CN114994082A - A double-precision mark point graphic structure and recognition method - Google Patents
A double-precision mark point graphic structure and recognition method Download PDFInfo
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- CN114994082A CN114994082A CN202210738524.5A CN202210738524A CN114994082A CN 114994082 A CN114994082 A CN 114994082A CN 202210738524 A CN202210738524 A CN 202210738524A CN 114994082 A CN114994082 A CN 114994082A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N2021/95638—Inspecting patterns on the surface of objects for PCB's
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Abstract
Description
技术领域technical field
本发明涉及线路板印刷领域,尤其涉及一种双精度mark点图形结构及识别方法。The invention relates to the field of circuit board printing, in particular to a double-precision mark point graphic structure and an identification method.
背景技术Background technique
在PCB板上的元件安装完成后,通常需要利用mark点进行检查贴片精度,然而目前现有的mark点只能监控识别一种精度,无法满足两种精度要求,如果一块PCB板上的元件存在两种精度要求的元件,则需要制作两种精度的mark点去进行检查,检查是否满足了两种精度要求,从而过多的占用了PCB的空间,因此本发明提出了一种双精度mark点图形识别结构及识别方法,其可以识别两种精度,当一块PCB板上存在两种精度要求的元件时,无需增加另一种精度的mark点去进行识别另一种精度,通过本mark点即可同时识别两种精度要求,节省了PCB的空间,提高了PCB的空间利用率。After the components on the PCB are installed, it is usually necessary to use the mark points to check the patch accuracy. However, the existing mark points can only monitor and identify one accuracy, and cannot meet the two accuracy requirements. If there are components with two kinds of precision requirements, it is necessary to make two kinds of precision mark points to check whether the two kinds of precision requirements are met, which takes up too much space on the PCB. Therefore, the present invention proposes a double-precision mark. Point pattern recognition structure and recognition method, it can recognize two kinds of precision, when there are two kinds of precision requirements on a PCB board, there is no need to add another kind of mark point to identify another kind of precision, through this mark point The two precision requirements can be identified at the same time, which saves the space of the PCB and improves the space utilization of the PCB.
发明内容SUMMARY OF THE INVENTION
本发明所采用的技术方案为:一种双精度mark点图形结构,其特征在于,mark点由大圆环、小圆环和实心圆组成;所述大圆环、小圆环和实心圆三者同心,并且由内到外依次为:实心圆、小圆环、大圆环,且三者之间均不接触。The technical scheme adopted in the present invention is: a double-precision mark point graphic structure, characterized in that the mark point is composed of a large circle, a small circle and a solid circle; the large circle, the small circle and the solid circle are three They are concentric, and from the inside to the outside are: solid circle, small circle, large circle, and none of the three are in contact.
进一步地,所述实心圆直径大于0.1mm;所述小圆环外侧直径和内侧直径的差值大于0.15mm。Further, the diameter of the solid circle is greater than 0.1 mm; the difference between the outer diameter and the inner diameter of the small circular ring is greater than 0.15 mm.
进一步地,所述实心圆边缘至小圆环内侧边缘的距离大于0.2mm;所述小圆环外侧边缘至大圆环内侧边缘的距离大于0.2mm。Further, the distance from the solid circle edge to the inner edge of the small circle is greater than 0.2 mm; the distance from the outer edge of the small circle to the inner edge of the large circle is greater than 0.2 mm.
一种双精度mark点识别方法,包括如下步骤:A double-precision mark point recognition method, comprising the following steps:
S1.将大圆环内涂抹油墨层,并且覆盖住小圆环和实心圆;S1. Apply the ink layer to the large ring, and cover the small ring and the solid circle;
S2.对油墨层进行曝光;S2. Expose the ink layer;
S3.对曝光后的mark点进行观察,根据油墨层曝光后显影的位置,判断精度偏差。S3. Observe the mark points after exposure, and judge the accuracy deviation according to the position of the ink layer developed after exposure.
进一步地,曝光光源为圆环状,光源外侧边缘直径小于小圆环的外侧直径,且大于小圆环的内侧直径;光源内侧边缘直径小于实心圆直径。Further, the exposure light source is a circular ring, the diameter of the outer edge of the light source is smaller than the outer diameter of the small ring, and is larger than the inner diameter of the small ring; the diameter of the inner edge of the light source is smaller than the diameter of the solid circle.
由于本发明采用了上述技术方案,本发明具有的有益效果为:传统的mark点只能识别一种精度,如需识别另一种精度,则需要增加另一组mark点,而本发明所提出的mark点可同时识别两种精度,无需增加mark点,大大的节约了PCB空间。Because the present invention adopts the above-mentioned technical scheme, the present invention has the beneficial effects that the traditional mark points can only identify one kind of precision. The mark point can identify two kinds of precision at the same time, no need to increase the mark point, which greatly saves the PCB space.
附图说明Description of drawings
图1为本发明大圆环、小圆环和实心圆位置关系示意图。1 is a schematic diagram of the positional relationship between a large ring, a small ring and a solid circle in the present invention.
图2为本发明油墨涂层样式示意图。Figure 2 is a schematic diagram of the ink coating style of the present invention.
图3为本发明曝光光源样式示意图。FIG. 3 is a schematic diagram of the pattern of the exposure light source of the present invention.
图4为本发明mark点涂抹油墨层后示意图。FIG. 4 is a schematic diagram of the present invention after the mark point is coated with an ink layer.
图5为曝光光源与mark点各部分大小比例示意图。FIG. 5 is a schematic diagram of the size ratio of the exposure light source and each part of the mark point.
图6为本发明曝光后理想状态示意图。FIG. 6 is a schematic diagram of the ideal state after exposure of the present invention.
图7为本发明曝光后精度偏差大于0小于0.05mm时示意图。FIG. 7 is a schematic diagram of the present invention when the precision deviation after exposure is greater than 0 and less than 0.05 mm.
图8为本发明曝光后精度偏差等于0.05mm时示意图。8 is a schematic diagram of the present invention when the precision deviation after exposure is equal to 0.05mm.
图9为本发明曝光后精度偏差大于0.05mm小于0.075mm时示意图。9 is a schematic diagram of the present invention when the precision deviation after exposure is greater than 0.05mm and less than 0.075mm.
图10为本发明曝光后精度偏差等于0.075mm时示意图。10 is a schematic diagram of the present invention when the precision deviation after exposure is equal to 0.075mm.
图11为本发明曝光后精度偏差大于0.075mm时示意图。11 is a schematic diagram of the present invention when the precision deviation after exposure is greater than 0.075mm.
附图标记reference number
大圆环-1;小圆环-2;实心圆-3;油墨图层-4;油墨层实心圆-41;油墨层圆环-42。Large circle-1; small circle-2; filled circle-3; ink layer-4; ink layer filled circle-41; ink layer circle-42.
具体实施方式Detailed ways
实施例,在PCB贴片完成后,对PCB进行检查,检查其贴片精度是否达到要求,下面以当PCB板上同时存在0.05mm和0.075mm两种精度要求的贴片时,检查贴片精度进行举例;Example, after the PCB patch is completed, check the PCB to check whether the patch accuracy meets the requirements. The following is to check the patch accuracy when there are patches with two precision requirements of 0.05mm and 0.075mm on the PCB. give an example;
如图1-5所示,一种双精度mark点图形结构,mark点由大圆环、小圆环和实心圆组成;大圆环1、小圆环2和实心圆3三者同心,并且由内到外依次为:实心圆3、小圆环2、大圆环1,且三者之间均不接触;实心圆3直径大于0.1mm;小圆环2外侧直径和内侧直径的差值大于0.15mm,实心圆3边缘至小圆环2内侧边缘的距离大于0.2mm;小圆环2外侧边缘至大圆环1内侧边缘的距离大于0.2mm;As shown in Figure 1-5, a double-precision mark point graphic structure, the mark point consists of a large circle, a small circle and a solid circle; the
实心圆3直径0.7mm;小圆环2内径1.5mm,外径1.8mm;大圆环1内径3.4mm,外径4.0mm;油墨涂层4位于大圆环之内,覆盖住实心圆3和小圆环2,并且不超出大圆环1内径;The diameter of the
一种双精度mark点识别方法,识别方法如下:A double-precision mark point recognition method, the recognition method is as follows:
首先将油墨涂在mark点上,油墨图层4位于大圆环1内,覆盖住小圆环2和实心圆1,并且不超出大圆环1的内径;随后进行曝光处理,曝光光源的圆环形,内径为0.6mm,外径为1.65mm;First, apply the ink on the mark point, and the
在理想状态下时,曝光光源外侧边缘至小圆环外侧边缘的距离应为0.075mm。曝光光源内侧边缘至实心圆3边缘的距离应为0.05mm,此时进行曝光,曝光结束获得的图像应为图6所示,实心圆3边缘距离曝光结束后剩余的油墨层实心圆41边缘的距离应为0.05mm,小圆环2内侧边缘距离曝光结束后剩余的油墨层圆环42的内侧边缘距离应为0.075,此时表示曝光位于理想状态,没有出现偏差;Under ideal conditions, the distance from the outer edge of the exposure light source to the outer edge of the small ring should be 0.075mm. The distance from the inner edge of the exposure light source to the edge of the
当偏差大于0小于0.05mm时,获得的图像应为,如图7所示,实心圆3边缘至曝光结束后剩余的油墨层实心圆41边缘的最小距离小于0.05mm且大于0。When the deviation is greater than 0 and less than 0.05mm, the obtained image should be, as shown in Figure 7, the minimum distance from the edge of the
当偏差等于0.05mm时,获得的图像应为,如图8所示,实心圆3边缘至曝光结束后剩余的油墨层实心圆41相切,且油墨层实心圆41位于实心圆3内;When the deviation is equal to 0.05mm, the obtained image should be, as shown in Figure 8, the edge of the
当偏差大于0.05mm小于0.075mm时,获得的图像应为,如图9所示,油墨层实心圆41边缘超出实心圆3,并且油墨层圆环42内侧边缘位于小圆环2外侧边缘之内;When the deviation is greater than 0.05mm and less than 0.075mm, the obtained image should be, as shown in Figure 9, the edge of the
当偏差等于0.075mm时,获得的图像应为,如图10所示,油墨层圆环42的内侧边缘与小圆环2的外侧边缘相切,并且油墨层圆环42内侧边缘没有超出小圆环2的外侧边缘;When the deviation is equal to 0.075mm, the obtained image should be, as shown in Figure 10, the inner edge of the
当偏差大于0.075mm时,获得的图像应为,如图11所示,油墨层圆环42的内侧边缘超出小圆环2的外侧边缘;When the deviation is greater than 0.075mm, the obtained image should be, as shown in Figure 11, the inner edge of the
工作原理:当PCB板上同时存在0.05mm和0.075mm两种精度要求的元件时,对该PCB板进行检查两种精度要求的元件是否达全部到精度要求时,首先将该PCB板放置在用于对mark进行曝光的曝光机下,并以PCB板四周的的基准点为基准进行定位,定位完成后,启动曝光机对mark点进行曝光,曝光结束后,取出PCB板,放置到用于检查mark点的显微镜下,进行观察,判断其是否合格;举例说明:在PCB板上的两种元件精度要求分别为0.05mm和0.075mm时,曝光结束后,如果观察到的图像如图9或图10所示时,即油墨层实心圆41边缘超出实心圆3,并且油墨层圆环42内侧边缘位于小圆环2外侧边缘之内时,或者油墨层圆环42内侧边缘与小圆环2外侧边缘相切时,此时表示,精度偏差不大于0.075mm,即精度要求为0.075mm的元件合格,精度要求为0.05mm的元件不合格;如果观察到的图像中,如图6、图7、图8任意一个图中图形所示时,即表示,精度偏差不超过0.05mm,即为两种精度要求均满足;如果观察到的图像如图11所示时,即表示此时精度偏差大于0.075mm,两种不同精度要求的元件均不合格。Working principle: When there are two components with precision requirements of 0.05mm and 0.075mm on the PCB board, check whether the components with the two precision requirements meet the precision requirements on the PCB board. Under the exposure machine that exposes the mark, the positioning is based on the reference points around the PCB board. After the positioning is completed, the exposure machine is started to expose the mark points. After the exposure is completed, the PCB board is taken out and placed for inspection. Observe under the microscope at the mark point to judge whether it is qualified or not; for example: when the accuracy requirements of the two components on the PCB are 0.05mm and 0.075mm respectively, after exposure, if the observed image is as shown in Figure 9 or Figure 9 10, that is, when the edge of the
尽管上面已经示出和描述了本发明的实施例,可以理解的是,上述实施例是示例性的,不能理解为对本发明的限制,本领域的普通技术人员在本发明的范围内可以对上述实施例进行变化、修改、替换和变型。Although the embodiments of the present invention have been shown and described above, it should be understood that the above-mentioned embodiments are exemplary and should not be construed as limiting the present invention. Embodiments are subject to variations, modifications, substitutions and variations.
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