CN114839423A - Voltage amplitude detection method, detection system and device - Google Patents
Voltage amplitude detection method, detection system and device Download PDFInfo
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- CN114839423A CN114839423A CN202210363410.7A CN202210363410A CN114839423A CN 114839423 A CN114839423 A CN 114839423A CN 202210363410 A CN202210363410 A CN 202210363410A CN 114839423 A CN114839423 A CN 114839423A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
Abstract
The invention provides a voltage amplitude detection method, a detection system and a device, wherein the method mainly comprises the following steps: comparing the first input signal with a first reference voltage, and determining a positive peak value of the first input signal according to a comparison result; comparing the first input signal with the second reference voltage, and determining a negative peak value of the first input signal according to a comparison result; according to the scheme, the voltage amplitude of a pin to be detected in the existing radio frequency test is acquired more simply, the disturbance voltage amplitude is obtained through step-by-step comparison based on the diode, the voltage amplitude detection aiming at periodic interference without depending on waveform measuring instruments such as an oscilloscope is realized through regulating and controlling the input direct current signal, the high cost performance is achieved, the applicable frequency range is higher compared with that of a traditional peak detection circuit, and the high-frequency-ratio voltage amplitude detection circuit can be widely applied to the technical field of electromagnetic interference.
Description
Technical Field
The invention relates to the technical field of electromagnetic interference, in particular to a voltage amplitude detection method, a detection system and a detection device.
Background
In order to improve the emi immunity of electronic products, in the related art, the emc test is a necessary step in the design. As shown in fig. 1, in a direct radio frequency power injection (DPI) test, an interference signal is injected into a pin of a chip to be tested through a radio frequency signal generator and a radio frequency power amplifier, and a voltage disturbance value reaching an observation point of a product is recorded, and data is integrated to obtain the immunity of the chip. In order to measure the voltage amplitude of the pin to be measured on the chip, measurement equipment such as an oscilloscope and the like is usually adopted to contact with the pin, and the complete waveform is sampled to realize numerical value sampling statistics.
In the related art, when the DPI method is used for the noise immunity test, the following disadvantages exist: 1) when the wafer is contained in the package, the oscilloscope probe cannot directly contact the electrode of the transistor, and cannot detect the voltage amplitude at the pin; 2) the common measuring instruments mainly comprising the oscillograph belong to expensive equipment, the instruments are high in cost and have certain volume, the instruments occupy considerable area of a laboratory table, and the operation can be mastered only by performing certain instrument training.
Disclosure of Invention
In view of the foregoing, to at least partially solve the above technical problems, embodiments of the present invention provide a method for detecting a voltage amplitude of a periodic disturbance, and a detection system and an apparatus capable of implementing the detection method.
Therefore, the technical scheme of the application provides a voltage amplitude detection method, which comprises the following steps:
acquiring a disturbed voltage to obtain a first input signal, and acquiring a first reference voltage and a second reference voltage generated by a field programmable logic gate array;
the first input signal and the first reference voltage are input into a first diode module in a positive peak value detection module for comparison, and a comparison result is output to obtain a first voltage value;
inputting the first reference voltage to a second diode module in the positive peak value detection module, and outputting to obtain a second voltage value;
inputting the first input signal and the second reference voltage into a third diode module in a negative peak detection module for comparison, and outputting a comparison result to obtain a third voltage value;
inputting the second reference voltage to a fourth diode module in the negative peak detection module, and outputting to obtain a fourth voltage value;
comparing the first voltage value with the second voltage value for the second time to output a first direct current signal, and determining a positive peak value of a first input signal according to the first direct current signal;
and comparing the third voltage value with the fourth voltage value for the second time to output a second direct current signal, and determining the negative peak value of the first input signal according to the second direct current signal.
In a possible embodiment of the present disclosure, the first input signal includes a central voltage and a to-be-measured amplitude portion; the central voltage and the amplitude part to be measured satisfy the following calculation formula:
V in ＝V DC +AMPsin(2πft)
wherein, V in For said input signal, V DC And the AMP is the amplitude to be measured, f is the frequency, and t is the time.
In a possible embodiment of the solution of the present application, the first reference voltage approaches the center voltage from a voltage peak, and the second reference voltage approaches the center voltage from a voltage valley.
In a possible embodiment of the solution of the present application, the method further comprises the steps of:
outputting the first direct current signal to a first LED lamp, and performing visual representation on a positive peak value of the first input signal through the first LED lamp;
and outputting the second direct current signal to a second LED lamp, and performing visual representation on the negative peak value of the first input signal through the second LED lamp.
In a possible embodiment of the solution of the present application, the method further comprises the steps of:
acquiring a historical record, and acquiring a mapping relation between the amplitude of the second input signal and a third reference voltage in the historical record;
And fitting according to the mapping relation to obtain a calibration value, and calibrating the first reference voltage and/or the second reference voltage according to the calibration value.
On the other hand, the technical scheme of the application also provides a method for realizing the voltage amplitude detection in the first aspect, and the system mainly comprises a positive peak detection module and a negative peak detection module;
the positive peak detection module is used for comparing the first input signal with a first reference voltage and determining a positive peak of the first input signal according to a comparison result;
the negative peak detection module is used for comparing the first input signal with the second reference voltage and determining the negative peak of the first input signal according to the comparison result;
among them, the positive peak detection module includes a first diode module, a second diode module and a first comparator; the input end of the first diode module is connected with the first input signal and the first reference voltage, and the output end of the first diode module is connected with the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator;
The negative peak value detection module comprises a third diode module, a fourth diode module and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator.
In one possible embodiment of the present solution, the system further comprises a first LED lamp and a second LED lamp;
the anode of the first LED lamp is connected to the output end of the first comparator, and the cathode of the first LED lamp is grounded; the anode of the second LED lamp is connected to the output end of the second comparator, and the cathode of the second LED lamp is grounded.
In one possible embodiment of the present disclosure, a first diode module in a system includes a first diode, a second diode, and a first RC sub-circuit; the cathode of the first diode is connected to one end of the first RC sub-circuit, the cathode of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the second diode module is identical in construction to the first diode module.
In a possible embodiment of the present disclosure, the third diode module in the system includes a third diode, a fourth diode, and a second RC sub-circuit; the cathode of the third diode is connected to one end of the second RC sub-circuit, the cathode of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to a power supply voltage; the fourth diode module is identical in construction to the third diode module.
On the other hand, this application technical scheme still provides a voltage amplitude detection's device, and the device includes:
at least one processor;
at least one memory for storing at least one program;
when the at least one program is executed by the at least one processor, causes the at least one processor to execute a method of voltage magnitude detection as described in the first aspect.
Advantages and benefits of the present invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention:
according to the technical scheme, for more simply realizing the collection of the voltage amplitude of the pin to be detected in the existing radio frequency test, the disturbance voltage amplitude is obtained through step-by-step comparison based on the diode, the voltage amplitude detection aiming at the periodic interference without depending on waveform measuring instruments such as an oscilloscope is realized through regulating and controlling the input direct current signal, the high cost performance is achieved, and the applicable frequency range of the traditional peak detection circuit is higher.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic diagram of a voltage amplitude detection system according to the related art;
fig. 2 is a schematic structural diagram of a comparative periodic disturbance amplitude detector in the technical solution of the present application;
FIG. 3 is a schematic circuit diagram of a complete voltage amplitude detection system according to the present invention;
fig. 4 is a schematic circuit diagram of a Dio module in the present embodiment;
fig. 5 is a schematic circuit diagram of another Dio module according to the present disclosure;
fig. 6 is a schematic diagram of input and output waveforms of a Dio module in the present application.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention. The step numbers in the following embodiments are provided only for convenience of illustration, the order between the steps is not limited at all, and the execution order of each step in the embodiments can be adapted according to the understanding of those skilled in the art.
When the radio frequency interference is injected, only the voltage disturbance value at the pin for injecting the interference signal needs to be acquired, and the waveform is not concerned. The periodic disturbance contains two key parameters, amplitude and frequency. The interference frequency is set by the tester and is a known condition. So that only the amplitude of the disturbance is measured. A simpler circuit can be used if only amplitude measurements are required.
However, in the related technical solutions, when the DPI method is used for noise immunity testing, there are problems that the oscilloscope probe cannot directly contact the electrode of the transistor, so that the voltage amplitude at the pin cannot be detected, and the cost is high and the operation is complicated; and the scheme about voltage amplitude detection focuses more on a peak detection and hold circuit, but the circuit has a lower detectable frequency range and is mainly applied between a sensor device and an analog-to-digital converter (ADC), signal acquisition processing is carried out by the ADC, or the modulation of signals in a detector is carried out, and the noise of a chip power supply and the ground is measured. The peak detection holding circuit is not applied to the voltage amplitude measurement of the disturbed chip pin of the direct power injection method at present. The traditional peak detection and holding circuit focuses on following an input signal to realize quick response and is limited by an operational amplifier bandwidth, and the frequency of the input signal is usually below 100 MHz. In addition, the digital multimeter with the function of detecting the effective value of the alternating voltage has a low frequency of only 10MHz at most. Therefore, the two devices cannot cover the frequency band required by the DPI test.
Based on the foregoing technical theory, in order to more simply realize the acquisition of the voltage amplitude at the pin to be tested in the existing radio frequency test, in a first aspect, the technical scheme of the present application provides a simple system for detecting the voltage amplitude of the periodic disturbance, and the disturbance voltage amplitude is obtained through step-by-step comparison based on a diode, so that the system is suitable for the amplitude measurement of the periodic interference signal. In an embodiment, the system generally includes a positive peak detection module and a negative peak detection module.
The positive peak detection module, as shown in fig. 2, is mainly configured to compare the first input signal with a first reference voltage, and determine a positive peak of the first input signal according to a comparison result; and the negative peak value detection module is mainly used for comparing the first input signal with the second reference voltage and determining the negative peak value of the first input signal according to the comparison result.
As shown in fig. 3, the positive peak detection module includes a first diode module, a second diode module, and a first comparator; the input end of the first diode module is connected with the first input signal and the first reference voltage, and the output end of the first diode module is connected with the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator; the negative peak value detection module comprises a third diode module, a fourth diode module and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator. It should be noted that the first to fourth diode modules are Dio modules in fig. 3, and the first comparator and the second comparator are CMP modules in fig. 3.
In an embodiment, the positive peak detection module and the negative peak detection module in the system each mainly include a diode module and a comparator module, wherein the diode module is a quasi-detection circuit formed by two commonly output diodes and an RC. One group of diode modules is used for testing signals V of chip pins in And a DC signal V ref Respectively as input for one comparison, and the other input is DC signal V ref As a comparison, the two outputs are compared twice by the comparator. Based on the forward-conducting and reverse-blocking device characteristics of the diodes, the output of the diode module is determined by a high input value in the two diodes. Thus, by sequentially changing the input V ref To effect variation of its output V 1 Output V of the diode module compared with 2 The difference between the two signals changes the output of the comparator, and the LED lamp is used as display to directly reflect the change of the output level. Input V which can be considered to trip the comparator ref Namely the peak value of the signal to be measured at the moment, and the amplitude value can be obtained through calculation.
Because the Dio module compares the input signal Vin with the reference voltage Vref and converts the input signal Vin into a direct-current voltage to be output, the comparator is equivalent to comparing two direct-current voltages, and the requirement on comparison speed is greatly reduced. In contrast, the amplitude detector can be suitable for a common frequency band of a DPI injection test by only selecting a diode with a proper working frequency.
In some optional embodiments, the system further comprises a first LED lamp and a second LED lamp, as shown in fig. 3, wherein the anode of the first LED lamp is connected to the output end of the first comparator, and the cathode of the first LED lamp is grounded; the anode of the second LED lamp is connected to the output end of the second comparator, and the cathode of the second LED lamp is grounded.
In the embodiment, in order to make the signal obviously characterized and simulate the board-level test experiment conditions, the LED lamp is selected for output visualization processing, and the comparator is used for outputting a signal to control the on and off of the LED.
In some alternative embodiments, as shown in fig. 4, the first diode module includes a first diode, a second diode, and a first RC subcircuit; the cathode of the first diode is connected to one end of the first RC sub-circuit, the cathode of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the second diode module is identical in construction to the first diode module. Further, as shown in fig. 4, the third diode module includes a third diode, a fourth diode and a second RC sub-circuit; the cathode of the third diode is connected to one end of the second RC sub-circuit, the cathode of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to a power supply voltage; the fourth diode module is identical in construction to the third diode module.
It is understood that in the embodiments, the first diode module and the second diode module refer to diode modules in the positive peak detection module, and correspondingly, the third diode module and the fourth diode module refer to diode modules in the negative peak detection module.
Specifically, as shown in fig. 4, the diode module (i.e., Dio module) is composed of two diodes of the same type and an RC, similar to a half-wave rectifier circuit, because two detection parts are used for the input voltage V for scanning p And V n From peak and valley, respectively, towards the central voltage, so that the Dio modules of both are constructively slightly spacedOtherwise. In fig. 4, the Dio block of the positive peak detection section is on the left, and the Dio block of the negative peak detection section is on the right. The disturbed voltage of the observation point of the chip to be measured is used as an input signal V in At a central voltage of V DC The frequency f is known from the injected interference signal, the amplitude to be measured is AMP, and can be written as:
V in ＝V DC +AMPsin(2πft)
wherein, V in For said input signal, V DC And the AMP is the amplitude to be measured, f is the frequency, and t is the time.
The operation of the peak measurement is exemplarily explained by taking the peak measurement as an example. Generating a reference voltage V using an FPGA p . The reference group inputs are all V p The output is V 1 As a reference for comparison; the input of the comparison set is V in And V p V is obtained by primary comparison of diodes 2 。V 1 And V 2 The comparator performs secondary comparison to convert the voltage into DC output V 0 . In order to make the signal obviously characterized and simulate board level test experiment conditions, an LED lamp is selected for output visual processing, and the comparator is used for outputting a signal to control the on and off of the LED.
More specifically, in the embodiment, the Dio module outputs of the ratio pair group shown in fig. 5 are only connected with resistors and have no capacitors, and the input and output waveforms are shown in fig. 6. As a specific pair of groups, because the diodes have the characteristics of forward conduction and reverse cut-off, when the diodes with two different inputs are output together, the output value is determined by the higher input. And the reference group is V because the inputs are all p The output is only composed of V p And (6) determining. In fig. 6, the upper half represents the reference voltage V p Higher than V inmax When the voltage is on, D2 is turned on, D1 is turned off, and V is turned off 1 ＝ 2 (ii) a The lower half of the reference voltage V p Below V inmax When the voltage is applied, D1 and D2 are alternately conducted, the output has periodic pulse, if a capacitor is connected later, the accumulated voltage can be charged, so V 1 >V 2 . Based on this, by changing V ref Performing voltage scanning to gradually decrease a voltage value higher than the maximum value of the signal to be measured to a value lower than the maximum value,it can be observed that the comparator output switches from a low level to a high level, which can be more clearly characterized as the on and off of the LED. V when the output level is changed can be considered p I.e. is the input V inmax . Similarly, the valley value can be measured, and the known amplitude can be calculated.
In addition, the gain of the ideal comparator is infinite, the circuit structure is highly symmetrical, no input offset voltage exists, and output can be rapidly turned over when the difference value of input signals jumps. However, limited by the input offset voltage and the finite gain, the comparator needs a certain difference between the input signals to output the inversion, so that the obtained V is recorded ref Will be smaller than the actual value, need to carry on the calibration process in order to reduce the error, obtain V under different frequency through sampling in advance in Amplitude AMP and V ref Fitting to obtain a calibration value, and measuring the obtained V according to the calibration table in practical application ref And (6) carrying out calibration.
On the other hand, the technical solution of the present application further provides a voltage amplitude detection method implemented based on the voltage amplitude detection system in the first aspect, and the method mainly includes steps S100 to S700:
s100, obtaining a disturbed voltage to obtain a first input signal, and obtaining a first reference voltage and a second reference voltage generated by a field programmable gate array;
s200, the first input signal and the first reference voltage are input into a first diode module in a positive peak detection module to be compared, and a comparison result is output to obtain a first voltage value;
S300, inputting the first reference voltage to a second diode module in the positive peak value detection module, and outputting to obtain a second voltage value;
s400, inputting the first input signal and the second reference voltage into a third diode module in a negative peak detection module for comparison, and outputting a comparison result to obtain a third voltage value;
s500, inputting the second reference voltage to a fourth diode module in the negative peak detection module, and outputting to obtain a fourth voltage value;
s600, performing secondary comparison on the first voltage value and the second voltage value to obtain a first direct current signal, and determining a positive peak value of a first input signal according to the first direct current signal;
s700, comparing the third voltage value with the fourth voltage value for the second time and outputting to obtain a second direct current signal, and determining a negative peak value of the first input signal according to the second direct current signal.
In an embodiment, a set of diode modules is used for testing the signal V of the chip pin in And a DC signal V ref Respectively as input for one comparison, and the other input is DC signal V ref As a comparison, the two outputs are compared twice by the comparator. Based on the forward-conducting and reverse-blocking device characteristics of the diodes, the output of the diode module is determined by a high input value in the two diodes. Thus, by sequentially changing the input V ref To change its output V 1 Output V of the diode module in comparison 2 The difference between the two signals changes the output of the comparator, and the LED lamp is used as display to directly reflect the change of the output level. Input V which may be considered to trip the comparator ref Namely the peak value of the signal to be measured at the moment, and the amplitude value can be obtained through calculation.
Since Dio module inputs signal V in And a reference voltage V ref The comparison is carried out, and the direct current voltage is converted into the direct current voltage for output, so that the comparator is equivalent to comparing two direct current voltages, and the requirement on comparison speed is greatly reduced. In contrast, the amplitude detector can be suitable for a common frequency band of a DPI injection test by only selecting a diode with a proper working frequency.
In some alternative embodiments, the first input signal includes a central voltage and a measured amplitude portion; the central voltage and the amplitude part to be measured satisfy the following calculation formula:
V in ＝V DC +AMPsin(2πft)
wherein, V in For said input signal, V DC And the AMP is the amplitude to be measured, f is the frequency, and t is the time.
In some alternative embodiments, the first reference voltage approaches the center voltage from a peak voltage value, and the second reference voltage approaches the center voltage from a valley voltage value.
In some alternative embodiments, the method may further include steps S700-S800:
s700, outputting the first direct current signal to a first LED lamp, and performing visual representation on a positive peak value of the first input signal through the first LED lamp;
and S800, outputting the first direct current signal to a first LED lamp, and performing visual representation on a positive peak value of the first input signal through the first LED lamp.
Specifically, in the embodiment, the input and output waveforms of the embodiment are shown in fig. 6. As a specific pair of groups, because the diodes have the characteristics of forward conduction and reverse cut-off, when the diodes with two different inputs are output together, the output value is determined by the higher input. And the reference group is V because the inputs are all p The output is only composed of V p And (6) determining. In fig. 6, the upper half represents the reference voltage V p Higher than V inmax When the voltage is on, D2 is turned on, D1 is turned off, and V is turned off 1 ＝V 2 (ii) a The lower half of the reference voltage V p Below V inmax When the voltage is applied, D1 and D2 are alternately conducted, the output has periodic pulse, if a capacitor is connected later, the accumulated voltage can be charged, so V 1 >V 2 . Based on this, by changing V ref And performing voltage scanning, and gradually reducing a voltage value higher than the maximum value of the signal to be measured to be lower than the maximum value, so that the output of the comparator can be observed to be switched from a low level to a high level, and the output can be more obviously characterized as the on-off of the LED. V when the output level is changed can be considered p I.e. is the input V inmax . Similarly, the valley value can be measured, and the known amplitude can be calculated.
In some alternative embodiments, the method of an embodiment may further include steps S900-S910:
s900, acquiring a history record, and acquiring a mapping relation between the amplitude of the second input signal in the history record and a third reference voltage;
s910, a calibration value is obtained according to the mapping relation in a fitting mode, and the first reference voltage and/or the second reference voltage are/is calibrated according to the calibration value.
In the embodiment, the ideal comparator has infinite gain and highly symmetrical circuit structure without input offset voltage, and can realize rapid output turnover when the difference of input signals jumps. However, limited by the input offset voltage and the finite gain, the comparator needs a certain difference between the input signals to output the inversion, so that the obtained V is recorded ref Will be smaller than the actual value, need to carry on the calibration process in order to reduce the error, obtain V under different frequency through sampling in advance in Amplitude AMP and V ref Fitting to obtain a calibration value, and measuring the obtained V according to the calibration table in practical application ref And (6) carrying out calibration.
It should be noted that, in the embodiment, the reference signal V may be generated by an external FPGA ref And the output of the comparator is digitally processed and connected to the PC terminal, and the PC terminal program judges V ref And if the regulation and control are in place, the whole system can realize automation.
On the other hand, this application technical scheme still provides a voltage amplitude detection's device, and the device includes:
at least one processor;
at least one memory for storing at least one program;
when the at least one program is executed by the at least one processor, causes the at least one processor to execute a method of voltage magnitude detection as described in the first aspect.
From the above specific implementation process, it can be concluded that the technical solution provided by the present invention has the following advantages or advantages compared to the prior art:
according to the technical scheme, the voltage amplitude detection for the periodic interference without depending on waveform measuring instruments such as an oscilloscope can be realized by regulating and controlling the input direct current signal, the high cost performance is achieved, and the application frequency range of the peak detection circuit is higher than that of a traditional peak detection circuit.
In alternative embodiments, the functions/acts noted in the block diagrams may occur out of the order noted in the operational illustrations. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality/acts involved. Furthermore, the embodiments presented and described in the flow charts of the present invention are provided by way of example in order to provide a more thorough understanding of the technology. The disclosed methods are not limited to the operations and logic flows presented herein. Alternative embodiments are contemplated in which the order of various operations is changed and in which sub-operations described as part of larger operations are performed independently.
Furthermore, although the present invention is described in the context of functional modules, it should be understood that, unless otherwise stated to the contrary, one or more of the functions and/or features may be integrated in a single physical device and/or software module, or one or more of the functions and/or features may be implemented in a separate physical device or software module. It will also be appreciated that a detailed discussion of the actual implementation of each module is not necessary for an understanding of the present invention. Rather, the actual implementation of the various functional modules in the apparatus disclosed herein will be understood within the ordinary skill of an engineer, given the nature, function, and internal relationship of the modules. Accordingly, those skilled in the art can, using ordinary skill, practice the invention as set forth in the claims without undue experimentation. It is also to be understood that the specific concepts disclosed are merely illustrative of and not intended to limit the scope of the invention, which is defined by the appended claims and their full scope of equivalents.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While embodiments of the invention have been shown and described, it will be understood by those of ordinary skill in the art that: various changes, modifications, substitutions and alterations can be made to the embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the claims and their equivalents.
While the preferred embodiments of the present invention have been illustrated and described, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (10)
1. A method of voltage amplitude detection, comprising the steps of:
acquiring a disturbed voltage to obtain a first input signal, and acquiring a first reference voltage and a second reference voltage generated by a field programmable logic gate array;
the first input signal and the first reference voltage are input into a first diode module in a positive peak value detection module for comparison, and a comparison result is output to obtain a first voltage value;
inputting the first reference voltage to a second diode module in the positive peak value detection module, and outputting to obtain a second voltage value;
inputting the first input signal and the second reference voltage into a third diode module in a negative peak detection module for comparison, and outputting a comparison result to obtain a third voltage value;
inputting the second reference voltage to a fourth diode module in the negative peak detection module, and outputting to obtain a fourth voltage value; comparing the first voltage value with the second voltage value for the second time to output a first direct current signal, and determining a positive peak value of a first input signal according to the first direct current signal;
and comparing the third voltage value with the fourth voltage value for the second time to output a second direct current signal, and determining the negative peak value of the first input signal according to the second direct current signal.
2. The method of claim 1, wherein the first input signal comprises a central voltage and a to-be-measured amplitude component; the central voltage and the amplitude part to be measured satisfy the following calculation formula:
V in ＝V DC +AMPsin(2πft)
wherein, V in For said input signal, V DC And the AMP is the amplitude to be measured, f is the frequency, and t is the time.
3. The method of claim 2, wherein the first reference voltage is approximated from a peak voltage value to the center voltage value, and the second reference voltage is approximated from a valley voltage value to the center voltage value.
4. A method of voltage amplitude detection as claimed in claim 1, characterized in that the method further comprises the steps of:
outputting the first direct current signal to a first LED lamp, and performing visual representation on a positive peak value of the first input signal through the first LED lamp;
and outputting the second direct current signal to a second LED lamp, and performing visual representation on the negative peak value of the first input signal through the second LED lamp.
5. A method of voltage amplitude detection according to claim 1, characterized in that the method further comprises the steps of:
Acquiring a historical record, and acquiring a mapping relation between the amplitude of the second input signal and a third reference voltage in the historical record;
and fitting according to the mapping relation to obtain a calibration value, and calibrating the first reference voltage and/or the second reference voltage according to the calibration value.
6. A system for voltage magnitude detection, characterized in that it is adapted to implement a method for voltage magnitude detection according to any of claims 1-5, said system comprising a positive peak detection module and a negative peak detection module;
the positive peak detection module is used for comparing the first input signal with a first reference voltage and determining a positive peak of the first input signal according to a comparison result;
the negative peak detection module is used for comparing the first input signal with the second reference voltage and determining the negative peak of the first input signal according to the comparison result;
the positive peak detection module comprises a first diode module, a second diode module and a first comparator; the input end of the first diode module is connected with the first input signal and the first reference voltage, and the output end of the first diode module is connected with the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator;
The negative peak detection module comprises a third diode module, a fourth diode module and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator.
7. The system for voltage amplitude detection of claim 6, further comprising a first LED light and a second LED light;
the anode of the first LED lamp is connected to the output end of the first comparator, and the cathode of the first LED lamp is grounded;
the anode of the second LED lamp is connected to the output end of the second comparator, and the cathode of the second LED lamp is grounded.
8. The system of claim 6, wherein the first diode module comprises a first diode, a second diode, and a first RC sub-circuit; the cathode of the first diode is connected to one end of the first RC sub-circuit, the cathode of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the second diode module is identical in construction to the first diode module.
9. The system of claim 6, wherein the third diode module comprises a third diode, a fourth diode, and a second RC sub-circuit; the cathode of the third diode is connected to one end of the second RC sub-circuit, the cathode of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to a power supply voltage; the fourth diode module is identical in construction to the third diode module.
10. An apparatus for voltage amplitude detection, comprising:
at least one processor;
at least one memory for storing at least one program;
when executed by the at least one processor, cause the at least one processor to perform a method of voltage magnitude detection as claimed in any one of claims 1 to 5.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115902357A (en) * | 2023-02-15 | 2023-04-04 | 海的电子科技(苏州)有限公司 | Method and device for detecting unknown waveform voltage signal and storage medium |
| CN116092403A (en) * | 2023-01-16 | 2023-05-09 | 海的电子科技(苏州)有限公司 | Method and device for detecting voltage waveform of image signal generator and storage medium |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116092403A (en) * | 2023-01-16 | 2023-05-09 | 海的电子科技(苏州)有限公司 | Method and device for detecting voltage waveform of image signal generator and storage medium |
| CN115902357A (en) * | 2023-02-15 | 2023-04-04 | 海的电子科技(苏州)有限公司 | Method and device for detecting unknown waveform voltage signal and storage medium |
| CN116559520A (en) * | 2023-02-15 | 2023-08-08 | 海的电子科技(苏州)有限公司 | Voltage signal detection method, device and storage medium |
| CN116559520B (en) * | 2023-02-15 | 2023-10-17 | 海的电子科技(苏州)有限公司 | Voltage signal detection method, device and storage medium |
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