CN114519169A - Production line beat qualification rate statistical method, intelligent terminal and storage device - Google Patents
Production line beat qualification rate statistical method, intelligent terminal and storage device Download PDFInfo
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- CN114519169A CN114519169A CN202011295613.4A CN202011295613A CN114519169A CN 114519169 A CN114519169 A CN 114519169A CN 202011295613 A CN202011295613 A CN 202011295613A CN 114519169 A CN114519169 A CN 114519169A
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- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
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- G06F7/48—Methods or arrangements for performing computations using exclusively denominational number representation, e.g. using binary, ternary, decimal representation using non-contact-making devices, e.g. tube, solid state device; using unspecified devices
- G06F7/52—Multiplying; Dividing
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- G06Q10/0633—Workflow analysis
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- G—PHYSICS
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- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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- G06Q10/06—Resources, workflows, human or project management; Enterprise or organisation planning; Enterprise or organisation modelling
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- G06Q10/06395—Quality analysis or management
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06Q—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL OR SUPERVISORY PURPOSES, NOT OTHERWISE PROVIDED FOR
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- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Abstract
The application discloses statistical method, intelligent terminal and device that have a memory function of production line beat qualification rate, this method includes: acquiring the primary yield and the unplanned shutdown loss rate of each process in a production line within a set period; calculating the pass rate of the process beat of each process by using the primary yield of each process and the unplanned shutdown loss rate; and determining the product of the process tact qualification rates of all the processes as the tact qualification rate of the production line. In this way, this application makes the user can rationally arrange product process time and personnel's configuration in each process according to the beat qualification rate in producing the line to reach and promote the product yields, improve and produce line production efficiency, shorten product processing cycle, reach high quality, short processing cycle's purpose.
Description
Technical Field
The application relates to the technical field of qualification rate statistics, in particular to a statistical method for the beat qualification rate of a production line.
Background
At present, the working mode of the production line of the manufacturing industry basically adopts the traditional production line mode. The traditional production line has a working mode that after the work of a product at a previous station is finished, the product flows to a next station again to work. However, when this type of flow line production mode is applied to a job post having the same work content of a workstation, there is a loss of production efficiency, which affects the tact time. However, after the beat qualification rate in the production line is determined, the production line production efficiency can be improved by reasonably arranging the product processing time and personnel configuration in each process according to the qualification rate, the product processing period is shortened, and the problems can be effectively solved. Therefore, it is very important to find a statistical method of beat qualification rate to realize that a lean production method and a tool are connected in series to form a resultant force, so that the lean improvement benefit is dominant, the operation management of a factory is promoted, and the production efficiency of a production line is improved.
Disclosure of Invention
The technical problem that this application mainly solved provides a statistical method, intelligent terminal and the device that has the memory function of producing line beat qualification rate for the user can rationally arrange product process time and personnel's configuration in each process according to the beat qualification rate in producing the line, with promotion product yields, improves and produces line production efficiency, shortens product processing cycle.
In order to solve the technical problem, the application adopts a technical scheme that: a statistical method for beat qualification rate of a production line is provided, and the method comprises the following steps: acquiring the primary yield and the unplanned shutdown loss rate of each process in a production line within a set period; calculating the pass rate of the process beat of each process by using the primary yield rate and the unplanned shutdown loss rate of each process; and determining the product of the process tact qualification rates of the processes as the tact qualification rate of the production line.
Wherein, the acquisition of the primary yield and the unplanned shutdown loss rate of each process in the production line in the set period comprises: and sequentially acquiring the primary yield of each station in each process, and determining the product of the primary yields of the stations as the primary yield of the process.
Wherein, the acquisition of the primary yield and the unplanned shutdown loss rate of each process in the production line in the set period comprises: obtaining the theoretical producibility and the actual output of each process; determining a yield loss number through the difference value of the theoretical yield number and the actual yield number; and calculating the unplanned shutdown loss rate of the process according to the output loss number and the theoretical producibility number.
Wherein if the actual production number is greater than the theoretical producible number, the production loss number is determined to be 0.
Wherein, the step beat qualification rate of the working procedure obtained by utilizing the first-time yield of each working procedure and the unplanned shutdown loss rate comprises the following steps: obtaining actual output rate of each procedure in the production line by utilizing the unplanned shutdown loss rate of the procedures; and determining the process beat qualification rate of each process based on the product of the primary yield of each process in the production line and the actual yield of each process in the production line.
Wherein, it includes to acquire in the setting cycle every process once yields and unplanned shutdown loss rate: acquiring the one-time yield and the unplanned shutdown loss rate of each procedure of each product generated by a production line in a set period; the step time qualification rate of the working procedures is calculated by utilizing the primary yield rate and the unplanned shutdown loss rate of each working procedure, and the step time qualification rate comprises the following steps: generating a one-time yield and an unplanned shutdown loss rate of each process of each product by using the production line to obtain a process beat qualification rate of each product; and obtaining the process tact qualified rate of the process by using the process tact qualified rate of each product.
Wherein, it includes to acquire in the setting cycle every process once yields and unplanned shutdown loss rate: acquiring the unplanned shutdown loss rate of each product produced in each process and the production time for producing the product; and calculating the unplanned shutdown loss rate of the process by using the unplanned shutdown loss rate and the production time of each product.
Wherein calculating the unplanned downtime loss rate for the process using the unplanned downtime loss rate for each of the products and the production time comprises: obtaining an unplanned downtime loss rate for each of said products by utilizing the unplanned downtime loss rate and the production time for said product; calculating a sum of loss rates to an unplanned outage loss rate for each of said products and a sum of time to production time for producing each of said products; determining an unscheduled shutdown loss rate for the process by a quotient of the sum of the loss rates and the sum of time.
In order to solve the above technical problem, another technical solution adopted by the present application is: the intelligent terminal comprises a processor and a memory, wherein the processor is coupled with the memory, and the processor and the memory execute instructions during working, so that the statistical method for the beat qualification rate of the production line in any embodiment can be realized.
In order to solve the above technical problem, another technical solution adopted by the present application is: there is provided an apparatus having a storage function, the apparatus storing a program, the program implementing the method for counting the tact qualification rate in any one of the above embodiments.
The beneficial effect of this application is: different from the situation of the prior art, the statistical method for the beat qualification rate of the production line comprises the following steps: acquiring the once good product rate and the unplanned shutdown loss rate of each process in a production line within a set period; calculating the pass rate of the process beat of each process by using the primary yield of each process and the unplanned shutdown loss rate; and determining the product of the process tact qualification rates of all the processes as the tact qualification rate of the production line. Through the mode, a user can reasonably arrange the product processing time and personnel configuration in each process according to the beat qualification rate in the production line, so that the product yield is improved, the production efficiency of the production line is improved, the product processing period is shortened, and the purposes of high quality and short processing period are achieved.
Drawings
FIG. 1 is a schematic flow chart diagram illustrating an embodiment of a statistical method for beat qualification rate of a production line according to the present application;
FIG. 2 is a schematic flow chart diagram illustrating another embodiment of the statistical method for beat qualification rate of production line according to the present application;
FIG. 3 is a schematic structural diagram of an embodiment of an intelligent terminal according to the present application;
fig. 4 is a schematic structural diagram of an embodiment of the apparatus with a storage function according to the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort belong to the protection scope of the present application.
Referring to fig. 1, fig. 1 is a schematic flow chart illustrating an embodiment of a statistical method for beat qualification rate of a production line according to the present application. The embodiment provides a statistical method for beat qualification rate of a production line, and specifically, the method may include the following steps:
step S101: and acquiring the one-time yield and the unplanned shutdown loss rate of each process in the production line within a set period.
In the present embodiment, the first-time yield per process in the production line means a ratio of a product passing through the process once in an actual production process to a theoretically producible number of the product. Specifically, the first-time yield of each process is the product of the first-time yields of the inspection stations in each process, that is, the first-time yield of each process is the product of the first-time yields of the inspection stations in each process.
The one-time yield of each station in each process refers to the ratio of the number of products passing through the station once in the actual production process to the theoretical producible number. And the number of products passing through the station at one time in the actual production process is the difference between the theoretical producibility number of the station and the one-time defective number of the station. That is, in each step, the yield per time of each station is (theoretical production number of this station-primary defective number of this station)/theoretical production number of this station.
In the present embodiment, the unplanned downtime loss rate for each process in the production line is the ratio of the number of production losses of a product in the actual production process to the number of theoretical productions. Specifically, the unplanned shutdown loss rate for each step is the quotient of the yield loss number and the theoretical producibility number of each step, that is, the unplanned shutdown time for each step is the yield loss number of each step/the theoretical producibility number of each step.
The yield loss number of each step is a difference between a theoretical producibility number and an actual producibility number of each step, that is, the yield loss number of each step is the theoretical producibility number of each step-the actual producibility number of each step.
In one embodiment, the actual output number of the process is greater than the theoretical producible number, and the output loss number of the process is determined to be 0.
In one specific embodiment, the step of counting the first-time yield includes: solder paste detection, automatic optical detection in front of a furnace, automatic optical detection after the furnace, plug-in section detection, wave soldering detection, automatic on-line detection, function test process, aging, whole machine assembly detection, whole machine test process and packaging section detection.
Wherein the automatic optical inspection after the furnace comprises visual inspection; in the functional test procedure, each functional test station needs to be separately counted; in the whole machine testing procedure, each whole machine testing station needs to be separately counted; the inspection of the packaging section comprises the inspection of the packaging of single-plate semi-finished products, finished products of the whole machine and the like.
Furthermore, the problems of the automatic optical detection station and the solder paste detection station which are misreported need to be counted according to the defects; for the non-performance defects found in the plug-in section and the assembly section, if the device replacement or the maintenance is involved, statistics is needed; the problems found by quality testing personnel or operators of the part-time quality testing at all quality monitoring points need to be recorded and counted; statistics needs to be recorded for any abnormity found in a repair welding station after wave soldering, such as any abnormity found in stations of pin shearing, tin bead brushing, residual soldering flux removal, repair welding and the like.
In a specific embodiment, the process of calculating the unplanned downtime loss rate of each link includes: surface mounting process, veneer process, module or whole machine process. And for the preprocessing processes outside the line, such as the processing of the general network preprocessing, the processing of the front shell assembly of the terminal and the like, statistics is not carried out.
Specifically, different application scenarios and different production line processes are different, and a surface mounting process is taken as an example to illustrate that the process of the surface mounting process for calculating the unplanned downtime loss rate of each link includes: printing, SPI, surface mounting, AOI before furnace, reflow soldering, AOI after furnace, bar code pasting, visual inspection, dispensing, CW test (terminal) and the like. Other processes, if the single board process needs to count the unplanned downtime loss rate of each link, include: the method comprises the following working procedures of component inserter or hand insertion, wave soldering, AOI, glue dispensing, assembly stations, ICT, testing and the like. The module or the whole process comprises the following steps: dispensing, assembling stations, testing and the like.
Wherein, each assembly station needs to be separately counted according to the station; the test comprises an aging test, and statistics are needed to be separately carried out according to test equipment or stations.
Optionally, in a specific embodiment, the tact of the production line, that is, the set period, is 10 minutes, and when the tact of the sample production line is not greater than 10 minutes, the one-time yield of each station and the unplanned downtime of each process are counted in units of every 10 minutes; and when the tempo of the sample plate production line is more than 10 minutes, counting the one-time yield of each station and the unplanned downtime of each process according to the actual tempo.
Optionally, in a specific embodiment, the unplanned outage loss rate of the process including different production time periods is counted by performing cumulative calculation on the actual output number in each production time period in the process according to a set period.
Step S102: and calculating the process beat qualification rate of each process by using the primary yield rate and the unplanned shutdown loss rate of each process.
The beat qualification rate is a comprehensive index representing the beat processing yield and the production efficiency of the production line, and the process beat qualification rate of each process of the production line in production processing is determined by the primary yield of each process representing the quality and the unplanned shutdown loss rate of each process representing the efficiency. Specifically, the actual output rate of each process in the production line is calculated through the unplanned shutdown loss rate of each process, namely the actual output rate of each process in the production line is 1-the unplanned shutdown loss rate of each process. And calculating the process beat qualification rate of each process by using the product of the primary yield rate of each process in the production line and the actual output rate of each process in the production line, namely the process beat qualification rate of each process is (1-unplanned shutdown loss rate of each process) the primary yield rate of each process in the production line.
Step S103: and determining the product of the process tact qualification rates of the processes as the tact qualification rate of the production line.
And the beat qualification rate of the production line is the beat qualification rate of the product in the production and processing process. Specifically, the tact yield of the production line is the product of the tact yields of the processes in the production line, that is, the tact yield of the production line is the product of the tact yields of the processes.
According to the scheme, the step qualification rate of each process is calculated by obtaining the primary qualification rate of each process and the unplanned shutdown loss rate of each process in the production line in the set period, and the product of the step qualification rates of each process is determined as the step qualification rate of the production line, so that the statistics of the step qualification rate of the production line is realized, a user can reasonably arrange the product processing time and personnel configuration in each process according to the step qualification rate of the production line, the product qualification rate is improved, the production efficiency of the production line is improved, the product processing period is shortened, and the purposes of high quality and short processing period are achieved.
Referring to fig. 2, fig. 2 is a schematic flow chart illustrating an embodiment of a statistical method for beat qualification rate of a production line according to the present application. Specifically, the method may include the steps of:
step S201: and acquiring the one-time yield and the unplanned shutdown loss rate of each procedure of each product generated by the production line in a set period.
In this embodiment, the production line produces a plurality of products, and the unplanned outage loss rate for each process is determined by the unplanned outage loss rate for each product in the production process. Specifically, the unplanned shutdown loss rate of each process is the unplanned shutdown loss rate of each product and is accumulated after the conversion according to the production time, namely: the unplanned downtime loss rate for each process (product a unplanned downtime loss rate product a production time + · + product N unplanned downtime loss rate product N production time)/total production time.
In one embodiment, the one-time good rate of each process for each product generated by the production line is the product of the one-time good rates of each station in each process for each product generated by the production line, i.e. the one-time good rate of each process for each product is the product of the one-time good rates of each station in each process for each product.
The primary yield of each station in each process of each product generated by the production line is determined by the primary defective number and the theoretical producibility number of each station in each process of each product generated by the production line. Specifically, it can be calculated by the following formula: the one-time yield of each station in each procedure of each product is 1- ((the one-time defective number of the product A at the station +. cndot. + the one-time defective number of the product N at the station)/(the theoretical producibility number of the product A at the station +. cndot. + the theoretical product N at the station)).
Step S202: and generating the one-time yield and the unplanned shutdown loss rate of each process of each product by using a production line to obtain the beat qualification rate of each process of each product.
Specifically, the step-by-step actual output rate of each product generated by the production line is calculated by the step-by-step unplanned outage loss rate of each product generated by the production line, namely, the step-by-step actual output rate of each product is 1-the step-by-step unplanned outage loss rate of each product. And calculating the product of the primary yield of each process of each product generated by the production line and the actual yield of each process of each product generated by the production line to obtain the process beat qualification rate of each process, namely the process beat qualification rate of each process of each product is equal to (1-the unplanned shutdown loss rate of each process of each product) the primary yield rate of each process of each product.
Step S203: and obtaining the process tact qualified rate of each process by using the tact qualified rate of each product.
Specifically, the process tact yield of each process is the product of the process tact yields of the corresponding processes of each product, i.e., the tact yield of each process is the product of the tact yields of the corresponding processes of each product.
Step S204: and determining the product of the beat qualification rate of each process as the beat qualification rate of the production line.
Specifically, the tact yield of the production line is the product of the process tact yields of the processes in the production line, that is, the tact yield of the production line is the product of the process tact yields.
In the scheme, the process beat qualification rate of each product is obtained by acquiring the primary yield rate and the unplanned shutdown loss rate of each process of each product generated by the production line in a set period and then generating the primary yield rate and the unplanned shutdown loss rate of each process of each product by using the production line, and the process beat qualification rate of each process is obtained by utilizing the process beat qualification rate of each product, and finally the product of the process beat qualification rates of each process is determined as the beat qualification rate of the production line, thereby realizing the statistics of the beat qualification rates of the production lines containing different products, so that the user can reasonably arrange the product processing time and personnel configuration in each procedure according to the beat qualification rate in the production line, therefore, the purposes of improving the product yield, improving the production line production efficiency, shortening the product processing period and achieving high quality and short processing period are achieved.
Referring to fig. 3, fig. 3 is a schematic structural diagram of an embodiment of an intelligent terminal according to the present application. The present embodiment provides an intelligent terminal, which includes a processor 301 and a memory 302, where the processor 301 is coupled to the memory 302, and the processor 301 and the memory 302 can implement the steps in the method when in operation.
Referring to fig. 4, fig. 4 is a schematic structural diagram of an embodiment of a device with a storage function according to the present application. The present embodiment provides a device 40 with a storage function, in which program data 401 is stored, wherein when being executed by a processor, the program data 401 implements the steps in the method, and for the specific method steps, reference is made to the description in the above method embodiments, and details are not repeated herein.
According to the scheme, the step qualification rate of each process is calculated by obtaining the primary qualification rate of each process and the unplanned shutdown loss rate of each process in the production line in the set period, and the product of the step qualification rates of each process is determined as the step qualification rate of the production line, so that the statistics of the step qualification rate of the production line is realized, a user can reasonably arrange the product processing time and personnel configuration in each process according to the step qualification rate of the production line, the product qualification rate is improved, the production efficiency of the production line is improved, the product processing period is shortened, and the purposes of high quality and short processing period are achieved.
In the several embodiments provided in the present application, it should be understood that the disclosed method, terminal and apparatus can be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, a division of a module or a unit is merely one type of logical division, and an actual implementation may have another division, for example, a unit or a component may be combined or integrated with another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some interfaces, and may be in an electrical, mechanical or other form.
Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on network elements. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present application may be substantially implemented or contributed to by the prior art, or all or part of the technical solution may be embodied in a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) or a processor (processor) to execute all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above description is only an example of the present application and is not intended to limit the scope of the present application, and all modifications of equivalent structures and equivalent processes, which are made by the contents of the specification and the drawings, or which are directly or indirectly applied to other related technical fields, are intended to be included within the scope of the present application.
Claims (10)
1. A statistical method for beat qualification rate of a production line is characterized by comprising the following steps:
acquiring the primary yield and the unplanned shutdown loss rate of each process in a production line within a set period;
calculating the pass rate of the process beat of each process by using the primary yield of each process and the unplanned shutdown loss rate;
and determining the product of the process tact qualification rates of the processes as the tact qualification rate of the production line.
2. The statistical method for the tact qualification rate of the production line of claim 1, wherein the acquiring of the one-time yield and the unplanned shutdown loss rate of each process in the production line in the set period comprises:
and sequentially acquiring the primary yield of each station in each process, and determining the product of the primary yields of the stations as the primary yield of the process.
3. The statistical method for the tact qualification rate of the production line of claim 1, wherein the acquiring of the one-time yield and the unplanned shutdown loss rate of each process in the production line in the set period comprises:
acquiring the theoretical producibility number and the actual producibility number of each process;
determining the yield loss number through the difference value of the theoretical yield number and the actual yield number;
and calculating the unplanned shutdown loss rate of the process according to the output loss number and the theoretical producibility number.
4. The method of claim 3, wherein if the actual output number is greater than the theoretical producible number, the output loss number is determined to be 0.
5. The method for counting the tact qualification rate of a production line according to any one of claims 1 to 4, wherein the calculating the tact qualification rate of the process by using the primary good product rate and the unplanned outage loss rate of each process comprises:
obtaining actual output rate of each procedure in a production line by utilizing the unplanned shutdown loss rate of the procedures;
and determining the process beat qualification rate of each process based on the product of the primary yield of each process in the production line and the actual yield of each process in the production line.
6. The statistical method for production line beat qualification rate according to any one of claims 1 to 4, wherein the acquiring of the yield of each process in the production line at one time and the unplanned shutdown loss rate in a set period comprises:
acquiring the one-time yield and the unplanned shutdown loss rate of each procedure of each product generated by a production line in a set period;
the step time qualification rate of the working procedures is calculated by utilizing the primary yield rate and the unplanned shutdown loss rate of each working procedure, and the step time qualification rate comprises the following steps:
generating a one-time yield and an unplanned shutdown loss rate of each procedure of each product by using the production line to obtain a procedure beat qualification rate of each product;
and obtaining the process tact qualification rate of each process by using the process tact qualification rate of each product.
7. The statistical method for the tact qualification rate of the production line of claim 6, wherein the acquiring the yield of each process and the unplanned shutdown loss rate of each process in the production line within the set period comprises:
acquiring the unplanned shutdown loss rate of each product produced in each process and the production time for producing the product;
and calculating the unplanned shutdown loss rate of the process by using the unplanned shutdown loss rate and the production time of each product.
8. The method of claim 7, wherein calculating the unplanned downtime loss rate for the process using the unplanned downtime loss rate for each of the products and the production time comprises:
obtaining the unplanned shutdown loss rate of each product by utilizing the unplanned shutdown loss rate and the production time of the product;
calculating the sum of the loss rates of the unplanned shutdown loss rates of each of the products and the sum of the production times for producing each of the products;
determining an unscheduled shutdown loss rate for the process by a quotient of the sum of the loss rates and the sum of time.
9. An intelligent terminal, wherein the intelligent terminal comprises a processor and a memory, the processor is coupled to the memory, and the processor and the memory execute instructions during operation, so as to implement the steps in the method for counting the beat yield of the production line according to any one of claims 1 to 8.
10. An apparatus having a storage function, wherein a program is stored, and the program is executed to implement the steps in the method for counting tact pass rate according to any one of claims 1 to 8.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116362454A (en) * | 2023-06-03 | 2023-06-30 | 宁德时代新能源科技股份有限公司 | Yield analysis system and method, electronic equipment, storage medium and product |
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2020
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116362454A (en) * | 2023-06-03 | 2023-06-30 | 宁德时代新能源科技股份有限公司 | Yield analysis system and method, electronic equipment, storage medium and product |
| CN116362454B (en) * | 2023-06-03 | 2023-10-20 | 宁德时代新能源科技股份有限公司 | Yield analysis system and method, electronic equipment, storage medium and product |
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Application publication date: 20220520 |