CN114624620A

CN114624620A - Automatic test method and device for power supply system for liquid crystal screen aging test

Info

Publication number: CN114624620A
Application number: CN202210235609.1A
Authority: CN
Inventors: 姚鑫荣; 聂世球; 张扬扬; 王金福; 李业华; 姜承湘; 朱泓衍
Original assignee: Shenzhen Qianhai Xk Image Technology Design Co ltd
Current assignee: Shenzhen Qianhai Xk Image Technology Design Co ltd
Priority date: 2022-03-11
Filing date: 2022-03-11
Publication date: 2022-06-14

Abstract

The embodiment of the invention discloses an automatic test method and device for a power supply system for an aging test of a liquid crystal display. The method comprises the following steps: sending a voltage setting command to a power system to be tested, and setting each power device to be a preset voltage; sending a voltage reading command to a power system to be tested, and reading back initial voltage sampling values of each power supply device; switching a load network into a large resistance network, sending a starting output command to a power supply system to be tested, and sampling a first voltage and a first current input by the power supply system to be tested; sending a voltage reading command and a current reading command to a power system to be tested, and reading back a test voltage sampling value and a test current sampling value of each power supply device; switching the load network into a high-power resistance network, and sampling a second voltage input by the power supply system to be tested; and determining whether the power system to be tested is normal according to the obtained parameter values. The automatic test of the power supply system is realized, the production efficiency and the reliability are improved, and the cost is reduced.

Description

Automatic test method and device for power supply system for liquid crystal screen aging test

Technical Field

The embodiment of the invention relates to the technical field of system detection, in particular to an automatic test method and device for a power supply system for an aging test of a liquid crystal display.

Background

The power supply system applied to the aging test of the liquid crystal screen has different power supply requirements due to different types of the corresponding liquid crystal screens. For example, the EDP liquid crystal screen needs two power supplies of VDD and VBL, the mipi liquid crystal screen needs four power supplies of VDD, IOVCC, VSP and VSN, the LVDS screen may need eight power supplies of VDD, IOVCC, VSP, VSN, VGH, VGL, VCOM and AVDD, and the like, and the backlight of the liquid crystal screen is divided into two types of constant voltage and constant current. When the aging test is performed, the power supply system may need to perform the aging test on a plurality of liquid crystal screens at the same time, and at this time, the power supply system needs to monitor and protect the power supply parameters of each liquid crystal screen in real time, wherein the power supply parameters include voltage and current. Therefore, the requirements of the aging test of the liquid crystal display on the power supply system mainly include: multiple power supplies are adopted to meet different requirements of different liquid crystal screens; the multi-channel aging system meets the requirement of aging with one driver for multiple drivers; the voltage range is large, and different voltage values need to be set for output; each channel switch can be independently controlled; the voltage and current parameters need to be monitored in real time, and the device has the functions of OVP, OCP, UVP and the like.

The complexity of the power supply system not only increases the difficulty of development, but also puts higher requirements on production test. If the manual test is carried out by manpower, all functions and parameters of one power supply system are tested, and the test is carried out for a few minutes and a plurality of tens of minutes. By the operation, the mass production of products not only needs to consume a large amount of time, but also has high requirements on the quality of workers, needs to pay huge time cost and labor cost, is low in efficiency, and easily causes uncontrollable problems such as missing detection, error and the like.

Disclosure of Invention

The embodiment of the invention provides an automatic testing method and device for a power supply system for an aging test of a liquid crystal display screen, which are used for improving the production efficiency and the reliability of the test and reducing the quality requirement and the cost of workers.

In a first aspect, an embodiment of the present invention provides an automatic test method for a power supply system for an aging test of a liquid crystal display, where the method includes:

sending a voltage setting command to a power supply system to be tested so as to set each power supply device in the power supply system to be tested to be a preset voltage;

sending a voltage reading command to the power supply system to be tested so as to read back the initial voltage sampling value of each power supply device;

switching a load network into a large resistance network, sending an output starting command to the power supply system to be tested to control each power supply device to output, and sampling a first voltage and a first current input by the power supply system to be tested;

sending a voltage reading command and a current reading command to the power supply system to be tested so as to read back a test voltage sampling value and a test current sampling value of each power supply device;

switching the load network into a high-power resistance network, and sampling a second voltage input by the power supply system to be tested;

and determining whether the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value.

Optionally, the sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage includes:

sending a first voltage setting command to the power supply system to be tested so as to set each power supply device to be the minimum value of the voltage range of the power supply device;

sending a second voltage setting command to the power supply system to be tested so as to set each power supply device to be the maximum value of the voltage range of the power supply device;

correspondingly, the sending a voltage reading command to the power system to be tested to read back the initial voltage sampling value of each power device includes:

sending a first voltage reading command to the power supply system to be tested so as to read back a first voltage sampling value of each power supply device when the minimum value is set;

and sending a second voltage reading command to the power supply system to be tested so as to read back a second voltage sampling value of each power supply device when the maximum value is set.

Optionally, determining whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes:

comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal or not;

comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal;

and comparing the second voltage with the preset voltage to determine whether the loading capacity of the power supply system to be tested is normal.

Optionally, the large resistance network includes an LED lamp string for simulating a constant current backlight of the liquid crystal display; the test voltage sampling value is the voltage on the LED lamp string monitored by the power supply system to be tested; after sampling the first voltage and the first current input by the power supply system to be tested, the method further comprises the following steps:

determining a sampling voltage on the LED lamp string according to the first voltage;

correspondingly, the determining whether the function of the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes:

and comparing the sampling voltage with the sampling value of the test voltage to determine whether the voltage sampling function of the power supply system to be tested is normal.

Optionally, before sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage, the method further includes:

and sending a communication command to the power system to be tested, detecting whether effective response information is received, and if the effective response information is received, determining that the power system to be tested is normally connected.

Optionally, the method further includes:

detecting the input of a test starting key of a user, and if the input is detected and the power system to be tested is in a non-test state at present and is normally connected, starting the test;

and detecting the input of the test stopping key of the user, and stopping the test if the input is detected and the user is in the test state currently.

Optionally, the method further includes:

and if the function of the power supply system to be tested is detected to be abnormal, alarming is carried out through a buzzer and/or LCD display until the test key input is detected to be stopped, and test information is printed through a PC.

In a second aspect, an embodiment of the present invention further provides an automatic test apparatus for a power supply system used in an aging test of a liquid crystal display, where the apparatus includes:

the device comprises a preset voltage setting module, a voltage setting module and a control module, wherein the preset voltage setting module is used for sending a voltage setting command to a power system to be tested so as to set each power supply device in the power system to be tested to be preset voltage;

the initial voltage sampling value reading module is used for sending a voltage reading command to the power supply system to be tested so as to read back the initial voltage sampling value of each power supply device;

the first sampling module is used for switching a load network into a large-resistance network, sending an output starting command to the power supply system to be tested so as to control each power supply device to output, and sampling a first voltage and a first current input by the power supply system to be tested;

the test parameter reading module is used for sending a voltage reading command and a current reading command to the power system to be tested so as to read back a test voltage sampling value and a test current sampling value of each power supply device;

the second sampling module is used for switching the load network into a high-power resistance network and sampling a second voltage input by the power supply system to be tested;

and the function detection module is used for determining whether the power supply system to be tested has a normal function or not according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value.

In a third aspect, an embodiment of the present invention further provides a computer device, where the computer device includes:

one or more processors;

a memory for storing one or more programs;

when the one or more programs are executed by the one or more processors, the one or more processors are enabled to implement the automatic test method for the power supply system for the liquid crystal screen aging test provided by any embodiment of the invention.

In a fourth aspect, the embodiment of the present invention further provides a computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, implements the automatic test method for a power supply system for an aging test of a liquid crystal display according to any embodiment of the present invention.

The embodiment of the invention provides an automatic test method of a power supply system for liquid crystal screen aging test, which tests the voltage setting function and the voltage sampling function of the power supply system to be tested by setting preset voltage for the power supply system to be tested and reading back initial voltage sampling values of each power supply device, and simultaneously controls the output of the power supply system to be tested to test the voltage current sampling function and the load carrying capacity of the power supply system to be tested by respectively switching a load network to a large resistance network and a large power resistance network, thereby realizing the automatic test of the power supply system, not only improving the production efficiency, but also improving the test reliability, greatly reducing the quality requirement of workers, reducing the production cost and playing a good auxiliary role in checking and analyzing the power supply system by research and development personnel.

Drawings

Fig. 1 is a flowchart of an automatic testing method of a power supply system for testing aging of a liquid crystal display according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of an automatic testing apparatus of a power supply system for an aging test of a liquid crystal display according to a second embodiment of the present invention;

fig. 3 is a schematic structural diagram of a computer device according to a third embodiment of the present invention.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.

Before discussing exemplary embodiments in more detail, it should be noted that some exemplary embodiments are described as processes or methods depicted as flowcharts. Although a flowchart may describe the steps as a sequential process, many of the steps can be performed in parallel, concurrently or simultaneously. In addition, the order of the steps may be rearranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figure. The processes may correspond to methods, functions, procedures, subroutines, subprograms, and the like.

Furthermore, the terms "first," "second," and the like may be used herein to describe various orientations, actions, steps, elements, or the like, but the orientations, actions, steps, or elements are not limited by these terms. These terms are only used to distinguish one direction, action, step or element from another direction, action, step or element. For example, a first voltage may be referred to as a second voltage, and similarly, a second voltage may be referred to as a first voltage, without departing from the scope of the present application. The first voltage and the second voltage are both voltages, but they are not the same voltage. The terms "first", "second", etc. are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

Example one

Fig. 1 is a flowchart of an automatic testing method of a power supply system for testing aging of a liquid crystal display according to an embodiment of the present invention. The embodiment is applicable to the situation of automatically testing the power supply system for the liquid crystal screen aging test, and the method can be executed by the automatic testing device for the power supply system for the liquid crystal screen aging test provided by the embodiment of the invention, the device can be realized by hardware and/or software, and can be generally integrated in computer equipment. As shown in fig. 1, the method specifically comprises the following steps:

and S11, sending a voltage setting command to the power supply system to be tested so as to set each power supply device in the power supply system to be tested to be a preset voltage.

And S12, sending a voltage reading command to the power system to be tested so as to read back the initial voltage sampling value of each power supply device.

And S13, switching the load network into a large resistance network, sending an output starting command to the power supply system to be tested to control each power supply device to output, and sampling a first voltage and a first current input by the power supply system to be tested.

And S14, sending a voltage reading command and a current reading command to the power system to be tested so as to read back the test voltage sampling value and the test current sampling value of each power supply device.

And S15, switching the load network into a high-power resistor network, and sampling a second voltage input by the power supply system to be tested.

S16, determining whether the power supply system to be tested is normal according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value.

Specifically, the method provided by this embodiment may be implemented by a correspondingly designed power supply automatic test system, and specifically, the power supply automatic test system may be connected to a power supply system to be tested for testing. The power supply automatic test system can comprise an MCU control system, a load network, a voltage and current sampling module and the like, wherein the MCU control system is respectively connected with the load network and the voltage and current sampling module, the load network can comprise a high-power resistive load, a large-power resistive load and a switching control circuit between the high-power resistive load and the large-power resistive load, and the MCU control system can switch the load network into the large-power resistive network or the high-power resistive network by controlling the gear switch of the load network, so that the test of different functions is realized. The voltage and current sampling module can be responsible for sampling the voltage and current outside the power supply automatic test system and transmitting the voltage and current to the MCU control system, and meanwhile, the MCU control system can perform AD conversion and convert the voltage and current into the corresponding required voltage and current value after receiving the output of the voltage and current sampling module. When the power supply system to be tested is connected for testing, the MCU control system, the load network and the voltage and current sampling module can be respectively connected to corresponding interfaces of the power supply system to be tested, so that the voltage and current sampling module is used for sampling the output of the power supply system to be tested, the load network is used for providing a load for the power supply system to be tested, and the MCU control system is used for providing related control signals for the power supply system to be tested so as to acquire related information and control the whole working process.

The testing process can firstly test the voltage setting function, specifically, the MCU control system can send a voltage setting command to the power supply system to be tested, and the target sets each power supply device in the power supply system to be tested to be a preset voltage, wherein the preset voltages of the power supply devices can be the same or different. If each power supply device can complete the voltage setting according to the voltage setting command, the voltage setting function of the power supply system to be tested can be judged to be normal. After the voltage setting command is sent, the MCU control system can send a voltage reading command to the power system to be tested to read the current voltage of each power device, specifically, the initial voltage sampling value of each power device sampled by the power system to be tested, so as to determine whether the voltage setting function of the power system to be tested is normal according to the initial voltage sampling value and the corresponding preset voltage, and also determine whether the voltage sampling function of the power system to be tested is normal.

And then, whether the voltage sampling function and the current sampling function of the power supply system to be tested are normal under the condition of normal working output can be tested, the load network can be switched to a large-resistance network firstly, and then the MCU control system sends an output starting command to the power supply system to be tested to control each power supply device to output, so that the normal working state of the power supply system to be tested is simulated. And then, the first voltage and the first current input into the power supply automatic test system can be sampled through the voltage and current sampling module and are transmitted to the MCU control system, and the MCU control system can respectively perform AD conversion on the received first voltage and the received first current and can convert the first voltage and the first current into corresponding required voltage and current values. On the other hand, the MCU control system may send a voltage reading command and a current reading command to the power system to be tested to read a test voltage sampling value and a test current sampling value obtained by self-sampling when the power system to be tested is simulated to normally operate, so as to determine whether the voltage sampling function and the current sampling function of the power system to be tested are normal according to the first voltage and the first current (specifically, the converted voltage current value), and the test voltage sampling value and the test current sampling value.

And then whether the loading capacity of each power supply device in the power supply system to be tested is normal can be tested, the load network can be switched to a high-power resistor network firstly, each power supply device keeps an output state at the moment, then the second voltage input into the power supply automatic test system can be sampled through the voltage and current sampling module and is transmitted to the MCU control system, and the MCU control system can perform AD conversion on the received second voltage for subsequent comparison. Whether the load capacity of each power supply device in the power supply system to be tested is normal can be judged according to the second voltage and a preset voltage, wherein the preset voltage can be the preset voltage of the voltage setting process completed in the previous step, and a new voltage value can be additionally set in the load capacity testing process.

Wherein, send the voltage setting order to the electrical power generating system that awaits measuring, in order to with each power equipment in the electrical power generating system that awaits measuring sets up to preset voltage, include: sending a first voltage setting command to the power supply system to be tested so as to set each power supply device to be the minimum value of the voltage range of the power supply device; sending a second voltage setting command to the power supply system to be tested so as to set each power supply device to be the maximum value of the voltage range of the power supply device; correspondingly, the sending a voltage reading command to the power system to be tested to read back the initial voltage sampling value of each power device includes: sending a first voltage reading command to the power supply system to be tested so as to read back a first voltage sampling value of each power supply device when the minimum value is set; and sending a second voltage reading command to the power supply system to be tested so as to read back a second voltage sampling value of each power supply device when the maximum value is set.

Specifically, in the process of testing the voltage setting function of the power supply system to be tested, the above description may be referred to, first, after each power supply device is set to the minimum value of its own voltage range, the first voltage sampling value is read back, and it is determined whether the voltage setting function of the power supply system to be tested is normal for one time, and then, after each power supply device is set to the maximum value of its own voltage range, the second voltage sampling value is read back, so if the results of two times are normal, it may be determined that the voltage setting functions of the power supply system to be tested are normal within the full voltage range of each power supply device, and meanwhile, the voltage sampling function may also be considered as normal temporarily.

Optionally, determining whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes: comparing the initial voltage sampling value with the preset voltage to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal or not; comparing the first current with the test current sampling value to determine whether the current sampling function of the power supply system to be tested is normal; and comparing the second voltage with the preset voltage to determine whether the loading capacity of the power supply system to be tested is normal.

Specifically, referring to the above description, the initial voltage sampling value may be compared with a preset voltage, and if the error between the initial voltage sampling value and the preset voltage is within a first preset error (e.g., 0.1V), it is determined that the voltage setting function and the voltage sampling function of the power supply system to be measured are both normal, and if the error between the initial voltage sampling value and the voltage sampling function is outside the first preset error, it may be further determined whether the voltage setting function is normal according to whether the voltage sampling function is normal subsequently. The first current and the test current sampling value can be compared, if the error between the first current and the test current sampling value is within a second preset error (such as 2%), the current sampling function of the power supply system to be tested is determined to be normal, and if the error between the first current and the test current sampling value is outside the second preset error, the current sampling function of the power supply system to be tested is determined to be abnormal. The second voltage may be compared with a preset voltage, and if the error between the second voltage and the preset voltage is within a third preset error (e.g., 0.2V), it is determined that the loading capacity of the power supply system to be tested is normal, and if the error between the second voltage and the preset voltage is outside the third preset error, it is determined that the loading capacity of the power supply system to be tested is abnormal.

Optionally, the large resistance network includes an LED lamp string for simulating a constant current backlight of the liquid crystal display; the test voltage sampling value is the voltage on the LED lamp string monitored by the power supply system to be tested; after sampling the first voltage and the first current input by the power supply system to be tested, the method further comprises the following steps: determining a sampling voltage on the LED lamp string according to the first voltage; correspondingly, the determining whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes: and comparing the sampling voltage with the sampling value of the test voltage to determine whether the voltage sampling function of the power supply system to be tested is normal.

Specifically, the constant-current backlight of the liquid crystal display can be simulated by arranging the LED lamp strings in the load network, so that the state that the power supply system to be tested normally performs testing work is simulated. In the process of testing whether the voltage sampling function of the power supply system to be tested is normal or not, the voltage on the LED lamp string can be judged by comparing, specifically, after the first voltage is obtained by sampling, the sampling voltage on the LED lamp string can be obtained by conversion according to the first voltage, the parameters of a load network element and the like, meanwhile, the power supply system to be tested can use the voltage on the monitored LED lamp string as a test voltage sampling value, so that the sampling voltage and the test voltage sampling value can be compared, if the error between the sampling voltage and the test voltage sampling value is within a fourth preset error (such as 0.1V), the voltage sampling function of the power supply system to be tested is determined to be normal, and if the error between the sampling voltage and the test voltage sampling value is beyond the fourth preset error, the voltage sampling function of the power supply system to be tested is determined to be abnormal.

On the basis of the foregoing technical solution, optionally, before sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage, the method further includes: and sending a communication command to the power system to be tested, detecting whether effective response information is received, and if the effective response information is received, determining that the power system to be tested is normally connected.

Specifically, when the power supply automation test system provided in this embodiment needs to be used for testing, the system may be first powered on and initialized, and it is determined whether the system is normally connected to the power supply system to be tested, and if the system is normally connected, the subsequent test steps may be started. Specifically, after the initialization is completed, a communication command is continuously sent to the power supply system to be tested to detect whether valid response information can be received, and if the valid response information is received, it can be determined that the power supply system to be tested is normally connected. Meanwhile, a connection mark can be set, the connection mark can be set to be 0 after initialization, and if normal connection with a power system to be tested is detected, the connection mark can be set to be 1, so that the connection mark can be directly used for determining the current connection state in the following process.

On the basis of the above technical solution, optionally, the method further includes: detecting the input of a test starting key of a user, and if the input is detected and the power supply system to be tested is in a non-test state at present and is normally connected, starting the test; and detecting the input of a test stopping key of a user, and stopping the test if the input is detected and the user is in a test state currently.

Specifically, the power supply automation test system provided by this embodiment may start to detect the key input of the user after being powered on, where the key input may include a start test key input and a stop test key input. When the input of a test starting key is detected, if the system is in a non-test state and the power system to be tested is normally connected (if the connection mark is 1), the test can be started, wherein if the system is in the test state, the key input can be ignored, and if the power system to be tested is not normally connected, the user can be prompted in a mode of alarming and the like. When the system is in a test state and the test stopping key input is detected, the test can be stopped, wherein if the system is in a non-test state, the key input can be ignored. The test system is simple to operate, and after the test system is connected with a power supply system to be tested, automatic test can be carried out only by pressing a test starting key by one key operation. Meanwhile, a test flag may be set, after initialization, the test flag may be set to 0 to represent that the test device is currently in a non-test state, and after the test is started, the test flag may be set to 1 to represent that the test device is currently in a test state, so that the test flag may be directly used to determine the current test state in the following.

On the basis of the above technical solution, optionally, the method further includes: and if the function of the power supply system to be tested is detected to be abnormal, alarming is carried out through a buzzer and/or LCD display until the test key input is detected to be stopped, and test information is printed through a PC.

Specifically, the power supply automation test system provided by this embodiment may further include a human-computer interaction module and is connected to the MCU control system, where the human-computer interaction module may specifically include a PC, an LCD display unit, a buzzer, and one or more of the above-mentioned start test key and stop test key, and the MCU control system may communicate with the PC to receive an instruction and output a test state, a test result, and the like, and may also detect key input, and control the LCD display unit and the buzzer to prompt different test results in different ways, and the like. Specifically, after a user presses a start test key to start automatic test, if abnormal function is detected, multi-sound long-sound alarm is performed through a buzzer, the alarm can be stopped when the user presses the stop test key, if the abnormal function is not detected, the test can be automatically finished after one or more test flows are completed, the test can be reminded of passing through two short-sound buzzes, and meanwhile, if the user presses the start test key, the abnormal connection of a power supply system to be tested is detected, and one-sound long-sound alarm can be performed through the buzzer to distinguish different alarm events. The alarm mode through the buzzer can also alarm through different display modes of the LCD display unit. The test information may also be printed by the PC after the user presses a stop test button or automatically ends the test. Therefore, the testing method provided by the embodiment can present the testing result in various visual and simple modes, the tester can judge the quality of the power supply system to be tested only by distinguishing different sounds and/or different LCD display modes, the quality requirement on the tester is greatly reduced, various testing information can be printed by connecting a PC, and the maintenance personnel can quickly locate the problem through the testing information.

According to the technical scheme provided by the embodiment of the invention, the voltage setting function and the voltage sampling function of the power supply system to be tested are tested by setting the preset voltage for the power supply system to be tested and reading back the initial voltage sampling value of each power supply device, the voltage and current sampling function and the load carrying capacity of the power supply system to be tested are tested by respectively switching the load network to the large resistance network and the large power resistance network and controlling the output of the power supply system to be tested, so that the automatic test of the power supply system is realized, the production efficiency is improved, the test reliability is improved, the quality requirement of workers is greatly reduced, the production cost is reduced, and the power supply system is well assisted to the examination and analysis of research and development personnel.

Example two

Fig. 2 is a schematic structural diagram of an automatic testing apparatus for a power supply system for testing liquid crystal display aging according to a second embodiment of the present invention, where the apparatus may be implemented in hardware and/or software, and may be generally integrated into a computer device, so as to execute the automatic testing method for a power supply system for testing liquid crystal display aging according to any embodiment of the present invention. As shown in fig. 2, the apparatus includes:

the preset voltage setting module 21 is configured to send a voltage setting command to a power supply system to be tested, so as to set each power supply device in the power supply system to be tested to a preset voltage;

the initial voltage sampling value reading module 22 is configured to send a voltage reading command to the power system to be tested, so as to read back the initial voltage sampling value of each power supply device;

the first sampling module 23 is configured to switch a load network into a large resistance network, send an output start command to the power supply system to be tested, control each power supply device to output, and sample a first voltage and a first current input by the power supply system to be tested;

the test parameter reading module 24 is configured to send a voltage reading command and a current reading command to the power system to be tested, so as to read back a test voltage sampling value and a test current sampling value of each power device;

the second sampling module 25 is configured to switch the load network to a high-power resistor network, and sample a second voltage input by the power supply system to be tested;

and the function detection module 26 is configured to determine whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value, and the test current sampling value.

According to the technical scheme provided by the embodiment of the invention, the voltage setting function and the voltage sampling function of the power supply system to be tested are tested by setting the preset voltage for the power supply system to be tested and reading back the initial voltage sampling value of each power supply device, and the voltage and current sampling function and the load carrying capacity of the power supply system to be tested are tested by respectively switching the load network to the large-resistance network and the large-power resistance network and simultaneously controlling the output of the power supply system to be tested, so that the automatic test of the power supply system is realized, the production efficiency is improved, the test reliability is improved, the quality requirement of workers is greatly reduced, the production cost is reduced, and the power supply system is well assisted to the examination and analysis of research and development personnel.

On the basis of the above technical solution, optionally, the preset voltage setting module 21 includes:

the first voltage setting unit is used for sending a first voltage setting command to the power supply system to be tested so as to set each power supply device to be the minimum value of the voltage range of the power supply device;

the second voltage setting unit is used for sending a second voltage setting command to the power supply system to be tested so as to set each power supply device to be the maximum value of the voltage range of the power supply device;

accordingly, the initial voltage sample value reading module 22 includes:

the first voltage sampling value reading unit is used for sending a first voltage reading command to the power supply system to be tested so as to read back the first voltage sampling value of each power supply device when the first voltage sampling value is set to be the minimum value;

and the second voltage sampling value reading unit is used for sending a second voltage reading command to the power system to be tested so as to read back the second voltage sampling values of the power equipment when the maximum value is set.

On the basis of the above technical solution, optionally, the function detecting module 26 includes:

the voltage setting function detection unit is used for comparing the initial voltage sampling value with the preset voltage so as to determine whether the voltage setting function and the voltage sampling function of the power supply system to be tested are normal or not;

the current sampling function detection unit is used for comparing the first current with the test current sampling value so as to determine whether the current sampling function of the power supply system to be tested is normal or not;

and the power supply loading capacity detection unit is used for comparing the second voltage with the preset voltage so as to determine whether the loading capacity of the power supply system to be detected is normal.

On the basis of the above technical scheme, optionally, the large resistance network comprises an LED lamp string for simulating a constant current backlight of the liquid crystal screen; the test voltage sampling value is the voltage on the LED lamp string monitored by the power supply system to be tested; this a power supply system's automatic testing arrangement for LCD screen aging testing still includes:

the sampling voltage determining module is used for determining the sampling voltage on the LED lamp string according to the first voltage after the first voltage and the first current input by the power supply system to be tested are sampled;

accordingly, the function detection module 26 includes:

and the voltage sampling function detection unit is used for comparing the sampling voltage with the test voltage sampling value so as to determine whether the voltage sampling function of the power supply system to be tested is normal or not.

On the basis of the above technical solution, optionally, the automatic testing apparatus for a power supply system for an aging test of a liquid crystal display further includes:

and the system connection detection module is used for sending a voltage setting command to the power supply system to be detected, sending a communication command to the power supply system to be detected before each power supply device in the power supply system to be detected is set to be preset voltage, detecting whether effective response information is received, and determining that the power supply system to be detected is normally connected if the effective response information is received.

the test starting detection module is used for detecting the input of a test starting key of a user, and if the input is detected and the power supply system to be tested is in a non-test state currently and is connected normally, the test is started;

and the test stopping detection module is used for detecting the test stopping key input of the user, and stopping the test if the input is detected and the user is in the test state currently.

and the alarm prompting module is used for giving an alarm through the display of a buzzer and/or an LCD if the abnormal function of the power supply system to be tested is detected until the input of the test stopping key is detected, and printing test information through a PC.

The automatic testing device for the power supply system for the liquid crystal screen aging test, provided by the embodiment of the invention, can execute the automatic testing method for the power supply system for the liquid crystal screen aging test, provided by any embodiment of the invention, and has the corresponding functional modules and beneficial effects of the execution method.

It should be noted that, in the above embodiment of the automatic test device for a power supply system for a liquid crystal display aging test, the included units and modules are only divided according to functional logic, but are not limited to the above division, as long as the corresponding functions can be realized; in addition, specific names of the functional units are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present invention.

EXAMPLE III

Fig. 3 is a schematic structural diagram of a computer device provided in the third embodiment of the present invention, and shows a block diagram of an exemplary computer device suitable for implementing the embodiment of the present invention. The computer device shown in fig. 3 is only an example, and should not bring any limitation to the function and the scope of use of the embodiments of the present invention. As shown in fig. 3, the computer apparatus includes a processor 31, a memory 32, an input device 33, and an output device 34; the number of the processors 31 in the computer device may be one or more, one processor 31 is taken as an example in fig. 3, the processor 31, the memory 32, the input device 33 and the output device 34 in the computer device may be connected by a bus or in other ways, and the connection by the bus is taken as an example in fig. 3.

The memory 32 is used as a computer readable storage medium and can be used for storing software programs, computer executable programs, and modules, such as program instructions/modules corresponding to the automatic test method for the power system for the lcd panel burn-in test in the embodiment of the present invention (for example, the preset voltage setting module 21, the initial voltage sampling value reading module 22, the first sampling module 23, the test parameter reading module 24, the second sampling module 25, and the function detection module 26 in the automatic test apparatus for the power system for the lcd panel burn-in test). The processor 31 executes various functional applications and data processing of the computer device by running software programs, instructions and modules stored in the memory 32, that is, the automatic test method of the power supply system for the liquid crystal screen aging test described above is realized.

The memory 32 may mainly include a program storage area and a data storage area, wherein the program storage area may store an operating system, an application program required for at least one function; the storage data area may store data created according to use of the computer device, and the like. Further, the memory 32 may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device. In some examples, the memory 32 may further include memory located remotely from the processor 31, which may be connected to a computer device over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.

The input device 33 may be used to receive test status result information, and to generate key signal inputs and the like relating to user settings and function control of the computer apparatus. Output device 34 may be used to send commands to a power system under test, and the like.

Example four

An embodiment of the present invention further provides a storage medium containing computer-executable instructions, which when executed by a computer processor, are configured to perform an automatic test method for a power supply system for a liquid crystal display aging test, where the method includes:

The storage medium may be any of various types of memory devices or storage devices. The term "storage medium" is intended to include: mounting media such as CD-ROM, floppy disk, or tape devices; computer system memory or random access memory such as DRAM, DDR RAM, SRAM, EDO RAM, Lambda (Rambus) RAM, etc.; non-volatile memory such as flash memory, magnetic media (e.g., hard disk or optical storage); registers or other similar types of memory elements, etc. The storage medium may also include other types of memory or combinations thereof. In addition, the storage medium may be located in the computer system in which the program is executed, or may be located in a different second computer system connected to the computer system through a network (such as the internet). The second computer system may provide the program instructions to the computer for execution. The term "storage medium" may include two or more storage media that may reside in different locations, such as in different computer systems that are connected by a network. The storage medium may store program instructions (e.g., embodied as a computer program) that are executable by one or more processors.

Of course, the storage medium containing the computer-executable instructions provided by the embodiments of the present invention is not limited to the method operations described above, and may also perform related operations in the automatic test method for a power supply system for a liquid crystal display aging test provided by any embodiment of the present invention.

A computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, for example, in baseband or as part of a carrier wave. Such a propagated data signal may take many forms, including, but not limited to, electro-magnetic, optical, or any suitable combination thereof. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.

Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

From the above description of the embodiments, it is obvious for those skilled in the art that the present invention can be implemented by software and necessary general hardware, and certainly, can also be implemented by hardware, but the former is a better embodiment in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which can be stored in a computer-readable storage medium, such as a floppy disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a FLASH Memory (FLASH), a hard disk or an optical disk of a computer, and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device) to execute the methods according to the embodiments of the present invention.

It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. An automatic test method of a power supply system for an aging test of a liquid crystal display is characterized by comprising the following steps:

2. The automatic test method for the power supply system for the liquid crystal screen aging test as recited in claim 1, wherein the sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage comprises:

3. The automatic test method of the power supply system for the aging test of the liquid crystal display according to claim 1, wherein the determining whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value comprises:

4. The automatic test method of the power supply system for the aging test of the liquid crystal display screen as claimed in claim 1, wherein the large resistance network comprises LED lamp strings for simulating a constant current backlight of the liquid crystal display screen; the test voltage sampling value is the voltage on the LED lamp string monitored by the power supply system to be tested; after sampling the first voltage and the first current input by the power supply system to be tested, the method further comprises the following steps:

correspondingly, the determining whether the power supply system to be tested functions normally according to the preset voltage, the initial voltage sampling value, the first voltage, the second voltage, the first current, the test voltage sampling value and the test current sampling value includes:

5. The automatic test method for the power supply system for the LCD screen aging test, according to claim 1, before the sending a voltage setting command to the power supply system to be tested to set each power supply device in the power supply system to be tested to a preset voltage, further comprising:

6. The automatic test method of the power supply system for the LCD screen aging test, according to claim 5, characterized in that the method further comprises:

detecting the input of a test starting key of a user, and if the input is detected and the power supply system to be tested is in a non-test state at present and is normally connected, starting the test;

7. The automatic test method of the power supply system for the LCD screen aging test, according to claim 6, characterized in that the method further comprises:

and if the power supply system to be tested is detected to have abnormal functions, alarming through a buzzer and/or LCD display until the test key input is detected to be stopped, and printing test information through a PC.

8. An automatic test device for a power supply system of a liquid crystal screen aging test is characterized by comprising:

the device comprises a preset voltage setting module, a voltage setting module and a control module, wherein the preset voltage setting module is used for sending a voltage setting command to a power system to be tested so as to set each power supply device in the power system to be tested to be a preset voltage;

9. A computer device, comprising:

one or more processors;

a memory for storing one or more programs;

when the one or more programs are executed by the one or more processors, the one or more processors are enabled to implement the automatic test method for the power supply system for the liquid crystal screen aging test as set forth in any one of claims 1 to 7.

10. A computer-readable storage medium on which a computer program is stored, the program implementing the automatic test method of the power supply system for the burn-in test of a liquid crystal panel according to any one of claims 1 to 7 when executed by a processor.