CN114500994A - Method for testing radiation transient response of photoelectric image sensor - Google Patents
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Abstract
Description
技术领域technical field
本发明属于辐射效应测试领域，具体涉及一种光电图像传感器辐射瞬态响应的测试方法。The invention belongs to the field of radiation effect testing, in particular to a method for testing radiation transient response of a photoelectric image sensor.
背景技术Background technique
辐射瞬态响应是指辐射粒子或射线穿过器件敏感区域时产生的电子-空穴对被器件收集而在输出图像中产生亮点或亮线的现象。与累积辐照损伤相比，辐射瞬态响应为非永久性损伤，成像探测系统在辐射场环境下时产生，而离开辐射场后即可恢复，且每帧图像中瞬态信号随机出现。Radiation transient response refers to the phenomenon that the electron-hole pairs generated when radiation particles or rays pass through the sensitive area of the device are collected by the device and produce bright spots or bright lines in the output image. Compared with the cumulative radiation damage, the radiation transient response is non-permanent damage, which occurs when the imaging detection system is in the radiation field environment, and can be recovered after leaving the radiation field, and the transient signal appears randomly in each frame of image.
光电图像传感器的辐射瞬态响应影响主要分为以下两方面：应用于辐射环境下的光电图像传感器(如电荷耦合器件、CMOS图像传感器等)将受到辐射粒子或射线的影响，产生瞬态噪声，干扰或降低了器件的成像、探测性能；应用于辐射探测环境下的光电图像传感器将辐射粒子或射线产生的瞬态响应当作信号，进而对辐射环境参数进行探测。因此，开展不同粒子或射线辐射环境下光电图像传感器辐射瞬态响应研究具有重要意义。The radiation transient response of photoelectric image sensors is mainly divided into the following two aspects: photoelectric image sensors (such as charge-coupled devices, CMOS image sensors, etc.) applied in radiation environments will be affected by radiation particles or rays, resulting in transient noise, Interfering or reducing the imaging and detection performance of the device; the photoelectric image sensor applied in the radiation detection environment regards the transient response generated by the radiation particles or rays as a signal, and then detects the radiation environment parameters. Therefore, it is of great significance to study the radiation transient response of photoelectric image sensors in different particle or ray radiation environments.
开展光电图像传感器辐射瞬态响应研究过程中必须实现对其瞬态响应的快速准确测量。在开展光电图像传感器瞬态响应测试过程中，器件本底噪声、工作过程中的热噪声对测试结果将产生一定的影响。此外工作在辐射环境中的光电图像传感器将受到粒子或射线的累积辐照损伤，从而产生辐射噪声。上述噪声均会对光电图像传感器的瞬态响应测试造成一定的影响。目前需要实现对光电图像传感器瞬态响应快速、准确测试与分析。The rapid and accurate measurement of the transient response of the photoelectric image sensor must be achieved in the process of researching the radiation transient response of the photoelectric image sensor. In the process of testing the transient response of photoelectric image sensors, the noise floor of the device and the thermal noise during operation will have a certain impact on the test results. In addition, the photoelectric image sensor working in the radiation environment will be damaged by the accumulated radiation of particles or rays, resulting in radiation noise. All of the above noise will have a certain impact on the transient response test of the photoelectric image sensor. At present, it is necessary to realize fast and accurate testing and analysis of the transient response of photoelectric image sensors.
发明内容SUMMARY OF THE INVENTION
为实现对瞬态响应快速、准确测试与分析，本发明提供一种光电图像传感器辐射瞬态响应的测试方法，该方法解决了不同辐射环境下光电图像传感器瞬态响应典型特征及规律实验测试的问题，为应用于辐射环境下光电图像传感器辐射噪声处理、辐射信号识别提供技术支撑。In order to realize fast and accurate testing and analysis of the transient response, the present invention provides a method for testing the radiation transient response of a photoelectric image sensor, which solves the problems of the typical characteristics and regular experimental tests of the photoelectric image sensor transient response under different radiation environments. It provides technical support for radiation noise processing and radiation signal identification of photoelectric image sensors in radiation environment.
为实现上述目的，本发明采用以下技术方案：To achieve the above object, the present invention adopts the following technical solutions:
一种光电图像传感器辐射瞬态响应的测试方法，包括以下步骤：A method for testing radiation transient response of a photoelectric image sensor, comprising the following steps:
步骤一、选择产生瞬态响应的辐射粒子或射线的种类，确定辐射粒子或射线的入射注量率、入射角度、积分时间和数据采集频率，或者，确定辐射粒子或射线的入射剂量率、入射角度、积分时间和数据采集频率；Step 1. Select the type of radiation particles or rays that generate transient responses, determine the incident fluence rate, incident angle, integration time and data acquisition frequency of the radiation particles or rays, or determine the incident dose rate of the radiation particles or rays, incident angle, integration time and data collection frequency;
步骤二、搭建光电图像传感器的瞬态响应测试系统，对光电图像传感器进行遮光处理，随后，瞬态响应测试系统持续采集图像数据，直至图像数据的平均输出值达到稳定；Step 2, building a transient response test system of the photoelectric image sensor, shading the photoelectric image sensor, and then, the transient response test system continues to collect image data until the average output value of the image data reaches stability;
步骤三、在非辐射场、不同积分时间条件下采集暗场图像数据，随后将光电图像传感器放置在辐射场内，依次采集不同入射注量率、不同入射角度、不同积分时间条件下输出的辐射图像数据，或者依次采集不同入射剂量率、不同入射角度、不同积分时间条件下输出的辐射图像数据；Step 3: Collect dark field image data under the conditions of non-radiation field and different integration times, then place the photoelectric image sensor in the radiation field, and sequentially collect the radiation output under the conditions of different incident fluence rates, different incident angles, and different integration times. Image data, or sequentially collect radiation image data output under the conditions of different incident dose rates, different incident angles, and different integration times;
步骤四、在设定时间内将光电图像传感器的瞬态响应测试系统移出辐射场，随后返回步骤三，再次在设定时间内将光电图像传感器的瞬态响应测试系统移出辐射场，返回步骤三，重复该过程多次，获取多个暗场图像数据和辐射图像数据；该过程中，若辐射粒子或射线对光电图像传感器产生较为严重损伤，则更换光电图像传感器，返回步骤二；Step 4. Move the transient response test system of the photoelectric image sensor out of the radiation field within the set time, then return to step 3, move the transient response test system of the photoelectric image sensor out of the radiation field again within the set time, and return to step 3 , repeat this process many times to obtain multiple dark field image data and radiation image data; in this process, if radiation particles or rays cause serious damage to the photoelectric image sensor, replace the photoelectric image sensor, and return to step 2;
步骤五、将获取的暗场图像数据和辐射图像数据进行数据处理，获得瞬态响应图像和瞬态响应实验规律；Step 5: Perform data processing on the acquired dark field image data and radiation image data to obtain a transient response image and an experimental law of transient response;
对辐射场外的多帧暗场图像数据每个像素点处的输出值进行求平均，获得光电图像传感器的背景噪声图像，将辐射场下的辐射图像数据减去背景噪声图像即可获得瞬态响应图像；The output value of each pixel of the multi-frame dark field image data outside the radiation field is averaged to obtain the background noise image of the photoelectric image sensor. The transient image can be obtained by subtracting the background noise image from the radiation image data under the radiation field. responsive image;
对瞬态响应图像进行边缘检测获得瞬态响应的形貌特征，绘制不同条件下的多帧瞬态响应信号分布曲线，获得瞬态响应实验规律。The edge detection of the transient response image is performed to obtain the topographic characteristics of the transient response, and the multi-frame transient response signal distribution curves under different conditions are drawn to obtain the experimental law of the transient response.
进一步地，步骤一中，积分时间根据辐射粒子或射线的入射注量率或入射剂量率确定，最大积分时间设置判断标准为光电图像传感器输出瞬态响应信号的像素单元占比不超过50％。Further, in step 1, the integration time is determined according to the incident fluence rate or incident dose rate of the radiation particles or rays, and the maximum integration time is set as a criterion that the photoelectric image sensor outputs a transient response signal whose pixel units account for no more than 50%.
进一步地，步骤二中，图像数据的平均输出值达到稳定的具体判断方法为：连续采集图像数据一段时间后，光电图像传感器内部温度在1分钟内变化小于0.1℃或输出平均暗信号变化小于2％。Further, in step 2, the specific method for judging that the average output value of the image data has reached stability is: after continuously collecting image data for a period of time, the internal temperature of the photoelectric image sensor changes within 1 minute by less than 0.1 °C or the output average dark signal changes less than 2. %.
进一步地，步骤二中，对光电图像传感器进行遮光处理具体为：采用遮光材料完全遮挡光电图像传感器的感光面，遮光材料为不透光的遮光纸。Further, in step 2, the shading treatment of the photoelectric image sensor is specifically: using a shading material to completely shield the photosensitive surface of the photoelectric image sensor, and the shading material is opaque shading paper.
进一步地，步骤三中，在相同辐照状态下，采集的辐射图像数据帧数不小于20帧，辐射图像数据一般保存为8位、12位或16位raw格式。Further, in step 3, under the same irradiation state, the number of frames of the collected radiation image data is not less than 20 frames, and the radiation image data is generally saved in 8-bit, 12-bit or 16-bit raw format.
进一步地，步骤三中，非辐射场下，暗场图像数据的采集数据帧数不小于50帧。Further, in step 3, under the non-radiation field, the number of data frames of dark field image data collected is not less than 50 frames.
进一步地，步骤四中，射线对光电图像传感器产生较为严重损伤的判断方法为：辐射场环境下，光电图像传感器的输出信号统计分布图中的最高点对应的信号值增大；辐射粒子对光电图像传感器产生较为严重损伤的判断方法为：辐射场环境下，输出图像中存在超过设定阈值的热像元。Further, in step 4, the method for judging that the ray causes serious damage to the photoelectric image sensor is: under the radiation field environment, the signal value corresponding to the highest point in the statistical distribution diagram of the output signal of the photoelectric image sensor increases; The judgment method for serious damage to the image sensor is: in the radiation field environment, there are thermal pixels in the output image that exceed the set threshold.
进一步地，所述光电图像传感器为电荷耦合器件或CMOS图像传感器。Further, the photoelectric image sensor is a charge coupled device or a CMOS image sensor.
与现有技术相比，本发明具有如下有益效果：Compared with the prior art, the present invention has the following beneficial effects:
1.本发明方法对光电图像传感器瞬态响应进行测试并进行数据处理，获得瞬态响应典型特征和规律，为应用于辐射场环境下的光电图像传感器瞬态响应评估、瞬态响应噪声处理、抗瞬态响应加固设计提供数据支撑。1. The method of the present invention tests the transient response of the photoelectric image sensor and performs data processing to obtain the typical characteristics and laws of the transient response, which are used for the transient response evaluation of the photoelectric image sensor applied in the radiation field environment, transient response noise processing, Data support for anti-transient response reinforcement design.
2.本发明方法能够实现对瞬态响应的准确测量。为避免器件本底噪声的影响，本发明在开展测试时通过采集多帧暗场图像求均值，随后在数据处理过程中采用减去本底噪声的方法。为避免测试过程中器件发热对结果的影响，本发明方法在开展瞬态响应测试时，首先对测试系统进行预热处理并进行监测，待温度稳定后开展测试。为避免累积辐射噪声对测试结果的影响，通过定期将光电图像传感器瞬态响应测试系统移出辐射场，或更换光电图像传感器。2. The method of the present invention can realize accurate measurement of transient response. In order to avoid the influence of the noise floor of the device, the present invention obtains an average value by collecting multiple frames of dark field images during testing, and then adopts the method of subtracting the noise floor in the data processing process. In order to avoid the influence of device heating on the results during the test, when the transient response test is carried out in the method of the present invention, the test system is firstly preheated and monitored, and the test is carried out after the temperature is stable. To avoid the influence of accumulated radiation noise on the test results, periodically move the photoelectric image sensor transient response test system out of the radiation field, or replace the photoelectric image sensor.
附图说明Description of drawings
图1为本发明实施例中光电图像传感器辐射瞬态响应的测试方法流程图；1 is a flowchart of a method for testing the radiation transient response of a photoelectric image sensor according to an embodiment of the present invention;
图2为本发明实施例中CMOS图像传感器Co-60γ射线瞬态响应典型输出图像；FIG. 2 is a typical output image of a Co-60 γ-ray transient response of a CMOS image sensor in an embodiment of the present invention;
图3为本发明实施例中剂量率为0.05rad(Si)/s时连续三帧CMOS图像传感器Co-60γ射线瞬态响应输出分布示意图；3 is a schematic diagram of the output distribution of the Co-60 γ-ray transient response of three consecutive frames of a CMOS image sensor when the dose rate is 0.05rad(Si)/s in an embodiment of the present invention;
图4为本发明实施例中剂量率为0.1rad(Si)/s时未减暗场和减去暗场后CMOS图像传感器Co-60γ射线瞬态响应输出分布图。FIG. 4 is an output distribution diagram of Co-60 γ-ray transient response of a CMOS image sensor without dark field and after dark field subtraction when the dose rate is 0.1 rad(Si)/s in an embodiment of the present invention.
具体实施方式Detailed ways
下面结合附图和具体实施方式对本发明进行详细说明。本领域技术人员应当理解的是，这些实施方式仅仅用来解释本发明的技术原理，目的并不是用来限制本发明的保护范围。The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principle of the present invention, and are not intended to limit the protection scope of the present invention.
本发明提出一种光电图像传感器辐射瞬态响应的测试方法，光电图像传感器主要包括电荷耦合器件(CCD)和CMOS图像传感器等，该方法实现了对光电图像传感器辐射瞬态响应的实验测量，为光电图像传感器辐射瞬态响应研究提供了技术支撑。The invention provides a method for measuring the radiation transient response of a photoelectric image sensor. The photoelectric image sensor mainly includes a charge-coupled device (CCD) and a CMOS image sensor. The method realizes the experimental measurement of the radiation transient response of the photoelectric image sensor. The research on radiation transient response of photoelectric image sensor provides technical support.
本发明提供的光电图像传感器辐射瞬态响应的测试方法具体包括以下步骤：The method for testing the radiation transient response of a photoelectric image sensor provided by the present invention specifically includes the following steps:
步骤一、根据测试需要，选择产生瞬态响应的辐射粒子或射线的种类，确定辐射粒子或射线的入射注量率(或入射剂量率)、入射角度、积分时间和数据采集频率；Step 1. According to the test needs, select the type of radiation particles or rays that generate transient responses, and determine the incident fluence rate (or incident dose rate), incident angle, integration time and data collection frequency of the radiation particles or rays;
积分时间的选取过程中，需要根据辐射粒子或射线的入射注量率或入射剂量率进行确定，一般情况下，最大积分时间设置判断标准为光电图像传感器输出瞬态响应信号的像素单元占比不超过50％；In the selection process of the integration time, it needs to be determined according to the incident fluence rate or incident dose rate of the radiation particles or rays. In general, the maximum integration time is set as the criterion for the pixel units that output the transient response signal of the photoelectric image sensor. more than 50%;
步骤二、搭建光电图像传感器的瞬态响应测试系统，使光电图像传感器的瞬态响应测试系统能够正常输出图像，对光电图像传感器进行遮光处理，随后，瞬态响应测试系统持续采集图像数据一段时间，直至图像数据的平均输出值达到稳定；其中，图像数据的平均输出值达到稳定具体判断方法为：连续采集图像数据一段时间后，光电图像传感器内部温度在1分钟内变化小于0.1℃或输出平均暗信号变化小于2％；Step 2: Build a transient response test system of the photoelectric image sensor, so that the transient response test system of the photoelectric image sensor can output images normally, and perform shading treatment on the photoelectric image sensor. Then, the transient response test system continues to collect image data for a period of time , until the average output value of the image data reaches stability; among them, the average output value of the image data reaches stability The specific judgment method is: after continuously collecting image data for a period of time, the internal temperature of the photoelectric image sensor changes within 1 minute by less than 0.1 ℃ or the average output value Dark signal change less than 2%;
步骤三、在非辐射场、不同积分时间条件下采集暗场图像数据；随后将光电图像传感器放置在辐射场内，依次采集不同入射注量率、不同入射角度、不同积分时间条件下输出的辐射图像数据，或者依次采集不同入射剂量率、不同入射角度、不同积分时间条件下输出的辐射图像数据；Step 3: Collect dark field image data under the conditions of non-radiation field and different integration times; then place the photoelectric image sensor in the radiation field, and sequentially collect the radiation output under the conditions of different incident fluence rates, different incident angles, and different integration times Image data, or sequentially collect radiation image data output under the conditions of different incident dose rates, different incident angles, and different integration times;
光电图像传感器进行遮光处理时，采用遮光材料完全遮挡光电图像传感器的感光面，遮光材料一般为不透光的遮光纸；如需研究辐射粒子或射线穿过不同材料后在光电图像传感器中产生的瞬态效应，可在遮光纸和光电图像传感器之间添加需研究的材料；When the photoelectric image sensor is shading, the photosensitive surface of the photoelectric image sensor is completely shielded by the shading material. Transient effect, the material to be studied can be added between the light-shielding paper and the photoelectric image sensor;
在相同辐照状态下，采集的辐射图像数据帧数不小于20帧，图像数据一般保存为8位、12位或16位raw格式；非辐射场下，暗场图像数据的采集数据帧数不小于50帧；Under the same irradiation state, the number of collected radiation image data frames is not less than 20 frames, and the image data is generally saved in 8-bit, 12-bit or 16-bit raw format; under the non-radiation field, the number of collected data frames of dark field image data is not less than 50 frames;
步骤四、如果在辐照场内瞬态响应测试时间较长时，辐射粒子或射线会对光电图像传感器造成一定损伤，导致本底噪声增大，因此需要定期将光电图像传感器瞬态响应测试系统移出辐射场，随后返回步骤三，执行该过程多次，获取多个暗场图像数据和辐射图像数据，上述测试时间、定期移出时间根据瞬态响应测试内容、辐射场强度、光电图像传感器对辐射损伤的敏感度等因素确定；同时，如果时间测试时间太长时，累积辐照对光电图像传感器造成较大损伤严重影响瞬态响应测试结果时，此时需更换光电图像传感器，返回步骤二；Step 4. If the transient response test time in the irradiation field is long, the radiation particles or rays will cause certain damage to the photoelectric image sensor, resulting in an increase in the background noise. Therefore, it is necessary to periodically test the photoelectric image sensor transient response test system. Remove the radiation field, then return to step 3, perform this process multiple times, and obtain multiple dark field image data and radiation image data. The above test time and periodic removal time are based on the transient response test content, radiation field strength, and photoelectric image sensors. The damage sensitivity and other factors are determined; at the same time, if the time test time is too long, the accumulated radiation will cause great damage to the photoelectric image sensor and seriously affect the transient response test results, at this time, the photoelectric image sensor needs to be replaced, and return to step 2;
射线对光电图像传感器产生损伤的判断方法为辐射场环境下，光电图像传感器的输出信号统计分布图中的最高点对应的信号值增大，即光电图像传感器的本底噪声增大；The method for judging the damage caused by rays to the photoelectric image sensor is that in the radiation field environment, the signal value corresponding to the highest point in the statistical distribution diagram of the output signal of the photoelectric image sensor increases, that is, the noise floor of the photoelectric image sensor increases;
辐射粒子对光电图像传感器产生损伤的判断标准为辐射场环境下，输出图像中存在较多热像元(输出信号远高于辐照前，且连续多帧输出信号几乎不发生改变，在图像中表现为固定存在的亮点)，即输出图像中热像元的占比超过设定阈值，例如超过20％；此外，为了避免辐照注量率过高、辐照时间过长，在器件中产生累积损伤增大，一般采用低注量率(剂量率)、长积分时间模式进行数据采集；The criterion for the damage caused by radiation particles to the photoelectric image sensor is that in the radiation field environment, there are many thermal pixels in the output image (the output signal is much higher than that before irradiation, and the output signal of consecutive multiple frames hardly changes, and in the image It appears as a fixed bright spot), that is, the proportion of thermal pixels in the output image exceeds the set threshold, for example, more than 20%; The cumulative damage increases, generally using a low fluence rate (dose rate) and long integration time mode for data collection;
步骤五、将获取的暗场图像数据和辐射图像数据进行数据处理，获得瞬态响应图像和瞬态响应实验规律；Step 5: Perform data processing on the acquired dark field image data and radiation image data to obtain a transient response image and an experimental law of transient response;
通过辐射场外的多帧暗场图像数据每个像素点处的输出值进行求平均，获得光电图像传感器的背景噪声图像，辐射场下的辐射图像数据减去背景噪声图像即可获得瞬态响应图像；通过对瞬态响应图像进行边缘检测获得瞬态响应的形貌特征；通过绘制不同条件下的多帧瞬态响应信号分布曲线，获得瞬态响应实验规律。The background noise image of the photoelectric image sensor is obtained by averaging the output values of each pixel of the multi-frame dark field image data outside the radiation field, and the transient response can be obtained by subtracting the background noise image from the radiation image data under the radiation field. The morphological characteristics of the transient response are obtained by edge detection of the transient response image; the experimental law of the transient response is obtained by drawing the multi-frame transient response signal distribution curves under different conditions.
本发明实施例提供了一款CMOS图像传感器Co-60伽马射线辐照瞬态响应测试方法，结合光电图像传感器辐射瞬态响应的实验测试方法流程图图1对CMOS图像传感器Co-60伽马射线辐照瞬态响应测试方法进行说明，具体步骤如下所示：The embodiment of the present invention provides a method for testing the transient response of a CMOS image sensor Co-60 gamma ray irradiation, combined with the flow chart of the experimental testing method for the radiation transient response of a photoelectric image sensor. The ray irradiation transient response test method is described, and the specific steps are as follows:
步骤一、本次瞬态响应实验辐射源为Co-60γ射线，剂量率分别为0.05rad(Si)/s和0.1rad(Si)/s，粒子入射角度为垂直入射(与探测器平面呈90度)，积分时间为6.0ms，采集数据频率为2(即每秒采集两帧图像)；Step 1. The radiation source of this transient response experiment is Co-60 γ-ray, the dose rates are 0.05rad(Si)/s and 0.1rad(Si)/s respectively, and the particle incident angle is vertical incidence (90° to the detector plane). degrees), the integration time is 6.0ms, and the data collection frequency is 2 (that is, two frames of images are collected per second);
步骤二、对光电图像传感器进行遮光处理，非辐射场条件下采集图像数据，持续采集约30分钟，通过实时观测瞬态响应测试系统输出图像平均灰度值，初步判断瞬态响应测试系统采集接近稳定，随后连续5分钟采集时间内，输出图像信号均值变化约为1％，此时认为输出达到稳定；Step 2: Perform shading treatment on the photoelectric image sensor, collect image data under non-radiation field conditions, and continue to collect for about 30 minutes. By observing the average gray value of the image output by the transient response test system in real time, it is preliminarily judged that the transient response test system is close to the acquisition. Stable, then the average value of the output image signal changes by about 1% within the continuous 5-minute acquisition time, and the output is considered to be stable at this time;
步骤三、根据实验室剂量率测量系统标定值，将CMOS图像传感器的瞬态响应测试系统放置在剂量率为0.05rad(Si)/s的位置处，将CMOS图像传感器摆放与Co-60γ射线入射角度为90度，对瞬态响应测试系统除CMOS图像传感器外模块进行屏蔽防护；Step 3. According to the calibration value of the laboratory dose rate measurement system, place the transient response test system of the CMOS image sensor at a position where the dose rate is 0.05rad(Si)/s, and place the CMOS image sensor with the Co-60 gamma ray. The incident angle is 90 degrees, and the modules other than the CMOS image sensor of the transient response test system are shielded and protected;
按照实验方案，设置积分时间和采集频率，本次测试设置积分时间为积分时间为6.0ms，采集帧数为20帧，数据保存格式为16bit unsigned的raw格式数据；According to the experimental plan, set the integration time and acquisition frequency. In this test, set the integration time as the integration time as 6.0ms, the number of acquisition frames as 20 frames, and the data storage format as 16bit unsigned raw format data;
步骤四、将辐射源从所存放的水井中提出，待到达指定位置后开始采集数据，数据采集完成后立即降源，停止辐照将CMOS图像传感器瞬态响应测试系统放置在剂量率为0.1rad(Si)/s的位置处，对瞬态响应测试系统除CMOS图像传感器外模块进行屏蔽防护；将辐射源从所存放的水井中提出，待到达指定位置后开始采集数据，数据采集完成后立即降源，停止辐照；Step 4. Take the radiation source out of the stored well, start collecting data after reaching the designated position, drop the source immediately after the data collection is completed, stop the irradiation, and place the CMOS image sensor transient response test system at a dose rate of 0.1rad. (Si)/s, shield and protect the modules of the transient response test system except the CMOS image sensor; lift the radiation source from the stored well, and start collecting data after reaching the designated position. Immediately after the data collection is completed Drop the source, stop the irradiation;
步骤五、将采集到的数据导入图像数据处理系统进行数据处理，获得Co-60γ射线诱发瞬态响应典型特征和实验规律，典型输出图像如图2所示，分布图如图3和图4所示。Step 5. Import the collected data into the image data processing system for data processing, and obtain the typical characteristics and experimental laws of Co-60γ-ray induced transient response. The typical output image is shown in Figure 2, and the distribution diagrams are shown in Figure 3 and Figure 4. Show.
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