CN114678716A - Elastic piece probe and elastic piece probe module - Google Patents
Elastic piece probe and elastic piece probe module Download PDFInfo
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- CN114678716A CN114678716A CN202011549589.2A CN202011549589A CN114678716A CN 114678716 A CN114678716 A CN 114678716A CN 202011549589 A CN202011549589 A CN 202011549589A CN 114678716 A CN114678716 A CN 114678716A
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- 239000000523 sample Substances 0.000 title claims abstract description 137
- 238000012360 testing method Methods 0.000 claims abstract description 55
- 125000006850 spacer group Chemical group 0.000 claims description 38
- 239000012634 fragment Substances 0.000 claims description 11
- 238000013519 translation Methods 0.000 claims description 5
- 238000003780 insertion Methods 0.000 claims description 3
- 230000037431 insertion Effects 0.000 claims description 3
- 230000014759 maintenance of location Effects 0.000 claims 1
- 230000008719 thickening Effects 0.000 abstract description 15
- 230000002035 prolonged effect Effects 0.000 description 6
- 238000005491 wire drawing Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/15—Pins, blades or sockets having separate spring member for producing or increasing contact pressure
- H01R13/17—Pins, blades or sockets having separate spring member for producing or increasing contact pressure with spring member on the pin
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
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- Measuring Leads Or Probes (AREA)
Abstract
The embodiment of the invention discloses a shrapnel probe and a shrapnel probe module, wherein the shrapnel probe comprises an elastic middle part, a first conductive part and a second conductive part, the first conductive part and the second conductive part are connected with two opposite ends of the elastic middle part, the first conductive part comprises a first testing contact surface, a first thickening surface and a second thickening surface, the first thickening surface and the second thickening surface are connected with two opposite sides of the first testing contact surface, and the second conductive part comprises: the first probe face and the second probe face on second test contact surface opposite both sides are connected to the second test contact surface, and the first interval between first thickening face and the second thickening face is greater than the second interval between first probe face and the second probe face. The invention can improve the one-time accuracy of the test, increase the contact surface with the tested product and prolong the service life of the spring piece probe.
Description
Technical Field
The invention relates to the field of testing devices, in particular to a shrapnel probe and a shrapnel probe module.
Background
With the rapid development of modern society, the quality requirements of people on electronic products are higher and higher, and the requirements of test equipment for detecting the electronic products are higher and higher, at present, in the conduction test of a small-distance BTB connector, the test equipment is connected with a tested product by taking a probe as a connecting piece, and a Blade Pin (sheet Pin) is gradually replacing a Pogo Pin (cylindrical Pin) to be widely applied.
However, the prior art sheet-like needles often have problems of short life span and/or low test accuracy. Therefore, the invention provides a probe with long service life and high test accuracy, which is a problem to be solved urgently.
Disclosure of Invention
The invention mainly aims to provide a spring probe and a spring probe module aiming at the defects of the prior art, which can increase the contact surface with a connector to be tested, improve the one-time accuracy of the test and prolong the service life.
Specifically, one embodiment of the present invention discloses a pogo pin, comprising: the elastic middle part, a first conductive part connected with one end of the elastic middle part and a second conductive part connected with the other end of the elastic middle part far away from the first conductive part. The first conductive portion includes: first test contact surface, first thickening face and second thickening face, first test contact surface is located first conductive part is kept away from one side at elasticity middle part for connect the connector that awaits measuring, first thickening face is connected one side of first test contact surface, the second thickening face is connected the another side of first test contact surface, and with first thickening face is relative. The second conductive portion includes: second test contact surface, first probe face and second probe face, the second test contact surface is located the second conductive part is kept away from one side at elasticity middle part for connect the switching circuit board, first probe face is connected one side of second test contact surface, the second probe face is connected the another side of second test contact surface, and with first probe face is relative.
The first distance between the first thickening surface and the second thickening surface is larger than the second distance between the first probe surface and the second probe surface, so that the first testing contact surface of the first conductive part is in full contact with the connector to be tested, the testing accuracy is improved, and meanwhile the service life of the elastic piece probe is prolonged.
In an embodiment of the present invention, the elastic middle portion, the first conductive portion and the second conductive portion are an integrated structure.
The embodiment of the invention also discloses a shrapnel probe module, which comprises: the probe assembly comprises a floating plate, a base plate, a connecting assembly and a probe assembly, wherein the connecting assembly is used for connecting the floating plate with the base plate. The floating plate is provided with a plurality of elastic piece probe limiting holes; the bottom plate is arranged corresponding to the floating plate, and a plurality of elastic piece probe limiting grooves are formed in one side, far away from the floating plate; the probe assembly comprises any one of the elastic sheet probes.
The first conductive part of each spring probe is connected with the connector to be tested through the corresponding spring probe limiting hole, and the second conductive part of each spring probe is connected with the adapter circuit board through the spring probe limiting groove.
In one embodiment of the invention, the connecting assembly comprises an elastic connecting piece and an adjustable guiding limit connecting piece.
The elastic connecting piece is connected with the floating plate and the bottom plate so as to realize the translation of the floating plate relative to the bottom plate along the elastic force direction of the elastic connecting piece;
the adjustable guide limiting connecting piece is connected with the floating plate and the bottom plate and limits the translation distance of the floating plate relative to the bottom plate.
In an embodiment of the invention, the probe assembly further includes a plurality of spacers, at least one spacer is disposed between every two adjacent shrapnel probes, an accommodating cavity for accommodating the shrapnel probes and the spacers is disposed on one side of the bottom plate away from the floating plate, a plurality of spacer clamping grooves are disposed on two opposite sides of an inner wall of the accommodating cavity, and each spacer is clamped with the corresponding spacer clamping groove.
In an embodiment of the invention, one spacer is arranged between every two adjacent shrapnel probes among the shrapnel probes, and the distance between every two adjacent shrapnel probes is not more than 0.35 mm.
In one embodiment of the invention, the connecting assembly further comprises a mounting plate connecting piece and a mounting pin, and the bottom plate comprises a bottom plate main body and a detachable mounting plate positioned on one side of the bottom plate far away from the floating plate.
Wherein the mounting plate connecting member connects the base plate main body and the detachable mounting plate so that the detachable mounting plate is detachable from the base plate main body to facilitate replacement of the probe assembly;
wherein, the assembly pin runs through the kickboard, bottom plate main part with can dismantle the mounting panel, just the assembly pin is followed can dismantle and stretch out in the mounting panel, so that the accurate location of second conductive part is to on the adapter circuit board.
In an embodiment of the invention, a plurality of positioning protrusions are arranged on one side of the floating plate away from the bottom plate, and the positioning protrusions are symmetrically distributed around the elastic piece probe limiting hole to limit the insertion position of the connector to be tested.
The technical scheme has the following advantages or beneficial effects:
the thickness of the first conductive part of the elastic piece probe is increased, so that the contact surface between the first conductive part and the connector to be tested is increased, the one-time accuracy of conduction testing is greatly improved, and the service life of the elastic piece probe is prolonged. The elastic piece probe module adopting the elastic piece probe has the advantages of the elastic piece probe, the number and the interval of the elastic piece probes in the elastic piece probe module can be adjusted according to actual needs, the elastic piece probe module is widely suitable for connectors to be tested with different numbers or center distances, the universality of the elastic piece probe module is improved, the manufacturing cost is saved, the service life is prolonged, and in addition, the elastic piece probe module is small in size, high in assembly precision and simple and convenient to assemble and disassemble.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1a is a schematic structural diagram of a pogo pin according to an embodiment of the present invention;
FIG. 1b is a diagram illustrating a structural comparison between a pogo pin according to an embodiment of the present invention and a conventional pin according to the related art;
FIG. 1c is a diagram illustrating a structure comparison of a pogo pin according to an embodiment of the present invention and a conventional pin according to the related art;
fig. 2 is a schematic view of an overall structure of a pogo pin module according to an embodiment of the present invention;
FIG. 3 is an exploded view of the pogo pin module shown in FIG. 2;
FIG. 4 is an exploded view of a portion of the pogo pin module shown in FIG. 2;
FIG. 5 is an enlarged view of a portion of the structure shown in FIG. 4 at location A;
fig. 6 is a schematic structural diagram of a pogo pin and an overcurrent pin in a pogo pin module according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings and specific implementation, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that all the directional indicators (such as up, down, left, right, front, and rear … …) in the embodiment of the present invention are only used to explain the relative position relationship between the components, the movement situation, etc. in a specific posture (as shown in the drawing), and if the specific posture is changed, the directional indicator is changed accordingly.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Some embodiments of the invention are described in detail below with reference to the accompanying drawings. The embodiments described below and the features of the embodiments can be combined with each other without conflict.
As shown in fig. 1a, a pogo pin 10 according to an embodiment of the present invention includes: an elastic middle portion 110, a first conductive portion 120, and a second conductive portion 130. The first conductive portion 120 is connected to one end of the resilient central portion 110, and the second conductive portion 130 is connected to the other end of the resilient central portion 110 remote from the first conductive portion 120. The first conductive part 120 includes, for example, a first testing contact surface 121, a first thickened surface 122 and a second thickened surface 123, and the first testing contact surface 121 is located on a side of the first conductive part 120 away from the elastic middle part 110 and is used for connecting a connector to be tested; the first mentioned thickened surface 122 connects one side of the first test contact surface 121; the second thickened surface 123 is mentioned to be connected to the other side of the first test contact surface 121 and to be opposite to the first thickened surface 122. The second conductive part 130 includes, for example, a second test contact surface 131, a first probe surface 132 and a second probe surface 133, the second test contact surface 131 is located on a side of the second conductive part 130 away from the flexible middle part 110 for connecting to the adapting circuit board, the first probe surface 132 is connected to one side of the second test contact surface 131, and the second probe surface 133 is connected to the other side of the second test contact surface 131 and is opposite to the first probe surface.
The first distance d1 between the first thickened surface 122 and the second thickened surface 123 is greater than the second distance d2 between the first probe surface 132 and the second probe surface 133, so that the first testing contact surface 121 of the first conductive part 120 is in full contact with the connector to be tested, the test accuracy is improved, the contact surface with the product to be tested is increased, and the service life of the spring probe is prolonged.
Specifically, as shown in fig. 1a, the embodiment takes the connector to be tested as a testing female connector for illustration, the mentioned first conductive part 120 is, for example, a pointed shape, two ends of the elastic middle part 110, which are connected to the first conductive part 120 and the second conductive part 130, are both rectangular spring pieces, and an S-shaped spring piece is connected between the two rectangular spring pieces, so that the spring piece probe 10 is not easy to break and has certain elasticity. The second conductive portion 130 is provided with a pentagonal contact spring, for example, and the shortest side is in contact connection with the adapting circuit board, but the embodiment does not limit the specific shape of the contact spring for the contact connection between the second conductive portion 130 and the adapting circuit board, and may also be a rectangular contact spring, for example. The elastic middle portion 110, the first conductive portion 120 and the second conductive portion 130 are integrally formed, for example.
In other embodiments of the present invention, the pogo pin 10 may also be used to connect a testing male connector, that is, the connector to be tested may also be a testing male connector, specifically, the structure of the pogo pin 10 is different from the structure shown in fig. 1a in that the first conductive portion 120 is not in a pointed shape, that is, is not protruded outward, but is recessed inward, for example, as shown in the right side of fig. 6, the first conductive portion 120 of the pogo pin 10 is, for example, in a zigzag shape, and is suitable for connecting the testing male connector. Similarly, the first conductive portion 120 is thickened, the elastic middle portion 110 is also configured as an S-shape, and the second conductive portion 130 is configured with two pentagonal-like contact spring pieces, for example, and the shortest side is in contact connection with the adapting circuit board, but the embodiment does not limit the specific shape and number of the contact spring pieces in contact connection between the second conductive portion 130 and the adapting circuit board. Of course, the specific shape of the first connection portion 120 in the pogo pin 10 is not limited in this embodiment, and it may be a pointed shape as shown on the left side of fig. 6, or a sawtooth shape as shown on the right side of fig. 6, or other shapes suitable for connecting the connector to be tested.
The pogo pin disclosed in the embodiments of the present invention may have various configurations, for example, fig. 1b and fig. 1c show reference examples of two pogo pins with different configurations, the left side of fig. 1b is the pogo pin 10a with different configurations of the present invention, and the right side of fig. 1b is the corresponding conventional uniform thickness probe 11a in the prior art; the left side of fig. 1c is a pogo pin 10b of the present invention with a different configuration, and the right side of fig. 1c is a corresponding conventional uniform thickness pin 11b of the prior art. The thickened end of the first conductive part 120a of the pogo pin 10a on the left side of fig. 1b is a cylinder with an inverted U-shaped cross section, and is located on the opposite left side of the first conductive part 120a of the pogo pin 10a, the elastic middle part 110a is S-shaped, and the contact end of the second conductive part 130a is located on the opposite left side of the pogo pin 10 a. The thickened end of the first conductive part 120b of the pogo pin 10b on the left side of fig. 1c is an inverted U-shaped column with a protrusion, and is located on the opposite right side of the first conductive part 120b of the pogo pin 10b, the elastic middle part 110b is S-shaped, and the contact end of the second conductive part 130b is located on the opposite right side of the pogo pin 10 b. Of course, the embodiment is not limited thereto, and the specific shape and relative position of the thickened end of the first conductive part 120a or the first conductive part 120b, and the number, specific shape and relative position of the contact end of the second conductive part 130a or the second conductive part 130b may be designed according to practical applications.
Further, the value of the first distance d1 is not more than 90% of the center distance of the connector to be tested, and the value of the second distance d2 is not more than 50% of the center distance of the connector to be tested. The center-to-center distance of the connectors to be tested is, for example, 0.35mm, etc., although the center-to-center distance of the connectors to be tested is not limited in this embodiment.
Specifically, compared with the conventional equal-thickness probe in the prior art, the spring probe 10 provided in the embodiment of the present invention performs thickening processing on both opposite sides of the first conductive part 120, and the spring probe 10 with the thickened first conductive part 120 is used in a corresponding fine-pitch test module, particularly a corresponding test module of a BTB connector with a fine pitch of less than 0.35MM, which can increase a contact surface with a connector to be tested, improve a service life and a one-time accuracy, and avoid that a contact point with the connector to be tested cannot be conducted due to too small contact, where the maximum value of the contact surface is about 90% of a center distance corresponding to the connector to be tested, and the maximum value of the contact surface of the conventional equal-thickness probe in the prior art is less than 50% of the center distance corresponding to the connector to be tested.
As shown in fig. 2-3, an embodiment of the present invention further provides a dome probe module 20, for example, including: a floating plate 210, a base plate 220, a connecting assembly 230, and a probe assembly 240. The floating plate 210 mentioned therein is provided with a plurality of pogo pin positioning holes 211; the mentioned bottom plate 220 is arranged corresponding to the floating plate 210, and one side far away from the floating plate 210 is provided with a plurality of spring probe limiting grooves 2221; the mentioned connection assembly 230 is used to connect the floating plate 210 and the bottom plate 220; the probe assembly 240 includes, for example, a plurality of pogo pins 10 as described in the previous embodiments.
The first conductive part 120 of each pogo pin 10 is connected to the connector to be tested through the corresponding pogo pin positioning hole 211, and the second conductive part 130 of each pogo pin 10 is connected to the adapting circuit board through the pogo pin positioning groove 2221.
The pogo pin module 20 is electrically connected to a connector to be tested, such as an FPC connector or a BTB connector inside a mobile phone, and an adaptor circuit board, such as a PCB circuit board, by using the pogo pin 10. The dome probe 10 subjected to thickening can increase the contact surface between the first conductive part 120 of the dome probe 10 and the connector to be tested, so that the service life and the one-time accuracy are improved, and the purposes of convenient assembly and disassembly and protection of the dome probe 10 can be realized through the arrangement of the floating plate 210, the bottom plate 220 and the connecting assembly 230.
Specifically, as shown in fig. 3 and 4, the probe assembly 240 further includes a spacer 241 and an overcurrent probe 242, for example, the mentioned spacer 241 is a rectangular ceramic plate, for example, to ensure good insulation and heat dissipation effects, although the material and shape of the spacer 241 are not limited in this embodiment, and may be specifically designed according to the practical application. The mentioned overcurrent probes 242 are similar to the structure of the aforementioned dome probe 10, and also have an electrically connected first end connected to the connector to be tested, an electrically connected second end connected to the interposer, and an elastic portion connected to the electrically connected first end and the electrically connected second end, and the electrically connected first end and the electrically connected second end are located at two opposite ends of the elastic portion, for example, two overcurrent probes 242 are disposed in the probe assembly 240 of the dome probe module 20, the overcurrent probes 242 can be used for passing large current, the dome probe 10 is disposed between the two overcurrent probes 242, for example, the dome probe 10 can pass large current and can also perform a detection function, and spacers 241 are disposed between the dome probes 10 and between the dome probe 10 and the overcurrent probes 242 to reduce the volume of the dome probe module 20.
The mentioned base plate 220 includes, for example, a base plate main body 221 and a detachable mounting plate 222, and the aforementioned pogo pin holding groove 2221 is located on the mentioned detachable mounting plate 222. The side of the bottom plate main body 221 away from the floating plate 210 is provided with a concave part, the depth of the concave part is equal to the thickness of the detachable mounting plate 222, and after the detachable mounting plate 222 is connected through the mounting plate connecting piece 233, the detachable mounting plate 222 and the side of the bottom plate main body 221 away from the floating plate 210 are located on the same horizontal plane.
Further, the connection assembly 230 includes an elastic connection member 231, and the elastic connection member 231 connects the floating plate 210 and the bottom plate main body 221, so as to enable the floating plate 210 to translate along an elastic direction of the elastic connection member 231 with respect to the bottom plate main body 221, so as to protect the pogo pin and enable precise guiding and positioning. The elastic connection members 231 are, for example, 4 equal-height springs, and are fixedly mounted on the bottom plate main body 221, and the elastic force of the equal-height springs supports the floating of the floating plate 210. Before the pogo pin module 20 performs the compression conduction test, the equal-height springs support the initial state of the floating plate 210, that is, the floating plate 210 is in the springing-open state, the floating plate 210 is located at a position far away from the bottom plate main body 221, and at this time, the first conductive part 120 of the pogo pin 10 is accommodated in the floating plate 210, so as to protect the first conductive part 120 of the pogo pin 10 from being impacted or worn; when the pogo pin module 20 performs a compression connection conduction test, the equal-height springs contract, the first conductive part 120 of the pogo pin 10 extends out of the pogo pin limiting hole 211 and is connected with a connector of a connector to be tested, and the second conductive part 130 of the pogo pin 10 is connected with the adapting circuit board; when the pogo pin module 20 stops being pressed and connected, the equal-height springs are reset to make the first conductive portion 120 of the pogo pin 10 return to the side of the pogo pin positioning hole 211 of the floating plate 210 close to the bottom plate main body 221, and disconnected from the connector of the connector to be tested, and the second conductive portion 130 of the pogo pin 10 is disconnected from the adapting circuit board.
Further, the connection assembly 230 further includes an adjustable guiding limit connector 232, and the adjustable guiding limit connector 232 is used for connecting the floating plate 210 and the bottom plate main body 221 and limiting the translation distance of the floating plate 210 relative to the bottom plate 220. Specifically, the adjustable guiding limit connector 232 is, for example, a wire drawing screw, a through hole matched with the wire drawing screw is formed in the floating plate 210, a fixing sleeve matched with the wire drawing screw is formed in the bottom plate main body 221, the wire drawing screw is connected with the fixing sleeve to fix the relative position of the floating plate 210 and the bottom plate main body 221, the height position of the floating plate 210 relative to the bottom plate main body 221 can be adjusted by loosening or screwing the wire drawing screw, the required precision of the test can be matched, and the connection performance can be guaranteed.
Further, as shown in fig. 4 and 5, an accommodating inner cavity 2211 for accommodating the pogo pin 10 and the spacers 241 is disposed on one side of the bottom plate main body 221 away from the floating plate 210, and a plurality of spacer card slots 2211a are disposed on two opposite sides of an inner wall of the accommodating inner cavity 2211, wherein each spacer 241 is in clamping connection with the corresponding spacer card slot 2211 a. Specifically, the mentioned spacer card slots 2211a are, for example, arranged equidistantly, and the distance between every two adjacent spacer card slots 2211a is equal. The accommodating inner cavity 2211 includes, for example, a first accommodating inner cavity 2211b and a second accommodating inner cavity 2211c, the number of the first accommodating inner cavity 2211b and the number of the second accommodating inner cavity 2211c are two, the first accommodating inner cavity 2211b is used for accommodating the pogo pin 10, and the second accommodating inner cavity 2211c is used for accommodating the overcurrent pin 242. The openings of the first and second accommodating cavities 2211b and 2211c near the floating plate 210 only satisfy that the first conductive part 120 of the pogo pin 10 and the first end 2421 of the overcurrent pin 242 are electrically connected to extend out, so as to prevent the pogo pin 10 and the overcurrent pin 242 from shaking when the pogo pin module 20 is pressed and connected, so that the pogo pin 10 and the overcurrent pin 242 are kept stable during testing, and further ensure the positioning accuracy of the pogo pin 10 and the overcurrent pin 242.
As shown in fig. 3 and 4, a spacer 241 is disposed between every two adjacent pogo pins 10 among the plurality of pogo pins 10, or a plurality of spacers 241 is disposed between every two adjacent pogo pins 10 among the plurality of pogo pins 10. For example, only one spacer 241 is disposed between every two adjacent pogo pins 10 in the pogo pin module 20, and the number of the spacers 241 is equal to the number of the spacer card slots 2211 a. Of course, the number of the spacers 241 between two adjacent pogo pins 10 is not limited in this embodiment. The number and the spacing of the shrapnel probes 10 in the shrapnel probe module can be adjusted according to actual needs, so that the connector to be tested can be widely applied to connectors to be tested with different numbers or center distances, the universality of the shrapnel probe module is improved, and the manufacturing cost is saved.
Further, when a spacer 241 is disposed between every two adjacent pogo pins 10 among the plurality of pogo pins 10, a distance between every two adjacent pogo pins 10 is not greater than 0.35 mm. However, the present embodiment is not limited thereto, and a plurality of spacers 241 may be disposed between every two adjacent pogo pins 10 in the plurality of pogo pins 10. For example, the number of the spacers 241 disposed between two adjacent pogo pins 10 may be set according to actual situations, for example, the one spacer 241 disposed between two adjacent pogo pins 10 may test a connector to be tested with a center-to-center distance of 0.35mm, and the thickness of each spacer 241 is, for example, 0.2mm, so that when the connector to be tested with a center-to-center distance of 0.55mm needs to be tested, one spacer 241 may be added between two pogo pins 10, that is, two spacers 241 are disposed to complete the test of the connector to be tested with a center-to-center distance of 0.55mm, it is worth mentioning that the aforementioned center-to-center distance and thickness are only for better understanding of the present embodiment, and the present invention is not limited thereto. When the connectors to be tested with different PIN numbers or different center distances need to be tested, the number of the elastic sheet probes 10 is directly adjusted, or the number of the spacers 241 arranged between two adjacent elastic sheet probes 10 is adjusted, so that the operation is simple.
Further, the connection assembly 230 further includes a mounting plate connector 233 and a mounting stud 234. Wherein the mounting plate connector 233 connects the base plate main body 221 and the detachable mounting plate 222 such that the detachable mounting plate 222 is detachable from the base plate main body 221 to facilitate replacement of the probe assembly 240. Wherein the mounting pins 234 penetrate the floating plate 210, the bottom plate main body 221 and the detachable mounting plate 222, and the mounting pins 234 protrude from the detachable mounting plate 222, so that the second conductive part 130 is precisely positioned on the adapting circuit board.
Specifically, the mentioned mounting plate connecting member 233 is, for example, an expansion screw, and the bottom plate main body 221 is provided with an expansion tube matched with the expansion screw, though the embodiment does not limit the type of the mounting plate connecting member 233, and it is sufficient that the detachable mounting plate 222 and the bottom plate main body 221 are easily connected and detached. If single or a plurality of shell fragment probe 10 or single or a plurality of overcurrent probe 242 appear damaging, can dismantle mounting panel 222 from bottom plate main part 221 and pull down, change single or a plurality of shell fragment probe 10 or single or a plurality of overcurrent probe 242 that damage, the assembly precision between floating plate 210 and bottom plate main part 221 is not influenced, has improved shell fragment probe module 20 and has changed the work efficiency of probe to and make things convenient for probe later stage to change and maintain, and increase test stability.
Specifically, as shown in fig. 2 and 3, the mounting posts 234 extend from the side of the removable mounting plate 222 away from the floating plate 210 to precisely position the second conductive portion 130 to the adapting circuit board. Specifically, the assembly pins 234 penetrating the floating plate 210, the bottom plate main body 221, and the detachable mounting plate 222 can ensure the assembly accuracy of the entire structure of the pogo pin module 20. In addition, the length of the assembly pin 234 extending from the side of the detachable mounting plate 222 away from the floating plate 210 is greater than the length of the second conductive part 130 of the pogo pin 10 extending from the pogo pin limiting groove 2221 of the detachable mounting plate 222, when the pogo pin module 20 is not in test connection, the assembly pin 234 can prevent the second conductive part 130 from being broken by external force impact, when the floating plate 210 is pressed down for test connection, the assembly pin 234 can be connected with the pin groove adapted on the adapting circuit board, so that the second conductive part 130 can be accurately positioned on the adapting circuit board.
Further, a plurality of positioning protrusions 212 are disposed on a side of the floating plate 210 away from the bottom plate 220, and the positioning protrusions 212 are symmetrically distributed around the pogo pin positioning hole 211 to limit the insertion position of the connector to be tested. Specifically, the positioning lug 212 includes, for example, a first positioning lug 2121 and a second positioning lug 2122. For example, one side of the floating plate 210 away from the bottom plate 220 is provided with, for example, 2 first positioning protrusions 2121 and 4 second positioning protrusions 2122, the plurality of pogo pin holes 211 are distributed on the floating plate 210 in a similar rectangular manner, 2 first positioning protrusions 2121 are symmetrically distributed on two opposite sides of the similar rectangular distribution surface of the plurality of pogo pin holes 211, the first positioning protrusions 2121 are, for example, cylinders with an inverted U-shaped cross section for clamping the connector to be tested, 4 second positioning protrusions 2122 are symmetrically distributed on two opposite sides of the similar rectangular distribution surface of the plurality of pogo pin holes 211, the second positioning protrusions 2122 are, for example, cylinders with a trapezoidal cross section for limiting the connector to be tested on the floating plate 210, and play a certain guiding role when the connector to be tested approaches the floating plate 210, so as to ensure the connection stability of the pogo pins 10 and the overcurrent probes 242 with the connector of the connector to be tested, the abrasion of the dome probe 10 and the overcurrent probe 242 is reduced, and the service life of the dome probe 10 and the overcurrent probe 242 is prolonged. Of course, the present embodiment also does not limit the specific shape and the specific number of the first positioning protruding portion 2121 and the second positioning protruding portion 2122, and it is sufficient to stably connect the connector to be tested and the floating plate 210, so as to ensure the connection accuracy between the pogo pin 10 and the overcurrent pin 242 and the connector to be tested.
In summary, in the pogo pin disclosed in this embodiment, the thickness of the first conductive portion 120 of the pogo pin 10 is increased, so that the contact area between the first conductive portion 120 and the connector to be tested is increased, the one-time accuracy of the conduction test is greatly improved, and the service life of the pogo pin 10 is prolonged. The disclosed shell fragment probe module of this embodiment adopts shell fragment probe 10 to have the advantage of aforementioned shell fragment probe, just the quantity and the interval of shell fragment probe in the shell fragment probe module can be adjusted according to actual need, extensively is applicable to the connector that awaits measuring of multiple quantity or centre-to-centre spacing difference, has improved shell fragment probe module's commonality, saves the cost of manufacture and improves life, in addition shell fragment probe module is small, the assembly precision is high and the equipment, dismantlement are simple and convenient.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (8)
1. A pogo pin (10), comprising:
an elastic middle portion (110);
a first conductive portion (120) connecting one end of the resilient middle portion (110), comprising:
the first testing contact surface (121) is positioned on one side, away from the elastic middle part (110), of the first conductive part (120) and used for connecting a connector to be tested;
a first thickened surface (122) connecting one side of the first test contact surface (121);
a second thickened surface (123) connected to the other side of the first test contact surface (121) and opposite to the first thickened surface (122);
a second conductive portion (130) connecting the other end of the resilient middle portion (110) away from the first conductive portion (120), comprising:
the second testing contact surface (131) is positioned on one side, away from the elastic middle part (110), of the second conductive part (130) and used for connecting the adapter circuit board;
a first probe face (132) connected to one side of the second test contact face (131);
a second probe face (133) connected to the other side of the second test contact face (131) and opposed to the first probe face (132);
wherein a first spacing (d1) between the first thickened face (122) and the second thickened face (123) is greater than a second spacing (d2) between the first probe face (132) and the second probe face (133).
2. The pogo pin of claim 1, wherein the resilient middle portion (110), the first conductive portion (120), and the second conductive portion (130) are an integral structure.
3. The utility model provides a shell fragment probe module which characterized in that includes:
the floating plate (210) is provided with a plurality of elastic piece probe limiting holes (211);
the bottom plate (220) is arranged corresponding to the floating plate (210), and a plurality of elastic piece probe limiting grooves (2221) are arranged on one side far away from the floating plate (210);
a connection assembly (230) connecting the floating plate (210) and the bottom plate (220);
a probe assembly (240) comprising: a plurality of pogo pins (10) according to any one of claims 1-2;
the first conductive part (120) of each spring probe (10) is connected with the to-be-tested connector through the corresponding spring probe limiting hole (211), and the second conductive part (130) of each spring probe (10) is connected with the adapter circuit board through the spring probe limiting groove (2221).
4. A dome probe module according to claim 3, characterized in that the connection assembly (230) comprises an elastic connector (231) and an adjustable guiding limit connector (232);
wherein the elastic connector (231) connects the floating plate (210) and the bottom plate (220) to realize the translation of the floating plate (210) relative to the bottom plate (220) along the elastic force direction of the elastic connector (231);
wherein the adjustable guide limit connector (232) connects the floating plate (210) and the bottom plate (220) and limits the translation distance of the floating plate (210) relative to the bottom plate (220).
5. The pogo pin module of claim 3, wherein the probe assembly (240) further comprises a plurality of spacers (241), at least one spacer (241) is disposed between every two adjacent pogo pins (10), an accommodating cavity (2211) for accommodating the pogo pins (10) and the spacers (241) is disposed on one side of the bottom plate (220) away from the floating plate (210), and a plurality of spacer clamping grooves (2211a) are disposed on two opposite sides of an inner wall of the accommodating cavity (2211), wherein each spacer (241) is clamped with the corresponding spacer clamping groove (2211 a).
6. The dome probe module of claim 5, wherein one spacer (241) is disposed between every two adjacent dome probes (10) among the plurality of dome probes (10), and a distance between every two adjacent dome probes (10) is not greater than 0.35 mm.
7. A dome probe module according to claim 4, characterized in that the connection assembly (230) further comprises a mounting plate connection (233) and a mounting stud (234), the bottom plate (220) comprising a bottom plate body (221) and a detachable mounting plate (222) at the side of the bottom plate (220) remote from the float plate (210);
wherein the mounting plate connector (233) connects the base plate main body (221) with the detachable mounting plate (222) such that the detachable mounting plate (222) is detachable from the base plate main body (221) to facilitate replacement of the probe assembly (240);
wherein the mounting pins (234) penetrate through the floating plate (210), the bottom plate main body (221) and the detachable mounting plate (222), and the mounting pins (234) protrude from the detachable mounting plate (222) so as to precisely position the second conductive part (130) on the adapting circuit board.
8. The pogo pin module of claim 3, wherein a plurality of positioning protrusions (212) are disposed on a side of the floating plate (210) away from the bottom plate (220), the positioning protrusions (212) being symmetrically distributed around the pogo pin retention hole (211) to limit an insertion position of the connector to be tested.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011549589.2A CN114678716B (en) | 2020-12-24 | 2020-12-24 | Spring probe and spring probe module |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202011549589.2A CN114678716B (en) | 2020-12-24 | 2020-12-24 | Spring probe and spring probe module |
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| CN114678716B CN114678716B (en) | 2024-04-16 |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN115343514A (en) * | 2022-09-13 | 2022-11-15 | 渭南木王智能科技股份有限公司 | Multi-point micro-distance testing module |
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| CN114678716B (en) | 2024-04-16 |
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