CN114993121A - System and method for measuring ignition resistance of electronic detonator - Google Patents

System and method for measuring ignition resistance of electronic detonator Download PDF

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Publication number
CN114993121A
CN114993121A CN202210460676.3A CN202210460676A CN114993121A CN 114993121 A CN114993121 A CN 114993121A CN 202210460676 A CN202210460676 A CN 202210460676A CN 114993121 A CN114993121 A CN 114993121A
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analog
firing
electronic detonator
measuring
voltage
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CN114993121B (en
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朱志明
武寿昌
金宝全
郑弘毅
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Shanghai Xinyang Technology Co ltd
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Shanghai Xinyang Technology Co ltd
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    • FMECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F42AMMUNITION; BLASTING
    • F42CAMMUNITION FUZES; ARMING OR SAFETY MEANS THEREFOR
    • F42C21/00Checking fuzes; Testing fuzes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/16Measuring impedance of element or network through which a current is passing from another source, e.g. cable, power line
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02DCLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00Reducing energy consumption in communication networks
    • Y02D30/70Reducing energy consumption in communication networks in wireless communication networks

Abstract

The invention provides a system and a method for measuring an ignition resistance of an electronic detonator, which are characterized by comprising an electronic detonator chip and a host; the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result; and the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor. The invention adopts a low-cost circuit structure to realize high measurement precision of the firing resistor, can avoid the problems of overlarge production process deviation of the firing resistance value or large oxidation resistance value due to overlong placing time, ensures that the resistance value is in an effective firing range, and avoids blind blasting during the actual explosion of the electronic detonator.

Description

System and method for measuring ignition resistance of electronic detonator
Technical Field
The invention relates to the technical field of ignition resistance measurement, in particular to a system and a method for measuring the ignition resistance of an electronic detonator. In particular, it preferably relates to a low-cost, highly reliable measurement method for the firing resistance of electronic detonators.
Background
The electronic detonator needs to perform self-checking on all functions before being used on site, wherein the self-checking of the firing resistor of the detonator is particularly important, because if the firing resistor is broken or the resistance value is increased due to oxidation and the like, the powder head cannot be normally ignited, so that detonators and explosives which are not detonated can be left on the blasting site. Mechanical equipment damage and even casualties are easily caused in the process of cleaning afterwards, so that the detonator ignition resistance needs to be detected, and the detonator with abnormal resistance is removed in advance.
Although some existing electronic detonator chips also have the function of detecting the resistance value of the firing resistor, some measuring schemes are too simple, and only the on-off of the resistor can be roughly measured; at present, there is a method for measuring resistance by directly using high-precision ADC (at least more than 16 bits ADC), which also achieves a precision of about 0.1ohm, but the circuit complexity and cost are much higher.
Chinese utility model patent publication No. CN213481151U discloses a resistance test circuit for an electronic detonator ignition bridgewire, which includes a main control unit, an analog channel switching circuit, a pre-circuit composed of a bridgewire sampling resistance and an amplifying circuit, and a power supply unit; the power supply unit respectively provides voltage for the analog channel switching circuit, the front circuit and the main control unit; the analog channel switching circuit is electrically connected with the front-end circuit and the main control unit in sequence; the analog channel switching circuit can output the voltage division voltage to the amplifying circuit for amplification and input the voltage-stabilized power supply to the bridge wire sampling resistor for voltage division.
Aiming at the related technologies, the inventor thinks that the existing electronic detonator chip can only roughly measure the on-off of the resistor, and has no way of detecting the small-range change of the resistance value caused by resistor oxidation and the like; some measurement schemes are too complex, because the resistance of the firing resistor is small, in order to accurately measure, a high-precision ADC is adopted for measurement, the circuit is complex, and the cost is too high.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a system and a method for measuring the firing resistance of an electronic detonator.
The invention provides a system for measuring the firing resistance of an electronic detonator, which comprises an electronic detonator chip and a host;
the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result;
and the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor.
Preferably, the electronic detonator chip comprises a current-limiting resistor, an analog-to-digital conversion circuit and an operational amplifier;
the current limiting resistor limits the current flowing through the firing resistor;
the ignition resistor generates a voltage signal by flowing current after current limiting;
the operational amplifier collects a voltage signal and amplifies the voltage signal by A0 times;
and the analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result D.
Preferably, the electronic detonator chip further comprises a communication circuit, a test control logic module, a first test switch and a second test switch;
the host machine sends a command of measuring the firing resistance;
the communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic module;
the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance;
and the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistance.
Preferably, the electronic detonator chip comprises a low-dropout linear voltage stabilizing circuit;
the low-dropout linear voltage stabilizing circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output low voltage of the low-dropout linear voltage stabilizing circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter.
Preferably, the first input end of the low dropout linear voltage stabilizing circuit forms a first input high-voltage end of the electronic detonator chip;
the second input end of the low-dropout linear voltage-stabilizing circuit forms a second input high-voltage end of the electronic detonator chip, and the second input high-voltage end of the resistor detonator chip is grounded;
the output end of the low-dropout linear voltage stabilizing circuit forms an output low-voltage end of the electronic detonator chip, and the output end of the low-dropout linear voltage stabilizing circuit is connected with one end of the current limiting resistor;
the other end of the current-limiting resistor is connected with the non-inverting input end of the operational amplifier and the drain electrode of the first test switch;
the first communication end of the communication circuit forms a first communication end of the electronic detonator chip;
the second communication end of the communication circuit forms a second communication end of the electronic detonator chip;
the instruction output port of the communication circuit is connected with the instruction input end of the test control logic module;
the analog-to-digital conversion result input end of the communication circuit is connected with the analog conversion result output end of the analog-to-digital conversion circuit;
the test signal output end of the test control logic module is respectively connected with the enable signal end of the analog-to-digital conversion circuit and the enable signal end of the operational amplifier;
a first starting signal end of the test control logic module is connected with a grid electrode of the first test switch;
a second starting signal end of the test control logic module is connected with a grid electrode of the second test switch;
the analog signal input end of the analog-to-digital conversion circuit is connected with the output end of the operational amplifier;
the inverting input end of the operational amplifier is connected with the source level of a second test switch, and the source level of the second test switch is grounded;
the source level of the first test switch forms a first measuring end of the electronic detonator chip;
the drain electrode of the second test switch forms a second measuring end of the electronic detonator chip;
the first test end and the second test end of the electronic detonator chip can be connected with the firing resistor.
Preferably, the host converts the analog-to-digital conversion result D into a corresponding voltage value V1:
Figure BDA0003621558160000031
operational amplifier input voltage V2:
Figure BDA0003621558160000032
current I on the measurement path:
Figure BDA0003621558160000033
wherein, R represents a current limiting resistor; r ds Representing the conduction resistance value of the test switch; r fire Represents the firing resistance;
voltage of firing resistor is satisfied
V2-I*(2*R ds )=I*R fire
And (3) calculating:
Figure BDA0003621558160000034
according to the method for measuring the firing resistance of the electronic detonator provided by the invention, a system for measuring the firing resistance of the electronic detonator is applied, and the method comprises the following steps:
an analog-to-digital conversion result acquisition step: the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result;
a host processing step: the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor.
Preferably, the step of obtaining the analog-to-digital conversion result includes the steps of:
a power supply step: the low-dropout linear voltage stabilizing circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output voltage of the low-dropout linear voltage stabilizing circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter;
a command sending step: the host computer sends a command for measuring the firing resistance;
a transmission step: the communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic module;
a wake-up step: the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance;
a signal generation step: the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistor, so that the current limiting resistor limits the current flowing through the firing resistor, and the firing resistor generates a voltage signal after the current limiting flows through the current;
a signal amplification step: the operational amplifier collects a voltage signal and amplifies the voltage signal by A0 times;
a signal conversion step: the analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result.
Preferably, in the host processing step,
the host computer converts the analog-to-digital conversion result D into a corresponding voltage value V1:
Figure BDA0003621558160000041
operational amplifier input voltage V2:
Figure BDA0003621558160000042
current I on the measurement path:
Figure BDA0003621558160000043
wherein, R represents a current limiting resistor; r is ds Representing the conduction resistance value of the test switch; r is fire Represents the firing resistance;
voltage of firing resistor is satisfied
V2-I*(2*R ds )=I*R fire
And (3) calculating:
Figure BDA0003621558160000044
preferably, the measuring method further comprises repeating the steps of: and repeating the step of obtaining the analog-to-digital conversion result and the step of processing by the host, and taking the average value of the resistance values of the ignition resistors measured for multiple times as the final resistance value of the ignition resistor.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention adopts a low-cost circuit structure to realize high measurement precision of the firing resistor, can avoid the problems of overlarge production process deviation of the firing resistance value or large oxidation resistance value due to overlong placing time, ensures that the resistance value is in an effective firing range, and avoids blind blasting during the actual explosion of the electronic detonator;
2. the current-limiting resistor is designed on the resistor test path in the electronic detonator chip, so that the current flowing through the resistor is extremely small (less than 1mA) during testing, and the firing resistor is prevented from igniting the explosive head;
3. according to the invention, a voltage signal of the firing resistor is amplified by adopting a differential operational amplifier, then the voltage signal is sampled by an analog-to-digital converter ADC (ADC not exceeding 8 bits), a resistance value is obtained after conversion of a measured value, and the measurement precision of the resistor is within 0.1 ohm.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a diagram showing the structure of the circuit of the present invention.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will aid those skilled in the art in further understanding the present invention, but are not intended to limit the invention in any manner. It should be noted that variations and modifications can be made by persons skilled in the art without departing from the concept of the invention. All falling within the scope of the present invention.
The embodiment of the invention discloses a system for measuring an ignition resistance of an electronic detonator, which comprises an electronic detonator chip and a host as shown in figure 1. The electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result. The host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor.
The electronic detonator chip comprises a low-dropout linear voltage stabilizing circuit, a communication circuit, a test control logic module, a first test switch, a second test switch, a current limiting resistor, an analog-to-digital conversion circuit and an operational amplifier.
The low dropout linear voltage regulator circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output low voltage of the low dropout linear voltage regulator circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter.
The host sends a measure firing resistance command.
And the communication circuit receives the command of measuring the ignition resistance and transmits the command of measuring the ignition resistance to the test control logic module.
And the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance.
And the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistance.
The current limiting resistor limits a current flowing through the firing resistor.
The firing resistor generates a voltage signal by passing the current limited by the current limiting resistor.
The operational amplifier collects the voltage signal and amplifies the voltage signal by a0 times.
The analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result D.
The first input end of the low-dropout linear voltage-stabilizing circuit forms a first input high-voltage end of the electronic detonator chip.
The second input end of the low-dropout linear voltage-stabilizing circuit forms a second input high-voltage end of the electronic detonator chip, and the second input high-voltage end of the resistance detonator chip is grounded.
The output end of the low-dropout linear voltage stabilizing circuit forms an output low-voltage end of the electronic detonator chip, and the output end of the low-dropout linear voltage stabilizing circuit is connected with one end of the current-limiting resistor.
The first input end and the second input end of the low dropout linear voltage stabilizing circuit can be connected with input high voltage; and the second input end of the low dropout linear voltage stabilizing circuit is grounded.
The other end of the current-limiting resistor is connected with the non-inverting input end of the operational amplifier and the drain electrode of the first test switch.
The first communication end of the communication circuit forms a first communication end of the electronic detonator chip.
And the second communication end of the communication circuit forms a second communication end of the electronic detonator chip.
The input first communication terminal and the second communication terminal of the communication circuit are each connectable to a bus.
And the instruction output port of the communication circuit is connected with the instruction input end of the test control logic module.
The analog-to-digital conversion result input end of the communication circuit is connected with the analog conversion result output end of the analog-to-digital conversion circuit.
And the test signal output end of the test control logic module is respectively connected with the enable signal end of the analog-to-digital conversion circuit and the enable signal end of the operational amplifier.
The first opening signal end of the test control logic module is connected with the grid electrode of the first test switch.
And a second starting signal end of the test control logic module is connected with the grid electrode of the second test switch.
The analog signal input end of the analog-to-digital conversion circuit is connected with the output end of the operational amplifier.
The inverting input end of the operational amplifier is connected with the source stage of the second test switch, and the source stage of the second test switch is grounded.
The source level of the first test switch forms a first measuring end of the electronic detonator chip.
And the drain electrode of the second test switch forms a second measuring end of the electronic detonator chip.
The first test end and the second test end of the electronic detonator chip can be connected with the firing resistor.
The host converts the analog-to-digital conversion result D into a corresponding voltage value V1:
Figure BDA0003621558160000061
operational amplifier input voltage V2:
Figure BDA0003621558160000062
measuring the current I on the path:
Figure BDA0003621558160000063
wherein, R represents a current limiting resistor; r ds Representing the conduction resistance value of the test switch; r fire Indicating the firing resistance.
Voltage of firing resistor is satisfied
V2-I*(2*R ds )=I*R fire
And (3) calculating:
Figure BDA0003621558160000071
the embodiment of the invention discloses a low-cost high-reliability measuring method for an electronic detonator ignition resistance, as shown in figure 1, a measuring system for the electronic detonator ignition resistance is applied, and the principle of ignition resistance measurement is explained according to the following steps: the method comprises the following steps: an analog-to-digital conversion result obtaining step: the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result. Host processing step: the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor. Repeating the steps: and repeating the step of obtaining the analog-to-digital conversion result and the step of processing by the host, and taking the average value of the resistance values of the ignition resistors measured for multiple times as the final resistance value of the ignition resistor.
The step of obtaining the analog-to-digital conversion result comprises the following steps: a power supply step: the low dropout linear voltage regulator circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output voltage of the low dropout linear voltage regulator circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter.
Specifically, the electronic detonator chip completes chip power-on through VDD and GND power supply, and outputs a stable low-voltage power supply VCC for supplying power to a circuit related to resistance measurement.
A command sending step: the host sends a measure firing resistance command. Specifically, the host sends a command for measuring firing resistance to the electronic detonator chip, starts a timer interrupt (an interrupt occurs after about 10 milliseconds), and waits for reading the sampling value of the analog-to-digital converter ADC. The host machine can be a detonation controller of the electronic detonator, and the MCU is adopted in the host machine to control the electronic detonator chip, typically as follows: STM32F103RCT6 of ST intentionally semiconductors. The English language of the MCU is called Microcontroller Unit, and the Chinese translation is a micro control Unit.
A transmission step: the communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic module. A wake-up step: and the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance.
Specifically, the electronic detonator chip receives an instruction, firstly wakes up the operational amplifier and the analog-to-digital converter through the test control logic, and waits for a period of time T and other circuits to be stable (T is about 1 millisecond). When the resistance test is not performed, the operational amplifier and the analog-to-digital converter are in a sleep state, and the circuit is generally required to be in a stable state when the circuit is awakened, so that 1ms is used for waiting for the circuit of the operational amplifier and the analog-to-digital converter to be stable. The communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic, and the test control logic wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance.
A signal generation step: the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistor, so that the current limiting resistor limits the current flowing through the firing resistor, and the firing resistor generates a voltage signal after the current limiting flows through the current limiting resistor. A signal amplification step: the operational amplifier collects the voltage signal and amplifies the voltage signal by a0 times.
Specifically, the electronic detonator chip controls two switches, namely an NMOS1 switch and an NMOS2 switch, to be closed, current flows through an ignition resistor R _ fire to generate a voltage signal, the voltage signal is amplified by A0 times through an operational amplifier, and the voltage signal enters an analog-to-digital converter (ADC). After the two NMOS switches are closed, the high-side voltage of the firing resistor enters the positive (+) input of the operational amplifier, and the low-side voltage input enters the negative (-) input of the operational amplifier. And the test control logic controls two switches of NMOS1 and NMOS2 to be closed according to the command of measuring the firing resistance.
A signal conversion step: the analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result. Specifically, the analog-to-digital converter ADC performs sampling of the signal and stores the result D in a register of the chip. The register is located inside the communication circuit and is part of the communication circuit to store the output result of the analog-to-digital converter ADC.
In the host processing step, the host is triggered by the timed interruption, and the host reads an ADC sampling value from an internal register of the electronic detonator chip.
The host converts the analog-to-digital conversion result D into a corresponding voltage value V1 (D is first converted into the corresponding voltage value):
Figure BDA0003621558160000081
VCC is the LDO output voltage inside the electronic detonator chip, is a determined value, and can be obtained from a user manual of the chip.
Operational amplifier input terminal voltage V2 (operational input terminal voltage):
Figure BDA0003621558160000082
where a0 is the amplification gain of the operational amplifier inside the electronic detonator chip, is a definite value and can be obtained from the user manual of the chip.
Measuring the current I on the path:
Figure BDA0003621558160000083
wherein, R represents a current limiting resistor; r ds Representing the conduction resistance value of the test switch; r is fire Represents the firing resistance; r, Rds is the current-limiting resistance inside the chip of the electronic detonator and the on-resistance of the NMOS tube, the first test switch and the second test switch have the same resistance value, and are determined values, which can be obtained from the user manual of the chip.
Firing resistor R _ fire (R) fire ) Voltage of (2) satisfies
V2-I*(2*R ds )=I*R fire
Thereby calculating:
Figure BDA0003621558160000091
in the repeating step, the above steps are repeated a plurality of times (the power supply step may not be included), resistance values are obtained a plurality of times, and an average value is calculated as a final ignition resistance value. This helps to eliminate certain measurement errors.
Wherein, VDD/GND: the chip inputs a high-voltage power supply, generally between 5 and 40V. Low dropout linear voltage regulator circuit: the conversion from a high-voltage power supply to a low-voltage power supply is realized, and the output of the low-voltage power supply is generally stabilized at 3V. The LDO is called low dropout regulator in english, and the chinese translation is a low dropout linear regulator, VDD denotes an input voltage (high voltage power supply) of the LDO, VCC denotes an output voltage (low voltage power supply) of the LDO, and GND denotes a ground terminal. Where VIN represents the input high voltage and GND represents ground. VOUT represents the output low voltage.
A communication circuit: communication with the host is accomplished through an external A, B bus. Wherein A and B represent two bus signals, DIN represents analog-to-digital conversion result input, DOUT represents received instruction, and output to test control logic.
And (3) testing the control logic: and the test command of the host is converted into corresponding control logic to control the closing of the two internal test switches NMOS1 and NMOS 2. The NMOS is called N-Metal-Oxide-Semiconductor, which is translated into N-type Metal-Oxide-Semiconductor, called NMOS transistor. NMOS1, NMOS 2: and testing the switch, wherein the testing is realized by an NMOS tube. When the circuit is implemented, two NMOS tubes are completely symmetrical, and the conduction resistance of the MOS tube is designed to be Rds which is 100 ohm. ohm stands for ohm. Where TEST represents the firing resistor TEST signal, and the high level is active. NMOS1_ OPEN indicates the test switch 1(NMOS transistor 1) on signal, active high. NMOS2_ OPEN represents the test switch 2(NMOS transistor 2) on signal, active high. DIN denotes a test command input, from the communication circuit DOUT.
An operational amplifier: the amplification function of the voltage signal on the resistor is realized, and the amplification factor is A0. Wherein, the ENABLE represents the operational amplifier ENABLE signal, and the high level is active. IN1 represents the operational amplifier positive terminal input. IN2 represents the op amp negative terminal input. A0 denotes the gain of the operational amplifier.
Analog-to-digital conversion circuit ADC: the analog signal output by the operational amplifier is converted into a digital signal, where the ADC is designed as an 8-bit ADC. The resistance can be measured at 1-10ohm, and the precision reaches 0.1 ohm. ADC is called Analog-to-Digital Converter in English, and Chinese translation is an Analog-to-Digital Converter. Current limiting resistor: and limiting the current flowing through the firing resistor on the measuring channel to be not more than 1 mA. The value of R is greater than 3 Kohm. Wherein, ENABLE represents the ENABLE signal of the analog-to-digital conversion circuit, and high level is effective. A represents the analog signal input and D represents the analog-to-digital conversion result output.
An ignition resistor: and the resistor is used for igniting and detonating the explosive head when the electronic detonator chip is detonated. Typically in the range of 1-10 ohm. Wherein VX represents the high-voltage end of the firing resistor, and VB represents the low-voltage end of the firing resistor.
The invention discloses a high-precision measuring method for an ignition resistance of an electronic detonator. The electronic detonator comprises an electronic detonator chip, a test switch and a current-limiting resistor are designed in a circuit of the electronic detonator chip, so that when the test switch is opened and enters a resistance measurement mode, the current flowing through the resistor is limited within a minimum range (typically not more than 1mA), the safety of resistance measurement is ensured, and the risk that the firing resistor detonates a explosive head is avoided. Meanwhile, aiming at the characteristic that the value range of the firing resistance value is limited (generally between 1ohm to 10 ohm) in the application of the electronic detonator, the measurement precision of the resistance can reach within 0.1ohm through a differential operational amplifier and a low-precision and low-cost analog-to-digital converter ADC (ADC not exceeding 8 bits). The circuit has simple structure and extremely low cost.
The current-limiting resistor is designed on a resistor test path in the electronic detonator chip, so that the current flowing through the resistor is extremely small (less than 1mA) during testing, and the firing resistor is prevented from igniting the explosive head. The voltage signal of the firing resistor is amplified by adopting a differential operational amplifier, then the voltage signal is sampled by an analog-to-digital converter ADC (ADC not more than 8 bits), the resistance value is obtained after the conversion of the measured value, and the measurement precision of the resistor is within 0.1 ohm.
The invention can realize the measurement of the resistance value of the firing resistor of the electronic detonator, and has the advantages of high precision, simple circuit structure and extremely low cost. Through the high-precision measurement of the ignition resistor, the electronic detonator with unqualified ignition resistor can be filtered out, including but not limited to overlarge production process deviation of the ignition resistor, too long standing time, large oxidation resistance value of the resistor and the like. The measuring method can be used in the production test of the electronic detonator, and can also be carried out before the on-site actual explosion, so that the firing resistance value of each electronic detonator used in the actual explosion is ensured to be within the effective firing range, and the blind shot is avoided.
In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.

Claims (10)

1. A measuring system for the firing resistance of an electronic detonator is characterized by comprising an electronic detonator chip and a host;
the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result;
and the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor.
2. The system for measuring the firing resistance of the electronic detonator according to claim 1, wherein the electronic detonator chip comprises a current limiting resistor, an analog-to-digital conversion circuit and an operational amplifier;
the current limiting resistor limits the current flowing through the firing resistor;
the ignition resistor generates a voltage signal by flowing current after current limiting;
the operational amplifier collects a voltage signal and amplifies the voltage signal by A0 times;
and the analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result D.
3. The system for measuring the firing resistance of the electronic detonator according to claim 2, wherein the electronic detonator chip further comprises a communication circuit, a test control logic module, a first test switch and a second test switch;
the host machine sends a command of measuring the firing resistance;
the communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic module;
the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance;
and the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistance.
4. The system for measuring the firing resistance of the electronic detonator according to claim 3, wherein the electronic detonator chip comprises a low dropout linear voltage regulator circuit;
the low dropout linear voltage regulator circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output low voltage of the low dropout linear voltage regulator circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter.
5. The system for measuring the firing resistance of the electronic detonator according to claim 4, wherein the first input end of the low dropout linear voltage regulating circuit constitutes a first input high voltage end of the electronic detonator chip;
the second input end of the low-dropout linear voltage stabilizing circuit forms a second input high-voltage end of the electronic detonator chip, and the second input high-voltage end of the resistance detonator chip is grounded;
the output end of the low-dropout linear voltage stabilizing circuit forms an output low-voltage end of the electronic detonator chip, and the output end of the low-dropout linear voltage stabilizing circuit is connected with one end of the current limiting resistor;
the other end of the current-limiting resistor is connected with the non-inverting input end of the operational amplifier and the drain electrode of the first test switch;
the first communication end of the communication circuit forms a first communication end of the electronic detonator chip;
the second communication end of the communication circuit forms a second communication end of the electronic detonator chip;
the instruction output port of the communication circuit is connected with the instruction input end of the test control logic module;
the analog-to-digital conversion result input end of the communication circuit is connected with the analog conversion result output end of the analog-to-digital conversion circuit;
the test signal output end of the test control logic module is respectively connected with the enable signal end of the analog-to-digital conversion circuit and the enable signal end of the operational amplifier;
a first starting signal end of the test control logic module is connected with a grid electrode of the first test switch;
a second starting signal end of the test control logic module is connected with a grid electrode of the second test switch;
the analog signal input end of the analog-to-digital conversion circuit is connected with the output end of the operational amplifier;
the inverting input end of the operational amplifier is connected with the source stage of a second test switch, and the source stage of the second test switch is grounded;
the source level of the first test switch forms a first measuring end of the electronic detonator chip;
the drain electrode of the second test switch forms a second measuring end of the electronic detonator chip;
the first test end and the second test end of the electronic detonator chip can be connected with the firing resistor.
6. The system for measuring the firing resistance of the electronic detonator according to claim 4, wherein the host computer converts the analog-to-digital conversion result D into a corresponding voltage value V1:
Figure FDA0003621558150000021
operational amplifier input voltage V2:
Figure FDA0003621558150000022
measuring the current I on the path:
Figure FDA0003621558150000023
wherein, R represents a current limiting resistor; r ds Representing the conduction resistance value of the test switch; r fire Represents the firing resistance;
voltage of firing resistor is satisfied
V2-I*(2*R ds )=I*R fire
And (3) calculating:
Figure FDA0003621558150000024
7. a method for measuring the firing resistance of an electronic detonator, which is characterized by applying the system for measuring the firing resistance of the electronic detonator according to any one of claims 1 to 6, and comprises the following steps:
an analog-to-digital conversion result obtaining step: the electronic detonator chip processes the firing resistor to obtain an analog-to-digital conversion result;
host processing step: the host machine processes the analog-to-digital conversion result to obtain the resistance value of the firing resistor.
8. The method for measuring the firing resistance of the electronic detonator according to claim 7, wherein the analog-to-digital conversion result obtaining step comprises the steps of:
a power supply step: the low-dropout linear voltage stabilizing circuit receives input high voltage and converts the input high voltage into output low voltage VCC, and the output voltage of the low-dropout linear voltage stabilizing circuit can supply power to the test control logic module, the operational amplifier and the analog-to-digital converter;
a command sending step: the host computer sends a command for measuring the firing resistance;
a transmission step: the communication circuit receives the command of measuring the firing resistance and transmits the command of measuring the firing resistance to the test control logic module;
a wake-up step: the test control logic module wakes up the operational amplifier and the analog-to-digital converter according to the command of measuring the firing resistance;
a signal generation step: the test control logic module controls the first test switch and the second test switch to be closed according to the command of measuring the firing resistor, so that the current limiting resistor limits the current flowing through the firing resistor, and the firing resistor generates a voltage signal after the current limiting flows through the current;
a signal amplification step: the operational amplifier collects a voltage signal and amplifies the voltage signal by A0 times;
a signal conversion step: the analog-to-digital converter processes the amplified voltage signal to obtain an analog-to-digital conversion result.
9. The method for measuring the firing resistance of an electronic detonator according to claim 8, wherein in the host processing step,
the host computer converts the analog-to-digital conversion result D into a corresponding voltage value V1:
Figure FDA0003621558150000031
operational amplifier input voltage V2:
Figure FDA0003621558150000032
measuring the current I on the path:
Figure FDA0003621558150000033
wherein, R represents a current limiting resistor; r ds Representing the conduction resistance value of the test switch; r fire Represents the firing resistance;
voltage of firing resistor is satisfied
V2-I*(2*R ds )=I*R fire
And (3) calculating:
Figure FDA0003621558150000034
10. the method of measuring firing resistance of an electronic detonator as claimed in claim 7, further comprising repeating the steps of: and repeating the step of obtaining the analog-to-digital conversion result and the step of processing by the host, and taking the average value of the resistance values of the ignition resistors measured for multiple times as the final resistance value of the ignition resistor.
CN202210460676.3A 2022-04-28 2022-04-28 System and method for measuring ignition resistance of electronic detonator Active CN114993121B (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11190600A (en) * 1997-12-26 1999-07-13 Toyotomi Kogyo Kk Electric detonator with electronic-type delay circuit and blasting method using it
CN101666595A (en) * 2009-09-08 2010-03-10 北京维深数码科技有限公司 Control chip of digital electronic detonator
CN107132408A (en) * 2017-06-28 2017-09-05 同济大学 Commercial electric detonator tube resistor safety instrumentation and method
CN207717850U (en) * 2017-12-22 2018-08-10 新疆雪峰科技(集团)股份有限公司 The firing voltage tester of head of electronic detonator
CN111207634A (en) * 2020-03-18 2020-05-29 融硅思创(北京)科技有限公司 Digital electronic detonator chip with resistance detection function and resistance detection method
CN213481151U (en) * 2020-10-27 2021-06-18 东莞市安林电子有限公司 Resistance test circuit of electronic detonator ignition bridge wire

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11190600A (en) * 1997-12-26 1999-07-13 Toyotomi Kogyo Kk Electric detonator with electronic-type delay circuit and blasting method using it
CN101666595A (en) * 2009-09-08 2010-03-10 北京维深数码科技有限公司 Control chip of digital electronic detonator
CN107132408A (en) * 2017-06-28 2017-09-05 同济大学 Commercial electric detonator tube resistor safety instrumentation and method
CN207717850U (en) * 2017-12-22 2018-08-10 新疆雪峰科技(集团)股份有限公司 The firing voltage tester of head of electronic detonator
CN111207634A (en) * 2020-03-18 2020-05-29 融硅思创(北京)科技有限公司 Digital electronic detonator chip with resistance detection function and resistance detection method
CN213481151U (en) * 2020-10-27 2021-06-18 东莞市安林电子有限公司 Resistance test circuit of electronic detonator ignition bridge wire

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