CN114778897A

CN114778897A - Semiconductor test fixture

Info

Publication number: CN114778897A
Application number: CN202210383774.1A
Authority: CN
Inventors: 丁崇亮; 张飞龙; 付盼红
Original assignee: Weinan Muwang Intelligent Technology Co ltd
Current assignee: Weinan Muwang Intelligent Technology Co ltd
Priority date: 2022-04-12
Filing date: 2022-04-12
Publication date: 2022-07-22

Abstract

The invention discloses a semiconductor test fixture which comprises a base, wherein a cushion block is arranged on the lower side of the base, clamping holes are formed in the cushion block, a fixing plate is hinged to the lower side of the base, a limiting hole is formed in the fixing plate, a hook matched with the fixing plate is assembled on the side portion of the base, and a fixture body is arranged below the fixing plate. The semiconductor test fixture solves the problems that the existing semiconductor test is high in difficulty and low in efficiency, and large-scale factory operation is difficult to realize.

Description

Semiconductor test fixture

Technical Field

The invention belongs to the technical field of semiconductor detection, and particularly relates to a semiconductor test fixture.

Background

The semiconductor test probe is a micro linker with wide application, and is widely applied to the fields of medical treatment, microelectronics, photoelectricity and the like.

Because the existing semiconductor test has high operation difficulty and low efficiency and is difficult to realize large-scale test and screening, the labor cost in the test process is difficult to reduce in the actual operation. Therefore, how to realize rapid and large-scale testing and screening becomes very urgent and important.

Disclosure of Invention

The invention aims to provide a semiconductor test fixture, which solves the problems that the existing semiconductor test is difficult to realize and has low efficiency, and large-scale factory operation is difficult to realize.

In order to achieve the above object, a first technical solution adopted by the present invention is: the utility model provides a semiconductor test fixture, includes the base, and the downside of base is provided with the cushion, be provided with the clamping hole on the cushion, the downside of base articulates there is the fixed plate, be provided with spacing hole on the fixed plate, the lateral part of base is equipped with the couple of fixed integrated circuit board fit, the below of fixed plate is provided with the anchor clamps body.

As a preferable technical scheme of the invention, the hook is hinged on the side part of the base, and the upper side of the hook is connected to the side part of the base through a spring.

As a preferable technical scheme, a first pin shaft is arranged on the side portion of the base, and the hook is sleeved on the first pin shaft.

As a preferred technical scheme of the present invention, a second pin is disposed on a lower side of the base, and the fixing plate is sleeved on the second pin.

As a preferable aspect of the present invention, a rotary cover is provided on an upper side of the base.

As a preferred technical solution of the present invention, an external threaded connector is provided on an upper side of the base, and the rotary cap is threadedly fitted on the external threaded connector.

As a preferable technical scheme of the invention, the upper side of the base is provided with a limiting pin which is positioned on the outer side of the external thread connector.

As a preferred technical scheme of the invention, the number of the limiting pins is two, and the limiting pins are oppositely arranged on two sides of the external thread connector in an angle of 180 degrees.

As a preferred technical solution of the present invention, the fixture body includes a substrate, a fixture seat is disposed on the substrate, a fixture bearing seat is disposed in the fixture seat, and a mounting groove is disposed in the fixture bearing seat.

As a preferable technical scheme of the present invention, the whole seat of the clamp is provided with a plurality of grooves, and the grooves are communicated with the mounting groove and located at one side of the mounting groove.

The invention has the beneficial effects that: the semiconductor test fixture used by the invention can respectively clamp and position the tested object and the test instrument, so that the tested object and the test instrument can quickly finish accurate contraposition contact, further realize related test detection, greatly improve the production efficiency, reduce the operation difficulty and have better market popularization and application prospects.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:

FIG. 1 is a schematic structural diagram of a semiconductor test fixture according to the present invention;

FIG. 2 is a partially exploded view of a semiconductor test fixture according to the present invention;

fig. 3 is a schematic structural diagram of a fixture body in a semiconductor test fixture according to the present invention.

In the figure: 1. the test device comprises a base, 2 parts of an external thread connector, 3 parts of a rotating cover, 4 parts of a limiting pin, 5 parts of a spring, 6 parts of a hook, 7 parts of a first pin shaft, 8 parts of a base plate, 9 parts of a fixing plate, 10 parts of a cushion block, 11 parts of a second pin shaft, 12 parts of a clamp seat, 13 parts of a clamp bearing seat, 14 parts of a test instrument and 15 parts of a tested product.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the accompanying drawings are illustrative only for the purpose of explaining the present invention, and are not to be construed as limiting the present invention.

In the description of the present invention, if there are first and second descriptions for distinguishing technical features, they are not interpreted as indicating or implying relative importance or implicitly indicating the number of indicated technical features or implicitly indicating the precedence of the indicated technical features.

In the description of the present invention, unless otherwise explicitly limited, terms such as arrangement, installation, connection and the like should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific contents of the technical solutions.

As shown in figure 1, the semiconductor test fixture comprises a base 1, wherein a cushion block 10 is arranged on the lower side of the base 1, clamping holes are formed in the cushion block 10, a fixing plate 9 is hinged to the lower side of the base 1, limiting holes are formed in the fixing plate 9, a hook 6 matched with the fixing plate 9 in a clamping mode is assembled on the side portion of the base 1, and a fixture body is arranged below the fixing plate 9.

With reference to fig. 2, in use, the fixing plate 10 is taken down from the hook 6, then the testing instrument 14 is placed on the cushion block 8, finally the fixing plate 10 and the hook 6 are buckled again, the tested product 15 (such as a testing probe) is clamped in the fixture body, and then the fixing plate 10 is aligned with the tested product 15 to ensure that the fixing plate is contacted with the tested product 15, so that the testing can be performed. Due to the limiting effect of the fixing plate 9 and the clamp body, the distance between the testing instrument 14 and the tested product 15 is controllable, so that overpressure caused by too large force due to too short distance is avoided, good contact between the testing instrument and the tested product can be ensured by controlling a proper distance, and detection can be completed quickly and accurately.

Referring to fig. 2, in a semiconductor test fixture of the present invention, a hook 6 is hinged to a side portion of a base 1, and an upper side of the hook 6 is connected to the side portion of the base 1 through a spring 5.

Design like this, when fixed plate 10 upwards moves, can push up the lower extreme of moving couple 6 and make it take place anticlockwise rotation, spring 5 shrink this moment, after fixed plate 9 lock is on cushion 8, clockwise rotation takes place for the lower extreme of couple 6 under the effect of spring 5 elasticity, and the lower extreme of couple 6 and the downside bayonet socket of fixed plate 9 this moment are in the same place.

When the fixing plate 9 needs to be detached, a person rotates the upper end of the hook 6 anticlockwise, and at the moment, the lower end of the hook 6 is tripped from the fixing plate 9.

Referring to fig. 2, in the semiconductor test fixture of the present invention, a first pin 7 is disposed at a side portion of the base 1, and the hook 6 is sleeved on the first pin 7.

As an optimal hinging mode, the hinging assembly of the hook 6 at the side part of the base 1 can be finished by sleeving the hook 6 on the first pin shaft 7, and the assembly and payment are convenient.

Referring to fig. 2, in the semiconductor test fixture of the present invention, a second pin 10 is disposed at a lower side of the base, and the fixing plate 9 is sleeved on the second pin 10.

As a preferred hinging mode, the fixing plate 9 is sleeved on the second pin shaft 11 to rotate by taking the second pin shaft 10 as a reference, so that the fixing plate and the cushion block 8 are buckled and disassembled.

Referring to fig. 2, in the semiconductor test fixture of the present invention, a rotary cap 3 is disposed on the upper side of a base 1.

The staff can drive the fixed plate 9 to move towards the tested product 15 by holding the rotary cover 3, and the operation is convenient.

Referring to fig. 2, in the semiconductor test fixture of the present invention, an external screw connector 2 is disposed on an upper side of a base 1, and a rotary cap 3 is threadedly mounted on the external screw connector 2.

The rotary cap 3 can be assembled on the external thread connector 2, so that the distance of the rotary cap 3 can be adjusted to adapt to adjustment of different distances.

Referring to fig. 2, in the semiconductor test fixture of the present invention, a limit pin 4 is disposed on the upper side of the base 1, and the limit pin 4 is located outside the external threaded connector 2.

The limiting pin 4 can prevent the rotary cover 3 from being arranged at the lowest position on the external thread connector 2, and the lowest position is limited to a certain extent.

Referring to fig. 2, in the semiconductor test fixture of the present invention, the number of the limiting pins 3 is two, and the limiting pins are oppositely arranged at 180 ° on two sides of the external threaded connector 2.

Two spacer pin east 3 are located the below of rotatory lid 3, are 180 symmetrical arrangement and can ensure that rotatory lid 3 can keep balance, can not take place to rock.

Referring to fig. 3, in the semiconductor test fixture of the present invention, the fixture body includes a substrate 8, a fixture seat 12 is disposed on the substrate 8, a fixture seat 13 is disposed in the fixture seat 12, and a mounting groove is disposed in the fixture seat 13.

The test instrument 15 is clamped and placed in the mounting groove, and the test end of the test instrument 15 extends out of the mounting groove.

Referring to fig. 3, in the semiconductor test fixture of the present invention, the fixture base 13 is provided with a plurality of grooves, and the grooves are communicated with the mounting groove and located at one side of the mounting groove.

The purpose of the grooves is to facilitate the placement of the test instrument 15 in the mounting groove by means of an auxiliary tool,

therefore, compared with the prior art, the semiconductor test fixture used by the invention can respectively clamp and position the tested product and the test instrument, so that the tested product and the test instrument can be quickly and accurately aligned and contacted, further relevant test detection is realized, the production efficiency is greatly improved, the operation difficulty is reduced, and the market popularization and use prospect is better.

While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. The utility model provides a semiconductor test fixture, its characterized in that, includes base (1), and the downside of base (1) is provided with cushion (10), be provided with the clamping hole on cushion (10), the downside of base (1) articulates there is fixed plate (9), be provided with spacing hole on fixed plate (9), the lateral part of base (1) is equipped with fixed plate (9) clamp complex couple (6), the below of fixed plate (9) is provided with the anchor clamps body.

2. The semiconductor test fixture according to claim 1, wherein the hook (6) is hinged to the side of the base (1), and the upper side of the hook (6) is connected to the side of the base (1) through a spring (5).

3. The semiconductor test fixture according to claim 2, wherein a first pin (7) is disposed on a side portion of the base (1), and the hook (6) is sleeved on the first pin (7).

4. The semiconductor testing fixture according to claim 3, wherein a second pin (11) is disposed on a lower side of the base (1), and the fixing plate (9) is sleeved on the second pin (11).

5. Semiconductor test fixture according to claim 4, characterized in that the base (1) is provided with a rotary cover (3) on its upper side.

6. The semiconductor test fixture according to claim 5, wherein the base (1) is provided at an upper side thereof with an external screw connector (2), and the rotary cap (3) is screw-fitted to the external screw connector (2).

7. The semiconductor test fixture according to claim 6, wherein a limit pin (4) is disposed on the upper side of the base (1), and the limit pin (4) is located on the outer side of the external threaded connector (2).

8. The semiconductor test fixture according to claim 7, wherein the number of the limiting pins (4) is two, and the limiting pins are oppositely arranged on two sides of the external threaded connector (2) at 180 degrees.

9. The semiconductor testing fixture according to claim 8, wherein the fixture body comprises a base plate (8), a fixture seat (12) is disposed on the base plate (8), a fixture bearing seat (13) is disposed in the fixture seat (12), and a mounting groove is disposed in the fixture bearing seat (13).

10. The semiconductor testing fixture of claim 9, wherein the fixture base (13) is provided with a plurality of grooves, and the grooves are communicated with the mounting groove and located at one side of the mounting groove.