CN114798487B - Intelligent screening equipment and screening method for transistor - Google Patents
Intelligent screening equipment and screening method for transistor Download PDFInfo
- Publication number
- CN114798487B CN114798487B CN202210404414.5A CN202210404414A CN114798487B CN 114798487 B CN114798487 B CN 114798487B CN 202210404414 A CN202210404414 A CN 202210404414A CN 114798487 B CN114798487 B CN 114798487B
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- fixed
- discharging
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- 238000012216 screening Methods 0.000 title claims abstract description 165
- 238000000034 method Methods 0.000 title claims description 17
- 238000007599 discharging Methods 0.000 claims abstract description 49
- 230000005484 gravity Effects 0.000 claims abstract description 21
- 230000003014 reinforcing effect Effects 0.000 claims description 5
- 239000000463 material Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000002787 reinforcement Effects 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000012634 fragment Substances 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The intelligent screening equipment for the transistor comprises a vibrating tray body, a discharging guide rail, a base, vertical rods, screening guide rails, a discharging opening and a gravity screening assembly, wherein the discharging guide rail is fixed at the discharging end of the vibrating tray body, the feeding end of the discharging guide rail corresponds to the discharging end of the vibrating tray body, the discharging guide rail is obliquely arranged, the base is arranged on one side of the vibrating tray body, and the two vertical rods are symmetrically fixed in the middle of the upper surface of the base.
Description
Technical Field
The invention relates to the technical field of transistor screening equipment, in particular to intelligent screening equipment and screening method for transistor.
Background
The transistor is a solid semiconductor device and has multiple functions of detection, rectification, amplification, switching, voltage stabilization, signal modulation and the like. The transistor, as a kind of variable current switch, is capable of controlling the output current based on the input voltage. Different from a common mechanical switch, the transistor controls the opening and closing of the transistor by utilizing an electric signal, so that the switching speed can be very high, and the switching speed in a laboratory can reach more than 100 GHz;
the transistors with the same overall dimension have different pin numbers, the transistors with the same overall dimension but different pin numbers need to be screened in the production and discharge processes, the transistors with the same pin numbers are screened together, the existing equipment for screening the transistors is mainly composed of a vibrating disc, material feeding and discharging equipment and a ccd industrial camera, and the equipment is large in size, complex in structure and high in production and operation cost.
Therefore, it is necessary to provide a new intelligent screening device and screening method for transistors to solve the above technical problems.
Disclosure of Invention
In order to solve the technical problems, the invention provides intelligent screening equipment and screening method for transistor.
The invention provides intelligent screening equipment for a transistor, which comprises a vibrating tray body, a discharging guide rail, a base, upright rods, screening guide rails, a discharging opening and a gravity screening assembly, wherein the discharging guide rail is fixed at the discharging end of the vibrating tray body, the feeding end of the discharging guide rail corresponds to the discharging end of the vibrating tray body, the discharging guide rail is obliquely arranged, the base is arranged on one side of the vibrating tray body, the two upright rods are symmetrically fixed in the middle of the upper surface of the base, the screening guide rail is fixed at the upper end between the two upright rods, the screening guide rail is integrally obliquely arranged, the top of the screening guide rail is fixed with the bottom of the discharging guide rail, the discharging opening is arranged at one end, close to the screening guide rail, of the discharging guide rail, the discharging opening is communicated with the screening guide rail, and the gravity screening assembly is arranged on the side wall of the screening guide rail and is used for screening the transistor.
Preferably, gravity screening subassembly includes baffle, stitch through groove, first spout, screening mouth, embedded groove, closure plate, second spout, connecting block, linking frame and shell fragment, two sliding connection in proper order is in the upper end of screening guide rail inner wall, the stitch through groove has been seted up to one side of baffle, two first spout is seted up in proper order in the upper end of screening guide rail one side lateral wall, and the position of baffle corresponds with the position of first spout, two the screening mouth is seted up in proper order and is kept away from the upper end of first spout one side lateral wall at screening guide rail, and screening mouth is linked together with the inner wall of screening guide rail, the bottom at screening mouth inner wall is seted up to the embedded groove, closure plate sliding connection is at the inner wall of embedded groove, the second spout is seted up in one side of embedded groove inner wall, and the second spout runs through the outer wall that screening guide rail lateral wall extends to screening guide rail, the connecting block is fixed in one side that the baffle is close to first spout, and the connecting block is kept away from the one end of baffle and passes the outside that first spout extends to screening guide rail, and the inner wall sliding connection of first spout, linking frame is fixed at the screening guide rail one end is kept away from and is kept away from the closure plate, the bottom of the connecting frame is connected with the closure plate, the fixed connection frame is kept away from the outer wall of the connecting frame.
Preferably, the number of the stitch through grooves on one baffle plate at the upper side of the inner side of the screening guide rail is three, and the number of the stitch through grooves on one baffle plate at the lower side of the inner side of the screening guide rail is two.
Preferably, the bottom of the screening opening, which is close to one side of the inner wall of the screening guide rail, is provided with a chamfer.
Preferably, the upper end of the outer wall of the screening guide rail, which is close to one side of the screening opening, is sequentially fixed with two blanking guide plates, and one end of the blanking guide plate, which is close to the screening guide rail, is opposite to the screening opening.
Preferably, a limiting strip is fixed on one side of the top of the discharging guide rail.
Preferably, the screening guide rail is arranged vertically to the discharging guide rail.
Preferably, the size of the inner wall of the feed opening is the same as the size of the inner wall of the screening guide rail.
Preferably, the middle part of base upper surface symmetry is fixed with the reinforcement curb plate, the surface mounting of one side and pole setting of reinforcement curb plate.
The invention also provides a screening method adopting the intelligent screening equipment for the transistor, which comprises the following steps:
1) The transistors are orderly arranged and enter the discharging guide rail through the feeding work of the transistors by the vibrating disc body;
2) The material enters the inner side of the screening guide rail at the end part of the discharging guide rail and slides downwards along the inner wall of the screening guide rail under the action of gravity;
3) Screening the transistors of different pin numbers by a gravity screen assembly;
4) The final four-pin transistor enters into one blanking guide plate at the upper part, the three-pin transistor enters into one blanking guide plate at the lower part, and the two-pin transistor is directly blanked from the bottom of the screening guide rail.
Compared with the related art, the intelligent screening equipment and the screening method for the transistor have the following beneficial effects:
1. the transistor screening equipment designed by the invention has the advantages of simple structure, small volume and low production and operation cost, and is particularly suitable for screening of transistors with the same appearance and different pin numbers.
2. The screening structure designed by the invention utilizes the pin number of the transistor and the weight of the transistor during blanking to complete the screening work, does not need to add power equipment or adopt a CCD camera in the screening process, and can complete the screening work.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is an enlarged view of the invention at A;
FIG. 3 is a schematic diagram of the position structure of the feed opening of the present invention;
FIG. 4 is an enlarged view of the invention at B;
FIG. 5 is a schematic view of one of the gravity screen assemblies of the present invention;
FIG. 6 is an enlarged view of the invention at C;
FIG. 7 is a second schematic view of a gravity screen assembly according to the present invention;
FIG. 8 is an enlarged view of the invention at D;
FIG. 9 is a third schematic illustration of the gravity screen assembly of the present invention;
FIG. 10 is a schematic view of a pin through slot position configuration of the present invention;
FIG. 11 is a schematic diagram of the method of the present invention.
Reference numerals in the drawings: 1. a vibration plate body; 2. a discharging guide rail; 3. a base; 4. a vertical rod; 5. a screening guide rail; 6. a feed opening; 7. a gravity screen assembly; 71. a baffle; 71A, pin passing grooves; 72. a first chute; 73. a screening port; 74. an embedding groove; 75. a closing plate; 76. a second chute; 77. a connecting block; 78. a connection frame; 79. a spring plate; 8. a blanking guide plate; 9. defining a strip; 10. and reinforcing the side plates.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Specific implementations of the invention are described in detail below in connection with specific embodiments.
Referring to fig. 1, fig. 2, fig. 3 and fig. 4, the intelligent screening device for a transistor provided by the embodiment of the invention includes a vibrating tray body 1, a discharging guide rail 2, a base 3, a vertical rod 4, a screening guide rail 5, a feed opening 6 and a gravity screening assembly 7, wherein the discharging guide rail 2 is fixed at the discharging end of the vibrating tray body 1, the feeding end of the discharging guide rail 2 corresponds to the discharging end of the vibrating tray body 1, the discharging guide rail 2 is arranged in an inclined manner, the base 3 is arranged at one side of the vibrating tray body 1, two vertical rods 4 are symmetrically fixed at the middle part of the upper surface of the base 3, the screening guide rail 5 is fixed at the upper end between the two vertical rods 4, the screening guide rail 5 is integrally arranged in an inclined manner, the top of the screening guide rail 5 is fixed with the bottom of the discharging guide rail 2, the feed opening 6 is arranged at one end of the discharging guide rail 2 close to the screening guide rail 5, the feed opening 6 is communicated with the screening guide rail 5, the inner wall of the feed opening 6 is the same as the inner wall of the screening guide rail 5, and the gravity screening assembly 7 is arranged at the side wall of the screening guide rail 5 for transistor.
It should be noted that, the invention is particularly used for screening transistors with the same external dimensions of the main body parts of the transistors and different pin numbers, and mainly screening mixed four-pin, three-pin and two-pin transistors, the outer wall of the main body part of the transistor is attached to the inner wall of the discharging guide rail 2, the bottom of the transistor contacts with the bottom of the inner wall of the discharging guide rail 2 when the transistor is at the discharging end, the top of the transistor contacts with the inner wall of the limiting strip 9, namely the main body part of the whole transistor is just embedded inside the discharging guide rail 2, the outer wall of the main body part of the same transistor is attached to the inner wall of the larger end of the blanking opening 6, so that the transistor can be attached to the inner wall of the blanking opening 6 and enter the inside of the screening guide rail 5, and the same transistor can slide smoothly inside the screening guide rail 5.
Referring to fig. 5, fig. 6, fig. 7, fig. 8, fig. 9 and fig. 10, the gravity screening assembly 7 includes a baffle 71, a stitch passing groove 71A, a first chute 72, a screening opening 73, an embedded groove 74, a closing plate 75, a second chute 76, a connecting block 77, a connecting frame 78 and a spring 79, two baffle 71 are sequentially connected to the upper end of the inner wall of the screening guide 5 in a sliding manner, a stitch passing groove 71A is provided on one side of the baffle 71, two first chute 72 are sequentially provided on the upper end of the side wall of the screening guide 5, the position of the baffle 71 corresponds to the position of the first chute 72, two screening openings 73 are sequentially provided on the upper end of the side wall of the screening guide 5 far from the first chute 72, and the screening opening 73 is communicated with the inner wall of the screening guide 5, the embedded groove 74 is provided at the bottom of the inner wall of the screening opening 73, the closing plate 75 is slidingly connected to the inner wall of the embedded groove 74, the second chute 76 is provided on one side of the inner wall of the embedded groove 74, the second chute 76 extends to the outer wall of the screening guide 5 in a penetrating manner, the position of the side wall of the screening guide 5 is extended to the outer wall of the screening guide 5, the two first chute 72 is sequentially provided on the side wall 77, and the two first chute 72 is fixedly connected to the connecting block 78 is far from the inner wall 78, and the connecting block 78 is fixedly connected to the inner wall of the first chute 72, which is far from the inner wall 78, which is far from the inner wall of the first chute 72, and the inner wall 78.
The body of the transistor to be screened is fitted to the inner wall of the screening port 73 and slides out, that is, the transistor that cannot pass through the baffle 71 is just allowed to slide to one side through the screening port 73.
Referring to fig. 10, the number of the pin passing grooves 71A on one baffle plate 71 on the upper side of the inner side of the screening guide 5 is three, and the number of the pin passing grooves 71A on one baffle plate 71 on the lower side of the inner side of the screening guide 5 is two.
It should be noted that, the four-pin transistor, the three-pin transistor and the two-pin transistor with the same external dimensions of the main body part, wherein, when the four pins of the four-pin transistor reach the position of the upper baffle 71, the four pins of the four-pin transistor are blocked by the baffle 71, and the three pins of the three-pin transistor correspond to the three pins of the upper baffle 71, so that the three-pin transistor can smoothly pass through the baffle 71 at the upper position, and when the three-pin transistor reaches the position of the lower baffle 71, the pins of the three-pin transistor can be blocked by the baffle 71 because of the two pin passing grooves 71A on the baffle 71, and when the two pins of the two-pin transistor pass through the baffle 71 at the upper baffle 71, the two pins of the two-pin transistor can pass through the two pins of the baffle 71 from the two passing grooves 71A on the two sides of the baffle 71, and can not pass through the two pins of the lower baffle 71 directly from the two lower baffle 71, and can not pass through the two pins of the guide rail 71.
Referring to fig. 8, the bottom of the screening opening 73 near the inner wall of the screening guide 5 is provided with a chamfer, so that the transistor can be prevented from being blocked at the screening opening 73 during the process of sliding down the inner side of the screening guide 5.
Referring to fig. 1 and 9, two blanking guide plates 8 are sequentially fixed at the upper end of the outer wall of the screening guide rail 5 near the screening opening 73, and one end of the blanking guide plate 8 near the screening guide rail 5 is opposite to the screening opening 73 for guiding the screened four-pin transistor and three-pin transistor.
Referring to fig. 1 and 2, a limiting strip 9 is fixed on one side of the top of the discharging guide rail 2, so that the transistor can be stably attached to the inner wall of the discharging guide rail 2 to slide.
Referring to fig. 1 and 2, the screening guide 5 is disposed perpendicular to the discharge guide 2, so that the discharge opening 6 is precisely aligned with the inner wall of the screening guide 5.
Referring to fig. 1, a reinforcing side plate 10 is symmetrically fixed in the middle of the upper surface of the base 3, and one side of the reinforcing side plate 10 is fixed to the surface of the upright rod 4, so that the connection strength between the base 3 and the upright rod 4 can be improved.
Referring to fig. 11, the present invention further provides a screening method using an intelligent screening apparatus for transistors, the screening method comprising the steps of:
1) The transistors are orderly arranged and enter the discharging guide rail 2 through the feeding work of the transistors by the vibrating disc body 1;
2) The materials enter the inner side of the screening guide rail 5 at the end part of the discharging guide rail 2 and slide downwards along the inner wall of the screening guide rail 5 under the action of gravity;
3) The transistors of different pin numbers are screened by gravity screen assembly 7;
4) The final four-pin transistor is fed to one blanking guide 8 located above, the three-pin transistor is fed to one blanking guide 8 located below, and the two-pin transistor is fed directly from the bottom of the screening rail 5.
The intelligent screening equipment and the screening method for the transistors provided by the invention have the following working principles:
When the four-pin transistor, the three-pin transistor and the two-pin transistor are sequentially arranged on the inner side of the vibrating disc body 1 and sequentially conveyed to the discharging guide rail 2, when the transistors reach the inner side of the discharging opening 6, the transistors sequentially fall to the inner side of the screening guide rail 5 from the inner side of the discharging opening 6 at intervals, the transistors slide downwards along the inner wall of the screening guide rail 5 under the action of gravity to reach the position of the first baffle 71, the three-pin transistor and the two-pin transistor can pass through the three-pin transistor and the two-pin transistor, the four-pin transistor can press one baffle 71 above to enable the baffle 71 to move downwards, and then one closing plate 75 corresponding to the baffle 71 can slide downwards along the inner wall of the embedded groove 74 until the closing plate 75 is completely immersed into the inner side of the embedded groove 74, the transistors fall to the position corresponding to the screening opening 73, then the screening opening 73 slides out, and then the baffle 71 is reset under the action of a spring plate 79, so that the screening work of the four-pin transistor is completed;
The three-pin transistor can be screened out when reaching the baffle 71 positioned below, and finally the two-pin transistor is discharged from the bottom of the screening guide rail 5, so that screening work is completed.
The circuits and control involved in the present invention are all of the prior art, and are not described in detail herein.
The foregoing description is only illustrative of the present invention and is not intended to limit the scope of the invention, and all equivalent structures or equivalent processes or direct or indirect application in other related technical fields are included in the scope of the present invention.
Claims (7)
1. Intelligent screening device for transistor, its characterized in that includes:
The vibrating tray comprises a vibrating tray body (1), wherein a discharge guide rail (2) is fixed at the discharge end of the vibrating tray body (1), the feed end of the discharge guide rail (2) corresponds to the discharge end of the vibrating tray body (1), and the discharge guide rail (2) is obliquely arranged;
The base (3) is arranged on one side of the vibration disc body (1);
The two vertical rods (4) are symmetrically fixed in the middle of the upper surface of the base (3);
The screening guide rail (5), the screening guide rail (5) is fixed at the upper end between the two vertical rods (4), the whole screening guide rail (5) is obliquely arranged, and the top of the screening guide rail (5) is fixed with the bottom of the discharging guide rail (2);
The discharging opening (6) is formed in one end, close to the screening guide rail (5), of the discharging guide rail (2), and the discharging opening (6) is communicated with the screening guide rail (5);
a gravity screen assembly (7), the gravity screen assembly (7) being arranged on the side wall of the screening guide rail (5) for screening the transistors;
the gravity screen assembly (7) comprises:
The two baffles (71) are sequentially and slidably connected to the upper end of the inner wall of the screening guide rail (5), and a stitch passing groove (71A) is formed in one side of each baffle (71);
The first sliding grooves (72) are sequentially formed in the upper end of one side wall of the screening guide rail (5), and the positions of the baffle plates (71) correspond to the positions of the first sliding grooves (72);
The screening openings (73) are sequentially formed in the upper end of the side wall of the screening guide rail (5) away from the first chute (72), and the screening openings (73) are communicated with the inner wall of the screening guide rail (5);
the embedded groove (74) is formed in the bottom of the inner wall of the screening opening (73);
a closing plate (75), wherein the closing plate (75) is slidably connected to the inner wall of the embedded groove (74);
The second sliding groove (76) is formed in one side of the inner wall of the embedded groove (74), and the second sliding groove (76) penetrates through the side wall of the screening guide rail (5) and extends to the outer wall of the screening guide rail (5);
The connecting block (77) is fixed on one side, close to the first sliding groove (72), of the baffle plate (71), one end, far away from the baffle plate (71), of the connecting block (77) penetrates through the first sliding groove (72) to extend to the outer side of the screening guide rail (5), and the connecting block (77) is in sliding connection with the inner wall of the first sliding groove (72);
The connecting frame (78), the connecting frame (78) is fixed at one end of the connecting block (77) far away from the baffle (71), the connecting frame (78) surrounds the screening guide rail (5), and one end of the inner wall of the connecting frame (78) penetrates through the second sliding groove (76) to be fixed with the surface of the closing plate (75);
The elastic piece (79) is symmetrically fixed at the bottom of the connecting frame (78), and one end, far away from the connecting frame (78), of the elastic piece (79) is fixed with the outer wall of the screening guide rail (5);
the number of the stitch through grooves (71A) on one baffle plate (71) at the upper side of the inner side of the screening guide rail (5) is three, and the number of the stitch through grooves (71A) on one baffle plate (71) at the lower side of the inner side of the screening guide rail (5) is two;
Two blanking guide plates (8) are sequentially fixed on the outer wall of the screening guide rail (5) close to the screening opening (73), and one end of each blanking guide plate (8) close to the screening guide rail (5) corresponds to the screening opening (73).
2. The intelligent screening device for transistors according to claim 1, wherein the screening opening (73) is provided with a chamfer at the bottom of the side close to the inner wall of the screening guide rail (5).
3. Intelligent screening apparatus for transistors according to claim 1, characterized in that a limiting strip (9) is fixed to one side of the top of the outfeed rail (2).
4. Intelligent screening apparatus for transistors according to claim 1, characterized in that the screening guide (5) is arranged perpendicular to the discharge guide (2).
5. Intelligent screening apparatus for transistors according to claim 1, characterized in that the size of the inner wall of the feed opening (6) is the same as the size of the inner wall of the screening guide (5).
6. The intelligent screening device for transistors according to claim 1, wherein a reinforcing side plate (10) is symmetrically fixed in the middle of the upper surface of the base (3), and one side of the reinforcing side plate (10) is fixed with the surface of the upright (4).
7. A screening method using the intelligent screening apparatus for transistors according to any one of claims 1 to 6, characterized in that the screening method comprises the steps of:
1) The transistors are orderly arranged and enter the discharging guide rail (2) through the feeding work of the transistors by the vibrating disc body (1);
2) The material enters the inner side of the screening guide rail (5) at the end part of the discharging guide rail (2), and slides downwards along the inner wall of the screening guide rail (5) under the action of gravity;
3) Screening the transistors with different pin numbers through a gravity screening assembly (7);
4) The final four-pin transistor enters into one blanking guide plate (8) at the upper part, the three-pin transistor enters into one blanking guide plate (8) at the lower part, and the two-pin transistor is directly blanked from the bottom of the screening guide rail (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210404414.5A CN114798487B (en) | 2022-04-18 | 2022-04-18 | Intelligent screening equipment and screening method for transistor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210404414.5A CN114798487B (en) | 2022-04-18 | 2022-04-18 | Intelligent screening equipment and screening method for transistor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114798487A CN114798487A (en) | 2022-07-29 |
| CN114798487B true CN114798487B (en) | 2024-04-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN202210404414.5A Active CN114798487B (en) | 2022-04-18 | 2022-04-18 | Intelligent screening equipment and screening method for transistor |
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| CN (1) | CN114798487B (en) |
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| DE10226150A1 (en) * | 2002-06-13 | 2004-01-15 | Beining, Rolf, Prof.Dr. | Process used in recycling processes/systems for sorting materials comprises transporting the materials from a heap to a specified position of a feed system, and placing the materials in ordered positions on a transport belt |
| CN207963526U (en) * | 2017-12-26 | 2018-10-12 | 攀枝花钢企米易白马球团有限公司 | Ring formation of rotary kiln thing screening device |
| CN110756456A (en) * | 2019-11-29 | 2020-02-07 | 华贵机电（珠海）有限公司 | Automatic detection screening equipment for hollow coils |
| CN214778923U (en) * | 2021-05-26 | 2021-11-19 | 进业（天津）轻工制品有限公司 | Screwdriver head stacking device for laser lettering |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| BE1018945A3 (en) * | 2009-10-05 | 2011-11-08 | Visys Nv | GUIDE PLATE FOR THE COLLECTION AND GUIDANCE OF BULK PRODUCTS IN SORTING MACHINES. |
| CN109047041A (en) * | 2018-07-12 | 2018-12-21 | 太仓市晨启电子精密机械有限公司 | A kind of auto rectifier high current heat is surveyed and classifier and its method |
| CN108672302B (en) * | 2018-07-13 | 2020-04-07 | 苏州大学 | Bolt screening machine |
| CN210230675U (en) * | 2019-07-08 | 2020-04-03 | 江苏泽恩机械科技有限公司 | Sorter guide rail |
-
2022
- 2022-04-18 CN CN202210404414.5A patent/CN114798487B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10226150A1 (en) * | 2002-06-13 | 2004-01-15 | Beining, Rolf, Prof.Dr. | Process used in recycling processes/systems for sorting materials comprises transporting the materials from a heap to a specified position of a feed system, and placing the materials in ordered positions on a transport belt |
| CN207963526U (en) * | 2017-12-26 | 2018-10-12 | 攀枝花钢企米易白马球团有限公司 | Ring formation of rotary kiln thing screening device |
| CN110756456A (en) * | 2019-11-29 | 2020-02-07 | 华贵机电（珠海）有限公司 | Automatic detection screening equipment for hollow coils |
| CN214778923U (en) * | 2021-05-26 | 2021-11-19 | 进业（天津）轻工制品有限公司 | Screwdriver head stacking device for laser lettering |
Also Published As
| Publication number | Publication date |
|---|---|
| CN114798487A (en) | 2022-07-29 |
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