CN114880219A - Test node configuration method and device, electronic equipment and storage medium - Google Patents
Test node configuration method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The disclosure relates to a test node configuration method, a test node configuration device, an electronic device and a storage medium, wherein the method comprises the following steps: displaying a test node association graph in a display interface, wherein the test node association graph comprises at least one test node pair, the test node pair comprises a first test node and a second test node, and a tail end point of the first test node is connected with a head end point of the second test node; and in response to the operation for editing the attribute of the test node to be configured, displaying the edited attribute information of the test node to be configured in the attribute display area of the display interface, wherein the test node to be configured is any test node in the test node association diagram. By adopting the embodiment of the disclosure, the testing efficiency can be improved.
Description
Technical Field
The present disclosure relates to the field of testing, and in particular, to a method and an apparatus for configuring a test node, an electronic device, and a storage medium.
Background
When the time-consuming test of the product function is carried out, the test nodes need to be preset, and the time consumption of the corresponding function of each test node is determined based on the time information corresponding to the test nodes. For example: when the loading of the test picture is time-consuming, the test for the time-consuming loading of the picture needs to be realized based on the difference between the time corresponding to the node appearing in the picture in the whole test process and the time corresponding to the starting node in the whole test process. That is, before the time-consuming function test is performed, the relationship between the test nodes needs to be preset, so that the time-consuming function test can be performed based on the time information corresponding to each test node.
In the related art, the test nodes are configured in a list manner, and for example, the list of test nodes may be as shown in fig. 1. In the mode of configuring and displaying the test nodes by the list, the interactive relationship among the test nodes is too dispersed, the incidence relationship among the test nodes cannot be directly obtained, and then a complete test node path cannot be directly obtained, so that the test efficiency is low.
Disclosure of Invention
The present disclosure provides a test node configuration method, device, electronic device and storage medium, so as to at least solve the problem of low test efficiency in the related art. The technical scheme of the disclosure is as follows:
according to a first aspect of the embodiments of the present disclosure, a test node configuration method is provided, including:
displaying a test node association graph in a display interface, wherein the test node association graph comprises at least one test node pair, the test node pair comprises a first test node and a second test node, and a tail end point of the first test node is connected with a head end point of the second test node;
and in response to the operation for editing the attribute of the test node to be configured, displaying the edited attribute information of the test node to be configured in the attribute display area of the display interface, wherein the test node to be configured is any test node in the test node association diagram.
In one example, the presenting the test node association graph in the presentation interface includes:
responsive to an operation for selecting the first test node, presenting the first test node in a first presentation manner in a presentation interface;
in response to an operation to create a test node, the second test node is exposed below the first test node in an exposure interface.
In one example, the first test node is connected to the second test node by a connecting line, a first end of the connecting line is connected to a tail end of the first test node, and a second end of the connecting line is connected to a head end of the second test node, and the method further includes:
determining, in response to an operation to determine test node pairs to be adjusted, the test node pairs to be adjusted from the test node association graph;
and responding to the adjustment operation of the connecting line in the test node pair to be adjusted, and adjusting the target end of the connecting line to a target end point connected with a third test node.
In one example, the displaying, in response to the operation for editing the attribute of the test node to be configured, the edited attribute information of the test node to be configured in the attribute display area of the display interface includes:
responding to an operation for selecting a test node to be configured, and displaying attribute information of the test node to be configured in an attribute display area of the display interface, wherein the attribute display area comprises attribute configuration items, and the attribute configuration items are used for configuring the attribute information of the test node to be configured;
and responding to the editing operation aiming at the target attribute configuration item, and displaying the attribute information edited by the test node to be configured in the display interface.
In one example, the attribute configuration items comprise at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item,
the displaying the property information edited by the test node to be configured in the display interface in response to the editing operation for the target property configuration item includes:
responding to the editing operation aiming at the node name configuration item, displaying the edited node name of the test node to be configured in the display area of the test node name to be configured, wherein the display area of the test node name to be configured comprises the node name configuration item and/or the name display area corresponding to the test node to be configured in the test node association diagram; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node image configuration item, and displaying the node image edited by the test node to be configured in the attribute display area; and/or the presence of a gas in the gas,
in response to the editing operation aiming at the node event type configuration item, displaying the node event type of the test node to be configured in a second display mode in the attribute display area; and/or the presence of a gas in the gas,
and responding to the editing operation aiming at the node test threshold configuration item, and displaying the preset presets of the test nodes to be configured in the node test threshold configuration item.
In one example, the method further comprises:
responding to the operation for acquiring the target video, and acquiring the target video;
and responding to the operation for starting the test, executing the test operation based on the test node association diagram, the attribute information of each test node and the target video, and displaying the test result in the test result display area.
According to a second aspect of the embodiments of the present disclosure, there is provided a test node configuration apparatus, including:
the display method comprises the steps that a first display unit is configured to display a test node association graph in a display interface, the test node association graph comprises at least one test node pair, the test node pair comprises a first test node and a second test node, and a tail end point of the first test node is connected with a head end point of the second test node;
and the second display unit is configured to execute an operation for performing attribute editing on the test node to be configured, and display the edited attribute information of the test node to be configured in an attribute display area of the display interface, wherein the test node to be configured is any test node in the test node association diagram.
In one example, the first presentation unit is further configured to perform:
responsive to an operation for selecting the first test node, presenting the first test node in a first presentation manner in a presentation interface;
in response to an operation to create a test node, the second test node is exposed below the first test node in an exposure interface.
In one example, the first test node is connected to the second test node through a connection line, a first end of the connection line is connected to a tail end of the first test node, and a second end of the connection line is connected to a head end of the second test node, and the apparatus further includes:
a first determining unit configured to perform determining a pair of test nodes to be adjusted from the association graph of test nodes in response to an operation for determining the pair of test nodes to be adjusted;
an adjusting unit configured to perform an adjusting operation of the connecting line in response to the test node to be adjusted being aligned with the connecting line, and adjust the target end of the connecting line to a target end point connected with a third test node.
In one example, the second presentation unit is further configured to perform:
responding to an operation for selecting a test node to be configured, and displaying attribute information of the test node to be configured in an attribute display area of the display interface, wherein the attribute display area comprises attribute configuration items, and the attribute configuration items are used for configuring the attribute information of the test node to be configured;
and responding to the editing operation aiming at the target attribute configuration item, and displaying the attribute information edited by the test node to be configured in the display interface.
In one example, the attribute configuration items comprise at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item,
the second presentation unit is further configured to perform:
responding to the editing operation aiming at the node name configuration item, displaying the edited node name of the test node to be configured in the display area of the test node name to be configured, wherein the display area of the test node name to be configured comprises the node name configuration item and/or the name display area corresponding to the test node to be configured in the test node association diagram; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node image configuration item, and displaying the node image edited by the test node to be configured in the attribute display area; and/or the presence of a gas in the gas,
in response to the editing operation aiming at the node event type configuration item, displaying the node event type of the test node to be configured in a second display mode in the attribute display area; and/or the presence of a gas in the gas,
and responding to the editing operation aiming at the node test threshold configuration item, and displaying the preset presets of the test nodes to be configured in the node test threshold configuration item.
In one example, the apparatus further comprises:
an acquisition unit configured to execute acquisition of a target video in response to an operation for acquiring the target video;
and the third display unit is configured to execute a test operation in response to an operation for starting a test, execute a test operation based on the test node association diagram, the attribute information of each test node and the target video, and display a test result in a test result display area.
According to a third aspect of the embodiments of the present disclosure, there is provided an electronic apparatus including:
a processor;
a memory for storing the processor-executable instructions;
wherein the processor is configured to execute the instructions to implement the test node configuration method of any one of the preceding claims.
According to a fourth aspect of embodiments of the present disclosure, there is provided a computer-readable storage medium, wherein instructions, when executed by a processor of an electronic device, enable the electronic device to perform a test node configuration method as defined in any one of the preceding claims.
According to a fifth aspect of embodiments of the present disclosure, there is provided a computer program product comprising instructions which, when executed by a processor of an electronic device, enable the electronic device to perform a test node configuration method as defined in any one of the preceding claims.
The technical scheme provided by the embodiment of the disclosure at least brings the following beneficial effects:
the test node configuration method, the test node configuration device, the electronic device and the storage medium provided by the embodiments of the present disclosure can show a test node association diagram in a display interface, where the test node association diagram includes at least one test node pair, the test node pair includes a first test node and a second test node, and a tail end of the first test node is connected to a head end of the second test node. Furthermore, in response to the operation for editing the attribute of the test node to be configured, the attribute information edited by the test node to be configured is displayed in the attribute display area of the display interface. Based on the test node configuration method, the test node configuration device, the electronic equipment and the storage medium provided by the embodiment of the disclosure, the incidence relation among the test nodes can be visually represented through the test node association diagram, and then the incidence relation among the test nodes and the test node path can be directly obtained according to the test node association diagram, so that the test efficiency can be improved, and the configuration of the test nodes can be realized in a view mode, so that the configuration process of the test nodes can be simplified, and the configuration efficiency of the test nodes can be improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present disclosure and, together with the description, serve to explain the principles of the disclosure and are not to be construed as limiting the disclosure.
FIG. 1 is a schematic diagram illustrating a test node list in accordance with an exemplary embodiment.
FIG. 2 is a flow chart illustrating a method of test node configuration in accordance with an exemplary embodiment.
FIG. 3 is a schematic diagram illustrating a presentation interface in accordance with an exemplary embodiment.
FIG. 4 is a flow chart illustrating a method of test node configuration in accordance with an exemplary embodiment.
FIG. 5 is a flowchart illustrating a test node configuration method in accordance with an exemplary embodiment.
FIG. 6 is a flow chart illustrating a method of test node configuration in accordance with an exemplary embodiment.
FIG. 7 is a flowchart illustrating a method of test node configuration in accordance with an exemplary embodiment.
FIG. 8 is a schematic diagram illustrating a test node configuration method in accordance with an exemplary embodiment.
FIG. 9 is a block diagram illustrating a test node configuration apparatus in accordance with an exemplary embodiment.
FIG. 10 is a block diagram illustrating an electronic device in accordance with an example embodiment.
Detailed Description
In order to make the technical solutions of the present disclosure better understood, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the accompanying drawings.
It should be noted that the terms "first," "second," and the like in the description and claims of the present disclosure and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the disclosure described herein are capable of operation in sequences other than those illustrated or otherwise described herein. The implementations described in the exemplary embodiments below are not intended to represent all implementations consistent with the present disclosure. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the present disclosure, as detailed in the appended claims.
It should also be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data for presentation, analyzed data, etc.) referred to in the present disclosure are both information and data that are authorized by the user or sufficiently authorized by various parties.
In an embodiment, as shown in fig. 2, a test node configuration method is provided, and this embodiment is illustrated by applying the method to a terminal, and it is to be understood that the method may also be applied to a server, and may also be applied to a system including the terminal and the server, and is implemented by interaction between the terminal and the server. In this embodiment, the method includes the steps of:
in step 202, a test node association graph is displayed in the display interface, the test node association graph includes at least one test node pair, the test node pair includes a first test node and a second test node, and a tail end of the first test node is connected to a head end of the second test node.
In the embodiment of the disclosure, when performing a function time-consuming test, a corresponding test node may be set for each function to be tested, and an association relationship between the test nodes may be set, where the association relationship between the test nodes may include a relationship between a parent node and a child node. When performing a function time consumption test, the time consumption of the function corresponding to the child node is a difference obtained by subtracting a time node corresponding to the child node from a time node corresponding to the parent node, for example: and the starting test node is a father node of the test node appearing in the picture, and the time consumed for the picture to appear is the difference value between the time node corresponding to the starting test node and the time node corresponding to the test node appearing in the picture.
In the embodiment of the present disclosure, after the test nodes are created, the association relationship between the test nodes may be displayed through a test node association diagram, where the test node association diagram includes each test node, any two test nodes having the association relationship may form a test node pair, two test nodes in the test node pair have a connection relationship in the test node association diagram, and a tail end point of a first test node serving as a parent node is connected to a head end point of a second test node serving as a child node.
Illustratively, referring to the test node association diagram shown in fig. 3, the present example includes four test nodes in total, including start-up, frame occurrence, bundle (package) download, and download completion, and there are 3 test node pairs, which are respectively a first test node pair composed of the start-up test node and the frame occurrence test node, a second test node pair composed of the start-up test node and the bundle download test node, and a third test node pair composed of the bundle download test node and the download completion test node. Taking the first test node pair as an example, the start test node is a father node, the picture appearance test node is a child node, and the tail end point of the start test node and the head end point of the picture appearance test node are connected by a line segment.
In step 204, in response to the operation for editing the attribute of the test node to be configured, the edited attribute information of the test node to be configured is displayed in the attribute display area of the display interface, and the test node to be configured is any test node in the test node association diagram.
In the embodiment of the disclosure, the display interface includes an attribute display area, and the attribute display area is used for displaying attribute information of the test node to be configured. Any test node to be subjected to attribute configuration in the test node association diagram can be used as a test node to be configured, the attribute information of the test node to be configured can be edited in the attribute display area in response to the operation for performing attribute editing on the test node to be configured, and the edited attribute information of the test node to be configured is displayed in the attribute display area after the editing is completed.
For example, referring to fig. 3, if the test node that has completed downloading is taken as the test node to be configured, the attribute display area may display the attribute information of the test node that has completed downloading. Furthermore, in response to the operation for performing attribute editing on the downloaded test node, the attribute information after editing the downloaded test node may be displayed at a corresponding position in the attribute display area.
The test node configuration method provided by the embodiment of the disclosure can display a test node association diagram in a display interface, where the test node association diagram includes at least one test node pair, the test node pair includes a first test node and a second test node, and a tail end of the first test node is connected to a head end of the second test node. Furthermore, in response to the operation for editing the attribute of the test node to be configured, the attribute information edited by the test node to be configured is displayed in the attribute display area of the display interface. Based on the test node configuration method provided by the embodiment of the disclosure, the incidence relation between the test nodes can be visually represented through the test node incidence graph, and then the incidence relation between the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, referring to fig. 4, in step 202, a test node association graph is presented in a presentation interface, which may be implemented by the following steps:
in step 402, in response to an operation for selecting a first test node, displaying the first test node in a first display mode in a display interface;
in step 404, the second test node is exposed below the first test node in the exposure interface in response to the operation for creating the test node.
In the embodiment of the disclosure, the test node association diagram can be displayed in the display interface in response to the creation operation of the user on the test node. Illustratively, when the first test node is created, the test node association graph only includes one test node, and the test node is a test node carried in the test node association graph and does not need to be manually created by a user.
Before creating a test node, a user needs to determine a parent node of the test node to be created, and select the parent node through an operation for selecting the parent node. For example, taking a first test node as a parent node of a second test node to be created as an example, the first test node may be selected through a selection operation (for example, a single click, a double click, a touch, and the like, which is not specifically limited in the embodiments of the present disclosure), and a terminal device may respond to the selection operation on the first test node and display the first test node in a first display manner in a display interface to represent that the first test node has been selected as the parent node of the second test node to be created. The first display mode is a preset display mode, for example, the display mode may be a highlight display mode, a virtual frame mark display mode, and the like.
After the first test node is selected, a second test node may be created and exposed in the exposure interface further in response to the operation for creating a test node. For example, a test node creation control is included in the presentation interface, the operation for creating the test node may include a trigger operation for the test node creation control, the terminal may respond to the trigger operation for the test node creation control, present a second test node below the first test node in the presentation interface, where a head end point of the second test node is connected to a tail end point of the first test node by a line segment, and may add a record that a child node includes the second test node in the attribute data of the first test node, and add a record that a parent node includes the first test node in the attribute data of the second test node.
In one example, after the test nodes with the first test node as the parent node are generated, the test nodes are automatically displayed at the preset position on the lower right of the first test node, and further, the test nodes can be moved to the target position in response to the dragging operation for each test node. For example: after the second test node is generated, the second test node may be displayed at a preset position below and to the right of the first test node, and the second test node may be moved to a target position by a drag operation when the preset position has displayed a test node associated with the first test node.
Or, in another example, the first child node of the first test node may be displayed at the preset position below and to the right, and in the case of generating the second test node, if there is a sibling node in the second test node, the second test node may be displayed at the preset position below and to the left of the sibling node, otherwise, the second test node is displayed at the preset position below and to the right of the first test node. For example: after a third test node having the first test node as a parent node has been exposed, the second test node may be exposed at a preset location below and to the left of the third test node.
Based on the test node configuration method provided by the embodiment of the disclosure, the incidence relation among the test nodes can be configured in a view mode to obtain a test node incidence graph, so that the configuration process of the test nodes can be simplified, and the configuration efficiency of the test nodes can be improved; the incidence relation among the test nodes is visually represented through the test node incidence graph, and then the incidence relation among the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, the first test node is connected to the second test node through a connection line, a first end of the connection line is connected to the tail end of the first test node, and a second end of the connection line is connected to the head end of the second test node, and as shown in fig. 5, the method may further include:
in step 502, in response to the operation for determining the test node pairs to be adjusted, determining the test node pairs to be adjusted from the test node association graph;
in step 504, in response to the adjusting operation of the connecting line in the pair of test nodes to be adjusted, the target end of the connecting line is adjusted to the target end point connected to the third test node.
In the embodiment of the disclosure, the incidence relation of the test nodes in the test node incidence graph can be adjusted. For example, the operation for determining the test node pair to be adjusted may include selecting a connecting line for connecting the first test node and the second test node, and in response to the operation selected for the connecting line, the test node pair composed of the first test node and the second test node may be taken as the test node pair to be adjusted. And after the test node to be adjusted is determined, the target end of the connecting line in the test node to be adjusted can be adjusted to the target end point connected with the third test node through operations such as dragging. After the drag adjustment of the connecting line in the test node pair to be adjusted is completed, the attribute data of the test node can be updated according to the incidence relation among the adjusted test nodes.
For example, after determining the pair of test nodes to be adjusted, if it is required that the parent node of the second test node is adjusted to be the third test node, the target end of the connecting line is the first end, and the target end of the third test node is the tail end, the first end of the connecting line in the pair of test nodes to be adjusted may be adjusted to be the tail end of the third test node by dragging the first end of the connecting line in the pair of test nodes to be adjusted, and the record of the second test node may be deleted in the child node of the attribute data of the first test node, the parent node is updated from the first test node to the third test node in the attribute data of the second test node, and the record of the second test node is added in the child node of the attribute data of the third test node.
Or, if the child node of the first test node needs to be adjusted to be the third test node, the target end of the connecting line is the second end, and the target end of the third test node is the head end, the second end of the connecting line in the test node to be adjusted can be adjusted to be the head end connected to the third test node from the head end connected to the second test node by dragging the first end of the connecting line in the test node to be adjusted and the like. And the child node can be updated from the second test node to a third test node in the child node of the attribute data of the first test node, the first test node is deleted in the parent node of the attribute data of the second test node, and the record of the first test node is added in the parent node of the attribute data of the third test node.
Based on the test node configuration method provided by the embodiment of the disclosure, the incidence relation between the test nodes can be adjusted by adjusting the connecting line in the test node to be adjusted, the configuration process of the test nodes can be simplified, and the configuration efficiency of the test nodes can be improved; the incidence relation among the test nodes is visually represented through the test node incidence graph, and then the incidence relation among the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, referring to fig. 6, in step 204, in response to an operation for performing attribute editing on a test node to be configured, displaying attribute information edited by the test node to be configured in an attribute display area of a display interface, which may be implemented by the following steps:
in step 602, in response to an operation for selecting a test node to be configured, displaying attribute information of the test node to be configured in an attribute display area of a display interface, where the attribute display area includes an attribute configuration item, and the attribute configuration item is used to configure the attribute information of the test node to be configured;
in step 604, in response to the editing operation for the target attribute configuration item, the edited attribute information of the test node to be configured is displayed in the display interface.
In the embodiment of the present disclosure, the test node to be configured may be a test node to be configured with attribute information, for example: after the test node is created and displayed in response to the trigger operation of creating the control for the test node, if the current attribute information of the test node is null or preset information, the test node may be determined as a test node to be configured. Or, in a case that the attribute information of the test node needs to be updated and modified, the test node may be used as a test node to be configured.
After the test node to be configured is determined, the current attribute information of the test node to be configured can be displayed in the attribute display area of the display interface. The attribute display area comprises a plurality of attribute configuration items, and each attribute configuration item is used for configuring and displaying each item of attribute information of the test node to be configured. For example: the attribute configuration items may include a node name configuration item, a node image configuration item, and the like, where the node name configuration item may be used to configure and display a node name of the test node to be configured, and the node image configuration item may be used to configure and display a node image corresponding to the test node to be configured.
And the target attribute configuration item is an attribute configuration item corresponding to the attribute information to be adjusted of the test node to be configured. The editing operation for the target property configuration item may include an operation of inputting/uploading/selecting property information performed in the target property configuration item. The user can edit the attribute information of the test node to be configured through the target attribute configuration item, and after the editing of the attribute information is completed, the edited attribute information can be displayed in a display interface.
Based on the test node configuration method provided by the embodiment of the disclosure, the attribute information of the test node to be configured can be configured in a visual mode, the configuration process of the test node can be simplified, and the configuration efficiency of the test node is improved; the incidence relation among the test nodes is visually represented through the test node incidence graph, and then the incidence relation among the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, the attribute configuration item includes at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item, in step 504, in response to an editing operation on the target attribute configuration item, the edited attribute information of the test node to be configured is displayed in the display interface, and the following steps may be implemented:
responding to the editing operation aiming at the node name configuration item, displaying the node name edited by the test node to be configured in the display area of the test node name to be configured, wherein the display area of the test node name to be configured comprises the node name configuration item and/or a name display area corresponding to the test node to be configured in the test node association diagram; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node image configuration item, and displaying the node image edited by the test node to be configured in the attribute display area; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node event type configuration item, and displaying the node event type of the test node to be configured in the attribute display area in a second display mode; and/or the presence of a gas in the gas,
and responding to the editing operation aiming at the node test threshold configuration item, and displaying the preset presets of the test nodes to be configured in the node test threshold configuration item.
In the embodiment of the present disclosure, the test node may include attribute information such as a node name, a node image, a node event type, and a node test threshold, where the node name is a name of the test node defined by the user. The node image is an image used for representing the test node in the test process, and when the node image is identified from the target video data in the test process, the corresponding time information of the node image in the target video data can be used as a time node corresponding to the test node, so that the time-consuming function test can be realized based on the time node corresponding to the test node.
The node event type is used for representing a node type of the test node, for example, the node type of the test node may include a when-component-appears type and a when-component-disappears type, and when the node type of the test node is the when-component-appears type, corresponding time information when the node image is identified from the target video data in the test process may be used as a time node corresponding to the test node; or, when the node type of the test node is the component disappearance type, after the node image is identified from the target video data in the test process, the corresponding time information when the node image disappears can be used as the time node corresponding to the test node.
The node test threshold is used to constrain the test accuracy for the test node. For example, in the testing process, when the similarity between the currently played video frame image in the target video data and the node image is higher than the node testing threshold, the node image identifying the testing node may be determined.
For example, the attribute configuration items displayed in the attribute display area may include at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item. The node name configuration item may be used to configure a node name of the test node to be configured, the node image configuration item may be used to configure a node image corresponding to the test node to be configured, the node time type configuration item may be used to configure a node event type corresponding to the test node to be configured, and the node test threshold configuration item may be used to configure a node test threshold corresponding to the test node to be configured.
Referring to fig. 3, the attribute configuration items displayed in the attribute display area may include a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item. After the user selects the test node to be configured, the attribute information of the test node to be configured can be displayed in the attribute display area.
In an example, the node name configuration item includes an input box, and the user may input a node name "download complete" of the test node to be configured in the input box, and then show the node name "download complete" of the test node to be configured in the input box of the node name configuration item, and show the node name "download complete" of the test node to be configured in the name display area of the test node to be configured in the test node association diagram.
In an example, the node image configuration item may include two controls, image interception and image upload. The user can trigger the image capturing control to trigger the image capturing function to take the captured image as the node image, or the user can trigger the image uploading control to trigger the image uploading function to take the uploaded image as the node image. And displaying the acquired node image in an image display area below the control.
In an example, the node event type configuration item may include a component appearing type option and a component disappearing type option, and the user may configure the node event type of the test node to be configured by selecting the component appearing type option or the component disappearing type option, and display the selected node event type option of the test node to be configured in a second display mode (a display mode such as highlighting, font color conversion, and the like).
In an example, the node test threshold configuration item includes a drop-down box (or may also be an input box), and the user may select to input the node test threshold of the test node to be configured in the drop-down box, and then show the node test threshold (e.g., 0.9) of the test node to be configured in the drop-down box of the node test threshold configuration item.
In an example, the attribute display area may further include a deletion control, after the test node to be configured is selected, the deletion control may be triggered to delete the test node to be configured from the test node association diagram, and the attribute data of each test node is updated according to the deleted test node to be configured, that is, the record about the test node to be configured in the attribute data of each test node is deleted.
Based on the test node configuration method provided by the embodiment of the disclosure, the attribute information of the test node to be configured can be configured in a visual mode, the configuration process of the test node can be simplified, and the configuration efficiency of the test node is improved; the incidence relation among the test nodes is visually represented through the test node incidence graph, and then the incidence relation among the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, as shown in fig. 7, the method may further include:
in step 702, in response to an operation for acquiring a target video, acquiring the target video;
in step 704, in response to the operation for starting the test, a test operation is performed based on the test node association map, the attribute information of each test node, and the target video, and the test result is displayed in the test result display area.
In the embodiment of the disclosure, the time-consuming test of the product function can be performed based on the target video. Illustratively, a video of the usage process may be captured during the usage of the product (experiencing the various functions of the product). The display interface may include a video set control and a start test control, and the operation for acquiring the target video may include that the user triggers the video set control to start a video upload function to upload at least one captured video as the target video.
The operation for initiating the test may include a trigger operation for initiating the test control. The terminal can respond to the trigger operation aiming at the starting test control, execute the time-consuming test operation of the function based on the incidence relation of each test node, the attribute information of each test node and the target video shown by the incidence graph of the test nodes, determine the function node corresponding to each test node based on the identified time node when the node image of each test node is in the node test type, and determine the time consumption of the function of each test node based on the incidence relation among the test nodes to obtain the test result. The test result display area may include a test result display area of each test node, and the test result display area may display the test result of each test node, and when a plurality of target videos are included, the test result of each target video may be displayed in the test node display area of each test node, or the corresponding test result may be displayed for each target video.
Based on the test node configuration method provided by the embodiment of the disclosure, the test node association graph can be configured in a visual mode, the configuration process of the test node can be simplified, and the configuration efficiency of the test node is improved; the incidence relation among the test nodes is visually represented through the test node incidence graph, and then the incidence relation among the test nodes can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In order that those skilled in the art will better understand the embodiments of the present disclosure, the embodiments of the present disclosure are described below by way of specific examples.
Referring to fig. 8, in this example, a user clicks to create or edit different test nodes in the process of editing the test nodes, and the test nodes are directly linked with each other and finally connected in series to form a complete test node path. The user can create a control by triggering the test node, and add the test node. The code side generates a svg rect (rectangle), and generates the name of a test node and the end points of two sides (the test node connected with the head end point and/or the test node connected with the tail end point) to the svg rect, and then adds the test node to the canvas of the exhibition interface.
And triggering the highlight display of the test node to be configured by selecting the test node to be configured by the user, and displaying the attribute information corresponding to the test node to be configured in the right attribute display area. The user can modify the attributes of the node name, the node test threshold value, the node image and the like of the test node to be configured in the attribute display area according to the own requirements.
The user can create a plurality of test nodes by repeating the process to obtain the test node association diagram.
According to the test node configuration method provided by the embodiment of the disclosure, the association relationship between the test nodes and the attribute information of the test nodes are visually displayed through the test node association diagram, the configuration of the test nodes in the brain graph form is supported, the problem of editing the test nodes in the brain graph form is solved, one father node in the test node association diagram can have a plurality of child nodes, and the problem that the embodiment of the disclosure supports a plurality of subsets of test nodes is also solved.
It should be understood that although the various steps in the flowcharts of fig. 1-8 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-9 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, which are not necessarily performed in sequence, but may be performed in turn or alternately with other steps or at least some of the other steps or stages.
It is understood that the same/similar parts between the embodiments of the method described above in this specification can be referred to each other, and each embodiment focuses on the differences from the other embodiments, and it is sufficient that the relevant points are referred to the descriptions of the other method embodiments.
FIG. 9 is a block diagram illustrating a test node configuration apparatus according to an example embodiment. Referring to fig. 9, the apparatus includes a first display unit 902 and a second display unit 904.
A first presentation unit 902 configured to perform presentation of a test node association graph in a presentation interface, where the test node association graph includes at least one test node pair, the test node pair includes a first test node and a second test node, and a tail end of the first test node is connected to a head end of the second test node;
the second display unit 904 is configured to perform, in response to an operation for performing attribute editing on a test node to be configured, display the attribute information edited by the test node to be configured in an attribute display area of the display interface, where the test node to be configured is any test node in the test node association graph.
The test node configuration device provided by the embodiment of the disclosure can display a test node association diagram in a display interface, where the test node association diagram includes at least one test node pair, the test node pair includes a first test node and a second test node, and a tail end of the first test node is connected to a head end of the second test node. Further, in response to the operation for editing the attribute of the test node to be configured, the edited attribute information of the test node to be configured is displayed in the attribute display area of the display interface. Based on the test node configuration device provided by the embodiment of the disclosure, the incidence relation between the test nodes can be visually represented through the test node incidence graph, and then the incidence relation between the test nodes and the test node path can be directly obtained according to the test node incidence graph, so that the test efficiency can be improved.
In an exemplary embodiment, the first presentation unit 902 is further configured to perform:
responsive to an operation for selecting the first test node, presenting the first test node in a first presentation manner in a presentation interface;
in response to an operation to create a test node, the second test node is exposed below the first test node in an exposure interface.
In one example, the first test node is connected to the second test node through a connection line, a first end of the connection line is connected to a tail end of the first test node, and a second end of the connection line is connected to a head end of the second test node, and the apparatus further includes:
a first determining unit configured to perform determining a pair of test nodes to be adjusted from the association graph of test nodes in response to an operation for determining the pair of test nodes to be adjusted;
an adjusting unit configured to perform an adjusting operation of the connecting line in response to the test node to be adjusted being aligned with the connecting line, and adjust the target end of the connecting line to a target end point connected with a third test node.
In one example, the second presenting unit 904 is further configured to perform:
responding to an operation for selecting a test node to be configured, and displaying attribute information of the test node to be configured in an attribute display area of the display interface, wherein the attribute display area comprises attribute configuration items, and the attribute configuration items are used for configuring the attribute information of the test node to be configured;
and responding to the editing operation aiming at the target attribute configuration item, and displaying the attribute information edited by the test node to be configured in the display interface.
In one example, the attribute configuration items comprise at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item,
the second presentation unit 904, further configured to perform:
responding to the editing operation aiming at the node name configuration item, displaying the edited node name of the test node to be configured in the display area of the test node name to be configured, wherein the display area of the test node name to be configured comprises the node name configuration item and/or the name display area corresponding to the test node to be configured in the test node association diagram; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node image configuration item, and displaying the node image edited by the test node to be configured in the attribute display area; and/or the presence of a gas in the gas,
in response to the editing operation aiming at the node event type configuration item, displaying the node event type of the test node to be configured in a second display mode in the attribute display area; and/or the presence of a gas in the gas,
and responding to the editing operation aiming at the node test threshold configuration item, and displaying the preset presets of the test nodes to be configured in the node test threshold configuration item.
In one example, the apparatus further comprises:
an acquisition unit configured to execute acquisition of a target video in response to an operation for acquiring the target video;
and the third display unit is configured to execute a test operation in response to an operation for starting a test, execute a test operation based on the test node association diagram, the attribute information of each test node and the target video, and display a test result in a test result display area.
With regard to the apparatus in the above-described embodiment, the specific manner in which each module performs the operation has been described in detail in the embodiment related to the method, and will not be elaborated here.
FIG. 10 is a block diagram illustrating an electronic device 1000 for a test node configuration method in accordance with an exemplary embodiment. For example, the electronic device 1000 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a gaming console, a tablet device, a medical device, a fitness device, a personal digital assistant, and so forth.
Referring to fig. 10, electronic device 1000 may include one or more of the following components: processing component 1002, memory 1004, power component 1006, multimedia component 1008, audio component 1010, interface to input/output (I/O) 1012, sensor component 1014, and communications component 1016.
The processing component 1002 generally controls the overall operation of the electronic device 1000, such as operations associated with display, telephone calls, data communications, camera operations, and recording operations. The processing components 1002 may include one or more processors 1020 to execute instructions to perform all or a portion of the steps of the methods described above. Further, processing component 1002 may include one or more modules that facilitate interaction between processing component 1002 and other components. For example, the processing component 1002 may include a multimedia module to facilitate interaction between the multimedia component 1008 and the processing component 1002.
The memory 1004 is configured to store various types of data to support operations at the electronic device 1000. Examples of such data include instructions for any application or method operating on the electronic device 1000, contact data, phonebook data, messages, pictures, videos, and so forth. The memory 1004 may be implemented by any type or combination of volatile or non-volatile storage devices, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk, optical disk, or graphene memory.
The power supply component 1006 provides power to the various components of the electronic device 1000. The power components 1006 may include a power management system, one or more power sources, and other components associated with generating, managing, and distributing power for the electronic device 1000.
The multimedia component 1008 includes a screen that provides an output interface between the electronic device 1000 and a user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive an input signal from a user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundary of a touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 1008 includes a front facing camera and/or a rear facing camera. The front camera and/or the rear camera may receive external multimedia data when the electronic device 1000 is in an operating mode, such as a shooting mode or a video mode. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.
The audio component 1010 is configured to output and/or input audio signals. For example, the audio component 1010 includes a Microphone (MIC) configured to receive external audio signals when the electronic device 1000 is in an operational mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signal may further be stored in the memory 1004 or transmitted via the communication component 1016. In some embodiments, audio component 1010 also includes a speaker for outputting audio signals.
I/O interface 1012 provides an interface between processing component 1002 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to: a home button, a volume button, a start button, and a lock button.
The sensor assembly 1014 includes one or more sensors for providing various aspects of status assessment for the electronic device 1000. For example, the sensor assembly 1014 may detect an open/closed state of the electronic device 1000, the relative positioning of components, such as a display and keypad of the electronic device 1000, the sensor assembly 1014 may also detect a change in the position of the electronic device 1000 or components of the electronic device 1000, the presence or absence of user contact with the electronic device 1000, orientation or acceleration/deceleration of the device 1000, and a change in the temperature of the electronic device 1000. The sensor assembly 1014 may include a proximity sensor configured to detect the presence of a nearby object in the absence of any physical contact. The sensor assembly 1014 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 1014 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.
The communication component 1016 is configured to facilitate wired or wireless communication between the electronic device 1000 and other devices. The electronic device 1000 may access a wireless network based on a communication standard, such as WiFi, a carrier network (such as 2G, 3G, 4G, or 5G), or a combination thereof. In an exemplary embodiment, the communication component 1016 receives a broadcast signal or broadcast related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communications component 1016 further includes a Near Field Communication (NFC) module to facilitate short-range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, Ultra Wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.
In an exemplary embodiment, the electronic device 1000 may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), controllers, micro-controllers, microprocessors, or other electronic components for performing the above-described methods.
In an exemplary embodiment, a computer-readable storage medium comprising instructions, such as the memory 1004 comprising instructions, executable by the processor 1020 of the electronic device 1000 to perform the above-described method is also provided. For example, the computer readable storage medium may be a ROM, a Random Access Memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like.
In an exemplary embodiment, a computer program product is also provided, which includes instructions executable by the processor 1020 of the electronic device 1000 to perform the above-described method.
It should be noted that the descriptions of the above-mentioned apparatus, the electronic device, the computer-readable storage medium, the computer program product, and the like according to the method embodiments may also include other embodiments, and specific implementations may refer to the descriptions of the related method embodiments, which are not described in detail herein.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It will be understood that the present disclosure is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (10)
1. A method for configuring a test node, comprising:
displaying a test node association graph in a display interface, wherein the test node association graph comprises at least one test node pair, the test node pair comprises a first test node and a second test node, and a tail end point of the first test node is connected with a head end point of the second test node;
and in response to the operation for editing the attribute of the test node to be configured, displaying the edited attribute information of the test node to be configured in the attribute display area of the display interface, wherein the test node to be configured is any test node in the test node association diagram.
2. The method of claim 1, wherein the presenting the test node association graph in the presentation interface comprises:
responsive to an operation for selecting the first test node, presenting the first test node in a first presentation manner in a presentation interface;
in response to an operation to create a test node, the second test node is exposed below the first test node in an exposure interface.
3. The method of claim 1 or 2, wherein the first test node is connected to the second test node by a connecting line, a first end of the connecting line is connected to a tail terminal of the first test node, and a second end of the connecting line is connected to a head terminal of the second test node, the method further comprising:
determining, in response to an operation to determine test node pairs to be adjusted, the test node pairs to be adjusted from the test node association graph;
and responding to the adjustment operation of the connecting line in the test node pair to be adjusted, and adjusting the target end of the connecting line to a target end point connected with a third test node.
4. The method according to claim 1 or 2, wherein the displaying the edited attribute information of the test node to be configured in the attribute display area of the display interface in response to the operation for editing the attribute of the test node to be configured comprises:
responding to an operation for selecting a test node to be configured, and displaying attribute information of the test node to be configured in an attribute display area of the display interface, wherein the attribute display area comprises attribute configuration items, and the attribute configuration items are used for configuring the attribute information of the test node to be configured;
and responding to the editing operation aiming at the target attribute configuration item, and displaying the attribute information edited by the test node to be configured in the display interface.
5. The method of claim 4, wherein the attribute configuration items comprise at least one of a node name configuration item, a node image configuration item, a node event type configuration item, and a node test threshold configuration item,
the displaying the property information edited by the test node to be configured in the display interface in response to the editing operation for the target property configuration item includes:
responding to the editing operation aiming at the node name configuration item, displaying the edited node name of the test node to be configured in the display area of the test node name to be configured, wherein the display area of the test node name to be configured comprises the node name configuration item and/or the name display area corresponding to the test node to be configured in the test node association diagram; and/or the presence of a gas in the gas,
responding to the editing operation aiming at the node image configuration item, and displaying the node image edited by the test node to be configured in the attribute display area; and/or the presence of a gas in the gas,
in response to the editing operation aiming at the node event type configuration item, displaying the node event type of the test node to be configured in a second display mode in the attribute display area; and/or the presence of a gas in the gas,
and responding to the editing operation aiming at the node test threshold configuration item, and displaying the preset presets of the test nodes to be configured in the node test threshold configuration item.
6. The method according to claim 1 or 2, characterized in that the method further comprises:
responding to the operation for acquiring the target video, and acquiring the target video;
and responding to the operation for starting the test, executing the test operation based on the test node association diagram, the attribute information of each test node and the target video, and displaying the test result in the test result display area.
7. A test node configuration apparatus, comprising:
the display method comprises the steps that a first display unit is configured to display a test node association graph in a display interface, the test node association graph comprises at least one test node pair, the test node pair comprises a first test node and a second test node, and a tail end point of the first test node is connected with a head end point of the second test node;
and the second display unit is configured to execute an operation for performing attribute editing on the test node to be configured, and display the edited attribute information of the test node to be configured in an attribute display area of the display interface, wherein the test node to be configured is any test node in the test node association diagram.
8. An electronic device, comprising:
a processor;
a memory for storing the processor-executable instructions;
wherein the processor is configured to execute the instructions to implement the test node configuration method of any of claims 1 to 6.
9. A computer-readable storage medium, wherein instructions in the computer-readable storage medium, when executed by a processor of an electronic device, enable the electronic device to perform the test node configuration method of any of claims 1 to 6.
10. A computer program product comprising instructions which, when executed by a processor of an electronic device, enable the electronic device to perform the test node configuration method of any one of claims 1 to 6.
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