CN114548247A - Data analysis method and device and electronic equipment - Google Patents
Data analysis method and device and electronic equipment Download PDFInfo
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- CN114548247A CN114548247A CN202210131905.7A CN202210131905A CN114548247A CN 114548247 A CN114548247 A CN 114548247A CN 202210131905 A CN202210131905 A CN 202210131905A CN 114548247 A CN114548247 A CN 114548247A
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- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
Abstract
A data analysis method, a data analysis device and an electronic device are provided, wherein the method comprises the following steps: the method comprises the steps of obtaining configuration parameters and attribute labels of a first chip, controlling the second chip to be connected to a preset circuit board when the configuration parameters are configured on a second chip, collecting electric signals of all sensors corresponding to the second chip based on the attribute labels, detecting all the electric signals in a preset detection mode, obtaining detection results of all the electric signals, and determining the working states of the sensors corresponding to all the electric signals respectively based on the detection results. By the method, the electric signals of the sensors corresponding to the second chip are acquired based on the attribute labels, so that the main system equipment can acquire the electric signals of the sensors of different types at the same time, and the sensors can be detected in real time without influencing the work of the sensors in the process of acquiring the electric signals of the sensors, so that the accuracy of the detected working state of the sensors is ensured.
Description
Technical Field
The application relates to the technical field of internet of things and industrial internet, in particular to a data analysis method and device and electronic equipment.
Background
With the development of industrial internet, the market increases the requirements for technical automation and intellectualization, the types and the number of sensors for realizing the requirements also increase, all the sensors are accessed into a main system device, when a certain sensor is attacked, the sensor corresponding to the sensor is attacked, and the attacked sensor is in an abnormal working state.
In order to detect whether a sensor is in an abnormal working state, currently, a method is adopted to detect whether communication data generated by each sensor on a main system device respectively contains abnormal communication data, when the communication data generated by the sensor contains the abnormal communication data, the sensor is determined to be in the abnormal working state, however, the communication data of the sensor depends on the strength of a network signal, when the network signal is unstable, if the sensor is in the abnormal working state, the main system device cannot acquire the communication data of the sensor in time, the sensor in the abnormal working state cannot be detected in time, and moreover, the method for analyzing the working state of the sensor based on the communication data of the sensor is too single, and when the sensor is in the working state, the communication data is only partial data in the data generated by the sensor, therefore, analyzing the operating state of the sensor based on the communication data of the sensor may result in inaccurate analysis of the operating state of the sensor.
Disclosure of Invention
The application provides a data analysis method, a data analysis device and electronic equipment, the chips are classified through attribute labels, main system equipment accessed by each sensor can analyze electric signals of multiple types of sensors at the same time, configuration parameters of a first chip are configured on a second chip, the second chip is accessed into a preset circuit board, in the process of detecting the electric signals of the sensors, when the sensors break down or are attacked, abnormal electric signals of the sensors can be determined in time, the accuracy of the working state of the sensors determined based on the electric signals is further ensured, meanwhile, the whole communication of the preset circuit board is not influenced, and the data analysis method can be suitable for the analysis work of all circuit boards.
In a first aspect, the present application provides a data analysis method, the method comprising:
obtaining configuration parameters and an attribute tag of a first chip, wherein the attribute tag comprises time for obtaining the configuration parameters and a name of a sensor to which the first chip belongs;
when the configuration parameters are configured on a second chip, controlling the second chip to be connected to a preset circuit board, and acquiring electric signals of each sensor corresponding to the second chip based on the attribute tags;
and detecting each electric signal in a preset detection mode to obtain a detection result of each electric signal, and determining the working state of the sensor corresponding to each electric signal based on the detection result.
In one possible design, obtaining configuration parameters for a first chip includes:
extracting corresponding use configuration data of the first chip to obtain configuration parameters of the first chip; or
And obtaining configuration parameters of the first chip based on all pin parameters of the first chip.
In one possible design, obtaining configuration parameters of the first chip based on all pin parameters of the first chip includes:
sending communication data to pins of at least one other chip based on the pins of the first chip;
when the communication reply data returned by the other chips is determined to be consistent with the preset reply data of the pin of the first chip, determining the pin parameters of the pin, wherein the pin parameters comprise pin voltage, bit rate and pin type;
sequentially traversing all pins of the first chip to obtain pin parameters corresponding to the pins respectively;
and obtaining configuration parameters of the first chip based on the pin parameters respectively corresponding to the pins, wherein the configuration parameters are a set of all the pin parameters.
In one possible design, detecting each electrical signal in a preset detection mode to obtain a detection result of each electrical signal includes:
extracting digital sequences corresponding to the electric signals respectively, and detecting whether the digital sequences are in a preset digital sequence set or not;
when the preset digital sequence set does not contain the digital sequence, determining the detection result of the electric signal corresponding to the digital sequence as an abnormal electric signal; or
And when the preset digital sequence set comprises the digital sequence, determining that the detection result of the electric signal corresponding to the digital sequence is a normal electric signal.
In a possible design, detecting each electrical signal in a preset detection mode to obtain a detection result of each electrical signal, further comprising:
calculating bit rates corresponding to the electric signals respectively, and detecting whether the bit rates are within a preset range or not, wherein the bit rates represent the number of bits transmitted in unit time;
when the bit rate is determined to be within the preset range, taking the electric signal corresponding to the bit rate as a normal electric signal; or
And when the bit rate is determined not to be in the preset range, taking the electric signal corresponding to the bit rate as an abnormal electric signal.
In one possible design, and based on the detection result, determining the operating state of the sensor corresponding to each electrical signal includes:
when the electric signal is a normal electric signal, determining that the working state of the sensor corresponding to the electric signal is a normal working state; or
And when the electric signal is an abnormal electric signal, determining that the working state of the sensor corresponding to the electric signal is an abnormal working state.
In a second aspect, the present application provides a data analysis apparatus, the apparatus comprising:
the acquisition module is used for acquiring configuration parameters and attribute labels of the first chip;
the acquisition module is used for controlling the second chip to be connected to a preset circuit board when the configuration parameters are configured on the second chip, and acquiring the electric signals of each sensor corresponding to the second chip based on the attribute tags;
and the determining module is used for detecting each electric signal in a preset detection mode, obtaining the detection result of each electric signal and determining the working state of the sensor corresponding to each electric signal based on the detection result.
In a possible design, the obtaining module is specifically configured to extract corresponding usage configuration data of the first chip, obtain configuration parameters of the first chip, and obtain the configuration parameters of the first chip based on all pin parameters of the first chip.
In a possible design, the obtaining module is further configured to send communication data to pins of at least one other chip based on the pins of the first chip, determine pin parameters of the pins when it is determined that communication reply data returned by the other chips is consistent with preset reply data of the pins of the first chip, sequentially traverse all the pins of the first chip, obtain pin parameters corresponding to each pin, and obtain configuration parameters of the first chip based on the pin parameters corresponding to each pin, where the configuration parameters are a set of all the pin parameters.
In a possible design, the determining module is specifically configured to extract digital sequences corresponding to the electrical signals, detect whether the digital sequences are in a preset digital sequence set, determine that a detection result of the electrical signal corresponding to the digital sequence is an abnormal electrical signal when the preset digital sequence set does not include the digital sequence, or determine that the detection result of the electrical signal corresponding to the digital sequence is a normal electrical signal when the preset digital sequence set includes the digital sequence.
In a possible design, the determining module is further configured to calculate bit rates corresponding to the electrical signals, detect whether the bit rates are within a preset range, and if the bit rates are determined to be within the preset range, use the electrical signals corresponding to the bit rates as normal electrical signals, or if the bit rates are not within the preset range, use the electrical signals corresponding to the bit rates as abnormal electrical signals.
In a possible design, the determining module is further configured to determine that the working state of the sensor corresponding to the electrical signal is a normal working state when the electrical signal is a normal electrical signal, or determine that the working state of the sensor corresponding to the electrical signal is an abnormal working state when the electrical signal is an abnormal electrical signal.
In a third aspect, the present application provides an electronic device, comprising:
a memory for storing a computer program;
and the processor is used for realizing the steps of the data analysis method when executing the computer program stored in the memory.
In a fourth aspect, a computer-readable storage medium has stored therein a computer program which, when executed by a processor, implements a data analysis method step as described above.
For each of the first to fourth aspects and possible technical effects of each aspect, please refer to the above description of the possible technical effects for the first aspect or each possible solution in the first aspect, and no repeated description is given here.
Drawings
FIG. 1 is a flow chart of the steps of a data analysis method provided herein;
fig. 2 is a schematic structural diagram of a data analysis apparatus provided in the present application;
fig. 3 is a schematic structural diagram of an electronic device provided in the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be described in further detail with reference to the accompanying drawings. The particular methods of operation in the method embodiments may also be applied to apparatus embodiments or system embodiments. It should be noted that "a plurality" is understood as "at least two" in the description of the present application. "and/or" describes the association relationship of the associated object, indicating that there may be three relationships, for example, a and/or B, which may indicate: a exists alone, A and B exist simultaneously, and B exists alone. A is connected with B and can represent: a and B are directly connected and A and B are connected through C. In addition, in the description of the present application, the terms "first," "second," and the like are used for descriptive purposes only and are not intended to indicate or imply relative importance nor order to be construed.
In the prior art, in order to detect whether the sensor is in an abnormal working state, a mode is adopted that whether abnormal communication data is included in communication data generated by each sensor on a main system device is detected, when the communication data generated by the sensor is determined to include the abnormal communication data, the sensor can be determined to be in the abnormal working state, however, the communication data of the sensor depends on the strength of a network signal, when the network signal is unstable, if the sensor is in the abnormal working state, the main system device cannot timely acquire the communication data of the sensor, the sensor in the abnormal working state cannot be timely detected, and when the sensor is in the working state, the communication data is only partial data in the data generated by the sensor, therefore, the working state of the sensor is analyzed based on the communication data of the sensor, this will result in inaccurate analysis of the operating state of the sensor.
In order to solve the above problem, embodiments of the present application provide a data analysis method, so as to implement accurate analysis of the working state of the sensor, so that a detection result of determining the working state of the sensor does not depend on a network signal. The method and the device in the embodiment of the application are based on the same technical concept, and because the principles of the problems solved by the method and the device are similar, the device and the embodiment of the method can be mutually referred, and repeated parts are not repeated.
The embodiments of the present application will be described in detail below with reference to the accompanying drawings.
Referring to fig. 1, the present application provides a data analysis method, which can ensure the accuracy of the detected operating state of a sensor and can detect the operating state of the sensor without depending on a network signal, and the method is implemented as follows:
step S1: and obtaining configuration parameters and attribute labels of the first chip.
The embodiment of the application determines the working state of the sensor through the electric signal of the sensor, in order to be able to detect the electric signal of the sensor, avoid that the sensor breaks down in the working state or the sensor is attacked, detect the abnormal electric signal of the sensor in time, the detection circuit needs to be distinguished from the sensor circuit, the first chip is in the sensor, therefore, the configuration parameter of the first chip needs to be copied to the second chip, firstly, the configuration parameter of the first chip needs to be obtained, there are two ways to obtain the first configuration parameter, the concrete way is as follows:
the first method is as follows: the main system device directly reads the corresponding use configuration data of the first chip and then obtains the configuration parameters of the first chip from the use configuration data.
The second method comprises the following steps: and obtaining configuration parameters of the first chip based on the pin parameters of the pins of the first chip.
In order to obtain the pin parameters of each pin of the first chip, taking a pin in the first chip to obtain the pin parameters as an example, the pin needs to send communication data to at least one pin of another chip, after the pin of another chip receives the communication data sent by the first chip, a communication reply data is generated based on the communication data, the communication reply data is sent to the pin of the first chip, the pin compares the communication reply data with a preset reply data, when the communication reply data is consistent with the preset reply data, the pin parameters can be analyzed from the communication reply data by the pin of the first chip, the pin parameters include pin voltage, bit rate and pin type, the bit rate is the number of bits transmitted in unit time, the above-described steps are repeated, and the pin parameters of each pin of the first chip can be obtained, and generating configuration parameters of the first chip based on all the pin parameters of the first chip, wherein the configuration parameters are a set of all the pin parameters.
It should be further noted that, after the above description of obtaining the configuration parameters, the embodiments of the present application can also implement detection of multiple types of sensors at the same time, and since each type of sensor is involved, it is necessary to distinguish the sensors of the various types by using the attribute tags, where the attribute tags may be the time of obtaining the configuration parameters of the first chip and the name of the sensor to which the first chip belongs.
Step S2: and when the configuration parameters are configured on a second chip, controlling the second chip to be accessed to a preset circuit board, and acquiring the electric signals of each sensor corresponding to the second chip based on the attribute tags.
In the above description, the configuration parameters and the attribute tags of the first chip are obtained, when the electrical signal of the sensor is detected, in order to avoid that the detection of the electrical signal of the sensor is not affected by a fault when the sensor fails, the second chip for detecting the electrical signal needs to be accessed to the preset circuit board, then the second chip and the preset circuit board are accessed to the sensor or the main system device together, the second chip is accessed to the preset circuit board by accessing the preset circuit board in a flying wire manner on the basis of the reproducible physical characteristics of the electrical signal, and other ways of accessing the second chip to the preset circuit board will not be specifically described here.
After the second chip and the preset circuit board are connected to the sensor together, the electrical signals of the sensor need to be acquired based on the attribute tag, and since the attribute tag includes the time for obtaining the configuration parameters of the first chip and the name of the sensor to which the first chip belongs, in order to avoid acquiring the electrical signals of the sensor, the sensors are randomly acquired by using the time and the name of the sensor in the attribute tag, and the specific classification conditions are shown in table 1:
TABLE 1
In table 1, only the electrical signals respectively acquired by the 4 sensors at 3 different time nodes are described, for each sensor, the electrical signals acquired by the 3 different time nodes may be the same or different, and may be determined according to actual conditions, the time for acquiring the electrical signals may be adjusted according to actual conditions, the types and the number of the sensors are also determined according to actual conditions, and the electrical signals acquired by the other sensors at different time nodes refer to an example of any one of the sensors in table 1, which is not specifically set forth herein.
By the method, in the process of collecting the electric signals of the sensors, the electric signals are classified based on the time dimension and the angle of each sensor name, and when the abnormal electric signals are determined, a certain time node and a certain sensor can be rapidly determined, so that the working state of the sensor can be rapidly determined.
Step S3: and detecting each electric signal in a preset detection mode to obtain a detection result of each electric signal, and determining the working state of the sensor corresponding to each electric signal based on the detection result.
The above describes how to collect the electrical signal of the sensor, and here, it will be explained how to collect the electrical signal of the sensor, and collecting the electrical signal of the sensor needs to ensure that the sensor is in the working state, and after determining that the sensor is in the working state, the electrical signal of the sensor is specifically analyzed in the following manner:
the first method is as follows: the digital sequence corresponding to the electric signal analyzed from the collected electric signal is as follows: 101010, indicating as high level, and 0 as low level, after obtaining the digital sequence of the electrical signal, matching the digital sequence with a preset digital sequence in a preset digital sequence set, when the matched digital sequence is consistent with the preset digital sequence, taking the electrical signal corresponding to the digital sequence as a normal electrical signal, and when the matched digital sequence is inconsistent with the preset digital sequence, taking the electrical signal corresponding to the digital sequence as an abnormal electrical signal.
The second method comprises the following steps: the bit rate of each electrical signal is calculated, and the method of calculating the bit rate is well known to those skilled in the art, and therefore, the method of calculating the bit rate will not be described here, for example: the bit rate is 115200 (bits/second), after determining the bit rate of each electrical signal, detecting whether each bit rate is within a preset range, when the bit rate is within the preset range, regarding the electrical signal corresponding to the bit rate as a normal electrical signal, and when the bit rate is outside the preset range, regarding the electrical signal corresponding to the bit rate as an abnormal electrical signal.
Based on the above description of the electrical signal of the sensor, it can be known that there are two detection results of the electrical signal of the sensor, one is a normal electrical signal, and the other is an abnormal electrical signal.
Through the description, the configuration parameters of the first chip are configured in the second chip, the second chip and the preset circuit board are connected into the sensor together, and the sensor is used for detecting the electric signals of the sensor, so that the situation that the electric signals of the sensor are not influenced by the working state of the sensor in the process of detecting the electric signals of the sensor is ensured, the efficiency of detecting the working state of the sensor is improved, in the process of detecting the working state of the sensor, the electric signals are collected based on the amount classification of the attribute labels, when the sensor is determined to be in the abnormal working state, a specific certain sensor can be rapidly determined, and the accuracy of detecting the working state of the sensor is improved.
Based on the same inventive concept, an embodiment of the present application further provides a data analysis apparatus, where the thread binding apparatus is used to implement a function of a data analysis method, and with reference to fig. 2, the apparatus includes:
an obtaining module 201, configured to obtain configuration parameters and an attribute tag of a first chip;
the acquisition module 202 is configured to, when the configuration parameter is configured on a second chip, control the second chip to access a preset circuit board, and acquire electrical signals of each sensor corresponding to the second chip based on the attribute tag;
the determining module 203 is configured to detect each electrical signal in a preset detection manner, obtain a detection result of each electrical signal, and determine a working state of a sensor corresponding to each electrical signal based on the detection result.
In a possible design, the obtaining module 201 is specifically configured to extract corresponding use configuration data of the first chip, obtain configuration parameters of the first chip, and obtain the configuration parameters of the first chip based on all pin parameters of the first chip.
In a possible design, the obtaining module 201 is further configured to send communication data to pins of at least one other chip based on the pins of the first chip, determine pin parameters of the pins when it is determined that communication reply data returned by the other chips is consistent with preset reply data of the pins of the first chip, sequentially traverse all the pins of the first chip, obtain pin parameters corresponding to each pin, and obtain configuration parameters of the first chip based on the pin parameters corresponding to each pin, where the configuration parameters are a set of all the pin parameters.
In a possible design, the determining module 203 is specifically configured to extract digital sequences corresponding to the electrical signals, detect whether the digital sequences are in a preset digital sequence set, determine that a detection result of the electrical signal corresponding to the digital sequence is an abnormal electrical signal when the preset digital sequence set does not include the digital sequence, or determine that a detection result of the electrical signal corresponding to the digital sequence is a normal electrical signal when the preset digital sequence set includes the digital sequence.
In a possible design, the determining module 203 is further configured to calculate bit rates corresponding to the electrical signals, detect whether the bit rates are within a preset range, and if the bit rates are determined to be within the preset range, use the electrical signals corresponding to the bit rates as normal electrical signals, or if the bit rates are not within the preset range, use the electrical signals corresponding to the bit rates as abnormal electrical signals.
In a possible design, the determining module is further configured to determine that the working state of the sensor corresponding to the electrical signal is a normal working state when the electrical signal is a normal electrical signal, or determine that the working state of the sensor corresponding to the electrical signal is an abnormal working state when the electrical signal is an abnormal electrical signal.
Based on the same inventive concept, an embodiment of the present application further provides an electronic device, where the electronic device can implement the function of the foregoing data analysis apparatus, and with reference to fig. 3, the electronic device includes:
at least one processor 301 and a memory 302 connected to the at least one processor 301, in this embodiment, a specific connection medium between the processor 301 and the memory 302 is not limited, and fig. 3 illustrates an example where the processor 301 and the memory 302 are connected through a bus 300. The bus 300 is shown in fig. 3 by a thick line, and the connection manner between other components is only for illustrative purposes and is not limited thereto. The bus 300 may be divided into an address bus, a data bus, a control bus, etc., and is shown with only one thick line in fig. 3 for ease of illustration, but does not represent only one bus or type of bus. Alternatively, the processor 301 may also be referred to as a controller, without limitation to name a few.
In the embodiment of the present application, the memory 302 stores instructions executable by the at least one processor 301, and the at least one processor 301 can execute the method of data analysis discussed above by executing the instructions stored in the memory 302. The processor 301 may implement the functions of the various modules in the apparatus shown in fig. 2.
The processor 301 is a control center of the apparatus, and may connect various parts of the entire control device by using various interfaces and lines, and perform various functions of the apparatus and process data by operating or executing instructions stored in the memory 302 and calling up data stored in the memory 302, thereby performing overall monitoring of the apparatus.
In one possible design, processor 301 may include one or more processing units, and processor 301 may integrate an application processor that primarily handles operating systems, user interfaces, application programs, and the like, and a modem processor that primarily handles wireless communications. It will be appreciated that the modem processor described above may not be integrated into the processor 301. In some embodiments, the processor 301 and the memory 302 may be implemented on the same chip, or in some embodiments, they may be implemented separately on separate chips.
The processor 301 may be a general-purpose processor, such as a Central Processing Unit (CPU), digital signal processor, application specific integrated circuit, field programmable gate array or other programmable logic device, discrete gate or transistor logic, discrete hardware components, or the like, that may implement or perform the methods, steps, and logic blocks disclosed in embodiments of the present application. A general purpose processor may be a microprocessor or any conventional processor or the like. The steps of a data analysis method disclosed in connection with the embodiments of the present application may be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules in the processor.
The processor 301 is programmed to solidify the code corresponding to the data analysis method described in the foregoing embodiment into the chip, so that the chip can perform the steps of the data analysis of the embodiment shown in fig. 1 when running. How to program the processor 301 is well known to those skilled in the art and will not be described herein.
Based on the same inventive concept, the present application also provides a storage medium storing computer instructions, which when run on a computer, cause the computer to execute a data analysis method as discussed above.
In some possible embodiments, the various aspects of a method of data analysis provided herein may also be embodied in the form of a program product comprising program code for causing a control apparatus to perform the steps of a method of data analysis according to various exemplary embodiments of the present disclosure as described above in this specification when the program product is run on a device.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A method of data analysis, comprising:
obtaining configuration parameters and an attribute tag of a first chip, wherein the attribute tag comprises time for obtaining the configuration parameters and a name of a sensor to which the first chip belongs;
when the configuration parameters are configured on a second chip, controlling the second chip to be connected to a preset circuit board, and acquiring electric signals of each sensor corresponding to the second chip based on the attribute tags;
and detecting each electric signal in a preset detection mode to obtain a detection result of each electric signal, and determining the working state of the sensor corresponding to each electric signal based on the detection result.
2. The method of claim 1, wherein obtaining configuration parameters for the first chip comprises:
extracting corresponding use configuration data of the first chip to obtain configuration parameters of the first chip; or
And obtaining configuration parameters of the first chip based on all pin parameters of the first chip.
3. The method of claim 2, wherein obtaining configuration parameters for the first chip based on all pin parameters of the first chip comprises:
sending communication data to pins of at least one other chip based on the pins of the first chip;
when the communication reply data returned by the other chips is determined to be consistent with the preset reply data of the pin of the first chip, determining the pin parameters of the pin, wherein the pin parameters comprise pin voltage, bit rate and pin type;
sequentially traversing all pins of the first chip to obtain pin parameters corresponding to the pins respectively;
and obtaining configuration parameters of the first chip based on the pin parameters corresponding to the pins respectively, wherein the configuration parameters are a set of all the pin parameters.
4. The method of claim 1, wherein detecting each electrical signal in a predetermined detection manner to obtain a detection result of each electrical signal comprises:
extracting digital sequences corresponding to the electric signals respectively, and detecting whether the digital sequences are in a preset digital sequence set or not;
when the preset digital sequence set does not contain the digital sequence, determining the detection result of the electric signal corresponding to the digital sequence as an abnormal electric signal; or
And when the preset digital sequence set comprises the digital sequences, determining the detection result of the electric signals corresponding to the digital sequences as normal electric signals.
5. The method of claim 1, wherein each electrical signal is detected in a predetermined detection manner to obtain a detection result of each electrical signal, further comprising:
calculating bit rates corresponding to the electric signals respectively, and detecting whether the bit rates are within a preset range or not, wherein the bit rates represent the number of bits transmitted in unit time;
when the bit rate is determined to be within the preset range, taking the electric signal corresponding to the bit rate as a normal electric signal; or
And when the bit rate is determined not to be in the preset range, taking the electric signal corresponding to the bit rate as an abnormal electric signal.
6. The method of claim 1, wherein determining the operating state of the sensor corresponding to each electrical signal based on the detection result comprises:
when the electric signal is a normal electric signal, determining that the working state of the sensor corresponding to the electric signal is a normal working state; or
And when the electric signal is an abnormal electric signal, determining that the working state of the sensor corresponding to the electric signal is an abnormal working state.
7. A data analysis apparatus, comprising:
the acquisition module is used for acquiring configuration parameters and attribute labels of the first chip;
the acquisition module is used for controlling the second chip to be connected to a preset circuit board when the configuration parameters are configured on the second chip, and acquiring the electric signals of each sensor corresponding to the second chip based on the attribute tags;
and the determining module is used for detecting each electric signal in a preset detection mode, obtaining the detection result of each electric signal and determining the working state of the sensor corresponding to each electric signal based on the detection result.
8. The apparatus of claim 7, wherein the obtaining module is specifically configured to extract usage configuration data corresponding to the first chip, obtain configuration parameters of the first chip, and obtain the configuration parameters of the first chip based on all pin parameters of the first chip.
9. An electronic device, comprising:
a memory for storing a computer program;
a processor for implementing the method steps of any one of claims 1-6 when executing the computer program stored on the memory.
10. A computer-readable storage medium, characterized in that a computer program is stored in the computer-readable storage medium, which computer program, when being executed by a processor, carries out the method steps of any one of claims 1-6.
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| CN202210131905.7A CN114548247A (en) | 2022-02-14 | 2022-02-14 | Data analysis method and device and electronic equipment |
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| CN202210131905.7A CN114548247A (en) | 2022-02-14 | 2022-02-14 | Data analysis method and device and electronic equipment |
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