CN114798487A - Intelligent screening equipment and screening method for transistors - Google Patents
Intelligent screening equipment and screening method for transistors Download PDFInfo
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- CN114798487A CN114798487A CN202210404414.5A CN202210404414A CN114798487A CN 114798487 A CN114798487 A CN 114798487A CN 202210404414 A CN202210404414 A CN 202210404414A CN 114798487 A CN114798487 A CN 114798487A
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- 238000012216 screening Methods 0.000 title claims abstract description 169
- 238000000034 method Methods 0.000 title claims description 17
- 238000007599 discharging Methods 0.000 claims abstract description 52
- 230000005484 gravity Effects 0.000 claims abstract description 21
- 230000009471 action Effects 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 230000003014 reinforcing effect Effects 0.000 description 5
- 239000012634 fragment Substances 0.000 description 4
- 230000008569 process Effects 0.000 description 4
- 238000007873 sieving Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/38—Collecting or arranging articles in groups
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention provides intelligent screening equipment for transistors, which comprises a vibrating disc body, a discharging guide rail, a base, upright rods, screening guide rails, a feed opening and a gravity screening component, wherein the discharging guide rail is fixed at the discharging end of the vibrating disc body, the feed end of the discharging guide rail corresponds to the discharging end of the vibrating disc body, the discharging guide rail is arranged in an inclined manner, the base is arranged at one side of the vibrating disc body, and the two upright rods are symmetrically fixed in the middle of the upper surface of the base.
Description
Technical Field
The invention relates to the technical field of transistor screening equipment, in particular to intelligent screening equipment and a screening method for transistors.
Background
A transistor is a solid semiconductor device and has a plurality of functions such as detection, rectification, amplification, switching, voltage stabilization, signal modulation, and the like. The transistor, which is a type of variable current switch, is capable of controlling an output current based on an input voltage. Different from a common mechanical switch, the transistor controls the opening and closing of the transistor by utilizing an electric signal, so that the switching speed can be very high, and the switching speed in a laboratory can reach more than 100 GHz;
the transistors with the same appearance size but different pin numbers are required to be screened in the production and discharging process, the transistors with the same appearance size but different pin numbers are screened together, the existing equipment for screening the transistors mostly comprises a vibrating disc, material feeding and discharging equipment and a ccd industrial camera, and generally has the disadvantages of large volume, complex structure and high production and operation cost.
Therefore, there is a need to provide a new intelligent screening apparatus and screening method for transistors to solve the above-mentioned technical problems.
Disclosure of Invention
In order to solve the technical problems, the invention provides intelligent screening equipment for transistors and a screening method.
The invention provides intelligent screening equipment for transistors, which comprises a vibrating disc body, a discharging guide rail, a base, an upright rod, a screening guide rail, a feed opening and a gravity screening component, a discharging guide rail is fixed at the discharging end of the vibrating disc body, the feeding end of the discharging guide rail corresponds to the discharging end of the vibrating disc body, the discharging guide rails are arranged in an inclined manner, the base is arranged on one side of the vibrating disk body, the two upright posts are symmetrically fixed in the middle of the upper surface of the base, the screening guide rail is fixed at the upper end between the two upright stanchions, the screening guide rail is integrally arranged in an inclined shape, the top of the screening guide rail is fixed with the bottom of the discharging guide rail, the feed opening is arranged at one end of the discharging guide rail close to the screening guide rail, the feed opening is linked together with the screening guide rail, gravity screening subassembly sets up the lateral wall at the screening guide rail for sieve the transistor.
Preferably, the gravity screening component comprises a baffle, a stitch passing groove, a first sliding groove, a screening opening, an embedded groove, a closed plate, a second sliding groove, a connecting block, a connecting frame and an elastic sheet, wherein the two baffles are sequentially and slidably connected to the upper end of the inner wall of the screening guide rail, the stitch passing groove is formed in one side of the baffle, the two first sliding grooves are sequentially formed in the upper end of the side wall of one side of the screening guide rail, the position of the baffle corresponds to the position of the first sliding groove, the two screening openings are sequentially formed in the upper end of the side wall, far away from the first sliding groove, of the screening guide rail, the screening opening is communicated with the inner wall of the screening guide rail, the embedded groove is formed in the bottom of the inner wall of the screening opening, the closed plate is slidably connected to the inner wall of the embedded groove, the second sliding groove is formed in one side of the inner wall of the embedded groove, and the second sliding groove penetrates through the side wall of the screening guide rail and extends to the outer wall of the screening guide rail, the connecting block is fixed in one side that the baffle is close to first spout, and the connecting block is kept away from the one end of baffle and is passed first spout and extend to the outside of screening guide rail, and the inner wall sliding connection of connecting block and first spout, the connection box is fixed in the one end that the baffle was kept away from to the connecting block, and the connection box encircles the screening guide rail, the fixed surface of second spout and closure plate is passed to the one end of connection box inner wall, the bottom symmetry of connection box is fixed with the shell fragment, the one end that the connection box was kept away from to the shell fragment is fixed with the outer wall of screening guide rail.
Preferably, the number of the stitch passing grooves on one baffle on one side above the inner side of the screening guide rail is three, and the number of the stitch passing grooves on one baffle below the inner side of the screening guide rail is two.
Preferably, the bottom of one side of the screening opening close to the inner wall of the screening guide rail is provided with a chamfer.
Preferably, the upper end of the outer wall of the screening guide rail, which is close to one side of the screening opening, is sequentially fixed with two blanking guide plates, and one end of each blanking guide plate, which is close to the screening guide rail, is opposite to the screening opening.
Preferably, a limiting strip is fixed on one side of the top of the discharging guide rail.
Preferably, the screening guide rail and the discharging guide rail are arranged vertically.
Preferably, the inner wall of the feed opening is the same as the inner wall of the screening guide rail in size.
Preferably, the middle part of the upper surface of the base is symmetrically fixed with reinforcing side plates, and one side of each reinforcing side plate is fixed with the surface of the vertical rod.
The invention also provides a screening method adopting the intelligent screening equipment for the transistor, which comprises the following steps:
1) the transistors are loaded through the vibrating disc body, and are sequentially arranged and enter the discharging guide rail;
2) the materials enter the inner side of the screening guide rail at the end part of the discharge guide rail and slide downwards along the inner wall of the screening guide rail under the action of gravity;
3) screening transistors with different pin numbers through a gravity screening component;
4) finally, the transistors with four pins enter a blanking guide plate positioned above, the transistors with three pins enter a blanking guide plate positioned below, and the transistors with two pins directly feed from the bottom of the screening guide rail.
Compared with the related art, the intelligent screening equipment and the screening method for the transistor have the following beneficial effects:
1. the transistor screening equipment designed by the invention has the advantages of simple structure, small volume and low production and operation cost, and is particularly suitable for screening transistors with the same appearance and different pin numbers.
2. The screening structure designed by the invention utilizes the pin number of the transistor and the weight of the transistor during blanking to complete screening work, and can complete screening work without additionally arranging power equipment or adopting a CCD camera in the screening process.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is an enlarged view of the invention at A;
FIG. 3 is a schematic view of the position structure of the feed opening of the present invention;
FIG. 4 is an enlarged view of the invention at B;
FIG. 5 is one of the schematic structural illustrations of the gravity screen assembly of the present invention;
FIG. 6 is an enlarged view of the invention at C;
FIG. 7 is a second schematic illustration of the construction of a gravity screen assembly of the present invention;
FIG. 8 is an enlarged view of the invention at D;
FIG. 9 is a third schematic illustration of the construction of a gravity screen assembly of the present invention;
FIG. 10 is a schematic view of the pin-through slot position structure of the present invention;
FIG. 11 is a schematic view of the method of the present invention.
Reference numbers in the figures: 1. a vibrating pan body; 2. a discharge guide rail; 3. a base; 4. erecting a rod; 5. screening guide rails; 6. a feeding port; 7. a gravity screen assembly; 71. a baffle plate; 71A, enabling a pin to pass through the groove; 72. a first chute; 73. a screening port; 74. a groove is embedded; 75. a closing plate; 76. a second chute; 77. connecting blocks; 78. a connecting frame; 79. a spring plate; 8. a blanking guide plate; 9. a limiting strip; 10. and reinforcing the side plates.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Specific implementations of the present invention are described in detail below with reference to specific embodiments.
Referring to fig. 1, 2, 3 and 4, an intelligent screening device for a transistor according to an embodiment of the present invention includes a vibrating tray body 1, a discharging guide rail 2, a base 3, upright posts 4, a screening guide rail 5, a discharging opening 6 and a gravity screening assembly 7, wherein the discharging end of the vibrating tray body 1 is fixed with the discharging guide rail 2, the feeding end of the discharging guide rail 2 corresponds to the discharging end of the vibrating tray body 1, the discharging guide rail 2 is obliquely arranged, the base 3 is arranged on one side of the vibrating tray body 1, the two upright posts 4 are symmetrically fixed in the middle of the upper surface of the base 3, the screening guide rail 5 is fixed at the upper end between the two upright posts 4, the screening guide rail 5 is integrally obliquely arranged, the top of the screening guide rail 5 is fixed to the bottom of the discharging guide rail 2, the discharging opening 6 is arranged at one end of the discharging guide rail 2 close to the screening guide rail 5, feed opening 6 is linked together with screening guide rail 5, the inner wall size of feed opening 6 is the same with the inner wall size of screening guide rail 5, gravity screening subassembly 7 sets up the lateral wall at screening guide rail 5 for sieve the transistor.
It should be noted that, the transistor used for screening transistors with the same external size of the main body part of the transistor and different pin numbers mainly screens the mixed four-pin, three-pin and two-pin transistors, the outer wall of the main body part of the transistor is attached to the inner wall of the discharging guide rail 2, the bottom of the transistor is contacted with the bottom of the inner wall of the discharging guide rail 2 when the transistor is at the discharging end part, and the top of the transistor is contacted with the inner wall of the limiting strip 9, that is, the main body part of the whole transistor is just embedded in the inner side of the discharging guide rail 2, the same outer wall of the main body part of the transistor is attached to the inner wall of the main body part of the transistor with the larger size of the feed opening 6, so that the transistor can be attached to the inner wall of the feed opening 6 and enter the screening guide rail 5, and can smoothly slide on the inner side of the screening guide rail 5.
Referring to fig. 5, 6, 7, 8, 9 and 10, the gravity screening assembly 7 includes a baffle 71, a stitch passing groove 71A, a first chute 72, a screening opening 73, an embedded groove 74, a closing plate 75, a second chute 76, a connecting block 77, a connecting frame 78 and a spring plate 79, the two baffles 71 are sequentially and slidably connected to the upper end of the inner wall of the screening guide rail 5, a stitch passing groove 71A is formed in one side of the baffle 71, the two first chutes 72 are sequentially formed in the upper end of the side wall of one side of the screening guide rail 5, the position of the baffle 71 corresponds to the position of the first chute 72, the two screening openings 73 are sequentially formed in the upper end of the side wall of one side of the screening guide rail 5 away from the first chute 72, the screening opening 73 is communicated with the inner wall of the screening guide rail 5, the embedded groove 74 is formed in the bottom of the inner wall of the screening opening 73, the closing plate 75 is slidably connected to the inner wall of the embedded groove 74, second spout 76 sets up in the one side of embedded groove 74 inner wall, and second spout 76 runs through the outer wall that screening guide rail 5 lateral wall extended to screening guide rail 5, connecting block 77 is fixed in the one side that baffle 71 is close to first spout 72, and the one end that baffle 71 was kept away from to connecting block 77 passes first spout 72 and extends to the outside of screening guide rail 5, and the inner wall sliding connection of connecting block 77 and first spout 72, connecting frame 78 fixes the one end that baffle 71 was kept away from at connecting block 77, and connecting frame 78 encircles screening guide rail 5, the fixed surface of second spout 76 and closing plate 75 is passed to the one end of connecting frame 78 inner wall, the bottom symmetry of connecting frame 78 is fixed with shell fragment 79, the one end that connecting frame 78 was kept away from to shell fragment 79 is fixed with the outer wall of screening guide rail 5.
It should be noted that the main body of the transistor to be screened is attached to the inner wall of the screening opening 73 to slide out, that is, the transistor that can not pass through the baffle 71 can just pass through the screening opening 73 to slide to one side.
Referring to fig. 10, the number of the stitch passing grooves 71A of the one barrier 71 on the upper side inside the screen guide 5 is three, and the number of the stitch passing grooves 71A of the one barrier 71 on the lower side inside the screen guide 5 is two.
It should be noted that, the four pins of the four-pin transistor are all staggered with three pins on the upper baffle 71 through the slots 71A, so that the four-pin transistor is blocked by the upper baffle 71 when reaching the position of the upper baffle 71, and the three pins of the three-pin transistor correspond to the three pins on the upper baffle 71 through the slots 71A, so that the three-pin transistor can smoothly pass through the upper baffle 71, and when the three-pin transistor reaches the position of the lower baffle 71, because the number of the pins on the upper baffle 71 passing through the slots 71A is two, the middle pin of the three-pin transistor is blocked by the baffle 71, when two pins on the two-pin transistor pass through the upper baffle plate 71, the two pins can pass through the two pins on the two sides of the baffle plate 71 in the groove 71A, and when the two pins are at the position of the lower baffle plate 71, the two pins can similarly pass through the only two pins on the baffle plate 71 in the groove 71A, so that the two-pin transistor can directly pass through the screening guide rail 5 without being blocked by the two baffle plates 71 and is discharged from the bottom of the screening guide rail 5.
Referring to fig. 8, a chamfer is formed at the bottom of the sieving port 73 close to the inner wall of the sieving guide rail 5, so that the phenomenon that the transistor is clamped at the sieving port 73 in the process of sliding downwards at the inner side of the sieving guide rail 5 can be avoided.
Referring to fig. 1 and 9, two discharging guide plates 8 are sequentially fixed to the upper end of the outer wall of the screening guide rail 5 near the screening opening 73, and one end of each discharging guide plate 8 near the screening guide rail 5 is opposite to the screening opening 73, and is used for guiding screened four-pin transistors and three-pin transistors.
Referring to fig. 1 and 2, a limiting strip 9 is fixed on one side of the top of the discharging guide rail 2, so that the transistor can be ensured to stably adhere to the inner wall of the discharging guide rail 2 to slide.
Referring to fig. 1 and 2, the screening guide 5 is perpendicular to the discharging guide 2, so that the discharging opening 6 is precisely aligned with the inner wall of the screening guide 5.
Referring to fig. 1, the middle of the upper surface of the base 3 is symmetrically fixed with a reinforcing side plate 10, and one side of the reinforcing side plate 10 is fixed with the surface of the upright rod 4, so that the connecting strength between the base 3 and the upright rod 4 can be improved.
Referring to fig. 11, the present invention further provides a screening method using the intelligent screening apparatus for transistors, the screening method comprising the steps of:
1) the transistors are loaded through the vibrating disc body 1, and are sequentially arranged and enter the discharging guide rail 2;
2) the materials enter the inner side of the screening guide rail 5 at the end part of the discharge guide rail 2 and slide downwards along the inner wall of the screening guide rail 5 under the action of gravity;
3) screening transistors with different pin numbers through a gravity screening component 7;
4) finally, the four-pin transistors enter one blanking guide plate 8 positioned above, the three-pin transistors enter one blanking guide plate 8 positioned below, and the two-pin transistors are directly blanked from the bottom of the screening guide rail 5.
The working principle of the intelligent screening equipment and the screening method for the transistor provided by the invention is as follows:
when the vibrating tray is used, the mixed four-pin transistor, three-pin transistor and two-pin transistor are sequentially arranged and conveyed on the discharging guide rail 2 at the inner side of the vibrating tray body 1, and sequentially fall from the discharging opening 6 to the inner side of the screening guide rail 5 at a certain time interval when the transistors reach the discharging opening 6, and slide downwards along the inner wall of the screening guide rail 5 under the action of gravity to reach the position of the first baffle plate 71, so that the three-pin transistor and the two-pin transistor can pass through, the four-pin transistor can press the baffle plate 71 above, the baffle plate 71 moves downwards, a closing plate 75 corresponding to the baffle plate 71 can slide downwards along the inner wall of the embedded groove 74 until the closing plate 75 is totally immersed into the inner side of the embedded groove 74, and the transistors fall to the position corresponding to the screening opening 73 and then slide out of the screening opening 73, then, the baffle 71 is reset under the resilience force of the elastic sheet 79, so that the screening work of the four-pin transistor is completed;
and the three-pin transistor can be screened out when reaching a baffle 71 positioned below, and finally the two-pin transistor is discharged from the bottom of the screening guide rail 5 to complete the screening work.
The circuits and controls involved in the present invention are prior art and will not be described in detail herein.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (10)
1. An intelligent screening apparatus for transistors, comprising:
the vibration disc comprises a vibration disc body (1), wherein a discharging guide rail (2) is fixed at the discharging end of the vibration disc body (1), the feeding end of the discharging guide rail (2) corresponds to the discharging end of the vibration disc body (1), and the discharging guide rail (2) is obliquely arranged;
the base (3), the said base (3) is set up in one side of the body of the vibration disc (1);
the two upright posts (4) are symmetrically fixed in the middle of the upper surface of the base (3);
the screening guide rail (5) is fixed at the upper end between the two vertical rods (4), the screening guide rail (5) is integrally arranged in an inclined manner, and the top of the screening guide rail (5) is fixed with the bottom of the discharging guide rail (2);
the feeding opening (6) is formed in one end, close to the screening guide rail (5), of the discharging guide rail (2), and the feeding opening (6) is communicated with the screening guide rail (5);
gravity screening subassembly (7), gravity screening subassembly (7) set up the lateral wall at screening guide rail (5) for sieve the transistor.
2. The intelligent screening apparatus for transistors according to claim 1, wherein the gravity screen assembly (7) comprises:
the two baffles (71) are sequentially connected to the upper end of the inner wall of the screening guide rail (5) in a sliding manner, and a pin passing groove (71A) is formed in one side of each baffle (71);
the two first sliding grooves (72) are sequentially formed in the upper end of the side wall of one side of the screening guide rail (5), and the position of the baffle (71) corresponds to the position of the first sliding grooves (72);
the two screening openings (73) are sequentially formed in the upper end of the side wall of the screening guide rail (5) far away from the first sliding groove (72), and the screening openings (73) are communicated with the inner wall of the screening guide rail (5);
the embedded groove (74), the embedded groove (74) is arranged at the bottom of the inner wall of the screening opening (73);
a closing plate (75), wherein the closing plate (75) is connected with the inner wall of the embedded groove (74) in a sliding way;
the second sliding chute (76) is formed in one side of the inner wall of the embedded groove (74), and the second sliding chute (76) penetrates through the side wall of the screening guide rail (5) and extends to the outer wall of the screening guide rail (5);
the connecting block (77) is fixed on one side, close to the first sliding groove (72), of the baffle plate (71), one end, far away from the baffle plate (71), of the connecting block (77) penetrates through the first sliding groove (72) to extend to the outer side of the screening guide rail (5), and the connecting block (77) is in sliding connection with the inner wall of the first sliding groove (72);
the connecting frame (78) is fixed to one end, far away from the baffle (71), of the connecting block (77), the connecting frame (78) surrounds the screening guide rail (5), and one end of the inner wall of the connecting frame (78) penetrates through the second sliding groove (76) and is fixed to the surface of the closing plate (75);
the screening guide rail comprises elastic sheets (79), the elastic sheets (79) are symmetrically fixed at the bottom of the connecting frame (78), and one end, far away from the connecting frame (78), of each elastic sheet (79) is fixed to the outer wall of the screening guide rail (5).
3. The intelligent screening apparatus for transistors according to claim 2, wherein the number of the pin passing grooves (71A) on the one baffle (71) located at the upper side inside the screening guide (5) is three, and the number of the pin passing grooves (71A) on the one baffle (71) located at the lower side inside the screening guide (5) is two.
4. The intelligent screening device for the transistors according to claim 2, wherein the bottom of the screening opening (73) close to one side of the inner wall of the screening guide rail (5) is chamfered.
5. The intelligent screening device for the transistors according to claim 2, wherein two blanking guide plates (8) are sequentially fixed to the upper end of the outer wall of the screening guide rail (5) close to one side of the screening opening (73), and one end of each blanking guide plate (8) close to the screening guide rail (5) is opposite to the screening opening (73).
6. An intelligent screening apparatus for transistors according to claim 1, wherein a limiting strip (9) is fixed to one side of the top of the discharge guide (2).
7. An intelligent screening apparatus for transistors according to claim 1, wherein the screening rail (5) is perpendicular to the discharge rail (2).
8. An intelligent screening apparatus for transistors according to claim 1, wherein the inner wall of the feed opening (6) is the same size as the inner wall of the screening guide (5).
9. The intelligent screening apparatus for the transistor according to claim 1, wherein a reinforced side plate (10) is symmetrically fixed to the middle of the upper surface of the base (3), and one side of the reinforced side plate (10) is fixed to the surface of the vertical rod (4).
10. A screening method using the intelligent screening apparatus for transistors according to claims 1 to 9, characterized in that the screening method is composed of the steps of:
1) the transistors are fed through the vibrating disc body (1) and are sequentially arranged to enter the discharging guide rail (2);
2) the materials enter the inner side of the screening guide rail (5) at the end part of the discharging guide rail (2) and slide downwards along the inner wall of the screening guide rail (5) under the action of gravity;
3) screening transistors with different pin numbers through a gravity screening component (7);
4) finally, the four-pin transistors enter one blanking guide plate (8) positioned above, the three-pin transistors enter one blanking guide plate (8) positioned below, and the two-pin transistors are directly blanked from the bottom of the screening guide rail (5).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210404414.5A CN114798487B (en) | 2022-04-18 | 2022-04-18 | Intelligent screening equipment and screening method for transistor |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202210404414.5A CN114798487B (en) | 2022-04-18 | 2022-04-18 | Intelligent screening equipment and screening method for transistor |
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| CN114798487A true CN114798487A (en) | 2022-07-29 |
| CN114798487B CN114798487B (en) | 2024-04-19 |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10226150A1 (en) * | 2002-06-13 | 2004-01-15 | Beining, Rolf, Prof.Dr. | Process used in recycling processes/systems for sorting materials comprises transporting the materials from a heap to a specified position of a feed system, and placing the materials in ordered positions on a transport belt |
| US20120279909A1 (en) * | 2009-10-05 | 2012-11-08 | Visys Nv | Guide plate for guiding bulk products and sorting machine with such a guide plate |
| CN207963526U (en) * | 2017-12-26 | 2018-10-12 | 攀枝花钢企米易白马球团有限公司 | Ring formation of rotary kiln thing screening device |
| CN108672302A (en) * | 2018-07-13 | 2018-10-19 | 苏州大学 | A kind of bolt screening machine |
| CN109047041A (en) * | 2018-07-12 | 2018-12-21 | 太仓市晨启电子精密机械有限公司 | A kind of auto rectifier high current heat is surveyed and classifier and its method |
| CN110756456A (en) * | 2019-11-29 | 2020-02-07 | 华贵机电（珠海）有限公司 | Automatic detection screening equipment for hollow coils |
| CN210230675U (en) * | 2019-07-08 | 2020-04-03 | 江苏泽恩机械科技有限公司 | Sorter guide rail |
| CN214778923U (en) * | 2021-05-26 | 2021-11-19 | 进业（天津）轻工制品有限公司 | Screwdriver head stacking device for laser lettering |
-
2022
- 2022-04-18 CN CN202210404414.5A patent/CN114798487B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10226150A1 (en) * | 2002-06-13 | 2004-01-15 | Beining, Rolf, Prof.Dr. | Process used in recycling processes/systems for sorting materials comprises transporting the materials from a heap to a specified position of a feed system, and placing the materials in ordered positions on a transport belt |
| US20120279909A1 (en) * | 2009-10-05 | 2012-11-08 | Visys Nv | Guide plate for guiding bulk products and sorting machine with such a guide plate |
| CN207963526U (en) * | 2017-12-26 | 2018-10-12 | 攀枝花钢企米易白马球团有限公司 | Ring formation of rotary kiln thing screening device |
| CN109047041A (en) * | 2018-07-12 | 2018-12-21 | 太仓市晨启电子精密机械有限公司 | A kind of auto rectifier high current heat is surveyed and classifier and its method |
| CN108672302A (en) * | 2018-07-13 | 2018-10-19 | 苏州大学 | A kind of bolt screening machine |
| CN210230675U (en) * | 2019-07-08 | 2020-04-03 | 江苏泽恩机械科技有限公司 | Sorter guide rail |
| CN110756456A (en) * | 2019-11-29 | 2020-02-07 | 华贵机电（珠海）有限公司 | Automatic detection screening equipment for hollow coils |
| CN214778923U (en) * | 2021-05-26 | 2021-11-19 | 进业（天津）轻工制品有限公司 | Screwdriver head stacking device for laser lettering |
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