc-shaped surface of the convex block moves downwards along the first inclined surface of the sliding block, meanwhile, the sliding block slides rightwards, when the convex block on the rocker arm moves into the 7-shaped bayonet on the sliding block, the sliding block slides leftwards under the action of the spring force of the sliding block, the 7-shaped bayonet of the sliding block clamps the convex block on the rocker arm, the CFexpress Type A card is inserted through the plug-in card box, after the CFexpress Type A card is inserted, the probe is contacted with the CFexpress Type A card, so that data on the CFexpress Type A card is transmitted to the probe PCB board wiring harness plug-in component through the probe, information on the probe PCB board wiring harness plug-in component is transmitted to the motherboard wiring harness connector through the data wiring harness, and finally the wiring harness connector transmits the information to the motherboard to realize data connection. When the required data is disconnected, the sliding block is pressed, the sliding block slides to one side far away from the rocker arm along the sliding block slide way, the rocker arm is bounced by the elastic force of the rocker arm spring, at the moment, the sliding block is loosened, the sliding block slides to one side close to the rocker arm along the sliding block slide way under the action of the elastic force of the slider spring, when the sliding block slides to the tail end of the sliding block slide way, the limiting block on the sliding block slide way blocks the sliding of the sliding block, the sliding block stops sliding, at the moment, the first arc-shaped surface of the protruding block is in contact with the first inclined surface of the sliding block, the rocker arm and the base form a certain angle, and a probe on the probe PCB can be far away from a probe socket on a mother board, at the moment, the CFexpress TypeA card is pulled out from the card box, and detection is completed. Through the operation, data connection can be realized when the card is inserted into the connector for testing, and before the card exits from the connector, data disconnection can be realized and the card can be repeatedly used.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a probe testing apparatus according to an embodiment of the present invention;

FIG. 2 is a cross-sectional view of a probe testing device according to an embodiment of the present invention;

FIG. 3 is a broken away cross-sectional view of a probe testing device according to an embodiment of the present invention;

in the figure: 1. CFexpress type a card; 2. a motherboard; 3. a probe; 4. a base; 5. a pin shaft; 6. a rocker spring; 7. a rocker arm; 8. a data harness; 9. a motherboard harness connector; 10. the probe PCB board is connected with the plug-in unit in a wiring harness mode; 11. a probe PCB board; 12. a slider; 13. a slider spring; 14. a screw; 15. a probe socket; 16. a card insertion box; 17. a bump; 18. a first arc-shaped face; 19. a first inclined plane; 20. a first circular groove; 21. a second circular groove.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.

The embodiment of the invention provides a probe testing device.

Referring to fig. 1 to 3, an embodiment of the invention provides a probe test apparatus,

including mother board 2, base 4, rocking arm 7, slider 12 and probe PCB board 11, base 4 is located 2 upsides of mother board, rocking arm 7 is located 4 one end of base, and with base 4 rotates to be connected, slider 12 is located the 4 other ends of base, slider 12 with 4 sliding fit of base, probe PCB board 11 is located 7 below middle parts of rocking arm.

Referring to fig. 3, when it is desired to inspect the CFexpress type a card 1, the rocker arm 7 is pressed, at which time the first arc-shaped surface 18 of the bump 17 moves downward along the first slope 19 of the slider 12, and at the same time, the slider 12 slides to the right, and when the bump 17 on the rocker arm 7 moves into the 7-shaped notch on the slider 12, the slider 12 slides to the left by the elastic force of the slider spring 13, and the 7-shaped notch of the slider 12 catches the bump 17 on the rocker arm 7, at which time, referring to fig. 2, the CFexpress type a card 1 is inserted through the card insertion box 16, and after the CFexpress type a card 1 is inserted, the probe 3 contacts the CFexpress type a card 1, see fig. 1, so that the data on the CFexpress type a card 1 is transmitted to the probe PCB harness connector 10 through the probe 3, and the information on the probe PCB harness connector 10 is transmitted to the motherboard harness 9 through the harness 9, and finally the motherboard harness 9 transmits the information to the motherboard 2, and realizing data connection. When data disconnection is needed, the sliding block 12 is pressed to enable the sliding block 12 to slide to one side far away from the rocker arm 7 along the sliding block slide way, the rocker arm 7 is bounced by the elastic force of the rocker arm spring 13, referring to fig. 2, a first circular groove 20 is arranged at the joint of the rocker arm 7 and the rocker arm spring 6, a second circular groove 21 is arranged at the joint of the base 4 and the rocker arm spring 6, the first circular groove 20 and the second circular groove 21 are used for fixing the rocker arm spring 6, and guide circles are arranged at openings of the first circular groove 20 and the second circular groove 21 and used for preventing collision between the rocker arm spring 6 and the base 4 and between the rocker arm 7. At this time, the slider 12 is released, the slider 12 slides to a side close to the rocker arm 7 along the slider slideway under the action of the elastic force of the slider spring 13, when the slider 12 slides to the tail end of the slider slideway, the stopper on the slider slideway blocks the sliding of the slider 12, the slider 12 stops, at this time, the first arc surface 18 of the bump 17 contacts with the first inclined surface 19 of the slider 12, so that the rocker arm 7 and the base 4 form a certain angle, and the probe 3 on the probe PCB 11 can be far away from the probe socket 16 on the motherboard 2, at this time, the CFexpress type a card 1 is pulled out from the card box 16, and the detection is completed.

In the description of the present invention, it should be noted that the terms "upper", "lower", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, which are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and operate, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

It is noted that, in the present invention, relational terms such as "first" and "second", and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

The foregoing are merely exemplary embodiments of the present invention, which enable those skilled in the art to understand or practice the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A probe test device is characterized in that: the method comprises the following steps:

the motherboard (2) comprises a base (4), and the base (4) is arranged on the upper side of the motherboard (2);

the rocker arm (7) is arranged at one end of the base (4), and the rocker arm (7) is rotatably connected with the base (4);

the sliding block (12) is arranged at the other end of the base (4), and the sliding block (12) is in sliding fit with the base (4);

probe PCB board (11), probe PCB board (11) are located rocking arm (7) below middle part.

2. A probe testing apparatus according to claim 1, wherein: probe PCB board (11) are connected through screw (14), it is equipped with probe (3) to connect on probe PCB board (11), the opposite side that rocking arm (7) were kept away from in probe PCB board (11) is equipped with probe PCB board pencil and connects plug-in components (10).

3. A probe testing apparatus according to any one of claims 1 to 2, wherein: one side of the motherboard (2) far away from the probe PCB board wiring harness connecting plug-in (10) is fixedly provided with a motherboard wiring harness connector (9), a data wiring harness (8) is arranged between the probe PCB board wiring harness connecting plug-in (10) and the motherboard wiring harness connector (9), and the data wiring harness (8) is used for electrically connecting the probe PCB board wiring harness connecting plug-in (10) and the motherboard wiring harness connector (9).

4. A probe testing apparatus according to claim 1, wherein: mother board (2) run through and are equipped with probe socket (15), still connect under probe socket (15) and be equipped with card box (16), card box (16) interpolation is equipped with CFexpress TYPE A card (1).

5. A probe testing apparatus according to claim 1, wherein: a convex block (17) is arranged at one end of the rocker arm (7) far away from the pin shaft (5), and a first arc-shaped surface (18) is arranged at one side below the convex block (17) and close to the sliding block (12); slider (12) are close to establish 7 shapes in one side of lug (17), be used for with lug (17) joint, one side that slider (12) top is close to lug (17) is equipped with first inclined plane (19).

6. A probe detection device according to claim 1, characterized in that the base (4) is connected to the motherboard (2) by means of screws (14), and the base (4) is provided with a plurality of circular arc surfaces for collision prevention.

7. The probe detection device according to claim 1, wherein a pin shaft (5) is inserted into one end of the rocker arm (7) far away from the slider (12), the rocker arm (7) is connected with the base (4) through the pin shaft (5), a rocker arm spring (6) is arranged between the rocker arm (7) and the base (4), and the rocker arm spring (6) is positioned on one side close to the pin shaft (5); a slider spring (13) is arranged between the slider (12) and the base (4), and the slider (12) is elastically connected with the base (4) through the slider spring (13).

8. The probe detection device according to claim 7, wherein a first circular groove (20) is formed at a joint of the rocker arm (7) and the rocker arm spring (6), a second circular groove (21) is formed at a joint of the base (4) and the rocker arm spring (6), the first circular groove (20) and the second circular groove (21) are used for fixing the rocker arm spring (6), and guide circles are arranged at openings of the first circular groove (20) and the second circular groove (21).