CN114879789A - Trimming integrated circuit capable of bidirectional automatic tracking - Google Patents
Trimming integrated circuit capable of bidirectional automatic tracking Download PDFInfo
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- CN114879789A CN114879789A CN202210388617.XA CN202210388617A CN114879789A CN 114879789 A CN114879789 A CN 114879789A CN 202210388617 A CN202210388617 A CN 202210388617A CN 114879789 A CN114879789 A CN 114879789A
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
- G05F1/10—Regulating voltage or current
- G05F1/46—Regulating voltage or current wherein the variable actually regulated by the final control device is dc
- G05F1/56—Regulating voltage or current wherein the variable actually regulated by the final control device is dc using semiconductor devices in series with the load as final control devices
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Abstract
The application provides a trimming integrated circuit capable of bidirectional automatic tracking. The trimming integrated circuit capable of bidirectional automatic tracking comprises: a bandgap reference module 10, the bandgap reference module 10 being configured to generate a bandgap reference voltage; a voltage buffer 20, a positive input end of the voltage buffer 20 is connected to the bandgap reference module 10, and a negative input end and an output end of the voltage buffer 20 are respectively connected to a first end of the internal trimming resistor string 30; the internal trimming resistor string 30, a second end of the internal trimming resistor string 30 is grounded; and a first end of the correction counter module 40 is connected to a first end of the internal trimming resistor string 30, a second end of the correction counter module 40 receives the first internal signal, a third end of the correction counter module 40 is connected to a sliding end of the internal trimming resistor string 30, and the correction counter module 40 is configured to trim a required target value upward or downward.
Description
Technical Field
The invention relates to the field of integrated circuits, in particular to a trimming integrated circuit capable of bidirectional automatic tracking.
Background
In the ic internal value calibration, a Chip Combining (CP) trimming is usually required. After the internal reference value is tested, the Fuse is burnt by laser or large current during the middle test to realize parameter trimming. Before trimming, the chip needs to be tested to read the internal reference value. In the testing process, an actual value is usually required to be tested, a trimming bit of a target value required to be trimmed is obtained through calculation, and then trimming correction is performed.
When testing the lithium battery protection chip, a voltage scanning mode is usually adopted for testing. In order to ensure a high yield of the product, a large trimming range is usually required. Therefore, a larger scan of the circuit is performed before trimming. In order to ensure that an accurate value is tested in the scanning process, when each gear is scanned, the circuit is waited to be tested after being stabilized.
Internal reference trimming of integrated circuits is typically implemented with CP. Three steps are required, namely, scan testing, calculating a trimming value and blowing a filling signal on an Integrated Circuit (IC) chip. Before trimming, the chip needs to be tested to read the internal reference value. During the test, a voltage scan is usually used. In order to ensure that an accurate value is tested during the scanning process, each gear is scanned, and the circuit needs to be tested after being stabilized. The higher the trimming precision is, the more scanning steps are, and the longer the testing time is. This results in longer testing time and increased testing costs. In addition, the trimming step is usually a design value, and a deviation may exist between the design value and a real value due to the influence of an integrated circuit process and a device parasitic parameter, so that high-precision trimming has an error.
Disclosure of Invention
The application provides a trimming integrated circuit capable of bidirectional automatic tracking, which can trim a required target value quickly upwards or downwards through a correction counter module. The method avoids the error caused by internal mismatch during trimming calculation in the prior art, and can avoid the condition that the trimming can be tracked only in one direction in the prior art.
In view of the foregoing, a first aspect of the present application provides a trimming ic capable of bidirectional auto-tracing. The trimming integrated circuit capable of bidirectional automatic tracking comprises: a bandgap reference module 10, the bandgap reference module 10 being configured to generate a bandgap reference voltage; a voltage buffer 20, a positive input end of the voltage buffer 20 is connected to the bandgap reference module 10, and a negative input end and an output end of the voltage buffer 20 are respectively connected to a first end of the internal trimming resistor string 30; the internal trimming resistor string 30, a second end of the internal trimming resistor string 30 is grounded; a calibration counter module 40, a first end of the calibration counter module 40 is connected to a first end of the internal trimming resistor string 30, a second end of the calibration counter module 40 receives the first internal signal, a third end of the calibration counter module 40 is connected to a sliding end of the internal trimming resistor string 30, and the calibration counter module 40 is configured to trim a required target value upwards or downwards.
Optionally, with reference to the first aspect, in a possible implementation manner, the correcting counter module 40 may specifically include: a comparator module 41 and a correction logic and trimming module 42, wherein an output end of the comparator module 41 is connected to a first end of the correction logic and trimming module 42, and a first end of the correction counter module 40 is connected to a first end of the internal trimming resistor string 30, which specifically includes: the positive input end of the comparator module 41 is connected to the first end of the internal trimming resistor string 30; the receiving of the first internal signal by the second end of the calibration counter module 40 specifically includes: the negative input end of the comparator module 41 is connected with the first internal signal; the connection of the third end of the correction counter module 40 to the sliding end of the internal trimming resistor string 30 specifically includes: a second terminal of the correction logic and trimming module 42 is connected to the sliding terminal of the internal trimming resistor string 30.
Optionally, with reference to the first aspect, in a possible implementation manner, an output end of the comparator module 41 is connected to a port T1, and a third end of the correction logic and trimming module 42 is connected to a port T0.
Optionally, in combination with the first aspect, in a possible implementation manner, when the T0 port starts to be filled with signals, if the initial T1 is high, the correction logic and trimming module 42 sets the timer to count down, and the internal reference value is gradually raised until the comparator module 41 turns over.
Optionally, with reference to the first aspect, in a possible implementation manner, when the comparator module 41 is flipped, the signal at the T1 terminal locks the correction logic and trimming module 42, and the signal from the T0 port is not poured into the correction logic and trimming module 42.
Optionally, with reference to the first aspect, in a possible implementation manner, when the comparator module 41 is turned over, the number of clock signals perfused by the T0 is read, and is converted into a binary system, that is, the trimming value of the corresponding trimming bit.
Optionally, with reference to the first aspect, in a possible implementation manner, when the T0 port starts to be filled with signals, if the initial T1 is low, the calibration logic and trimming module 42 sets the timer to be an upward number, gradually decreases the internal reference value, and fills the T0 port with square-wave signals.
Optionally, with reference to the first aspect, in a possible implementation manner, when a square wave signal is poured into the T0 terminal, the terminal voltage of the T1 terminal is detected at the same time, and when the terminal T1 is changed from a low level to a high level, the number of clock signals poured into the port T0 is read and converted into a binary system, that is, the trimming value to be subjected to fine trimming and burning is obtained.
The trimming integrated circuit capable of bidirectional automatic tracking can be applied to an integrated circuit, and can trim a required target value upwards or downwards quickly in product application with large discreteness; and errors caused by mismatch of internal devices can be eliminated in product application requiring precise trimming. Currently, many integrated circuits are affected by the circuit architecture, and besides the occupation of the middle test resources, the corrected chip parameters may deviate due to the mismatch of internal devices, thereby reducing the yield of finished products. The invention can ensure that the required target value can be adjusted upwards or downwards quickly and accurately to the required target value. The product testing period is shortened, and the finished product yield is improved.
Drawings
Fig. 1 is a schematic structural diagram of a trimming ic capable of bidirectional auto-tracing according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a portion of a trimming IC capable of bidirectional auto-tracing according to an embodiment of the present application;
FIG. 3 is a schematic diagram of a portion of a trimming IC capable of bidirectional auto-tracing according to an embodiment of the present application;
fig. 4 is a schematic diagram illustrating a partial structure of a trimming ic capable of bidirectional auto-tracing according to an embodiment of the present disclosure.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The term "and/or" appearing in the present application may be an association describing an associated object, meaning that three relationships may exist, e.g., a and/or B, may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" in this application generally indicates that the former and latter related objects are in an "or" relationship.
The terms "first," "second," and the like in the description and in the claims of the present application and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It will be appreciated that the data so used may be interchanged under appropriate circumstances such that the embodiments described herein may be practiced otherwise than as specifically illustrated or described herein. Moreover, the terms "comprises," "comprising," and any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or modules is not necessarily limited to those steps or modules explicitly listed, but may include other steps or modules not expressly listed or inherent to such process, method, article, or apparatus.
In the prior art, the internal reference trimming of an integrated circuit is usually implemented with a CP. The method comprises three steps of scanning test, calculating trimming value and blowing of filling signal for the whole IC chip. Before trimming, the chip needs to be tested to read the internal reference value. During the test, a voltage scan is usually used. In order to ensure that an accurate value is tested during the scanning process, each gear is scanned, and the circuit needs to be tested after being stabilized. The higher the trimming precision is, the more scanning steps are, and the longer the testing time is. This results in longer testing time and increased testing costs. In addition, the trimming step is usually a design value, and a deviation may exist between the design value and a real value due to the influence of an integrated circuit process and a parasitic parameter of a device, so that high-precision trimming has an error.
The invention determines the actual trimming value by detecting the inversion of the internal comparator, and the initial trimming value is made at the middle point, so that the trimming value can be tracked upwards or downwards. Therefore, the error caused by internal mismatch during trimming calculation in the prior art can be avoided, and the problem that trimming can only be tracked in one direction in the prior art can be avoided.
Specifically, referring to fig. 1, the trimming integrated circuit capable of bidirectional auto-tracing provided by the present application includes:
a bandgap reference block (bandgap) 10 for generating a bandgap reference voltage; the positive input end of the voltage buffer 20 is connected to the bandgap reference module 10, and the negative input end and the output end of the voltage buffer 20 are respectively connected to the first end of the internal trimming resistor string 30. The second terminal of the internal trimming resistor string (trimming res) 30 is grounded. The voltage buffer 20 and the internal trimming resistor string 30 form a complete linear regulator (LDO).
A first end (lower left end) of a calibrated counter module (calibrated up-counter) 40 is connected to the first end of the internal trimming resistor string 30, a second end (upper left end) of the calibrated counter module 40 receives a first internal signal, a third end (right end) of the calibrated counter module 40 is connected to the sliding end of the internal trimming resistor string 30, and the calibrated counter module 40 is configured to trim a desired target value upward or downward.
Further, referring to fig. 1, the calibration counter module 40 may specifically include: comparator module (comparator) 41, calibration logic and trimming module (logic & trim) 42. The output of the comparator module 41 is connected to a first (lower left) end of the correction logic and trimming module 42.
The connection of the first end of the correction counter module 40 and the first end of the internal trimming resistor string 30 specifically includes: the positive input of the comparator module 41 is connected to the first end of the internal trimming resistor string.
The receiving of the first internal signal by the second end of the calibration counter module 40 specifically includes: the negative input of the comparator block 41 is connected to the first internal signal.
The connection of the third end of the correction counter module 40 to the sliding end of the internal trimming resistor string 30 specifically includes: a second (right) end of the correction logic and trimming module 42 is connected to the sliding end of the internal trimming resistor string 30.
The output of the comparator block 41 is connected to the port T1, and the third terminal (upper left) of the correction logic and trimming block 42 is connected to the port T0.
Specifically, referring to fig. 2, fig. 2 is a specific circuit diagram of the internal trimming resistor string 30. FIG. 3 is a detailed circuit diagram of the internal calibration logic. Wherein Vref, Vin, POR, CLK are all internal signals. The T0 signal and the T1 signal are from FIG. 4.
In the trimming ic capable of bidirectional auto-tracking provided by the present application, when the T0 port is initially filled with a signal, if the initial T1 is high, it indicates that the internal reference voltage is below the target reference voltage. The correction logic and trimming module 42 sets the timer to count Down (Down count) and the internal reference value is gradually raised (logic value opposite to reference value) until the comparator module 41 flips over, indicating that the internal reference has been trimmed to the actual required value.
When the comparator module flips, the signal at T1 locks the correction logic and trimming module 42, and the signal from T0 port is no longer injected into the correction logic and trimming module 42. When the comparator module 41 is turned over, the number of clock signals injected by T0 is read and converted into binary, i.e. the trimming value of the corresponding trimming bit.
In the trimming ic capable of bidirectional auto-tracking provided by the present application, when the T0 port is initially filled with a signal, if the initial T1 is low, it indicates that the internal reference voltage is below the target reference voltage. The correction logic and trimming module 42 sets a timer to an up count. The internal reference value is stepped down and a square wave signal is perfused at T0.
When square wave signals are poured into the T0 end, the T1 end voltage is detected, when the T1 end is changed from low level to high level, the number of clock signals poured into the T0 port is read, and the clock signals are converted into binary, namely trimming (trimming) values which need to be burned in the fine trimming.
The invention has the advantages that the invention is applied to an integrated circuit, and can quickly adjust and regulate the required target value upwards or downwards in the application of products with larger discreteness; and errors caused by mismatch of internal devices can be eliminated in product application requiring precise trimming. Currently, many integrated circuits are affected by the circuit architecture, and besides the occupation of the middle test resources, the corrected chip parameters may deviate due to the mismatch of internal devices, thereby reducing the yield of finished products. The invention can ensure that the required target value can be adjusted upwards or downwards quickly and accurately to the required target value. The product testing period is shortened, and the finished product yield is improved.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the examples provided herein, it is understood that the disclosed methods may be practiced in other ways without departing from the spirit and scope of the present application. The present embodiment is an exemplary example only, and should not be taken as limiting, and the specific disclosure should not be taken as limiting the purpose of the application. For example, some features may be omitted, or not performed.
The technical means disclosed in the present application is not limited to the technical means disclosed in the above embodiments, and includes technical means formed by any combination of the above technical features. It should be noted that, for those skilled in the art, without departing from the principle of the present application, several improvements and modifications can be made, and these improvements and modifications are also considered to be within the scope of the present application.
The foregoing detailed description is directed to a trimming integrated circuit capable of bidirectional auto-tracing provided in an embodiment of the present application, and a specific example is applied in the detailed description to explain the principle and the implementation manner of the present application, and the description of the foregoing embodiment is only used to help understanding the method and the core idea of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application. Although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (8)
1. A trimming integrated circuit capable of bidirectional auto-tracing, comprising:
a bandgap reference module (10), the bandgap reference module (10) being configured to generate a bandgap reference voltage;
the positive input end of the voltage buffer (20) is connected with the band-gap reference module (10), and the negative input end and the output end of the voltage buffer (20) are respectively connected with the first end of the internal trimming resistor string (30);
the internal trimming resistor string (30), wherein a second end of the internal trimming resistor string (30) is grounded;
the first end of the correction counter module (40) is connected with the first end of the internal trimming resistor string (30), the second end of the correction counter module (40) receives a first internal signal, the third end of the correction counter module (40) is connected with the sliding end of the internal trimming resistor string (30), and the correction counter module (40) is used for trimming a required target value upwards or downwards.
2. The trimming ic according to claim 1, wherein the calibration counter module (40) comprises: a comparator module (41) and a correction logic and trimming module (42), wherein the output end of the comparator module (41) is connected with the first end of the correction logic and trimming module (42),
wherein, the first end of the correction counter module (40) is connected with the first end of the internal trimming resistor string (30) and specifically comprises: the positive input end of the comparator module (41) is connected with the first end of the internal trimming resistor string (30);
the receiving of the first internal signal by the second end of the calibration counter module (40) specifically includes: the negative input end of the comparator module (41) is connected with the first internal signal;
the third end of the correction counter module (40) is connected with the sliding end of the internal trimming resistor string (30) and specifically comprises: the second end of the correction logic and trimming module (42) is connected to the sliding end of the internal trimming resistor string (30).
3. The bi-directional auto-traceable trimming integrated circuit of claim 2, wherein,
the output end of the comparator module (41) is connected to a T1 port, and the third end of the correction logic and trimming module (42) is connected to a T0 port.
4. The trimming IC capable of bidirectional automatic tracing according to claim 3,
when the priming signal to the T0 port is started, if the initial T1 is high, the calibration logic and trimming module (42) sets the timer to count down, and the internal reference value is gradually raised until the comparator module (41) is turned over.
5. The bi-directional auto-traceable trimming integrated circuit of claim 4,
when the comparator module (41) flips, the signal at T1 locks the correction logic and trimming module (42) and the signal from T0 port is no longer perfused into the correction logic and trimming module (42).
6. The trimming integrated circuit capable of bidirectional automatic tracing according to claim 4 or 5,
when the comparator module (41) is turned over, the number of clock signals filled by the T0 is read and converted into binary system, namely, the trimming value of the corresponding trimming bit.
7. The bi-directional auto-traceable trimming integrated circuit of claim 3,
when the signal starts to be filled into the port T0, if the initial T1 is low level, the correction logic and trimming module (42) sets the timer to be an upward number, the internal reference value is gradually reduced, and the square wave signal is filled into the port T0.
8. The bi-directional auto-traceable trimming integrated circuit of claim 7,
when square wave signals are filled into the T0 end, the T1 end voltage is detected, when the T1 end is changed from low level to high level, the number of clock signals filled into the T0 port is read, and the clock signals are converted into binary, namely, trimming values needed to be burned in fine trimming are obtained.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117170451A (en) * | 2023-09-27 | 2023-12-05 | 深圳市迪浦电子有限公司 | Circuit and method for automatically tracking reference voltage of chip and outputting trimming code |
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