CN114551543A - Pixel repairing method and manufacturing method of organic light-emitting display panel - Google Patents

Pixel repairing method and manufacturing method of organic light-emitting display panel Download PDF

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Publication number
CN114551543A
CN114551543A CN202210124540.5A CN202210124540A CN114551543A CN 114551543 A CN114551543 A CN 114551543A CN 202210124540 A CN202210124540 A CN 202210124540A CN 114551543 A CN114551543 A CN 114551543A
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pixel
sub
thin film
defective
film transistor
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何伟
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Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Shenzhen China Star Optoelectronics Semiconductor Display Technology Co Ltd
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Publication of CN114551543A publication Critical patent/CN114551543A/en
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H10K59/1201—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/12—Active-matrix OLED [AMOLED] displays
    • H10K59/131—Interconnections, e.g. wiring lines or terminals

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  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)

Abstract

The invention relates to a pixel repairing method and a manufacturing method of an organic light-emitting display panel, wherein when sub-pixels in a pixel array are defective to form defective sub-pixels, a signal receiving end for disconnecting the defective sub-pixels is provided, the anodes of the defective sub-pixels and the anodes of the adjacent normal sub-pixels are connected in series through a connecting line, and the repair of the defective sub-pixels can be realized by combining a brightness compensation technology, so that the defective sub-pixels can normally emit light, the display brightness is consistent with that of the adjacent normal sub-pixels, the pseudo-normalization of the defective sub-pixels is realized, the metal wiring density in the pixel array can be reduced, the defect normalization repair can be avoided due to insufficient pixel space, the number of defective points in an organic light-emitting display panel product is reduced, and the product yield is improved.

Description

Pixel repairing method and manufacturing method of organic light-emitting display panel
Technical Field
The invention relates to the technical field of display, in particular to a pixel repairing method and a manufacturing method of an organic light-emitting display panel.
Background
In order to reduce the number of dark spots in a pixel array, a large-sized organic light emitting display panel (OLED) product manufactured by mass production at present usually adopts a design of reserving an anode bridge when designing a pixel structure, that is, an anode bridge trace is designed between two adjacent sub-pixels with the same color, one end of the anode bridge trace is connected to an anode of one sub-pixel a, and the other end of the anode bridge trace is connected to an anode overlapping area of another adjacent sub-pixel b with the same color but is not conducted with the anode of the sub-pixel b. When the sub-pixel a has a defect (such as a dark spot) and needs to be repaired, the connecting part of the anode bridging line and the anode lap joint area of the sub-pixel b is conducted in a laser welding mode, so that the sub-pixel a and the sub-pixel b are connected together, and the repair of the sub-pixel a is realized. However, the repair method of the anode bridging wires can increase the wire density in the pixel array, and the laser welding method has the risk of damaging other metal wires, which affects the yield of products.
Disclosure of Invention
The invention aims to solve the problem that the traditional pixel repairing method can increase the wiring density.
To achieve the above object, the present invention provides a pixel repairing method, including:
when a sub-pixel in the pixel array has a display defect to form a defective sub-pixel, disconnecting a signal receiving end of a driving thin film transistor of the defective sub-pixel;
connecting a normal sub-pixel adjacent to the defective sub-pixel in series with the defective sub-pixel;
and performing brightness compensation on the normal sub-pixel and the defective sub-pixel.
Optionally, the step of turning off a signal receiving terminal of the driving thin film transistor of the defective sub-pixel includes: and disconnecting the electric connection between the driving thin film transistor of the defective sub-pixel and the data line.
Optionally, the step of turning off a signal receiving terminal of the driving thin film transistor of the defective sub-pixel includes: and disconnecting the electric connection between the driving thin film transistor of the defective sub-pixel and a high-potential power line.
Optionally, the step of turning off a signal receiving terminal of the driving thin film transistor of the defective sub-pixel includes: and disconnecting the electric connection between the driving thin film transistor and the sensing thin film transistor of the defective sub-pixel.
Optionally, the step of serially connecting a normal sub-pixel adjacent to the defective sub-pixel with the defective sub-pixel includes: and connecting the anode of the normal sub-pixel and the anode of the defective sub-pixel in series through a connection line.
Optionally, the step of performing brightness compensation on the normal sub-pixel and the defective sub-pixel includes:
confirming the coordinates of the defective sub-pixel in the pixel array;
confirming the coordinates of the normal sub-pixels in the pixel array;
and performing brightness compensation on the defective sub-pixel and the normal sub-pixel.
Optionally, the color of the defective sub-pixel is the same as that of the normal sub-pixel.
In order to achieve the above object, the present invention further provides a method for manufacturing an organic light emitting display panel, including:
forming an array substrate, wherein the array substrate comprises a plurality of driving thin film transistors which are arranged in an array;
forming an organic light emitting layer on the array substrate;
forming a pixel array on the organic light-emitting layer, wherein the pixel array comprises a plurality of sub-pixels arranged in an array, each sub-pixel comprises an organic light-emitting device, and the organic light-emitting device is electrically connected with a driving thin film transistor;
when the sub-pixels in the pixel array have display defects, the sub-pixels with the display defects are repaired by adopting the pixel repairing method.
Optionally, the step of forming the array substrate includes: and connecting the source drain layer of the driving thin film transistor of the defective sub-pixel in the pixel array with the source drain layer of the driving thin film transistor of the adjacent normal sub-pixel in series through a connecting wire.
Optionally, the step of forming the array substrate includes: and connecting the shading layer of the driving thin film transistor of the defective sub-pixel in the pixel array with the shading layer of the driving thin film transistor of the adjacent normal sub-pixel in series through a connecting wire.
The invention has the beneficial effects that when the sub-pixels in the pixel array are defective to form defective sub-pixels, the pixel repairing method can realize the repair of the defective sub-pixels by connecting the anodes of the defective sub-pixels and the anodes of the adjacent normal sub-pixels in series through arranging the connecting lines towards the signal receiving end for disconnecting the defective sub-pixels and combining the brightness compensation technology, so that the defective sub-pixels can normally emit light, the display brightness is consistent with that of the adjacent normal sub-pixels, the pseudo normalization of the defective sub-pixels is realized, the metal routing density in the pixel array can be reduced, the defect normalization repair caused by insufficient pixel space is avoided, the number of defect points in the organic light-emitting display panel product is reduced, and the product yield is improved.
Drawings
The technical solution and other advantages of the present invention will become apparent from the following detailed description of specific embodiments of the present invention, which is to be read in connection with the accompanying drawings.
Fig. 1 is a schematic structural diagram of two adjacent sub-pixels in a pixel array according to an exemplary embodiment of the present invention;
FIG. 2 is a circuit diagram of a first sub-pixel in an exemplary embodiment of the invention;
FIG. 3 is a schematic cross-sectional view of a first sub-pixel in an exemplary embodiment of the invention;
FIG. 4 is a flow chart of a pixel repair method provided by an exemplary embodiment of the invention;
FIG. 5 is a circuit diagram of a first sub-pixel in another exemplary embodiment of the invention;
FIG. 6 is a circuit diagram of a first sub-pixel in another exemplary embodiment of the invention;
FIG. 7 is a schematic cross-sectional view of a first sub-pixel in another exemplary embodiment of the invention;
fig. 8 is a schematic cross-sectional structure diagram of a first sub-pixel in a further exemplary embodiment of the invention.
The parts in the figure are numbered as follows:
100. the organic light emitting diode includes a pixel array, 110a, a light emitting region, 110b, a circuit region, 111 ', a first sub-pixel, 112, a second sub-pixel, 120, an organic light emitting device, 121, an anode, 122, an organic light emitting layer, 123, a cathode, 130, an array substrate, 131, a bottom plate, 132, a light shielding layer, 133, a buffer layer, 134, a passivation layer, 135, a planarization layer, 136, a pixel defining layer, 1371, an active layer, 1372, a gate insulating layer, 1373, a gate metal layer, 1374, a source metal layer, 1375, a drain metal layer, 140', 140 ″ and a connecting line.
Detailed Description
The technical solution in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
According to the pixel repairing method provided by the invention, when the sub-pixels in the pixel array have defects to form the defective sub-pixels, the anodes of the defective sub-pixels and the anodes of the adjacent normal sub-pixels are connected in series by arranging the connecting lines towards the signal receiving end for disconnecting the defective sub-pixels, and the repairing of the defective sub-pixels can be realized by combining a brightness compensation technology, so that the defective sub-pixels can normally emit light, the display brightness is consistent with that of the adjacent normal sub-pixels, the pseudo normalization of the defective sub-pixels is realized, the metal routing density in the pixel array can be reduced, the defect normalization repairing can be avoided due to insufficient pixel space, the number of defective points in an organic light-emitting display panel product is reduced, and the product yield is improved. As a typical application, the pixel repair method may be used for pixel repair in the fabrication process of an organic light emitting display panel, which may be used for a large-sized OLED display panel, such as an OLED display.
In an embodiment of the present invention, the pixel array 100 is a plurality of sub-pixels arranged in an array, fig. 1 is a schematic structural diagram of adjacent sub-pixels in the pixel array 100, in two sub-pixels shown in fig. 1, one sub-pixel is a first sub-pixel 111, and the other sub-pixel is a second sub-pixel 112, and each sub-pixel includes a light emitting area 110a and a circuit area 110b located outside the light emitting area 110 a.
Taking the first sub-pixel 111 as an example, the circuit diagram of the sub-pixels in the pixel array 100 is shown in fig. 2, and the first sub-pixel 111 includes a gate scan line GL, a data line DL, a high potential power line VDD, a low potential power line VSS, a switching thin film transistor T1, a driving thin film transistor T2, a capacitor C, and an organic light emitting device 120. The organic light emitting device 120 is positioned at the light emitting region 110a of the first sub-pixel 111, and the switching thin film transistor T1, the driving thin film transistor T2, and the capacitor C are positioned at the circuit region 110 b.
The gate of the switching thin film transistor T1 is electrically connected to the gate scan line GL, the source thereof is electrically connected to the data line DL, the drain thereof is electrically connected to the gate of the driving thin film transistor T2, the gate of the driving thin film transistor T2 is electrically connected to the drain of the switching thin film transistor T1, the source thereof is electrically connected to the high potential power line VDD, the drain thereof is electrically connected to the anode of the organic light emitting device 120, the cathode of the organic light emitting device 120 is electrically connected to the low potential power line, one end of the capacitor C is electrically connected to the drain of the switching thin film transistor T1, and the other end thereof is electrically connected to the source of the driving thin film transistor T2.
The switching thin film transistor T1 turns on a circuit by a gate signal supplied from the gate scan line GL and supplies a data voltage supplied from the data line DL to the driving thin film transistor T2, the driving thin film transistor T2 turns on by receiving the data voltage supplied from the switching thin film transistor T1 and generates a data current from power supplied from the high potential power line VDD to supply the data current to the organic light emitting device 120, and the organic light emitting device 120 emits light, i.e., the gate of the driving thin film transistor T2 is a voltage signal receiving terminal for receiving a data voltage signal and the source of the driving thin film transistor T2 is a current signal receiving terminal for receiving a data current signal. The capacitor C holds the data voltage supplied to the driving thin film transistor T2 during one frame.
Taking the first sub-pixel 111 as an example, a circuit diagram of sub-pixels in the pixel array 100 is shown in fig. 3, where the first sub-pixel 111 includes an array substrate 130 and an organic light emitting device 120 disposed on the array substrate 130.
The array substrate 130 includes a base plate 131, a light-shielding layer 132 formed on the base plate 131, a buffer layer 133 formed on the base plate 131, the light-shielding layer 132 covered by the buffer layer 133, a passivation layer 134 formed on the buffer layer 133, a planarization layer 135 formed on the passivation layer 134, and a pixel defining layer 136 formed on the planarization layer 135. The material of the light shielding layer 132 may be a metal having a light shielding effect, such as silver or aluminum. Each tft is correspondingly provided with a light-shielding layer 132.
The driving thin film transistor T2 is disposed in the array substrate 130, and the driving thin film transistor T2 includes an active layer 1371, a gate insulating layer 1372, a gate metal layer 1373, a source metal layer 1374, and a drain metal layer 1375. The source metal layer 1374 and the drain metal layer 1375 are arranged in the same layer to form a source drain layer.
The organic light emitting device 120 includes an anode 121, an organic light emitting layer 122, and a cathode 123 stacked on the pixel defining layer 136, and the anode 121 is electrically connected to the drain metal layer 1375 of the driving thin film transistor T2.
When the pixel array 100 has a defect, for example, the first sub-pixel 111 is not driven to emit light due to the disconnection of the line or the electrode, the first sub-pixel 111 forms a dark spot in the pixel array 100, which causes a dark spot defect, and referring to fig. 1 to 4, the method for repairing the first sub-pixel 111 which becomes the defective sub-pixel in this embodiment includes the following steps:
s101, when the first sub-pixel 111 in the pixel array 100 has a display defect to form a defective sub-pixel, referring to fig. 2, the voltage signal receiving terminal of the driving thin film transistor T2 of the first sub-pixel 111 (i.e. the defective sub-pixel) is disconnected, that is, the electrical connection between the gate of the driving thin film transistor T2 and the drain of the switching thin film transistor T1 is disconnected, specifically, the electrical connection between the drain of the switching thin film transistor T1 and the capacitor C is disconnected;
s102, referring to fig. 1, connecting the anode of the second sub-pixel 112 in series with the anode of the first sub-pixel 111 through the connection line 140; that is, referring to fig. 3, since the anode 121 of the first sub-pixel 111 and the anode (not shown) of the second sub-pixel 112 are disposed on the same layer and are both disposed on the pixel defining layer 136, a connection line 140 (also called long line technology) is grown on the pixel defining layer 136 by inkjet printing, one end of the connection line 140 is electrically connected to the anode 121 of the first sub-pixel 111, and the other end of the connection line 140 is electrically connected to the anode of the second sub-pixel 112, thereby forming a series connection of the first sub-pixel 111 and the second sub-pixel 112;
s103, performing brightness compensation on the second sub-pixel 112 (i.e. the normal sub-pixel) and the first sub-pixel 111 (i.e. the defective sub-pixel), wherein at this time, since the signal receiving terminal of the driving tft T2 of the first sub-pixel 111 is cut off, the organic light emitting device 120 in the first sub-pixel 111 is connected in series to the second sub-pixel 112, and thus, performing brightness compensation on the second sub-pixel 112 can achieve co-emission of the organic light emitting device in the second sub-pixel 112 and the organic light emitting device 120 in the first sub-pixel 111, and normalize the first sub-pixel 111 which becomes a dark spot.
Wherein, the connecting wire 140 is a conductive metal wire, preferably a silver wire, and the width of the connecting wire 140 is 3um to 25 um.
The method for performing brightness compensation on the first sub-pixel 111 and the second sub-pixel 112 includes the following steps:
s104, confirming the coordinates of the first sub-pixel 111 in the pixel array 100;
s105, confirming the coordinates of the second sub-pixel 112 in the pixel array 100;
s106, performing brightness compensation on the first sub-pixel 111 and the second sub-pixel 112, wherein the first sub-pixel 111 and the second sub-pixel 112 are connected in series, so that the resistance is increased, and the brightness compensation is performed by increasing the data voltage of the second sub-pixel 112 (i.e. the normal sub-pixel), or the brightness compensation is performed by increasing the data current of the second sub-pixel 112 (i.e. the normal sub-pixel).
In the present embodiment, the first sub-pixel 111 (i.e., the defective sub-pixel) and the second sub-pixel 112 (i.e., the normal sub-pixel) have the same color. In other implementations, the first sub-pixel 111 (i.e., the defective sub-pixel) is a different color than the second sub-pixel 112 (i.e., the normal sub-pixel).
The pixel repairing method provided by this embodiment only needs to grow a connecting line between the anode 121 of the first sub-pixel 111 (i.e. the defective sub-pixel) and the anode of the second sub-pixel 112 (i.e. the normal sub-pixel), so as to realize the series connection of the first sub-pixel 111 and the second sub-pixel 112, and realize the normalization of the defective sub-pixel, without disposing an anode bridging trace, which can reduce the pixel metal trace density and avoid the pixel space deficiency that the dark spot normalization repair cannot be performed. And then the shipment rate and the shipment grade of the organic light-emitting display panel products are improved, and the product yield is improved by 5-10%.
In order to improve the production efficiency, when one or more of the following three conditions are met, the pixel repair provided by the invention is adopted to repair the defective sub-pixel:
1) when the number of the defective sub-pixels in the pixel array defined by a circle with the diameter of 10cm is more than or equal to 1, repairing the defective sub-pixels;
2) when the total number of the defective sub-pixels in the pixel array is greater than or equal to 10, repairing the defective sub-pixels;
3) and when 3 or 4 continuous defect sub-pixels exist in the pixel array, repairing the defect sub-pixels.
As another implementation manner of the present invention, referring to fig. 5, in the step S101, the current signal receiving end of the driving thin film transistor T2 of the first sub-pixel 111 (i.e., the defective sub-pixel) may be selectively cut off, that is, the source of the driving thin film transistor T2 is electrically disconnected from the high potential power line VDD. As another implementation manner, in the step S101, it is selectable to simultaneously cut off the voltage signal receiving terminal of the driving thin film transistor T2 of the first sub-pixel 111 and the current signal receiving terminal of the driving thin film transistor T2 of the first sub-pixel 111.
In another embodiment of the present invention, a circuit diagram of the first sub-pixel 111 'is shown in fig. 6, and the first sub-pixel 111' includes a gate scan line GL, a data line DL, a high potential power line VDD, a low potential power line VSS, a switching thin film transistor T1, a driving thin film transistor T2, a capacitor C, a sensing thin film transistor T3, a reference line Ref, and an organic light emitting device 120. The organic light emitting device 120 is positioned at the light emitting region 110a of the first subpixel 111, and the switching thin film transistor T1, the driving thin film transistor T2, the capacitor C, and the sensing thin film transistor T3 are positioned at the circuit region 110 b.
The gate of the switching thin film transistor T1 is electrically connected to the gate scan line GL, the source thereof is electrically connected to the data line DL, the drain thereof is electrically connected to the gate of the driving thin film transistor T2, the gate of the driving thin film transistor T2 is electrically connected to the drain of the switching thin film transistor T1, the source thereof is electrically connected to the high potential power line VDD, the drain thereof is electrically connected to the anode of the organic light emitting device 120, the cathode of the organic light emitting device 120 is electrically connected to the low potential power line, one end of the capacitor C is electrically connected to the drain of the switching thin film transistor T1, the other end thereof is electrically connected to the drain of the driving thin film transistor T2, the gate of the sensing thin film transistor T3 is electrically connected to the gate scan line GL, the source thereof is electrically connected to the drain of the driving thin film transistor T2, and the drain thereof is electrically connected to the reference line Ref.
The sensing thin film transistor T3 is used to sense a threshold voltage Vth deviation of the driving thin film transistor T2 causing image quality degradation, and sensing of the threshold voltage deviation is performed in a sensing mode. The sensing thin film transistor T3 supplies a current for driving the thin film transistor T2 to the reference line Ref in response to a sensing control signal supplied through the gate scan line GL.
In this embodiment, the signal receiving terminal of the driving tft T2 further includes a source connection terminal connected to the sensing tft T3, and when the first sub-pixel 111 is repaired, the source connection terminals of the driving tft T2 and the sensing tft T3 are also cut off.
When performing the brightness compensation for the second sub-pixel 112, after acquiring the coordinates of the first sub-pixel 111 and the second sub-pixel 112, the brightness compensation for the first sub-pixel 111 and the second sub-pixel 112 with the dark point normalized can be performed by the threshold voltage Vth compensation provided by the reference line Ref in the second sub-pixel 112 and the Demura process.
Meanwhile, the invention also provides a manufacturing method of the organic light-emitting display panel, which comprises the following steps:
s100a, forming an array substrate 130, wherein the array substrate 130 includes a bottom plate 131, a light-shielding layer 132 formed on the bottom plate 131, a buffer layer 133 formed on the bottom plate 131, the buffer layer 133 covering the light-shielding layer 132, a passivation layer 134 formed on the buffer layer 133, a planarization layer 135 formed on the passivation layer 134, and a pixel defining layer 136 formed on the planarization layer 135. The thin film transistor array includes a driving thin film transistor T2, and the driving thin film transistor T2 includes an active layer 1371, a gate insulating layer 1372, a gate metal layer 1373, a source metal layer 1374, and a drain metal layer 1375. The active layer 1371 is formed on the buffer layer 133 and above the light-shielding layer 132, the gate insulating layer 1372 is formed on the active layer 1371, the gate metal layer 1373 is formed on the gate insulating layer 1372, and the source metal layer 1374 and the drain metal layer 1375 are electrically connected to the active layer 1371, respectively. The source metal layer 1374 and the drain metal layer 1375 are arranged on the passivation layer 134 in the same layer to form a source drain layer;
s100b, forming an organic light emitting layer on the array substrate 130;
s100c, forming a pixel array 100 on the organic light emitting layer, where the pixel array 100 includes a plurality of sub-pixels arranged in an array, one of the sub-pixels includes an organic light emitting device 120, and an anode of the organic light emitting device 120 is electrically connected to a drain of the driving thin film transistor T2;
s100d, when the first sub-pixel 111 in the pixel array 100 has a display defect to form a defective sub-pixel, the first sub-pixel 111 is repaired by the pixel repairing method described in the steps S101 to S106.
In another embodiment of the present invention, referring to fig. 7, in the process of forming the array substrate 130, if a defect is found in the process of forming the light-shielding Layer 132(LS Layer) of the first sub-pixel 111, the light-shielding Layer 132 of the first sub-pixel 111 (i.e., the defective sub-pixel) and the light-shielding Layer 132 of the second sub-pixel 112 (i.e., the normal sub-pixel adjacent to the defective sub-pixel) may be connected in series by the connection line 140' for repair. The connection lines 140' may be grown on the bottom plate 131 by a long line technology.
In still another embodiment of the present invention, referring to fig. 8, in the process of forming the array substrate 130, if a defect is found in the process of forming the source drain Layer (SD Layer) of the first subpixel 111, the source drain Layer (source metal Layer 1374 and/or drain metal Layer 1375) of the first subpixel 111 (i.e., the defective subpixel) and the source drain Layer (source metal Layer and/or drain metal Layer) of the second subpixel 112 (i.e., the normal subpixel adjacent to the defective subpixel) may be connected in series through the connection line 140 ″ for repair. The connection line 140 "may be grown on the passivation layer 134 by a long line technique.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that various modifications and embellishments can be made by those skilled in the art without departing from the principle of the present invention, and these should be construed as the protection scope of the present invention.

Claims (10)

1. A pixel repair method, comprising:
when a sub-pixel in the pixel array has a display defect to form a defective sub-pixel, disconnecting a signal receiving end of a driving thin film transistor of the defective sub-pixel;
connecting a normal sub-pixel adjacent to the defective sub-pixel in series with the defective sub-pixel;
and performing brightness compensation on the normal sub-pixel and the defective sub-pixel.
2. The pixel repairing method according to claim 1, wherein the step of turning off a signal receiving terminal of the driving thin film transistor of the defective sub-pixel comprises: and disconnecting the electric connection between the driving thin film transistor of the defective sub-pixel and the data line.
3. The pixel repairing method according to claim 2, wherein the step of turning off a signal receiving terminal of the driving thin film transistor of the defective sub-pixel comprises: and disconnecting the electric connection between the driving thin film transistor of the defective sub-pixel and a high-potential power line.
4. A pixel repairing method according to claim 3, wherein said step of turning off a signal receiving terminal of a driving thin film transistor of the defective sub-pixel comprises: and disconnecting the electric connection between the driving thin film transistor and the sensing thin film transistor of the defective sub-pixel.
5. The pixel repairing method according to claim 4, wherein the step of connecting a normal sub-pixel adjacent to the defective sub-pixel in series with the defective sub-pixel comprises: and connecting the anode of the normal sub-pixel and the anode of the defective sub-pixel in series through a connecting line.
6. The pixel repair method according to claim 5,
the step of performing brightness compensation on the normal sub-pixel and the defective sub-pixel includes:
confirming the coordinates of the defective sub-pixel in the pixel array;
confirming the coordinates of the normal sub-pixels in the pixel array;
and performing brightness compensation on the defective sub-pixel and the normal sub-pixel.
7. The pixel repairing method according to claim 6, wherein the defective sub-pixel is the same color as the normal sub-pixel.
8. A method for manufacturing an organic light emitting display panel includes:
forming an array substrate, wherein the array substrate comprises a plurality of driving thin film transistors which are arranged in an array;
forming an organic light emitting layer on the array substrate;
forming a pixel array on the organic light-emitting layer, wherein the pixel array comprises a plurality of sub-pixels arranged in an array, each sub-pixel comprises an organic light-emitting device, and the organic light-emitting device is electrically connected with a driving thin film transistor;
when a display defect occurs in a sub-pixel in the pixel array, repairing the sub-pixel with the display defect by using the pixel repairing method according to any one of claims 1 to 7.
9. The method of claim 8, wherein the forming the array substrate comprises: and connecting the source drain layer of the driving thin film transistor of the defective sub-pixel in the pixel array with the source drain layer of the driving thin film transistor of the adjacent normal sub-pixel in series through a connecting wire.
10. The method of claim 8, wherein the forming the array substrate comprises: and connecting the shading layer of the driving thin film transistor of the defective sub-pixel in the pixel array with the shading layer of the driving thin film transistor of the adjacent normal sub-pixel in series through a connecting wire.
CN202210124540.5A 2022-02-10 2022-02-10 Pixel repairing method and manufacturing method of organic light-emitting display panel Pending CN114551543A (en)

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CN202210124540.5A CN114551543A (en) 2022-02-10 2022-02-10 Pixel repairing method and manufacturing method of organic light-emitting display panel

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Application Number Priority Date Filing Date Title
CN202210124540.5A CN114551543A (en) 2022-02-10 2022-02-10 Pixel repairing method and manufacturing method of organic light-emitting display panel

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