CN114593683B - Device and method for measuring parameters in pipeline production process based on pulse terahertz waves - Google Patents
Device and method for measuring parameters in pipeline production process based on pulse terahertz waves Download PDFInfo
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- 238000009683 ultrasonic thickness measurement Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
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Abstract
The invention discloses a parameter measuring device and method in a pipeline production process based on pulse terahertz waves, which organically combine a laser ranging radar with a terahertz system, firstly align a circular ring for fixing the laser ranging radar and an integrated terahertz probe with the center of a pipeline to be measured through a centering unit, and then realize fixed-point thickness scanning, continuous multipoint thickness scanning, continuous spiral multipoint thickness scanning and fixed-point circumferential thickness scanning of the pipeline to be measured through relative movement or relative rotation of the integrated terahertz probe and the pipeline to be measured. The on-line measurement of the pipeline parameters is realized, and the parameters such as wall thickness, layered wall thickness, inner diameter, outer diameter, concentricity and the like can be synchronously displayed instead of single thickness display.
Description
Technical field:
the invention belongs to the technical field of terahertz time-domain spectroscopy, and particularly relates to a device and a method for measuring parameters in a pipeline production process based on pulse terahertz waves.
The background technology is as follows:
In the production process of the pipeline, on-line detection of parameters such as the wall thickness, the layered wall thickness, the inner diameter, the outer diameter, the concentricity and the like of the pipeline is required to be realized, and the problem in the production process can be rapidly positioned through the abnormality of the parameters, so that the production process is fed back and guided.
The principle of the pipeline thickness measuring equipment commonly used in the market at present is ultrasonic thickness measurement, namely thickness measurement is carried out according to the ultrasonic pulse reflection principle. When the ultrasonic wave pulse emitted by the probe reaches the interface of the material through the object to be measured, the pulse is reflected back to the probe, and the thickness of the material to be measured is determined by precisely measuring the propagation time of the ultrasonic wave in the material. However, the propagation of ultrasonic waves requires a medium, which requires that the probe of the ultrasonic measurement device be brought into close proximity with the material to be measured. However, in the production process of the pipeline, the temperature is extremely high when the pipeline is formed, the pipeline cannot be in close contact with the pipeline, and the high temperature also has an influence on ultrasound, so that the test result is inaccurate. Due to the limitations of the test environments and the test scenes, for materials which cannot be contacted closely by some ultrasonic thickness measuring equipment, long-distance test is needed, so that the pipeline is required to be cooled to a certain temperature, ultrasonic waves can reach the tested materials and reflect back by means of other mediums, the test difficulty is definitely increased, the test complexity is increased, test errors are introduced, and the test result has obvious hysteresis.
The invention comprises the following steps:
The invention aims to overcome the defects in the prior art and seeks to design a device and a method for measuring parameters in the pipeline production process based on pulse terahertz waves.
In order to achieve the above purpose, the present invention adopts the following technical scheme: the invention relates to a parameter measurement device in a pipeline production process based on pulse terahertz waves, which comprises an integrated terahertz probe, a terahertz thickness measurement unit and a terahertz probe moving unit, wherein the terahertz thickness measurement unit is respectively connected with the integrated terahertz probe and the terahertz probe moving unit, the integrated terahertz probe is arranged on one side of a pipeline to be measured and used for generating and detecting the pulse terahertz waves, the terahertz waves emitted by the integrated terahertz probe are directed to the circle center of the pipeline to be measured, the integrated terahertz probe is fixed on the terahertz probe moving unit, the terahertz probe moving unit drives the terahertz probe to reciprocate along the linear direction of the radius of the pipeline to be measured to find the optimal detection position, the optimal position refers to the position of the integrated terahertz probe when the peak value of the terahertz wave is maximum, the terahertz thickness measurement unit is connected with the integrated terahertz probe, and the wall thickness of the pipeline b is calculated according to the terahertz signals fed back by the integrated terahertz probe when the optimal detection position is judged based on signals fed back by the integrated terahertz probe.
The parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a display processing device, wherein the terahertz thickness measuring unit is connected with the display processing device, and the display processing device is used for processing and/or displaying received results and coordinating the work among all the components.
The invention relates to a parameter measuring device in a pipeline production process based on pulse terahertz waves, which comprises a circular ring, a control base, a first laser range radar, a second laser range radar, a left linear motion unit, a right linear motion unit, an upper linear motion unit, a lower linear motion unit and a centering unit, wherein a terahertz probe moving unit is fixed on the circular ring, emitted light emitted by an integrated terahertz probe is directed at the center of the circular ring, the first laser range radar and the second laser range radar are respectively fixed at two ends of the diameter of the circular ring, the left end and the right end of the circular ring are respectively fixed at the control base through the left linear motion unit and the right linear motion unit, the left linear motion unit and the right linear motion unit drive the circular ring to move up and down along the control base, the upper end and the lower end of the circular ring are respectively fixed on the control base through the upper linear motion unit and the lower linear motion unit, the upper linear motion unit and the lower linear motion unit drive the circular ring to move left and right along the control base, the centering unit is respectively connected with the first laser ranging radar, the second laser ranging radar, the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit, the pipeline to be tested is arranged in the circular ring, the centering unit drives the circular ring to move up and down and left and right through controlling the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit to work, so that theta 1＝θ2＝0°,d1＝d2 is achieved, wherein theta 1 and theta 2 are included angles between incident light and reflected light measured by the first laser ranging radar and the second laser ranging radar respectively, and d 1 and d 2 are distances between the first laser ranging radar, the second laser ranging radar and the outer wall of the pipeline to be tested respectively.
Specifically, the parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a laser ranging unit, wherein the laser ranging unit is connected with the display processing device, when θ 1＝θ2 =0, the outer diameter D and the inner diameter D of the pipeline to be measured are calculated, D=a-D 1-d2, and d=d-2 h, wherein a is the distance between the first laser ranging radar and the second laser ranging radar, and h is the thickness of the pipeline.
The parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a 360-degree rotary motion unit, wherein the 360-degree rotary motion unit is respectively connected with the display processing device and the circular ring, and the 360-degree rotary motion unit drives the circular ring to rotate around the circle center based on a control instruction of the display processing device 20.
Specifically, 360 rotary motion unit includes external gear, internal gear, motor and mount, and internal gear and ring concentric fixed connection, a plurality of external gear and internal gear meshing that the hoop was evenly arranged, and every external gear is connected with corresponding motor, and the external gear is fixed on the mount, and left rectilinear motion unit, right rectilinear motion unit, go up rectilinear motion unit, lower rectilinear motion unit are fixed on the control base through the mount respectively.
The parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a horizontal movement unit, wherein the horizontal movement unit is respectively connected with the display processing device and the control base, and the horizontal movement unit drives the control base to move along the axis direction of the center of a circle of the pipeline to be measured based on a control instruction sent by the display processing device.
Specifically, the control base is a square frame formed by connecting square tubes, the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit are respectively connected with the square tubes at the left side, the right side, the front side and the rear side of the square frame, the circular ring is arranged at one side of the square frame, and a pipeline to be tested penetrates through the centers of the square frame and the circular ring.
The parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a mode setting unit, wherein the mode setting unit comprises four selection modes, namely a single-point measurement mode, a multi-point linear measurement mode, a multi-point spiral measurement mode and a multi-point synchronous measurement mode, the single-point measurement mode is used for carrying out fixed-point thickness scanning on a pipeline to be measured, the multi-point linear measurement mode is used for carrying out continuous multi-point thickness scanning on the pipeline to be measured, the multi-point spiral measurement mode is used for carrying out continuous spiral multi-point thickness scanning on the pipeline to be measured, and the multi-point synchronous measurement mode is used for carrying out fixed-point circumferential thickness scanning on the pipeline to be measured.
A parameter measurement method in the pipeline production process based on pulse terahertz waves specifically comprises the following steps:
(1) Placing a pipeline to be tested in a test system, emitting laser to the pipeline to be tested by a first laser range radar and a second laser range radar, and sending the measured included angles theta 1 and theta 2 between incident light and reflected light measured by the first laser range radar and the second laser range radar and distances d 1 and d 2 between the first laser range radar and the second laser range radar and the outer wall of the pipeline to be tested to a display processing device in real time;
(2) The centering unit acquires theta 1、θ2、d1 and d 2, and controls the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit to work so as to drive the circular ring to move up and down and left and right, so that theta 1＝θ2＝0°,d1＝d2 is achieved, and the alignment operation of the circle center of the circular ring and the circle center of the pipeline to be detected is completed;
(3) The terahertz probe moving unit drives the integrated terahertz probe to move to the maximum terahertz peak value and stops, so that the terahertz probe preset position is completed;
(4) Inputting pipeline basic parameters;
(5) Selecting modes and setting related parameters in a mode setting unit, wherein the modes comprise four selection modes, namely a single-point measurement mode, a multi-point linear measurement mode, a multi-point spiral measurement mode and a multi-point synchronous measurement mode, the single-point measurement mode is used for carrying out fixed-point thickness scanning on a pipeline to be measured, the multi-point linear measurement mode is used for carrying out continuous multi-point thickness scanning on the pipeline to be measured, the multi-point spiral measurement mode is used for carrying out continuous spiral multi-point thickness scanning on the pipeline to be measured, and the multi-point synchronous measurement mode is used for carrying out periodic fixed-point circumferential thickness scanning on the pipeline to be measured;
(6) According to the mode selected in the step (5) and the set parameters, the horizontal movement unit and/or the rotary movement unit move, in the process, the laser ranging unit 7 calculates the outer diameter D and the inner diameter D of the pipeline to be measured based on D 1 and D 2, d=a-D 1-d2, d=d-h, the terahertz thickness measuring unit 2 calculates the wall thickness b of the pipeline based on terahertz signals fed back by the integrated terahertz probe 1, and the result is sent to the display processing device 20 in real time for processing and displaying.
Compared with the prior art, the invention has the following beneficial effects: the method is not affected by temperature, can perform rapid measurement without the help of other mediums, and does not introduce other errors; the automatic center alignment operation improves the accuracy of measurement; the on-line measurement of the pipeline parameters is realized, and the parameters such as wall thickness, layered wall thickness, inner diameter, outer diameter, concentricity and the like can be synchronously displayed instead of single thickness display; the production process can be fed back and guided, the unqualified pipelines produced due to measurement hysteresis are reduced, and the multi-party loss of time, raw materials and the like caused by the unqualified pipelines is reduced.
Description of the drawings:
Fig. 1 is a schematic structural diagram of a parameter measurement device in the process of producing a pipe based on pulsed terahertz waves in embodiment 1.
Fig. 2 is a schematic diagram of the measurement of the thickness of the pipe based on the pulsed terahertz wave in embodiment 1.
Fig. 3 is a perspective view of a parameter measuring apparatus in the process of producing a pipe based on pulsed terahertz waves in example 1.
Fig. 4 is a partial perspective view of the parameter measuring apparatus in the process of producing a pipe based on pulsed terahertz waves in example 1.
Fig. 5 is a schematic structural diagram of the principle of laser ranging in embodiment 1.
Fig. 6 is a side view of fig. 3.
Fig. 7 is a cross-sectional view of BB in fig. 6.
Fig. 8 is a cross-sectional view AA of fig. 6.
Fig. 9 is a schematic structural diagram of a parameter measurement device in the process of producing a pipe based on pulsed terahertz waves in embodiment 1.
Fig. 10 is a schematic diagram of a single point measurement mode.
Fig. 11 is a schematic diagram of a multipoint linear measurement mode.
Fig. 12 is a schematic diagram of a multi-point spiral measurement mode.
Fig. 13 is a schematic diagram of a multipoint synchronous measurement mode.
FIG. 14 is a flow chart of on-line measurement of pipe wall thickness.
The specific embodiment is as follows:
the invention will now be further illustrated by means of specific examples in connection with the accompanying drawings.
Example 1
Terahertz waves are electromagnetic waves in a section between microwaves and infrared rays, and have a plurality of unique properties compared with electromagnetic waves in other wave bands, for example, the terahertz waves have good penetrability (such as PP, PVC, PE) on most inorganic and nonmetallic materials, and materials used by a large number of pipelines have the properties, so that the terahertz waves have good penetrability on most pipeline walls, and the acquisition of multilayer reflection signals with good signal-to-noise ratio can be ensured; terahertz pulses generated based on the principle of ultrafast optoelectronics have extremely short pulse width, generally in the sub-picosecond order, which means that terahertz waves have excellent spatial resolution in the propagation direction, and the 1ps pulse width theory can achieve spatial resolution of 30 μm, which is extremely advantageous for thin-wall pipeline measurement; the terahertz photons have lower energy than the x-rays which also have transmission capacity, do not cause ionization and are safe to human bodies, and the property makes terahertz waves very suitable for industrial production lines; the interaction of terahertz waves and molecules shows absorption bands at the inherent positions of the spectrums, and the absorption bands objectively reflect the components of substances and can be used for acquiring auxiliary parameters including component identification, water content identification and the like. These above properties make terahertz waves have incomparable advantages to other techniques for pipe thickness measurement.
Based on the above, the embodiment provides a device and a method for measuring parameters in the pipeline production process based on pulse terahertz waves. The characteristics of high spatial resolution, high time resolution and insensitive signal temperature of terahertz time-domain pulses can provide more stable and reliable measurement data in the pipeline production process, and particularly the method is used for multi-layer thin-wall pipelines, other mediums are not required to be introduced, the influence of high temperature on testing is not required to be considered, the real-time online measurement of parameters such as wall thickness, pipe diameter and the like can be realized, and monitoring is carried out in early stage of pipeline forming.
As shown in fig. 1, the parameter measurement device in the pipe production process based on the pulse terahertz wave according to this embodiment includes an integrated terahertz probe 1, a terahertz thickness measurement unit 2 and a terahertz probe moving unit 3, where the terahertz thickness measurement unit 2 is respectively connected with the integrated terahertz probe 1 and the terahertz probe moving unit 3, the integrated terahertz probe 1 is disposed at one side of a pipe 5 to be measured and is used for generating and detecting the pulse terahertz wave, the terahertz wave emitted by the integrated terahertz probe 1 is directed to the center of the pipe 5 (or perpendicular to the center axis of the pipe 5 to be measured), the integrated terahertz probe 1 is fixed on the terahertz probe moving unit 3, the terahertz probe moving unit 3 drives the terahertz probe to reciprocate along the linear direction where the radius of the pipe 5 to be measured is located to find an optimal detection position, where the integrated terahertz peak is located when the peak value of the terahertz is maximum, the terahertz thickness measurement unit 2 is connected with the integrated terahertz probe 1, and when the terahertz signal fed back by the integrated terahertz probe 1 is used for judging the optimal detection position and calculating the terahertz signal b of the pipe wall thickness of the integrated terahertz probe 1 according to the terahertz signal fed back by the integrated terahertz probe 1 when the optimal detection position is located. Specifically, the terahertz thickness measurement unit 2 is a host of an existing terahertz thickness measurement system.
As shown in fig. 2, the integrated terahertz probe 1 emits a pulse terahertz wave, after the terahertz wave reaches the pipe 5 to be measured, the terahertz wave is reflected on the wall of the pipe and returns to the integrated terahertz probe 1, wherein the first peak is a reflection peak of the first surface of the pipe, the second peak is a reflection peak of the second surface of the pipe, the third peak is a reflection peak of the third surface of the pipe, and the terahertz thickness measuring unit 2 measures the thickness of the pipe wall according to the terahertz flight time (FOT). The method comprises the following steps: the integrated terahertz probe 1 emits pulse terahertz waves, the terahertz waves are reflected on the wall of a pipeline to be detected 5 after reaching the pipeline to be detected, reflected signals enter the integrated terahertz probe 2 again and record the flight time and amplitude, the peak value position is accurately obtained through a peak searching algorithm, the peak value delay time t can be obtained from the waveform of fig. 2, the thickness information h of the pipeline can be calculated under the condition of knowing the refractive index n of the material,
The formula is as follows:
in order to accurately measure the thickness of the pipeline 5 to be measured, the emitted light emitted by the integrated terahertz probe 1 needs to be ensured to be directed to the circle center of the pipeline 5 to be measured in the measurement process, that is, the emitted light emitted by the integrated terahertz probe 1 is perpendicular to the central axis of the pipeline, and the following implementation mode is adopted in the embodiment specifically.
As shown in fig. 3, the parameter measuring device in the pipe production process based on the pulse terahertz wave further comprises a display processing device 20, the terahertz thickness measuring unit 2 is connected with the display processing device 20, and the display processing device 20 is used for processing and/or displaying the received result and coordinating the work among the components. The display processing device 20 includes a display, a host computer, and a computer support system for corresponding processing software.
As shown in fig. 4, 5 and 9, the parameter measuring device in the pipe production process based on the pulse terahertz wave according to this embodiment includes a circular ring 4, a control base 6, a first laser ranging radar 8, a second laser ranging radar 9, a left rectilinear motion unit 10, a right rectilinear motion unit 11, an upper rectilinear motion unit 12, a lower rectilinear motion unit 13 and a centering unit 14, the terahertz probe moving unit 3 is fixed on the circular ring 4, the emitted light emitted by the integrated terahertz probe 1 is directed to the center of the circular ring 4, the first laser ranging radar 8 and the second laser ranging radar 9 are respectively fixed at two ends of a diameter of the circular ring 4, the left and right ends of the circular ring 4 are respectively fixed at the control base 6 through the left rectilinear motion unit 10 and the right rectilinear motion unit 11, the left rectilinear motion unit 10 and the right rectilinear motion unit 11 drive the circular ring 4 to move up and down along the control base 6, the upper and lower ends of the circular ring 4 are respectively fixed on the control base 6 through an upper linear motion unit 12 and a lower linear motion unit 13, the upper linear motion unit 12 and the lower linear motion unit 13 drive the circular ring 4 to move left and right along the control base 6, a centering unit 14 is respectively connected with a first laser ranging radar 8, a second laser ranging radar 9, a left linear motion unit 10, a right linear motion unit 11, the upper linear motion unit 12 and the lower linear motion unit 13, a pipeline to be tested is arranged in the circular ring 4, the centering unit 14 drives the circular ring 4 to move left and right up and down by controlling the left linear motion unit 10, the right linear motion unit 11, the upper linear motion unit 12 and the lower linear motion unit 13 to move left and right, so that theta 1＝θ2＝0°,d1＝d2 is realized, wherein theta 1 and theta 2 are included angles between incident light and reflected light measured by the first laser ranging radar 8 and the second laser ranging radar 9 respectively, d 1 and d 2 are the distances between the first 8 and second 9 laser ranging radars and the outer wall of the pipe 5 to be measured, respectively. The left and right rectilinear motion units 10 and 11 do not interfere with each other when the upper and lower rectilinear motion units 12 and 13 move, and vice versa. Specifically, the centering unit 14 is part of the display processing device 20.
Specifically, as shown in fig. 5, the first laser ranging radar 8 and the second laser ranging radar 9 respectively emit laser (incident light), the laser is reflected (reflected light) when encountering the pipe 5 to be measured, the laser irradiates the surface of the pipe 5 to be measured, two opposite laser beams respectively form two bright light spots on the surface of the pipe 5 to be measured, the positions and shapes of the light spots, the time and the distance of the reflected light when returning are detected by a sensor in the laser ranging radar, the central unit 14 obtains angles theta 1 and theta 2 between the incident light and the reflected light measured by the first laser ranging radar 8 and the second laser ranging radar 9, and distances d 1 and d 2(d1 and d 2 between the first laser ranging radar 8 and the second laser ranging radar 9 and the outer wall of the pipe 5 to be measured are lengths of the incident light emitted by the first laser ranging radar 8 and the second laser ranging radar 9 onto the outer wall of the pipe to be measured respectively, the self-centering procedure is started, the ring 4 moves up and down under the driving of the left linear motion unit 10 and the right linear motion unit 11, the ring is stopped when the acquired angle θ 1＝θ2 =0° (at this time, the diameter of the ring 4 in the horizontal direction of the pipe 5 to be measured coincides), the ring is driven by the upper linear motion unit 12 and the lower linear motion unit 13 to move left and right, and the ring is stopped when the acquired d 1＝d2 (i.e. d 1'＝d2') is stopped (at this time, the diameter of the ring 4 in the vertical direction of the pipe 5 to be measured coincides), so as to finish the aligning operation of the circle center of the ring 4 and the circle center of the pipe 5 to be measured.
Because the terahertz wave emitted by the integrated terahertz probe 1 is directed to the circle center of the circular ring 4, and after the circle center of the circular ring 4 is aligned with the circle center of the pipeline 5 to be tested, the terahertz wave emitted by the integrated terahertz probe 1 is directed to the circle center of the pipeline 5 to be tested. The above implementation manner not only can realize that the terahertz wave emitted by the integrated terahertz probe 1 points to the circle center of the pipeline 5 to be measured, but also can conveniently measure the thickness h of the pipeline 5 to be measured, and can also measure the inner diameter D and the outer diameter D of the pipeline. Specifically, as shown in fig. 3 and 9, the parameter measuring device in the process of producing a pipe based on a pulse terahertz wave further includes a laser ranging unit 7, wherein the laser ranging unit 7 is connected with the display processing device 20, and when θ 1＝θ2 =0, the outer diameter D and the inner diameter D of the pipe to be measured are calculated, d=a-D 1-d2, d=d-2 h, where a is the distance between the first laser ranging radar 8 and the second laser ranging radar 9, and h is the thickness of the pipe. Specifically, the laser ranging unit 7 is an existing laser ranging system host.
As shown in fig. 9, the parameter measuring device in the process of producing the pipeline based on the pulse terahertz wave further comprises a 360-degree rotary motion unit, wherein the 360-degree rotary motion unit is respectively connected with the display processing device 20 and the circular ring 4, and the 360-degree rotary motion unit drives the circular ring 4 to rotate around the circle center based on a control instruction of the display processing device 20. After the circle center of the pipeline 5 to be measured is aligned with the circle center of the circular ring 4, the pipeline 5 to be measured and the circular ring 4 can relatively rotate around the axis of the circle center through the 360-degree rotary motion unit, and then the thickness of the pipe wall, the inner diameter of the pipe and the outer diameter of any point on the circumference of the pipeline are measured.
Specifically, as shown in fig. 4, 6, 7 and 8, the 360 ° rotary motion unit includes an external gear 14, an internal gear 15, a motor 16 and a fixed mount 17, the internal gear 15 and the circular ring 4 are concentrically and fixedly connected, a plurality of external gears 14 uniformly arranged in a circumferential direction are meshed with the internal gear 15, each external gear 14 is connected with a corresponding motor 16, the external gears 14 are fixed on the fixed mount 17, and the left rectilinear motion unit 10, the right rectilinear motion unit 11, the upper rectilinear motion unit 12 and the lower rectilinear motion unit 13 are respectively fixed on the control base 6 through the fixed mount 17. The pipeline 5 to be measured is placed in the circular ring 4, the external gear 14 rotates under the drive of the motor 16, the internal gear 15 and the circular ring 4 are sequentially driven to rotate, and then the integrated terahertz probe 1, the first laser ranging radar 8 and the second laser ranging radar 9 are driven to rotate around the pipeline 5 to be measured, so that the wall thickness, the inner diameter and the outer diameter of the pipeline at any point in the circumferential direction of the pipeline 5 to be measured are measured.
As shown in fig. 9, the parameter measuring device in the process of producing a pipeline based on the pulse terahertz wave further comprises a horizontal movement unit, wherein the horizontal movement unit is respectively connected with the display processing device 20 and the control base 6, and the horizontal movement unit drives the control base 6 to move along the direction of the center axis of the pipeline to be measured based on a control instruction sent by the display processing device 20. After the circle center of the pipeline 5 to be measured is aligned with the circle center of the circular ring 4, the pipeline 5 to be measured and the circular ring 4 can relatively move along the axis direction of the circle center through the horizontal movement unit, and then the thickness of the pipe wall, the inner diameter of the pipe and the outer diameter of any point in the length direction of the pipe are measured. Specifically, as shown in fig. 3 and 6, the horizontal movement unit includes a rail 18 fixed to the bottom plate and a slider 19 engaged with the rail 18, the slider 19 being fixed to the bottom of the control base 6.
Specifically, the control base 6 is a square frame formed by square tube connection, the left linear motion unit 10, the right linear motion unit 11, the upper linear motion unit 12 and the lower linear motion unit 13 are respectively connected with square tubes on the left side, the right side, the front side and the rear side of the square frame, the circular ring 4 is arranged on one side of the square frame, and the pipeline 5 to be tested passes through the centers of the square frame and the circular ring 4.
The parameter measuring device in the pipeline production process based on the pulse terahertz waves further comprises a mode setting unit 21, wherein the mode setting unit comprises a single-point measuring mode, a multipoint linear measuring mode, a multipoint spiral measuring mode and a multipoint synchronous measuring mode, the single-point measuring mode is used for carrying out fixed-point thickness scanning on the pipeline to be measured, the multipoint linear measuring mode is used for carrying out continuous multipoint thickness scanning on the pipeline to be measured, the multipoint spiral measuring mode is used for carrying out continuous spiral multipoint thickness scanning on the pipeline to be measured, and the multipoint synchronous measuring mode is used for carrying out fixed-point circumferential thickness scanning on the pipeline to be measured. The mode setting unit 21 displays a part of the processing apparatus 20.
A parameter measurement method in the pipeline production process based on pulse terahertz waves specifically comprises the following steps:
(1) Placing a pipeline to be tested in a test system, emitting laser to the pipeline to be tested by a first laser ranging radar 8 and a second laser ranging radar 9, and sending the measured included angles theta 1 and theta 2 between incident light and reflected light measured by the first laser ranging radar 8 and the second laser ranging radar 9 and distances d 1 and d 2 between the first laser ranging radar 8 and the second laser ranging radar 9 and the outer wall of the pipeline to be tested to a display processing device 20 in real time;
(2) The centering unit 14 acquires theta 1、θ2、d1 and d 2, controls the left linear motion unit 10, the right linear motion unit 11, the upper linear motion unit 12 and the lower linear motion unit 13 to work so as to drive the circular ring 4 to move up and down and left and right, so that theta 1＝θ2＝0°,d1＝d2 is achieved, and the circle center of the circular ring 4 and the circle center of the pipeline 5 to be tested are aligned;
(3) The terahertz probe moving unit 3 drives the integrated terahertz probe 1 to move until the peak value of the terahertz wave peak is maximum, and stops, so that the terahertz probe preset position is completed;
(4) Inputting a pipeline basic parameter such as refractive index c;
(5) Selecting a mode and setting related parameters at the mode setting unit 21;
(6) According to the mode selected in the step (5) and the set parameters, the horizontal movement unit and/or the rotary movement unit move, in the process, the laser ranging unit 7 calculates the outer diameter D and the inner diameter D of the pipeline to be measured based on D 1 and D 2, D=a-D 1-d2, d=d-h, the terahertz thickness measuring unit 2 calculates the wall thickness b of the pipeline based on terahertz signals fed back by the integrated terahertz probe 1, and the result is sent to the display processing device 20 in real time for processing and displaying;
as shown in fig. 10, single point measurement mode:
When the pipeline is in a static state, setting the stepping speed v 2 and the stepping distance L of the control base 6 along the track, and enabling the horizontal movement unit to drive the control base 6 to stop along the track at the stepping distance L of the speed v 2, so as to acquire data at the point;
When the pipeline moves at the speed v 1, the stepping speed v 2,v2＜v1 or v 2 =0 of the control base 6 along the track is set, and the horizontal movement unit drives the control base 6 to reach the detection point along the track at the speed v 2 to perform fixed-point thickness scanning. The mode is suitable for spot inspection of fixed positions of the pipeline, mainly for determining the thickness condition of the positions, and is used as a basis for judging the quality of finished products.
As shown in fig. 11, the multipoint linear measurement mode:
When the pipeline is in a static state, setting the stepping speed v 2 'of the control base 6 along the track, and driving the control base 6 to continuously scan the pipeline in real time along the track at the speed v 2' by the horizontal movement unit;
When the pipeline moves at the speed v 1, the stepping speed v 2'(v2'＜v1 or v 2' =0 of the control base 6 along the track is set, the pipeline is continuously scanned in real time, and data are acquired in real time. The mode is a basic mode of pipeline online measurement, and can be used for carrying out continuous thickness measurement on a pipeline region of interest.
As shown in fig. 12, the multi-point spiral measurement mode:
When the pipeline is in a static state, setting the stepping speed v 2 'of the control base 6 along the track, the rotating speed w of the circular ring, driving the control base 6 to step along the track at the speed v 2' by the horizontal movement unit, and driving the circular ring to rotate at the speed w relative to the pipeline to be tested by the 360-degree rotary movement unit, so as to perform real-time spiral scanning on the pipeline;
When the pipeline moves at the speed v 1, the stepping speed v 2'(v2'＜v1 or v 2 '=0 of the control base 6 along the track is set, the rotating speed w of the circular ring is set, the horizontal moving unit drives the control base 6 to step at the speed v 2' along the track, and meanwhile, the 360-degree rotating moving unit drives the circular ring to rotate at the speed w relative to the pipeline to be detected, so that the pipeline is spirally scanned. The mode can be applied to pipeline online measurement, and can be used for carrying out 360-degree multipoint scanning thickness measurement on a moving pipeline.
As shown in fig. 12, the multipoint synchronization measurement mode:
When the pipeline is in a static state, setting a stepping speed v 2 and a stepping distance L of the control base 6 along the track, and a rotating speed w of the circular ring, wherein the horizontal moving unit drives the control base 6 to stop along the track at the stepping distance L of the speed v 2, and then the 360-degree rotating moving unit drives the circular ring to rotate for one circle at the speed w relative to the pipeline to be detected, so that the pipeline is continuously scanned along the circumferential direction;
When the pipeline moves at the speed v 1, the movement speed of the control base 6 along the horizontal movement guide rail can be set to be v 2(v2＜v1 or v 2 =0, the horizontal movement unit drives the control base 6 to reach the detection point along the track at the speed v 2, the movement speed of the control base 6 along the horizontal movement guide rail is set to be v 1, the rotation speed w of the circular ring, the control base 6 and the pipeline synchronously move at the speed v 1, and meanwhile, the 360-degree rotation movement unit drives the circular ring to rotate at the speed w for one circle relative to the pipeline to be measured, data are collected in real time, and the like, so that measurement is completed. The mode is added with rotary scanning based on a single-point measurement mode, can be applied to pipeline online measurement, and can acquire thickness data of the same section position of a pipeline.
Claims (5)
1. The parameter measuring device in the pipeline production process based on the pulse terahertz waves is characterized by comprising an integrated terahertz probe, a terahertz thickness measuring unit, a display processing device, a terahertz probe moving unit, a circular ring, a control base, a first laser range radar, a second laser range radar, a left linear motion unit, a right linear motion unit, an upper linear motion unit, a lower linear motion unit and a centering unit, wherein the terahertz thickness measuring unit is respectively connected with the integrated terahertz probe and the terahertz probe moving unit, the integrated terahertz probe is arranged on one side of a pipeline to be measured and used for generating and detecting the pulse terahertz waves, the terahertz waves emitted by the integrated terahertz probe are directed to the circle center of the pipeline to be measured, the integrated terahertz probe is fixed on the terahertz probe moving unit, the terahertz probe is driven by the terahertz probe moving unit to reciprocate along the linear direction of the radius of the pipeline to be measured to find an optimal detection position, the integrated terahertz probe is positioned when the peak value of the terahertz wave peak is maximum, the terahertz thickness measuring unit is connected with the integrated terahertz probe, and the integrated terahertz probe is used for calculating the thickness of the integrated terahertz signal when the optimal detection position is judged based on the signal of the integrated terahertz probe and according to the terahertz signal of the integrated terahertz probe;
The terahertz thickness measuring unit is connected with the display processing device, and the display processing device is used for processing and/or displaying the received result and coordinating the work among the components;
The terahertz probe moving unit is fixed on the circular ring, the emitted light emitted by the integrated terahertz probe points to the circle center of the circular ring, the first laser ranging radar and the second laser ranging radar are respectively fixed at two ends of a diameter of the circular ring, the left end and the right end of the circular ring are respectively fixed on the control base through the left linear motion unit and the right linear motion unit, the left linear motion unit and the right linear motion unit drive the circular ring to move up and down along the control base, the upper end and the lower end of the circular ring are respectively fixed on the control base through the upper linear motion unit and the lower linear motion unit, the upper linear motion unit and the lower linear motion unit drive the circular ring to move left and right along the control base, the centering unit is respectively connected with the first laser ranging radar, the second laser ranging radar, the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit, the pipeline to be measured is arranged in the circular ring, the centering unit drives the circular ring to move up and down left and right through the control of the left linear motion unit, the right linear motion unit, so that theta 1=θ2=0°,d1=d2 is respectively, the theta 1 and the theta 2 are respectively the included angles between the first laser ranging radar, the second laser ranging radar and the first laser ranging radar and the second laser ranging radar are respectively measured by the incident light d and the laser ranging radar and the first laser ranging radar and the second laser ranging radar;
The device comprises a display processing device, a laser ranging unit, a 360-degree rotary motion unit, a control unit and a control unit, wherein the laser ranging unit is connected with the display processing device, when θ 1=θ2 =0, the outside diameter D and the inside diameter D of a pipeline to be measured are calculated, D=a-D 1-d2, d=d-2 h, a is the distance between a first laser ranging radar and a second laser ranging radar, and h is the thickness of the pipeline;
The 360-degree rotary motion unit comprises an external gear, an internal gear, a motor and a fixing frame, wherein the internal gear is fixedly connected with the circular ring in the same center, a plurality of external gears which are uniformly arranged in the circumferential direction are meshed with the internal gear, each external gear is connected with the corresponding motor, the external gear is fixed on the fixing frame, and the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit are respectively fixed on the control base through the fixing frame.
2. The device for measuring parameters in the production process of the pipeline based on the pulse terahertz waves according to claim 1, further comprising a horizontal movement unit, wherein the horizontal movement unit is respectively connected with the display processing device and the control base, and the horizontal movement unit drives the control base to move along the direction of the center axis of the pipeline to be measured based on a control instruction sent by the display processing device.
3. The parameter measuring device in the process of producing the pipeline based on the pulse terahertz waves according to claim 2, wherein the control base is a square frame formed by connecting square tubes, the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit are respectively connected with the square tubes on the left side, the right side, the front side and the rear side of the square frame, the circular ring is arranged on one side of the square frame, and the pipeline to be measured passes through the centers of the square frame and the circular ring.
4. The parameter measurement device in the process of producing the pipeline based on the pulse terahertz waves according to claim 3, further comprising a mode setting unit, wherein the mode setting unit comprises four selection modes, namely a single-point measurement mode, a multi-point line measurement mode, a multi-point spiral measurement mode and a multi-point synchronous measurement mode, the single-point measurement mode is used for carrying out fixed-point thickness scanning on the pipeline to be measured, the multi-point line measurement mode is used for carrying out continuous multi-point thickness scanning on the pipeline to be measured, the multi-point spiral measurement mode is used for carrying out continuous spiral multi-point thickness scanning on the pipeline to be measured, and the multi-point synchronous measurement mode is used for carrying out fixed-point circumferential thickness scanning on the pipeline to be measured.
5. A method for measuring parameters in the process of producing a pipeline based on pulsed terahertz waves, which utilizes the device for measuring parameters in the process of producing a pipeline based on pulsed terahertz waves as set forth in any one of claims 1 to 4, comprising the steps of:
(1) Placing a pipeline to be tested in a test system, emitting laser to the pipeline to be tested by a first laser range radar and a second laser range radar, and sending the measured included angles theta 1 and theta 2 between incident light and reflected light measured by the first laser range radar and the second laser range radar and distances d 1 and d 2 between the first laser range radar and the second laser range radar and the outer wall of the pipeline to be tested to a display processing device in real time;
(2) The centering unit acquires theta 1、θ2、d1 and d 2, and controls the left linear motion unit, the right linear motion unit, the upper linear motion unit and the lower linear motion unit to work so as to drive the circular ring to move up and down and left and right, so that theta 1=θ2=0°,d1=d2 is achieved, and the alignment operation of the circle center of the circular ring and the circle center of the pipeline to be detected is completed;
(3) The terahertz probe moving unit drives the integrated terahertz probe to move to the maximum terahertz peak value and stops, so that the terahertz probe preset position is completed;
(4) Inputting pipeline basic parameters;
(5) Selecting a mode and setting related parameters in a mode setting unit, wherein the mode comprises four selection modes, namely a single-point measurement mode, a multi-point linear measurement mode, a multi-point spiral measurement mode and a multi-point synchronous measurement mode, the single-point measurement mode is used for carrying out fixed-point thickness scanning on a pipeline to be measured, the multi-point linear measurement mode is used for carrying out continuous multi-point thickness scanning on the pipeline to be measured, the multi-point spiral measurement mode is used for carrying out continuous spiral multi-point thickness scanning on the pipeline to be measured, and the multi-point synchronous measurement mode is used for carrying out fixed-point circumferential thickness scanning on the pipeline to be measured;
(6) And (3) according to the mode selected in the step (5) and the set parameters, the horizontal movement unit and/or the rotary movement unit move, in the process, the laser ranging unit calculates the outer diameter D and the inner diameter D of the pipeline to be measured based on D 1 and D 2, D=a-D 1-d2, d=d-h, the terahertz thickness measuring unit calculates the wall thickness b of the pipeline based on terahertz signals fed back by the integrated terahertz probe, and the result is sent to the display processing device in real time for processing and displaying.
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