CN114791541A - Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system - Google Patents
Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system Download PDFInfo
- Publication number
- CN114791541A CN114791541A CN202210480041.XA CN202210480041A CN114791541A CN 114791541 A CN114791541 A CN 114791541A CN 202210480041 A CN202210480041 A CN 202210480041A CN 114791541 A CN114791541 A CN 114791541A
- Authority
- CN
- China
- Prior art keywords
- sample
- temperature range
- tube
- wide temperature
- corundum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 34
- 238000010438 heat treatment Methods 0.000 title claims abstract description 31
- 230000001681 protective effect Effects 0.000 claims abstract description 26
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 12
- 150000002367 halogens Chemical class 0.000 claims abstract description 12
- 238000012544 monitoring process Methods 0.000 claims abstract description 7
- 239000000523 sample Substances 0.000 claims description 88
- 239000010431 corundum Substances 0.000 claims description 51
- 229910052593 corundum Inorganic materials 0.000 claims description 51
- 239000010453 quartz Substances 0.000 claims description 33
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 33
- 230000000007 visual effect Effects 0.000 claims description 16
- 229910052751 metal Inorganic materials 0.000 claims description 12
- 239000002184 metal Substances 0.000 claims description 12
- 238000004320 controlled atmosphere Methods 0.000 claims description 9
- 238000007789 sealing Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 claims description 3
- 230000005611 electricity Effects 0.000 claims 1
- 239000007789 gas Substances 0.000 description 15
- 238000006243 chemical reaction Methods 0.000 description 8
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- 229910052760 oxygen Inorganic materials 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- 229910052739 hydrogen Inorganic materials 0.000 description 2
- 150000002431 hydrogen Chemical class 0.000 description 2
- 238000006722 reduction reaction Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005485 electric heating Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/003—Environmental or reliability tests
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention relates to an infrared heating wide temperature range, atmosphere controllable and visible electrical test system, which belongs to the technical field of electrical test and comprises a protective shell and a measuring clamp, wherein the measuring clamp is arranged in the protective shell and is used for loading a sample to be tested and enabling the sample to be tested to be in a gas protection atmosphere; the heating element is arranged in the protective shell and used for heating a sample to be detected; the temperature recorder is connected with the measuring clamp and used for detecting the temperature of the sample to be detected; the electrical tester is connected with the measuring clamp and used for detecting a test signal of a sample to be tested; and the camera is used for monitoring the state of the sample to be detected in real time. According to the invention, a halogen lamp is arranged at the focus of the ellipsoidal reflector, and the halogen lamp focuses light on a sample after being converged by the ellipsoidal reflector, so that the sample is heated, wherein the heating temperature is up to 2200 ℃; can ensure the stability and real-time monitoring performance of the sample at 2200 ℃ as high as the prior art.
Description
Technical Field
The invention relates to the technical field of electrical testing, in particular to an infrared heating wide-temperature-range atmosphere-controllable visual electrical testing system.
Background
With the development of scientific technology, the demand for miniaturization, integration and stabilization of electronic devices is increasingly remarkable. New requirements are also put on the electrical performance research of electronic devices. The temperature field has a very important influence on the electrical properties of the sample and is one of the first considered "field factors" for the study of materials. Under different temperature environments, even if the electrical properties, the microstructure and the action mechanism of the same sample are different, even if some samples reach a critical point, the phase structure of the sample can be mutated, so that the properties of the sample before and after the critical point temperature show great difference. Therefore, the measurement of the electrical properties over a wide temperature range is more helpful to understand the properties of the sample.
The industries such as aerospace, nuclear reactors and the like require operation at higher temperature, the performance test of samples has great technical difficulty in complex high-temperature environments, the highest measurement temperature is 1900 ℃, but only short-time heat preservation can be carried out (see Chinese patent with application number of 201910243502.X), and the temperature is difficult to maintain at 1900 ℃ for a long time. Secondly, most of the existing high-temperature electric heating furnaces heat a sample through a heating wire, and the furnace is well sealed (see the Chinese patent with the application number of 201920415639.4), so that the state of the sample at the current temperature cannot be observed, and the reliability of a test result cannot be ensured. In addition, the sample is easily reacted with gas at high temperature, for example, a metal sample is easily reacted with oxygen in the air at high temperature to form an oxide film. Certain oxides are susceptible to reduction reactions at high temperatures. Therefore, the protective gas is required to be introduced to ensure the stability of the sample at high temperature. On the other hand, the introduction of the gas is more beneficial to exploring the chemical reaction between the gas and the sample at high temperature and detecting the influence of the reaction on the sample performance.
The existing temperature-variable electrical test system has a far temperature test range which cannot meet the increasing exploration of the material performance at extreme temperature; the conventional testing means cannot simultaneously observe the color and the appearance change of a sample under test.
Disclosure of Invention
The invention aims to provide an infrared heating wide-temperature-range atmosphere-controllable visual electrical testing system to solve the problems in the background technology.
In order to achieve the purpose, the invention provides the following technical scheme:
an infrared heated wide temperature range, controlled atmosphere, visual electrical test system comprising:
a protective shell which is arranged on the upper portion of the shell,
the measuring clamp is arranged in the protective shell and used for loading a sample to be measured and enabling the sample to be measured to be in a gas protection atmosphere;
the heating element is arranged in the protective shell and used for heating a sample to be detected;
the temperature recorder is connected with the measuring clamp and used for detecting the temperature of the sample to be detected;
the electrical tester is connected with the measuring clamp and used for detecting a test signal of a sample to be tested;
and the camera is used for monitoring the state of the sample to be detected in real time.
As a further technical scheme of the invention, the measuring clamp comprises an upper probe part and a lower probe part matched with the upper probe part, and the upper probe part is connected with the lower probe part through a quartz tube.
As a further technical solution of the present invention, the upper probe portion includes:
the upper bearing device is fixedly arranged in the protective shell;
the upper locking device is arranged in the upper bearing device, and an upper rod is arranged in the upper locking device;
one end of the upper corundum tube is connected with the upper rod through an upper connecting device, and the other end of the upper corundum tube is provided with an upper electrode plate;
and the air inlet valve is arranged on the upper connecting device and used for inflating the quartz tube.
As a further technical solution of the present invention, the lower probe portion includes:
the lower bearing device is fixedly arranged in the protective shell;
the lower locking device is arranged in the lower bearing device, and a lower rod is arranged in the lower locking device;
one end of the lower corundum tube is connected with the lower rod through a lower connecting device, and the other end of the lower corundum tube is provided with a corundum plate;
the lower electrode plate is arranged on one side of the corundum plate, which is far away from the lower corundum tube, and is matched with the upper electrode plate;
the gas outlet valve is arranged on the lower connecting device and used for exhausting gas from the quartz tube;
one end of the quartz tube is connected with the upper connecting device, and the other end of the quartz tube is connected with the lower connecting device and used for sealing the upper corundum tube and the lower corundum tube inside; .
As a still further aspect of the present invention, the upper connecting device includes:
one side of the upper flange is connected with the upper rod, and the other side of the upper flange is connected with the quartz tube;
and the upper connector is arranged in the quartz tube, one end of the upper connector is fixedly connected with the upper rod, and the other end of the upper connector is fixedly connected with the upper corundum tube.
As a still further technical aspect of the present invention, the lower connecting device includes:
one side of the lower flange is connected with the lower rod, and the other side of the lower flange is connected with the quartz tube;
a lower connector installed inside the quartz tube, one end of the lower connector being fixedly connected with the lower rod, and the other end being fixedly connected with the lower corundum tube
As still further aspect of the present invention, the heating member includes:
the ellipsoidal reflector is fixedly arranged on the lower bearing device;
the halogen lamp is fixedly arranged in the ellipsoidal reflector, and when the halogen lamp works, the emitted light is focused by the ellipsoidal reflector and then heats a sample to be measured
As a further technical scheme of the invention, the plurality of the ellipsoid reflectors are uniformly distributed outside the quartz tube.
As a still further technical scheme of the invention, through holes are formed in the upper corundum tube and the lower corundum tube, and metal wires are arranged in the through holes.
As a still further technical scheme of the present invention, a fan for exchanging heat of the heating element is provided on the protective case.
As a further technical scheme of the invention, the bottom of the protective shell is provided with a probe assembly for connecting an external power supply connector and an internal electric appliance.
Compared with the prior art, the invention has the beneficial effects that:
1. a halogen lamp is arranged at the focus of the ellipsoid reflecting mirror, and the light is focused on a sample after being converged by the ellipsoid reflecting mirror, so that the sample is heated, wherein the heating temperature is up to 2200 ℃; the heating mode has larger temperature gradient, and the camera is arranged at a position away from the sample to be detected by a certain distance, so that the color and the appearance change of the sample at high temperature can be monitored in real time, and the high-temperature real-time state of the sample can be further known.
2. Sleeving a quartz tube outside a sample to be detected, controlling an air inlet valve and an air outlet valve, and introducing different atmospheres (vacuum, oxygen, hydrogen, argon and the like) so as to ensure the stability of the sample or explore the chemical reaction between gas and the sample at high temperature, and detecting the influence of the reaction on the performance of the sample;
3. can ensure the stability and real-time monitoring performance of the sample at 2200 ℃ as high as the temperature.
Drawings
FIG. 1 is a top view of an infrared heated wide temperature range, controlled atmosphere, visual electrical test system;
FIG. 2 is a front view of an infrared light heated wide temperature range, atmosphere controllable, visual electrical test system;
FIG. 3 is a schematic diagram of the internal structure of an infrared heating wide temperature range, atmosphere controllable, visual electrical test system;
FIG. 4 is a schematic view of a partial structure of a visible electrical testing system with a wide temperature range heated by infrared light and controllable atmosphere.
In the figure: 1-a protective shell, 2-a halogen lamp, 3-a quartz tube, 4-a sample to be tested, 5-a temperature recorder, 6-an electrical tester, 7-a metal wire, 8-a camera, 9-an upper bearing device, 10-an upper locking device, 11-an upper rod, 12-an air inlet valve, 13-an upper connecting device, 14-an ellipsoid reflecting mirror and 15-an upper corundum tube, 16-lower corundum tube, 17-lower bearing device, 18-lower connecting device, 19-gas outlet valve, 20-lower locking device, 21-lower rod, 22-upper flange, 23-upper connecting head, 24-lower connecting head, 25-lower flange, 26-upper electrode plate, 27-corundum plate, 28-lower electrode plate, A-upper probe part and B-lower probe part.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
The embodiment of the present invention is implemented as follows, and the infrared light heating wide temperature range, atmosphere controllable and visible electrical test system shown in fig. 1 to 4 comprises:
a protective shell (1) is provided,
the measuring clamp is arranged in the protective shell 1 and used for loading a sample 4 to be measured and enabling the sample 4 to be measured to be in a gas protection atmosphere;
the heating element is arranged in the protective shell 1 and used for heating a sample 4 to be detected;
the temperature recorder 5 is connected with the measuring clamp and used for detecting the temperature of the sample 4 to be detected;
the electrical tester 6 is connected with the measuring clamp and is used for detecting a test signal of the sample 4 to be tested;
and the camera 8 is used for monitoring the state of the sample 4 to be detected in real time.
In practical application, a sample 4 to be tested is placed on a measuring clamp, then atmosphere is controlled to be introduced, the sample is kept stable, heating is carried out through a heating element, the temperature is monitored in real time under the action of a temperature recorder 5, an electrical tester 6 detects a test signal, and the state of the sample is monitored in real time through a camera 8; the chemical reaction between different atmospheres (vacuum, oxygen, hydrogen, argon and the like) and the sample 4 to be detected at high temperature can be explored, the influence of the reaction on the performance of the sample 4 to be detected can be detected, the high-temperature stability and the real-time monitoring performance of the sample 4 to be detected are realized, and the method is more practical.
As shown in fig. 2 to 4, as a preferred embodiment of the present invention, the measuring jig includes an upper probe portion a and a lower probe portion B coupled thereto, the upper probe portion a is connected to the lower probe portion B through a quartz tube 3, and the upper probe portion a includes:
the upper bearing device 9 is fixedly arranged in the protective shell 1;
the upper locking device 10 is arranged in the upper bearing device 9, and an upper rod 11 is arranged in the upper locking device 10;
one end of the upper corundum tube 15 is connected with the upper rod 11 through the upper connecting device 13, and the other end of the upper corundum tube is provided with an upper electrode plate 26;
and an intake valve 12 mounted on the upper connecting means 13 for inflating the quartz tube 3.
The lower probe portion B includes:
the lower bearing device 17 is fixedly arranged in the protective shell 1;
the lower locking device 20 is arranged in the lower bearing device 17, and a lower rod 21 is arranged in the lower locking device 20;
one end of the lower corundum tube 16 is connected with the lower rod 21 through a lower connecting device 18, and the other end of the lower corundum tube is provided with a corundum plate 27;
a lower electrode plate 28 which is arranged on one side of the corundum plate 27 far away from the lower corundum tube 16 and is matched with the upper electrode plate 26;
a gas outlet valve 19 mounted on the lower connecting means 18 for exhausting gas from the quartz tube 3;
the quartz tube 3 is connected with an upper connecting device 13 at one end and a lower connecting device 18 at the other end, and is used for sealing an upper corundum tube 15 and a lower corundum tube 16 inside.
In one case of the embodiment, the upper probe part A fixes the upper corundum tube 15 and the upper rod 11, one end of the metal wire 7 passes through a through hole of the upper corundum tube 15 to be connected with an upper electrode plate 26 at the lower end of the upper corundum tube 15, and the other end of the metal wire is connected with the electrical tester 6; the lower probe part B is characterized in that a lower corundum tube 16 and a lower rod 21 are fixed, a corundum plate 27 is placed at the upper end of the lower corundum tube 16 and used for bearing a sample 4 to be tested, an electrode plate 28 is placed at the upper end of the corundum plate 27, one end of a metal wire 7 penetrates through one through hole in the lower corundum tube 16 and the corundum plate 27 and is connected with the electrode plate, the other end of the metal wire 7 is connected with an electrical tester 6, one end of the other metal wire 7 penetrates through the other through hole in the lower corundum tube 16 and is connected with the corundum plate 27, and the other end of the metal wire is connected with a temperature recorder 5; when the device works, the quartz tube 3 is arranged outside the sample 4 to be detected, and the air inlet valve 12 and the air outlet valve 19 are arranged at two ends of the sample so as to control the introduction of different atmospheres, because the material is easy to contact with gas at high temperature to react, for example, a metal material is easy to react with oxygen in the air at high temperature to form an oxide film, and certain oxides are easy to undergo reduction reaction at high temperature, so that different atmospheres are introduced to ensure the stability of the material at high temperature; in addition, the introduced gas can explore the chemical reaction between the gas and the sample 4 to be detected at high temperature, and detect the influence of the reaction on the performance of the sample 4 to be detected; further, in the preparation process of the sample 4 to be detected, electrodes are arranged according to the target temperature of the sample 4 to be detected, if the sample is to be detected to be 400 ℃, the upper electrode plate 26 and the lower electrode plate 28 can be made of silver sheets, and the metal wire 7 is made of silver wires; if the temperature of the sample 4 to be measured is 1500 ℃, platinum sheets are selected as the upper electrode sheet 26 and the lower electrode sheet 28, and the metal wire 7 is a platinum wire.
As shown in fig. 3, as another preferred embodiment of the present invention, the upper connecting means 13 comprises:
an upper flange 22, one side of which is connected with the upper rod 11 and the other side of which is connected with the quartz tube 3;
the upper connector 23 is arranged in the quartz tube 3, one end of the upper connector 23 is fixedly connected with the upper rod 11, and the other end of the upper connector 23 is fixedly connected with the upper corundum tube 15;
the lower connecting means 18 comprise:
a lower flange 25, one side of which is connected with the lower rod 21 and the other side of which is connected with the quartz tube 3;
and the lower connector 24 is arranged inside the quartz tube 3, one end of the lower connector 24 is fixedly connected with the lower rod 21, and the other end of the lower connector is fixedly connected with the lower corundum tube 16.
In one aspect of this embodiment, the upper flange 22 and the upper connector 23 are connected to improve the connection stability of the upper end and maintain the sealing performance, the lower flange 25 and the lower connector 24 are connected to improve the connection stability of the lower end and maintain the sealing performance, the whole structure is more stable, and the sealing effect is good.
As shown in fig. 2 and 3, as another preferred embodiment of the present invention, the heating member includes:
an ellipsoidal reflector 14 fixedly mounted on the lower load bearing device 17;
and the halogen lamp 2 is fixedly arranged in the ellipsoidal reflector 14, and when the halogen lamp 2 works, the emitted light is focused by the ellipsoidal reflector 14 to heat the sample 4 to be measured.
In one aspect of this embodiment, the ellipsoidal reflectors 14 are provided in plurality, the ellipsoidal reflectors 14 are uniformly distributed outside the quartz tube 3, four in this embodiment are provided, the halogen lamps 2 are located at the focal points of the ellipsoidal reflectors 14, emit light from the light source, are focused by the ellipsoidal reflectors 14 and then converge on the sample 4 to be measured, and serve as a heat source to heat the sample 4 to be measured, the heating temperature is as high as 2200 ℃, preferably, the protective shell 1 is provided with a fan for exchanging heat with the heating element, and the bottom of the protective shell 1 is provided with a probe assembly for connecting an external power supply connector and an internal electrical appliance; when the temperature recorder works, the halogen lamp 2 is started, the power is slowly increased, and the readings of the temperature recorder 5 and the electrical tester 6 are recorded in real time.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential attributes thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present specification describes embodiments, not every embodiment includes only a single embodiment, and such description is for clarity purposes only, and it is to be understood that all embodiments may be combined as appropriate by one of ordinary skill in the art to form other embodiments as will be apparent to those of skill in the art from the description herein.
Claims (11)
1. Infrared heating wide temperature range, atmosphere controllable, visual electricity test system, its characterized in that includes:
a protective shell, a plurality of fixing holes and a plurality of fixing holes,
the measuring clamp is arranged in the protective shell and used for loading a sample to be measured and enabling the sample to be measured to be in a gas protection atmosphere;
the heating element is arranged in the protective shell and used for heating a sample to be detected;
the temperature recorder is connected with the measuring clamp and used for detecting the temperature of the sample to be detected;
the electrical tester is connected with the measuring clamp and is used for detecting a test signal of a sample to be tested;
and the camera is used for monitoring the state of the sample to be detected in real time.
2. The infrared heated wide temperature range, controlled atmosphere, visual electrical test system of claim 1, in which the measurement fixture includes an upper probe portion and a lower probe portion mated therewith, the upper probe portion being connected to the lower probe portion by a quartz tube.
3. The infrared light heated wide temperature range, controlled atmosphere, visual electrical test system of claim 2, wherein the upper probe section comprises:
the upper bearing device is fixedly arranged in the protective shell;
the upper locking device is arranged in the upper bearing device, and an upper rod is arranged in the upper locking device;
one end of the upper corundum tube is connected with the upper rod through an upper connecting device, and the other end of the upper corundum tube is provided with an upper electrode plate;
and the air inlet valve is arranged on the upper connecting device and used for inflating the quartz tube.
4. The infrared heated wide temperature range, atmosphere-controllable, visual electrical test system of claim 3, wherein the lower probe portion comprises:
the lower bearing device is fixedly arranged in the protective shell;
the lower locking device is arranged in the lower bearing device, and a lower rod is arranged in the lower locking device;
one end of the lower corundum tube is connected with the lower rod through a lower connecting device, and the other end of the lower corundum tube is provided with a corundum plate;
the lower electrode plate is arranged on one side of the corundum plate far away from the lower corundum tube and matched with the upper electrode plate;
the gas outlet valve is arranged on the lower connecting device and used for exhausting gas from the quartz tube;
one end of the quartz tube is connected with the upper connecting device, and the other end of the quartz tube is connected with the lower connecting device, and the quartz tube is used for sealing the upper corundum tube and the lower corundum tube inside.
5. The infrared heated wide temperature range, controlled atmosphere, visual electrical test system of claim 4, wherein the upper attachment means comprises:
one side of the upper flange is connected with the upper rod, and the other side of the upper flange is connected with the quartz tube;
and the upper connector is arranged in the quartz tube, one end of the upper connector is fixedly connected with the upper rod, and the other end of the upper connector is fixedly connected with the upper corundum tube.
6. The infrared heated wide temperature range, controlled atmosphere, visual electrical test system of claim 4, wherein the lower attachment means comprises:
one side of the lower flange is connected with the lower rod, and the other side of the lower flange is connected with the quartz tube;
the lower connector is arranged in the quartz tube, one end of the lower connector is fixedly connected with the lower rod, and the other end of the lower connector is fixedly connected with the lower corundum tube.
7. The infrared heated wide temperature range, controlled atmosphere, visual electrical test system of claim 4, wherein the heating element comprises:
the ellipsoidal reflector is fixedly arranged on the lower bearing device;
and the halogen lamp is fixedly arranged in the ellipsoidal reflector, and when the halogen lamp works, the emitted light is focused by the ellipsoidal reflector and then heats a sample to be measured.
8. The infrared heated wide temperature range, controlled atmosphere, visual electrical test system of claim 7, wherein a plurality of the ellipsoidal reflectors are provided and uniformly distributed outside the quartz tube.
9. The infrared heating wide temperature range, atmosphere controllable and visible electrical testing system according to claim 4, characterized in that the upper corundum tube and the lower corundum tube are both provided with through holes, and metal wires are installed in the through holes.
10. The infrared heating wide temperature range, atmosphere controllable, visual electrical test system of claim 1, wherein a fan for exchanging heat with a heating element is provided on the protective shell.
11. The infrared light heated wide temperature range, controlled atmosphere, visual electrical testing system of claim 1 or 10, wherein a probe assembly for connecting an external power supply connection and an internal electrical appliance is provided at the bottom of the protective case.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210480041.XA CN114791541A (en) | 2022-05-05 | 2022-05-05 | Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210480041.XA CN114791541A (en) | 2022-05-05 | 2022-05-05 | Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN114791541A true CN114791541A (en) | 2022-07-26 |
Family
ID=82462208
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210480041.XA Pending CN114791541A (en) | 2022-05-05 | 2022-05-05 | Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN114791541A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115494339A (en) * | 2022-11-15 | 2022-12-20 | 陕西华秦科技实业股份有限公司 | High-precision atmosphere controllable temperature-changing electrical testing system |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050183820A1 (en) * | 2004-02-24 | 2005-08-25 | Kenji Fukuda | Thermal treatment equipment |
| CN101122577A (en) * | 2007-09-14 | 2008-02-13 | 清华大学 | Solid oxide electrolytic cell high temperature electrochemical property test device |
| CN105203848A (en) * | 2015-06-16 | 2015-12-30 | 湘潭大学 | Detection device for complex impedance spectrum and method thereof |
| KR101636692B1 (en) * | 2016-06-17 | 2016-07-06 | 주식회사 신한이엔지 | Integrated Testing Equipment |
| WO2020192453A1 (en) * | 2019-03-28 | 2020-10-01 | 中国科学院上海硅酸盐研究所 | Material high-temperature dielectric performance test system |
| JP6841478B1 (en) * | 2020-02-14 | 2021-03-10 | 北京科技大学 | In-situ test equipment and method for the reaction behavior of refractory materials under stress |
| CN113390935A (en) * | 2021-07-21 | 2021-09-14 | 清华大学 | High-temperature electrochemical test system |
-
2022
- 2022-05-05 CN CN202210480041.XA patent/CN114791541A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050183820A1 (en) * | 2004-02-24 | 2005-08-25 | Kenji Fukuda | Thermal treatment equipment |
| CN101122577A (en) * | 2007-09-14 | 2008-02-13 | 清华大学 | Solid oxide electrolytic cell high temperature electrochemical property test device |
| CN105203848A (en) * | 2015-06-16 | 2015-12-30 | 湘潭大学 | Detection device for complex impedance spectrum and method thereof |
| KR101636692B1 (en) * | 2016-06-17 | 2016-07-06 | 주식회사 신한이엔지 | Integrated Testing Equipment |
| WO2020192453A1 (en) * | 2019-03-28 | 2020-10-01 | 中国科学院上海硅酸盐研究所 | Material high-temperature dielectric performance test system |
| JP6841478B1 (en) * | 2020-02-14 | 2021-03-10 | 北京科技大学 | In-situ test equipment and method for the reaction behavior of refractory materials under stress |
| CN113390935A (en) * | 2021-07-21 | 2021-09-14 | 清华大学 | High-temperature electrochemical test system |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115494339A (en) * | 2022-11-15 | 2022-12-20 | 陕西华秦科技实业股份有限公司 | High-precision atmosphere controllable temperature-changing electrical testing system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN114791541A (en) | Infrared heating wide temperature range, atmosphere controllable and visible electrical testing system | |
| CN111458305A (en) | In-situ high-temperature spectrum testing device | |
| US3507145A (en) | Indium sesquioxide thin film combustible gas detector | |
| JP6578090B2 (en) | Cell evaluation system | |
| US11296342B2 (en) | Universal tubular solid oxide fuel cell testing kit | |
| JP4430844B2 (en) | Device for measuring the hydrogen concentration in the gas mixture | |
| CN108051487B (en) | A kind of stage apparatus of multifunctional solid oxide electrology characteristic test | |
| JP3042229B2 (en) | Substrate heating device | |
| CN110133061A (en) | One kind being suitable for dielectric material performance test high temp samples platform | |
| CN110988049A (en) | Catalytic combustion type MEMS gas sensor and working method thereof | |
| CN113866248B (en) | Detection method of carbon dioxide concentration detection sensor | |
| JP2005259354A (en) | Thermally insulated container | |
| JP4928672B2 (en) | Electrode structure of solid oxide fuel cell | |
| Kocache et al. | A miniature rugged and accurate solid electrolyte oxygen sensor | |
| CN214252093U (en) | High-temperature high-pressure in-situ XAS testing device | |
| RU2716875C1 (en) | Cell for the study of high-temperature conductivity of solids | |
| JP2002261037A (en) | Lamp and heat treatment device using the same | |
| Amita et al. | A high-temperature high-pressure optical cell for general-purpose spectrometers designed for supercritical water experiments | |
| Gao et al. | Low-Cost radiant heater for rapid response, high-temperature heating | |
| JPH09229779A (en) | Thermocuple for semiconductor element manufacturing apparatus | |
| CN213078481U (en) | Quick temperature change test box | |
| RU200605U1 (en) | DEVICE FOR ELECTROCHEMICAL RESEARCH OF TUBULAR SOLID OXIDE FUEL CELLS | |
| RU2781412C1 (en) | Sensor for determining the concentration of hydrogen in a gaseous environment | |
| RU2783751C1 (en) | Device for determining electrophysical characteristics of samples from thermoelectric materials | |
| Gao et al. | Low-Cost Radiant Heater for Rapid Response |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |