CN114978251B - Phase shifter and base station test system - Google Patents

Phase shifter and base station test system Download PDF

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Publication number
CN114978251B
CN114978251B CN202110201729.5A CN202110201729A CN114978251B CN 114978251 B CN114978251 B CN 114978251B CN 202110201729 A CN202110201729 A CN 202110201729A CN 114978251 B CN114978251 B CN 114978251B
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China
Prior art keywords
wiring layer
metal wiring
phase
combiners
network circuit
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CN202110201729.5A
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CN114978251A (en
Inventor
李敬华
王世华
屈红亮
高军
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Datang Mobile Communications Equipment Co Ltd
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Datang Mobile Communications Equipment Co Ltd
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B7/00—Radio transmission systems, i.e. using radiation field
    • H04B7/02—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
    • H04B7/04—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
    • H04B7/0413—MIMO systems
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01Q—ANTENNAS, i.e. RADIO AERIALS
    • H01Q3/00—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system
    • H01Q3/26—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the relative phase or relative amplitude of energisation between two or more active radiating elements; varying the distribution of energy across a radiating aperture
    • H01Q3/30—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the relative phase or relative amplitude of energisation between two or more active radiating elements; varying the distribution of energy across a radiating aperture varying the relative phase between the radiating elements of an array
    • H01Q3/34—Arrangements for changing or varying the orientation or the shape of the directional pattern of the waves radiated from an antenna or antenna system varying the relative phase or relative amplitude of energisation between two or more active radiating elements; varying the distribution of energy across a radiating aperture varying the relative phase between the radiating elements of an array by electrical means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B17/00—Monitoring; Testing
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B7/00—Radio transmission systems, i.e. using radiation field
    • H04B7/02—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas
    • H04B7/04—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas
    • H04B7/06—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station
    • H04B7/0613—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission
    • H04B7/0615—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission of weighted versions of same signal
    • H04B7/0617—Diversity systems; Multi-antenna system, i.e. transmission or reception using multiple antennas using two or more spaced independent antennas at the transmitting station using simultaneous transmission of weighted versions of same signal for beam forming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L5/00—Arrangements affording multiple use of the transmission path
    • H04L5/14—Two-way operation using the same type of signal, i.e. duplex
    • H04L5/1415—Two-way operation using the same type of signal, i.e. duplex using control lines
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
    • Y02D30/00—Reducing energy consumption in communication networks
    • Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks

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  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Variable-Direction Aerials And Aerial Arrays (AREA)

Abstract

The embodiment of the invention provides a phase shifter and a base station test system, and relates to the technical field of communication. The phase shifter includes: m signal input circuits, N signal output circuits, and a phase shift network circuit disposed between the signal input circuits and the signal output circuits; m and N are integer multiples of 2; the phase-shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the phase-shifting network circuit is determined based on a plurality of different beam forming angles included in the test requirement, and the strip lines are in one-to-one correspondence with the beam forming angles; wherein, each signal input circuit is connected with the input of one power divider respectively; the output of each power divider is respectively connected with the input of a combiner; the output of each combiner is respectively connected with a signal output circuit. The structure of the phase shifter can be simplified on the basis of saving cost.

Description

Phase shifter and base station test system
Technical Field
The present invention relates to the field of communications technologies, and in particular, to a phase shifter and a base station testing system.
Background
The mobile communication system has been developed to the 5 th generation, i.e., the 5G communication system. The 5G communication system employs array antennas to implement beamforming and multiple-input multiple-output (Multiple Input Multiple Output, MIMO) modes. Parallel transmission of multiple paths of data streams can be realized through a large-scale MIMO mode, spatial multiplexing gain is obtained, and transmission effectiveness is improved. And the combination of a plurality of sub-channel signals can be realized, the space diversity gain is obtained, and the reliability of transmission is improved.
To verify the performance of a 5G communication system employing beamforming and MIMO modes, MIMO base station systems may be tested in a laboratory using a conduction test method. The transmission path between the base station and the terminal in the MIMO base station system is simulated through the phase shifter, and the base station communicates with the terminal through the phase shifter, so that test data are obtained.
At present, the transmission path of the MIMO base station system can be simulated through an active phase shifter, but the active phase shifter comprises an attenuator, a phase shifting device and the like, and has a complex structure and high required cost.
Disclosure of Invention
The embodiment of the invention aims to provide a phase shifter and a base station test system, so that the structure of the phase shifter is simplified on the basis of saving cost. The specific technical scheme is as follows:
in a first aspect, embodiments of the present application provide a phase shifter, including: m signal input circuits, N signal output circuits, and a phase shift network circuit disposed between the signal input circuits and the signal output circuits; m and N are integer multiples of 2;
the phase-shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines are in one-to-one correspondence with the beam forming angles; the power divider is a 1-division N power divider, and the combiner is an M-combination 1 combiner;
wherein, each signal input circuit is connected with the input of one power divider respectively; the output of each power divider is respectively connected with the input of a combiner; the output of each combiner is respectively connected with a signal output circuit.
In one possible implementation manner, the M signal input circuits, the N signal output circuits, the M power splitters and the N combiners are all located on a first metal wiring layer of a printed circuit board PCB;
the strip line is located on the first metal wiring layer and the second metal wiring layer of the PCB, a via hole is formed in the first metal wiring layer, and the via hole is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
In one possible implementation, the M power splitters are sequentially arranged on one side of the first metal wiring layer, N combiners are sequentially arranged on the other side of the first metal wiring layer, and the M power splitters are located opposite to the N combiners.
In one possible implementation manner, the via hole on the first metal wiring layer near the power divider and the via hole on the first metal wiring layer near the combiner are symmetrically arranged relative to a first central line, where the first central line is a central line between a column where M power dividers are located and a column where N combiners are located on the first metal wiring layer.
In one possible implementation, the phase shift network circuit includes M/2 power splitters sequentially arranged on one side of the first metal wiring layer, and another M/2 power splitters sequentially arranged on the other side of the first metal wiring layer;
the N combiners are sequentially arranged between the two rows of power splitters, half of input ports of each combiner face to one power splitter, and the other half of input ports face to the other power splitter.
In one possible implementation manner, the N combiners are sequentially arranged on the second centerlines of the two columns of power splitters; or, the N combiners are staggered with respect to the second center line.
In one possible implementation, the vias on both sides of each combiner on the first metal wiring layer are symmetrically arranged with respect to the second center line.
In a second aspect, embodiments of the present application provide a phase shifter, including: m first diplexers, N second diplexers, and an uplink phase shift network circuit and a downlink phase shift network circuit arranged between the M first diplexers and the N second diplexers, wherein M and N are integer multiples of 2;
the uplink phase-shifting network circuit comprises M combiners, N power splitters and M multiplied by N strip lines between the M combiners and the N power splitters, wherein the length of each strip line included in the uplink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the uplink phase-shifting network circuit are in one-to-one correspondence with the beam forming angles; the uplink phase-shifting network circuit comprises a combiner which is an N-in-1 combiner, and the uplink phase-shifting network circuit comprises a power divider which is a 1-division M power divider;
the downlink phase-shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the downlink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the downlink phase-shifting network are in one-to-one correspondence with the beam forming angles; the power divider included in the downstream phase-shifting network circuit is a 1-to-N power divider, and the combiner included in the downstream phase-shifting network circuit is an M-to-1 combiner;
each first duplexer is respectively connected with the input of one power divider in the uplink phase-shifting network circuit, the output of each power divider is respectively connected with the input of one combiner, and the output of each combiner is respectively connected with one second duplexer;
each second diplexer is respectively connected to the input of one power divider in the downlink phase-shifting network circuit, the output of each power divider is respectively connected to the input of one combiner, and the output of each combiner is respectively connected to one first diplexer.
In one possible implementation manner, the M first duplexers, the N second duplexers, the M combiners and the N power splitters included in the uplink phase-shifting network circuit, and the M power splitters and the N combiners included in the downlink phase-shifting network circuit are all located on the first metal wiring layer of the printed circuit board PCB;
the strip line is located on the first metal wiring layer and the second metal wiring layer of the PCB, a via hole is formed in the first metal wiring layer, and the via hole is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
In one possible implementation manner, in the upstream phase shift network circuit, the M combiners are sequentially arranged on one side of the first metal wiring layer, and the N power splitters are sequentially arranged on the other side of the first metal wiring layer; or, M/2 combiners are sequentially arranged on one side of the first metal wiring layer, another M/2 combiners are sequentially arranged on the other side of the first metal wiring layer, and the N power splitters are sequentially arranged on the central lines of the two rows of combiners or staggered relative to the central lines of the two rows of combiners;
in the downstream phase shift network circuit, the M power splitters are sequentially arranged on one side of the first metal wiring layer, and the N combiners are sequentially arranged on the other side of the first metal wiring layer; or, M/2 power splitters are sequentially arranged on one side of the first metal wiring layer, and M/2 power splitters are sequentially arranged on the other side of the first metal wiring layer, and the N combiners are sequentially arranged on the central lines of the two rows of power splitters or staggered relative to the central lines of the two rows of power splitters.
In a third aspect, an embodiment of the present application provides a base station testing system, where the system includes a test base station, a plurality of test terminals, and a phase shifter according to the second aspect;
the M radio frequency channels of the test base station are connected with the M first duplexers of the phase shifter one by one, and the radio frequency channels of the plurality of test terminals are connected with the N second duplexers of the phase shifter one by one.
By adopting the technical scheme, the phase shifter comprises M signal input circuits, N signal output circuits and a phase shifting network circuit, wherein the phase shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners. The phase shifter in the embodiment of the application can be seen to comprise a simple circuit, and the length of the strip line is set based on the test requirement, so that a plurality of beam forming angles required by the test can be realized, the complex structural design is not needed, devices such as an attenuator are not needed, the structure is simple, and the cost is low.
Of course, it is not necessary for any one product or method of practicing the invention to achieve all of the advantages set forth above at the same time.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are necessary for the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention and that other embodiments may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of an array antenna beam forming principle provided in an embodiment of the present application;
fig. 2 is a schematic diagram of a MIMO mode according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a phase shifter according to an embodiment of the present disclosure;
fig. 4 is an exemplary schematic diagram of a phase shifting network circuit according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of a phase shift network circuit according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of another phase shifting network circuit according to an embodiment of the present disclosure;
fig. 7 is a schematic structural diagram of another phase shifting network circuit according to an embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of another phase shifting network circuit according to an embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of another phase shifter according to an embodiment of the present disclosure;
fig. 10 is an exemplary schematic diagram of a structure of a phase shifter according to an embodiment of the present application.
Detailed Description
The following description of the technical solutions in the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings in the embodiments of the present application, and it is apparent that the described embodiments are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The term "plurality" in the embodiments of the present application means two or more, and other adjectives are similar thereto.
In the prior art, in order to verify the performance of a 5G communication system employing beamforming and MIMO modes, a test may be performed by a conduction test method. The current conduction test method adopts an active phase shifter to simulate transmission multipath of MIMO, and can realize beam forming of any angle through the active phase shifter, but the active phase shifter has complex structure, higher cost and more complex use, and calibration operation is needed before use. Therefore, the embodiment of the application provides the phase shifter and the base station test system, and the phase shifter is a passive fixed phase shifter, and has the advantages of simple structure, low cost and no need of calibration before use.
The 5G system implements a MIMO mode using an array antenna of a frequency division duplex (frequency division duplex, FDD) base station, and the principle of beamforming of the array antenna is shown in fig. 1. Taking a linear array as an example, one array antenna includes n antenna elements, and the distance between adjacent antenna elements is d. In order for the array antenna to generate a shaped beam pointing at an angle θ, it is necessary to make the phase difference between radio frequency signals of each antenna unit be Φ, Φ=2ρd×sin θ/λ. Where λ is the wavelength.
Based on the principle shown in fig. 1, an array antenna pattern test can be performed. The array antenna pattern test refers to inputting radio frequency signals with different amplitudes and phases for different antenna units, so that the array antenna generates beams with different directions, signal intensity in each direction of space can be obtained through antenna pattern measurement, further, a relation diagram of two-dimensional or three-dimensional radiation signal intensity and azimuth is drawn, and the relation diagram is compared with a simulation result, so that the performance of the 5G communication system can be determined.
The principle of the MIMO mode is shown in fig. 2, taking a 2x2 multi-user MIMO system as an example, the number of antenna output ports at the base station side is 2, the number of antenna input ports at the terminal is 2, and the number of transmission multipaths between the base station and the terminal is the product of the number of antenna output ports at the base station and the number of antenna input ports at the terminal, that is, 2x2.
Let the received signal vector be y, the transmitted signal vector be x, and the MIMO system space transfer function be h, then y=h×x, and properly design the transmitted signal vector, so that the terminal 1 can only receive the signal that the base station needs to send to the terminal 1, and the terminal 2 only receives the signal that the base station needs to send to the terminal 2. Reference is made to the description in the related art for specific implementation principles.
In the embodiment of the present application, the phase shifter may simulate transmission multipath between the base station and the terminal, and the phase shifter provided in the embodiment of the present application is described in detail below.
As shown in fig. 3, an embodiment of the present application provides a phase shifter including: m signal input circuits, N signal output circuits, and a phase shift network circuit disposed between the signal input circuits and the signal output circuits; wherein M and N are integer multiples of 2.
As an example, M may be the same number of antenna interfaces of the base station, and N may be the same number of antenna interfaces of the terminal.
The phase-shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines correspond to the beam forming angles one by one.
The power divider is a 1-division N power divider, and the combiner is an M-combination 1 combiner. The 1-division N power divider can be formed by combining a plurality of 1-division 2 power dividers, and the M-in-1 combiner can be formed by combining a plurality of 2-in-1 combiners.
Taking the values of M and N as 4 as an example, the phase shift network circuit in fig. 3 is shown in fig. 4, and the phase shift network circuit includes 4 1-division-4 power splitters, 4-combination-1 combiners, and 4×4 striplines.
Wherein, each signal input circuit is connected with the input of one power divider respectively; the output of each power divider is respectively connected with the input of a combiner; the output of each combiner is respectively connected with a signal output circuit.
By adopting the technical scheme, the phase shifter comprises M signal input circuits, N signal output circuits and a phase shifting network circuit, wherein the phase shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners. The phase shifter in the embodiment of the application can be seen to comprise a simple circuit, and the length of the strip line is set based on the test requirement, so that a plurality of beam forming angles required by the test can be realized, the complex structural design is not needed, devices such as an attenuator are not needed, the structure is simple, and the cost is low.
In one embodiment of the present application, the entity of the phase shifter is a printed circuit board (Printed Circuit Board, PCB). The M signal input circuits, the N signal output circuits, the M power splitters and the N combiners are all positioned on a first metal wiring layer of the printed circuit board PCB;
the strip line is positioned on a first metal wiring layer and a second metal wiring layer of the PCB, and the first metal wiring layer is provided with a via hole which is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
Wherein, the PCB is 4-layer board, and wherein top layer and bottom are the reference layer, and two middle layers are metal wiring layer, and two middle layers are one of them is above-mentioned first metal wiring layer, and another layer is above-mentioned second metal wiring layer.
The embodiment of the application provides two kinds of M power splitters, N combiners, and distribution modes of m×n strip lines between the M power splitters and the N combiners in a PCB, which are described below.
In the first distribution manner, as shown in fig. 5, M power splitters are sequentially arranged on one side of the first metal wiring layer, N combiners are sequentially arranged on the other side of the first metal wiring layer, and the M power splitters are opposite to the N combiners. For example, M power splitters are sequentially arranged on the left side of the first metal wiring layer, and correspondingly, N combiners are sequentially arranged on the right side of the first metal wiring layer.
In fig. 5, M and N are both 4, and fig. 5 includes 4 1-division-4 power splitters and 4-combination-1 combiners, where each 1-division-4 power splitter includes 3 1-division-2 power splitters, and each 4-combination-1 combiner includes 3 2-combination-1 combiners.
All of the lateral lines shown in fig. 5 are located on the first metal wiring layer, the vertical lines are located on the second metal wiring layer, and the turning points between the lateral lines and the vertical lines are vias on the first metal wiring layer.
In this embodiment of the present application, the via hole on the first metal wiring layer near the power divider side and the via hole on the combiner side are symmetrically disposed with respect to the first center line. The first central line is a central line between a column where M power splitters are located and a column where N combiners are located on the first metal wiring layer.
Referring to fig. 5, the first center line is the center line between the column in which the 4 power splitters on the left side are located and the column in which the 4 power splitters on the right side are located.
The conventional wiring manner is to make a complete strip line between two rf ports on the same metal layer of the PCB, and for the 4x4 ports, as shown in fig. 6, if a conventional wiring scheme is adopted, 4 metal wiring layers are required, the strip line connected to each combiner is located on 1 metal wiring layer, for example, in fig. 6, 4 strip lines connected to the first combiner are located on the first metal wiring layer, 4 strip lines connected to the second combiner are located on the second metal wiring layer, 4 strip lines connected to the third combiner are located on the third metal wiring layer, and 4 strip lines connected to the fourth combiner are located on the fourth metal wiring layer. For PCBs comprising 4 metal routing layers, 5 reference layers are typically also included, i.e. it is required to be implemented with a 9-layer PCB. In this application embodiment, connect a complete stripline through setting up the via hole, then only need 2 layers metal wiring layer and 2 layers reference layer, can realize in 9 layers PCB through 4 layers PCB, practiced thrift the cost.
In the technical scheme, through symmetrically arranging the via hole on the first metal wiring layer, which is close to the power divider, and the via hole on the first metal wiring layer, which is close to the combiner, relative to the first central line, the insertion loss and the phase shift caused by the via hole can be offset, and the influence of the via hole on the performance of the phase shifter is avoided.
In the second distribution manner, as shown in fig. 7 and 8, the phase shift network circuit includes M/2 power splitters sequentially arranged on one side of the first metal wiring layer, and M/2 power splitters sequentially arranged on the other side of the first metal wiring layer; the N combiners are sequentially arranged between the two rows of power splitters, and half of input ports of each combiner face to one power splitter and the other half of input ports face to the other power splitter.
The N combiners are sequentially arranged on the second central lines of the two rows of power splitters; or, the N combiners are staggered with respect to the second center line. The through holes on two sides of each combiner on the first metal wiring layer are symmetrically arranged relative to the second central line.
Referring to fig. 7, in fig. 7, taking M and N as 4 as examples, the left side in fig. 7 includes two 1-to-4 power splitters, the right side includes two 1-to-4 power splitters, and the second center line of the two columns of power splitters includes 4-to-1 combiners.
The connection lines shown in fig. 7 are strip lines between the power divider and the combiner, fig. 7 is only a schematic diagram, in an actual PCB, the length relationship of each strip line is not limited to the length relationship shown in fig. 7, and each strip line is not limited to a straight line, for example, the length of each strip line can meet the test requirement by bending or the like.
Referring to fig. 8, in fig. 8, taking M and N as 4 as examples, the left side in fig. 8 includes two 1-to-4 power splitters, the right side includes two 1-to-4 power splitters, and 4-to-1 combiners are staggered with respect to the second center line of the two columns of power splitters.
The connection lines shown in fig. 8 are strip lines between the power divider and the combiner, fig. 8 is only a schematic diagram, and in an actual PCB, the length relationship of each strip line is not limited to the length relationship shown in fig. 8. The distance of each combiner from the second center line can be adjusted in fig. 8 so that each strip line meets the test requirement.
In this application embodiment, through making N combiner arrange in order between two rows of merit divides the ware, and the merit divides the ware towards one side of half input port of every combiner, and half input port is towards the merit of opposite side divides the ware in addition, can reduce the transversal line and the vertical line turn between merit divide ware and the combiner, reduce the via hole quantity, and can reduce the wiring degree of difficulty, save the PCB area, further reduce cost.
In addition, through the mode that makes each combiner staggered arrangement for the second central line for the length of each stripline accords with the test demand, can reduce the bending of stripline, has reduced the wiring difficulty.
In the above embodiments of the present application, the combiner and the power divider are relative concepts, and if the input of the power divider is taken as the output and the output of the power divider is taken as the input, the power divider can be taken as the combiner.
The phase shift network circuit may be an uplink phase shift network circuit or a downlink phase shift network circuit, for example, the phase shift network circuits shown in fig. 5 to 8 may be used as the downlink phase shift network circuit, and if the combiner shown in fig. 5 to 8 is used as the power divider and the power divider shown in fig. 5 to 8 is used as the combiner, the phase shift network circuit may be used as the uplink phase shift network circuit.
The uplink from the test terminal to the test base station can be measured by a phase shifter comprising an uplink phase shifting network circuit, and the downlink from the test base station to the test terminal can be measured by a phase shifter comprising a downlink phase shifting network circuit.
In fig. 5 to 8, channels A1, A2, A3 and A4 are four radio frequency channels of the test base station, and channels B1, B2, B3 and B4 are four radio frequency channels of the test terminal.
In another embodiment of the present application, a base station testing system is also provided, which includes a test base station, a plurality of test terminals, and the phase shifter described above.
The test base station comprises a test base station, a phase shifter, a plurality of test terminals, a plurality of signal input circuits, a plurality of signal output circuits and a plurality of test terminals, wherein the M radio frequency channels of the test base station are connected with the M signal input circuits of the phase shifter one by one, and the radio frequency channels of the plurality of test terminals are connected with the N signal output circuits of the phase shifter one by one.
In order to measure uplink and downlink simultaneously, another phase shifter is provided in the embodiments of the present application, and as shown in fig. 9, the phase shifter includes M first duplexers, N second duplexers, and an uplink phase shifting network circuit and a downlink phase shifting network circuit disposed between the M first duplexers and the N second duplexers. M and N are each an integer multiple of 2.
In this embodiment of the present application, each of the first duplexer and the second duplexer may be a strip line duplexer.
The uplink phase-shifting network circuit comprises M combiners, N power splitters and M multiplied by N strip lines between the M combiners and the N power splitters, wherein the length of each strip line included in the uplink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the uplink phase-shifting network circuit correspond to the beam forming angles one by one; the uplink phase-shifting network circuit comprises a combiner which is an N-1 combiner, and the uplink phase-shifting network circuit comprises a power divider which is a 1-M power divider;
the downlink phase-shifting network circuit comprises M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the downlink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the downlink phase-shifting network correspond to the beam forming angles one by one; the power divider included in the downlink phase-shifting network circuit is a 1-division N power divider, and the combiner included in the downlink phase-shifting network circuit is an M-in-1 combiner;
wherein, each first duplexer is connected with the input of a power divider in the uplink phase-shifting network circuit respectively, in the uplink phase-shifting network circuit, the output of each power divider is connected with the input of a combiner respectively, and the output of each combiner is connected with a second duplexer respectively;
each second duplexer is respectively connected with the input of one power divider in the downlink phase-shifting network circuit, the output of each power divider is respectively connected with the input of one combiner, and the output of each combiner is respectively connected with one first duplexer.
In one embodiment of the present application, the M first duplexers, the N second duplexers, the M combiners and the N power splitters included in the uplink phase-shifting network circuit, and the M power splitters and the N combiners included in the downlink phase-shifting network circuit are all located on the first metal wiring layer of the PCB;
the strip line is positioned on a first metal wiring layer and a second metal wiring layer of the PCB, and the first metal wiring layer is provided with a via hole which is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
In one implementation, in the upstream phase shift network circuit, M combiners are sequentially arranged on one side of the first metal wiring layer, and N power splitters are sequentially arranged on the other side of the first metal wiring layer; or, M/2 combiners are sequentially arranged on one side of the first metal wiring layer, and M/2 combiners are sequentially arranged on the other side of the first metal wiring layer, N power splitters are sequentially arranged on the central lines of the two rows of combiners or staggered relative to the central lines of the two rows of combiners;
in the downstream phase shift network circuit, M power splitters are sequentially arranged on one side of a first metal wiring layer, and N combiners are sequentially arranged on the other side of the first metal wiring layer; or, M/2 power splitters are sequentially arranged on one side of the first metal wiring layer, and M/2 power splitters are sequentially arranged on the other side of the first metal wiring layer, and N combiners are sequentially arranged on the central lines of the two rows of power splitters or staggered relative to the central lines of the two rows of power splitters.
By adopting the technical scheme, the phase shifter can be realized through the duplexer, the power divider and the combiner, the realization is simpler, the required cost is lower, the length of the strip line is set based on the test requirement, a plurality of beam forming angles required by the test can be realized, the complex structural design is not needed, and the measurement of uplink and downlink can be realized through the phase shifter.
The following describes the phase shifter according to the embodiment of the present application with reference to a specific example, as shown in fig. 10, the phase shifter includes 4 first diplexers, two first diplexers on the left side are respectively connected to the radio frequency channel A1 and the radio frequency channel A3 of the test base station, and two first diplexers on the right side are respectively connected to the radio frequency channel A2 and the radio frequency channel A4 of the test base station. Each duplexer includes a transmitting end and a receiving end. For ease of understanding, the two first diplexers on the left are referred to as a diplexer A1 and a diplexer A3, respectively, and the two first diplexers on the right are referred to as a diplexer A2 and a diplexer A4, respectively.
The phase shifter also comprises 4 second diplexers which are respectively connected with radio frequency channels B1, B2, B3 and B4 of the test terminal. For ease of understanding, the above 4 duplexers are referred to as a duplexer B1, a duplexer B2, a duplexer B3, and a duplexer B4, respectively.
In fig. 10, two phase shift network circuits are shown, and it can be seen that the upper and lower parts in fig. 10 have the same structure, wherein one part can be used as an uplink phase shift network circuit, and the other part can be used as a downlink phase shift network circuit.
Taking the lower half of fig. 10 as an example of the downstream phase shift network circuit, referring to fig. 10, the transmitting end of the duplexer A1 in fig. 10 is connected to the input of the power divider A1, and the 4 outputs of the power divider A1 are respectively connected to the inputs of the combiner B1, the combiner B2, the combiner B3 and the combiner B4.
The transmitting end of the duplexer A2 is connected with the input of the power divider A2, and 4 outputs of the power divider A2 are respectively connected with the inputs of the combiner B1, the combiner B2, the combiner B3 and the combiner B4.
The transmitting end of the duplexer A3 is connected with the input of the power divider A3, and 4 outputs of the power divider A3 are respectively connected with the inputs of the combiner B1, the combiner B2, the combiner B3 and the combiner B4.
The transmitting end of the duplexer A4 is connected with the input of the power divider A4, and 4 outputs of the power divider A4 are respectively connected with the inputs of the combiner B1, the combiner B2, the combiner B3 and the combiner B4.
The diplexers in fig. 10 are implemented by PCB strip lines, and the uplink frequency band of the diplexer is 1.92-1.98GHz and the downlink frequency band is 2.11-2.17GHz, as an example.
The phase shifter shown in fig. 10 includes 16 transmission paths between the input ports of the 4 diplexers and the output ports of the 4 diplexers, and the length of each transmission path can be determined according to the beamforming angle determined by the test requirement. The relationship between the length of the transmission path and the angle of the beam forming is as follows: l=Φλ/360, L is the transmission path length, Φ is the beamforming angle, λ is the wavelength.
The length of the transmission path is the length between the output of the first diplexer and the input of the second diplexer, and in order to reduce the wiring difficulty of the PCB board, in the embodiment of the present application, the distance between each first diplexer and the uplink phase-shifting network circuit and the distance between each second diplexer and the uplink phase-shifting network circuit are the same. And the distance between each first duplexer and the downstream phase shift network circuit and the distance between each second duplexer and the downstream phase shift network circuit are the same. Furthermore, by setting the length difference of the strip line between the power divider and the combiner, the transmission path length corresponding to the test requirement can be met.
As an example, the relationship between the path lengths of the above 16 transmission paths and the beamforming angles is shown in table 1.
TABLE 1
In another embodiment of the present application, a base station testing system is also provided, which includes a test base station, a plurality of test terminals, and the phase shifter described above.
The test base station comprises a test base station, a phase shifter, a plurality of test terminals, a plurality of first diplexers, a plurality of second diplexers and a plurality of test terminals, wherein the M radio frequency channels of the test base station are connected with the M first diplexers of the phase shifter one by one, and the radio frequency channels of the plurality of test terminals are connected with the N second diplexers of the phase shifter one by one.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention are included in the protection scope of the present invention.

Claims (11)

1. The phase shifter is characterized by comprising M signal input circuits, N signal output circuits and a phase shifting network circuit arranged between the signal input circuits and the signal output circuits; m and N are integer multiples of 2;
the phase-shifting network circuit consists of M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines are in one-to-one correspondence with the beam forming angles; the power divider is a 1-division N power divider, and the combiner is an M-combination 1 combiner;
wherein, each signal input circuit is connected with the input of one power divider respectively; the output of each power divider is respectively connected with the input of a combiner; the output of each combiner is respectively connected with a signal output circuit.
2. The phase shifter of claim 1, wherein the M signal input circuits, the N signal output circuits, the M power splitters, and the N combiners are all located on a first metal wiring layer of a printed circuit board PCB;
the strip line is located on the first metal wiring layer and the second metal wiring layer of the PCB, a via hole is formed in the first metal wiring layer, and the via hole is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
3. The phase shifter according to claim 2,
the M power splitters are sequentially arranged on one side of the first metal wiring layer, the N combiners are sequentially arranged on the other side of the first metal wiring layer, and the M power splitters are opposite to the N combiners in position.
4. The phase shifter according to claim 3,
the via holes on the first metal wiring layer, which are close to the power divider, and the via holes on the first metal wiring layer, which are close to the combiner, are symmetrically arranged relative to a first central line, wherein the first central line is the central line between the row where the M power dividers are located and the row where the N combiners are located on the first metal wiring layer.
5. The phase shifter according to claim 2,
the phase shift network circuit comprises M/2 power dividers which are sequentially arranged on one side of the first metal wiring layer, and M/2 power dividers which are sequentially arranged on the other side of the first metal wiring layer;
the N combiners are sequentially arranged between the two rows of power splitters, half of input ports of each combiner face to one power splitter, and the other half of input ports face to the other power splitter.
6. The phase shifter according to claim 5,
the N combiners are sequentially arranged on the second central lines of the two rows of power splitters; or, the N combiners are staggered with respect to the second center line.
7. The phase shifter according to claim 6,
the through holes on two sides of each combiner on the first metal wiring layer are symmetrically arranged relative to the second central line.
8. The phase shifter is characterized by comprising M first duplexers, N second duplexers, and an uplink phase shifting network circuit and a downlink phase shifting network circuit which are arranged between the M first duplexers and the N second duplexers, wherein M and N are integer multiples of 2;
the uplink phase-shifting network circuit consists of M combiners, N power splitters and M multiplied by N strip lines between the M combiners and the N power splitters, wherein the length of each strip line included in the uplink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the uplink phase-shifting network circuit are in one-to-one correspondence with the beam forming angles; the uplink phase-shifting network circuit comprises a combiner which is an N-in-1 combiner, and the uplink phase-shifting network circuit comprises a power divider which is a 1-division M power divider;
the downlink phase-shifting network circuit consists of M power splitters, N combiners and M multiplied by N strip lines between the M power splitters and the N combiners, wherein the length of each strip line included in the downlink phase-shifting network circuit is determined based on a plurality of different beam forming angles included in test requirements, and the strip lines included in the downlink phase-shifting network correspond to the beam forming angles one by one; the power divider included in the downstream phase-shifting network circuit is a 1-to-N power divider, and the combiner included in the downstream phase-shifting network circuit is an M-to-1 combiner;
each first duplexer is respectively connected with the input of one power divider in the uplink phase-shifting network circuit, the output of each power divider is respectively connected with the input of one combiner, and the output of each combiner is respectively connected with one second duplexer;
each second diplexer is respectively connected to the input of one power divider in the downlink phase-shifting network circuit, the output of each power divider is respectively connected to the input of one combiner, and the output of each combiner is respectively connected to one first diplexer.
9. The phase shifter of claim 8, wherein the M first diplexers, the N second diplexers, the M power splitters and the N power splitters included in the upstream phase shifting network circuit, and the M power splitters and the N power splitters included in the downstream phase shifting network circuit are all located in a first metal wiring layer of a printed circuit board PCB;
the strip line is located on the first metal wiring layer and the second metal wiring layer of the PCB, a via hole is formed in the first metal wiring layer, and the via hole is used for communicating the same strip line on the first metal wiring layer and the second metal wiring layer.
10. The phase shifter according to claim 9,
in the uplink phase shift network circuit, the M combiners are sequentially arranged on one side of the first metal wiring layer, and the N power splitters are sequentially arranged on the other side of the first metal wiring layer; or, M/2 combiners are sequentially arranged on one side of the first metal wiring layer, another M/2 combiners are sequentially arranged on the other side of the first metal wiring layer, and the N power splitters are sequentially arranged on the central lines of the two rows of combiners or staggered relative to the central lines of the two rows of combiners;
in the downstream phase shift network circuit, the M power splitters are sequentially arranged on one side of the first metal wiring layer, and the N combiners are sequentially arranged on the other side of the first metal wiring layer; or, M/2 power splitters are sequentially arranged on one side of the first metal wiring layer, and M/2 power splitters are sequentially arranged on the other side of the first metal wiring layer, and the N combiners are sequentially arranged on the central lines of the two rows of power splitters or staggered relative to the central lines of the two rows of power splitters.
11. A base station testing system, characterized in that the system comprises a testing base station, a plurality of testing terminals and a phase shifter according to any one of claims 8-10;
the M radio frequency channels of the test base station are connected with the M first duplexers of the phase shifter one by one, and the radio frequency channels of the plurality of test terminals are connected with the N second duplexers of the phase shifter one by one.
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Citations (2)

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Publication number Priority date Publication date Assignee Title
CN111162856A (en) * 2020-01-22 2020-05-15 南京捷希科技有限公司 Radio frequency matrix of frequency division duplex system, performance test system and method
CN212542636U (en) * 2020-08-12 2021-02-12 昆山恩电开通信设备有限公司 High-performance cavity phase shifter applied to 5G system

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KR20210015262A (en) * 2019-08-01 2021-02-10 삼성전자주식회사 Antenna module and electronic device including thereof

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111162856A (en) * 2020-01-22 2020-05-15 南京捷希科技有限公司 Radio frequency matrix of frequency division duplex system, performance test system and method
CN212542636U (en) * 2020-08-12 2021-02-12 昆山恩电开通信设备有限公司 High-performance cavity phase shifter applied to 5G system

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