CN114487940A - Atomic magnetometer air chamber consistency detection device - Google Patents

Abstract

The invention provides an atomic magnetometer air chamber consistency detection device which comprises a supporting component, a plurality of atomic air chambers, an air chamber turntable, a driving light source, 1/4 wave plates, a first photoelectric detector, a detection light source, a first reflector, a second reflector, a 1/2 wave plate, a polarization beam splitter prism, a second photoelectric detector, a third photoelectric detector, a magnetic shielding barrel and a coil magnetism supplementing device, wherein the atomic air chambers are fixedly arranged on the periphery of the air chamber turntable at intervals; the atom magnetometer air chamber consistency detection device can detect the air chamber parameters and the magnetometer performance of any atom air chamber by rotating the air chamber turntable. By applying the technical scheme of the invention, the technical problems of poor consistency, low efficiency and high time cost of the test of the plurality of atomic gas chambers in the prior art are solved.

Description

Atomic magnetometer air chamber consistency detection device

Technical Field

The invention relates to the technical field of optical detection and weak magnetic detection, in particular to a gas chamber consistency detection device of an atomic magnetometer.

Background

With the rapid development of quantum manipulation technology, new technical fields such as quantum computation, quantum communication, quantum sensing and the like are rapidly developed, and in recent years, weak magnetic field detection by utilizing an atomic spin effect has become an important development direction of quantum sensing. Among them, atomic magnetometers such as a spin-free relaxation atomic magnetometer, a scalar atomic magnetometer, a three-axis vector atomic magnetometer, and the like have attracted attention of many scholars, and among them, the spin-free relaxation atomic magnetometer maintains the world record of the highest sensitivity in the field of weak magnetic detection, has been subjected to the research and development of first-generation products by some domestic and foreign enterprise institutions, and is gradually becoming important strength of biomedicine such as brain magnetic detection, cardiac magnetic detection, and the like.

The atomic magnetometer is mainly composed of a light source system, a magnetic field shielding system and an atomic gas pool control system. The conventional reasons for restricting the sensitivity of the atomic magnetometer comprise optical field noise, magnetic field distribution, temperature control, atomic gas chamber composition and the like, wherein light source noise can be inhibited through additional modulation feedback, the magnetic field distribution and the temperature control can be correspondingly inhibited to a corresponding degree through optimization and adjustment, but relevant research on the atomic gas chamber composition in the atomic magnetometer is developed, but the process flow for assembling the atomic magnetometer gas pool is still incomplete, the gas content of the atomic gas chamber cannot be strictly quantified, so the inconsistency of the atomic magnetometer gas composition limits the further development of the atomic magnetometer in the aspect of industrial multi-channel prototype, and becomes the bottleneck of the development of the multi-channel atomic magnetometer. In addition, the inconsistency of magnetic field response due to the difference of gas composition has become one of the important obstacles for gradient detection of atomic magnetometer. At present, the detection of the air chamber of the atomic magnetometer is influenced in many aspects, firstly, the air chamber parameter detection aiming at the atomic magnetometer is carried out around a single air chamber for a plurality of times, the parameters to be detected are various, and the efficiency of the testing process is low. And secondly, the test process is basically based on an optical platform system device for detection, is influenced by light source difference, optical element difference, detection environment difference and the like, cannot be completely adapted to the actual miniaturized atomic magnetometer product, and the parameters of the gas chamber (such as nitrogen content, gas chamber wall loss and the like) and the performance of the magnetometer (such as sensitivity of the magnetometer, residual magnetism of the gas chamber and the like) obtained by measurement of the two are different, so that the batch assembly capability of the magnetometer is reduced. In addition, because the atomic magnetometer is mostly required to be carried out in a well-shielded zero-magnetic-field environment, corresponding work needs to be carried out around the magnetic shielding barrel in the traditional testing process, and the optical device is constructed by relying on the optical platform, but the magnetic shielding barrel is large in size due to the design requirements of the magnetic shielding barrel, the testing device needs to be built by a targeted application optical platform in the magnetometer testing process, and the magnetometer testing time and the cost are increased.

Disclosure of Invention

The invention provides a device for detecting the consistency of gas chambers of an atomic magnetometer, which can solve the technical problems of poor consistency, low efficiency and high time cost of testing of a plurality of atomic gas chambers in the prior art.

The invention provides a device for detecting the consistency of an atomic magnetometer gas chamber, which comprises: a support assembly; the atom air chambers are fixedly arranged at the periphery of the air chamber turntable at intervals, and the air chamber turntable is rotatably arranged on the support assembly; the driving light source, the 1/4 wave plate and the first photoelectric detector are all arranged on the supporting assembly, the driving light emitted by the driving light source enters any atom air chamber after passing through the 1/4 wave plate, and the first photoelectric detector is used for detecting the light intensity of the driving light passing through the atom air chamber; the detection light source, the first reflector, the second reflector, the 1/2 wave plate, the polarization beam splitter prism, the second photodetector and the third photodetector are respectively arranged on two mutually perpendicular side surfaces of the polarization beam splitter prism, the detection light source, the first reflector, the second reflector, the 1/2 wave plate and the polarization beam splitter prism are all arranged on the supporting assembly, detection light emitted by the detection light source enters the atom air chamber after being emitted by the first reflector, detection light transmitted by the atom air chamber enters the polarization beam splitter prism through the 1/2 wave plate after being reflected by the second reflector and is divided into first detection light and second detection light, the second photodetector is used for detecting the light intensity of the first detection light, and the third photodetector is used for detecting the light intensity of the second detection light; the magnetic shielding barrel is arranged outside the atomic gas chambers and is used for shielding external magnetic interference; the coil magnetism supplementing device is arranged outside the atomic gas chambers and used for compensating the magnetic field environment in the magnetic shielding barrel; the atom magnetometer air chamber consistency detection device can detect the air chamber parameters and the magnetometer performance of any atom air chamber by rotating the air chamber turntable.

Further, atom magnetometer air chamber uniformity detection device still includes a plurality of air chamber heating system, and a plurality of air chamber heating system set up with a plurality of atom air chamber one-to-ones, and arbitrary air chamber heating system all includes heating plate, heat conduction casing and plastics shell subassembly, and atom air chamber sets up in the heat conduction casing, and the heating plate contacts with the heat conduction casing, and the heat conduction casing sets up in the plastics shell subassembly.

Further, atom magnetometer air chamber uniformity detection device still includes the fixed subassembly of first optics, the fixed subassembly of second optics, the fixed subassembly of third optics and the fixed subassembly of fourth optics, the fixed subassembly of first optics, the fixed subassembly of second optics, the fixed subassembly of third optics and the fixed subassembly of fourth optics are all fixed to be set up on supporting component, detecting light source sets up on the fixed subassembly of first optics, driving light source and 1/4 wave plate setting are on the fixed subassembly of second optics, polarization beam splitting prism sets up on the fixed subassembly of third optics, first photoelectric detector sets up on the fixed subassembly of fourth optics.

Further, arbitrary optical fixing assembly all includes plastic base, plastics telescopic link, plastics fixed plate and plastics tightly decides the board, and plastics tightly decides the board and has the recess that holds, holds the recess and is used for holding the setting and treats the fastener, and plastics tightly decides the fixed setting of board on the plastics fixed plate, and plastic base has the telescopic link and holds the chamber, and the intracavity is held at the telescopic link to the movably setting of telescopic link, and the plastics fixed plate setting is on the upper portion of telescopic link.

Furthermore, any optical fixing component comprises a plurality of plastic telescopic rods, the plastic base is provided with a plurality of telescopic rod accommodating cavities, and the plurality of plastic telescopic rods and the plurality of telescopic rod accommodating cavities are arranged in a one-to-one correspondence mode.

Further, the supporting component comprises a first plastic supporting plate, a second plastic supporting plate and a plastic plane plate, the plastic plane plate is provided with a rotary disc accommodating cavity, the air chamber rotary disc is rotatably arranged in the rotary disc accommodating cavity, the first plastic supporting plate and the second plastic supporting plate are arranged in parallel, and the plastic plane plate is fixedly arranged on the first plastic supporting plate and the second plastic supporting plate.

Furthermore, the atom magnetometer gas chamber consistency detection device can complete detection of the gas chamber wall loss parameters, the nitrogen content in the gas chamber, the magnetometer sensitivity and the gas chamber remanence of any atom gas chamber according to the detection signal of at least one of the first photoelectric detector, the second photoelectric detector and the third photoelectric detector.

Further, the method for detecting the wall loss parameter of any atomic gas chamber specifically comprises the following steps: detecting a light intensity signal that the driving light source does not pass through the atomic gas chamber; detecting a light intensity signal detected by a first photoelectric detector after a driving light source passes through an atomic gas chamber; and calculating to obtain the air chamber wall loss parameter of the atomic air chamber according to the light intensity signal which does not pass through the atomic air chamber and the light intensity signal detected by the first photoelectric detector.

Further, the method for detecting the content of nitrogen in any atomic gas chamber specifically comprises the following steps: scanning the driving light source to set the temperature, obtaining an atomic absorption curve at the first photoelectric detector, fitting the atomic absorption curve to obtain the half width of the curve, and calculating according to the half width of the curve to obtain the nitrogen content in the gas chamber.

Further, the method for detecting the residual magnetism of the gas chamber of any atomic gas chamber specifically comprises the following steps: the detection of the residual magnetism of the gas chamber is finished according to the value of the compensation magnetic field of the coil magnetism supplementing device.

By applying the technical scheme of the invention, the atomic magnetometer air chamber consistency detection device is provided, the detection device can realize the detection of the air chamber parameters and the magnetometer performance of any atomic air chamber by arranging a plurality of air chambers on the air chamber turntable and rotating the air chamber turntable, and the mode can ensure the quick consistency test of the air chambers in the same light path; moreover, by arranging the driving light source, the detection light source and the matched optical element, the measurement of parameters of various air chambers can be realized, meanwhile, the sensitivity test of the atomic magnetometer of the air chambers in a nonmagnetic environment can be sequentially compared, and a direct basis rather than indirect parameter judgment is provided for the magnetometer to rapidly screen the air chambers; furthermore, the atomic magnetometer air chamber consistency detection device provided by the invention can directly install a plurality of atomic air chambers in magnetic shielding systems with various specifications through the air chamber rotating disc without additionally constructing an optical measurement device according to an optical platform, thereby avoiding the interference of different environment variables, such as light, light path deviation, temperature drift and the like, on the air chamber parameters in the multi-air chamber measurement process. Therefore, compared with the prior art, the atomic magnetometer air chamber consistency detection device provided by the invention can realize quick batch screening of multiple air chambers under the synchronous conditions of no magnetic field interference and no light source displacement disturbance, has high efficiency and low time cost, has the adaptability of a magnetometer probe assembly and the compatibility of a magnetic shielding system, and provides guarantee for the development of batch production of atomic magnetometers.

Drawings

The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.

FIG. 1 is a schematic structural diagram of an atomic magnetometer gas chamber consistency detection device in the open magnetic shielding state according to an embodiment of the present invention;

FIG. 2 is a schematic diagram illustrating an explosive structure of an atomic magnetometer gas cell uniformity detecting device provided in accordance with a specific embodiment of the present invention;

FIG. 3 is a schematic diagram illustrating an exploded structure of an atomic magnetometer gas chamber consistency detection device provided by a specific embodiment of the present invention, except for a magnetic shielding barrel and a coil magnetism supplementing device;

FIG. 4 illustrates a basic optical path diagram of an atomic magnetometer gas cell uniformity detection apparatus provided in accordance with a specific embodiment of the present invention;

FIG. 5 is a schematic diagram illustrating a structure of a polarization beam splitting prism provided in accordance with an embodiment of the present invention;

FIG. 6 illustrates a schematic structural diagram of any one of the photodetectors provided in accordance with a specific embodiment of the present invention;

FIG. 7 is a schematic diagram illustrating the structure of a miniaturized 1/4 wave plate or 1/2 wave plate provided in accordance with an embodiment of the present invention;

FIG. 8 illustrates a schematic structural diagram of a miniaturized driving light source or detection light source provided according to an embodiment of the present invention;

FIG. 9 illustrates an exploded view of an optical mounting assembly provided in accordance with an embodiment of the present invention;

FIG. 10 illustrates an exploded view of a gas chamber heating system provided in accordance with an embodiment of the present invention;

fig. 11 shows a schematic view of an assembly between a polarization beam splitter prism, a second photodetector and a third photodetector provided in accordance with an embodiment of the present invention.

Wherein the figures include the following reference numerals:

10. a support assembly; 11. a first plastic support plate; 12. a second plastic support plate; 13. a plastic flat panel; 13a, a turntable accommodating cavity; 20. an atomic gas cell; 30. an air chamber turntable; 40. driving a light source; 50. 1/4 a wave plate; 60. a first photodetector; 70. detecting a light source; 80. a first reflector; 90. a second reflector; 100. 1/2 a wave plate; 110. a polarization beam splitter prism; 120. a second photodetector; 130. a third photodetector; 140. a magnetic shielding barrel; 150. a coil magnetism supplementing device; 160. a gas chamber heating system; 161. a heating plate; 162. a thermally conductive housing; 163. a plastic housing component; 1631. a plastic side cover; 1632. a plastic side plate; 171. a first optical mount assembly; 172. a second optical mount assembly; 173. a third optical fixing component; 174. a fourth optical fixing component; 1701. a plastic base; 1701a telescopic rod accommodating cavity; 1702. a plastic telescopic rod; 1703. a plastic fixing plate; 1704. a plastic fastening plate; 1704a, an accommodating groove; 180. a ceramic bearing.

Detailed Description

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The following description of at least one exemplary embodiment is merely illustrative in nature and is in no way intended to limit the invention, its application, or uses. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.

The relative arrangement of the components and steps, the numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective portions shown in the drawings are not drawn in an actual proportional relationship for the convenience of description. Techniques, methods, and apparatus known to those of ordinary skill in the relevant art may not be discussed in detail but are intended to be part of the specification where appropriate. In all examples shown and discussed herein, any particular value should be construed as merely illustrative, and not limiting. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be discussed further in subsequent figures.

As shown in fig. 1 to 11, an atomic magnetometer gas cell consistency detection device according to an embodiment of the present invention includes a support assembly 10, a plurality of atomic gas cells 20, a gas cell turntable 30, a driving light source 40, an 1/4 wave plate 50, a first photodetector 60, a detection light source 70, a first mirror 80, a second mirror 90, a 1/2 wave plate 100, a polarization beam splitter prism 110, a second photodetector 120, a third photodetector 130, a magnetic shielding barrel 140, and a coil magnetism supplementing device 150, wherein the plurality of atomic gas cells 20 are fixedly disposed at a periphery of the gas cell turntable 30 at intervals, the gas cell turntable 30 is rotatably disposed on the support assembly 10, the driving light source 40, the 1/4 wave plate 50, and the first photodetector 60 are disposed on the support assembly 10, the driving light emitted by the driving light source 40 enters any atomic gas cell 20 after passing through the 1/4 wave plate 50, the first photodetector 60 is used for detecting the light intensity of the driving light passing through the atomic gas cell 20, the second photodetector 120 and the third photodetector 130 are respectively arranged on two mutually perpendicular side surfaces of the polarization beam splitter prism 110, the detection light source 70, the first reflector 80, the second reflector 90, the 1/2 wave plate 100 and the polarization beam splitter prism 110 are all arranged on the support component 10, the detection light emitted by the detection light source 70 enters the atomic gas cell 20 after being emitted by the first reflector 80, the detection light transmitted from the atomic gas cell 20 enters the polarization beam splitter prism 110 through the 1/2 wave plate 100 after being reflected by the second reflector 90 and is divided into first detection light and second detection light, the second photodetector 120 is used for detecting the light intensity of the first detection light, the third photodetector 130 is used for detecting the light intensity of the second detection light, the magnetic shielding barrel 140 is arranged outside the plurality of atomic gas cells 20, the shielding cylinder is used for shielding external magnetic interference, the coil magnetism supplementing device 150 is arranged outside the atomic gas chambers 20, and the coil magnetism supplementing device 150 is used for compensating the magnetic field environment in the magnetic shielding barrel 140; the atom magnetometer air chamber consistency detection device can detect the air chamber parameters and the magnetometer performance of any atom air chamber 20 by rotating the air chamber turntable 30.

By applying the configuration mode, the atom magnetometer air chamber consistency detection device is provided, the detection device can realize the detection of the air chamber parameters and the magnetometer performance of any atom air chamber by arranging a plurality of air chambers on the air chamber turntable and rotating the air chamber turntable, and the mode can ensure the quick consistency test of the plurality of air chambers in the same light path; moreover, by arranging the driving light source, the detection light source and the matched optical element, the measurement of parameters of various air chambers can be realized, meanwhile, the sensitivity test of the atomic magnetometer of the air chambers in a nonmagnetic environment can be sequentially compared, and a direct basis rather than indirect parameter judgment is provided for the magnetometer to rapidly screen the air chambers; furthermore, the atomic magnetometer air chamber consistency detection device provided by the invention can directly install a plurality of atomic air chambers in magnetic shielding systems with various specifications through the air chamber rotating disc without additionally constructing an optical measurement device according to an optical platform, thereby avoiding the interference of different environment variables, such as light, light path deviation, temperature drift and the like, on the air chamber parameters in the multi-air chamber measurement process. Therefore, compared with the prior art, the atomic magnetometer air chamber consistency detection device provided by the invention can realize quick batch screening of multiple air chambers under the synchronous conditions of no magnetic field interference and no light source displacement disturbance, has high efficiency and low time cost, has the adaptability of a magnetometer probe assembly and the compatibility of a magnetic shielding system, and provides guarantee for the development of batch production of atomic magnetometers.

Further, in the present invention, in order to ensure the normal operation of the atomic gas chamber, the atomic gas chamber needs to be adjusted to a proper operation temperature. In order to adjust the working temperature of the atomic gas chamber, the atomic magnetometer gas chamber consistency detection device may be configured to further include a plurality of gas chamber heating systems 160, the plurality of gas chamber heating systems 160 are disposed in one-to-one correspondence with the plurality of atomic gas chambers 20, each gas chamber heating system 160 includes a heating sheet 161, a heat-conducting housing 162 and a plastic housing component 163, the atomic gas chambers 20 are disposed in the heat-conducting housing 162, the heating sheets 161 are in contact with the heat-conducting housing 162, and the heat-conducting housing 162 is disposed in the plastic housing component 163. As an embodiment of the present invention, as shown in fig. 10, the plastic housing assembly 163 includes a plastic side cover 1631 and two plastic side plates 1632, and the plastic side cover 1631 and the two plastic side plates 1632 jointly form a containing space, which is convenient for production and assembly. The plastic side cover 1631 and the two plastic side plates 1632 isolate the external airflow disturbance of the base for the atomic gas chamber, the heating plate 161 is connected with the boron nitride heat-conducting shell 162 to provide timely gas chamber temperature control, and the atomic gas chamber 20 is arranged in the center of the boron nitride heat-conducting shell 162 to ensure uniform temperature.

In addition, in the present invention, in order to facilitate the installation of the driving light source, the detecting light source and the optical components, the atomic magnetometer gas cell uniformity detecting device can be configured to further include a first optical fixing component 171, a second optical fixing component 172, a third optical fixing component 173 and a fourth optical fixing component 174, the first optical fixing component 171, the second optical fixing component 172, the third optical fixing component 173 and the fourth optical fixing component 174 are all fixedly disposed on the supporting component 10, the detecting light source 70 is disposed on the first optical fixing component 171, the driving light sources 40 and 1/4 wave plate 50 are disposed on the second optical fixing component 172, the polarizing beam splitter prism 110 is disposed on the third optical fixing component 173, the second photodetector and the third photodetector are disposed on the polarizing beam splitter prism 110 and are attached to both side surfaces of the polarizing beam splitter prism 110, the first photodetector 60 is disposed on a fourth optical mounting assembly 174.

Specifically, in the present invention, as shown in fig. 9, any optical fixing assembly includes a plastic base 1701, a plastic expansion link 1702, a plastic fixing plate 1703 and a plastic fastening plate 1704, the plastic fastening plate 1704 has a receiving groove 1704a for receiving a fastener to be set, the plastic fastening plate 1704 is fixedly disposed on the plastic fixing plate 1703, the plastic base 1701 has an expansion link receiving cavity 1701a, the expansion link is movably disposed in the expansion link receiving cavity 1701a, and the plastic fixing plate 1703 is disposed on an upper portion of the expansion link.

Under this kind of configuration, drive light source, detection light source and supporting optical element mountable set up in holding the recess, through the tight board of plastics realization to drive light source, detection light source and supporting optical element's fastening installation, the telescopic link is movably set up and is held the intracavity at the telescopic link, can drive the reciprocating of the tight board of plastics through reciprocating of telescopic link, and then realizes that the light source corresponds with atomic air chamber, accomplishes the position control.

Further, in the present invention, in order to ensure the consistency of the adjustment amount at each position of the plastic fastening plate, any optical fixing assembly may be configured to include a plurality of plastic expansion rods 1702, a plastic base 1701 having a plurality of expansion rod receiving cavities 1701a, the plurality of plastic expansion rods 1702 being arranged in one-to-one correspondence with the plurality of expansion rod receiving cavities 1701 a.

Further, in the present invention, in order to achieve smooth rotation of the air chamber rotary table, the support assembly 10 may be configured to include a first plastic support plate 11, a second plastic support plate 12, and a plastic plane plate 13, the plastic plane plate 13 has a rotary table accommodating cavity 13a, the air chamber rotary table 30 is rotatably disposed in the rotary table accommodating cavity 13a, the first plastic support plate 11 and the second plastic support plate 12 are disposed in parallel, and the plastic plane plate 13 is fixedly disposed on the first plastic support plate 11 and the second plastic support plate 12. As an embodiment of the present invention, in order to further ensure smooth rotation of the air chamber turntable, the air chamber turntable may be rotatably disposed in the turntable accommodating chamber 13a through a ceramic bearing 180.

In the present invention, the atomic magnetometer gas chamber consistency detection device can complete the detection of the gas chamber wall loss parameter, the nitrogen content in the gas chamber, the magnetometer sensitivity and the gas chamber remanence of any atomic gas chamber 20 according to the detection signal of at least one of the first photodetector 60, the second photodetector 120 and the third photodetector 130.

Specifically, in the present invention, the method for detecting the wall loss parameter of any atomic gas cell 20 specifically includes: detecting a light intensity signal that the driving light source 40 does not pass through the atomic gas cell 20; detecting a light intensity signal detected by the first photodetector 60 after the driving light source 40 passes through the atomic gas cell 20; and calculating and acquiring the gas chamber wall loss parameter of the atomic gas chamber 20 according to the light intensity signal which does not pass through the atomic gas chamber 20 and the light intensity signal detected by the first photoelectric detector 60.

The method for detecting the content of the nitrogen in any atomic gas chamber 20 specifically comprises the following steps: the scanning driving light source 40 sets the temperature, an atomic absorption curve is obtained at the first photoelectric detector 60, the half width of the curve is obtained according to the fitting of the atomic absorption curve, and the nitrogen content in the gas chamber is obtained according to the half calculation of the curve.

The method for detecting the sensitivity of any atomic gas cell 20 specifically comprises the following steps: the laser is driven, the laser is detected to normally work, the atomic air chamber is adjusted to normal working temperature, the power spectral density is calculated and obtained based on two light intensity signals through the light intensity signals measured by the two photoelectric detectors at the polarization beam splitter prism of the double photoelectric detectors, the frequency domain information is obtained according to the power spectral density calculation, and the sensitivity corresponding to the atomic air chamber is obtained according to the frequency domain information.

The detection method of the residual magnetism of the gas chamber of any atom gas chamber 20 specifically comprises the following steps: the detection of the residual magnetism of the gas chamber is completed according to the value of the compensation magnetic field of the coil magnetism supplementing device 150 by tuning the driving light source 40 to the bottom of the absorption line type, adjusting the optical frequency shift to zero, supplementing magnetism to the atomic gas chamber 20 through the coil magnetism supplementing device 150.

In order to further understand the present invention, the following describes the atomic magnetometer gas chamber consistency detection device provided by the present invention in detail with reference to fig. 1 to 10.

As shown in fig. 1 to 10, an atomic magnetometer plenum uniformity detecting device according to an embodiment of the present invention includes a support assembly 10, a plurality of atomic plenums 20, a plenum carousel 30, a driving light source 40, an 1/4 wave plate 50, a first photodetector 60, a detecting light source 70, a first mirror 80, a second mirror 90, a 1/2 wave plate 100, a polarization beam splitter prism 110, a second photodetector 120, a third photodetector 130, a magnetically shielded tub 140, a coil magnetism supplementing device 150, a plurality of plenum heating systems 160, a plurality of optical fixing assemblies, and a ceramic bearing 180.

Any air chamber heating system 160 comprises a heating sheet 161, a heat-conducting shell 162 and a plastic shell assembly 163, wherein the plastic shell assembly 163 comprises a plastic side cover 1631 and two plastic side plates 1632, the plastic side cover 1631 and the two plastic side plates 1632 jointly enclose a containing space, the atom air chamber 20 is arranged in the heat-conducting shell 162, the heating sheet 161 is in contact with the heat-conducting shell 162, and the atom air chamber 20, the heating sheet 161 and the heat-conducting shell 162 are located in the containing space. The plastic side cover 1631 and the two plastic side plates 1632 isolate the external airflow disturbance of the base for the atomic gas chamber, the heating plate 161 is connected with the boron nitride heat-conducting shell 162 to provide timely gas chamber temperature control, and the atomic gas chamber 20 is arranged in the center of the boron nitride heat-conducting shell 162 to ensure uniform temperature.

The chamber carousel 30 is secured to the support assembly 10 by ceramic bearings 180. The gas chamber turntable 30 is provided with a plurality of gas chamber heating systems 160 which can synchronously heat a plurality of atom gas chambers 20, and different atom gas chambers 20 are switched by rotation after the atom gas chambers 20 are heated to the same temperature, so that the gas chamber measurement under the consistent environment is realized under the condition of not changing the light source, the magnetic field distribution and the light path position. The inner ring of the ceramic bearing is fixedly arranged on the plastic plane plate 13, the outer ring of the ceramic bearing is fixedly arranged with the air chamber turntable 30, and the atomic air chamber structure switching capacity is provided by rotating the air chamber turntable 30. In this embodiment, the chamber carousel 30 is attached to eight sets of chamber heating systems 160, which in turn allow for rapid measurements of eight sets of atomic chambers 20.

The driving light source 40, the 1/4 wave plate 50, the first photoelectric detector 60, the detection light source 70, the first reflector 80, the second reflector 90, the 1/2 wave plate 100 and the polarization beam splitter prism 110 are directly installed on the supporting component 10 through an optical fixing component, the second photoelectric detector and the third photoelectric detector are installed and arranged on two vertical side faces of the polarization beam splitter prism 110, an atom air chamber, the light source and optical elements are in the same integral structure, and the light source path is not influenced by light path deviation caused by air chamber switching. The first photoelectric detector obtains a light intensity signal by detecting a light beam passing through the air chamber by the miniaturized driving light source, and obtains a wall loss parameter of the air chamber by comparing the ratio of the light intensity signals in the states of the air chamber and the air chamber. Meanwhile, the temperature is set through the scanning driving light source, namely the wavelength of the scanning driving light source is scanned, an atomic absorption curve is obtained at the first photoelectric detector, and the half width of the curve is obtained through fitting, so that the nitrogen content in the gas chamber is obtained. After accomplishing air chamber uniformity detection device and buildding, drive laser instrument, detection laser instrument normally work, and normal operating temperature is transferred to the atom air chamber, and the model machine operating condition of simulation magnetometer prototype through the light intensity signal of two photoelectric detector measurement of two photoelectric detector polarization beam splitter prism departments, obtains the power spectral density based on two light intensity signal calculations, obtains frequency domain information according to the power spectral density calculation, obtains the sensitivity that the air chamber corresponds according to the frequency domain information. In the process that the air chamber consistency detection device simulates the working state of a magnetometer, the residual magnetism condition of the air chamber can be evaluated in real time by tuning the driving light source to the bottom of the absorption line type, adjusting the optical frequency shift to zero and comparing the compensation magnetic field sizes of the epoxy resin coil magnetism supplementing devices under different air chambers.

The optical fixing system of the miniaturized light source comprises a plastic base 1701, a plastic telescopic rod 1702, a plastic fixing plate 1703 and a plastic fastening plate 1704, wherein the plastic base 1701 is fixed with the supporting component 10, and the stability of a light path is ensured. The plastic base 1701 and the plastic extension 1702 cooperate to facilitate adjustment of the optical path height of the light source and optical components being secured. The two fastening plates are matched with the threaded holes on the fixing plate and necessary plastic screws to fix the optical element to the position of the fixing plate.

The support assembly 10 comprises a first plastic support plate 11, a second plastic support plate 12 and a plastic plane plate 13, wherein the two plastic support plates 12 and the plastic plane plate 13 are connected and can be arranged on an epoxy resin coil magnetism supplementing device, and a support structure formed by the two plastic support plates can be well suitable for internal cylindrical surface structures of magnetic shielding systems with various specifications.

The device for detecting the consistency of the air chambers of the atomic magnetometer comprises a multilayer high-conductivity magnetic shielding barrel and an epoxy resin coil magnetism supplementing device. The multilayer high-conductivity magnetic shielding barrel can shield a magnetic field in the barrel to nT magnitude, and the saddle-shaped coil and the annular coil which are arranged on the epoxy resin coil magnetism supplementing device are matched with an extra high-precision current source, so that the magnetic field in the barrel can be compensated to a near-zero field environment.

The embodiment provides a device that is fit for atomic magnetometer short-term screening atom air chamber, and wherein the air chamber heating system and the air chamber carousel of combining together can switch a plurality of air chambers to the same environment and test, and the fixed subassembly of miniaturized light source optics then can adapt light source module, optical element in the miniaturized magnetometer probe research and development production process to can fix different specification subassemblies. The whole set of device is designed without magnetism, and the compatible supporting system can well adapt to the cylindrical surface environments of magnetic shielding barrels with different specifications, thereby reducing the design requirements on the magnetic shielding devices. The invention can realize the rapid batch detection of multiple air chambers, has the adaptability of a miniaturized magnetometer probe assembly and the compatibility of a magnetic shielding system, and provides a foundation for the application scene of the next batch production of the atomic magnetometer.

In summary, the present invention provides a device for detecting the consistency of an atomic magnetometer gas chamber, which has the following advantages compared with the prior art.

(1) A plurality of atom air chambers can be arranged in a plurality of air chamber heating systems, and the rapid consistency measurement of the plurality of air chambers in the same light path can be realized by matching with an air chamber switching system.

(2) The system can be matched with necessary miniaturized light sources and optical elements to measure parameters of various air chambers, and simultaneously can be used for sequentially comparing sensitivity tests of atomic magnetometers of the air chambers in a nonmagnetic environment, so that direct basis is provided for the magnetometers to rapidly screen the air chambers, and indirect parameter judgment is not provided.

(3) The miniaturized light source and the optical element in the process of producing the magnetometer can be directly adopted, and the magnetometer is suitable for light sources and optical elements with different specifications, so that the maximum degree of a test result is consistent with the parameters in an actual magnetometer probe, and the magnetometer probe has good adaptability. In addition, the air chamber can be measured without a moving device, and the uniformity of the magnetic field at the position of the air chamber is ensured. The light source, the optical element and the air chamber are fixed on the same platform, and the air chamber measuring light path has high consistency.

(4) The whole consistency test system can be directly installed in magnetic shielding systems of various specifications, an optical measurement device does not need to be additionally constructed according to an optical platform, and the interference of different environment variables such as lamplight, light path deviation, temperature drift and the like to parameters of the air chambers in the measurement process of the multiple air chambers is avoided.

Spatially relative terms, such as "above … …," "above … …," "above … … surface," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial relationship to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. For example, if a device in the figures is turned over, devices described as "above" or "on" other devices or configurations would then be oriented "below" or "under" the other devices or configurations. Thus, the exemplary term "above … …" can include both an orientation of "above … …" and "below … …". The device may be otherwise variously oriented (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

It should be noted that the terms "first", "second", and the like are used to define the components, and are only used for convenience of distinguishing the corresponding components, and the terms have no special meanings unless otherwise stated, and therefore, the scope of the present invention should not be construed as being limited.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. An atomic magnetometer gas chamber consistency detection device, characterized in that the atomic magnetometer gas chamber consistency detection device comprises:

a support assembly (10);

a plurality of atom air chambers (20) and an air chamber rotary table (30), wherein the atom air chambers (20) are fixedly arranged at the periphery of the air chamber rotary table (30) at intervals, and the air chamber rotary table (30) is rotatably arranged on the support assembly (10);

the atomic gas cell comprises a driving light source (40), an 1/4 wave plate (50) and a first photoelectric detector (60), wherein the driving light source (40), the 1/4 wave plate (50) and the first photoelectric detector (60) are all arranged on the supporting assembly (10), driving light emitted by the driving light source (40) enters any atomic gas cell (20) after passing through the 1/4 wave plate (50), and the first photoelectric detector (60) is used for detecting the light intensity of the driving light passing through the atomic gas cell (20);

detect light source (70), first speculum (80), second mirror (90), 1/2 wave plate (100), polarization beam splitting prism (110), second photoelectric detector (120) and third photoelectric detector (130) set up respectively on two mutually perpendicular's of polarization beam splitting prism (110) side, detect light source (70), first speculum (80), second speculum (90), 1/2 wave plate (100) and polarization beam splitting prism (110) all set up on supporting component (10), the detection light that detects light source (70) and send passes through first speculum (80) transmission back and gets into atom gas chamber (20), follow the transmissive detection light of atom gas chamber (20) passes through after second speculum (90) reflection back warp 1/2 wave plate (100) gets into polarization beam splitting prism (110) branch A first photodetector and a second photodetector, the second photodetector (120) for detecting the light intensity of the first detected light, the third photodetector (130) for detecting the light intensity of the second detected light;

a magnetic shielding bucket (140), the magnetic shielding bucket (140) being disposed outside the plurality of atomic gas chambers (20), the shielding canister being for shielding external magnetic interference;

a coil magnetism supplementing device (150), wherein the coil magnetism supplementing device (150) is arranged outside the atomic gas chambers (20), and the coil magnetism supplementing device (150) is used for compensating the magnetic field environment in the magnetic shielding barrel (140);

the atom magnetometer air chamber consistency detection device can detect the air chamber parameters and the magnetometer performance of any atom air chamber (20) by rotating the air chamber turntable (30).

2. The atomic magnetometer plenum consistency detection device according to claim 1, further comprising a plurality of plenum heating systems (160), wherein the plenum heating systems (160) are arranged in a one-to-one correspondence with the atomic plenums (20), any of the plenum heating systems (160) comprises a heating plate (161), a heat conducting housing (162) and a plastic housing component (163), the atomic plenum (20) is arranged in the heat conducting housing (162), the heating plate (161) is in contact with the heat conducting housing (162), and the heat conducting housing (162) is arranged in the plastic housing component (163).

3. The atomic magnetometer plenum uniformity detection device of claim 1, further comprising a first optical fixing component (171), a second optical fixing component (172), a third optical fixing component (173), and a fourth optical fixing component (174), wherein said first optical fixing component (171), said second optical fixing component (172), said third optical fixing component (173), and said fourth optical fixing component (174) are all fixedly disposed on said support component (10), wherein said detection light source (70) is disposed on said first optical fixing component (171), wherein said driving light source (40) and said 1/4 wave plate (50) are disposed on said second optical fixing component (172), wherein said polarizing beam splitting prism (110) is disposed on said third optical fixing component (173), the first photodetector (60) is disposed on the fourth optical mounting assembly (174).

4. The atomic magnetometer plenum uniformity detection device of claim 3, wherein any one of said optical fixing components comprises a plastic base (1701), a plastic expansion link (1702), a plastic fixing plate (1703) and a plastic fastening plate (1704), wherein said plastic fastening plate (1704) has a receiving groove (1704a) for receiving a fastener to be installed, said plastic fastening plate (1704) is fixedly installed on said plastic fixing plate (1703), said plastic base (1701) has an expansion link receiving cavity (1701a), said expansion link is movably installed in said expansion link receiving cavity (1701a), and said plastic fixing plate (1703) is installed on the upper portion of said expansion link.

5. The atomic magnetometer plenum uniformity detection device of claim 4, wherein any one of said optical fixing assemblies comprises a plurality of said plastic telescoping rods (1702), said plastic base (1701) having a plurality of said telescoping rod receiving cavities (1701a), said plurality of plastic telescoping rods (1702) being arranged in a one-to-one correspondence with said plurality of telescoping rod receiving cavities (1701 a).

6. The atomic magnetometer plenum uniformity detecting device according to any one of claims 1 to 5, wherein said supporting assembly (10) comprises a first plastic supporting plate (11), a second plastic supporting plate (12) and a plastic plane plate (13), said plastic plane plate (13) has a turntable accommodating cavity (13a), said plenum turntable (30) is rotatably disposed in said turntable accommodating cavity (13a), said first plastic supporting plate (11) and said second plastic supporting plate (12) are disposed in parallel, said plastic plane plate (13) is fixedly disposed on said first plastic supporting plate (11) and said second plastic supporting plate (12).

7. The atomic magnetometer gas cell consistency detection device according to claim 6, wherein the atomic magnetometer gas cell consistency detection device can detect the gas cell wall loss parameter, the gas cell internal nitrogen content, the magnetometer sensitivity and the gas cell remanence of any one of the atomic gas cells (20) according to the detection signal of at least one of the first photodetector (60), the second photodetector (120) and the third photodetector (130).

8. The atomic magnetometer and gas cell consistency detection device according to claim 7, wherein the detection method of the gas cell wall loss parameter of any one of the atomic gas cells (20) specifically comprises: detecting a light intensity signal of the driving light source (40) not passing through the atomic gas cell (20); detecting a light intensity signal detected by the first photodetector (60) after the driving light source (40) passes through the atomic gas cell (20); and calculating and acquiring the air chamber wall loss parameter of the atomic air chamber (20) according to the light intensity signal which does not pass through the atomic air chamber (20) and the light intensity signal detected by the first photoelectric detector (60).

9. The atomic magnetometer gas chamber consistency detection device according to the claim 8, characterized in that the detection method of the nitrogen content inside any one of the atomic gas chambers (20) specifically comprises the following steps: and scanning a driving light source (40) to set temperature, obtaining an atomic absorption curve at the first photoelectric detector (60), fitting according to the atomic absorption curve to obtain the half width of the curve, and calculating according to the half width of the curve to obtain the content of nitrogen in the gas chamber.

10. The atomic magnetometer gas cell consistency detection device according to claim 9, wherein the detection method of the residual magnetism of the gas cell of any one of the atomic gas cells (20) specifically comprises: and tuning the driving light source (40) to the bottom of the absorption line type, zeroing the optical frequency shift, performing magnetism compensation on the atomic gas chamber (20) through the coil magnetism compensation device (150), and completing detection on the residual magnetism of the gas chamber according to the value of the compensation magnetic field of the coil magnetism compensation device (150).

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