CN114629465A - APD-TIA circuit and TIA chip - Google Patents

APD-TIA circuit and TIA chip Download PDF

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Publication number
CN114629465A
CN114629465A CN202111108147.9A CN202111108147A CN114629465A CN 114629465 A CN114629465 A CN 114629465A CN 202111108147 A CN202111108147 A CN 202111108147A CN 114629465 A CN114629465 A CN 114629465A
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tia
apd
voltage
filter
chip
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陈伟
林少衡
高淑君
洪佳程
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Xiamen UX High Speed IC Co Ltd
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Xiamen UX High Speed IC Co Ltd
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00—Networks using active elements
    • H03H11/02—Multiple-port networks
    • H03H11/04—Frequency selective two-port networks
    • H03H11/12—Frequency selective two-port networks using amplifiers with feedback

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Abstract

The invention discloses an APD-TIA circuit and a TIA chip, wherein the circuit comprises an external high-voltage circuit, an APD and a TIA, the external high-voltage circuit comprises an external high-voltage source and a high-voltage filter network connected to the output end of the external high-voltage source, the positive output end of the high-voltage filter network is connected with the negative electrode of the APD, the positive electrode of the APD is connected with the input end of the TIA, the TIA is provided with a grounding common end used for connecting an external ground, and the grounding end of the high-voltage filter network is directly connected to the grounding common end of the TIA. The TIA chip is provided with a TIA and a high-voltage filter network. They have the following advantages: the problem of high-frequency oscillation of the APD-TIA circuit is solved.

Description

APD-TIA circuit and TIA chip
Technical Field
The invention relates to an APD-TIA circuit and a TIA chip.
Background
In optical communication, especially in applications with a rate of 10Gbps or more, the problem of high-frequency oscillation (the oscillation frequency is close to the channel bandwidth) is likely to occur in an APD (avalanche photodiode) in combination with a TIA (transimpedance amplifier).
As shown in fig. 1: the typical APD-TIA bulk circuit consists of three major parts: 1. external high voltage and external high voltage filter networks; 2.avalanche photodiode APD with parasitic capacitance of CAPD(ii) a 3. Transimpedance amplifier circuit TIA: it comprises I0And RfFormed transimpedance amplification input stage and fully differential circuit I1And R0C0The formed single-ended slip stage circuit.
Wherein C is1C2C3Is a signal line parasitic capacitance. PINK is the cathode bias of APD, PINA is the anode bias of APD, and is also the TIA input end, and VSS is the TIA ground pin. A. the0Is I0Gain of (A)1Is I1The gain of (c). The ground terminal of the external high voltage filter network is connected to the external ground, and the ground pin VSS in the TIA is connected to the external ground through the ground wire.
The whole circuit includes a ground inductor LgndIt is the loop of the feedback device that introduces the risk of high frequency oscillations.
To briefly illustrate loop performance, assume C1＝C2＝C3And in general, CHIOf a few hundred pF, so that the tank terminal is effectively ac ground, the loop signal equivalent model of the circuit of fig. 1 can be simplified to fig. 2, where R isINIs I0Input impedance of, xi represents I1The mismatch coefficient of (a) is a random quantity in the process production, and the mismatch comprises the mismatch of an input tube and a load in a fully differential circuit. Taking the mismatch coefficient of the resistance as an example,
Figure DEST_PATH_IMAGE001
thus, ξ A1Is due to I1Mismatch to produce common mode gain, i.e.
Figure DEST_PATH_IMAGE002
VOUT,CM_I1And VIN_I1Are each I1Output common mode signal sum I1The input signal of (1).
For loop performance analysis, the input signal V is disconnected from point AIN_ADetecting the output signal V of point BOUT_BThe loop gain can be written as (if I is considered)0And I1Let their overall bandwidth be f-3dB_I0I1)：
Figure DEST_PATH_IMAGE003
When f is less than f-3dB_I0I1When, | Gloop(f) I increases with increasing frequency.
Figure DEST_PATH_IMAGE004
It can be seen that f-3dB_I0I1The larger, | Gloop(f)|MAXThe larger, if | Gloop(f)|MAX(> 1), there is a risk of oscillation, which is why the higher the bandwidth of the signal channel, the more likely high frequency oscillations occur and the oscillation frequency is close to the bandwidth.
To solve this problem, the prior art generally employs a more advanced TSV/DSV process, through which VSS is connected to the external ground. The equivalent circuit is shown in fig. 3.
Parasitic inductance (pH level) L due to TSV/DSVTSV_DSVMuch smaller than the ground inductance (several hundred pH) L of the bond wirebondingI.e. Lgnd＝Lbonding//LTSV_DSV0. Then there are
Gloop(f)≈0
The loop has no gain and is naturally stable.
However, the prior art has the following disadvantages:
1. not all processes support DSV/TSV, especially CMOS processes, do not support DSV/TSV substantially.
2. The DSV/TSV process option is adopted, so that the cost is increased inevitably, the DSV/TSV process must be matched with a back gold process, the production period and the production cost are increased, and the yield is reduced due to the extra process.
Disclosure of Invention
The invention provides an APD-TIA circuit and a TIA chip, which overcome the defects of the prior art in the background art.
One of the technical schemes adopted by the invention for solving the technical problems is as follows:
an APD-TIA circuit comprises an external high-voltage circuit, an APD and a TIA, wherein the external high-voltage circuit comprises an external high-voltage source and a high-voltage filter network connected to the output end of the external high-voltage source, the positive output end of the high-voltage filter network is connected with the negative electrode of the APD, the positive electrode of the APD is connected with the input end of the TIA, the TIA is provided with a grounding common end used for being connected with an external ground, and the grounding end of the high-voltage filter network is directly connected to the grounding common end of the TIA.
In one embodiment: the high-voltage filter network is composed of a filter resistor RHIAnd a filter capacitor CHIAnd forming an RC filter network.
In one embodiment: the high-voltage filter network is composed of a filter capacitor CHIAnd forming a filter network.
The second technical scheme adopted by the invention for solving the technical problems is as follows:
a TIA chip is provided with a TIA and a high-voltage filter network, wherein the TIA is provided with a grounding common end used for connecting an external ground, a grounding end of the high-voltage filter network is connected to the grounding common end of the TIA, the chip is provided with a grounding pin VSS leading to the grounding common end, a PINA pin leading to an input end of the TIA, a VOUTP leading to a positive output end of the TIA, a VOUTN pin leading to a negative output end of the TIA, a PINK pin leading to a positive output end of a high-voltage filter circuit, and a VAPD pin leading to a positive input end of the high-voltage filter circuit.
In one embodiment: the high-voltage filter network is composed of a filter resistor RHIAnd a filter capacitor CHIAnd forming an RC filter network.
In one embodiment: the high-voltage filter network is composed of a filter capacitor CHIAnd forming a filter network.
In one embodiment: the filter resistor RHIThe dielectric layer between the metal line and the substrate is not doped with P + or N +.
In one embodiment: the metal wire is a single-layer metal winding wire or a laminated metal winding wire, and has no P + doping or N + doping with the substrate.
In one embodiment: the filter capacitor CHITo MOM electricityAnd (4) carrying out the following steps.
In one embodiment: the filter capacitor CHIThe single-layer MOM capacitor or the multi-layer MOM capacitor is connected in parallel.
The third technical scheme adopted by the invention for solving the technical problems is as follows:
an APD-TIA circuit comprising an external high voltage source, an APD and a TIA chip as claimed in any of claims 4 to 10, the external high voltage source being connected to the VAPD pin of the TIA chip, the negative electrode of the APD being connected to the PINK pin of the TIA chip, the positive electrode of the APD being connected to the PINA pin of the TIA chip, the VSS pin of the TIA chip being connected to ground.
Compared with the background technology, the technical scheme has the following advantages:
1. according to the scheme, the grounding end of the high-voltage filter network is directly connected to the grounding common end of the TIA, the high-voltage filter network is integrated into the TIA chip, and the generation of a ground wire inductance L is avoidedgndThe problem of high-frequency oscillation is solved for a loop of a feedback device.
2. According to the scheme, the high-voltage filter network is integrated into the TIA chip, and the TIA chip is manufactured together, so that compared with the prior art, the high-cost external high-voltage filter network does not need to be manufactured, and the manufacturing cost of the high-voltage filter network and the APD-TIA circuit is reduced.
3. Filter resistance RHIDesigned as a metal wire, and the dielectric layer between the metal wire and the substrate has no P + doping or N + doping, thereby improving the withstand voltage value of the dielectric layer between the filter resistor and the substrate, and combining the filter capacitor CHIDesigned as MOM capacitor, thereby improving the filter capacitance C in the chipHIThe withstand voltage of (1). Thereby solving the problem of the filter capacitor C under the low-voltage processHIAnd a filter resistor RHIThe reliability of (2).
Drawings
The invention is further illustrated by the following figures and examples.
Fig. 1 is a schematic diagram of a typical APD-TIA overall circuit as described in the background.
FIG. 2 is a diagram of a high frequency loop equivalent model of a typical APD-TIA circuit.
FIG. 3 is an equivalent model diagram of a high frequency loop using TSV/DSV grounding.
Fig. 4 is a schematic diagram of the APD-TIA circuit structure described in this embodiment.
Fig. 5 is an equivalent model diagram of a high-frequency loop of the APD-TIA circuit according to this embodiment.
Fig. 6 is a diagram of an RCRC filter network structure.
FIG. 7 is a diagram of a filter resistor R according to this embodimentHIA schematic view of the structure of (1).
FIG. 8 shows a filter capacitor C according to this embodimentHIA schematic view of the structure of (1).
Detailed Description
Referring to fig. 4, an APD-TIA circuit includes an external high voltage circuit, an APD and a TIA, the external high voltage circuit includes an external high voltage source and a high voltage filter network connected to an output end of the external high voltage source, a positive output end of the high voltage filter network is connected to a negative electrode of the APD, a positive electrode of the APD is connected to an input end of the TIA, the TIA has a ground common terminal for connecting an external ground, a ground terminal of the high voltage filter network is directly connected to the ground common terminal of the TIA, the ground terminal of the high voltage filter network and the ground common terminal of the TIA have the same potential, and thus a ground line inductance L is prevented from being generatedgndThe problem of high-frequency oscillation is solved for a loop of a feedback device.
In an APD-TIA circuit constructed by TIA chip, in order to eliminate the generation of ground wire inductance LgndThe TIA chip is provided with the TIA and the high-voltage filter network, the TIA is provided with a grounding common end used for connecting an external ground, a grounding end of the high-voltage filter network is connected to the grounding common end of the TIA, the chip is provided with a grounding pin VSS connected with the grounding common end, a PINA pin connected with an input end of the TIA, a VOUTP connected with a positive output end of the TIA, a VOUTN pin connected with a negative output end of the TIA, a PINK pin connected with a positive output end of the high-voltage filter circuit and a VAPD pin connected with a positive input end of the high-voltage filter circuit. Therefore, the grounding end of the high-voltage filter network can be connected with the grounding common end of the TIA to form equipotential.
Compared with the traditional TIA chip, the TIA chip integrates a high-voltage filter network inside, and needs to add two pins, namely PINK and VAPD.
The APD-TIA circuit constructed by the TIA chip comprises an external high voltage source, an APD and the TIA chip, wherein the external high voltage source is connected with a VAPD pin of the TIA chip, a negative electrode of the APD is connected with a PINK pin of the TIA chip, a positive electrode of the APD is connected with a PINA pin of the TIA chip, and a VSS pin of the TIA chip is grounded.
Referring to FIG. 5, to analyze the loop performance of the APD-TIA circuit described herein, the input signal V is disconnected from point AIN_ADetecting the output signal V of point BOUT_BThe loop gain can be obtained as follows:
Gloop(f) 0, because of CAPDThere is no signal difference between the two ends, so the loop gain is 0, and the oscillation problem can be solved.
The high-voltage filter network can be composed of a filter resistor RHIAnd a filter capacitor CHIAnd forming an RC filter network. Either simple RC filtering or an RCRC filtering network, as shown in fig. 6. It is also possible to use only the filter capacitor CHI (RHI0) is formed.
When integrating the high-voltage filter network into the TIA chip, the filter resistor R in the high-voltage filter network needs to be solvedHIAnd/or a filter capacitor CHIMainly overcoming the filter resistance RHIAnd a filter capacitor CHIThe problem of withstand voltage of (2).
Bias voltage V of APDHIGenerally, the voltage is 20V-60V, and the voltage resistance of the device provided by the common low-voltage process is generally not more than 5.5V. This patent provides a filter resistor RHIAnd a filter capacitor CHIThe design scheme of (2):
filter resistor RHIThe well resistor, the injection resistor or the polysilicon resistor provided by the process library cannot be adopted, so that the distance between the resistors and the substrate is close, the substrate is generally connected with a grounding pin VSS, the level of the grounding pin VSS is 0, and if the filter resistor R is adopted, the filter resistor R can not be used for filtering the signalHIOne end is applied with high voltage, so that the filter resistor RHIThe dielectric layer between the substrate and the substrate is easily broken down and cannot meet the reliability requirement.
Filter resistor R in the present techniqueHIBy adopting the metal wire, P + or N + doping cannot be carried out below the metal wire, namely the dielectric layer between the metal wire and the substrate does not have P + doping or N + doping. Therefore, the metal wire is far away from the substrate, the dielectric layer is thick and is not easy to break down, and the layer or layers on which the metal wire is located are evaluated according to different processes.
In a preferred embodiment, the filter resistor RHIThe method is realized by a metal winding inductor, and a filter resistor R is shown in figure 7HIThe P1 and P2 are the filter resistor RHIAt both ends of the same. Filter resistor RHINot only single-layer winding, but also laminated winding, and other shapes, such as long straight line, can be used, the core of which is filter resistor RHIThe distance from the substrate is far enough to meet the voltage withstand requirement.
Filter capacitor CHIThe process library cannot be selected to provide MIM, PIP or MOS capacitors because the dielectric layer of these capacitors is thin and cannot meet the high voltage requirement of tens of volts. The technical scheme is realized by adopting an MOM capacitor, namely, the edge parasitic capacitor of the same layer of metal. The larger the distance between the metals in the same layer is, the larger the withstand voltage is, but the smaller the capacitance value is. The implementation scheme is shown in figure 8, A and B are CHIAt both ends of the tube. CHIThe MOM capacitor can be connected in parallel by a single layer or multiple layers.
The above description is only a preferred embodiment of the present invention, and therefore should not be taken as limiting the scope of the invention, which is defined by the appended claims and their equivalents.

Claims (11)

1. An APD-TIA circuit, characterized by: the high-voltage power supply comprises an external high-voltage circuit, an APD and a TIA, wherein the external high-voltage circuit comprises an external high-voltage source and a high-voltage filter network connected to the output end of the external high-voltage source, the positive output end of the high-voltage filter network is connected with the negative electrode of the APD, the positive electrode of the APD is connected with the input end of the TIA, the TIA is provided with a grounding common end used for being connected with an external ground, and the grounding end of the high-voltage filter network is directly connected to the grounding common end of the TIA.
2. An APD-TIA circuit as claimed in claim 1, wherein: the high-voltage filter network is composed of a filter resistor RHIAnd a filter capacitor CHIAnd forming an RC filter network.
3. An APD-TIA circuit as claimed in claim 1, wherein: the high-voltage filter network is composed of a filter capacitor CHIAnd forming a filter network.
4. A TIA chip, comprising: the chip is provided with a grounding pin VSS which is connected with the grounding common end, a PINA pin which is connected with an input end of the TIA, a VOUTP which is connected with a positive output end of the TIA, a VOUTN pin which is connected with a negative output end of the TIA, a PINK pin which is connected with a positive output end of the high-voltage filter circuit and a VAPD pin which is connected with a positive input end of the high-voltage filter circuit.
5. A TIA chip as claimed in claim 4, wherein: the high-voltage filter network is composed of a filter resistor RHIAnd a filter capacitor CHIAnd forming an RC filter network.
6. A TIA chip as claimed in claim 4, wherein: the high-voltage filter network is composed of a filter capacitor CHIAnd forming a filter network.
7. An APD-TIA chip as claimed in claim 5, wherein: the filter resistor RHIThe dielectric layer between the metal line and the substrate is not doped with P + or N +.
8. An APD-TIA chip as claimed in claim 7, wherein: the metal wire is a single-layer metal winding wire or a laminated metal winding wire, and has no P + doping or N + doping with the substrate.
9. An APD-TIA chip as claimed in claim 5 or 6, wherein: the filter capacitor CHIIs an MOM capacitor.
10. An APD-TIA chip as claimed in claim 9, wherein: the filter capacitor CHIThe single-layer MOM capacitor or the multi-layer MOM capacitor is connected in parallel.
11. An APD-TIA circuit, characterized by: the circuit comprises an external high-voltage source, an APD and a TIA chip as claimed in any one of claims 4 to 10, wherein the external high-voltage source is connected with a VAPD pin of the TIA chip, a negative electrode of the APD is connected with a PINK pin of the TIA chip, a positive electrode of the APD is connected with a PINA pin of the TIA chip, and a VSS pin of the TIA chip is grounded.
CN202111108147.9A 2021-09-22 2021-09-22 APD-TIA circuit and TIA chip Pending CN114629465A (en)

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CN114629465A true CN114629465A (en) 2022-06-14

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