CN114969658B - Grouping sequential test method for exponential lifetime type product - Google Patents
Grouping sequential test method for exponential lifetime type product Download PDFInfo
- Publication number
- CN114969658B CN114969658B CN202210496835.5A CN202210496835A CN114969658B CN 114969658 B CN114969658 B CN 114969658B CN 202210496835 A CN202210496835 A CN 202210496835A CN 114969658 B CN114969658 B CN 114969658B
- Authority
- CN
- China
- Prior art keywords
- test
- group
- samples
- equal
- products
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000010998 test method Methods 0.000 title abstract description 12
- 238000012360 testing method Methods 0.000 claims abstract description 127
- 238000000034 method Methods 0.000 claims description 16
- 238000004364 calculation method Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 238000005520 cutting process Methods 0.000 description 7
- 238000004088 simulation Methods 0.000 description 7
- 238000007689 inspection Methods 0.000 description 5
- 238000009826 distribution Methods 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 238000013459 approach Methods 0.000 description 2
- 230000001186 cumulative effect Effects 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000001502 supplementing effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Data Mining & Analysis (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Optimization (AREA)
- Pure & Applied Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Mathematical Physics (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Operations Research (AREA)
- Probability & Statistics with Applications (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Algebra (AREA)
- Evolutionary Biology (AREA)
- Databases & Information Systems (AREA)
- Software Systems (AREA)
- General Engineering & Computer Science (AREA)
- Bioinformatics & Computational Biology (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention discloses a grouping sequential test method for an exponential lifetime type product, which comprises the following steps: s1, initializing, inputting related parameters of a producer, inputting related parameters of a user, and inputting test plan time consumption t w of each group of test samples; s2, calculating the total number N of samples and the received number Ac; s3, calculating the grouping number z, and calculating a rejection risk probability criterion Pt 1 and a reception risk probability criterion Pt 2; s4, outputting; s5, determining the number of samples of each group, and starting the test group by group from the 1 st group; s6, counting from the 1 st group to the current i th group, wherein the number of samples with faults in the test period is recorded as m, and the number of the samples with the faults is recorded as nt; s7, if i is less than or equal to z, calculating risk probabilities p a and p b respectively, and carrying out relevant judgment; s8, if i=z+1, the test is terminated after the test of group 1+z is completed.
Description
Technical Field
The invention belongs to the technical field of product inspection, and particularly relates to a grouping sequential test method for an exponential lifetime type product.
Background
Currently, in a range of international, national and military standards, several commonly used methods for testing exponential life type products are presented. For example, in GJB899A-2009, a common sequential trial statistical scheme, a timed tail-biting trial statistical scheme, and a full-trial statistical scheme are given. The "test time" mentioned in these schemes is actually the cumulative lifetime of all samples, so they have a common feature: the life information of the tested product needs to be recorded in the test, so that an instrument capable of detecting the state of the product in real time and on line is needed to be matched with the test for capturing the fault moment of the product. However, the test field does not necessarily have conditions for recording the life of the test product, so that conventional tests in the standards cannot be performed, and therefore, it is necessary to design a method for designing a grouping sequential test scheme for an exponential life type product, and the reliability test of the product can be completed in a short time with fewer test products while stably controlling the risk of the producer and the risk of the consumer within the expected threshold range.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a grouping sequential test method for an exponential lifetime type product.
In order to achieve the above purpose, the invention adopts the following technical scheme:
A method of group sequential testing for an exponential lifetime type product, comprising the steps of:
S1, initializing, and inputting related parameters of a production party: the risk threshold alpha and the average life t 0 of good products are input with related parameters of a user: the risk threshold value beta and the average life t 1 of the poor product are input, and the time t w of the test plan of each group of test samples is input;
s2, calculating the total number N of samples and the received number Ac;
S3, calculating the grouping number z, and calculating a rejection risk probability criterion Pt 1 and a reception risk probability criterion Pt 2;
S4, outputting the total number N of samples, the receiving number Ac, the grouping number z, the rejection risk probability criterion Pt 1 and the receiving risk probability criterion Pt 2;
S5, determining the number of samples of each group, starting the test from the 1 st group, and simultaneously testing all samples of the same group, wherein the test time of each group is t w;
S6, counting the number of samples which are in failure in the test period from the 1 st group to the current i st group at the test end point time t w of the i th group, wherein the number of samples is recorded as m, and the number of the samples is recorded as nt;
S7, if i is less than or equal to z, calculating risk probabilities p a and p b respectively, and performing relevant judgment, wherein the calculation formulas of the risk probabilities p a and p b are as follows:
where nt is the number of test samples, and m is the number of samples that fail during the test;
S8, if i=z+1, stopping the test after the test of the 1+z group is completed, counting the total times m of sample faults in the whole test period, judging whether m is less than or equal to Ac or not, if m is less than or equal to Ac, receiving the batch of products, otherwise, rejecting the batch of products.
Preferably, the specific steps of step S2 are as follows:
s21, order N=1, ac=0, at is equal to the minimum of N-1 and 1.3N (1-q 1), and the integer is taken up At;
Wherein q 0 refers to the probability that good t 0 does not fail during the test, q 1 refers to the probability that bad t 1 does not fail during the test, and At is the upper search limit of Ac;
S22, order Pa is N, ac, where B (·) is a beta function, let/>Pb is N, ac corresponding to the risk probability of the user;
S23, if Pa < alpha and Pb < beta are all established, the total number N of samples and the received number Ac are calculated, the step S3 is executed, and otherwise, the step S24 is executed;
and S24, updating Ac, and if Ac > At after Ac=Ac+1, then N=N+1, ac=0, updating At, wherein At is equal to the minimum number in N-1 and 1.3N (1-q 1), and taking an integer upwards for At, and then repeatedly executing the step S22 and the step S23.
Preferably, the specific steps of step S3 are as follows:
S31, initializing z=2;
S32, order
S33, ifAnd/>If so, step S4 is performed, otherwise, let z=z+1, and repeat steps S32 and S33, where nz 1 and nz 2 are integers greater than 1.
Preferably, the specific step of determining the number of samples of each group in step S5 is: the samples were divided into 1+z groups, let n 1 equal toN 2＝N-zn1, the number of samples of the 1 st group to the z-th group is n 1, the number of samples of the 1 st+z group is n 2, the serial numbers of each group are i, i is more than or equal to 1 and less than or equal to 1+z, the initial value of i is 1, and n 1 products are randomly selected to form the 1 st group.
Preferably, in step S7, the specific steps for performing the correlation determination are:
S71, if p a＜Pt1 is met, rejecting the batch of products, and terminating the test;
S72, if p b＜Pt2 is met, receiving the batch of products, and terminating the test;
If neither p a＜Pt1 nor p b＜Pt2 is satisfied, i=i+1 is added to the number of samples of the next group, and step S6 is executed to continue the next group test.
Compared with the prior art, the invention has the beneficial effects that:
(1) According to the grouping sequential test method for the exponential lifetime type product, provided by the invention, lifetime data of a sample is not needed, and whether the sample fails or not is only checked at the test end point moment, so that an instrument capable of monitoring the state of the sample in real time to obtain the lifetime data is not needed to be configured, the cost is reduced, and the feasibility is better;
(2) The method provided by the invention is used for inspecting various products with average service lives, the product receiving probability result is consistent with the sequential test and the timing tail-cutting test result of GJB899A-2009, the test time is obviously less than that of the national standard sequential test, and the number of required samples is also less than that of the national standard timing tail-cutting test.
Drawings
Fig. 1 is a graph comparing a grouping sequential test method for an exponential lifetime product with a sequential test statistical scheme of GJB899A-2009 and a product receiving probability of a timing tail-cutting test statistical scheme on product inspection, which are provided by the embodiment of the present invention;
Fig. 2 is a comparison chart of a grouping sequential test method for an exponential lifetime product and a sequential test statistical scheme of GJB899A-2009 and a test time consumption of a timing tail-cutting test statistical scheme on product inspection, which are provided by the embodiment of the present invention;
Fig. 3 is a graph comparing a grouping sequential test method for an exponential lifetime product with a sequential test statistical scheme of GJB899A-2009 and a timing tail-biting test statistical scheme provided in an embodiment of the present invention to total number of test samples required for product inspection.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
The embodiment of the invention provides a grouping sequential test method for an exponential lifetime type product, which specifically comprises the following steps:
S1, initializing, and inputting related parameters of a production party: the risk threshold alpha and the average life t 0 of good products are input with related parameters of a user: the risk threshold value beta and the average life t 1 of the poor products are input, the test plan time consumption t w of each group of test samples is input, the product samples in the group start to be tested at the same time, the states of all the samples are checked at the test endpoint time t w, and the number of the samples with faults in the group of the test is counted;
S2, calculating the total number N of samples and the received number Ac, wherein the method comprises the following specific steps:
s21, order N=1, ac=0, at is equal to the minimum of N-1 and 1.3N (1-q 1), and the integer is taken up At;
Wherein q 0 refers to the probability that good t 0 does not fail during the test, q 1 refers to the probability that bad t 1 does not fail during the test, and At is the upper search limit of Ac;
S22, order Pa is N, ac, where B (·) is a beta function, let/>Pb is N, ac corresponding to the risk probability of the user;
S23, if Pa < alpha and Pb < beta are all established, the total number N of samples and the received number Ac are calculated, the step S3 is executed, and otherwise, the step S24 is executed;
S24, updating Ac, after Ac=Ac+1, if Ac > At, then N=N+1, ac=0, updating At, wherein At is equal to the minimum number in N-1 and 1.3N (1-q 1), and taking an integer upwards for At, and then repeatedly executing the step S22 and the step S23;
S3, calculating the grouping number z, and calculating a rejection risk probability criterion Pt 1 and a reception risk probability criterion Pt 2, wherein the specific steps are as follows:
S31, initializing z=2;
S32, order Pt 1 is a rejection risk probability criterion, and Pt 2 is a reception risk probability criterion;
S33, if And/>If so, executing step S4, otherwise, repeating steps S32 and S33, wherein nz 1 and nz 2 are integers greater than 1, and the value principle is that/>Near 0.01, it is recommended that: when alpha is more than or equal to 0.1, the proper nz 1 is selected so that/>Establishment; when beta is more than or equal to 0.1, selecting proper nz 2 to ensure that/>Establishment;
S4, outputting the total number N of samples, the receiving number Ac, the grouping number z, the rejection risk probability criterion Pt 1 and the receiving risk probability criterion Pt 2;
S5, determining the number of samples of each group, specifically: the number of samples in each group is as equal as possible, the samples are divided into 1+z groups, and n 1 is equal to N 2＝N-zn1, the number of samples of the 1 st group to the z th group is n 1, the number of samples of the 1 st+z group is n 2, the serial numbers of the groups are recorded as i, i is not less than 1 and not more than 1+z, the initial value of i is 1, n 1 products are randomly selected to form the 1 st group, the test is started from the 1 st group by group, all samples of the same group are tested simultaneously, and the test time of each group is t w;
S6, counting the number of samples which are in failure in the test period from the 1 st group to the current i st group at the test end point time t w of the i th group, wherein the number of samples is recorded as m, and the number of the samples is recorded as nt;
S7, if i is less than or equal to z, calculating risk probabilities p a and p b respectively, and performing relevant judgment, wherein the calculation formulas of the risk probabilities p a and p b are as follows:
where nt is the number of test samples, and m is the number of samples that fail during the test;
The specific steps for carrying out the relevant judgment are as follows:
S71, if p a＜Pt1 is met, rejecting the batch of products, and terminating the test;
S72, if p b＜Pt2 is met, receiving the batch of products, and terminating the test;
S73, if p a＜Pt1 and p b＜Pt2 are not established, making i=i+1, supplementing the number of samples of the next group, executing a step S6, and continuing the next group of tests;
For a product whose lifetime obeys the exponential distribution exp (μ), since its remaining lifetime is still obeying the exponential distribution exp (μ), n new samples need not be randomly sampled from the batch product when continuing the next set of tests, but samples that have not failed after the end of the i-th set of tests can be retained in the i+1th set of samples, and then the new samples can be replenished such that the number of samples in the i+1th set is equal to n. Thus, the parameter N in the test protocol does not mean that there must be N different samples, something that will repeatedly appear in consecutive sets of tests;
S8, if i=z+1, stopping the test after the test of the 1+z group is completed, counting the total times m of sample faults in the whole test period, judging whether m is less than or equal to Ac or not, if m is less than or equal to Ac, receiving the batch of products, otherwise, rejecting the batch of products.
Calculating: sampling inspection of a batch of product is now required. Knowing that the life of the product obeys the exponential distribution, the average life t 0 of good products concerned by the producer=150h, and the risk threshold alpha=0.1 of the producer; the average life t 1 of the bad products concerned by the user=100 h, and the risk threshold value beta of the user=0.1. By applying the test method provided by the embodiment of the invention, a grouping sequential test scheme is designed.
Solution: (1) initialising, from known: α=0.1, t 0＝150h,β＝0.1,t1 =100 h. Let the test deadline t w = 100h for each group.
(2) The total number of samples N and the received number Ac are calculated.
Calculated, q 0＝0.5134,q1 = 0.3679. When n=81, ac=45, pa=0.088, pb=0.096, where Pa < α and Pb < β are both true.
(3) Initializing the number of packets z=2, letting nz 1 =15 and nz 2 =15, And judge/>And/>If they are not both, updating z=z+1, and calculating to z=16, pt 1＝0.0066,Pt2 =0.0066 satisfies/>And/>All the requirements are satisfied, and z and Pt 1、Pt2 at this time are saved.
(4) After the test scheme is designed, outputting the content of the test scheme: the total number of samples n=81, the number of received ac=45, the number of packets z=16, the risk probability criterion Pt 1＝0.0066,Pt2 =0.0066.
The effectiveness of the method provided by the embodiment of the invention is verified in a simulation mode, and compared with a sequential test statistical scheme and a timing tail-cutting test statistical scheme of GJB 899A-2009.
For the above example, the cutoff time of the sequential test statistical protocol of GJB899A-2009 was 49.56t 1, the received number was 41, and the serial test mode of sample-by-sample testing was used, where the number of samples used was the least. The timing tail-biting test scheme of the GJB899A-2009 is as follows: the accumulated test time of the samples is 49.4t 1, the receiving number is 40, a parallel test mode of 41 units for simultaneous test is adopted, and 41 is the minimum sample number of the mode, so that test conclusion can be obtained more quickly.
Fig. 1 to 3 are simulation test effects of the above three method sampling test schemes, respectively, described in terms of three points of product reception probability, test time consumption ratio, and total number of test samples, respectively. Note that: the ratio of test time elapsed is the ratio of test time elapsed to t 1, where test time elapsed refers to the time from the start of the test to the conclusion, and not the cumulative lifetime of all of the test samples.
The simulation results of the method provided by the embodiment of the invention and the national standard sequential and national standard timing test scheme on the receiving probability of products with the average service life within the range of 70-190 are shown in the following table 1.
TABLE 1
As can be seen from table 1: for good t 0 =150, the rejection risk probability simulation results of the three schemes are 0.1225, 0.0935 and 0.0895 respectively, and the approach risk threshold alpha=0.1 can be considered in consideration of the random error factors of the simulation; for poor t 1 =100, the simulation results of the reception risk probabilities of the three schemes are 0.1185, 0.0810 and 0.1040 respectively, and the approach risk threshold β=0.1 can be considered in consideration of the random error factors of the simulation. As can be seen from table 1 and fig. 1: the method provided by the embodiment of the invention is used for checking various products with average service lives, and the product receiving probability result is consistent with the sequential test and the timing tail-cutting test result of the GJB 899A-2009.
For the statistics, to accurately grasp the statistics, the statistics are observed for a long enough time or a large enough number of samples. The parallel test mode is adopted, so that the timing tail-biting test of the GJB899A-2009 can reach the test conclusion fastest, but the number of required samples is also the largest. As can be seen from fig. 2 and 3: sequential testing of GJB899A-2009, due to the serial test mode, while requiring the least number of samples, is also the most time consuming. The test time consumption and the required sample number of the method provided by the embodiment of the invention are between the sequential test and the timing tail-cutting test of GJB899A-2009, and the test time consumption is obviously less than that of the national standard sequential test. Compared with the two national standards, the method provided by the embodiment of the invention has the remarkable characteristics that the life data of the sample is not needed, and only the sample is checked to determine whether the sample fails at the test end point time, so that an instrument capable of monitoring the sample state in real time to obtain the life data is not needed to be configured like the relevant standards such as GJB899A-2009, and the like, and the method provided by the embodiment of the invention has better feasibility.
In summary, according to the grouping sequential test method for the exponential lifetime type product provided by the embodiment of the invention, lifetime data of a sample is not needed, and whether the sample fails or not only needs to be checked at the test end point moment, so that an instrument capable of monitoring the state of the sample in real time to obtain lifetime data is not needed to be configured, the cost is reduced, and the feasibility is better.
While embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that: many changes, modifications, substitutions and variations may be made to the embodiments without departing from the spirit and principles of the invention, the scope of which is defined by the claims and their equivalents.
Claims (3)
1. A method of sequential testing of groups for an exponential lifetime type product, comprising the steps of:
S1, initializing, and inputting related parameters of a production party: the risk threshold alpha and the average life t 0 of good products are input with related parameters of a user: the risk threshold value beta and the average life t 1 of the poor product are input, and the time t w of the test plan of each group of test samples is input;
s2, calculating the total number N of samples and the received number Ac, wherein the method comprises the following specific steps:
s21, order N=1, ac=0, at is equal to the minimum of N-1 and 1.3N (1-q 1), and the integer is taken up At;
Wherein q 0 refers to the probability that good t 0 does not fail during the test, q 1 refers to the probability that bad t 1 does not fail during the test, and At is the upper search limit of Ac;
S22, order Pa is N, ac, where B (·) is a beta function, let/>Pb is N, ac corresponding to the risk probability of the user;
S23, if Pa < alpha and Pb < beta are all established, the total number N of samples and the received number Ac are calculated, the step S3 is executed, and otherwise, the step S24 is executed;
S24, updating Ac, after Ac=Ac+1, if Ac > At, then N=N+1, ac=0, updating At, wherein At is equal to the minimum number in N-1 and 1.3N (1-q 1), and taking an integer upwards for At, and then repeatedly executing the step S22 and the step S23;
S3, calculating the grouping number z, and calculating a rejection risk probability criterion Pt 1 and a reception risk probability criterion Pt 2, wherein the specific steps are as follows:
S31, initializing z=2;
S32, order
S33, ifAnd/>If the same is true, executing step S4, otherwise, letting z=z+1, repeating steps S32 and S33, wherein nz 1 and nz 2 are integers greater than 1;
S4, outputting the total number N of samples, the receiving number Ac, the grouping number z, the rejection risk probability criterion Pt 1 and the receiving risk probability criterion Pt 2;
S5, determining the number of samples of each group, starting the test from the 1 st group, and simultaneously testing all samples of the same group, wherein the test time of each group is t w;
S6, counting the number of samples which are in failure in the test period from the 1 st group to the current i st group at the test end point time t w of the i th group, wherein the number of samples is recorded as m, and the number of the samples is recorded as nt;
S7, if i is less than or equal to z, calculating risk probabilities p a and p b respectively, and performing relevant judgment, wherein the calculation formulas of the risk probabilities p a and p b are as follows:
Where nt is the number of samples tested, m is the number of samples that failed during the test, and B (·) is the beta function;
S8, if i=z+1, stopping the test after the test of the 1+z group is completed, counting the total times m of sample faults in the whole test period, judging whether m is less than or equal to Ac or not, if m is less than or equal to Ac, receiving the batch of products, otherwise, rejecting the batch of products.
2. The method of sequential testing of groups for exponential lifetime products of claim 1, wherein the specific step of determining the number of samples of each group in step S5 is: the samples were divided into 1+z groups, let n 1 equal toN 2＝N-zn1, the number of samples of the 1 st group to the z-th group is n 1, the number of samples of the 1 st+z group is n 2, the serial numbers of each group are i, i is more than or equal to 1 and less than or equal to 1+z, the initial value of i is 1, and n 1 products are randomly selected to form the 1 st group.
3. The method for sequential testing of packets for exponential lifetime products of claim 1, wherein in step S7, said specific step of performing correlation determination is:
S71, if p a＜Pt1 is met, rejecting the batch of products, and terminating the test;
S72, if p b＜Pt2 is met, receiving the batch of products, and terminating the test;
If neither p a＜Pt1 nor p b＜Pt2 is satisfied, i=i+1 is added to the number of samples of the next group, and step S6 is executed to continue the next group test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210496835.5A CN114969658B (en) | 2022-05-09 | 2022-05-09 | Grouping sequential test method for exponential lifetime type product |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210496835.5A CN114969658B (en) | 2022-05-09 | 2022-05-09 | Grouping sequential test method for exponential lifetime type product |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114969658A CN114969658A (en) | 2022-08-30 |
| CN114969658B true CN114969658B (en) | 2024-05-07 |
Family
ID=82982333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210496835.5A Active CN114969658B (en) | 2022-05-09 | 2022-05-09 | Grouping sequential test method for exponential lifetime type product |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114969658B (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008054403A2 (en) * | 2005-11-15 | 2008-05-08 | Probity Laboratories, Llc | Systems and methods for identifying, categorizing, quantifying and evaluating risks |
| CN107301285A (en) * | 2017-06-16 | 2017-10-27 | 南京航空航天大学 | Non-electronic product Sequential Compliance Method based on predicting residual useful life |
| CN111523185A (en) * | 2020-04-22 | 2020-08-11 | 西安航空制动科技有限公司 | Service life assessment method for aircraft brake control device |
| CN113431496A (en) * | 2021-05-31 | 2021-09-24 | 中国舰船研究设计中心 | Drilling and production ship cooperative operation fault diagnosis and decision-making assisting method |
| KR102335651B1 (en) * | 2020-12-07 | 2021-12-06 | 국방기술품질원 | Reliability sampling plan cost-effectiveness optimization design method based on prediction result of failure rate of electronic equipment applied to weapon system |
-
2022
- 2022-05-09 CN CN202210496835.5A patent/CN114969658B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2008054403A2 (en) * | 2005-11-15 | 2008-05-08 | Probity Laboratories, Llc | Systems and methods for identifying, categorizing, quantifying and evaluating risks |
| CN107301285A (en) * | 2017-06-16 | 2017-10-27 | 南京航空航天大学 | Non-electronic product Sequential Compliance Method based on predicting residual useful life |
| CN111523185A (en) * | 2020-04-22 | 2020-08-11 | 西安航空制动科技有限公司 | Service life assessment method for aircraft brake control device |
| KR102335651B1 (en) * | 2020-12-07 | 2021-12-06 | 국방기술품질원 | Reliability sampling plan cost-effectiveness optimization design method based on prediction result of failure rate of electronic equipment applied to weapon system |
| CN113431496A (en) * | 2021-05-31 | 2021-09-24 | 中国舰船研究设计中心 | Drilling and production ship cooperative operation fault diagnosis and decision-making assisting method |
Non-Patent Citations (1)
| Title |
|---|
| 武器装备全寿命周期的风险估计方法;沈国柱;科 研 管 理;20200120;第21卷(第6期);第1-21页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114969658A (en) | 2022-08-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107478455B (en) | Timing truncation reliability test method suitable for Weibull distribution type product | |
| US10371751B2 (en) | Circuit and method for diagnosing scan chain failures | |
| CN110596566A (en) | DPAT (dual port automatic test) method for ATE (automatic test equipment) system | |
| CN114969658B (en) | Grouping sequential test method for exponential lifetime type product | |
| JP5025524B2 (en) | Test apparatus, test system, and test method | |
| WO2022022164A1 (en) | Method and apparatus for determining abnormality of probe card | |
| Senthilkumar et al. | Design of Double Inspection Quick Switching System [DIQSS (0, 1)] | |
| JP2009093709A (en) | Semiconductor integrated circuit and test method | |
| CN115684869A (en) | Chip testing system and method based on power management | |
| JP4650152B2 (en) | Method and apparatus for measuring and selecting characteristics of electronic components | |
| US7899635B2 (en) | Sampling inspection method | |
| TW200839557A (en) | A method for calculating the continuity of bad wafer lots and a method for finding a defective machine using the same | |
| JP3614838B2 (en) | Semiconductor inspection system and semiconductor device inspection method | |
| CN114006678B (en) | Method for quickly acquiring source of received frame by FC-AE equipment | |
| CN116167313B (en) | Training data generation method and system for integrated circuit design | |
| CN111293048B (en) | Wafer testing system and method thereof | |
| Dworak et al. | Fortuitous detection and its impact on test set sizes using stuck-at and transition faults | |
| US20220034939A1 (en) | Method and apparatus for judging abnormality of probe card | |
| US6717870B2 (en) | Method for assessing the quality of a memory unit | |
| TWI423361B (en) | Sampling inspection method | |
| JP3807649B2 (en) | Selection method of multilayer ceramic capacitors | |
| TWI398652B (en) | Output data analyzer for use in chip testing | |
| CN114580985A (en) | Quality detection method and system for electronic product | |
| JP2002131372A (en) | Method and device for inspecting semiconductor device | |
| CN111327491A (en) | Server-centered pessimistic diagnosis method for data center network |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |