CN114966257A - Detection method and system for electrostatic test discharge path - Google Patents
Detection method and system for electrostatic test discharge path Download PDFInfo
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- CN114966257A CN114966257A CN202210348293.7A CN202210348293A CN114966257A CN 114966257 A CN114966257 A CN 114966257A CN 202210348293 A CN202210348293 A CN 202210348293A CN 114966257 A CN114966257 A CN 114966257A
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Abstract
The invention discloses a method and a system for detecting a discharge path in an electrostatic test, wherein the method comprises the following steps: s10, determining an electrostatic test area in the electrostatic test board; s20, carrying out high-voltage discharge on the device to be tested; s30, shooting and recording the static test area through an infrared thermal imaging device; s40, scanning the infrared thermal imaging video frame by frame, and compounding the infrared thermal imaging image during discharging with the planar structure chart of the device to be detected; and S50, determining the discharge path of the static electricity on the device to be tested. By the method, testers can visually determine the discharge paths of static electricity and corresponding positions or corresponding elements of the discharge paths in the electronic device, the detection precision is higher, repeatability is realized, and compared with the traditional test method, the method can test all the discharge paths at one time, the efficiency is higher, meanwhile, multiple tests are not needed to determine the discharge paths at the point to be tested, the consumption of the device to be tested is reduced, and the test cost is reduced.
Description
Technical Field
The invention relates to the technical field of product testing, in particular to a method and a system for detecting an electrostatic test discharge path.
Background
In the production process of electronic products, one important test process is electrostatic test. In testing, some abnormal functions of electronic products often occur, such as electrostatic damage to devices. Therefore, the problem of static electricity has been a problem for electronic engineers. The difficulty is that the paths of static electricity entering, flowing away and discharging cannot be observed, and the potential risks cannot be analyzed and evaluated in detail for some electronic products damaged by static electricity. If the problem needs to be solved, a certain method is used for grabbing and recording the static inlet and discharge paths in the static test so as to perform protection treatment in a targeted manner.
However, the current problems are that the different electronic products have different structural designs, circuit designs, product materials and component distributions, so that the static electricity flowing paths are different, and the general discharging path can only be estimated by a method of damaged electronic component positions in the prior art. The method has the following defects: firstly, the speed is low, a large amount of static experiments are needed, and the time consumption is long; secondly, the efficiency is low, the electrostatic discharge sometimes has not only one path, and the workload can be multiplied under the condition that a plurality of paths discharge; thirdly, the cost is high, the electrostatic discharge test belongs to destructive test, and the product is scrapped in each test, so that the test cost is high.
Therefore, how to accurately and efficiently detect the flowing and discharging paths of static electricity in the static electricity test becomes a technical problem which needs to be solved at present.
Disclosure of Invention
The invention discloses a detection method and a detection system for an electrostatic test discharge path, and aims to solve the technical problems in the prior art.
In order to solve the problems, the invention adopts the following technical scheme:
in one aspect, the present invention provides a method for detecting an electrostatic test discharge path, including the following steps:
determining an electrostatic test area in the electrostatic test board;
carrying out high-voltage discharge on a device to be tested;
shooting and recording the static test area through an infrared thermal imaging device;
scanning the infrared thermal imaging video frame by frame, and compounding the infrared thermal imaging image during discharging with a planar structure chart of the device to be detected;
and determining the discharge path of static electricity on the device to be tested.
As a preferred embodiment, before the step of determining the electrostatic test region in the electrostatic test board, further comprising:
and storing the plane structure diagrams of different devices to be tested into a database of the computer.
As a preferred embodiment, in the step of determining the electrostatic test region in the electrostatic test board, further comprising:
the device to be tested is horizontally arranged on an insulating gasket of the electrostatic test board, and electric heating films are respectively fixed on the insulating gasket and two opposite angles of the device to be tested in an insulating mode;
or, the electric heating films are respectively fixed at least four corners of the device to be tested in an insulating way.
As a preferred embodiment, in the step of determining the electrostatic test region in the electrostatic test board, further comprising:
opening the electrothermal film, and heating the device to be tested through the electrothermal film;
adjusting a camera of the infrared thermal imaging device to be vertical to the detection surface of the device to be detected, starting the infrared thermal imaging device, positioning the static test area, and determining the type and the position of the device to be detected.
As a preferred embodiment, in the step of recording the image of the static electricity test area by the infrared thermal imaging device, the method further comprises:
setting a shooting frame rate of an infrared thermal imaging device to be not less than 240 frames; the photographing resolution of the infrared thermal imaging apparatus is set to be not less than 384 × 288.
As a preferred embodiment, in the step of recording the image of the static electricity test area by the infrared thermal imaging device, the method further comprises:
setting a shooting frame rate of an infrared thermal imaging device to 960 frames; the photographing resolution of the infrared thermal imaging apparatus was set to 640 × 480.
As a preferred embodiment, in the step of scanning the infrared thermal imaging video frame by frame and compounding the infrared thermal imaging image during discharging with the planar structure diagram of the device to be measured, the method further comprises:
and outputting the infrared thermal imaging video frame by frame, taking the infrared thermal imaging image before discharging as a reference frame, identifying the rest frames with different brightness from the static test area in the reference frame, and determining the rest frames as the infrared thermal imaging image during discharging.
As a preferred embodiment, in the step of scanning the infrared thermal imaging video frame by frame and compounding the infrared thermal imaging image during discharging with the planar structure diagram of the device to be tested, the method further comprises the following steps:
increasing contrast of the infrared thermal imaging image during discharging by utilizing gamma correction;
and compounding the infrared thermal imaging image with the increased contrast with the planar structure diagram of the device to be detected.
As a preferred embodiment, in the step of determining the discharge path of static electricity at the device under test, the method further comprises:
and determining the corresponding position and/or corresponding element of the electrostatic discharge path in the planar structure diagram of the device to be tested according to the composite image.
In another aspect, the present invention further provides a system for detecting an electrostatic test discharge path, including:
-a static test board for static testing of the electronic device;
-an electro-thermal film arranged at a corner of a device under test in the electrostatic test board for positioning an electrostatic test area in the electrostatic test board;
the infrared thermal imaging device is vertically arranged above the static test area and is used for shooting and recording the heat change of the device to be tested in the static test process;
-computational processing means for analyzing the ir thermographic video and determining the discharge path of the static electricity at the device under test.
The technical scheme adopted by the invention can achieve the following beneficial effects:
the invention discloses a detection method of an electrostatic test discharge path, which is characterized in that before the process of carrying out electrostatic test on an electronic device, an electrothermal film is arranged at the corner of an insulating gasket of a device to be tested and/or an electrostatic test board, so that the device to be tested and the electrostatic test board form temperature difference contrast; during the process of carrying out static test on the electronic device, the infrared thermal imaging device carries out slow motion video recording, the frame-by-frame scanning is carried out after the test is finished, and the infrared thermal imaging image during the discharging process is compounded with the planar structure chart of the device to be tested so as to determine the discharge path of the static in the device to be tested.
By the method, the discharge path of static electricity and the corresponding position or corresponding elements of the discharge path in the electronic device can be visually determined by adjusting the relevant parameters of the infrared thermal imaging device during video recording and processing the video, the detection precision is higher, the discharge path can be repeatedly checked for multiple times, and the method has repeatability.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the description of the embodiments are briefly introduced below to form a part of the present invention, and the exemplary embodiments and the description thereof illustrate the present invention and do not limit the present invention. In the drawings:
fig. 1 is a flowchart of a method for detecting an electrostatic test discharge path in a preferred embodiment disclosed in embodiment 1 of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the specific embodiments of the present invention and the accompanying drawings. In the description of the present invention, it is noted that the term "or" is generally employed in its sense including "and/or" unless the content clearly dictates otherwise.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "connected," and "connected" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral connection; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In order to solve the problems in the prior art, an embodiment of the present application provides a method for detecting a discharge path in an electrostatic test, including: determining an electrostatic test area in the electrostatic test board; carrying out high-voltage discharge on a device to be tested; shooting and recording the static test area through an infrared thermal imaging device; scanning the infrared thermal imaging video frame by frame, and compounding the infrared thermal imaging image during discharging with a planar structure chart of the device to be detected; and determining the discharge path of static electricity on the device to be tested.
Example 1
In the process of electrostatic testing of electronic devices, the electronic devices are often damaged or damaged by electrostatic shock, and the paths of static electricity entering, flowing away and discharging cannot be observed, and for some electrostatic shock electronic products, the potential risks cannot be analyzed and evaluated in detail. In the traditional detection method, the rough discharge path can be estimated only by a method of the damaged electronic component position, and the speed is low and the efficiency is low; in view of the disadvantages of the conventional detection methods, there is a method for displaying a discharge path by spraying a temperature-changing paint on the surface of a device to be detected in the prior art, but the disadvantages of the method are also obvious: because the rise time generated instantaneously during electrostatic discharge is less than nanosecond and the duration is only hundreds of milliseconds, even if the variable-temperature paint is coated, because the time for generating and disappearing the static is very fast, under the condition that a plurality of discharge paths exist, the discharge paths are still difficult to observe and record, and because the method needs paint spraying, the electronic device is damaged, so that the electronic device has the risk of being unusable even if the electrostatic test is finished.
To solve the above problem, the present embodiment provides a method for detecting an electrostatic test discharge path to accurately position an electrostatic discharge path in an electronic device, and referring to fig. 1, in a preferred embodiment, the method includes the following steps:
s10, determining a static test area in the static test board;
preferably, before the static test, firstly, storing the plane structure diagram of the device to be tested into a database of a computer; during the static test, the device to be tested is horizontally arranged on an insulating liner of the static test board, optionally, electric heating films are respectively fixed on the insulating liner and two opposite corners of the upper surface of the device to be tested in an insulating mode, or the electric heating films are respectively fixed on at least four corners and the edges of the device to be tested in an insulating mode. Preferably, although the electric heating film is fixed on the device to be tested in an insulating mode, the electric heating film cannot be arranged at the position, grounded, of the device to be tested to avoid the influence of the existence of the electric heating film on static testing.
In a preferred embodiment, the device to be tested is a display screen module; preferably, the electrothermal film comprises an electrothermal element and an insulating layer, can be curled, has small volume and can be rapidly heated after being electrified; preferably, the electric heating film is fixed at the corner of the device to be tested and/or the insulating gasket by using an insulating adhesive tape. The technical personnel in the field understand that the specifications of the electrothermal film are various, the damage to the element to be tested or the influence on the experiment are not prevented, the low-temperature electrothermal film is preferred, the shape of the electrothermal film is preferably sheet-shaped or strip-shaped, and the outline of the electrothermal film is ensured to be at least the same as the outline of the fixed part of the device to be tested; the specific model of the electrothermal film can be specifically selected according to different devices to be tested, and is not described herein any more.
After the electric heating film and the device to be tested are fixed, the electric heating film is opened, and the temperature of the device to be tested is increased through the electric heating film; adjusting a camera of the infrared thermal imaging device to be vertical to the detection surface of the device to be detected, starting the infrared thermal imaging device, positioning the static test area, and determining the type and the position of the device to be detected.
Specifically, because the device to be tested and the electrostatic test board have the same temperature at room temperature, if the infrared thermal imaging device is directly used for shooting the device to be tested, the position, the boundary and the outline of the device to be tested cannot be distinguished, and the device to be tested and the electrostatic test board can form a temperature difference with the heating of the electrothermal film, so that a tester can be helped to determine the position of the device to be tested.
In a preferred embodiment, the infrared thermal imaging device and the infrared thermal imaging instrument are connected with a computer, so that images shot and recorded by the infrared thermal imaging device and the infrared thermal imaging instrument can be processed in real time; furthermore, after the to-be-tested device is heated by the electrothermal film, the infrared thermal imaging device is started, so that the position and the general outline of the to-be-tested device can be displayed in the picture of the computer, and subsequent experimenters can conveniently select the corresponding plane structure chart.
S20, carrying out high-voltage discharge on the device to be tested;
preferably, the position of the device to be tested is determined by the electrothermal film in step S10, so that in this step, the electrothermal film can be selectively closed or continuously used during the static test;
optionally, when the device to be tested is subjected to high-voltage discharge, electrostatic arcs with different electric quantities can be shot at the same point to be tested of the multiple devices to be tested, or electrostatic arcs with the same electric quantity can be shot at the same point to be tested of the multiple devices to be tested, or multiple points to be tested can be selected from the devices to be tested, so that the error of the test result is reduced;
s30, shooting and recording the static test area through an infrared thermal imaging device;
specifically, when an electrostatic test is performed, the instantaneous voltage generated during electrostatic discharge usually exceeds 4000 volts, so that the temperature of air at the position where an arc passes is heated to about 6000 ℃ to 7000 ℃ within tens to hundreds of milliseconds, and therefore, when the electrostatic arc passes, a significant high-temperature region is generated along the discharge path of the electrostatic arc.
For the above reasons, when the infrared thermal imaging device is used in the static electricity test, the shooting frame rate of the infrared thermal imaging device is adjusted to be not less than 240 frames, and the shooting resolution of the infrared thermal imaging device is set to be not less than 384 × 288, so as to ensure higher detection accuracy of the high-temperature area; in a preferred embodiment, the shooting frame rate of the infrared thermal imaging device is set to 960 frames; the photographing resolution of the infrared thermal imaging apparatus was set to 640 × 480.
S40, scanning the infrared thermal imaging video frame by frame, and compounding the infrared thermal imaging image during discharging with the planar structure chart of the device to be tested;
in a preferred embodiment, after the static test is finished, the computer outputs the images of the infrared thermal imaging video one by one, the infrared thermal imaging image before discharging is used as a reference frame, and because a highlight/high red area appears in the picture during the static discharge, the rest frames with different brightness from the static test area in the reference frame are identified through an image subtraction algorithm or by using a dynamic threshold segmentation dythreshold operator and conventional blob analysis, and the rest frames are determined as the infrared thermal imaging image during discharging.
Further, the contrast of the infrared thermal imaging image during discharging is increased by gamma correction, so that the discharging path is displayed more clearly; and overlapping and compounding the infrared thermal imaging image with the increased contrast with a planar structure diagram of the device to be detected so as to determine the position corresponding to the electrostatic path.
Preferably, when image composition is carried out, the position and the boundary of the device to be tested are determined through the position where the electric heating film is placed, and meanwhile, the plane structure diagram of the device to be tested is adjusted to be in a proper size, so that the infrared thermal imaging image and the plane structure diagram of the device to be tested can be composited.
And S50, determining the discharge path of the static electricity on the device to be tested.
And determining the corresponding position of the electrostatic discharge path in the planar structure diagram of the device to be tested and/or the corresponding element according to the composite image. After the static test is finished, the infrared thermal imaging video can be repeatedly checked for many times, experimenters are helped to quickly check the device to be tested, and the area damaged by the static shock is checked.
By the detection method, the electrostatic discharge paths and the corresponding positions of the electrostatic discharge paths or the corresponding elements in the electronic device can be visually determined, the detection precision is higher, the electrostatic discharge paths and the corresponding positions or the corresponding elements in the electronic device can be checked repeatedly, and the repeatability is realized.
Example 2
In this embodiment, a system for detecting an electrostatic test discharge path is provided, and in a preferred embodiment, the system includes an electrostatic test board, an electrothermal film, an infrared thermal imager, and a computer.
Preferably, the electrostatic test board is provided with an insulating pad, and the electronic device is placed on the insulating pad to perform electrostatic test; preferably, the electrothermal film is arranged at the corner of the device to be tested and/or the corner of the insulating gasket and used for positioning the static test in the static test board; preferably, the infrared thermal imager is vertically arranged above the static test area and used for shooting and recording the heat change of the device to be tested in the static test process; preferably, the computer is used for storing the planar structure diagram of the device to be tested, compounding the planar structure diagram with the infrared thermal imaging diagram and determining the electrostatic discharge path in the electrostatic test.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (10)
1. A method for detecting an electrostatic test discharge path, comprising:
determining an electrostatic test area in the electrostatic test board;
carrying out high-voltage discharge on a device to be tested;
shooting and recording the static test area through an infrared thermal imaging device;
scanning the infrared thermal imaging video frame by frame, and compounding an infrared thermal imaging image during discharging with a planar structure chart of the device to be detected;
and determining a discharge path of static electricity on the device to be tested.
2. The method for testing according to claim 1, further comprising, before said step of determining an electrostatic test area in an electrostatic test board:
and storing the different plane structure diagrams of the device to be tested into a database of a computer.
3. The method for inspecting in accordance with claim 2, wherein in said step of determining an electrostatic test area in an electrostatic test board, further comprising:
horizontally placing a device to be tested on an insulating gasket of the electrostatic test board, and respectively fixing electric heating films on the insulating gasket and two opposite corners of the device to be tested in an insulating manner;
or, the electric heating films are respectively fixed at least four corners of the device to be tested in an insulating way.
4. The method for inspecting as claimed in claim 3, wherein in the step of determining the electrostatic test area in the electrostatic test board, further comprising:
opening the electrothermal film, and heating the device to be tested through the electrothermal film;
adjusting a camera of the infrared thermal imaging device to be vertical to a detection surface of the device to be detected, starting the infrared thermal imaging device, positioning the static test area, and determining the type and the position of the device to be detected.
5. The method for detecting according to claim 1, wherein in the step of recording the image of the static electricity test area by the infrared thermal imaging device, the method further comprises:
setting a shooting frame rate of the infrared thermal imaging device to be not less than 240 frames; the photographing resolution of the infrared thermal imaging apparatus is set to be not less than 384 × 288.
6. The method for detecting according to claim 5, wherein in the step of recording the image of the static electricity test area by the infrared thermal imaging device, the method further comprises:
setting a shooting frame rate of the infrared thermal imaging device to 960 frames; the photographing resolution of the infrared thermal imaging apparatus was set to 640 × 480.
7. The inspection method according to claim 1, wherein in the step of scanning the infrared thermography video frame by frame and compositing the infrared thermography image during discharging with the planar structure diagram of the device under inspection, the method further comprises:
and outputting the infrared thermal imaging video frame by frame, taking the infrared thermal imaging image before discharging as a reference frame, identifying the other frames with different brightness from the static test area in the reference frame, and determining the other frames as the infrared thermal imaging image during discharging.
8. The inspection method according to claim 7, wherein in the step of scanning the thermal infrared imaging video frame by frame and compositing the thermal infrared imaging image during discharging with the planar structure of the device under test, the method further comprises:
increasing contrast of the infrared thermal imaging image during discharging by utilizing gamma correction;
and compounding the infrared thermal imaging image with the increased contrast with the planar structure chart of the device to be tested.
9. The method of claim 1, wherein the step of determining the discharge path of static electricity in the device under test further comprises:
and determining the corresponding position of the electrostatic discharge path in the planar structure chart of the device to be tested and/or corresponding elements according to the composite image.
10. A detection system for an electrostatic test discharge path, comprising:
-an electrostatic test board for electrostatic testing of the electronic device;
-an electro-thermal film arranged at a corner of a device under test in said electrostatic test board for positioning an electrostatic test area in said electrostatic test board;
an infrared thermal imaging device, vertically arranged above the electrostatic test area, for taking a picture of the thermal variation of the device under test during the electrostatic test;
-computational processing means for analyzing the thermographic ir video and determining the discharge path of the static electricity at the device under test.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210348293.7A CN114966257A (en) | 2022-04-01 | 2022-04-01 | Detection method and system for electrostatic test discharge path |
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| CN202210348293.7A CN114966257A (en) | 2022-04-01 | 2022-04-01 | Detection method and system for electrostatic test discharge path |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298648A (en) * | 2023-05-12 | 2023-06-23 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
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- 2022-04-01 CN CN202210348293.7A patent/CN114966257A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116298648A (en) * | 2023-05-12 | 2023-06-23 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
| CN116298648B (en) * | 2023-05-12 | 2023-09-19 | 合肥联宝信息技术有限公司 | Detection method and device for electrostatic paths and electronic equipment |
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